Integrated test probe

Abstract

The utility model provides an integrated test probe which comprises a first support, a second support and a plurality of probe monomers, the first support and the second support are coupled with each other, the first support is separably arranged at the upper end of the second support, and the probe monomers penetrate through the second support downwards from the first support. At least part of the probe monomer is fixedly connected with the first support; the upper part of the probe monomer is provided with a leading-out end part electrically connected with external test equipment, and the lower part of the probe monomer is provided with a detection end part electrically connected with an external detection part. The integrated test probe provided by the utility model has the advantages of high reliability, long service life, accurate test, better and more stable electrical performance, low processing cost, replaceable core parts and the like.

Description

Technical Field

[0001] The present application relates to the technical field of radio frequency connector testing, and in particular to an integrated test probe for assisting in testing a radio frequency connector. Background Art

[0002] In the RF connector industry, RF connectors need to be tested to ensure product quality. Currently, there is a solution that uses a board-side multi-channel test module for testing.

[0003] Most board-side multi-channel test modules adopt a small-pitch integration solution. The working principle is as follows: the bottom of the board-side multi-channel test probe is integrated with multiple probe heads; the board-side multi-channel test probe is locked on the upper fixture by screws, and the object to be tested (such as an RF connector) is fixed on the lower fixture. The upper fixture is driven downward by a motor to make the board-side multi-channel test probe contact and conduct with the object to be tested, and the inspector uses the instrument to detect whether the product meets the requirements.

[0004] However, this solution currently has some disadvantages, such as high processing difficulty, small interface spring pin spacing, low life, the entire system will be scrapped if one spring pin is damaged, inability to perform stable and accurate testing, high cost, etc. These defects reduce testing efficiency and increase costs, making this integrated testing solution difficult to circulate in the market.

[0005] Therefore, researching and developing a new integrated test probe solution has become an urgent problem to be solved by those skilled in the art. Utility Model Content

[0006] In order to overcome the defects of the above-mentioned prior art, the present application provides an integrated test probe that can be used for integrated testing of RF connectors, which has the advantages of high reliability, long life, precise testing, better and more stable electrical performance, low processing cost, and replaceable core components.

[0007] Specifically, the present application provides an integrated test probe, which includes a first support and a second support coupled to each other and a plurality of probe monomers, wherein the first support is detachably arranged at the upper end of the second support, the probe monomer extends downward through the second support from the first support, and the probe monomer is at least partially fixedly connected to the first support; the upper part of the probe monomer is provided with a lead-out end electrically connected to an external test device, and the lower part of the probe monomer is provided with a detection end electrically connected to an external detection component.

[0008] In an optional implementation, the first support is provided with a plurality of upper mounting holes for mounting the probe unit, and the second support is provided with a plurality of lower mounting holes located opposite to the upper mounting holes.

[0009] In an optional implementation, the first support and the second support are connected by a positioning assembly, and the positioning assembly includes a matching positioning member and a positioning hole; the positioning member is protruding from the lower surface of the first support, and the positioning hole is provided in the second support and corresponds to the position of the positioning member; or, the positioning member is protruding from the upper surface of the second support, and the positioning hole is provided in the first support and corresponds to the position of the positioning member.

[0010] In an optional implementation, the probe unit is an integrated probe, and the integrated probe is fixedly connected to one of the upper mounting holes of the first support and is gap-fitted with a corresponding lower mounting hole.

[0011] In another optional implementation, the probe monomer includes a first probe component and a second probe component that are separated from each other, the first probe component is arranged on the first support, and the second probe component is arranged on the second support; the upper end of the first probe component is the lead-out end, the lower end of the first probe component is arranged as the interface end, the lower end of the second probe component is arranged as the detection end, the upper end of the second probe component is arranged as the positioning end, and the interface end and the positioning end are coupled.

