Specimen examination automation system, and method of predicting idle time periods in a specimen examination automation system
By predicting idle time periods in the automated body inspection system, the problem of needing to stop the device to perform maintenance processes in the prior art is solved. Data deletion and maintenance processes are realized in the running state, ensuring the stable operation of the system and the performance of the control unit.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HITACHI HIGH TECH CORP
- Filing Date
- 2024-10-11
- Publication Date
- 2026-06-26
AI Technical Summary
In the prior art, in order to perform maintenance procedures, the data processing device for instrument analysis needs to be moved from the running state to the stopped state, which may cause the operation to be hindered, and the device needs to be restarted when forcibly opening the storage area during idle periods.
By using the automated physical examination system, based on physical examination-related information and the storage capacity history, the system predicts idle periods when the control unit load is less than a specified amount, and performs data deletion and maintenance during these periods.
This enables maintenance procedures to be performed while the device is in operation, avoiding device shutdowns and ensuring continuous system operation and maintenance of control unit performance.
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Figure CN122295579A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to an automated system for physical examination and a method for predicting idle time periods in such an automated system, for example, to a system with an automatic deletion function for physical examination data. Background Technology
[0002] In instrumental analytical data processing devices that perform chemical or physical analyses, there are techniques aimed at avoiding memory leaks and continuously performing stable and highly reliable analyses. Such techniques are described, for example, in Patent Document 1.
[0003] Patent document 1 states: "In an instrumental analysis data processing device that performs chemical or physical analysis, when the available memory capacity is detected to be reduced and a restart request is output, the analysis schedule information of the analysis device is collected, the analysis status of each analysis device is grasped, and the unopened storage area of the storage device is forcibly opened during the period when no analysis is performed."
[0004] Existing technical documents
[0005] Patent documents
[0006] Patent Document 1: Japanese Patent Application Publication No. 2007-010357 Summary of the Invention
[0007] The technical problem that the invention aims to solve
[0008] However, in the prior art, the device needs to be stopped in order to perform maintenance procedures. For example, performing maintenance procedures during periods of high device load may impede operation, so the device needs to be stopped to reliably avoid affecting its operation.
[0009] The instrument analysis data processing device described in Patent Document 1 also needs to be restarted when it performs a forced opening action on an inaccessible storage area during an idle period. That is, there is a problem that the device needs to be switched from an operating state to a stopped state in order to perform the forced opening action (maintenance processing).
[0010] The purpose of this invention is to solve the problems of the prior art and provide a system that can perform maintenance processes while in operation.
[0011] Technical means for solving technical problems
[0012] An example of an automated physical examination system according to the present invention includes: The storage unit stores specimen data related to the specimen being examined; and Control Department The control unit predicts idle periods when the load on the control unit is less than a specified amount, based on at least one of the information related to the specimen examination and the usage capacity history of the storage unit.
[0013] One example of the method for predicting idle time periods in an automated physical examination system, which relates to this invention, The automated specimen examination system includes: The storage unit stores specimen data related to the specimen being examined; and Control Department In the method, the control unit predicts idle time periods when the load on the control unit is less than a predetermined amount based on at least one of the information related to the specimen examination and the usage capacity history of the storage unit.
[0014] Invention Effects
[0015] According to the present invention, since idle time periods can be predicted, maintenance processes can be scheduled during idle time periods, thereby enabling maintenance processes to be performed while the system is in operation.
[0016] Other technical issues, structures, and effects not mentioned above will be further clarified through the following description of the implementation methods. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of the automated specimen examination system according to Embodiment 1 of the present invention.
[0018] Figure 2 This is a flowchart from Example 1, showing how the recommended time period for deleting specimen data is determined based on the idle time period when the load of the control unit is less than a specified amount.
[0019] Figure 3A This is an example of prediction based on idle time periods related to specimen examination, as described in Example 1.
[0020] Figure 3B This is an example of prediction based on idle time periods related to specimen examination, as described in Example 1.
