A method and apparatus for testing the surface function of a touch display screen

Abstract

This invention provides a method and apparatus for surface function testing of a touch display screen. The method includes: extracting features from the collected three-dimensional topographic data of the touch display screen under test, identifying raised button areas, and calculating the corresponding limit displacement threshold; controlling the detection probe to apply a dynamic load to the raised button area based on the limit displacement threshold, and simultaneously collecting instantaneous load data, instantaneous displacement data, and instantaneous capacitance data during the loading process; processing the time-series correspondence of the above data to calculate the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area; performing state matching under preset rules based on the extracted features to obtain defect classification results; and dynamically generating test results based on the defect classification results and historical operating data. By recognizing irregularly shaped glass structures through 3D topographic data and combining a three-dimensional model of force, displacement, and capacitance, the misjudgment of electromechanical separation is solved, significantly improving the product testing accuracy and process yield.

Description

Technical Field

[0001] This invention relates to the field of glass button screen manufacturing technology, and in particular to a method and apparatus for testing the surface function of a touch display screen. Background Technology

[0002] With the continuous upgrading of human-computer interaction technology, the form of touch screens is becoming increasingly diversified. In some high-end applications, the surface of the touch screen integrates physical glass buttons with mechanical travel (i.e., a special microstructure with a raised surface and a groove on the back created by chemical etching). This new type of touch screen not only needs to respond to capacitive touch signals, but also needs to produce specific mechanical elastic deformation when pressed to provide realistic physical tactile feedback.

[0003] Existing testing technologies suffer from problems such as fragmented testing dimensions, susceptibility to damage, and lack of process traceability. Specifically, traditional touchscreen testing devices typically use conductive adhesive tips to simulate fingers for simple electrical signal (XY coordinates, sensitivity) testing, or a single force gauge for physical pressure testing. On the one hand, because the etched area on the back of the glass button is extremely thin, traditional blind pressure testing equipment lacks adaptive protection based on the surface 3D morphology, making it extremely easy to crush the fragile glass microstructure during testing. On the other hand, existing single-dimensional testing cannot accurately align "mechanical feel (force and deformation)" and "electrical function (capacitance reporting)" on the same time axis, leading to the release of defective products with hidden electromechanical asynchrony, such as "pressable but unresponsive" or "triggered upon touch but without tactile feedback." Furthermore, current testing results often only reach a simple "pass / fail" judgment, failing to identify hidden microcracks within the structure, and lacking a dynamic correlation with upstream manufacturing processes such as chemical etching and water-based adhesive bonding, thus lacking a global closed-loop feedback mechanism.

[0004] In summary, current methods for inspecting touchscreens with mechanical travel are limited, lack dynamic coupling analysis of multi-dimensional electromechanical features, and cannot achieve automatic optimization and adjustment of process parameters based on defect classification. Summary of the Invention

[0005] This invention provides a method and apparatus for testing the surface function of a touch display screen, which solves the problems of touch displays with mechanical travel microstructures being easily damaged during testing, misjudgment of electromechanical performance due to separation, and lack of process closed-loop optimization feedback.

[0006] In a first aspect, the present invention provides a method for detecting the surface function of a touch display screen, comprising: Feature extraction is performed on the three-dimensional topographic data of the touch screen under test, the raised button area is identified, and the corresponding limit displacement threshold is calculated. The detection probe is controlled by the limit displacement threshold to apply a dynamic load to the raised button area, and the instantaneous load data, instantaneous displacement data and instantaneous capacitance data of the raised button area during the loading process are collected simultaneously. Based on the time-series correspondence between the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data, the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area are calculated. Based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics, state matching is performed under the preset judgment rules to obtain the corresponding defect classification results; Based on the defect classification results and historical detection operation data, detection results are dynamically generated.

[0007] Optionally, the step of extracting features from the collected three-dimensional topographic data of the touch screen under test, identifying the raised button area, and calculating the corresponding limit displacement threshold includes: Extract the flat areas from the three-dimensional topography data and use them as the reference plane height of the absolute coordinate system; Identify the raised button area and extract the height of the peak coordinates within the raised button area; Based on the reference plane height, the height of the peak coordinate, the preset rated compression stroke, and the tolerance margin, the limit displacement threshold used to characterize the safe compression distance is calculated and generated.

[0008] Optionally, the step of applying a dynamic load to the raised button area based on the limit displacement threshold control detection probe, and simultaneously collecting instantaneous load data, instantaneous displacement data, and instantaneous capacitance data of the raised button area during the loading process, includes: The detection probe is controlled to press down at a constant speed toward the raised button area, and the contact force fed back from the end of the detection probe is monitored in real time. When the contact force reaches the preset contact threshold, it is determined as the physical contact origin and a unified time reference is established. High-frequency synchronous sampling is initiated using the unified time reference. Before the probe's downward displacement reaches the limit displacement threshold, the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data are synchronously cached to generate a dynamic feature matrix with time as the independent variable.

[0009] Optionally, based on the time-series correspondence between the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data, the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area are calculated, including: Calculate the derivative of the instantaneous load data with respect to the instantaneous displacement data, and obtain the instantaneous stiffness sequence characterizing mechanical elasticity as the dynamic stiffness feature; Extract the first timestamp of reaching the preset rated stroke from the instantaneous displacement data; Set the reporting capacitance threshold of the touch chip, and extract the second timestamp that first meets the reporting capacitance threshold from the instantaneous capacitance data; The difference between the second timestamp and the first timestamp is calculated and used as the electromechanical synchronization feature.

