System and method for electrode inspection

Abstract

An electrode inspection system according to an embodiment of the disclosure can include an optical system configured to capture a top surface and a side surface of an electrode sheet traveling in one direction, thereby generating a top surface image and a side surface image of the electrode sheet, and an electrode inspection device configured to detect one or more burrs protruding perpendicularly from the electrode sheet using the side surface image, determine whether the electrode sheet exhibits skew using the top surface image, and adjust a position of the optical system.

Description

Technical Field

[0001] This application claims priority and benefit to Korean Patent Application No. 10-2024-0176989, filed on December 3, 2024, with the Korean Intellectual Property Office, the entire contents of which are incorporated herein by reference.

[0002] This disclosure relates to an electrode inspection system and method for batteries, and more specifically, to an electrode inspection system and method for determining whether an electrode sheet is defective using images of the electrode sheet. Background Technology

[0003] Rechargeable and reusable secondary batteries can be used as a power source for small devices such as mobile phones, tablet PCs and vacuum cleaners, and also as a power source for medium and large devices such as automobiles and smart grid energy storage systems (ESS).

[0004] Typically, secondary batteries are manufactured by housing an electrode assembly consisting of a positive electrode, a separator, and a negative electrode stacked in a repeating pattern within a casing such as a cylindrical can or a prismatic bag.

[0005] The positive and negative electrodes are manufactured by processing metal current collectors (copper for the negative electrode and aluminum for the positive electrode) to a predetermined size, and then coating their surfaces with positive or negative electrode slurry respectively, leaving a portion of the ends exposed.

[0006] Before being loaded into the casing, the electrodes are cut to a specified size. For example, during slitting, the electrode sheets travel in a specific direction and can be cut to a predetermined width. Because the slitting process involves a blade applying vertical pressure to cut the electrode sheets, burrs may form on the cut surfaces of the electrode sheets. These slitting burrs can potentially cause battery fires and need to be detected during the battery manufacturing process.

[0007] Among the prior art documents related to this disclosure, KR 10-2023-0053517 A is somewhat relevant. Summary of the Invention

[0008] [Technical Issues]

[0009] To avoid one or more problems in related technologies, embodiments of this disclosure provide an electrode inspection system that can use images of electrode sheets to detect slitting burrs.

[0010] To avoid one or more problems in related technologies, embodiments of this disclosure also provide an electrode inspection method using an electrode inspection system.

[0011] To avoid one or more problems of the related art, embodiments of this disclosure also provide an electrode inspection apparatus included in an electrode inspection system.

[0012] [Technical Solution]

[0013] To achieve the objectives of this disclosure, an electrode inspection system may include: an optical system configured to capture the top and side surfaces of an electrode sheet traveling in one direction, thereby generating a top surface image and a side surface image of the electrode sheet; and an electrode inspection device configured to use the side surface image to detect one or more burrs protruding vertically from the electrode sheet, use the top surface image to determine whether the electrode sheet is misaligned, and adjust the position of the optical system.

[0014] The optical system may include: an upper image sensor that generates an image of the top surface; a side image sensor that generates a side image; and one or more mirrors configured to guide light incident from the electrode sheet to the side image sensor.

[0015] The optical system may include a housing in which an optical path is formed, and an upper image sensor coupled to the top of the housing and a side image sensor coupled to the side of the housing.

[0016] One or more reflectors may include: a first reflector coupled to the bottom of the housing, which reflects light incident from the side of the electrode sheet into the interior of the housing; and a second reflector disposed within the housing, which reflects light reflected from the first reflector toward the side image sensor.

[0017] The electrode inspection device can also be configured to detect the edge lines of the electrode sheets in the top surface image and determine whether electrode sheet misalignment has occurred based on the edge lines.

[0018] The electrode inspection device can also be configured to: when it is determined that electrode misalignment has occurred, move the position of the optical system in the direction corresponding to the misalignment direction and adjust the focus of the side image sensor.

