System for calibrating a step gauge

Abstract

The present disclosure provides a system for calibrating a step gauge, comprising a length measuring machine and a bearing table configured to set the step gauge, the step gauge comprising a plurality of gauge blocks arranged in a straight line, the bearing table being configured to adjust the posture of the step gauge, the length measuring machine comprising a guide rail, a measuring seat and a measuring head arranged on the measuring seat, the measuring seat being configured to be movable along the guide rail, the measuring head being configured to be movable in a direction orthogonal to the guide rail, the measuring seat being configured to make the measuring head contact a surface to be measured when moving along the guide rail, and in response to a measurement value for characterizing the force of the measuring head reaching a preset range, recording the position of the measuring seat as the position of the surface to be measured, wherein the surface to be measured is the surface to be measured of a gauge block in the plurality of gauge blocks. Thus, the equipment cost of measuring the step gauge can be reduced.

Description

[0001] This application is a divisional application of the patent application filed on June 4, 2025, with application number 2025107397551, entitled "Measuring Method and System of Stride Gauge Based on Length Measuring Machine". Technical Field

[0002] This disclosure relates to the intelligent manufacturing equipment industry, and in particular to a system for calibrating step gauges. Background Technology

[0003] A step gauge is a high-precision measuring instrument consisting of multiple gauge blocks arranged in a straight line. It is widely used for calibrating coordinate measuring machines and inspecting the movement accuracy of machine tool tables. To ensure the accuracy of the step gauge, it needs to be calibrated before use, which requires measuring each gauge block.

[0004] Currently, the measurement of step gauges mainly relies on the combined use of a coordinate measuring machine (CMM) and a laser interferometer. The laser interferometer's reflector and the step gauge are mounted on the CMM's worktable, and the optical path is adjusted so that the laser beam is parallel to the direction of the worktable's movement. The CMM is then used to aim at each face of the step gauge, and the readings are measured using the laser interferometer's indication.

[0005] However, existing step gauge measurement methods suffer from high equipment costs. Coordinate measuring machines and laser interferometers are both high-precision metrology devices, which are not only expensive to purchase but also require regular maintenance and calibration, resulting in high operating costs. Furthermore, the operation and maintenance of these devices require specialized technicians, further increasing labor costs. Summary of the Invention

[0006] This disclosure is made in view of the above-mentioned situation, and its purpose is to provide a step gauge measurement method and system based on a length measuring machine that can reduce the equipment cost of measuring step gauges.

[0007] Therefore, a first aspect of this disclosure provides a step gauge measurement method based on a length measuring machine. The length measuring machine includes a guide rail, a measuring seat disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring seat. The step gauge includes a plurality of gauge blocks arranged in a straight line. The step gauge is disposed on one side of the guide rail via a support platform, with the direction of the guide rail as a first axis. The step gauge measurement method includes: making the step gauge parallel to the guide rail; controlling the probe to move in a direction perpendicular to the first axis and controlling the measuring seat to move along the guide rail to make the probe contact the surface to be measured, wherein the surface to be measured is the surface of the gauge block among the plurality of gauge blocks, wherein, for adjacent gauge blocks among the plurality of gauge blocks, the surface to be measured near the gap between the adjacent gauge blocks is called the gap surface; the probe first moves to the gap between the adjacent gauge blocks and then contacts the gap surface; and in response to the force on the probe, as indicated by the measured value of the probe, reaching a preset range, the position of the measuring seat is recorded as the position of the surface to be measured.

[0008] In the first aspect of this disclosure, using a length measuring machine to measure the step gauge to obtain the position of the surface to be measured (i.e., measuring the position of the surface to be measured) can reduce the equipment cost of measuring the step gauge. Furthermore, by using the position of the measuring seat unique to the length measuring machine to determine the position of the surface to be measured, and combining this with the measurement value of the measuring head unique to the length measuring machine as a basis, the position of the measuring seat is recorded when the force on each surface to be measured remains essentially the same, ensuring the consistency of measurement conditions and thus improving the accuracy of measuring the step gauge. Additionally, placing the step gauge on one side of the guide rail avoids limiting the movement range of the measuring seat during measurement, thereby increasing the measurement range of the step gauge's length. It also prevents the measuring seat from colliding with the step gauge, thus avoiding damage to the measuring seat or the step gauge. Furthermore, it reduces the positional requirements of the measuring head and minimizes modifications to the original structure of the length measuring machine. Moreover, placing the step gauge on one side of the guide rail via a support platform can fix the step gauge during measurement, reducing interference caused by step gauge wobbling, and also facilitates adjusting the posture of the step gauge via the support platform. In addition, the probe first moves to the gap between adjacent gauge blocks and then contacts the gap surface. The step-by-step operation makes it easy to control the movement speed of different steps, which can balance measurement efficiency and the safety of the probe or the surface to be measured.

[0009] Furthermore, in the step gauge measurement method according to the first aspect of this disclosure, optionally, a second axis is defined as a direction that is in the same horizontal plane as the first axis and perpendicular to the first axis, and the probe is parallel to the second axis. In this case, when the step gauge is placed on one side of the guide rail, the probability of the probe hitting the bottom of the step gauge can be reduced, thereby reducing the risk of damaging the probe. In addition, having the probe parallel to the second axis also improves the ease of controlling the probe.

[0010] Furthermore, in the step gauge measurement method according to the first aspect of this disclosure, optionally, a second axis is defined as a direction that is in the same horizontal plane as the first axis and perpendicular to the first axis, and a third axis is defined as a direction that is perpendicular to both the first axis and the second axis. The support platform can rotate or tilt at least around the second axis and the third axis. This allows for adjustment of the step gauge's posture.

[0011] Furthermore, in the step gauge measurement method according to the first aspect of this disclosure, optionally, making the step gauge parallel to the guide rail includes: controlling the measuring seat to move along the guide rail so that the probe contacts a reference surface, the reference surface being one surface of one of the plurality of gauge blocks; repeating the following steps until the change in the measured value of the probe during the current reciprocating movement is not greater than a preset value; controlling the probe to reciprocate in the direction of the second axis, and adjusting the support platform to rotate about the third axis in response to the change being greater than the preset value; and repeating the following steps until the change is not greater than the preset value: controlling the probe to reciprocate in the direction of the third axis, and adjusting the support platform to rotate about the second axis in response to the change being greater than the preset value. This facilitates making the step gauge parallel to the guide rail.