[0010] Optionally, the step of performing state matching based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics under preset judgment rules to obtain the corresponding defect classification result includes: Evaluate the stationarity of the instantaneous stiffness sequence and the peak value of the instantaneous load data; If it is determined that the instantaneous stiffness sequence exhibits a step decrease with a sustained negative value, then the structural stiffness deficiency characteristic of hidden microcracks is output. If it is determined that the peak value of the instantaneous load data has triggered the ultimate load threshold before the instantaneous displacement data reaches the preset rated stroke, then output a defect indicating that the mechanical resistance exceeds the standard due to the front end etching being too shallow. If the difference is determined to be greater than the preset hysteresis threshold, or the instantaneous capacitance data does not meet the reporting capacitance threshold, then an electromechanical response disconnection defect indicating abnormal back-end bonding is output.

[0011] Optionally, after dynamically generating the detection results based on the defect classification results and historical detection operation data, the method further includes: The system statistically analyzes the defect classification results of each batch of touch screens within a historical period, and obtains the corresponding mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate. Based on the statistical results of the mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate, and preset traceability rules, a process update instruction for the front-end manufacturing workshop is generated. The process update instruction is then sent to the corresponding manufacturing execution system. The system receives status data from the manufacturing execution system after running based on the new process parameters, and uses this data for the optimization analysis of the detection rules in the next cycle.

[0012] In a second aspect, the present invention provides a touch display screen surface function detection device, comprising: The feature extraction module is used to extract features from the collected three-dimensional topography data of the touch screen under test, identify the raised button area and calculate the corresponding limit displacement threshold. The synchronous acquisition module is used to control the detection probe to apply a dynamic load to the raised button area based on the limit displacement threshold, and to synchronously acquire the instantaneous load data, instantaneous displacement data and instantaneous capacitance data of the raised button area during the loading process. The feature calculation module is used to process the time-series correspondence between the instantaneous load data, the instantaneous displacement data and the instantaneous capacitance data to calculate the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area. The state matching module is used to perform state matching based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics under preset judgment rules to obtain the corresponding defect classification results. The result generation module is used to dynamically generate detection results based on the defect classification results and historical detection operation data.

[0013] Thirdly, the present invention provides an electronic device including a processor and a memory, the memory storing computer-readable instructions that, when executed by the processor, perform the steps of the method provided in the first aspect above.

[0014] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, performs the steps of the method provided in the first aspect above.

[0015] Fifthly, the present invention provides a computer program product comprising a computer program that, when executed by a processor, performs the steps of the method provided in the first aspect above.

[0016] As can be seen from the above technical solutions, the present invention has the following advantages: This invention provides a method and apparatus for surface functional testing of touch screens. The method includes: extracting features from the collected three-dimensional topographic data of the touch screen under test to calculate a limit displacement threshold; applying a dynamic load based on the threshold and simultaneously acquiring instantaneous load, displacement, and capacitance data at high frequency; calculating dynamic stiffness characteristics and electromechanical synchronization characteristics, and obtaining defect classification results through state matching; finally, generating test results based on the classification results and feeding back process instructions. By establishing a safety protection threshold through 3D topographic recognition, non-destructive testing of irregularly shaped glass structures is achieved; by constructing a three-dimensional coupled data model of force, displacement, and capacitance, the misjudgment and missed judgment caused by the disconnect between mechanical feel and touch function are perfectly solved; simultaneously, based on the abrupt change in slope of dynamic stiffness, latent microcracks are captured, and process traceability feedback to the manufacturing system can be achieved based on defect characteristics, thereby significantly improving the detection accuracy and overall process yield of touch screens with mechanical travel. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a flowchart illustrating the steps of a method for detecting the surface function of a touch display screen according to an embodiment of the present invention. Figure 2 This is a flowchart illustrating the steps of a second embodiment of the method for detecting the surface function of a touch display screen according to the present invention. Figure 3 This is a structural block diagram of an embodiment of a touch display screen surface function detection device according to the present invention; Figure 4 This is a structural block diagram of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0019] Preferred embodiments of the invention will now be described in more detail with reference to the accompanying drawings. While preferred embodiments of the invention are shown in the drawings, it should be understood that the invention can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that the invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0020] This invention provides a method and apparatus for surface function testing of a touch display screen, which is used to coordinate and optimize the testing end and manufacturing end of a touch display screen with mechanical travel microstructure. This solves the problems of easy structural damage, misjudgment of electromechanical performance, and lack of process closed-loop optimization feedback in the prior art when testing glass buttons with back etched grooves and front protrusions.

[0021] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0022] Example 1 Please see Figure 1 , Figure 1 This is a flowchart illustrating the steps of a method for detecting the surface function of a touch display screen according to an embodiment of the present invention. The method includes: Step S101: Extract features from the collected three-dimensional topography data of the touch screen under test, identify the raised button area and calculate the corresponding limit displacement threshold. In this embodiment, because the back of a touchscreen display with mechanical travel (such as a TFT module with physical glass buttons) is thinned by chemical etching, the remaining glass thickness is extremely thin and fragile. First, a high-precision 3D line laser profilometer scans the entire surface of the screen under test to obtain point cloud data. The average height of the flat glass area is extracted as the reference plane for the absolute coordinate system, and the peak coordinates of the raised button area are identified. Based on the reference plane height, peak coordinate height, and a preset rated compression stroke and tolerance margin, the safe compression distance for that specific button, i.e., the limit displacement threshold, is dynamically calculated. This threshold is sent to the underlying driver to ensure physical-level crush protection during subsequent compression tests.