[0021] Figure 4 This is a screen display example from Embodiment 1.
[0022] Figure 5 This is a calculation example of load prediction shift based on the usage capacity history of the storage unit, as described in Embodiment 2 of the present invention.
[0023] Figure 6 This is an example of screen display when a specified time is set in Embodiment 3 of the present invention. Detailed Implementation
[0024] Embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following embodiments, structural elements (including element steps, etc.) are not essential, except where specifically indicated or where they are considered obviously necessary in principle.
[0025] [Example 1]
[0026] The following is based on Figure 1 , Figure 2 , Figure 3A , Figure 3B , Figure 4 Example 1 of the present invention is described below.
[0027] Figure 1 This is a schematic diagram of the automated physical examination system 1 involved in Embodiment 1. The automated physical examination system 1 is a system for automating examinations in hospitals or examination facilities, etc. Its general structure is described below. The automated physical examination system 1 includes an examination information system 2, a system unit 3, a control unit 4, a storage unit 5, and a display unit 6.
[0028] The examination information system 2 (also known as the Laboratory Information System, sometimes simply referred to as LIS in the diagram) is a system that connects to the control unit 4 via communication line 7 and manages specimen data. For example, when specimen 8 is being processed by the system unit 3, a processing request for specimen examination is sent from the examination information system 2, and the control unit 4 receives the processing request and issues a processing instruction to the system unit 3.
[0029] System Unit 3 performs processing related to specimen examination based on processing instructions. Furthermore, System Unit 3 sends the processing results to Control Unit 4, and the Examination Information System 2 receives the processing results via Control Unit 4.
[0030] System unit 3 is used to prepare the sample 8 into a state suitable for examination by an analytical device (not shown). The automated sample examination system 1 or system unit 3 may also include this analytical device. System unit 3 includes a transport module, a centrifugation module, a thrombectomy module, a dispensing module, a barcode affixing module, a transfer module, and a storage module. Each module processes the sample 8 to prepare it into an analytical state. For example, if the sample 8 is blood, the centrifugation module centrifuges the sample 8 to separate it into serum and blood cells. The dispensing module divides one sample 8 into smaller portions for dispensing, enabling analysis by multiple analytical devices. Furthermore, system unit 3 can also perform examinations on the sample 8.
[0031] The control unit 4 has a known computer hardware structure, such as an arithmetic unit and a storage unit. The arithmetic unit includes, for example, a processor, and the storage unit includes, for example, storage media such as semiconductor storage devices and disk drives. Some or all of the storage media may also be non-transitory storage media.
[0032] The storage unit can store programs. By executing these programs, the processor enables the control unit 4 to perform the functions described in this embodiment.
[0033] The control unit 4 is connected to the system unit 3 via communication line 7. Based on the processing request from the inspection information system 2, the control unit 4 issues processing instructions to the system unit 3 to control the operation of the system unit 3. In addition, the control unit 4 obtains the specimen inspection information 9 related to the inspection of the specimen 8 from the storage unit 5, and based on this, it can predict the idle time period of the control unit 4 (e.g., the time period when the load of the control unit 4 is less than a specified amount).
[0034] Storage unit 5 stores the specimen examination information 9 of the automated specimen examination system 1. The specimen examination information 9 includes specimen data related to the specimens being examined. For example, the specimen data for each specimen being examined includes the specimen ID and patient name. Furthermore, the specimen data for each examined specimen includes the concentration of each component and the examination date.
[0035] The control unit 4 and the storage unit 5 can also be integrated into one unit. For example, the storage unit of the control unit 4 can also be used to form the storage unit 5.
[0036] The specimen inspection information 9 may also include other information. For example, it may include the processing history for each time period. The processing history for each time period may include, for example, the number of specimens 8 processed in the system unit 3 (processing count), the number of processing requests sent from the inspection information system 2, the number of times the user operates on the control unit 4, etc.
