An oscilloscope, frequency compensation method, and computer-readable storage medium

Abstract

An oscilloscope, a frequency compensation method, and a computer-readable storage medium are disclosed, relating to the field of measurement technology. The oscilloscope includes replaceable probes, at least one measurement channel, an interface unit, a storage unit, and a processing unit. The replaceable probes are used to acquire a signal under test, wherein the replaceable probes include at least one reference probe; at least one measurement channel is used to receive the signal under test transmitted through each probe; the interface unit is used to connect each probe and the measurement channel; the storage unit is used to store frequency compensation parameters for each probe, wherein the frequency compensation parameters include reference compensation parameters determined based on the frequency response parameters output by the oscilloscope, and calibration compensation parameters for each probe determined based on the frequency response parameters of the reference probe and the corresponding frequency response parameters output by the oscilloscope for each probe; the processing unit is used to retrieve the frequency compensation parameters corresponding to the currently connected probe; and to compensate the signal under test acquired by the currently connected probe according to the frequency compensation parameters.

Description

Technical Field

[0001] This invention relates to the field of measurement technology, and more specifically to an oscilloscope, a frequency compensation method, and a computer-readable storage medium. Background Technology

[0002] With the rapid development of high-speed digital circuits, radio frequency circuits, and high-speed serial bus technologies, the requirements for signal integrity and measurement accuracy are constantly increasing. Active differential probes, due to their advantages such as high input impedance, wide bandwidth, and low load effect, are widely used in the field of high-speed signal measurement.

[0003] Please refer to Figure 1 Existing active differential probes generally consist of two parts: a probe head and a probe amplifier. One end of the probe head is connected to the circuit under test, and the other end is connected to the probe amplifier via a coaxial cable. The probe head typically contains passive components such as resistors and capacitors, whose main functions are signal attenuation, signal format conversion, and load matching of the circuit under test. The probe amplifier is mainly used to perform impedance conversion, signal amplification, and DC bias cancellation, and outputs the processed signal to measuring equipment such as an oscilloscope.

[0004] As the measurement bandwidth of active differential probes continues to increase, the gain flatness, amplitude-frequency response, and phase characteristics of the probe across the entire bandwidth have an increasingly significant impact on measurement accuracy. To ensure that the probe has good frequency response characteristics within its effective measurement bandwidth, it is usually necessary to calibrate the probe during the manufacturing process and store the relevant parameters or compensation data obtained from the calibration in the probe's internal memory chip. When the probe is connected to an oscilloscope, the oscilloscope reads the calibration data and performs corresponding compensation processing on the measurement signal, thereby improving the accuracy of the measurement results.

[0005] In existing technologies, calibration data for active differential probes is typically obtained based on a specific probe head and probe amplifier combination. However, probe heads often have various structural forms in practical applications to adapt to different measurement scenarios and objects being measured. For example, probe heads can adopt welded structures, through-hole structures, or point test structures with adjustable probe spacing. Due to differences in parasitic capacitance, parasitic inductance, and transmission path length among probe heads with different structures, their corresponding frequency response characteristics also differ significantly.

[0006] During production calibration, due to limitations such as process complexity and cost, only a single standard probe head and probe amplifier combination is typically selected for unified calibration. When users replace the probe head with other structural forms during actual testing, the probe system still uses the previously stored calibration data for signal compensation. However, since this calibration data fails to reflect the true frequency response characteristics of the current probe head and probe amplifier combination, it can easily lead to inaccurate compensation, thereby affecting the measurement accuracy of the active differential probe within its bandwidth range. Summary of the Invention

[0007] The main technical problem solved by this invention is to provide an oscilloscope capable of frequency compensation for different probes.

[0008] According to a first aspect, one embodiment provides an oscilloscope, comprising:

[0009] A replaceable probe for acquiring a signal to be measured, wherein the replaceable probe includes at least one reference probe;

[0010] At least one measurement channel is used to receive the signal to be measured transmitted through each probe;

[0011] An interface unit is used to connect each probe to the measurement channel;

[0012] A storage unit is used to store frequency compensation parameters for each probe, wherein the frequency compensation parameters include reference compensation parameters determined based on the frequency response parameters output by the oscilloscope when the reference probe is connected to the interface unit, and calibration compensation parameters for each probe determined based on the frequency response parameters of the reference probe and the frequency response parameters corresponding to each probe output by the oscilloscope when each probe is connected to the interface unit.

[0013] Processing unit, used for:

[0014] Determine the probe currently connected to the interface unit;

[0015] The frequency compensation parameters corresponding to the currently connected probe are called based on the configuration parameters of the currently connected probe.

[0016] The test signal acquired by the currently connected probe is compensated according to the frequency compensation parameters.