[0012] Furthermore, in the step gauge measurement method according to the first aspect of this disclosure, optionally, the measuring seat is controlled to move along the guide rail to align the probe with the gap; the probe is controlled to move in a direction perpendicular to the first axis to allow the probe aligned with the gap to enter the gap; and the measuring seat is controlled to move along the guide rail to allow the probe located in the gap to contact the gap surface. This further balances measurement efficiency and improves the safety of the probe or the surface to be measured.

[0013] Furthermore, in the step gauge measurement method according to the first aspect of this disclosure, optionally, the gap surface includes a first and a second surface to be measured opposite each other. After the probe moves to the gap, it first contacts the first surface to be measured to measure the position of the first surface to be measured, then contacts the second surface to be measured to measure the position of the second surface to be measured, and then measures the position of the next gap surface. This helps to reduce the travel time of the probe and improve measurement efficiency.

[0014] Additionally, in the step gauge measurement method according to the first aspect of this disclosure, optionally, the probe is mounted on the measuring seat by a clamp; the clamp is configured to control the movement of the probe in a direction perpendicular to the first axis. In this case, the combination of the measuring seat and the clamp enables the probe to move in multiple mutually perpendicular directions, thereby facilitating the movement of the probe to a target position (e.g., an adjacent area of ​​the surface to be measured).

[0015] Furthermore, in the step gauge measurement method according to the first aspect of this disclosure, optionally, the fixture includes a pressure plate, a vertical slider, and a horizontal push rod; the pressure plate is mounted on the measuring base; the vertical slider is disposed on the side wall of the pressure plate in a manner movable in the vertical direction; the horizontal push rod is disposed on the vertical slider in a manner movable in the horizontal direction and is connected to the probe. This facilitates control of the probe's movement in the directions of the second axis and the third axis.

[0016] Additionally, in the step gauge measurement method according to the first aspect of this disclosure, optionally, the measuring seat includes a drive wheel for controlling the movement of the measuring seat along the guide rail, and a fine-tuning wheel for controlling the slight movement of the measuring seat along the guide rail; the drive wheel controls the movement of the measuring seat along the guide rail so that the probe is in one of the following states: aligned with an adjacent area of ​​the surface to be measured and in contact with or away from the surface to be measured; after the probe contacts the surface to be measured, the fine-tuning wheel controls the slight movement of the measuring seat along the guide rail so that the force on the probe represented by the measured value reaches the preset range. In this case, it is convenient to move to the vicinity of the target area at a higher speed by the drive wheel, reducing the travel time to improve measurement efficiency, and then adjust slowly by the fine-tuning wheel to reduce positioning errors caused by inertia or overshoot.

[0017] A second aspect of this disclosure provides a step gauge measurement system based on a length measuring machine, including a length measuring machine and a support platform. The length measuring machine includes a guide rail, a measuring seat disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring seat. The step gauge includes a plurality of gauge blocks arranged in a straight line. The step gauge is disposed on one side of the guide rail via the support platform. With the direction of the guide rail as a first axis, when measuring the surface to be measured by the step gauge, the probe moves in a direction perpendicular to the first axis, and the measuring seat moves along the guide rail to make the probe contact the surface to be measured. For adjacent gauge blocks among the plurality of gauge blocks, the surface to be measured near the gap between the adjacent gauge blocks is called the gap surface. The probe first moves to the gap between the adjacent gauge blocks and then contacts the gap surface. In response to the force on the probe, as indicated by the measured value of the probe, reaching a preset range, the position of the measuring seat is recorded and used as the position of the surface to be measured. The surface to be measured is the surface to be measured of the gauge blocks among the plurality of gauge blocks.

[0018] According to this disclosure, a step gauge measurement method and system based on a length measuring machine are provided, which can reduce the equipment cost of measuring step gauges. Attached Figure Description

[0019] This disclosure will now be explained in further detail by way of example only with reference to the accompanying drawings.

[0020] Figure 1 This is a schematic diagram illustrating the measurement environment of the step gauge involved in the example of this disclosure.

[0021] Figure 2 This is a schematic diagram showing the assembly of the length measuring machine and fixture involved in the example of this disclosure.

[0022] Figure 3 This is a schematic diagram illustrating the user interface involved in the examples of this disclosure.

[0023] Figure 4 This is an exemplary plan view illustrating the step gauge involved in the examples of this disclosure.

[0024] Figure 5 This is a schematic diagram illustrating the assembly of the fixture and probe involved in the example of this disclosure.

[0025] Figure 6 This is an exemplary flowchart illustrating the measurement method involved in the examples of this disclosure.

[0026] Figure 7 This is an exemplary flowchart illustrating how the step gauge is parallel to the guide rail, as described in this disclosure.

[0027] Figure 8 This is a schematic diagram illustrating the positional change of the probe when measuring the gap surface between adjacent gauge blocks, as described in the example of this disclosure.

[0028] Figure 9 This is an exemplary flowchart illustrating an example of bringing a probe into contact with the gap surface of an adjacent gauge block, as described in this disclosure.

[0029] Figure 10 This is an exemplary flowchart illustrating one implementation of the measurement method involved in this disclosure. Detailed Implementation

[0030] Hereinafter, preferred embodiments of the present disclosure will be described in detail with reference to the accompanying drawings. In the following description, the same reference numerals are used for the same components, and repeated descriptions are omitted. Furthermore, the drawings are merely schematic diagrams, and the proportions of the components or the shapes of the components may differ from actual figures. It should be noted that the terms "comprising" and "having," and any variations thereof, in this disclosure, do not necessarily limit the process, method, system, product, or apparatus to the explicitly listed steps or units, but may include or have other steps or units not explicitly listed or inherent to these processes, methods, products, or apparatuses.

[0031] To address the aforementioned problems, the inventors, after research, proposed a solution based on a length measuring machine, which utilizes the length measuring machine to measure the step gauge. This reduces the equipment cost for measuring the step gauge. Specifically, the inventors modified the existing length measuring machine structure, changing the usual measurement method where the workpiece is placed on the machine's guide rail. Instead, the step gauge is placed on one side of the guide rail, enabling the measurement of the step gauge using the length measuring machine (i.e., realizing the application of the length measuring machine in step gauge measurement).