[0037] The number of samples 8 processed represents, for example, the number of samples 8 processed in each time period. The number of processing requests sent from the inspection information system 2 represents, for example, the number of times information related to processing requests sent from the inspection information system 2 to the system unit 3 via the control unit 4 in each time period (or it can be limited to information requesting the processing of samples 8) is sent.
[0038] The number of times a user operates on the control unit 4 indicates the number of times the user operates the control unit 4 to input instructions for the system unit 3 in each time period. Specific examples include: the number of times a specified button in the specified GUI is clicked, and / or the number of times a value is entered through a specified field in the specified GUI.
[0039] The length of each time period is, for example, 1 hour, meaning that 1 day consists of 24 time periods.
[0040] Display unit 6 displays a user-operable GUI. The GUI accepts operations for controlling system unit 3 and / or displays information regarding instructions and guidance for the user. For example, it can display the idle time periods predicted by control unit 4 and the predicted shift of load (charts and / or values) as analysis results 10.
[0041] Figure 2 This is a flowchart illustrating the scenario where the automated specimen examination system 1 determines the recommended time period for data deletion based on the idle time period of control unit 4. Figure 2 The flowchart shows the following actions.
[0042] (S21)
[0043] Control unit 4 reads past specimen inspection information 9 from storage unit 5 (e.g., up to the last executed inspection process). Furthermore, control unit 4 reads the usage capacity history of storage unit 5 from storage unit 5. The usage capacity history of storage unit 5, for example, indicates the amount or proportion of the used area of storage unit 5 for each time period.
[0044] (S22)
[0045] Control unit 4 can analyze the input specimen examination information 9 to predict the time period during which the load on control unit 4 is less than a specified amount (hereinafter referred to as "idle time period"). The specific method for predicting idle time periods will be described later. Control unit 4 can predict idle time periods based on at least a portion of the specimen examination information 9. In addition, information related to multiple items included in the specimen examination information 9 can be combined to improve the prediction accuracy of idle time periods.
[0046] In addition, the control unit 4 can also analyze the usage capacity history of the storage unit 5 to predict idle time periods.
[0047] Thus, the control unit 4 predicts idle time periods based on at least one of the specimen inspection information 9 and the usage capacity history of the storage unit 5.
[0048] In this way, the time periods when the load on the control unit 4 is low can be calculated. For example, time periods when the device is running but not processing the sample 8, time periods when the number of processing requests sent and received from the inspection information system 2 is low, time periods when the user does not operate the control unit 4, and time periods when the storage unit 5 is used at a low capacity are all examples of this type of situation.
[0049] Depending on the facility (hospital or examination facility, etc.) using the automated physical examination system 1, the system's daily operating hours and idle periods vary. This structure allows for the clear definition of the operational status of the automated physical examination system 1 within the hospital or examination facility.
[0050] Figure 3Aand Figure 3B This is a prediction example based on the idle time period of the specimen inspection information 9. The horizontal axis represents time, and the vertical axis represents the load of the control unit 4. The load of the control unit 4 can represent, for example, any one of the number of specimens processed, the number of processing requests from the inspection information system 2, or the number of user operations on the control unit 4. In a variation, the load of the control unit 4 can also represent the usage capacity of the storage unit 5.
[0051] Figure 3A and Figure 3B The chart divides the multi-day data contained in the specimen examination information 9 into each time period to show its progression. Figure 3A The example represents 3 days of data, with 3 curves corresponding to 1 day of data. Figure 3B The example represents the average of data over 3 days.
[0052] When the value on the vertical axis is below a specified threshold TH for a certain period of time, that period is considered a low-load period, i.e., an idle period. For example, in Figure 3A In the example, if the vertical axis value of all dates within a certain time period is below the threshold TH, that time period is determined to be an idle time period. Figure 3A Idle time periods 31a and 31b are shown. On the other hand, if the vertical axis value of any day exceeds the predetermined threshold TH, the control unit 4 is under high load during that time period, and that time period is determined to be a non-idle time period.