[0019] The electrode inspection device can also be configured to: identify the metal foil area in the side image and detect burr areas protruding from the metal foil area.

[0020] The electrode inspection device can also be configured to determine whether the electrode sheet is defective based on one or more of the size of the burr area and the protrusion length.

[0021] The electrode inspection device can also be configured to: create trend information, including one or more of the locations of burrs on the electrode sheet and the size of the burrs at each location, and visualize and output the trend information via a predetermined graphical user interface (GUI).

[0022] According to another embodiment of this disclosure, an electrode inspection method performed by an electrode inspection system, the electrode inspection system including an optical system and an electrode inspection device linked to the optical system, may include: capturing images of the top surface and side surface of an electrode sheet traveling in one direction via the optical system to generate a top surface image and a side surface image of the electrode sheet; and using the side surface image via the electrode inspection device to detect one or more burrs protruding vertically from the electrode sheet.

[0023] Electrode inspection methods may also include: using a top surface image with an electrode inspection device to determine whether the electrode sheet is misaligned; and when it is determined that the electrode sheet has misaligned, adjusting the position of the optical system.

[0024] Using a top surface image to determine whether an electrode pad has deviated can include: detecting the edge line of the electrode pad in the top surface image; and determining whether electrode pad deviation has occurred based on the edge line.

[0025] Adjusting the position of the optical system may include moving the optical system in a direction corresponding to the deflection direction to adjust the focus of the side image sensor included in the optical system.

[0026] Burr detection can include: identifying the foil region in the side image; and detecting burr regions protruding from the foil region.

[0027] Burr detection can include determining whether an electrode sheet is defective based on one or more of the size of the burr area and the length of the protrusion.

[0028] The method may further include: generating trend information, which includes one or more of the locations of burrs on the electrode sheet and the size of burrs at each location; and visualizing the trend information and outputting the trend information via a predetermined graphical user interface (GUI).

[0029] According to another embodiment of this disclosure, an electrode inspection apparatus is linked to an optical system configured to capture images of the top surface and sides of an electrode sheet traveling in one direction. The electrode inspection apparatus may include: at least one processor; and a memory configured to store at least one instruction executed by the at least one processor.

[0030] Here, at least one instruction includes instructions for: using a side image of the electrode sheet received from the optical system to detect burrs protruding vertically from the electrode sheet; using a top surface image of the electrode sheet received from the optical system to determine whether the electrode sheet is misaligned; and when it is determined that misalignment of the electrode sheet has occurred, adjusting the position of the optical system.

[0031] [Beneficial Effects]

[0032] According to embodiments of this disclosure, slitting burrs can be detected in real time by utilizing both side and top views of the simultaneously captured electrode sheet, thereby further improving the accuracy and time efficiency of electrode inspection. Attached Figure Description

[0033] Figure 1 This is a flowchart of the electrode manufacturing process.

[0034] Figure 2 This is a reference diagram used to illustrate the process of cutting burrs.

[0035] Figure 3 This is a block configuration diagram of an electrode inspection system according to an embodiment of the present disclosure.

[0036] Figure 4 This is a reference diagram illustrating the operation of an electrode inspection system according to an embodiment of the present disclosure.

[0037] Figure 5 This is a block configuration diagram of an optical system according to an embodiment of the present disclosure.

[0038] Figures 6 to 8 These are examples of optical systems implemented according to embodiments of the present disclosure.

[0039] Figure 9 This is a flowchart of the operation of an electrode inspection method according to an embodiment of the present disclosure.

[0040] Figure 10 This is a reference diagram used to illustrate a burr detection method according to an embodiment of the present disclosure.

[0041] Figure 11 It is a reference graph used to illustrate trend information according to embodiments of the present disclosure.

[0042] Figure 12 This is a flowchart of an operation sequence for a position adjustment method for an optical system according to an embodiment of the present disclosure.

