Electronic test box for fast-changing functional vehicle

Abstract

The application provides a quick-change functional electronic test box for a vehicle, comprising a shell, a basic function module and a test function plate. The number of test function plate mounting holes arranged on the shell is one, and the test function plate is multiple. Each test function plate realizes different test function requirements. During use, the corresponding test function plate is inserted through the mounting hole, and the matching test function plate is replaced when the test object is changed. The part of the test function plate exposed from the shell is also provided with a matching connection port according to different test objects, and is connected with different test objects through different connection ports. When the test object is switched, only the test function plate for different test objects needs to be replaced. In this way, one box can be used for multiple purposes, multiple test boxes are not needed when testing different objects, and the configuration cost is reduced. The box body can be designed to be relatively small, facilitating carrying and transferring.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, specifically a quick-change automotive electronic test box. Background Technology

[0002] With the booming development of new energy vehicles, the number of electronic components installed in automobiles is increasing, including cameras, screens, central control systems, and audio systems. These components must all undergo rigorous testing before leaving the factory. The testing requirements for these components vary. To address this issue, Chinese invention patent application CN101126783A proposes a method and device for testing automotive electrical signals. This method connects dozens of single-function test boxes via external interfaces. While this method achieves the testing function, the system is complex, inconvenient to operate, and the cost of purchasing multiple devices is high. Chinese invention patent application CN10567680A proposes an automotive electronic control system tester and its testing method. This method uses software to define pins for different vehicle models, and the test boxes are relatively compact, solving the matching problem between different vehicle models. However, it can only perform tests on individual functions. Chinese invention patent application CN108693480A... The first application proposes a universal testing platform for automotive battery boxes. It uses a barcode scanner to scan product barcodes, and a host computer program determines if the product information matches. This allows for convenient testing of battery components such as fuses and nuts. However, this solution also matches information for different models of individual devices, but cannot perform cross-category testing. The invention patent application CN113376464A proposes a universal automotive central control product testing box circuit, capable of testing multiple test objects. However, concentrating various functions into one device makes the configuration more complex and costly. The utility model patent CN208060667U integrates numerous digital boards into the testing device. While its configuration is relatively comprehensive, a basic functional module needs to support multiple functional boards, requiring higher power. External interfaces for different functional boards also need to be designed on the housing, resulting in complex circuitry, large size, and inconvenience for transfer and handling. Currently, none of the background technologies can provide a test box that allows for convenient function conversion. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a quick-change function automotive electronic test box that can solve the problem of rapid function switching for multiple test objects.

[0004] The technical solution of this invention is: a quick-change functional automotive electronic test box, comprising a housing, a basic functional module, and a test function board. The housing contains the basic functional module, which has an inter-board high-speed connector slot. The test function board has an inter-board high-speed connector plug that matches the inter-board high-speed connector slot on the basic functional module. The housing has a test function board mounting hole, through which the test function board is inserted into the housing, allowing the inter-board high-speed connector plug to be inserted into the inter-board high-speed connector slot. The invention is characterized by: one mounting hole, multiple test function boards, each fulfilling different testing functional requirements. Each time it is used, the corresponding test function board is inserted through the mounting hole. When the test object changes, the matching test function board is replaced. The portion of the test function board exposed in the housing also has matching connection ports according to different test objects, allowing connection to different test objects through different connection ports.

[0005] Different test function boards are used to meet the requirements of different test objects. The basic function module carries the test function boards. When switching test objects, only the test function board for different test objects needs to be replaced. In this way, one box can be used for multiple purposes. When testing different objects, there is no need to configure multiple test boxes, which reduces configuration costs. The box can be designed to be relatively small, which is convenient for handling and transfer.