[0023] Step S102: Based on the limit displacement threshold, the detection probe is controlled to apply a dynamic load to the raised button area, and the instantaneous load data, instantaneous displacement data and instantaneous capacitance data of the raised button area during the loading process are collected simultaneously. In this embodiment, a robotic arm probe equipped with a six-axis force sensor and conductive rubber contacts is controlled to press down uniformly towards the center of the identified raised button area. When the force sensor detects that the contact force reaches a preset micro-contact threshold (e.g., 0.05N), it is determined as the physical contact origin and a unified time reference is established. High-frequency synchronous sampling (e.g., 2000Hz) is enabled based on this time reference. Before the probe's downward displacement reaches the limit displacement threshold, a dynamic coupling matrix with time as the independent variable is generated in memory in real time, strictly aligning the instantaneous load (characterizing mechanical resistance), instantaneous displacement (characterizing deformation depth), and instantaneous capacitance (characterizing touch sensitivity) on the same time axis.

[0024] Step S103: Based on the time sequence correspondence between the instantaneous load data, the instantaneous displacement data and the instantaneous capacitance data, the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area are calculated. In this embodiment, data from the aforementioned dynamic coupling matrix is ​​extracted in real time for feature calculation. On one hand, by calculating the derivative of instantaneous load with respect to instantaneous displacement, the instantaneous stiffness sequence characterizing the mechanical elasticity of the glass microstructure, i.e., the dynamic stiffness characteristic, is obtained; normally thinned glass should exhibit stable spring characteristics. On the other hand, the mechanical trigger timestamp when the pressure reaches the rated stroke is extracted from the displacement data, and the electrical trigger timestamp when the capacitance value exceeds the touch IC reporting threshold is extracted from the capacitance data. The difference between the two is calculated as the electromechanical synchronization characteristic, thereby quantifying the time lag between the physical press reaching the desired position and the screen responding to the light-up.

[0025] Step S104: Based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics, perform state matching under the preset judgment rules to obtain the corresponding defect classification results; In this embodiment, not only is a simple pass / fail judgment performed, but a precise defect classification is achieved through a preset expert rule matrix. Specifically: if the evaluation detects a sudden negative step drop in the instantaneous stiffness sequence, it indicates that brittle microcracks invisible to the naked eye have occurred inside the glass, releasing stress and reducing resistance; in this case, the defect result "insufficient structural stiffness" is output. If the load spikes to its limit before the probe reaches its rated stroke, it indicates that the front-end chemical etching depth is insufficient, resulting in excessive glass thickness; the defect result "excessive mechanical resistance" is output. If the mechanical curve is normal but the electromechanical synchronization hysteresis time is large or there is no electrical signal, it indicates that the underlying water-based adhesive is too thick or the sensor is abnormal; the defect result "electromechanical response disconnection" is output.

[0026] Step S105: Based on the defect classification results and historical detection operation data, dynamically generate detection results.

[0027] In this embodiment, defect classification results of each batch of touchscreens within a historical period are collected and analyzed to obtain the incidence rate of each defect. Based on these statistical data and preset traceability rules, the detection results can be automatically converted into process update instructions for the front-end manufacturing workshop and sent to the Manufacturing Execution System (MES). For example, when the defect rate of "excessive mechanical resistance" increases, an instruction will be generated to prompt the front-end etching workshop to increase the chemical concentration or extend the etching time. The status data after the new process is run will be received for closed-loop verification, thereby realizing continuous learning and updating of the entire manufacturing and inspection chain.

[0028] This invention provides a method for surface functional testing of a touch screen. It involves extracting features from the collected three-dimensional morphological data of the touch screen under test to calculate a limit displacement threshold; applying a dynamic load based on the threshold and simultaneously acquiring instantaneous load, displacement, and capacitance data at high frequency; calculating dynamic stiffness characteristics and electromechanical synchronization characteristics; and obtaining defect classification results through state matching; and dynamically generating test results based on the defect classification results and historical operating data. By establishing a safety protection threshold through 3D morphological recognition, non-destructive testing is achieved. The combined force, displacement, and capacitance three-dimensional temporal coupling model perfectly solves the misjudgment caused by the separation of electromechanical performance. Furthermore, based on dynamic stiffness mutations, microcrack capture and process traceability feedback are achieved, thereby significantly improving the detection accuracy and production line yield of touch screens with mechanical travel.

[0029] Example 2 Please see Figure 2 , Figure 2 This is a flowchart illustrating a second embodiment of the touch display surface function testing method of the present invention, the steps of which include: Step S201: Extract the flat area from the three-dimensional topography data and use it as the reference plane height of the absolute coordinate system; In this embodiment, the surface point cloud data obtained by 3D line laser scanning is filtered and fitted to remove noise, and then the conventional flat glass area on the touch screen that has not undergone etching or protrusion processing is extracted. The average Z-axis height of this flat area is set as the zero point of the absolute coordinate system (i.e., the reference plane height), providing a unified reference plane for subsequent depth calculations.

[0030] Step S202: Identify the raised button area and extract the height of the peak coordinates in the raised button area; In this embodiment, a lens-like solid glass button area is automatically located in the three-dimensional topography data using morphological image processing algorithms or height threshold segmentation methods. The three-dimensional coordinate points in the area are then traversed to extract the point with the largest Z-axis value, which is the peak coordinate of the raised button and its absolute height relative to the reference surface.