[0012] According to the technical solution provided by the aforementioned implementation, the integrated test probe has at least the following advantages:

[0013] (1) By coupling and detaching the first support and the second support, the first support and the second support can respectively realize different motion states, and can realize disassembly and assembly installation testing; and a plurality of probe units are connected to the first support, and when the first support is moved, the probe units can be synchronously moved, which can achieve the effect of precise positioning and flexible switching of tests.

[0014] (2) By setting the positioning component, the positioning accuracy of the first support and the second support can be improved.

[0015] (3) By adopting an integrated probe, it is easy to replace to suit various general or specific test scenarios.

[0016] (4) By adopting a separate probe structure, a first probe assembly is respectively arranged on a first support and a second probe assembly is arranged on a second support, and the ends of the first probe assembly and the second probe assembly are coupled and connected, so as to have a split combination effect. In automated testing, multiple integrated test probes can be used. Through the orderly coordination of the first probe assembly and multiple second probe assemblies, flow-line operation of multiple detection processes can be realized. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0018] Figure 1 A schematic diagram of the structure of an integrated test probe provided in one embodiment of the present application.

[0019] Figure 2 A schematic diagram of the structure of an integrated test probe provided in another angle according to an embodiment of the present application.

[0020] Figure 3 A schematic structural diagram of a first support and a second support of an integrated test probe provided in one embodiment of the present application.

[0021] Figure 4 A schematic structural diagram of a first probe assembly and a second probe assembly provided in one embodiment of the present application.

[0022] Figure 5 A schematic diagram of an exploded view of a first probe assembly and a second probe assembly provided in one embodiment of the present application.

[0023] Figure 6 A partial structural cross-sectional view of an integrated test probe provided in one embodiment of the present application.

[0024] Figure 7 A partial structural cross-sectional view of an integrated test probe provided in one embodiment of the present application.

[0025] Figure 8 A schematic diagram of the installation structure of the first support and the first probe assembly provided in one embodiment of the present application.

[0026] Fig. 9 A schematic diagram of the installation structure of the second support and the second probe assembly provided in one embodiment of the present application.

[0027] Fig.10 A schematic diagram of an integrated testing solution provided for one embodiment of the present application.

[0028] Fig.11 This is a schematic diagram of a conventional board-side multi-channel test integration solution.

[0029] Fig.12 This is a schematic diagram of the detection end surface of a conventional board-end multi-channel test probe.

[0030] Description of reference numerals:

[0031] 1. First support; 2. Second support; 3. Probe unit; 301. Lead-out end; 302. Detection end; 303. Interface end; 304. Positioning end; 11. Upper mounting hole; 12. Positioning member; 21. Lower mounting hole; 22. Positioning hole; 31. First probe assembly; 311. Center needle; 3111. Positioning part; 312. First body; 3121. Accommodating cavity; 3122. Positioning part; 313. Interface body; 3131. Positioning cavity; 3132. Abutment part; 314. Elastic member; 315, claw; 3151, clamping part; 3152, claw part; 316, first insulating member; 32, second probe assembly; 321, center conductor; 322, second body; 323, second insulating member; 100, test equipment; 200, fixture box; 300, drive fixture; 400, board-end multi-channel test probe; 500, object under test; 610, transmission line; 620, circuit board; 630, test socket; 710, upper fixture; 720, lower fixture; 305, probe head. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0033] In this document, the terms "first", "second", etc. are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, the meaning of "plurality" is two or more.

[0034] In addition, in this article, directional terms such as "upper" and "lower" are defined relative to the orientation of the structure schematically placed in the drawings. It should be understood that these directional terms are relative concepts. They are used for relative description and clarification, and they can change accordingly according to the change of the orientation of the structure.

[0035] Combination Fig.11 and Fig.12As shown, the structure of the conventional board-end multi-channel test integration solution is usually to fix the board-end multi-channel test probe 400 to the lower surface of an upper fixture 710 by screws, etc., with its test end facing downward, and a lower fixture 720 is arranged below the upper fixture 710, and the object to be tested 500 such as the RF connector is placed on the upper surface of the lower fixture 720. At the test bottom end of the board-end multi-channel test probe 400, multiple probe heads 305 can be arranged to perform integrated multi-tests. Through a driving mechanism such as a motor, the upper fixture 710 can be driven downward to make the board-end multi-channel test probe 400 contact and conduct with the object to be tested 500, and the inspector uses the instrument to detect whether the product meets the requirements.