[0006] The test function board includes an external input interface, an interface adapter unit, and a board-level control interface management module. The external input interface is connected to the interface adapter unit, which is connected to the inter-board high-speed connector. The board-level control interface management module is connected to both the external input interface and the interface adapter unit. After receiving the signal from the object under test, the external input interface inputs the signal to the interface adapter unit, which then outputs the processed signal to the inter-board high-speed connector plug. The board-level control interface management module coordinates and controls the external input interface and the interface adapter unit. The basic function modules include a control management module, a storage module, a high-speed data receiving module, a data processing module, a data encapsulation and forwarding module, and an external communication interface module. The high-speed data receiving module is connected to the inter-board high-speed connector slot. The high-speed data receiving module, data processing module, data encapsulation and forwarding module, and external communication interface module are connected sequentially. The control management module is connected to the high-speed data receiving module, data processing module, data encapsulation and forwarding module, and external communication interface module. The storage module is connected to the control management module.

[0007] To ensure the fixation of the test function board, an improvement is proposed: a function board fixing device is provided on the housing near the mounting hole of the test function board. The function board fixing device includes a mounting base and a fixing clip. The fixing base is fixed to the housing, and the fixing clip is hinged to the mounting base. The fixing clip is provided with a limiting head and a pressing head, and the limiting head is provided with a limiting surface. In normal operation, the high-speed connector plug between the test function board is inserted into the corresponding high-speed connector slot between the baseboards, and the edge of the test function board panel fits against the edge of the mounting hole to form a whole housing. At this time, the limiting surface is close to the outer side of the test function board panel.

[0008] When the test box is working normally or being transported, the limiting surface of the function board fixing device is close to the outer side of the test function board panel, which plays an auxiliary fixing role. When you want to replace the test function board, you only need to press the pressing head, and the fixing clip can rotate around the hinge point, thereby disengaging the limiting head from the outer side of the test function board panel, and the test function board can be pulled out for replacement.

[0009] For ease of operation, a spring can be installed between the mounting base and the fixing clip. The spring's restoring force ensures that the limiting surface is pressed tightly against the outer side of the test function board panel. The spring can be a compression spring or a torsion spring.

[0010] While springs can provide some restraining force to the fixing clips, a large reset force requires a significant amount of force to press the head, making operation inconvenient. Conversely, a small reset force may cause the test function board to detach in situations with high vibration, such as during test box handling, and the high-speed connector plug between boards may still loosen. To address this issue, a locking clip can be installed. During normal operation, the locking clip tightly engages with the fixing clip, restricting its rotation and thus securing the test function board.

[0011] By using locking clips, the fixing clips can be locked in place, preventing the test function board from becoming loose due to handling or accidental contact. It also eliminates the need to set the spring's return force too high, making operation easier.

[0012] To prevent the insertion of incompatible test function boards, the present invention also proposes an improvement: a positioning component is provided near the mounting holes of the test function board.

[0013] The positioning component is designed primarily for identifying test function boards. A positioning structure is set at the position corresponding to the positioning component on the matching test function board. The matching is determined by whether the positioning component and the positioning structure fit together. Mismatched test function boards will have positioning components that limit their insertion into the working position, thus facilitating the differentiation and identification of the test function boards.

[0014] To facilitate the removal of the test function board, an auxiliary pop-out device can be set up. The auxiliary pop-out device can be a flexible component or a rotary head, which makes it easier to operate.

[0015] The quick-change automotive electronic test box provided by this invention adopts a modular design concept. It uses a system with general functions as a basic functional module and installs it in the housing. It integrates components configured separately for different test objects into a test function board. When changing different test objects, only the test function board needs to be replaced to easily perform tests on different test objects. It is equipped with a positioning component, and a positioning structure is set at the position corresponding to the positioning component. The positioning component and the positioning structure correspond to each other so that the matching test function board can be pushed into the test function board mounting hole and reach the working position.

[0016] The test function board can be disassembled and assembled without the use of related tools, reducing the number of operation steps and enabling quick, accurate and flexible replacement. The locking clip structure helps to achieve the purpose of fixing and ejection. Attached Figure Description

[0017] Figure 1 This is a front view of an embodiment of the quick-change functional automotive electronic test box of the present invention.

[0018] Figure 2 yes Figure 1 System schematic diagram of the embodiment.

[0019] Figure 3 yes Figure 1 Front view of the middle function board fixing device and the test function board panel.