[0031] Step S203: Based on the reference plane height, the height of the peak coordinate, the preset rated compression stroke, and the tolerance margin, calculate and generate the limit displacement threshold used to characterize the safe compression distance; In practical implementation, due to thickness tolerances in the manufacturing of each glass button, a uniform pressing depth can easily crush thinner glass. The maximum safe pressing distance for a specific button is dynamically calculated using the formula (peak coordinate height - reference surface height + target rated pressing stroke + mechanical tolerance allowance). This limit displacement threshold is written into the servo controller as a hardware-level foolproof protection boundary.

[0032] In a specific implementation, the formula for calculating the ultimate displacement threshold is as follows:

[0033] In the formula, The limit displacement threshold characterizes the maximum legal downward displacement of the detection probe from the absolute reference plane. The height of the peak coordinates; The height of the reference plane; This refers to the physical height of the raised area on the front of the glass button; The rated downward stroke preset in the product specification sheet; Mechanical tolerance allowance introduced to account for machining errors.

[0034] This formula integrates 3D contour features with physical travel requirements, setting a robust "physical anti-collision wall" for the servo drive to ensure that the downward displacement will not break through the safety margin at the bottom.

[0035] Step S204: Control the detection probe to press down at a constant speed toward the raised button area, and monitor the contact force fed back from the end of the detection probe in real time; In this embodiment, a robotic arm equipped with a high-precision six-axis force sensor and conductive rubber contacts (used to simulate the capacitance characteristics of a real human finger) is controlled to press vertically downwards at a constant speed (e.g., 1 mm / s) toward the center coordinate of the raised button. The purpose of pressing down at a constant speed is to eliminate inertial force interference caused by acceleration and ensure that the subsequently acquired dynamic stiffness sequence has accurate physical meaning.

[0036] Step S205: When the contact force reaches the preset contact threshold, it is determined as the physical contact origin and a unified time reference is established. In this embodiment, the force sensor reading is close to zero when the mechanical probe descends in the air. The moment the force sensor detects a slight change in resistance that reaches the contact threshold (e.g., 0.05N), it determines that the probe is just touching the glass surface. At this point, the displacement encoder is immediately zeroed, and the current timestamp is recorded, serving as the "origin" for aligning all subsequent multidimensional data.

[0037] Step S206: High-frequency synchronous sampling is started with the unified time reference. Before the probe's downward displacement reaches the limit displacement threshold, the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data are synchronously cached to generate a dynamic feature matrix with time as the independent variable. In this embodiment, based on a unified time reference, data in three dimensions are synchronously recorded in memory at a high frequency (e.g., 1000Hz or higher). At this time, the depth of probe pressing down (displacement), the glass reaction force (load), and the digital signal (capacitance) fed back by the touch IC in the physical world are perfectly coupled in the same time matrix until the probe displacement triggers the limit displacement threshold or reaches the preset maximum thrust and then the pressing stops.

[0038] In the specific implementation, the dynamic feature matrix is ​​generated in memory in real time. The specific mathematical expression is as follows:

[0039] In the formula, This is a discrete sampling timestamp with the origin of physical contact as the zero point; , and These are the instantaneous load data, instantaneous displacement data, and instantaneous capacitance data that are synchronously latched at that moment.

[0040] By constructing this underlying coupling matrix, it is ensured that the "mechanical resistance" and "deformation depth" of the physical world and the "touch sensitivity" of the digital world are aligned with zero delay on the time axis, providing an absolutely reliable data source for subsequent calculation of cross-dimensional electromechanical synchronization features.

[0041] Step S207: Calculate the derivative of the instantaneous load data with respect to the instantaneous displacement data, and obtain the instantaneous stiffness sequence characterizing mechanical elasticity as the dynamic stiffness feature; In this embodiment, ΔF / ΔD (force change divided by displacement change) within each minute time step is calculated mathematically. This derivative sequence reflects the change in the "spring stiffness coefficient" of the glass button with thinning grooves during compression, and is a core physical characteristic for determining whether the internal structure of the glass is intact and whether the etching thickness is uniform.

[0042] In a specific implementation, the discrete-time derivative of the instantaneous stiffness sequence is calculated using the following formula:

[0043] In the formula, For sampling timestamp The dynamic stiffness eigenvalue at time t; and These are the instantaneous load data recorded at the current time and the previous sampling time, respectively; and These are the instantaneous displacement data recorded at the current time and the previous sampling time, respectively.

[0044] The formula extracts The sequence filters out interference from static mechanical characteristics and can reflect the microscopic changes in the "spring stiffness coefficient" of glass with thinning grooves during the dynamic yielding process in real time.

[0045] Step S208: Extract the first timestamp of reaching the preset rated stroke from the instantaneous displacement data; In this embodiment, the dynamic feature matrix is ​​traversed to find the moment when the actual downward displacement of the probe just reaches the standard mechanical stroke (e.g., 0.15mm) defined in the product specification, and this moment is recorded as the first timestamp, which represents the time point when the button is "fully pressed" at the physical level.

[0046] Step S209: Set the reporting capacitance threshold of the touch chip, and extract the second timestamp that first meets the reporting capacitance threshold from the instantaneous capacitance data; In this embodiment, when the touch IC is approached and pressed by a conductive probe, its raw data (original capacitance value) continuously increases. The first point in the data column where the capacitance value exceeds the factory-set trigger threshold is found and recorded as a second timestamp, which represents the time point at the digital level when the "screen responds and triggers the function".