[0053] Additionally, for example in Figure 3B In the example, if the value (average) of the vertical axis is below the threshold TH for a certain time period, that time period is determined to be an idle time period. Figure 3B Idle time periods 32a and 32b are shown. On the other hand, if the value of the vertical axis exceeds the predetermined threshold TH, the control unit 4 is under high load during that time period, and that time period is determined to be a non-idle time period.
[0054] As a variation, the idle time period can also be predicted using multiple items such as the number of samples processed, the number of processing requests from the inspection information system 2, the number of user operations on the control unit 4, and the usage capacity of the storage unit 5. For example, a threshold can be set for each item, and the time period in which the values of all items are below the threshold can be calculated as the idle time period.
[0055] If it is the same facility, it can be assumed that the idle time periods appear in the same pattern on all dates, including the past and the future. Therefore, it can be predicted that the time periods corresponding to the idle time periods 32a and 32b of the past dates will also be idle time periods on future dates.
[0056] (S23)
[0057] The idle time period predicted by control unit 4 and such Figure 3A and Figure 3B The load shift shown is also displayed on the display unit 6 as analysis result 10. That is, the display unit 6 displays the idle time period and the load shift.
[0058] Figure 4 This is an example of a screen display. Figure 4 (a) An example of a display screen 41 showing analysis result 10. Display screen 41 shows the predicted idle time periods and the load values (e.g., the average value within each idle time period) as analysis result 10. This structure enables the analysis results to be visualized to the user.
[0059] Figure 4 (a) only shows the load values for each idle time period, but the display unit 6 can, for example, display the load values for each idle time period. Figure 3A and Figure 3B The chart shown illustrates the shift in load.
[0060] (S24)
[0061] Control unit 4 outputs the predicted idle time period as the recommended time period for data deletion. That is, during the recommended time period, control unit 4 is advised to delete at least a portion of the data stored in control unit 4 or storage unit 5.
[0062] Figure 4 (b) is an example of screen display (output example) of display unit 6 in S24. It displays screen 42 showing the recommended time period for data deletion. Figure 4 In (b), the data content to be deleted is the specimen data related to the examined specimen, but the deleted object can be any one or more of the following.
[0063] Specimen data related to the examined specimens (e.g., specimen data that was examined 48 hours before the deletion execution time). Processing requests from inspection information system 2 (e.g., processing requests received by control unit 4 48 hours before the deletion execution time).
[0064] Thus, control unit 4 recommends deleting at least a portion of the examined specimen data and at least a portion of the processing request for specimen examination during idle periods. This recommended process allows idle periods to be effectively utilized for deletion.
[0065] In addition, as a variation, it may be recommended to delete data other than these.
[0066] (S25)
[0067] If screen 42, which displays recommended time periods, is shown, the user can select one or more recommended time periods. Specifically, if... Figure 4 (a) and Figure 4 As shown in (b), when the display unit 6 displays multiple predicted free time periods, the user can appropriately select the most desired free time period. Figure 4 In example (b), the recommended time period screen 42 displays three recommended time periods, showing that the user is selecting "21:00~23:00".
[0068] Multiple idle time periods can be selected. In this way, the control unit 4 accepts input that at least one of the multiple idle time periods is selected.
[0069] In S25, when the user selects more than one free time period (e.g., in...), Figure 4 (b) When the “OK” button is operated in the state, S26 is executed.
[0070] (S26)
[0071] Control unit 4 decides to automatically delete the data to be deleted within the selected time period and schedules the data deletion process within the selected time period. Alternatively, maintenance procedures, described later, can also be scheduled. Figure 4 (c) is an example of the confirmation screen 44 for the recommended time period. In this example, it shows that the user has selected "21:00~23:00".
[0072] In S25, when the user does not select any free time period (e.g., in...), Figure 4 When the "Cancel" button is operated in state (b), the control unit 4 decides not to automatically delete the data to be deleted at any time, and omits the execution of S26 and S27.