[0032] Furthermore, for ease of description, the surface of the gauge block to be measured among the multiple gauge blocks of the step gauge will be referred to as the measured surface. The direction of the guide rail of the length measuring machine is taken as the first axis, the direction in the same horizontal plane as the first axis and perpendicular to it is taken as the second axis, and the direction perpendicular to both the first and second axes is taken as the third axis. Taking the direction of the guide rail as the horizontal direction as an example, the direction of the first axis can be horizontal, the direction of the second axis can be another horizontal direction perpendicular to the direction of the first axis, and the direction of the third axis can be vertical. In some examples, the first axis can be called the X-axis, the second axis the Y-axis, and the third axis the Z-axis.

[0033] Figure 1 This is a schematic diagram illustrating the measurement environment of the step gauge 200 involved in the example of this disclosure. Wherein, Figure 1 A portion of the length measuring machine 100 is shown in the image.

[0034] In some examples, the step gauge measurement method (described later) described in this disclosure can be applied to, for example, Figure 1 The measurement environment shown is intended to limit this disclosure.

[0035] In some examples, reference Figure 1 The measurement environment may include a length measuring machine 100 and a step gauge 200. The length measuring machine 100 may be configured to measure the position of the surface 211 to be measured by the step gauge 200, thereby enabling measurement of the step gauge 200. In some examples, the measurement environment may also include a support platform 300, which may be configured to support (e.g., support or fix) the step gauge 200. In some examples, the measurement environment may also include a clamp 400, which may be configured to clamp the probe 130 (described later) of the length measuring machine 100 and control the movement of the probe 130 in the non-guide rail direction of the length measuring machine 100.

[0036] Additionally, the length measuring machine 100 can be a length measuring instrument. That is, the length measuring machine 100 can be configured to measure the length parameters of the workpiece being measured. In some examples, the length measuring machine 100 can be a contact length measuring machine. In some examples, the contact length measuring machine can include at least one of a grating length measuring machine and a mechanical length measuring machine.

[0037] In some examples, the length measuring machine 100 can be configured to determine the position information of a corresponding position of the workpiece being measured (e.g., the position of the surface 211 to be measured on the step gauge 200) using the position of its measuring seat 120 (described later). For example, the measuring seat 120 can be moved so that the probe 130 of the length measuring machine 100 contacts the workpiece, and the position of the measuring seat 120 corresponding to the corresponding position of the workpiece can be sampled to obtain the position information of that position. In some examples, the length measuring machine 100 can be configured to determine the position information of a corresponding position of the workpiece using the position of its measuring seat 120 and the measurement value of the probe 130. In some examples, the measuring seat 120 may also be referred to as a head seat.

[0038] Figure 2 This is a schematic diagram showing the assembly of the length measuring machine 100 and the fixture 400 involved in the example of this disclosure. Figure 3 This is a schematic diagram illustrating the user interface 500 involved in the example of this disclosure.

[0039] In some examples, reference Figure 2 The length measuring machine 100 may include a guide rail 110, a measuring base 120, and a probe 130. The measuring base 120 may be disposed on the guide rail 110 and movable along the guide rail 110. This facilitates determining the positional information of the corresponding position of the workpiece being measured by the position of the measuring base 120. Additionally, the probe 130 may be disposed on the measuring base 120. In this case, combining the measurement value of the probe 130 ensures the consistency of the contact state between the probe 130 and the workpiece being measured when recording the position of the measuring base 120 (i.e., ensuring the consistency of measurement conditions), thereby improving the accuracy of measuring the workpiece. In some examples, the probe 130 may be disposed on the measuring base 120 by a clamp 400. In this case, the clamp 400 facilitates adjusting the position of the probe 130 in the non-guide rail direction within the length measuring machine 100.

[0040] The following description of the relevant components of the length measuring machine 100 takes the measured surface 211 of the step gauge 200 as an example of the corresponding position of the measured part. It should be noted that this does not imply any limitation on this disclosure.

[0041] In some examples, for a grating length measuring machine, the guide rail 110 may have a first grating ruler. The position of the measuring seat 120 can be determined by the grating value measured by the first grating ruler. That is, the grating value of the first grating ruler can represent the position of the measuring seat 120. Thus, the accuracy of the position of the measuring seat 120 can be improved by using a grating length measuring machine. In addition, the grating value measured by the first grating ruler can also be called the guide rail grating value. In some examples, the guide rail 110 may have a grating groove, and the first grating ruler can be installed in the grating groove.

[0042] In some examples, reference Figure 2The measuring base 120 may include a drive wheel 121 and a fine-tuning wheel 122. The drive wheel 121 controls the movement of the measuring base 120 along the guide rail 110 (i.e., the drive wheel 121 can initially adjust the position of the measuring base 120). The fine-tuning wheel 122 controls the fine movement of the measuring base 120 along the guide rail 110 (i.e., the fine-tuning wheel 122 can finely adjust the position of the measuring base 120). In other words, the movement speed of the measuring base 120 along the guide rail 110 controlled by the fine-tuning wheel 122 can be less than the movement speed of the measuring base 120 along the guide rail 110 controlled by the drive wheel 121. In this case, it is convenient to move to the vicinity of the target area at a higher speed via the drive wheel 121, reducing travel time and improving measurement efficiency, and then adjust slowly via the fine-tuning wheel 122 to reduce positioning errors caused by inertia or overshoot.

[0043] In some examples, reference Figure 2 The measuring base 120 may also include a locking handle 123 for locking the drive wheel 121. Before the measuring base 120 is moved along the guide rail 110 by the fine-tuning wheel 122, the drive wheel 121 can be locked by the locking handle 123. Before the measuring base 120 is moved along the guide rail 110 by the drive wheel 121, the drive wheel 121 can be released by the locking handle 123 in response to the locking state. This reduces interference with the drive wheel 121 when fine-tuning the measuring base 120.

[0044] In some examples, the measuring base 120 may also include a body portion 124, which may be configured to provide support. In some examples, the measuring base 120 may also include a measuring rod (not shown) fixed to the body portion 124.