[0047] Step S210: Calculate the difference between the second timestamp and the first timestamp, and use it as the electromechanical synchronization feature; In the specific implementation, the time difference (hysteresis) is obtained by subtracting the first timestamp from the second timestamp. If it is a perfect button, the screen should light up or trigger the button the instant it is physically pressed down, and this difference should be close to zero. This feature accurately quantifies the "sense of touch and response synchronization rate" in the user's real experience.

[0048] In a specific implementation, the calculation formula for the electromechanical synchronization feature is as follows:

[0049] In the formula, The electromechanical synchronization characteristic characterizes the time lag of the functional response relative to the physical pressing. The second timestamp (the moment when the digital touch signal reaches the reporting threshold); This is the first timestamp (the moment when the physical mechanical displacement reaches the rated downward stroke).

[0050] This formula aligns data across the physical and electrical layers in the time domain, quantifying the "touch and screen response synchronization rate" in the user's real-world experience with microsecond / millisecond precision.

[0051] Step S211: Evaluate the stationarity of the instantaneous stiffness sequence and the peak value of the instantaneous load data; In this embodiment of the application, the smoothness of the acquired instantaneous stiffness sequence is checked, and the maximum force generated during the entire pressing cycle is monitored to see if it exceeds the safe yield limit of the glass, so as to provide a basis for subsequent classification and interception.

[0052] Step S212: If it is determined that the instantaneous stiffness sequence has a continuous negative step decrease, then output the structural stiffness deficiency defect that characterizes the hidden microcrack. In this embodiment, the normal elastic deformation stiffness should remain positive. If the stiffness suddenly becomes negative during the compression process (i.e., the displacement increases but the resistance decreases instantaneously), it means that cleavage or microscopic brittle fracture (microcracks) has occurred inside the glass due to stress concentration. This defect cannot be detected by traditional optical detection, but this method captures this feature and directly outputs the structural abnormality defect.

[0053] In the specific implementation, considering that the six-axis force sensor may have background noise or slight external vibration interference under high-frequency sampling, in order to avoid misjudgment, the determination of a step drop in the instantaneous stiffness sequence with a continuous negative value specifically includes a time constraint condition: continuously monitor the sequence state, and only when the condition is met... Furthermore, this abnormal state persists for more than the preset microcrack filtering time threshold on the time axis (e.g., Only when the time constraint is met is it confirmed as a valid step. By introducing this time constraint, high-frequency noise can be accurately eliminated, and the real "instantaneous stress release (force unloading)" can be identified as an irreversible microscopic brittle fracture occurring inside the glass groove. This allows for the extremely accurate output of structural stiffness deficiencies that characterize latent microcracks.

[0054] Step S213: If it is determined that the peak value of the instantaneous load data has triggered the ultimate load threshold before the instantaneous displacement data reaches the preset rated stroke, then output a defect indicating that the mechanical resistance exceeds the standard due to the shallow front-end etching. In this embodiment, if the force is so great as to crush the glass before the probe reaches the specified depth, an emergency stop and retraction will be triggered immediately. This directly indicates that the chemical etching process on the back of this batch of glass is not deep enough, and the residual glass is too thick and hard, causing the user to be unable to press it, thus outputting a defect of excessive mechanical resistance.

[0055] In practical implementation, to achieve two-way safety protection for both precision testing instruments and the product under test, when a defect of excessive mechanical resistance is detected, the underlying servo control system will be linked to trigger a hardware-level protection response: once the instantaneous load... Touching or exceeding the ultimate load threshold (For example, set as the ultimate yield load of glass) Regardless of whether the current displacement has reached the rated stroke, the underlying servo driver immediately cuts off the downward pulse and triggers an "emergency stop and reverse zeroing" action. This implementation detail not only outputs defect classification results within milliseconds, but also completely avoids the risk of glass buttons being crushed due to the probe being forced down due to excessively thick front-end etching through a physical-level anti-crushing protection mechanism.

[0056] Step S214: If it is determined that the difference is greater than the preset hysteresis threshold, or the instantaneous capacitance data does not meet the reporting capacitance threshold, then output an electromechanical response disconnection defect that indicates abnormal back-end bonding. In the embodiments of this application, if the stiffness and travel are normal, it indicates that the glass button is physically sound. However, if the hysteresis time is too long, or even if the capacitor signal is weak when pressed all the way down, it is usually because the back-end adhesive (OCA) is too thick, or the impedance of the touch sensor traces is abnormal, causing the probe's electric field to be unable to penetrate effectively. This results in an electrical defect where the electromechanical response is disconnected.

[0057] Step S215: Statistically analyze the defect classification results of each batch of touch screen displays within the historical period, and obtain the corresponding mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate; based on the statistical results of the mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate and the preset traceability rules, generate a process update instruction for the front-end manufacturing workshop; send the process update instruction to the corresponding manufacturing execution system; receive the status data fed back by the manufacturing execution system after running based on the new process parameters, and use it for the detection rule optimization analysis of the next cycle.

[0058] In this embodiment of the application, the test results of each device are aggregated to the cloud or local server in real time, and the occurrence ratio and trend of the three major categories of defects (too hard, too soft / damaged, and electrical insensitivity) are statistically analyzed by hour or shift.