[0073] (S27)
[0074] Control unit 4 automatically deletes data that is the target of deletion during the selected idle time period. For example, control unit 4 automatically deletes at least a portion of the specimen data related to the examined specimens during the idle time period. According to this structure, since the data deletion process can be scheduled to the idle time period, the data deletion process can be performed in the running state without causing problems for the load of control unit 4.
[0075] In addition, control unit 4 can also be like Figure 4 As shown in (b), screen 43 displays implementation information including the implementation history of data deletion (e.g., the time period when the last data deletion was performed) and the implementation plan of data deletion (e.g., the scheduled time period for the next data deletion).
[0076] In addition, the control unit 4 can also perform processes other than data deletion during the selected idle time period. For example, it can also perform scheduled maintenance processes. Maintenance processes include, for example, the automatic replenishment of consumables. In addition, it can also perform actual setting change processes, for example, when the settings of the automated body inspection system 1 have been predetermined (e.g., when the setting parameters have been changed but have not yet been reflected in the actual operation).
[0077] With this structure, maintenance can be scheduled during off-peak hours, allowing it to be performed while the system is running without causing problems with the load on the control unit 4. For example, maintenance procedures such as changes to system operating conditions that previously required switching to a stopped state can now be performed while the system is running.
[0078] Alternatively, the user-initiated selection process (S25) can be omitted. In this case, the data deletion or maintenance process can be automatically executed by the control unit 4 during any idle time period.
[0079] With the structure described above, data deletion and / or maintenance are performed automatically during the predicted idle time periods, enabling data deletion or maintenance to be executed while the system is running. Therefore, for example, 24-hour operation can be achieved without stopping the automated specimen examination system 1. Furthermore, it prevents the increase of specimen data and maintains the performance of the control unit 4.
[0080] Furthermore, since automatic deletion is performed during idle periods, even if the load on the control unit 4 increases due to the deletion process, the maximum load can be minimized.
[0081] [Example 2]
[0082] In this embodiment, based on the usage capacity history of the storage unit 5 read in S21 of Embodiment 1, the predicted shift in the usage capacity of the storage unit 5 is calculated in S22. The structure other than S21 and S22 can be the same as in Embodiment 1. Hereinafter, the description of parts common to Embodiment 1 will sometimes be omitted.
[0083] Figure 5 This is a calculation example of load prediction shift based on the usage history of storage unit 5. A calculation method different from Example 1 is described. The horizontal axis represents time, and the vertical axis represents the usage rate of storage unit 5.
[0084] The control unit 4 periodically obtains the usage capacity history of the storage unit 5 from the storage unit 5, as the usage capacity history 51. The control unit 4 predicts the shift in usage capacity based on the usage capacity history 51. The prediction can be achieved, for example, by making a linear approximation of the usage capacity history 51. The linear approximation can use, for example, the least squares method. However, the specific method of prediction is not limited to this.
[0085] In this way, the control unit 4 predicts the shift of the usage capacity history 51 of the storage unit 5 and calculates the predicted shift 54. The control unit 4 can also display the predicted idle time period and the predicted shift 54 (e.g., a graph or numerical value). Based on this structure, the user can easily grasp the shift of the available capacity of the storage unit 5.
[0086] Control unit 4 calculates the predicted shift 54, which is the predicted area 52 where the predicted usage capacity exceeds a specified threshold (e.g., 60%). The time period corresponding to the predicted area 52 is recommended to the user as the recommended time period 53 for data deletion.
[0087] [Example 3]
[0088] The following is based on Figure 6 Example 3 of the present invention will be described below. Hereinafter, descriptions of parts common to Examples 1 or 2 will sometimes be omitted.
[0089] The automated specimen examination system 1 involved in this embodiment is configured such that the user can determine and manually input the deletion time period of the specimen data.