[0043] Figure 13 This is a reference image used to illustrate a method for determining the presence of deviation according to an embodiment of the present disclosure.

[0044] Figure 14 This is a block configuration diagram of an electrode inspection apparatus according to an embodiment of the present disclosure.

[0045] 10: Electrode plates

[0046] 100: Optical System

[0047] 200: Electrode Inspection Device

[0048] 1400: Electrode Inspection Device Detailed Implementation

[0049] This invention can be modified in various forms and has various embodiments, and specific embodiments thereof are shown by way of example in the accompanying drawings and will be described in detail below. However, it should be understood that the invention is not intended to be limited to the specific embodiments, but rather, the invention is intended to cover all modifications, equivalents, and substitutions falling within the spirit and scope of the invention. Throughout the description of the accompanying drawings, the same reference numerals refer to the same elements.

[0050] It will be understood that although terms such as first, second, A, B, etc., may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used only to distinguish one element from another. For example, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element, without departing from the scope of the invention. As used herein, the term "and / or" includes a plurality of associated listed items or a combination of any one of a plurality of associated listed items.

[0051] It will be understood that when a component is described as "coupled" or "connected" to another component, it can be directly coupled or connected to the other component, or there may be intermediate components. Conversely, when a component is described as "directly coupled" or "directly connected" to another component, there are no intermediate components.

[0052] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the invention. As used herein, the singular forms “a,” “an,” and “the” are also intended to include the plural forms unless the context clearly indicates otherwise. It will be further understood that the terms “comprising,” “including,” “covering,” “containing,” and / or “having” as used herein specify the presence of stated features, integers, steps, operations, constituent elements, components, and / or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, constituent elements, components, and / or combinations thereof.

[0053] Unless otherwise defined, all terms used herein, including technical and scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It will also be understood that terms such as those defined in common dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant field, and will not be interpreted in an idealized or overly formal sense unless expressly defined herein.

[0054] Figure 1 This is a flowchart of the electrode manufacturing process.

[0055] like Figure 1As shown, the electrode manufacturing process for secondary batteries can be carried out through a mixing process (S10), a coating process (S20), a drying process (S30), a rolling process (S40), a slitting process (S50), and a grooving process (S60).

[0056] The mixing process (S10) is a process for mixing electrode raw materials. Here, the electrode material may include a positive electrode active material or a negative electrode active material. Known materials can be used as electrode materials, and the mixing process can produce a liquid electrode material.

[0057] The coating process (S20) is the process of coating liquid electrode material onto a sheet. Here, the sheet can refer to a metal foil formed from a metallic material such as aluminum or copper. The coating equipment is installed in the travel path of the sheet and can apply the liquid electrode material to the traveling sheet. Through the coating process, coated portions with coated electrode material and uncoated portions without coated electrode material can be formed in the sheet.

[0058] In the following text, the sheet coated with electrode material is referred to as an "electrode sheet".

[0059] The drying process (S30) is a process used to dry the electrode material.

[0060] The rolling process (S40) is the process of rolling dry electrode material onto the electrode sheet.

[0061] The slitting process (S50) is a process for cutting electrode sheets along the running direction, which is the longitudinal direction of the electrode sheets. The slitting equipment performing the slitting process can cut the electrode sheets in the longitudinal direction to ensure that they are cut to a preset electrode width specification.

[0062] The grooving process (S60) is a process used to process electrode sheets to form terminal parts and predetermined shapes.

[0063] Figure 2 This is a reference diagram used to illustrate the process of cutting burrs.

[0064] During the slitting process, the electrode sheet travels in a predetermined direction and can be cut into specified widths. Specifically, it can be as follows: Figure 2 The cutting process is shown, in which a blade (N) applies pressure to the electrode sheet 10 in the vertical direction to cut it.

