Long baseline RTK ionospheric process noise adaptive adjustment method under ionospheric scintillation
By adaptively adjusting ionospheric process noise and optimizing ionospheric power spectral density, the problem of decreased long-baseline RTK positioning accuracy caused by ionospheric scintillation was solved, achieving centimeter-level positioning accuracy and reducing ambiguity error fixation rate.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-27
- Publication Date
- 2026-07-17
AI Technical Summary
In ionospheric scintillation environments, long-baseline RTK positioning accuracy suffers from a decline. Existing technologies struggle to effectively address the rapid and drastic nonlinear changes in parameters caused by ionospheric scintillation, leading to filter divergence and large positioning errors.
By calculating the rate of change of total electron content and power spectral density of the ionosphere based on the single difference between stations, the optimal amplification function is fitted to adaptively adjust the traditional empirical ionospheric power spectral density, dynamically adjust the ionospheric process noise, input the prediction covariance matrix of the Kalman filter, and optimize the ionospheric power spectral density to adapt to the real changes under ionospheric scintillation.
It significantly improves the positioning accuracy of long baseline RTK, with positioning accuracy stabilizing at the centimeter level, reducing the ambiguity error fixation rate, and alleviating the parameter estimation distortion problem during ionospheric scintillation.
Smart Images
Figure CN122410567A_ABST