[0017] In one embodiment, the reference compensation parameter includes a reference gain compensation parameter, and the calibration compensation parameter includes a calibration gain compensation parameter;

[0018] When the reference probe is connected to the interface unit, the reference gain compensation parameter is determined based on the gain response parameter output by the oscilloscope.

[0019] When each probe is connected to the interface unit, the calibration gain compensation parameter of each probe is determined based on the quotient between the gain response parameter of the reference probe and the gain response parameter of each probe output by the oscilloscope.

[0020] In one embodiment, the reference compensation parameter further includes a reference phase compensation parameter, and the calibration compensation parameter further includes a calibration phase compensation parameter;

[0021] When the reference probe is connected to the interface unit, the reference phase compensation parameters are determined based on the phase response parameters output by the oscilloscope.

[0022] When each probe is connected to the interface unit, the calibration phase compensation parameter of each probe is determined based on the difference between the phase response parameter of the reference probe and the phase response parameter of each probe output by the oscilloscope.

[0023] In one embodiment, when the reference gain compensation parameter and the calibration gain compensation parameter are determined through different measurement channels, reference gain compensation data of the preset reference channel of the oscilloscope is obtained; the reference gain compensation parameter and the calibration gain compensation parameter are calibrated according to the reference gain compensation data to correspondingly determine the front-end reference gain compensation parameter and the front-end calibration gain compensation parameter used only for probe calibration.

[0024] And / or,

[0025] When the reference phase compensation parameter and the calibration phase compensation parameter are determined through different measurement channels, the reference phase compensation data of the preset reference channel of the oscilloscope is obtained; the reference phase compensation parameter and the calibration phase compensation parameter are calibrated according to the reference phase compensation data to determine the front-end reference phase compensation parameter and the front-end calibration phase compensation parameter used only for probe calibration.

[0026] In one embodiment, the preset reference channel is a pre-selected channel among the measurement channels, and the channel gain response data and channel phase response data of the other measurement channels besides the reference channel are normalized to determine the reference gain compensation data and reference phase compensation data of the reference channel.

[0027] In one embodiment, when the reference gain compensation parameter and the calibration gain compensation parameter are determined through the same measurement channel, the reference gain compensation parameter is the front-end reference gain compensation parameter, and the calibration gain compensation parameter is the front-end calibration gain compensation parameter.

[0028] And / or,

[0029] When the reference phase compensation parameter and the calibration phase compensation parameter are determined through the same measurement channel, the reference phase compensation parameter is the front-end reference phase compensation parameter, and the calibration phase compensation parameter is the front-end calibration phase compensation parameter.

[0030] In one embodiment, the processing unit compensates the signal under test acquired by the currently connected probe according to the frequency compensation parameter, including:

[0031] Obtain channel frequency response data to represent the frequency compensation of each measurement channel and frequency compensation coefficients to represent the frequency compensation of the interface unit;

[0032] The test signal acquired by the currently connected probe is compensated based on the channel frequency response data, frequency compensation coefficient, and frequency compensation parameters.

[0033] In one embodiment, the frequency compensation parameters are stored as a calibration file, which includes the identifier of each probe and the frequency compensation parameters corresponding to each probe.

[0034] According to a second aspect, one embodiment provides a frequency compensation method applied to a measuring instrument, comprising:

[0035] Determine the probe currently connected to the measuring instrument;

[0036] The frequency compensation parameters of the currently connected probe are invoked based on the configuration parameters of the currently connected probe.

[0037] The test signal acquired by the currently connected probe is compensated according to the frequency compensation parameters;

[0038] The frequency compensation parameters include the reference compensation parameters of the reference probe connected to the measuring instrument, and the calibration compensation parameters of each probe connected to the measuring instrument relative to the reference compensation parameters.

[0039] According to a third aspect, one embodiment provides a computer-readable storage medium storing a computer program that can be executed by a processor to implement the methods described in the above embodiments.

[0040] According to the oscilloscope, frequency compensation method, and computer-readable storage medium described in the above embodiments, the oscilloscope includes replaceable probes, at least one measurement channel, an interface unit, a storage unit, and a processing unit. The replaceable probes include at least one reference probe for acquiring a signal under test; the measurement channel is used to receive the signal under test transmitted via the probe; and the interface unit is used to establish an electrical connection between the probe and the measurement channel. The storage unit stores frequency compensation parameters corresponding to each probe, including: reference compensation parameters determined based on the frequency response parameters output by the oscilloscope when the reference probe is connected to the interface unit, and calibration compensation parameters determined based on the frequency response parameters of the reference probe and the corresponding probe output by the oscilloscope when each probe is connected to the interface unit. The processing unit is configured to, when a probe is connected to the interface unit, determine the type of the currently connected probe, retrieve the frequency compensation parameters corresponding to that probe, and perform compensation processing on the signal under test acquired by the currently connected probe based on the frequency compensation parameters.