[0045] Additionally, the probe 130 can be configured to sense the force between the surface 211 to be measured and the probe 130 by contacting the surface 211 to be measured. The measured value of the probe 130 (i.e., the reading of the probe 130) can represent the force acting on the probe. Furthermore, the force acting on the probe can refer to the force exerted on the probe 130. In other words, the force acting on the probe can be the force between the surface 211 to be measured and the probe 130. In some examples, the probe 130 can be a contact sensor.

[0046] In some examples, when the probe 130 is not in contact with the surface 211 to be measured, the measured value of the probe 130 can be a fixed value (e.g., 0). When the probe 130 is in contact with the surface 211 to be measured, the measured value of the probe 130 can change relative to the fixed value. Therefore, the force condition of the probe 130 can be determined based on the measured value of the probe 130.

[0047] In some examples, for a grating length measuring machine, the probe 130 can have a second grating ruler. The measured value can be the grating value obtained by the second grating ruler, which can also be called the probe grating value. That is, the grating value of the second grating ruler can represent the force applied to the probe 130. Thus, using a grating length measuring machine can improve the accuracy of the measured value.

[0048] In some examples, reference Figure 2 When measuring the step gauge 200, the probe 130 can be parallel to the second axis F2. In this case, when the step gauge 200 is placed on one side of the guide rail 110, the probability of the probe 130 hitting the bottom of the step gauge 200 can be reduced, thereby reducing the risk of damaging the probe 130. In addition, having the probe 130 parallel to the second axis F2 also improves the ease of controlling the probe 130.

[0049] In some examples, the length measuring machine 100 may also include a tailstock 140. In some examples, the position of the tailstock 140 may serve as a reference position for determining the position of the measuring seat 120. In some examples, the position of the tailstock 140 may be fixed. In some examples, the tailstock 140 may be configured to assist in supporting and positioning the workpiece being measured. In some examples, the tailstock 140 may include a mounting base and a measuring rod (not shown) fixed to the top of the mounting base.

[0050] In some examples, the length measuring machine 100 may also include a worktable (not shown) disposed on the guide rail 110. The worktable can be configured to hold other workpieces besides the step gauge 200. That is, the worktable disposed on the guide rail 110 is not the aforementioned support platform 300. In this case, it is possible to support the measurement of the step gauge 200 while maintaining the original workpiece types that the length measuring machine 100 can measure, facilitating the measurement of various workpieces. In other words, the measurement range of the length measuring machine 100 can be increased.

[0051] In addition, the worktable can at least control the rotation and / or tilt of the workpiece. In some examples, the worktable may include at least one of a two-axis worktable and a five-axis worktable.

[0052] In some examples, the length measuring machine 100 may also include a base 150. In some examples, the guide rail 110 and the tailstock 140 may be mounted on the base 150. In some examples, the base 150 may be made of marble. This helps to reduce the deformation of the length measuring machine 100 during operation and to reduce interference from external vibrations, thereby improving the stability and reliability of the length measuring machine 100.

[0053] In some examples, the length measuring machine 100 may also include a horizontal adjustment foot (not shown) disposed below the base 150, which can be configured to adjust the levelness of the base 150.

[0054] In some examples, the length measuring machine 100 can display measurement data. In some examples, the measurement data may include at least one of the measurement value of the probe 130 and the position of the measuring seat 120. In some examples, reference... Figure 2 The length measuring machine 100 may include a display device 160 (e.g., a monitor), which may be configured to display measurement data.

[0055] In some examples, display device 160 may display user interface 500 (see reference). Figure 3 The user interface 500 can be configured to display measurement data and / or set information about the test piece.

[0056] In some examples, reference Figure 3 The user interface 500 may include a first area 510, which may be configured to display measurement data. As an example, Figure 3 The position of the measuring base 120 is shown in box 511 of the first region 510, wherein the position of the measuring base 120 is represented by the grating value of the first grating ruler. Additionally, Figure 3 The image also shows an example of the measurement value of the probe 130 displayed in box 512 of the first region 510, wherein the measurement value of the probe 130 is represented by the grating value of the second grating ruler.

[0057] In some examples, the first area 510 may also include a sampling button 513, which may be configured to record the position of the measuring seat 120 in response to a user's click.

[0058] In some examples, reference Figure 3 The user interface 500 may also include a second area 520, which may be configured to set information about the test device (e.g., selecting the standard of the test device and entering parameters such as the specifications of the test device).

[0059] Figure 4 This is an exemplary plan view showing the step gauge 200 involved in the example of this disclosure.

[0060] In some examples, reference Figure 1 and Figure 4 The step gauge 200 may include multiple gauge blocks 210 arranged in a straight line. There may be gaps between adjacent gauge blocks 210.

[0061] Additionally, the surface 211 to be measured of gauge block 210 can be located between the two ends of step gauge 200 (see...). Figure 4 The first and second test surfaces 211a and 211b in the step gauge 200 can also be located at the end of the step gauge 200 (see [reference]). Figure 4The third test surface 211c in the plurality of gauge blocks 210. Therefore, the adjacent region of the test surface 211 may include at least one of the gap between adjacent gauge blocks 210 and the region near the end of the step gauge 200. For ease of description, the test surface 211 of adjacent gauge blocks near the gap is referred to as the gap surface. In addition, refer to Figure 4 The gap surface may include a first test surface 211a and a second test surface 211b, which are opposite each other.

[0062] Additionally, the step gauge 200 can be positioned in a location that does not obstruct the movement of the measuring base 120. For example, the step gauge 200 may not be mounted on the worktable of the guide rail 110.

[0063] In some examples, the step gauge 200 can be placed on one side of the guide rail 110. In this case, when measuring the step gauge 200, on the one hand, the length of the step gauge 200 can avoid limiting the movement range of the measuring seat 120, thereby increasing the measurement range of the length of the step gauge 200 (i.e., it can measure longer step gauges 200). On the other hand, it can avoid the measuring seat 120 from colliding with the step gauge 200 and causing damage to the measuring seat 120 or the step gauge 200. Furthermore, it can reduce the positional requirements of the probe 130 (for example, if the step gauge 200 is set on the worktable on the guide rail 110, the length of the step gauge 200 limits the movement range of the measuring seat 120, and there is also the consideration of whether the movement range of the probe 130 in the guide rail direction is sufficient to cover the area to be measured by the step gauge 200). In addition, it can reduce the modification of the original structure of the length measuring machine 100.

