PCB feature and detection task-based industrial planar ct acquisition parameter optimization method, system and device
By introducing camera pre-scan assistance and an AI quality-efficiency prediction model, the acquisition parameters of industrial planar CT are automatically configured, solving the problem of parameter dependence on human experience in existing technologies. This optimizes the accuracy, efficiency, and equipment lifespan of PCB inspection, adapting to the inspection needs of PCB boards of different specifications.
CN122415752APending Publication Date: 2026-07-17广州多浦乐电子科技股份有限公司
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 广州多浦乐电子科技股份有限公司
- Filing Date
- 2026-05-28
- Publication Date
- 2026-07-17
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Figure CN122415752A_ABST
Abstract
本发明公开了一种基于PCB特征与检测任务的工业平面CT采集参数自动优化方法、系统和设备，属于工业无损检测技术领域。本发明方法通过工业相机预扫获取PCB图像，自动识别并分割不同区域，提取区域特征并与PCB基础信息融合；构建AI质量效率预测模型，预测成像质量、扫描效率及设备损耗指标；采用多目标优化算法求解最优采集参数组，并自动下发至CT设备执行扫描。本发明实现了从“经验固定参数”到“一板一策略、一区一参数”的个性化配置，在保证缺陷检测精度的前提下，显著缩短扫描时间、降低X射线管损耗，提升检测产能与一致性，并具备闭环迭代优化能力。
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