[0041] With the above structure, the oscilloscope can automatically recall the corresponding frequency compensation parameters based on the configuration parameters of the new probe after probe replacement, and perform frequency compensation on the measurement signal under different probes. This application introduces a reference probe and its corresponding reference compensation parameters into the oscilloscope, and determines the calibration compensation parameters based on the frequency response relationship between the reference probe and other probes. This allows the oscilloscope to perform frequency compensation separately for different probes, thereby improving measurement consistency after probe replacement. Furthermore, by storing multiple sets of frequency compensation parameters corresponding to different probes, this application allows the oscilloscope to flexibly adapt to probes of different types and structures, reducing usage limitations caused by probe differences and improving the versatility of the equipment. The oscilloscope can also automatically recall the corresponding compensation parameters after recognizing the configuration parameters of the currently connected probe, eliminating the need for manual selection or reset of the compensation method by the user, improving ease of use and reducing errors caused by human operation. Attached Figure Description

[0042] Figure 1 This is a schematic diagram of the structure of an active differential probe in the background art;

[0043] Figure 2 This is a schematic diagram of the structure of an oscilloscope in one embodiment;

[0044] Figure 3 This is a schematic diagram of a replaceable probe for an oscilloscope in one embodiment;

[0045] Figure 4 This is a schematic diagram of the structure for obtaining gain compensation parameters in one embodiment;

[0046] Figure 5 This is a schematic diagram of the structure for obtaining phase compensation parameters in one embodiment;

[0047] Figure 6 This is a flowchart of a frequency compensation method in one embodiment. Detailed Implementation

[0048] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings. Similar elements in different embodiments are referred to by associated similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of this application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to this application are not shown or described in the specification. This is to avoid obscuring the core parts of this application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0049] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0050] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0051] Please refer to Figure 2 One embodiment provides an oscilloscope 10 that can perform frequency compensation for probes with different structures, thereby improving the measurement accuracy and consistency after probe replacement. The oscilloscope 10 includes a replaceable probe 11, at least one measurement channel 12, an interface unit 13, a storage unit 14, and a processing unit 15, which will be described in detail below.

[0052] Please refer to Figure 3In one embodiment, the oscilloscope 10 includes a replaceable probe 11 for acquiring the signal under test. This probe includes a reference probe 11a and at least one non-reference probe 11b. The reference probe 11a is a standard probe selected during production calibration, while the non-reference probe 11b is a probe with different structural forms, such as a soldered probe, a through-hole probe, or an adjustable probe spacing point-measurement probe, used to replace the reference probe 11a for signal measurement in actual measurement scenarios. Because the structures and parameters of different probes 11 differ, their frequency response characteristics vary, thus frequency compensation is required for each probe 11.

[0053] In one embodiment, the oscilloscope 10 includes at least one measurement channel 12 for receiving the signal under test transmitted through each probe 11. Each measurement channel 12 includes an input buffer circuit, an analog-to-digital converter circuit, and a digital signal processing module for converting the analog signal output from the probe 11 into a digital signal and transmitting it to the processing unit 15.

[0054] In one embodiment, the oscilloscope 10 further includes an interface unit 13 for connecting each probe 11 and each measurement channel 12. The interface unit 13 can be a coaxial interface, differential interface, or other adapter interface, used to establish an electrical connection between the probe 11 and the oscilloscope 10, and to transmit the signal under test output by the probe 11 to the measurement channel 12.

[0055] In one embodiment, the oscilloscope 10 further includes a storage unit 14 for storing frequency compensation parameters for each probe 11. These frequency compensation parameters include reference compensation parameters and calibration compensation parameters. When the reference probe 11a is connected to the interface unit 13, the reference compensation parameters are determined based on the frequency response parameters output by the oscilloscope 10. When each probe 11 is connected to the interface unit 13, the calibration compensation parameters for each probe 11 are determined based on the frequency response parameters of the reference probe 11a and the corresponding frequency response parameters output by the oscilloscope 10.

[0056] It should be noted that the reference compensation parameters are first determined using the reference probe 11a, and then the calibration compensation parameters are determined using the relationship between each probe 11 and the reference probe 11a. Here, each probe 11 refers to all the probes in the replaceable probes 11, which must include the reference probe 11a.

[0057] In one embodiment, in order to ensure that the oscilloscope 10 can maintain consistent gain response and phase characteristics when different probes 11 are replaced, this application establishes corresponding frequency compensation parameters for different probes 11. Specifically, the frequency compensation parameters include gain compensation parameters and phase compensation parameters to compensate for the gain response and phase response of the probe 11.