[0036] However, conventional board-side multi-channel test integration solutions have many disadvantages, making them difficult to promote and apply.

[0037] The present application designs a new integrated test probe that can be used in combination with the existing board-side multi-channel test probe 400 solution to overcome the defects of the current board-side multi-channel test integration solution.

[0038] Combination Figure 1 and Figure 2 As shown, the present application provides an integrated test probe. Specifically, the integrated test probe includes a first support 1 and a second support 2 coupled to each other and a plurality of probe monomers 3. The first support 1 can be detachably arranged at the upper end of the second support 2. The probe monomer 3 extends downward from the first support 1 to the second support 2. The probe monomer 3 is at least partially fixedly connected to the first support 1. The upper part of the probe monomer 3 is provided with a lead-out end 301 electrically connected to an external test device 100, and the lower part of the probe monomer 3 is provided with a detection end 302 electrically connected to an external detection component.

[0039] In the present application, the probe body 3 has a conductive component inside, one end of the conductive component extends to the lead-out end 301 , and the other end extends to the detection end 302 , so as to achieve electrical connection with the external test equipment 100 or an external detection component.

[0040] The first support 1 and the second support 2 are separable and coupled structures, which are convenient for testing applications. Specifically, during the test, the first support 1 can be connected to the driving mechanism, and the second support 2 can be set above the test object. By driving the first support 1, the probe monomer 3 connected thereto can be moved to achieve the purpose of the downward connection test. In addition, the first support 1 can be used in turn with multiple second supports 2 to achieve a variety of test items.

[0041] The probe unit 3 has a conductor inside, and the conductor can connect the lead-out end 301 and the detection end 302 to achieve electrical conduction during testing, so as to enable the external testing equipment 100 to test the object under test 500 .

[0042] Combination Figure 2 As shown, in the present application, the first support 1 is provided with a plurality of upper mounting holes 11 for mounting the probe unit 3 , and the second support 2 is provided with a plurality of lower mounting holes 21 opposite to the upper mounting holes 11 .

[0043] Specifically, in the embodiment of the present application, the first support 1 and the second support 2 can be made of a block jig, such as a metal jig block, a plastic jig block, etc. The block jig structure has the advantage of a stable structure. In other embodiments, the first support 1 and the second support 2 can also be made of a frame structure.

[0044] In the present application, in order to achieve the positioning cooperation between the first support 1 and the second support 2, the first support 1 and the second support 2 are connected by a positioning assembly, and the positioning assembly includes a matching positioning member 12 and a positioning hole 22; the positioning member 12 is protrudingly arranged on the lower surface of the first support 1, and the positioning hole 22 is arranged on the second support 2 and corresponds to the position of the positioning member 12; or, the positioning member 12 is protrudingly arranged on the upper surface of the second support 2, and the positioning hole 22 is arranged on the first support 1 and corresponds to the position of the positioning member 12.

[0045] Combination Figure 3 As shown, in one embodiment, the positioning member 12 adopts a pin structure, and the positioning hole 22 is a round hole adapted to the pin. Two positioning members 12 are arranged downward on the first support 1, and two adapted positioning holes 22 are arranged on the second support 2. When the first support 1 and the second support 2 are aligned and combined, the positioning member 12 is inserted into the corresponding positioning hole 22 to achieve accurate positioning of the first support 1 and the second support 2. In other embodiments, the positioning member 12 can be arranged on the second support 2, and the positioning hole 22 can be arranged on the first support 1. In other embodiments, the positioning member 12 can adopt other structures such as a bump.