[0020] Figure 4 yes Figure 3 Schematic diagram of the structural principle of the middle functional board fixing device.

[0021] Figure 5 yes Figure 4 The function panel retaining device is in the state when the press head is pressed, for use with Figure 4 It provides a clearer representation of structure and function compared to other methods.

[0022] Figure 6 , 7 yes Figure 3 A front view of the central functional panel fixing device, used to connect with... Figure 4 The explanation should be combined with the description of how the locking mechanism works. Figure 6 It is in the loose state. Figure 7 It is in the locked state.

[0023] Figure 8 This is a front view of another embodiment of the function board fixing device and mounting base.

[0024] Figure 9 , 10 This invention uses a different locking mechanism for a quick-change automotive electronic test box. (For ease of comparison and description) Figure 9 It is in the locked state. Figure 10 It is open.

[0025] Figure 11 yes Figure 9 A magnified view of a portion of the image is provided to illustrate the locking state of the locking mechanism in this embodiment.

[0026] Figure 12 yes Figure 10 A magnified view of a portion of the image is provided to illustrate the open state of the locking mechanism in this embodiment.

[0027] Figure 13 yes Figure 9 , 10 The embodiment in the test shows the state when the function board is removed.

[0028] Figure 14 yes Figure 13 A magnified view of the left edge of the mounting hole on the test function board.

[0029] Figure 15 yes Figure 13 A magnified view of the right edge of the mounting hole on the test function board.

[0030] Figure 16 This invention is a quick-change functional automotive electronic test box using another type of locking clip.

[0031] Figure 17 yes Figure 16 The enlarged view is shown to illustrate the principle of the locking mechanism in this embodiment.

[0032] Figure 18 yes Figure 16 A partial structural cross-sectional view of the locking mechanism is shown to illustrate the implementation of the spring and the rotating head.

[0033] Figure 19 yes Figure 16 The exploded view is used to illustrate the principle of the rotary head assisting in pulling out the test function board in this embodiment. Detailed Implementation

[0034] The specific embodiments of the present invention will be further described below with reference to the accompanying drawings and specific examples:

[0035] Implementation method 1.

[0036] Embodiment 1 is an example of a quick-change electronic test kit for vehicles according to the present invention, in conjunction with the accompanying drawings. Figure 1-7 illustrate.

[0037] like Figure 1As shown, the quick-change automotive electronic test box includes a housing 1, a basic functional module 2, and a test function board 3. The housing 1 houses the basic functional module 2, which has an inter-board high-speed connector slot. The test function board 3 has an inter-board high-speed connector plug that matches the inter-board high-speed connector slot on the basic functional module 2. The housing 1 has a test function board mounting hole, through which the test function board 3 is inserted into the housing 1, allowing the inter-board high-speed connector plug to be inserted into the inter-board high-speed connector slot. In this embodiment, there is one mounting hole, and multiple test function boards 3, each fulfilling different test function requirements. Each time it is used, the corresponding test function board 3 is inserted through the mounting hole. When the test object changes, the matching test function board 3 is replaced. The portion of the test function board 3 exposed on the housing also has matching connection ports according to different test objects, allowing connection to different test objects through different connection ports.

[0038] like Figure 2 As shown, the test function board 3 includes an external input interface, an interface adapter unit, a board-level control and management module, and a board identification unit. The external input interface is connected to the interface adapter unit, which is connected to the inter-board high-speed connector. The board-level control and management module is connected to the external input interface and the interface adapter unit. The board identification unit is connected to the basic function module 2 via the inter-board high-speed connector. After receiving the test signal from the object under test, the external input interface inputs the test signal to the interface adapter unit. The interface adapter unit receives, decodes, adapts the protocol, performs level conversion or format processing on the test signal, and then outputs it to the inter-board high-speed connector plug. The board-level control and management module coordinates and controls the external input interface and the interface adapter unit. Module 2 includes a control management module, a storage module, a high-speed data receiving module, a data processing module, a data encapsulation and forwarding module, an external communication interface module, and a power supply management unit. The high-speed data receiving module is connected to the inter-board high-speed connector slot. The high-speed data receiving module, data processing module, data encapsulation and forwarding module, and external communication interface module are connected in sequence. The control management module is connected to the high-speed data receiving module, data processing module, data encapsulation and forwarding module, external communication interface module, and power supply management unit. The storage module is connected to the control management module and / or the data processing module. The control management module is used to read the identity information of the test function board 3 and load the corresponding configuration parameters, channel mapping relationships, and interface working modes accordingly.