[0058] Please refer to Figure 4In one embodiment, when the frequency compensation parameter is refined into a gain compensation parameter, the reference compensation parameter includes a reference gain compensation parameter, and the calibration compensation parameter includes a calibration gain compensation parameter. A predetermined test signal is input to the reference probe 11a using an RF signal source 16. The test signal is transmitted to the measurement channel 12 of the oscilloscope 10 via a coaxial cable 17, a fixture 18, and the probe 11. The oscilloscope 10 acquires and measures the gain response parameter of the reference probe 11a to obtain the gain response parameter DATAa corresponding to the reference probe 11a. This gain response parameter DATAa corresponding to the reference probe 11a is the reference gain compensation parameter.

[0059] It should be noted that the probes 11 used in determining the gain compensation parameters here are all combinations of probe heads and probe amplifiers.

[0060] In one embodiment, after obtaining the gain response parameter DATAa of the reference probe 11a, the probes 11 are replaced one by one, and the gain response parameters of the replaced probes 11 are measured under the same test conditions to obtain the gain response parameter DATAb corresponding to each probe 11.

[0061] It should be noted that when replacing probe 11, it will also be replaced with reference probe 11a. For ease of explanation, the gain response parameter of the replaced reference probe 11a will no longer be denoted as DATAa, but as DATAb.

[0062] In one embodiment, since the gain response parameters of each probe 11 are different, there is a deviation between DATAa and DATAb. Therefore, the calibration gain compensation parameter is determined according to the relative relationship between the gain response parameter DATAa corresponding to the reference probe 11a and the gain response parameter DATAb corresponding to each probe 11.

[0063] In one embodiment, the calibration gain compensation parameter can be determined by the quotient between the gain response parameter DATAa corresponding to the reference probe 11a and the gain response parameter DATAb corresponding to each probe 11, that is:

[0064]

[0065] Where TB represents the calibration gain compensation parameter.

[0066] In one embodiment, the calibration gain compensation parameter TB is stored in storage unit 14 for automatic recall when probe 11 is switched. Reference probe 11a also recalls the corresponding calibration gain compensation coefficient TB, but since the gain response parameter of reference probe 11a is used as the reference, the calibration gain compensation parameter TB of reference probe 11a is calculated as 1, thereby ensuring that the compensation of each probe 11 remains consistent.

[0067] Please refer to Figure 5 In one embodiment, when the frequency compensation parameter is refined into a phase compensation parameter, the reference compensation parameter further includes a reference phase compensation parameter, and the calibration compensation parameter further includes a calibration phase compensation parameter. A predetermined test signal is input to the reference probe 11a using a fast-edge generator 19. The test signal is transmitted to the measurement channel 12 of the oscilloscope 10 via a coaxial cable 17, a clamp 18, and the probe 11. The oscilloscope 10 acquires and measures the phase response parameter of the reference probe 11a to obtain the phase response parameter PHASEa corresponding to the reference probe 11a. The phase response parameter PHASEa corresponding to the reference probe 11a is the reference phase compensation parameter.

[0068] It should be noted that the probes 11 used in determining the gain compensation parameters here are all combinations of probe heads and probe amplifiers.

[0069] In one embodiment, after obtaining the phase response parameter PHASEa of the reference probe 11a, the probes 11 are replaced one by one, and the phase response parameters of the replaced probes 11 are measured under the same test conditions to obtain the phase response parameter PHASEb corresponding to each probe 11.

[0070] It should be noted that when replacing probe 11, it will also be replaced with reference probe 11a. For ease of explanation, the gain response parameter of the replaced reference probe 11a will no longer be referred to as PHASEa, but as PHASEb.

[0071] In one embodiment, since the phase response parameters of each probe 11 are different, there is a deviation between PHASEa and PHASEb. Therefore, the calibration phase compensation parameter is determined according to the relative relationship between the phase response parameter PHASEa corresponding to the reference probe 11a and the phase response parameter PHASEb corresponding to each probe 11.

[0072] In one embodiment, the calibration phase compensation parameter can be determined using the difference between the phase response parameter PHASEa corresponding to the reference probe 11a and the phase response parameter PHASEb corresponding to each probe 11, that is:

[0073]

[0074] Here, PHASEbe represents the calibration phase compensation parameter.

[0075] In one embodiment, the calibration phase compensation parameter PHASEbe is stored in storage unit 14 for automatic recall when probe 11 is switched. Reference probe 11a also recalls the corresponding calibration phase compensation parameter PHASEbe, but since the phase response parameter of reference probe 11a is used as the reference, the calibration phase compensation parameter PHASEbe of reference probe 11a is calculated to be 0, thereby ensuring that the compensation of each probe 11 remains consistent.

[0076] In one embodiment, the reference compensation parameters and calibration compensation parameters may be obtained through different measurement channels 12. For example, the reference compensation parameters are obtained using channel 1, while the calibration compensation parameters are obtained using channel 2. To avoid the influence of the frequency response differences of different measurement channels 12 on the frequency compensation parameters of the probe 11, a reference channel is preset in the oscilloscope 10, and the reference gain compensation data and reference phase compensation data of the reference channel are obtained.