[0046] In one embodiment, the probe unit 3 is an integrated probe, which is fixedly connected to one of the upper mounting holes 11 of the first support 1 and has a clearance fit with a corresponding lower mounting hole 21 .

[0047] Specifically, the integrated probe may adopt a conventional probe structure solution in the field of radio frequency connector testing, or may adopt a commercially available product.

[0048] Combination Figure 4 As shown, in another embodiment, a split probe monomer 3 may be used.

[0049] Specific, combined Figure 8 and Fig. 9The probe monomer 3 includes a first probe component 31 and a second probe component 32 that are separated from each other. The first probe component 31 is arranged on the first support 1, and the second probe component 32 is arranged on the second support 2; the upper end of the first probe component 31 is the lead-out end 301, the lower end of the first probe component 31 is arranged as the interface end 303, the lower end of the second probe component 32 is the detection end 302, and the upper end of the second probe component 32 is arranged as the positioning end 304, and the interface end 303 and the positioning end 304 are coupled.

[0050] The split arrangement of the first probe assembly 31 and the second probe assembly 32 helps to improve the test efficiency.

[0051] Combination Figures 4 to 7 As shown, in this embodiment, a center needle 311 is provided inside the first probe assembly 31, and a center conductor 321 is provided inside the second probe assembly 32. The center needle 311 penetrates and connects the lead-out end 301 and the interface end 303, and the center conductor 321 penetrates and connects the positioning end 304 and the detection end 302. The center needle 311 and the center conductor 321 are arranged relative to each other.

[0052] By means of the center needle 311 and the center conductor 321 which are arranged opposite to each other, electrical conduction between the first probe assembly 31 and the second probe assembly 32 can be achieved to realize the testing purpose.

[0053] The first probe assembly 31 further includes a first body 312, an interface body 313 and an elastic member 314. The first body 312 is provided with an accommodating cavity 3121 inside, the accommodating cavity 3121 communicates with the upper and lower ends of the first body 312, the elastic member 314 is arranged in the accommodating cavity 3121, the interface body 313 is arranged at the lower part of the accommodating cavity 3121 and the lower end of the interface body 313 protrudes from the first body 312;

[0054] The upper end of the first body 312 is the lead-out end 301, the lower end of the interface body 313 protruding from the first body 312 is the interface end 303, the center needle 311 passes through the accommodating cavity 3121 and the interface body 313, the upper end of the center needle 311 extends to the lead-out end 301 and is electrically connected to the external test equipment 100, and the lower end of the center needle 311 extends to the interface end 303;

[0055] The elastic member 314 abuts against the first body 312 and the interface body 313 to provide a downward elastic force for the interface body 313 .

[0056] The accommodating cavity 3121 may be configured as a stepped multi-stage structure to provide different accommodating spaces and the abutting portion 3132 .

[0057] In this embodiment, the elastic member 314 is a spring which is sleeved on the outer circumference of the center pin 311 .

[0058] In this embodiment, the first probe assembly 31 further includes a clamping claw 315 and a first insulating member 316 , and the clamping claw 315 includes a clamping portion 3151 and a claw portion 3152 connected to each other.

[0059] A limiting cavity 3131 is provided inside the interface main body 313, and the limiting cavity 3131 is connected to the upper end of the interface main body 313. A contact portion 3132 is protrudingly provided on the outer surface of the interface main body 313. A limiting portion 3122 is protruding inwardly provided at the bottom end of the accommodating cavity 3121, and the contact portion 3132 abuts against the limiting portion 3122; the upper surface of the clamping portion 3151 abuts against the first main body 312, and the lower surface of the clamping portion 3151 abuts against the upper end of the elastic member 314, and the claw portion 3152 is inserted into the limiting cavity 3131 and abuts against the inner wall of the limiting cavity 3131; the center needle 311 is provided with a positioning portion 3111, and the upper end of the positioning portion 3111 abuts against the first main body 312, and the lower end of the positioning portion 3111 abuts against the clamping claw 315.