[0065] During this slitting process, if the blade (N) wears or its shape is deformed, the electrode sheet 10 may be cut unevenly, resulting in burrs (b) forming on the cut surface of the electrode sheet 10. Subsequently, as the cutting action of the blade (N) is repeated, the slitting burrs (b) are continuously formed.

[0066] The slitting burr (b) could potentially cause the battery to catch fire, thus necessitating more accurate detection of the slitting burr (b) during the battery manufacturing process. However, there are limitations to the current ability to accurately detect slitting burrs on moving electrode sheets.

[0067] The present disclosure and its various embodiments will be described in detail below with reference to the accompanying drawings.

[0068] Figure 3 This is a block diagram of an electrode inspection system according to an embodiment of the present disclosure, and Figure 4 This is a reference diagram illustrating the operation of an electrode inspection system according to an embodiment of the present disclosure.

[0069] refer to Figure 3 The electrode inspection system may include an optical system 100 and an electrode inspection device 200.

[0070] The optical system 100 is a device for capturing images of the top surface and side surfaces of the electrode sheet 10. Here, the optical system 100 can generate top surface and side surface images of a specific area of ​​the electrode sheet 10 and provide them to the electrode inspection apparatus 200.

[0071] The optical system 100 may include an upper image sensor for generating an image of the upper surface of the electrode sheet 10 and a side image sensor for generating an image of the side surface of the electrode sheet 10.

[0072] The optical system 100 can capture the top surface and side surface of the electrode sheet 10 traveling in one direction. Here, the optical system 100 can generate a top surface image and a side surface image per unit time.

[0073] Specifically, such as Figure 4 As shown, the electrode sheet 10 can be conveyed along the conveying direction (y) via the conveying unit 20. Here, the conveying unit 20 can guide the electrode sheet 10 from the unwinding unit 30 to the rewinding unit 40.

[0074] The optical system 100 is positioned along the travel path of the electrode sheet 10 and can simultaneously capture images of the side and top surfaces of the electrode sheet 10. Here, the optical system 100 can generate top surface and side surface images every unit time (e.g., 10 ms) and send them to the electrode inspection device 200.

[0075] Refer again Figure 3 The electrode inspection device 200 can use top surface and side surface images received from the optical system 100 to detect burrs generated on the electrode sheet 10. Here, burrs can refer to protrusions extending vertically from the horizontal plane of the electrode sheet 10.

[0076] The electrode inspection device 200 can determine whether burrs have formed on the electrode sheet 10 by identifying burr areas that protrude vertically from the electrode sheet 10 in a side view image. For example, the electrode inspection device 200 can use a predetermined image analysis algorithm to identify the metal foil area in the side view image and detect the burr areas protruding from the metal foil area.

[0077] The electrode inspection device 200 can determine whether an electrode sheet is defective based on one or more of the size of the burr area and the protrusion length. For example, if the area of ​​the burr area detected in a side image exceeds a predetermined threshold area, or if the vertical length of the burr area exceeds a predetermined threshold length, the corresponding electrode sheet 10 can be judged as defective.

[0078] The electrode inspection device 200 can use the top surface image to determine whether the electrode sheet 10 is misaligned (laterally deviated). If misalignment of the electrode sheet 10 is determined to have occurred, the position of the optical system 100 can be adjusted to adjust the focus of the side image sensor. Here, the electrode inspection device 200 can send a position adjustment signal to the control device supporting the sliding unit of the optical system 100, thereby moving the position of the optical system 100.

[0079] Lateral deviation of electrode 10 can mean that electrode 10 moves partially in a direction (x) perpendicular to the direction of travel (y) while traveling. If lateral deviation of electrode 10 occurs, the focus of the side image sensor capturing the side of electrode 10 changes, potentially degrading the quality of the side image. To prevent this image quality degradation, electrode inspection device 200 analyzes the top surface image to monitor whether electrode 10 has deviated. When deviation occurs, electrode inspection device can move the position of optical system 100 in a direction corresponding to the deviation direction to adjust the focus of the side image sensor.