[0077] In one embodiment, when the reference gain compensation parameter and the calibration gain compensation parameter are determined through different measurement channels 12, reference gain compensation data of the reference channel is obtained. Based on the reference gain compensation data, the reference gain compensation parameter and calibration gain compensation obtained under different measurement channels 12 are converted to the reference channel to determine the front-end reference gain compensation parameter and the front-end calibration gain compensation. Then, gain compensation is performed based on the front-end reference gain compensation parameter and the front-end calibration gain compensation.

[0078] Specifically, when the reference gain compensation parameter measured by the reference probe 11a on channel i is DATAa,i, its equivalent value converted to the reference channel r is:

[0079]

[0080] in, This represents the equivalent value of the reference gain compensation parameter converted to the reference channel (i.e., the front-end reference gain compensation parameter). This represents the reference gain compensation parameter for channel i. This represents the reference gain compensation data from channel i to the reference channel r.

[0081] When the gain response parameter measured by each probe 11 on channel j is DATAb,j, its equivalent value converted to the reference channel r is:

[0082]

[0083] in, This represents the equivalent value of the gain response parameters of each probe 11 converted to the reference channel. This represents the gain response parameters of each probe 11 in channel j. This represents the reference gain compensation data from channel j to the reference channel r.

[0084] The front-end calibration gain compensation parameter determined in this way is:

[0085]

[0086] in, This indicates the front-end calibration gain compensation parameter.

[0087] It should be noted that both the front-end reference gain compensation parameter and the front-end calibration gain compensation parameter are used to represent the gain compensation characteristics of probe 11 itself. Specifically, the front-end reference gain compensation parameter represents the gain compensation relationship of the reference probe 11a over the entire operating bandwidth; the front-end calibration gain compensation parameter represents the gain compensation relationship of each probe 11 relative to the reference probe 11a. The front-end gain compensation parameters determined in this way are independent of the selection of measurement channel 12 and can more accurately reflect the gain characteristics introduced by the probe head and probe amplifier combination, thus being used for gain compensation in probe 11 configuration.

[0088] Similarly, when the reference phase compensation parameters and calibration phase compensation parameters are determined through different measurement channels 12, reference phase compensation data of the reference channel is obtained. Based on the reference phase compensation data, the reference phase compensation parameters and calibration phase compensation obtained under different measurement channels 12 are converted to the reference channel to determine the front-end reference phase compensation parameters and front-end phase gain compensation. Then, gain compensation is performed based on the front-end reference phase compensation parameters and front-end calibration phase compensation.

[0089] Specifically, when the reference phase compensation parameter measured by the reference probe 11a on channel i is PHASEa,i, its equivalent value converted to the reference channel r is:

[0090]

[0091] in, This represents the equivalent value of the reference phase compensation parameter converted to the reference channel (i.e., the front-end phase gain compensation parameter). This represents the reference phase compensation parameter for channel i. This represents the reference phase compensation data from channel i to reference channel r.

[0092] When the phase response parameters measured by each probe 11 on channel j are ,j, its equivalent value converted to the reference channel r is:

[0093]

[0094] in, This represents the equivalent value of the phase response parameters of each probe 11 converted to the reference channel. This represents the phase response parameters of each probe 11 in channel j. This represents the reference phase compensation data from channel j to the reference channel r.

[0095] The determined front-end calibration phase compensation parameters are as follows:

[0096]

[0097] in, This indicates the front-end calibration gain compensation parameter.

[0098] It should be noted that both the front-end reference phase compensation parameters and the front-end calibration phase compensation parameters are used to represent the phase compensation characteristics of the probe 11 itself. Specifically, the front-end phase compensation parameters represent the phase compensation relationship of the reference probe 11a over the entire operating bandwidth; the front-end calibration phase compensation parameters represent the phase compensation relationship of each probe 11 relative to the reference probe 11a. The front-end phase compensation parameters determined in this way are independent of the selection of the measurement channel 12 and can more accurately reflect the phase characteristics introduced by the probe head and probe amplifier combination, thus being used for phase compensation in the probe 11 configuration.

[0099] In addition, the oscilloscope 10 can have multiple measurement channels 12, and each probe 11 can be connected to different measurement channels 12 during calibration or measurement. Regardless of which measurement channel 12 each probe 11 uses to acquire the frequency response parameters, a unified compensation processing flow can be used to generate frequency compensation parameters corresponding to the probe 11 configuration, thereby improving the measurement consistency and applicability under different combinations of probes 11 and different measurement channels 12.