[0064] In some examples, the step gauge 200 can be placed on one side of the guide rail 110 via the support platform 300. Specifically, refer to... Figure 1 The support platform 300 can be placed on one side of the guide rail 110, and the step gauge 200 can be placed on the support platform 300. In this case, the step gauge 200 can be fixed during measurement to reduce interference caused by the shaking of the step gauge 200.

[0065] In some examples, the step gauge 200 may also be positioned above the guide rail 110 in a location that allows the measuring seat 120 to pass through. For example, the probe 130 may be parallel to the third axis F3 and pass under the step gauge 200 as the measuring seat 120 moves, thereby measuring the individual surfaces 211 to be measured.

[0066] As described above, the support platform 300 can be configured to support the step gauge 200. In some examples, the support platform 300 can rotate or tilt at least about the second axis F2 and the third axis F3. This allows for adjustment of the attitude of the step gauge 200.

[0067] Figure 5This is an exemplary assembly diagram of the fixture 400 and the probe 130 involved in the examples of this disclosure.

[0068] In addition, to increase the movement direction of the probe 130, the inventors also designed a fixture 400 to control the movement of the probe 130 in a non-guide rail direction (i.e., a direction other than the first axis F1). In some examples, the fixture 400 can be configured to control the movement of the probe 130 in a direction perpendicular to the first axis F1. In this case, combining the measuring seat 120 and the fixture 400 enables the probe 130 to move in multiple mutually perpendicular directions, thereby facilitating the movement of the probe 130 to a target position (e.g., an adjacent area of ​​the surface 211 to be measured). In some examples, the fixture 400 can be configured to control the movement of the probe 130 in the directions of the second axis F2 and the third axis F3.

[0069] In some examples, reference Figure 5 The fixture 400 may include a pressure plate 410, a vertical slider 420, and a horizontal push rod 430. The pressure plate 410 may be mounted on the measuring base 120. The vertical slider 420 may be disposed on the side wall of the pressure plate 410 in a vertically movable manner. The horizontal push rod 430 may be disposed on the vertical slider 420 in a horizontally movable manner and is connected to the probe 130. This facilitates control of the probe 130's movement in the direction of the second axis F2 and the third axis F3. Furthermore, the horizontal push rod 430 allows control of the probe 130's movement in the direction of the second axis F2 by pushing or pulling the horizontal push rod 430. In some examples, the pressure plate 410 may be mounted to the measuring base 120 with screws.

[0070] In some examples, reference Figure 5 The fixture 400 may also include a vertical push rod 440, which may be disposed on the pressure plate 410 and configured to control the movement of the vertical slider 420 in the direction of the third axis F3. Thus, by means of the vertical push rod 440, the movement of the probe 130 in the third axis F3 can be controlled by pushing or pulling the vertical push rod 440.

[0071] This disclosure relates to a step gauge measurement method (also known as a step gauge calibration method, step gauge alignment method, etc.) based on a length measuring machine 100, which measures the step gauge 200 using the length measuring machine 100 when the step gauge 200 is positioned on one side of the guide rail 110. In some examples, the probe 130 may be parallel to the second axis F2. The step gauge measurement method based on the length measuring machine 100 disclosed in this disclosure will be referred to as the measurement method below. It should be noted that, unless there is a contradiction, the above descriptions of the length measuring machine 100, step gauge 200, bearing platform 300, and fixture 400 also apply to the measurement method.

[0072] Figure 6This is an exemplary flowchart illustrating the measurement method involved in the examples of this disclosure.

[0073] In some examples, reference Figure 6 The measurement method may include aligning the step gauge 200 parallel to the guide rail 110 of the length measuring machine 100 (step S101), controlling the measuring seat 120 of the length measuring machine 100 to move along the guide rail 110 and controlling the probe 130 of the length measuring machine 100 to move in a direction perpendicular to the first axis F1 so that the probe 130 contacts the surface to be measured 211 (step S102), and recording the position of the measuring seat 120 as the position of the surface to be measured 211 in response to the force on the probe indicating that the measured value of the probe 130 reaches a preset range (i.e., the force between the probe 130 and the surface to be measured 211 reaches a certain level) (step S103). In this case, using the length measuring machine 100 to measure the step gauge 200 to obtain the position of the surface to be measured 211 (i.e., measuring the position of the surface to be measured 211) can reduce the equipment cost of measuring the step gauge 200. In addition, the position of the measuring seat 120 unique to the length measuring machine 100 is used to determine the position of the surface to be measured 211, and the measurement value of the measuring head 130 unique to the length measuring machine 100 is used as a basis to record the position of the measuring seat 120 when the force on each surface to be measured 211 is basically the same. This can ensure the consistency of measurement conditions and thus improve the accuracy of the measuring step gauge 200.

[0074] In some examples, reference Figure 6 In step S101, the step gauge 200 can be mounted on one side of the guide rail 110 via the support platform 300, and the support platform 300 can be adjusted to make the step gauge 200 parallel to the guide rail 110. Alternatively, the step gauge 200 can be parallel to the guide rail 110 by having its axis parallel to the axis of the guide rail 110.

[0075] Figure 7 This is an exemplary flowchart illustrating how the step gauge 200 is parallel to the guide rail 110, as described in this disclosure.

[0076] In some examples, the parallelism between the step gauge 200 and the guide rail 110 can be determined by adjusting the platform 300 and combining the measurements from the probe 130. To this end, examples of this disclosure also provide an exemplary process for adjusting the platform 300 to make the step gauge 200 parallel to the guide rail 110, which involves adjusting the platform 300 about the other axis while controlling the probe 130 to move in the direction of one of the second axis F2 and the third axis F3, and combining the change in the measurements from the probe 130 to confirm whether the reference plane is parallel to the axis. Reference Figure 7 The exemplary process includes: Step S201: Control the measuring seat 120 to move along the guide rail 110 so that the probe 130 contacts the reference surface.

[0077] Alternatively, the reference surface can be one surface of any one of the gauge blocks 210. In some examples, the reference surface can be the surface of a gauge block 210 located at one end of the pitch gauge 200, such as the two surfaces at both ends of the pitch gauge 200. This facilitates quick positioning of the reference surface. In some examples, there can be multiple reference surfaces.

[0078] Step S202: Control the probe 130 to reciprocate in the direction of the second axis F2.