[0080] Figure 5 This is a block configuration diagram of an optical system according to an embodiment of the present disclosure.

[0081] refer to Figure 5 The optical system 100 may include an upper image sensor 110, a side image sensor 120, and one or more mirrors. Here, the one or more mirrors may include a first mirror 131 and a second mirror 132.

[0082] The optical system 100 can simultaneously capture the top surface and side surface of the electrode sheet 10 traveling in one direction (y), thereby generating a top surface image and a side surface image.

[0083] The upper image sensor 110 can generate a top surface image by capturing a portion of the cut surface of the top surface, including the electrode sheet 10 (see [link]). Figure 13 (A)).

[0084] The side image sensor 120 can generate a side image by capturing an image of a portion of the side region of the electrode sheet 10 (see [link]). Figure 10 (A)).

[0085] One or more mirrors can be arranged to guide light incident from the side of the electrode sheet 10 to the side image sensor 120. For example, as Figure 5 As shown, a first reflector 131 located on one side of the electrode sheet 10 reflects light incident from one side of the electrode sheet 10 toward a second reflector 132, and the second reflector 132 reflects light incident from the first reflector 131 toward a side image sensor 120. The side image sensor 120 can receive light incident from the second reflector 132 to generate an image of the side of the electrode sheet 10.

[0086] Figures 6 to 8 This is an example of an optical system implemented according to embodiments of the present disclosure. Here, Figure 6 This is a front view of the optical system. Figure 7 This is a right-side view of the optical system, and Figure 8 This is the left-side view of the optical system.

[0087] refer to Figures 6 to 8 The optical system may include a housing 140 with a specific shape, within which an optical path is formed. Here, the upper image sensor 110 may be fixedly coupled to the top of the housing 140, and the side image sensor 120 may be fixedly coupled to the side of the housing 140.

[0088] The first reflector 131 is coupled to the bottom of the housing 140 and can reflect light incident from the side of the electrode sheet 10 into the interior of the housing 140.

[0089] The second reflector 132 is disposed inside the housing 140 and can reflect the light reflected from the first reflector 131 toward the side image sensor 120.

[0090] The lighting unit 150 can be coupled to the bottom of the housing 140 to illuminate a uniform surface light toward the first reflector 131. Here, the lighting unit 150 can be a coaxial lighting device.

[0091] A portion of the housing 140 can be coupled to a sliding unit (not shown) and can be moved by the sliding unit in the x-axis direction (perpendicular to the direction of travel).

[0092] like Figures 6 to 8As shown, the upper image sensor 110, the side image sensor 120, the first reflector 131, the second reflector 132, the housing 140, and the illumination unit 150 included in the optical system 100 can be integrally formed. When the optical system 100 moves in the x-axis direction (perpendicular to the direction of travel) via the sliding unit, the distance between the first reflector 131 and the electrode plate 10 changes, thereby allowing adjustment of the focus of the side image sensor 120.

[0093] Figure 9 This is a flowchart of the operation of an electrode inspection method according to an embodiment of the present disclosure.

[0094] The optical system can simultaneously capture the top surface and side surface of an electrode sheet traveling in one direction (S910), thereby generating a top surface image and a side surface image of the electrode sheet. Here, the optical system can generate the top surface image and the side surface image every unit time (e.g., 10 ms).

[0095] The electrode inspection device can use a side view of the electrode sheet to detect one or more burrs protruding vertically from the electrode sheet (S920).

[0096] Figure 10 This is a reference diagram illustrating a burr detection method according to an embodiment of the present disclosure. Reference Figure 10 The electrode inspection device can identify the metal foil region (A) in a side image received from the optical system and detect burr regions (B) protruding from the metal foil region. Here, the electrode inspection device can use a predetermined image analysis algorithm to determine the metal foil region and the burr region in the side image (A). For example, based on the gray level of each pixel in the side image (A), the electrode inspection device can detect the metal region and identify the metal foil region with a vertical line shape and the burr region protruding from the metal foil region.