[0100] In one embodiment, the reference channel is a pre-selected channel from the 10+ measurement channels 12 of the oscilloscope. Channel gain response data and channel phase response data of the reference channel and other measurement channels 12 are acquired respectively. For any non-reference channel, reference gain compensation data from the non-reference channel to the reference channel is determined according to the gain ratio relationship, and reference phase compensation data from the non-reference channel to the reference channel is determined according to the phase difference relationship. This completes the normalization of the channel gain response data and channel phase response data of the other measurement channels 12 besides the reference channel.

[0101] In one embodiment, when the reference gain compensation parameter and the calibration gain compensation parameter are determined through the same measurement channel 12, since there is no cross-channel response difference, the reference gain compensation parameter can be directly used as the front-end reference gain compensation parameter, and the calibration gain compensation parameter can be directly used as the front-end calibration gain compensation parameter. Similarly, when the reference phase compensation parameter and the calibration phase compensation parameter are determined through the same measurement channel 12, the reference phase compensation parameter can be directly used as the front-end reference phase compensation parameter, and the calibration phase compensation parameter can be directly used as the front-end calibration phase compensation parameter.

[0102] In summary, the frequency compensation parameters in storage unit 14 have been explained. In order to store the frequency compensation parameters corresponding to each probe 11 for a long time so that they can be quickly retrieved when the probe 11 is replaced, storage unit 14 is EEPROM, Flash or other non-volatile memory.

[0103] In one embodiment, to facilitate unified management and rapid retrieval of frequency compensation parameters for different probes 11, the frequency compensation parameters are stored as a calibration file. Specifically, the calibration file records the identification information of the probe 11 and the corresponding frequency compensation parameters. The identification information of the probe 11 can be a probe serial number, model code, configuration number, or other identification data that uniquely identifies the probe type. The frequency compensation parameters are recorded according to the set frequency points using arrays, lookup tables, or function parameters.

[0104] In one embodiment, when probe 11 is connected to interface unit 13 of oscilloscope 10, processing unit 15 can read the identification information of the currently connected probe 11 and retrieve the matching frequency compensation parameter in the calibration file based on the identification information. Subsequently, processing unit 15 calls the corresponding frequency compensation parameter to perform compensation processing on the signal under test acquired by measurement channel 12 to achieve frequency response consistency under different probe 11 configurations.

[0105] For example, the calibration file stores the frequency compensation parameters for probe A and probe B, where probe A is the reference probe 11a and probe B is the non-reference probe 11b. If the currently connected probe 11 is probe A, since probe A's calibration gain compensation parameter is 1 and calibration phase compensation parameter is 0, the reference compensation parameters of probe A are used regardless of whether gain or phase compensation is applied. If the currently connected probe 11 is probe B, the frequency compensation parameters corresponding to probe B are obtained, and the calibration compensation parameters are combined with the reference compensation parameters. Specifically, if gain compensation is applied to probe B, the reference compensation parameters are multiplied by the calibration compensation parameters; if phase compensation is applied to probe B, the reference compensation parameters are added to the calibration compensation parameters.

[0106] In one embodiment, when the processing unit 15 performs gain compensation on the currently connected probe 11, in addition to calling the frequency compensation parameters corresponding to the currently connected probe 11, it also obtains other parameters related to gain compensation, including channel frequency response data SCOPE and frequency compensation coefficient K.

[0107] It should be noted that when the processing unit 15 calls the frequency compensation parameters corresponding to the currently connected probe 11, it needs to call the frequency compensation parameters corresponding to that probe according to the configuration parameters of the currently connected probe 11 to ensure the accuracy of the measurement results. The configuration parameters include either the resistance value of the probe 11 or the model information of the probe 11.

[0108] In one embodiment, when automatically identifying probe 11 by reading its resistance value, probe 11 has an internal resistive element for identification. When probe 11 is connected to oscilloscope 10, this resistor forms a voltage divider circuit with a fixed resistor inside oscilloscope 10. Oscilloscope 10 reads the divided voltage value through an analog-to-digital converter and calculates the probe resistance value based on the divided voltage value and the known fixed resistance value of oscilloscope 10. Subsequently, oscilloscope 10 compares the calculated probe resistance with the resistance identification value pre-stored in oscilloscope 10 configuration file. When the calculated probe resistance falls within the preset resistance range corresponding to a certain configuration file, it is determined that the currently connected probe 11 is a probe type corresponding to that configuration file, and the frequency compensation parameters corresponding to that configuration file are called to complete the automatic matching of probe 11.

[0109] In one embodiment, when identifying and configuring the probe 11 using its model information, the user can manually select the configuration file corresponding to the model number identified on the probe 11 in the user interface of the oscilloscope 10. Upon receiving the user's selection command, the oscilloscope 10 loads the frequency compensation parameters corresponding to the selected configuration file, thereby achieving adaptation to different probe 11 models.