[0059] In its implementation, an expert diagnostic matrix is ​​embedded. If the "mechanical resistance exceeding the standard rate" increases, it indicates that the glass is generally too hard recently, and an instruction will be generated to the chemical workshop to increase the concentration of the etching solution or extend the etching time; if the "electromechanical response disconnect rate" increases, an instruction will be generated to the bonding workshop to reduce the thickness of the water-based adhesive, thus achieving a closed loop of inferring the cause from the result.

[0060] In this embodiment of the application, the generated process update instructions and related parameter adjustment suggestions are sent in a structured manner to the factory's Manufacturing Execution System (MES) through the Industrial Internet communication protocol, reminding the PLC control system or process engineer in the relevant workshop to intercept and optimize them.

[0061] In this embodiment, after the current workshop performs a process update, it will continuously receive test data for new batches of products. If the electromechanical synchronization characteristics of the new batch are found to be improved and the defect rate decreases, the adjusted parameters will be stored in the database as a positive sample, continuously iterating and optimizing the inspection and manufacturing standards of the entire factory.

[0062] To more clearly illustrate the application of the above steps in actual industrial scenarios, let's take the testing process of a "15.6-inch TFT module with a 3D glass solid Home button" in the center console of a high-end new energy vehicle as an example.

[0063] 1. Parameter presets and physical structure background: Material dimensions: The original thickness of the high-alumina silicon cover glass is [missing information]. .

[0064] Microstructure dimensions: The diameter of the circular raised button on the front is [missing information]. The back of the button is chemically etched to create a circular groove with an etching depth of [insert depth here]. That is, the remaining glass thickness at the groove is only... .

[0065] Process parameters: Reference plane height Peak height of the protrusion Target rated downward stroke (Simulating the crisp tactile feedback of real buttons), mechanical tolerance allowance Ultimate protection load .

[0066] Sampling frequency: Set the high-frequency sampling rate to [value]. (i.e., sampling interval) ).

[0067] Capacitor reporting threshold: set to The hysteresis detection threshold is set to... .

[0068] 2. Data flow process for normal, good products: S201-S203: Calculate the ultimate displacement threshold .

[0069] S204-S206: Probe is pressed down, under force Triggering the origin The probe continues to press down, and the matrix synchronizes and buffers. , , .

[0070] S207-S208: In At that time, the probe displacement just reached At this time, the force recorded by the sensor is (Reasonable elastic resistance). Extract the first timestamp. The instantaneous stiffness sequence within this time period Stable at The positive range.

[0071] S209: In the following At that time, the touch IC reporting capacitor rose to (Crossing the threshold), extract the second timestamp. .

[0072] S210-S214: Calculation of electromechanical synchronization characteristics . The batch No negative step (no microcracks), under stress (Not exceeding the standard), and (Excellent synchronization). Output: Good product passed.

[0073] 3. Process anomaly feedback and closed-loop optimization throughout the entire process (NG scenario): Detection and interception: When detecting the second batch, the probe only reaches a certain displacement. (far from reaching) When the sensor load is... It has surged to Trigger an emergency stop. Determine that the slope of the mechanical curve is abnormal, and directly output "mechanical resistance exceeds standard defect" according to step S213.

[0074] Statistics and Instruction Generation (S215): The defect rate was found to be [missing information] within a shift. surge to Expert matrix analysis concluded that the glass is too hard, and the remaining thickness must be greater than the set value. Automatically generated traceability update command: "Insufficient front-end chemical etching depth, excessively thick residual grooves; it is recommended to increase the etching solution concentration in etching tank No. 2." Or the etching time is extended The instruction was sent to the factory's MES system via API. The MES system then scheduled the front-end equipment to complete the parameter correction. Two hours later, the batch produced using the new process entered the inspection station, where the new batch was detected. When the force recovers to The defect rate dropped to Thus, the entire lifecycle of data flow, from 3D topography localization and multi-dimensional matrix detection to closed-loop optimization of the front-end manufacturing process, has been completed.

[0075] This invention provides a method for surface function testing of touch displays. By refining three-dimensional topography positioning and safety threshold calculation, combined with dynamic feature matrix generation based on high-frequency synchronous sampling of force, displacement, and capacitance, it achieves deep coupling calculation of the electromechanical characteristics of irregularly shaped glass buttons. In particular, by introducing calculus operations of instantaneous stiffness sequences and electromechanical timestamp difference calculations, it can accurately penetrate the surface appearance and locate deep-seated process problems such as hidden micro-cracks, shallow etching, and abnormal bonding. Based on the above high-granularity defect classification results, the closed-loop linkage MES system issues process update instructions, realizing an automated upgrade from end-side intelligent quality inspection to global process optimization, significantly reducing the misjudgment rate, breakage rate, and overall manufacturing cost of touch screens with mechanical travel.

[0076] Example 3 Please see Figure 3 , Figure 3 This is a structural block diagram of an embodiment of a touch display screen surface function detection device according to the present invention. The device includes: The feature extraction module 301 is used to extract features from the three-dimensional shape data of the collected touch screen under test, identify the raised button area and calculate the corresponding limit displacement threshold. The synchronous acquisition module 302 is used to control the detection probe to apply a dynamic load to the raised button area based on the limit displacement threshold, and synchronously acquire the instantaneous load data, instantaneous displacement data and instantaneous capacitance data of the raised button area during the loading process. The feature calculation module 303 is used to process the time sequence correspondence between the instantaneous load data, the instantaneous displacement data and the instantaneous capacitance data to calculate the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area. The state matching module 304 is used to perform state matching based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics under a preset judgment rule to obtain the corresponding defect classification result. The result generation module 305 is used to dynamically generate detection results based on the defect classification results and historical detection operation data.