[0097] Refer again Figure 9 The electrode inspection device can determine whether an electrode sheet is defective based on one or more of the size of the burr area and the protrusion length (S930). For example, if the area of ​​the burr area detected in the side image exceeds a predetermined threshold area, or if the vertical length of the burr area exceeds a predetermined threshold length, the corresponding electrode sheet can be judged to be defective.

[0098] The electrode inspection device can generate trend information including at least one of the locations of burrs on the electrode sheet and the size of the burrs at each location. The electrode inspection device can then visualize the trend information and output it via a predetermined graphical user interface (GUI).

[0099] Figure 11 It is a reference graph used to illustrate trend information according to embodiments of the present disclosure.

[0100] refer to Figure 11 The electrode inspection device can collect inspection information based on the length direction (or travel direction) of the electrode sheet, including the location of burrs and the size of burrs at each location. Subsequently, the electrode inspection device can visualize the location of burrs and the size of burrs at each location on the electrode sheet in a two-dimensional graphic format and output it via a display device.

[0101] Figure 12 This is a flowchart of an operation sequence for a position adjustment method for an optical system according to an embodiment of the present disclosure.

[0102] The optical system can simultaneously capture images of the top surface and side surface of an electrode sheet traveling in one direction (S1210), thereby generating a top surface image and a side surface image of the electrode sheet. Here, the optical system can generate the top surface image and the side surface image every unit time (e.g., 10 ms).

[0103] The electrode inspection device can use an image of the top surface of the electrode sheet to determine whether the electrode sheet has deviated (S1220). Here, electrode sheet deviation can mean that the electrode sheet moves while partially shifting in a direction (x) perpendicular to the direction of travel (y).

[0104] Figure 13 This is a reference image used to illustrate a method for determining the presence of deviation according to an embodiment of the present disclosure.

[0105] refer to Figure 13 The electrode inspection device can detect (B) the edge lines of the electrode sheets in the top surface image (A) received from the optical system. Here, the electrode inspection device can use a predetermined image analysis algorithm to detect the edge lines in the top surface image (A). For example, based on the gray level of each pixel in the top surface image (A), the coated area and void area of ​​the electrode can be identified, and the boundary line between the coated area and void area of ​​the electrode can be defined as the edge line.

[0106] Subsequently, the electrode inspection device can monitor the x-coordinate of the electrode tip based on the edge lines detected in each of the multiple top surface images. Here, if the distance between the x-coordinate of the electrode tip and the preset reference coordinate is greater than or equal to a set distance, it can be determined that electrode misalignment has occurred.

[0107] Refer again Figure 12If it is determined that electrode misalignment has occurred (as in S1230), the electrode inspection device can adjust the position of the optical system in the direction corresponding to the misalignment direction to adjust the focus of the side image sensor (S1240). Here, the electrode inspection device can send a position adjustment signal, including the direction of movement and the distance of movement, to the control device of the sliding unit supporting the optical system to move the position of the optical system.

[0108] like Figures 6 to 8 As shown, since the optical system according to the embodiments of this disclosure is integrally formed, when the optical system moves in a direction corresponding to the deflection direction via the sliding unit, the distance between the first reflector 131 and the electrode plate 10 changes, thereby allowing adjustment of the focus of the side image sensor 120.

[0109] Figure 14 This is a block configuration diagram of an electrode inspection apparatus according to an embodiment of the present disclosure.

[0110] The electrode inspection apparatus 1400 according to an embodiment of the present disclosure can be linked to an optical system that captures images of the top surface and sides of an electrode sheet traveling in one direction.

[0111] The electrode inspection device 1400 may include at least one processor 1410, a memory 1420 storing at least one command executed by the processor, and a transceiver 1430 connected to a network for performing communication.