[0090] Figure 6 This is an example of the screen display when a time period is entered for deletion. Figure 6 (a) is an example of the display of the setting screen for deleting a time period. After the control unit 4 is started, the user can select the specified time selection bar 61 and enter the time period to be deleted. In the delete time period input bar 62, the start time 63, end time 64, and frequency 65 of the time period to be deleted can be entered (e.g., execution interval, n times per day, daily, weekly, monthly, etc.).
[0091] Figure 6 (b) is an example of the confirmation screen displayed when the settings are complete. The system automatically deletes data for the entered time period and displays confirmation message 66.
[0092] Thus, the control unit 4 accepts input of a time period for deleting data (e.g., at least a portion of the examined specimen data and at least a portion of the processing request for specimen examination).
[0093] With the structure described above, users can arbitrarily set their desired data deletion time period. Therefore, users can determine the deletion time period to avoid their scheduled work time, thus providing an automated body inspection system 1 that does not interfere with user operations. Furthermore, when inputting the deletion time period, users can refer to the recommended time period output by the control unit 4 (see Embodiment 1), thus allowing users to appropriately determine the deletion time period.
[0094] Label Explanation
[0095] 1...Automated System for Physical Examination
[0096] 2...Inspect the information system
[0097] 3...Systems Department
[0098] 4. Control Department
[0099] 5. Storage Section
[0100] 6 Display Section
[0101] 7... Communication lines
[0102] 8... Specimen
[0103] 9... Specimen Examination Information (Specimen Data)
[0104] 10...Analysis Results
[0105] 31a, 31b, 32a, 32b... Idle time periods
[0106] 41... Display screen
[0107] 42...Recommended time period screen
[0108] 43...Implementation Information Screen
[0109] 44...Confirmation screen
[0110] 51...Using Capacity History
[0111] 52...Prediction Area
[0112] 53...Recommended time period
[0113] 54...Predicted Shift
[0114] 61...Specified Time Selection Bar
[0115] 62...Delete Time Period Input Field
[0116] 63...Starting moment
[0117] 64...stopping time
[0118] 65... frequency
[0119] 66... Confirmation message
[0120] TH...threshold.
Claims
1. An automated system for physical examination, characterized in that, include: The storage unit stores specimen data related to the specimen being examined; as well as Control Department The control unit predicts idle periods when the load on the control unit is less than a specified amount, based on at least one of the information related to the specimen examination and the usage capacity history of the storage unit.
2. The automated body examination system as described in claim 1, characterized in that, The control unit recommends deleting at least a portion of the examined specimen data and at least a portion of the processing request for specimen examination during the idle time period.
3. The automated physical examination system as described in claim 1, characterized in that, The automated specimen examination system includes a display unit that shows the idle time periods. The control unit predicts the progression of the storage unit's usage capacity history. The display unit shows the predicted idle time period and the predicted usage capacity history progression.
4. The automated physical examination system as described in claim 1, characterized in that, The automated specimen examination system includes a display unit that shows multiple idle time periods.
5. The automated physical examination system as described in claim 1, characterized in that, The control unit automatically deletes at least a portion of the specimen data related to the examined specimens during the idle time period.
6. The automated body examination system as described in claim 1, characterized in that, The control unit performs prescribed maintenance procedures during the idle period.
7. The automated physical examination system as described in claim 4, characterized in that, The control unit accepts input selecting at least one of the plurality of idle time periods. During the selected idle time period, at least a portion of the examined specimen data and at least a portion of the processing requests for specimen examination are automatically deleted.
8. The automated body examination system as described in claim 1, characterized in that, The control unit accepts inputs for at least a portion of the examined specimen data and at least a portion of the processing request for specimen examination.
9. A method for predicting idle time periods in an automated physical examination system, characterized in that, The automated specimen examination system includes: The storage unit stores specimen data related to the specimen being examined; and Control Department The method includes: the control unit predicting idle time periods when the load on the control unit is less than a predetermined amount based on at least one of information related to the examination of the specimen and the usage capacity history of the storage unit.