[0110] In one embodiment, the channel frequency response data SCOPE is used to represent the frequency response compensation characteristics of each measurement channel 12 of the oscilloscope 10. The channel frequency response data reflects the gain changes of each measurement channel 12 at different frequencies and can be used to compensate for the amplitude errors introduced by each measurement channel 12. The frequency compensation coefficient K is used to represent the compensation coefficient related to the interface unit 13. The frequency compensation coefficient is related to the impedance characteristics of the output terminal of the probe 11 and the impedance characteristics of the input terminal of the oscilloscope 10, for example, it is related to the signal reflection and transmission errors caused by the standing wave characteristics of the output terminal of the probe 11 and the standing wave characteristics of the input terminal of the oscilloscope 10, thereby compensating for the frequency response influence at the connection interface between the probe 11 and the oscilloscope 10.

[0111] In one embodiment, the processing unit 15 performs gain compensation on the signal under test acquired by the currently connected probe 11 using the following formula based on the channel frequency response data, frequency compensation coefficient, and frequency compensation parameters:

[0112]

[0113] Where SCOPE represents the channel frequency response data, DATAa represents the reference gain compensation parameter corresponding to the reference probe 11a, K represents the frequency compensation coefficient, and TB represents the gain compensation parameter.

[0114] It should be noted that the above-described product-based compensation is primarily used to compensate for the gain response parameters of the signal under test. The phase compensation parameters can be determined solely through the phase calibration method described above, and do not require the product of the channel frequency response data SCOPE and the frequency compensation coefficient K used in gain compensation. Therefore, gain compensation and phase compensation in this application can be implemented independently to avoid unnecessary limitations imposed by gain compensation on the phase compensation process.

[0115] Please refer to Figure 6 Another embodiment provides a frequency compensation method applied to measuring instruments, such as oscilloscopes or other measuring devices with replaceable probes. The measuring instrument can automatically call upon the corresponding frequency compensation parameters when different probes are connected, thereby improving measurement consistency and accuracy under different probe configurations. Because different probes have different structural forms, parasitic parameters, and frequency response characteristics, the measuring instrument needs to establish corresponding frequency compensation parameters for different probes. This frequency compensation method includes the following steps.

[0116] Step S1: Determine the currently connected probe.

[0117] In one embodiment, when a probe is connected to a measuring instrument, the probe currently connected to the measuring instrument is determined. For example, the probe may have probe identification information, and the type or number of the currently connected probe can be identified by reading the probe identification information, thereby distinguishing between a reference probe and a non-reference probe.

[0118] Step S2: Call the frequency compensation parameters of the current probe.

[0119] In one embodiment, the measuring instrument stores frequency compensation parameters corresponding to multiple probes. After determining the currently connected probe, the frequency compensation parameters corresponding to that probe are retrieved. These frequency compensation parameters include the reference compensation parameters of the reference probe connected to the measuring instrument and the calibration compensation parameters of each probe connected to the measuring instrument.

[0120] In one embodiment, the reference compensation parameter can be the frequency response compensation data determined by the reference probe during the calibration process, which is used as a system reference; the calibration compensation parameter is the compensation data of each probe relative to the reference probe, which is used to compensate for the frequency response error introduced by the structural differences of different probes.

[0121] Step S3: Perform compensation processing on the signal to be tested.

[0122] In one embodiment, the measuring instrument acquires the signal under test through the currently connected probe, and the signal is also acquired by the measurement channel 12. Compensation processing is performed on the signal under test based on invoked frequency compensation parameters. For example, the compensation processing may include gain compensation and / or phase compensation; the gain compensation parameters correct the gain response of the signal under test, and the phase compensation parameters correct the phase response of the signal under test. Through compensation processing, the measuring instrument can maintain consistent frequency response characteristics across the entire operating bandwidth for measurement results under different probe configurations, thereby improving measurement accuracy and reliability in high-bandwidth measurement scenarios.

[0123] In summary, the oscilloscope 10 and frequency compensation method provided in this application can centrally manage the frequency compensation data of multiple replaceable probes 11, which facilitates automatic matching and recall of the corresponding frequency compensation parameters when the probe is replaced. At the same time, by storing the frequency compensation parameters as a calibration file, it is also convenient to update, import or recalibrate the frequency compensation data, thereby improving the applicability and measurement accuracy of the oscilloscope 10 and frequency compensation method in different measurement scenarios.

[0124] Those skilled in the art will understand that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, which may include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to achieve the above functions. For example, the program can be stored in the memory of a device, and when the program in the memory is executed by the processor, all or part of the above functions can be achieved. In addition, when all or part of the functions in the above embodiments are implemented by computer programs, the program can also be stored in a server, another computer, disk, optical disk, flash drive, or external hard drive, etc., and can be downloaded or copied to the memory of a local device, or the system of the local device can be updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be achieved.

[0125] The above examples illustrate the present invention only to aid in understanding it and are not intended to limit the scope of the invention. Those skilled in the art can make various simple deductions, modifications, or substitutions based on the principles of this invention.