[0112] The at least one command includes: a command for detecting burrs protruding in the vertical direction of the electrode sheet using a side image of the electrode sheet received from the optical system; a command for determining whether the electrode sheet exhibits misalignment using a top surface image of the electrode sheet received from the optical system; and a command for adjusting the position of the optical system if it is determined that misalignment of the electrode sheet has occurred.

[0113] Commands for determining whether an electrode sheet is bent may include: commands for detecting the edge lines of the electrode sheet in a top surface image; and commands for determining whether electrode sheet misalignment has occurred based on the edge lines.

[0114] Commands for adjusting the position of the optical system may include commands for moving the position of the optical system in a direction corresponding to the deflection direction to adjust the focus of the side image sensor included in the optical system.

[0115] Commands for detecting burrs may include: commands for identifying foil regions in a side image; and commands for detecting burr regions protruding from the foil regions.

[0116] Commands for detecting burrs may include commands for determining whether an electrode sheet is defective based on one or more of the size of the burr area and the length of the protrusion.

[0117] The at least one command may further include: a command for generating trend information, the trend information including one or more of the locations of burrs on the electrode sheet and the size of the burrs at each location; and a command for visualizing and outputting the trend information through a predetermined graphical user interface (GUI).

[0118] The electrode inspection device 1400 may also include an input interface device 1440, an output interface device 1450, a storage device 1460, etc. The various components included in the electrode inspection device 1400 can be connected via a bus 1470 and can communicate with each other.

[0119] Here, processor 1410 may refer to a central processing unit (CPU), graphics processing unit (GPU), or dedicated processor on which the methods according to embodiments of the present disclosure are executed. Furthermore, the memory may include one or more of volatile / temporary recording media and non-volatile / non-temporary recording media. For example, the memory may include at least one of read-only memory (ROM) and random access memory (RAM), and may include electrically erasable programmable read-only memory (EEPROM).

[0120] The operation of the methods according to embodiments of this disclosure can be implemented as a computer-readable program or code on a computer-readable recording medium. A computer-readable recording medium includes all types of recording devices in which computer systems store data readable by the computer. Furthermore, the computer-readable recording medium can be distributed across a network-connected computer system to store and execute the computer-readable program or code in a distributed manner.

[0121] The operation of the methods according to embodiments of this disclosure can be implemented in various forms associated with a program, such as a computer program or code itself, or a computer program product.

[0122] In addition, computer-readable recording media may include one or more of volatile / temporary recording media and non-volatile / non-temporary recording media.

[0123] Additionally, computer-readable recording media can include hardware devices specifically configured to store and execute program instructions, such as ROM, RAM, and flash memory, and can include, for example, various types of servers located on a network. Program instructions can include not only machine language code, such as that created by a compiler, but also high-level language code that can be executed by a computer using an interpreter.

[0124] Although some aspects of the invention have been described in the context of apparatus, they may also refer to, according to the description of the corresponding method, a block or apparatus corresponding to a method step or feature of a method step. Similarly, aspects described in the context of a method may also refer to a corresponding block or item or feature of a corresponding apparatus. Some or all of the method steps may be performed by (or using) hardware means such as, for example, a microprocessor, a programmable computer, or electronic circuitry. In some embodiments, one or more of the most important method steps may be performed by such means.

[0125] In the foregoing, this disclosure has been described with reference to exemplary embodiments thereof; however, those skilled in the art will understand that various corrections and changes may be made to this disclosure within the scope thereof without departing from the spirit and field of the disclosure as described in the appended claims.

Claims

1. An electrode inspection system, comprising: An optical system configured to capture images of the top and side surfaces of an electrode sheet traveling in one direction, thereby generating images of the top and side surfaces of the electrode sheet; as well as An electrode inspection device is configured to use the side image to detect one or more burrs protruding vertically from the electrode sheet, use the top surface image to determine whether the electrode sheet is misaligned, and adjust the position of the optical system.