[0039] Depending on the requirements of the object under test, there can be multiple external input interfaces. These interfaces are received, decoded, adapted to protocols, or formatted through corresponding interface adapter units. The board-level control and management module coordinates and controls these multiple external input interfaces and interface adapter units. Data received by the high-speed connector between boards is transmitted to the high-speed data receiving module, processed by the data processing module, and then input to the data encapsulation and forwarding module. The data encapsulation and forwarding module forwards the data to the external communication interface module, and then transmits it to the host computer or subsequent system. All modules are coordinated and controlled by the control and management module, and the processed data is stored by the storage module.

[0040] Taking the test signal as an image signal as an example, the working process of this system is described in detail. The external image source and other signals of the object under test are first connected to the test function board through one or more external input interfaces. The test function board, as a replaceable interface adapter unit, is used to receive, decode, adapt protocols, convert levels or format the input signals according to different objects under test or different vehicle serial and parallel image interface schemes, and convert them into a data format that can be uniformly received by the basic function module side. The data format may include eDP, OpenLDI / OLDI or other standardized image interface forms.

[0041] After adaptation, the various data streams are transmitted to the basic functional module via high-speed inter-board connectors. In this embodiment, the high-speed inter-board connectors can use PCIe connectors as the physical connection form to achieve high-speed data interconnection, control signal exchange, board identification, and power supply connection between the test function board and the basic functional module, but the transmission protocol is not limited to PCIe. By centralizing the specific interface adaptation function on the test function board side and the unified receiving and processing capabilities on the basic functional module side, this system can adapt to different devices under test or different interface protocols by replacing different types of test function boards without changing the main architecture of the basic functional module, thereby improving the platform's versatility and scalability.

[0042] The high-speed data receiving module on the basic function module side receives multiple data streams from the test function board and sends them to the data processing module for local processing. The data processing module can perform preprocessing, status statistics, frame rate statistics, bad / missing frame detection, image anomaly detection, channel status monitoring, and necessary data organization for each channel's data according to the test type. For configuration parameters, status information, anomaly information, or specified test data that need to be retained, the basic function module can temporarily cache, save parameters, or record error data through the storage module. Subsequently, the data encapsulation and forwarding module encapsulates the processed data and its corresponding channel identifiers, status information, and statistical information, and completes scheduling and forwarding according to the system configuration.

[0043] The external communication interface module is used to output the encapsulated image data, test data, or status data to the optical interface, electrical interface, or routing board interface, and finally transmit it to the host computer or back-end system. The host computer or back-end system can generate test reports based on the received data, or display the operating status, abnormal location, and test results of each channel in the form of matrix tables, visual status diagrams, etc. The control and management module is used to uniformly configure, monitor the status, and schedule the operation of the test function board, the various function modules in the basic function module, and the external communication interface module, and supports test function board identification, automatic parameter matching, parameter loading, channel mapping, and fault location.

[0044] Through the above functional modules, this system forms a complete data link from external device under test input, test function board interface adaptation, high-speed transmission between functional modules, local processing of basic function modules, data encapsulation and forwarding to the host computer for display and analysis. At the same time, it realizes modular decoupling between the test function board and basic function modules, between channels, and between control and data processing.

[0045] The power supply, heat dissipation, electrostatic discharge protection and electromagnetic compatibility protection devices or circuits not described in detail in this embodiment can adopt conventional settings in the art.