[0077] In an optional embodiment, the feature extraction module includes: The reference plane extraction submodule is used to extract the flat areas in the three-dimensional topography data as the reference plane height of the absolute coordinate system. The peak coordinate extraction submodule is used to identify the raised button area and extract the height of the peak coordinates in the raised button area. The threshold calculation submodule is used to calculate and generate the limit displacement threshold, which characterizes the safe compression distance, based on the reference plane height, the height of the peak coordinate, the preset rated compression stroke, and the tolerance margin.

[0078] In an optional embodiment, the synchronous acquisition module includes: The pressure monitoring submodule is used to control the detection probe to press down uniformly onto the raised button area and to monitor the contact force fed back from the end of the detection probe in real time. The origin determination submodule is used to determine the physical contact origin and establish a unified time reference when the contact force reaches a preset contact threshold. The high-frequency sampling submodule is used to start high-frequency synchronous sampling with the unified time reference. Before the probe's downward displacement reaches the limit displacement threshold, it synchronously caches the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data to generate a dynamic feature matrix with time as the independent variable.

[0079] In an optional embodiment, the feature calculation module includes: The stiffness calculation submodule is used to calculate the derivative of the instantaneous load data with respect to the instantaneous displacement data, and obtain the instantaneous stiffness sequence characterizing mechanical elasticity as the dynamic stiffness feature; The first timestamp extraction submodule is used to extract the first timestamp of reaching the preset rated stroke from the instantaneous displacement data; The second timestamp extraction submodule is used to set the reporting capacitance threshold of the touch chip and extract the second timestamp that first meets the reporting capacitance threshold from the instantaneous capacitance data. The time difference calculation submodule is used to calculate the difference between the second timestamp and the first timestamp as the electromechanical synchronization feature.

[0080] In an optional embodiment, the state matching module includes: The stability assessment submodule is used to assess the stability of the instantaneous stiffness sequence and the peak value of the instantaneous load data; The microcrack determination submodule is used to output a structural stiffness deficiency that characterizes a hidden microcrack when the instantaneous stiffness sequence shows a step drop with a continuous negative value. The resistance exceeding the standard determination submodule is used to output a mechanical resistance exceeding the standard defect characterized by the front end etching being too shallow when it is determined that the peak value of the instantaneous load data has triggered the ultimate load threshold before the instantaneous displacement data reaches the preset rated stroke. The decoupling defect determination submodule is used to output an electromechanical response decoupling defect that indicates abnormal back-end bonding when the difference is greater than a preset hysteresis threshold or the instantaneous capacitance data does not meet the reporting capacitance threshold.

[0081] In an optional embodiment, the result generation module includes: The defect statistics submodule is used to statistically analyze the defect classification results of each batch of touch screens within a historical period, and obtain the corresponding mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate. The instruction generation submodule is used to generate process update instructions for the front-end manufacturing workshop based on the statistical results of the mechanical resistance exceedance rate, the structural stiffness deficiency rate, and the electromechanical response disconnection rate and the preset traceability rules. The instruction issuing submodule is used to issue the process update instruction to the corresponding manufacturing execution system; The status feedback receiving submodule is used to receive status data fed back by the manufacturing execution system after running based on the new process parameters, and to use it for the detection rule optimization analysis of the next cycle.

[0082] Example 4 Based on the same inventive concept, embodiments of the present invention also provide an electronic device. Figure 4 This is a structural block diagram of an electronic device provided in an embodiment of the present invention. Figure 4As shown, an embodiment of the present invention provides an electronic device including: one or more processors 401, a memory 402, and one or more I / O interfaces 403. The memory 402 stores one or more programs, which, when executed by the one or more processors, cause the one or more processors to implement any of the touch display surface function detection methods described in the above embodiments; the one or more I / O interfaces 403 are connected between the processor and the memory, configured to enable information interaction between the processor and the memory.

[0083] Among them, processor 401 is a device with data processing capabilities, including but not limited to central processing unit (CPU); memory 402 is a device with data storage capabilities, including but not limited to random access memory (RAM, more specifically SDRAM, DDR, etc.), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory (FLASH); I / O interface (read-write interface) 403 is connected between processor 401 and memory 402, and can realize information interaction between processor 401 and memory 402, including but not limited to data bus (Bus).

[0084] In some embodiments, the processor 401, memory 402, and I / O interface 403 are interconnected via bus 404, and thus connected to other components of the computing device.

[0085] In some embodiments, the one or more processors 401 include a field-programmable gate array.

[0086] Example 5 This invention also provides a computer storage medium storing a computer program thereon, wherein the computer program, when executed by the processor, implements the steps of a touch display surface function detection method according to any embodiment.

[0087] Example 6 This invention also provides a computer program product, including a computer program that, when executed by the processor, implements the steps of a touch display surface function detection method according to any embodiment.

[0088] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0089] In the several embodiments provided in this application, it should be understood that the methods, apparatuses, electronic devices, and storage media disclosed in this invention can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual couplings, direct couplings, or communication connections may be through some interfaces; indirect couplings or communication connections between devices or units may be electrical, mechanical, or other forms.