2. The electrode inspection system according to claim 1, wherein, The optical system includes: An upper image sensor generates an image of the top surface; A side image sensor, wherein the side image sensor generates the side image; and One or more reflectors are configured to guide light incident from the electrode sheet to the side image sensor.

3. The electrode inspection system according to claim 2, wherein, The optical system includes: A housing in which optical paths are formed. The upper image sensor is coupled to the top of the housing, and the side image sensor is coupled to the side of the housing.

4. The electrode inspection system according to claim 3, wherein, The one or more reflectors include: A first reflector coupled to the bottom of the housing, the first reflector reflecting light incident from the side of the electrode sheet into the interior of the housing; and A second reflector disposed within the housing reflects light reflected from the first reflector toward the side image sensor.

5. The electrode inspection system according to claim 1, wherein the electrode inspection device is further configured to: The edge lines of the electrode sheet in the top surface image are detected, and the deviation of the electrode sheet is determined based on the edge lines.

6. The electrode inspection system according to claim 2, wherein the electrode inspection device is further configured to: When it is determined that the electrode has deviated, the position of the optical system is moved in the direction corresponding to the deviation direction, and the focus of the side image sensor is adjusted.

7. The electrode inspection system according to claim 1, wherein, The electrode inspection device is also configured to: Identify the metal foil region in the side image and detect burr regions protruding from the metal foil region.

8. The electrode inspection system according to claim 7, wherein, The electrode inspection device is also configured to: The presence of defects in the electrode sheet is determined based on one or more of the size of the burr area and the length of the protrusion.

9. The electrode inspection system according to claim 7, wherein, The electrode inspection device is also configured to: Generate trend information, which includes one or more of the locations of burrs on the electrode sheet and the size of burrs at each location; and The trend information is visualized and output via a predefined graphical user interface (GUI).

10. An electrode inspection method performed by an electrode inspection system, the electrode inspection system comprising an optical system and an electrode inspection device linked to the optical system, the method comprising: The optical system captures images of the top and side surfaces of an electrode sheet traveling in one direction to generate images of the top and side surfaces of the electrode sheet. and The electrode inspection device uses the side image to detect one or more burrs that protrude vertically from the electrode sheet.

11. The method of claim 10, further comprising: The electrode inspection device uses the top surface image to determine whether the electrode sheet is misaligned. and When it is determined that the electrode has deviated, the position of the optical system is adjusted.

12. The method according to claim 11, wherein, Determining whether the electrode plate exhibits misalignment using the top surface image includes: Detect the edge line of the electrode sheet in the top surface image; and The edge line is used to determine whether the electrode sheet has deviated.

13. The method according to claim 11, wherein, Adjusting the position of the optical system includes: The position of the optical system is moved in the direction corresponding to the deflection direction in order to adjust the focus of the side image sensor included in the optical system.

14. The method of claim 10, wherein, Detecting the burrs includes: Identify the metal foil region in the side image; and Detect burr areas protruding from the metal foil area.

15. The method according to claim 14, wherein, Detecting the burrs includes: The electrode sheet is determined to be defective based on one or more of the size of the burr area and the length of the protrusion.

16. The method of claim 15, further comprising: Generate trend information, which includes one or more of the locations of burrs on the electrode sheet and the size of burrs at each location; and The trend information is visualized and output via a predetermined graphical user interface (GUI).

17. An electrode inspection apparatus linked to an optical system configured to capture images of the top and side surfaces of an electrode sheet traveling in one direction, the apparatus comprising: At least one processor; as well as A memory configured to store at least one instruction executed by the at least one processor; Wherein, the at least one instruction includes instructions for the following: The side image of the electrode sheet received from the optical system is used to detect burrs that protrude vertically from the electrode sheet; The top surface image of the electrode sheet received from the optical system is used to determine whether the electrode sheet exhibits misalignment; and When it is determined that the electrode has deviated, the position of the optical system is adjusted.

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