[0060] The claw portion 3152 includes a plurality of claw pieces, each claw piece is extended from the clamping portion 3151 and is separated from each other, and the tail end of each claw piece has a protrusion protruding outwards for elastically abutting against the inner wall of the limiting cavity 3131 .

[0061] The claw portion 3152 is elastically abutted against the limiting cavity 3131 , so as to maintain the position of the claw 315 .

[0062] In this embodiment, the first insulating member 316 is sleeved on the center pin 311 and abuts against the first body 312 .

[0063] In this embodiment, the center needle 311 passes through the accommodating cavity 3121 and the limiting cavity 3131 and does not contact the interface body 313. In addition, the first insulating member 316 can maintain the position of the center needle 311 and insulate the center needle 311 from the first body 312.

[0064] In order to better achieve insulation between the center needle 311 and the first body 312 , the claw 315 may also be made of insulating material.

[0065] Combination Figures 4 to 7 As shown, in this embodiment, the second probe assembly 32 includes a second body 322 and a second insulating member 323, the upper end of the second body 322 is a positioning end 304, and the lower end of the second body 322 is a detection end 302; the second body 322 is hollow inside, and the center conductor 321 is arranged inside the second body 322, the center conductor 321 connects the positioning end 304 and the detection end 302, and the second insulating member 323 is arranged between the center conductor 321 and the inner wall of the second body 322.

[0066] The second insulating member 323 can maintain the position of the central conductor 321 and insulate the central conductor 321 from the second body 322 .

[0067] In this embodiment, when the interface end 303 and the positioning end 304 are butt-coupled, a gap is provided between the lower end of the center needle 311 and the upper end of the center conductor 321. When the first probe assembly 31 is pressed downward by force, the interface body 313 is blocked by the second body 322 and maintains its position, but the first body 312 is forced to move downward, thereby driving the center needle 311 to move downward until it contacts the center conductor 321, and at this time, the center needle 311 and the center conductor 321 can be connected. When the downward pressure is removed or the first body 312 is driven upward, the first body 312 drives the center needle 311 to move upward, and under the action of the elastic member 314, the interface body 313 is reset to contact the first body 312.

[0068] Combination Figure 6 As shown, in order to make the first body 312 and the second body 322 independent of each other, in this embodiment, the first body 312 is connected to the first support 1, and the second body 322 is connected to the second support 2.

[0069] Combination Fig.10 As shown, the present application provides a solution for using the integrated test probe, which is applicable when the probe monomer 3 is a split probe, as an example to help understand the technical solution of the present application.

[0070] The specific plan is as follows:

[0071] The object under test 500 and the board-end multi-channel test probe 400 are matched and fixed in the fixture box 200. In order to avoid interference from foreign objects, the interior of the fixture box 200 can be a dust-free and closed environment;

[0072] A transmission line 610 such as a flat cable is used, one end of the transmission line 610 is connected to the test end of the board-end multi-channel test probe 400, and the other end of the transmission line 610 is connected to a test circuit board 620, on which a plurality of test sockets 630 are arranged;

[0073] The second support 2 and the second probe assembly 32 are used as an integrated test probe A module; the integrated test probe A module is fixed on a dust-free and sealed fixture box 200, and the detection end 302 of the second probe assembly 32 abuts against the circuit board 620, and the lower end of the central conductor 321 is connected to the test socket 630 on the circuit board 620; the fixture box 200 can flow the transformation process in the form of an assembly line;

[0074] The first support 1 and the first probe assembly 31 are used as an integrated test probe B module; the integrated test probe B module is fixed on a driving fixture 300, and the driving fixture 300 can move up and down under the action of an external driving mechanism; the driving mechanism can be a motor, a cylinder or other devices with a driving function;

[0075] Under the action of the driving mechanism, when the driving fixture 300 is pressed down, the integrated test probe A module and the integrated test probe B module are turned on, and the rear end of the center pin 311 on the integrated test probe B module is connected to the test equipment 100, and the tester can observe the test results;

[0076] After the inspection of this process is completed, the driving fixture 300 is lifted to completely peel off the integrated test probe A module and the integrated test probe B module, and the fixture box 200 moves to the next process along the assembly line, and so on to complete all inspection processes.