[0079] In some examples, the probe 130 can be moved in the direction of the second axis F2 by the horizontal push rod 430. In some examples, the measurement value of the probe 130 can be recorded or observed during the movement.

[0080] Step S203: Determine whether the change in the measurement value of probe 130 during the current reciprocating movement is greater than a preset value.

[0081] If the change is greater than the preset value, then step S204 is executed. That is, if the measured value of the probe 130 changes during the movement of the probe 130, then step S204 is executed. If the change is not greater than the preset value, then step S205 is executed.

[0082] Step S204: Adjust the bearing platform 300 to rotate around the third axis F3. In some examples, after performing step S204, step S202 can be performed.

[0083] That is, steps S202 and S204 are repeated until the change in the measurement value of probe 130 during the current reciprocating movement is no greater than a preset value. This ensures that the reference plane is parallel to the second axis F2. In other words, when probe 130 moves in the direction of the second axis F2, it can continuously contact the reference plane. If the reference plane is not parallel to the second axis F2, the measurement value will change; if the reference plane is parallel to the second axis F2, the measurement value may not change or will change very little.

[0084] Furthermore, this disclosure does not specifically limit the value of the preset value; the preset value can be any value that can measure whether the reference plane is considered parallel to the axis (e.g., the second axis F2 or the third axis F3). In some examples, an appropriate preset value can be selected based on calibration requirements.

[0085] Step S205: Control the probe 130 to reciprocate in the direction of the third axis F3.

[0086] In some examples, the probe 130 can be moved in the direction of the third axis F3 by the vertical push rod 440. In some examples, the measurement value of the probe 130 can be recorded or observed during the movement.

[0087] Step S206: Determine whether the change in the measurement value of probe 130 during the current reciprocating movement is greater than a preset value.

[0088] If the change is greater than the preset value, then step S207 is executed. That is, if the measured value of the probe 130 changes during the movement of the probe 130, then step S207 is executed. If the change is not greater than the preset value, then the execution ends.

[0089] Step S207: Adjust the bearing platform 300 to rotate around the second axis F2.

[0090] In some examples, after performing step S207, step S205 can be performed.

[0091] That is, steps S205 and S207 are repeated until the change in the measurement value of probe 130 during the current reciprocating movement is no greater than a preset value. This ensures that the reference plane is parallel to the third axis F3. The basic principle is similar to steps S202 and S204, and will not be repeated here.

[0092] In some examples, reference Figure 6 In step S102, by combining two movement methods of the measuring seat 120 of the length measuring machine 100 moving along the guide rail 110 and the measuring head 130 of the length measuring machine 100 moving in a direction perpendicular to the first axis F1, the measuring head 130 is brought into contact with the surface 211 to be measured.

[0093] In some examples, the direction perpendicular to the first axis F1 may include at least one of the directions of the second axis F2 and the third axis F3. That is, the measuring seat 120 of the length measuring machine 100 can be moved along the guide rail 110 and the measuring head 130 can be moved in any direction perpendicular to the guide rail direction, so that the measuring head 130 contacts the surface 211 to be measured.

[0094] In some examples, the probe 130 can be moved in a direction perpendicular to the first axis F1 and the measuring seat 120 can be moved along the guide rail 110 to move the probe 130 to the adjacent area of ​​the surface to be measured 211 before contacting it. That is, the probe 130 is first moved to the vicinity of the surface to be measured 211 before contacting it. In this case, the step-by-step operation facilitates control of the movement speed of different steps, balancing measurement efficiency and the safety of the probe 130 or the surface to be measured 211 (e.g., reducing the risk of damage to the probe 130 or the surface to be measured 211). In some examples, before the probe 130 moves to the adjacent area of ​​the surface to be measured 211, the measuring seat 120 can be moved along the guide rail 110 to align the probe 130 with the adjacent area of ​​the surface to be measured 211. That is, when measuring the position of a certain surface 211, the probe 130 can first be aligned with the adjacent area of ​​the surface 211, then moved to the adjacent area of ​​the surface 211, and then contact the surface 211. In this way, both measurement efficiency and safety of the probe 130 or the surface 211 can be further balanced.

[0095] As described above, the measuring base 120 may include a drive wheel 121. In some examples, the drive wheel 121 can control the measuring base 120 to move along the guide rail 110 so that the probe 130 is in one of the following states: aligned with an adjacent area of ​​the surface to be measured 211 and in contact with or away from the surface to be measured 211. In some examples, the drive wheel 121 can control the measuring base 120 to move along the guide rail 110 so that the probe 130: first aligned with an adjacent area of ​​the surface to be measured 211, then in contact with the surface to be measured 211 after the probe 130 moves to the adjacent area of ​​the surface to be measured 211, and then moves away from the surface to be measured 211 after the measurement of the surface to be measured 211 is completed.

[0096] The following describes the process of probe 130 contacting surface 211, taking the adjacent areas of the surface to be measured as the gap between adjacent gauge blocks as an example. Figure 8 This is a schematic diagram illustrating the positional change of the probe 130 when measuring the gap surface between adjacent gauge blocks, as described in the example of this disclosure. Figure 9 This is an exemplary flowchart illustrating an example of how the probe 130 contacts the gap surface of an adjacent gauge block, as described in this disclosure.

[0097] For adjacent gauge blocks among multiple gauge blocks 210, the adjacent regions of the surface to be measured 211 can be the gap between adjacent gauge blocks. That is, in some examples, the probe 130 can be moved to the gap between adjacent gauge blocks by controlling the movement of the probe 130 in a direction perpendicular to the first axis F1 and controlling the movement of the measuring seat 120 along the guide rail 110, and then the probe 130 can be made to contact the gap surface. Specifically, the probe 130 can be moved in a direction perpendicular to the first axis F1 to allow the probe 130 to enter the gap (see...). Figure 8 (See frame D102), control the measuring base 120 to move along the guide rail 110 so that the probe 130 located in the gap contacts the gap surface of the adjacent gauge block (see frame D102). Figure 8 (Blocks D103 and D104). In some examples, the measuring seat 120 can be controlled to move along the guide rail 110 to align the probe 130 with the gap between adjacent gauge blocks before the probe 130 moves to the gap between adjacent gauge blocks (see [link]). Figure 8 (frame D101).