[0046] like Figure 3 As shown, a function board fixing device 4 and a positioning component 5 are installed close to the mounting hole of the test function board. The function board fixing device 4 restricts the test function board panel 31 to prevent the test function board from falling out. In this embodiment, the positioning component 5 consists of four cylinders, and the positioning structure on the corresponding test function board consists of four circular holes with corresponding positions and shapes. In specific implementation, those skilled in the art can use other methods for positioning, as long as they can match the corresponding test function board and prevent the insertion of mismatched test function boards.

[0047] like Figure 4 As shown, the function board fixing device 4 in this embodiment includes: the function board fixing device includes a mounting base 411 and a fixing clip 421. The mounting base 411 is fixed on the housing 1, and the fixing clip 421 is hinged to the mounting base 411. The fixing clip 421 is provided with a pressing head 4211 and a limiting head 4212. The limiting head 4212 is provided with a limiting surface 42121. When in normal working condition, the inter-board high-speed connector plug of the test function board 3 is inserted into the inter-board high-speed connector slot of the corresponding basic function module 2. The edge of the test function board panel 31 is attached to the edge of the housing mounting hole to form an integral housing 1. At this time, the limiting surface 42121 is attached to the outside of the test function board panel 31 to prevent the test function board 3 from coming out.

[0048] like Figure 4 , 5As shown, the function board fixing device 4 includes a first reset spring 431. In this embodiment, the first reset spring 431 is in the form of a compression spring. A spring support 441 is provided on the mounting base 411, and the first reset spring 431 is installed between the fixing clip 421 and the spring support 441. The pressing head 4211 is located above the first reset spring 431. When pressed down, the pressing head 4211 can cause the limiting head 4212 to rotate in the direction of the first reset spring 431, thereby causing the limiting surface 42121 to disengage from the test function board panel 31. When not pressed, the limiting surface 42121 contacts the test function board 3, thereby preventing it from disengaging.

[0049] like Figure 4 , 5 As shown in Figures 6 and 7, the first locking member 451 is hinged to the spring support 441. The first locking member 451 is provided with a knob 4511 and a locking surface 4512. By rotating the knob 4511, the locking surface 4512 can be made to contact or disengage from the lower part of the fixing member 421. Figure 4 , 5 In state 6, the locking surface 4512 is disengaged from the bottom of the fixing clip 421. At this time, the pressing head 4211 can be pressed to make the limiting surface 42121 continuously disengage from the test function board panel 31, and the test function board 3 can be removed. Figure 7 This is the state when the locking surface 4512 is in contact with the lower part of the fixing clip 421. At this time, the locking clip 451 restricts the movement of the pressing head, so that the limiting surface 42121 is in continuous contact with the test function board panel 31, thus fixing the test function board 3.

[0050] When using the quick-change automotive electronic test box of this embodiment, after the test function board 3 is inserted into place, the rotary knob 4511 is turned so that the locking surface 4512 is in contact with the lower part of the fixing clip 421, thereby restricting the movement of the fixing clip 421. The limiting surface 42121 contacts the test function board panel 31 and prevents the test function board 3 from moving, so that it can work normally.

[0051] When it is necessary to replace the test function board 3, turn the rotary knob 4511 to disengage the locking surface 4512 from the fixing clip 421, and press the press head 4211 to pull out the test function board.

[0052] For ease of state comparison, Figure 1 The display shows the state when the locking surface 4512 is disengaged from the fixing clip 421 during the initial installation or replacement of the test function board 3; Figure 7 This displays the working status of the locking test function board 3.

[0053] Implementation method 2.

[0054] Embodiment 2 is another embodiment of the functional board fixing device and mounting base of the present invention, in conjunction with the appendix. Figure 8 illustrate.

[0055] like Figure 8 As shown, the spring support 442 is fixed to the housing body, rather than to the mounting base 412, and the other implementation methods are the same as in Embodiment 1.

[0056] Similarly, this embodiment can also be implemented on a quick-change automotive electronic test box.

[0057] Implementation method 3.

[0058] Implementation method 3 is another implementation of the quick-change electronic test box for vehicles involved in this invention, combined with... Figure 9-15 Describe it.