Claims

1. An oscilloscope, characterized in that, include: A replaceable probe for acquiring a signal to be measured, wherein the replaceable probe includes at least one reference probe; At least one measurement channel is used to receive the signal to be measured transmitted through each probe; An interface unit is used to connect each probe to the measurement channel; A storage unit is used to store frequency compensation parameters for each probe, wherein the frequency compensation parameters include reference compensation parameters determined based on the frequency response parameters output by the oscilloscope when the reference probe is connected to the interface unit, and calibration compensation parameters for each probe determined based on the frequency response parameters of the reference probe and the frequency response parameters corresponding to each probe output by the oscilloscope when each probe is connected to the interface unit. Processing unit, used for: Determine the probe currently connected to the interface unit; The frequency compensation parameters corresponding to the currently connected probe are called based on the configuration parameters of the currently connected probe. The test signal acquired by the currently connected probe is compensated according to the frequency compensation parameters.

2. The oscilloscope as described in claim 1, characterized in that, The reference compensation parameters include reference gain compensation parameters, and the calibration compensation parameters include calibration gain compensation parameters; When the reference probe is connected to the interface unit, the reference gain compensation parameter is determined based on the gain response parameter output by the oscilloscope. When each probe is connected to the interface unit, the calibration gain compensation parameter of each probe is determined based on the quotient between the gain response parameter of the reference probe and the gain response parameter of each probe output by the oscilloscope.

3. The oscilloscope as described in claim 2, characterized in that, The reference compensation parameters also include reference phase compensation parameters, and the calibration compensation parameters also include calibration phase compensation parameters; When the reference probe is connected to the interface unit, the reference phase compensation parameters are determined based on the phase response parameters output by the oscilloscope. When each probe is connected to the interface unit, the calibration phase compensation parameter of each probe is determined based on the difference between the phase response parameter of the reference probe and the phase response parameter of each probe output by the oscilloscope.

4. The oscilloscope as described in claim 3, characterized in that, When the reference gain compensation parameter and the calibration gain compensation parameter are determined through different measurement channels, the reference gain compensation data of the preset reference channel of the oscilloscope is obtained; the reference gain compensation parameter and the calibration gain compensation parameter are calibrated according to the reference gain compensation data to determine the front-end reference gain compensation parameter and the front-end calibration gain compensation parameter used only for probe calibration. And / or, When the reference phase compensation parameter and the calibration phase compensation parameter are determined through different measurement channels, the reference phase compensation data of the preset reference channel of the oscilloscope is obtained; the reference phase compensation parameter and the calibration phase compensation parameter are calibrated according to the reference phase compensation data to determine the front-end reference phase compensation parameter and the front-end calibration phase compensation parameter used only for probe calibration.

5. The oscilloscope as described in claim 4, characterized in that, The preset reference channel is a channel pre-selected among the measurement channels, and the channel gain response data and channel phase response data of the other measurement channels besides the reference channel are normalized to determine the reference gain compensation data and reference phase compensation data of the reference channel.

6. The oscilloscope as described in claim 4, characterized in that, When the reference gain compensation parameter and the calibration gain compensation parameter are determined through the same measurement channel, the reference gain compensation parameter is the front-end reference gain compensation parameter, and the calibration gain compensation parameter is the front-end calibration gain compensation parameter. And / or, When the reference phase compensation parameter and the calibration phase compensation parameter are determined through the same measurement channel, the reference phase compensation parameter is the front-end reference phase compensation parameter, and the calibration phase compensation parameter is the front-end calibration phase compensation parameter.

7. The oscilloscope as described in claim 1, characterized in that, The processing unit compensates the signal under test acquired by the currently connected probe according to the frequency compensation parameters, including: Obtain channel frequency response data to represent the frequency compensation of each measurement channel and frequency compensation coefficients to represent the frequency compensation of the interface unit; The test signal acquired by the currently connected probe is compensated based on the channel frequency response data, frequency compensation coefficient, and frequency compensation parameters.

8. The oscilloscope as described in claim 1, characterized in that, The frequency compensation parameters are stored as a calibration file, which includes the identifier of each probe and the frequency compensation parameters corresponding to each probe.

9. A frequency compensation method, characterized in that, Applied to measuring instruments, including: Determine the probe currently connected to the measuring instrument; The frequency compensation parameters of the currently connected probe are invoked based on the configuration parameters of the currently connected probe. The test signal acquired by the currently connected probe is compensated according to the frequency compensation parameters; The frequency compensation parameters include the reference compensation parameters of the reference probe connected to the measuring instrument, and the calibration compensation parameters of each probe connected to the measuring instrument relative to the reference compensation parameters.

10. A computer-readable storage medium, characterized in that, The medium stores a computer program that can be executed by a processor to implement the method as described in claim 9.

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