[0098] As described above, the direction perpendicular to the first axis F1 can include at least one of the directions of the second axis F2 and the third axis F3. To this end, an example of this disclosure also provides an exemplary process for contacting the probe 130 with the gap surface by controlling the movement of the probe 130 in the direction of the second axis F2 and controlling the movement of the measuring seat 120 along the guide rail 110, wherein the probe 130 enters the gap between adjacent gauge blocks from the side of the step gauge 200. Reference Figure 9 The exemplary process may include: Step S301: Control the measuring base 120 to move along the guide rail 110 so that the probe 130 is aligned with the gap between adjacent gauge blocks (see...) Figure 8 (frame D101).

[0099] Step S302: Control the probe 130 to move in the direction of the second axis F2 so that the probe 130 aligned with the gap enters the gap (see...) Figure 8 (frame D102).

[0100] Step S303: Control the measuring base 120 to move along the guide rail 110 so that the probe 130 located in the gap contacts the gap surface of the adjacent gauge block (see...). Figure 8 (Blocks D103 and D104).

[0101] Additionally, the process of controlling the movement of the probe 130 in the direction of the third axis F3 and controlling the movement of the measuring seat 120 along the guide rail 110 to bring the probe 130 into contact with the surface 211 to be measured is similar to the exemplary procedure, and the same parts will not be described again. For example, the probe 130 can enter the gap between adjacent gauge blocks from above the pitch gauge 200. Specifically, the probe 130 can be positioned above the pitch gauge 200, the measuring seat 120 can be moved along the guide rail 110 to align the probe 130 with the gap, and the probe 130 can be moved in the direction of the third axis F3 to bring the aligned probe 130 into the gap.

[0102] In some examples, during the measurement of gap surfaces, after the probe 130 moves to the gap between adjacent gauge blocks, it can first contact the first test surface 211a to measure its position, then contact the second test surface 211b to measure its position, and then measure the position of the next gap surface. That is, it first contacts the first test surface 211a to obtain its position, and then contacts the second test surface 211b to obtain its position. This helps reduce the travel time of the probe 130 and improves measurement efficiency. For details on how the position of a single test surface 211 is obtained after contact, see step S103.

[0103] As described above, the probe 130 can be brought into contact with the surface 211 to be measured. In some examples, when the measured value of the probe 130 begins to change relative to a fixed value (e.g., when the second grating ruler of the probe 130 shows a reading), it can be considered that the probe 130 is in contact with the surface 211 to be measured. This facilitates improving the consistency of controlling the contact between the probe 130 and the surface 211 to be measured.

[0104] As described above, the measuring seat 120 may include a fine-tuning wheel 122. In some examples, reference... Figure 6 In step S103, after the probe 130 contacts the surface 211 to be measured, the measuring seat 120 can be slightly moved along the guide rail 110 by the fine-tuning wheel 122 so that the force on the probe represented by the measured value reaches a preset range. In this case, by fine-tuning the position of the measuring seat 120 by the fine-tuning wheel 122 of the length measuring machine 100, the force on each surface 211 to be measured can be kept basically the same, thereby reducing measurement error.

[0105] Furthermore, this disclosure does not specifically limit the value of the preset range; a suitable preset range can be selected based on calibration requirements. In some examples, a suitable range from 0.0001 mm to 0.5 mm can be selected to represent the preset range to which the force applied to the probe should reach, based on calibration requirements. For example, when the measured value is 0.3 ± 0.001 mm, the force between the probe 130 and the surface 211 to be measured can be considered to have reached a certain level.

[0106] In some examples, the position of the measuring seat 120 can be recorded by clicking the sampling button 513 on the user interface 500.

[0107] In some examples, the positions of multiple test surfaces 211 of the step gauge 200 can be obtained by traversing the step gauge 200. In some examples, after completing the measurement of the current test surface 211, the probe 130 can be moved away from the current test surface 211 by controlling the probe 130 to move in a direction perpendicular to the first axis F1 and controlling the measuring seat 120 to move along the guide rail 110, and the measurement of the next test surface 211 can continue until the surface of each of the multiple gauge blocks 210 of the step gauge 200 is measured. In some examples, the multiple test surfaces 211 of the step gauge 200 can be traversed in order from one end of the step gauge 200 to the other end.

[0108] Taking the gap surface between adjacent gauge blocks as an example. In some examples, for adjacent gauge blocks, after measuring at least one of the measured surfaces 211 of the gap surface of the current adjacent gauge block, the probe 130 can be moved out of the gap between the current adjacent gauge blocks by controlling the probe 130 to move in a direction perpendicular to the first axis F1 (e.g., the direction of the second axis F2 or the direction of the third axis F3) and controlling the measuring seat 120 to move along the guide rail 110 (see...). Figure 8 (See frame D105), and continue measuring the position of the next surface to be measured 211 (e.g., the gap surface of the next adjacent gauge block (see box D105)). Figure 8 (from the frame D106) or the end of the surface to be measured 211), until the surface of each gauge block 210 in the multiple gauge blocks 210 of the step gauge 200 is measured.

[0109] Figure 10 This is an exemplary flowchart illustrating one implementation of the measurement method according to the examples of this disclosure. The examples of this disclosure also provide an embodiment of the measurement method, with reference to... Figure 8 and Figure 10 This embodiment includes: Step S401: Make guide rail 110 and step gauge 200 parallel.

[0110] Step S402: Rotate the drive wheel 121 to move the measuring seat 120, thereby aligning the probe 130 with the gap between adjacent gauge blocks.

[0111] Step S403: Control the probe 130 to move on the second axis F2 to enter the gap between adjacent gauge blocks. As described above, in some examples, the probe 130 can be controlled to move on the second axis F2 by the clamp 400.

[0112] Step S404: Rotate the drive wheel 121 to move the measuring seat 120, so that the probe 130 contacts one of the test surfaces 211 of the gap surface.

[0113] Step S405: Lock the drive wheel 121 by locking handle 123.

[0114] Step S406: Rotate the fine-tuning wheel 122 to bring the force between the probe 130 and the surface 211 to a preset range. The force can be determined based on the measurement value of the probe 130. In some examples, for measurements represented by the grating values ​​of the second grating ruler, the grating values ​​can be opposite when the surfaces 211 are facing opposite directions (e.g., the first surface 211a and the second surface 211b), and the preset range represented by the preset grating value range is also opposite.