[0059] like Figure 9 , 10 11, 12, and 13, the fixing clips on the housing are implemented in the same way as in Embodiment 1, except for the implementation method of the locking clips. For ease of description, the locking clip in this embodiment is a second locking clip; for ease of comparison, Figure 9 , 11 This is the state where the second locking clip fixes the pressing head. Figure 10 , 12 This is the state where the second locking clip has released the pressing head; Figure 11 , 12 This is a magnified view to more clearly illustrate how the locking mechanism is implemented.

[0060] like Figure 12 As shown, the second locking clip 452 is hinged to the housing. The hinge hole between the second locking clip 452 and the housing is located below the press head side. A fixing post 4522 fixed to the housing is provided on the opposite side of the hinge hole. A groove 4521 is provided on the side of the second locking clip 452 away from the hinge hole, corresponding to the fixing post. The groove 4521 cooperates with the fixing post 452, and the two can fix the locking clip 451 when they are engaged. A protrusion 4523 is provided on the side of the second locking clip 451 near the spring support, and a locking surface 45231 is provided on the protrusion 4523. Figure 12 In the middle, the locking surface 45231 is disengaged from the fixing clip, the fixing clip can move, and the test function board can be pulled out.

[0061] Figure 13 This is the state when the test function board is removed; Figure 14 , 15 yes Figure 13 A magnified view of a portion, such as Figure 13 , 14As shown in Figure 15, the housing is provided with a guide groove 11 that mates with the edge of the test function board. The guide groove 11 starts from the mounting hole of the test function board and extends along the correct position of the test function board to guide the test function board into the correct position. Figure 13 The arrows in the diagram indicate the corresponding mating positions of the test function board and its corresponding guide groove.

[0062] like Figure 14 , 15 As shown, to facilitate the alignment and insertion of the test function board into the guide groove 11, the contact position between the guide groove 11 and the mounting hole of the test function board is provided with a rounded or chamfered corner. For ease of description, Figure 14 The enlarged view on the right side shows the rounded corners. Figure 15 The enlarged view on the left shows the bevel angle. In actual configuration, you can choose either rounded or beveled corners according to your needs.

[0063] like Figure 14 , 15 As shown, an auxiliary pop-out device 6 is also provided on the side of the mounting hole of the test function board. The auxiliary pop-out device 6 includes an elastic component and a pusher. When the pusher is pushed towards the elastic component, it can compress the elastic component. After the push is released, the elastic component returns to its original state, causing the pusher to pop outward. When the test function board is inserted into the working position, it contacts the pusher and compresses the elastic component. After the fixation of the test function board is released, the elastic component pushes the test function board out through the pusher for easy operation.

[0064] In this embodiment, an internally threaded countersunk hole 12 is provided on the housing body 1 for installing the auxiliary ejection device 6.

[0065] After the test function board is installed in place, the grounding contact part of the test function board contacts the conductive contact part of the side edge 13 of the test function board mounting hole. The material of the side edge 13 of the test function board mounting hole can be metal or other conductive material to form an electrostatic discharge path, shielding grounding path or functional grounding path between the test function board and the housing.

[0066] Implementation method 4.

[0067] Implementation 4 is another implementation of the quick-change electronic test box for vehicles involved in this invention. This embodiment is a variation of embodiment 1, and its key design features are: (1) the fixing clip is elongated to suit a flatter test box; (2) the locking clip has a different form; (3) the return spring is a torsion spring; (4) a rotary head is provided to assist in pulling out the test function board; the following is combined with Figure 16-18 Describe it.

[0068] like Figure 17As shown, the third locking clip 453 is installed on the side of the housing fixing clip. The third locking clip 453 is installed on the housing by screws 4531 and can slide left and right. The third locking clip 453 is provided with a locking tongue 4532, and the fixing clip is provided with a locking groove 4213 at the corresponding position. When the test function board is inserted and reaches the working position, the third locking clip 453 slides to the left, and the locking tongue 4532 is inserted into the locking groove 4213 to lock the fixing clip. When it is necessary to unlock, the third locking clip 453 slides to the right, the locking tongue 4532 disengages from the locking groove 4213, and the fixing clip can move.