[0090] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0091] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0092] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a readable storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned readable storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0093] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for detecting the surface function of a touch display screen, characterized in that, include: Feature extraction is performed on the three-dimensional topographic data of the touch screen under test, the raised button area is identified, and the corresponding limit displacement threshold is calculated. The detection probe is controlled by the limit displacement threshold to apply a dynamic load to the raised button area, and the instantaneous load data, instantaneous displacement data and instantaneous capacitance data of the raised button area during the loading process are collected simultaneously. Based on the time-series correspondence between the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data, the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area are calculated. Based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics, state matching is performed under the preset judgment rules to obtain the corresponding defect classification results; Based on the defect classification results and historical detection operation data, detection results are dynamically generated.

2. The method for detecting the surface function of a touch display screen according to claim 1, characterized in that, The step of extracting features from the collected three-dimensional topographic data of the touch screen under test, identifying the raised button area, and calculating the corresponding limit displacement threshold includes: Extract the flat areas from the three-dimensional topography data and use them as the reference plane height of the absolute coordinate system; Identify the raised button area and extract the height of the peak coordinates within the raised button area; Based on the reference plane height, the height of the peak coordinate, the preset rated compression stroke, and the tolerance margin, the limit displacement threshold used to characterize the safe compression distance is calculated and generated.

3. The method for detecting the surface function of a touch display screen according to claim 1, characterized in that, The detection probe, based on the limit displacement threshold, applies a dynamic load to the raised button area and simultaneously collects instantaneous load data, instantaneous displacement data, and instantaneous capacitance data of the raised button area during the loading process, including: The detection probe is controlled to press down at a constant speed toward the raised button area, and the contact force fed back from the end of the detection probe is monitored in real time. When the contact force reaches the preset contact threshold, it is determined as the physical contact origin and a unified time reference is established. High-frequency synchronous sampling is initiated using the unified time reference. Before the probe's downward displacement reaches the limit displacement threshold, the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data are synchronously cached to generate a dynamic feature matrix with time as the independent variable.

4. The method for detecting the surface function of a touch display screen according to claim 1, characterized in that, Based on the time-series correspondence between the instantaneous load data, the instantaneous displacement data, and the instantaneous capacitance data, the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area are calculated, including: Calculate the derivative of the instantaneous load data with respect to the instantaneous displacement data, and obtain the instantaneous stiffness sequence characterizing mechanical elasticity as the dynamic stiffness feature; Extract the first timestamp of reaching the preset rated stroke from the instantaneous displacement data; Set the reporting capacitance threshold of the touch chip, and extract the second timestamp that first meets the reporting capacitance threshold from the instantaneous capacitance data; The difference between the second timestamp and the first timestamp is calculated and used as the electromechanical synchronization feature.

5. The method for detecting the surface function of a touch display screen according to claim 4, characterized in that, The process of performing state matching based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics under preset judgment rules to obtain the corresponding defect classification results includes: Evaluate the stationarity of the instantaneous stiffness sequence and the peak value of the instantaneous load data; If it is determined that the instantaneous stiffness sequence exhibits a step decrease with a sustained negative value, then the structural stiffness deficiency characteristic of hidden microcracks is output. If it is determined that the peak value of the instantaneous load data has triggered the ultimate load threshold before the instantaneous displacement data reaches the preset rated stroke, then output a defect indicating that the mechanical resistance exceeds the standard due to the front end etching being too shallow. If the difference is determined to be greater than the preset hysteresis threshold, or the instantaneous capacitance data does not meet the reporting capacitance threshold, then an electromechanical response disconnection defect indicating abnormal back-end bonding is output.

6. The method for detecting the surface function of a touch display screen according to claim 1, characterized in that, After dynamically generating the detection results based on the defect classification results and historical detection operation data, the method further includes: The system statistically analyzes the defect classification results of each batch of touch screens within a historical period, and obtains the corresponding mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate. Based on the statistical results of the mechanical resistance exceeding rate, structural stiffness insufficient rate, and electromechanical response disconnection rate, and preset traceability rules, a process update instruction for the front-end manufacturing workshop is generated. The process update instruction is then sent to the corresponding manufacturing execution system. The system receives status data from the manufacturing execution system after running based on the new process parameters, and uses this data for the optimization analysis of the detection rules in the next cycle.

7. A surface function testing device for a touch screen display, characterized in that, include: The feature extraction module is used to extract features from the collected three-dimensional topography data of the touch screen under test, identify the raised button area and calculate the corresponding limit displacement threshold. The synchronous acquisition module is used to control the detection probe to apply a dynamic load to the raised button area based on the limit displacement threshold, and to synchronously acquire the instantaneous load data, instantaneous displacement data and instantaneous capacitance data of the raised button area during the loading process. The feature calculation module is used to process the time-series correspondence between the instantaneous load data, the instantaneous displacement data and the instantaneous capacitance data to calculate the dynamic stiffness characteristics and electromechanical synchronization characteristics of the raised button area. The state matching module is used to perform state matching based on the dynamic stiffness characteristics and the electromechanical synchronization characteristics under preset judgment rules to obtain the corresponding defect classification results. The result generation module is used to dynamically generate detection results based on the defect classification results and historical detection operation data.

8. An electronic device, characterized in that, include: processor; The memory is used to store processor-executable instructions; The processor executes the touch display surface function detection method as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the touch display surface function detection method as described in any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the touch display surface function detection method as described in any one of claims 1 to 6.

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