[0115] Step S407: Record the position of the measuring base 120. As described above, in some examples, the position of the measuring base 120 can be the grating value of the first grating ruler of the guide rail 110.

[0116] Step S408: Loosen the drive wheel 121 by locking handle 123.

[0117] Step S409: Rotate the drive wheel 121 to move the measuring seat 120, so that the probe 130 contacts the other test surface 211 of the gap surface to measure the position of the other test surface 211. That is, repeat steps S405 to S408 to obtain the position of the measuring seat 120 corresponding to the other test surface 211 of the gap surface.

[0118] This embodiment also includes moving the probe 130 out of the gap between adjacent gauge blocks and repeating steps S402 to S409 until the gap surface of each adjacent gauge block of the step gauge 200 is measured. Additionally, for the measurement of the surface 211 to be measured at the end of the step gauge 200, the probe 130 can be aligned with the adjacent area of ​​the surface 211 to be measured and a similar measurement to that of the gap surface can be performed; this will not be elaborated further here.

[0119] Furthermore, the examples in this disclosure also relate to a step gauge measurement system based on the length measuring machine 100 (which may also be called a step gauge calibration system, or step gauge adjustment system, etc.). It should be noted that, unless there is a contradiction, the relevant descriptions of the above measurement methods also apply to the step gauge measurement system.

[0120] In some examples, the step gauge measurement system may include a length measuring machine 100 and a support platform 300. The length measuring machine 100 may include a guide rail 110, a measuring base 120, and a measuring head 130. The measuring base 120 may be mounted on and movable along the guide rail 110. The measuring head 130 may be mounted on the measuring base 120. Additionally, the step gauge 200 may be mounted on one side of the guide rail 110 of the length measuring machine 100 via the support platform 300.

[0121] In some examples, when the step gauge measurement system measures the surface 211 to be measured by the step gauge 200, the measuring seat 120 can move along the guide rail 110 and the probe 130 can move in a direction perpendicular to the first axis F1 so that the probe 130 contacts the surface 211 to be measured. In response to the force on the probe indicating that the measured value of the probe 130 reaches a preset range, the position of the measuring seat 120 is recorded and used as the position of the surface 211 to be measured.

[0122] In some examples, the step gauge measurement system may also include a clamp 400. The probe 130 can be positioned on the measuring base 120 via the clamp 400.

[0123] While the present disclosure has been specifically described above in conjunction with the accompanying drawings and examples, it is to be understood that the foregoing description does not limit the present disclosure in any way. Those skilled in the art can make modifications and variations to the present disclosure as needed without departing from its essential spirit and scope, and all such modifications and variations shall fall within the scope of the present disclosure.

Claims

1. A system for calibrating a pace ruler, characterized by, The device includes a length measuring machine and a support platform configured to hold the step gauge. The step gauge includes a plurality of gauge blocks arranged in a straight line. The support platform is configured to adjust the posture of the step gauge. The length measuring machine includes a guide rail, a measuring seat, and a probe disposed on the measuring seat. The measuring seat is configured to move along the guide rail. The probe is configured to move in a direction orthogonal to the guide rail. The measuring seat is configured to bring the probe into contact with the surface to be measured when moving along the guide rail. In response to a measured value characterizing the force on the probe reaching a preset range, the position of the measuring seat is recorded and used as the position of the surface to be measured, wherein the surface to be measured is the surface of one of the gauge blocks among the plurality of gauge blocks.

2. The system for calibrating step gauges according to claim 1, characterized in that, With the direction of the guide rail as the first axis, the direction orthogonal to the first axis as the second axis, and the direction orthogonal to the first and second axes as the third axis, the support platform is configured to be able to rotate or tilt about at least the second and third axes to adjust the posture of the step gauge.

3. The system for calibrating step gauges according to claim 2, characterized in that, In response to the change in the measured value of the probe during reciprocating movement of the probe along the second axis being greater than a preset value, the support platform rotates around the third axis until the change is no greater than the preset value; and in response to the change in the measured value of the probe during reciprocating movement of the probe along the third axis being greater than the preset value, the support platform rotates around the second axis until the change is no greater than the preset value.

4. The system for calibrating a step gauge according to any one of claims 1 to 3, characterized in that, The support platform is configured to adjust the posture of the step gauge so that the step gauge is parallel to the guide rail.

5. The system for calibrating step gauges according to claim 1, characterized in that, The probe is parallel to a direction orthogonal to the guide rail.

6. The system for calibrating step gauges according to claim 1, characterized in that, With the direction of the guide rail as the first axis, the probe is mounted on the measuring seat by a clamp; the clamp is configured to control the movement of the probe in a direction perpendicular to the first axis.

7. The system for calibrating step gauges according to claim 6, characterized in that, The fixture includes a pressure plate, a vertical slider, and a horizontal push rod; the pressure plate is mounted on the measuring base; the vertical slider is disposed on the side wall of the pressure plate in a manner that allows it to move in the vertical direction; the horizontal push rod is disposed on the vertical slider in a manner that allows it to move in the horizontal direction and is connected to the probe.

8. The system for calibrating step gauges according to claim 1, characterized in that, The length measuring machine is a grating length measuring machine. The guide rail has a grating groove and a first grating ruler disposed in the grating groove. The position of the measuring seat is determined by the grating value measured by the first grating ruler. The measuring head has a second grating ruler, and the measured value is the grating value measured by the second grating ruler.

9. The system for calibrating step gauges according to claim 1, characterized in that, The measuring base includes a drive wheel for controlling the movement of the measuring base along the guide rail, and a fine-tuning wheel for controlling the slight movement of the measuring base along the guide rail; the drive wheel controls the movement of the measuring base along the guide rail so that the probe is in one of the following states: aligned with an adjacent area of ​​the surface to be measured, in contact with the surface to be measured, and away from the surface to be measured; after the probe contacts the surface to be measured, the fine-tuning wheel controls the measuring base to move slightly along the guide rail so that the force on the probe represented by the measured value reaches the preset range.

10. The system for calibrating a step gauge according to claim 1, characterized in that, The surface to be measured is a surface used to characterize the size of each of the gauge blocks or the distance between the multiple gauge blocks.

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