[0069] like Figure 18 , 19 As shown, the mounting base is installed on the housing by screws, and the fixing clip is hinged to the mounting base. A second return spring 432 is mounted on the hinge shaft. The second return spring is a torsion spring. One end of the second return spring 432 abuts against the fixing clip, and the other end abuts against the mounting base. When the fixing clip rotates downward, the second return spring 432 deforms to provide a return force for the fixing clip.

[0070] like Figure 18 , 19 As shown, the fixing clip in this example is also provided with a rotating head 4214. The rotating head 4214 is located in front of the limiting head. In normal operation, the rotating head 4214 is located on the back side of the test function board panel. When the test function board is replaced, the limiting head is pressed, causing the fixing clip to rotate outward. The limiting head disengages from the outside of the test function board panel, and the rotating head contacts the inside of the test function board panel, assisting the high-speed connector plug between the test function boards to disengage from the high-speed connector slot between the boards.

[0071] To reduce frictional resistance, a roller 4215 is provided at the upper end of the rotary head 4214; when ejecting, the roller 4215 contacts the back side of the test function board panel, reducing resistance during ejection and the possibility of scratching the back side of the test function board panel.

[0072] Of course, the above description is not intended to limit the present invention, and the present invention is not limited to the examples given above. Any changes, modifications, additions or substitutions made by those skilled in the art within the scope of the present invention should also fall within the protection scope of the present invention.

Claims

1. A quick-change automotive electronic test box, comprising a housing, a basic functional module, and a test function board, wherein the basic functional module is disposed within the housing, the basic functional module is provided with an inter-board high-speed connector slot, and the test function board is provided with an inter-board high-speed connector plug that matches the inter-board high-speed connector slot on the basic functional module; the housing is provided with a test function board mounting hole, and the test function board is inserted into the housing through the mounting hole, such that the inter-board high-speed connector plug is inserted into the inter-board high-speed connector slot; characterized in that: There is one mounting hole and multiple test function boards, each of which performs different test function requirements. Each time it is used, the corresponding test function board is inserted through the mounting hole. When the test object changes, the matching test function board is replaced. The part of the test function board that is exposed on the casing is also equipped with matching connection ports according to different test objects, and can be connected to different test objects through different connection ports.

2. The quick-change functional automotive electronic test box according to claim 1, characterized in that: The test function board includes an external input interface, an interface adapter unit, a board-level control and management module, and a board identification unit. The external input interface connects to the interface adapter unit, which in turn connects to the high-speed inter-board connector. The board-level control and management module connects to both the external input interface and the interface adapter unit. The board identification unit connects to the basic function module via the high-speed inter-board connector. After receiving the test signal from the object under test, the external input interface sends the signal to the interface adapter unit. The interface adapter unit receives, decodes, adapts to the protocol, performs level conversion or format correction on the test signal, and then outputs it to the high-speed inter-board connector. The board-level control and management module coordinates and controls the external input interface and the interface adapter unit. The basic function module includes a control and management module, a storage module, a high-speed data receiving module, and a data... The system comprises a data processing module, a data encapsulation and forwarding module, an external communication interface module, and a power supply management unit. A high-speed data receiving module is connected to the high-speed connector slot between boards. The high-speed data receiving module, data processing module, data encapsulation and forwarding module, and external communication interface module are connected sequentially. A control management module is connected to the high-speed data receiving module, data processing module, data encapsulation and forwarding module, external communication interface module, and power supply management unit. A storage module is connected to the control management module and / or the data processing module. After reading the identity information of the board identification unit, the control management module loads the configuration parameters, channel mapping relationship, and interface working mode corresponding to the test function board. After confirming that the test function board is inserted correctly and / or its identity matches, it supplies power to the test function board or enables the corresponding interface through the power supply management unit.

3. The quick-change functional automotive electronic test box according to claim 1, characterized in that: A function board fixing device is provided on the side of the housing close to the mounting hole of the test function board. The function board fixing device includes a mounting base and a fixing clip. The fixing base is fixed to the housing, and the fixing clip is hinged to the mounting base. The fixing clip is provided with a limiting head and a pressing head. The limiting head is provided with a limiting surface. In normal working condition, the high-speed connector plug between the test function boards is inserted into the corresponding high-speed connector slot between the basic function modules. The edge of the test function board panel is attached to the edge of the mounting hole to form an integral housing. At this time, the limiting surface is close to the outer side of the test function board panel.

4. The quick-change functional automotive electronic test box according to claim 3, characterized in that: A first return spring is provided between the mounting base and the fixing clip. The first return spring is in the form of a compression spring. A spring support is provided on either the housing or the mounting base. The first return spring is installed between the fixing clip and the spring support.

5. The quick-change functional automotive electronic test box according to claim 3, characterized in that: A second return spring is provided between the mounting base and the fixing clip. The second return spring is in the form of a torsion spring. The fixing clip is hinged to the fixing base, and the second return spring is fitted on its hinge shaft. One end of the second return spring abuts against the fixing clip, and the other end abuts against the fixing base. When the fixing clip rotates downward, the second return spring deforms to provide a return force for the fixing clip.

6. The quick-change functional automotive electronic test box according to claim 4, characterized in that: It also includes a first locking clip, which is hinged to a spring support. The first locking clip is provided with a knob and a locking surface. By rotating the knob, the locking surface can be tightly fitted with the bottom of the fixing clip to restrict the rotation of the fixing clip, thereby fixing the test function board.

7. The quick-change functional automotive electronic test box according to claim 4, characterized in that: It also includes a second locking clip, which is hinged to the housing. A protrusion is provided on the side of the second locking clip near the spring support, and a locking surface is provided on the protrusion. The hinge hole between the second locking clip and the housing is located below the pressing head side. A fixing post fixed to the housing is provided on the opposite side of the hinge hole. A groove is provided on the side of the second locking clip away from the hinge hole, corresponding to the fixing post. The groove cooperates with the fixing post. When the two are engaged, the locking surface fits tightly against the bottom of the fixing clip to restrict the rotation of the fixing clip, thereby fixing the test function board.

8. The quick-change functional automotive electronic test box according to claim 4, characterized in that: It also includes a third locking clip, which is installed on the side of the housing fixing clip. The third locking clip is installed on the housing by screws and can slide left and right. The third locking clip is provided with a locking tongue, and the fixing clip is provided with a locking groove at the corresponding position. When the test function board is inserted and reaches the working position, the third locking clip slides to the left, and the locking tongue is inserted into the locking groove to lock the fixing clip. When it is necessary to unlock, the third locking clip slides to the right, the locking tongue is disengaged from the locking groove, and the fixing clip can move.

9. The quick-change functional automotive electronic test box according to claim 3, characterized in that: A positioning component is also provided near the mounting holes of the test function board.

10. The quick-change functional automotive electronic test box according to claim 3, characterized in that: An auxiliary ejection device is also provided on the side of the mounting hole of the test function board. The auxiliary ejection device includes an elastic component and a pusher. When the pusher is pushed towards the elastic component, it can compress the elastic component. After the push is released, the elastic component returns to its original state, causing the pusher to eject outward. When the test function board is inserted into the working position, it contacts the pusher and causes the elastic component to compress. After the fixation of the test function board is released, the elastic component pushes the test function board out through the pusher.

11. The quick-change functional automotive electronic test box according to claim 3, characterized in that: The fixing clip is also equipped with a rotating head, which is located in front of the limiting head. In normal operation, the rotating head is located behind the test function board panel. When the test function board is replaced, the limiting head is pressed, causing the fixing clip to rotate outward. The limiting head disengages from the outer side of the test function board panel, and the rotating head contacts the inner side of the test function board panel, assisting the high-speed connector plug between the test function boards to disengage from the high-speed connector slot between the boards.

12. The quick-change functional automotive electronic test box according to claim 1, characterized in that: The housing also features guide grooves that align with the edge of the test function board.

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