[0077] The present application also provides another solution for using the integrated test probe, which is suitable for the case where the probe monomer 3 is an integrated probe.

[0078] The specific plan is:

[0079] The object under test 500 and the board-end multi-channel test probe 400 are matched and fixed in the fixture box 200. In order to avoid interference from foreign objects, the interior of the fixture box 200 can be a dust-free and closed environment;

[0080] A transmission line 610 such as a flat cable is used, one end of the transmission line 610 is connected to the test end of the board-end multi-channel test probe 400, and the other end of the transmission line 610 is connected to a test circuit board 620, on which a plurality of test sockets 630 are arranged;

[0081] The second support 2 is fixed on a dust-free and airtight fixture box 200, and the lower mounting hole 21 of the second support 2 is located corresponding to the test seat 630 on the circuit board 620; the fixture box 200 can be used in the form of an assembly line to flow the transformation process;

[0082] The first support 1 and the probe monomer 3 are used as an integrated test probe C module; the integrated test probe C module is fixed on a driving fixture 300, and the driving fixture 300 can move up and down under the action of an external driving mechanism; the driving mechanism can be a motor, a cylinder or other devices with a driving function;

[0083] Under the action of the driving mechanism, the driving fixture 300 is pressed down to move the integrated test probe C module downward, and after the probe unit 3 passes through the lower mounting hole 21 of the second support 2, the detection end 302 of the probe unit 3 is connected to the test socket 630 on the circuit board 620, and the lead-out end 301 on the integrated test probe C module is connected to the test equipment 100, and the tester can observe the test results;

[0084] After the inspection of this process is completed, the driving fixture 300 is lifted to completely peel off and disconnect the integrated test probe C module and the second support 2, and the fixture box 200 moves to the next process along the assembly line, and so on to complete all inspection processes.

[0085] This application has at least one of the following advantages:

[0086] (1) By coupling and detaching the first support and the second support, the first support and the second support can respectively realize different motion states, and can realize disassembly and assembly installation testing; and a plurality of probe units are connected to the first support, and when the first support is moved, the probe units can be synchronously moved, which can achieve the effect of precise positioning and flexible switching of tests.

[0087] (2) By setting the positioning component, the positioning accuracy of the first support and the second support can be improved.

[0088] (3) By adopting an integrated probe, it is easy to replace to suit various general or specific test scenarios.

[0089] (4) By adopting a separate probe structure, a first probe assembly is respectively arranged on a first support and a second probe assembly is arranged on a second support, and the ends of the first probe assembly and the second probe assembly are coupled and connected, so as to have a split combination effect. In automated testing, multiple integrated test probes can be used. Through the orderly coordination of the first probe assembly and multiple second probe assemblies, flow-line operation of multiple detection processes can be realized.

[0090] The integrated test probe provided by the implementation method of the present application is introduced in detail above, and the principles and implementation methods of the present application are explained by using specific examples. The above description is only used to help understand the method of the present application and its core mechanism; at the same time, for general technical personnel in this field, according to the ideas of the present application, there will be changes in the specific embodiments and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. An integrated test probe, characterized in that: The integrated test probe includes a first support and a second support coupled to each other and a plurality of probe monomers. The first support is detachably arranged at the upper end of the second support. The probe monomer extends downward from the first support through the second support. The probe monomer is at least partially fixedly connected to the first support. The upper portion of the probe monomer is provided with a lead-out end electrically connected to an external test device, and the lower portion of the probe monomer is provided with a detection end electrically connected to an external detection component.

2. The integrated test probe according to claim 1, characterized in that: The first support is provided with a plurality of upper mounting holes for mounting the probe unit, and the second support is provided with a plurality of lower mounting holes which are located opposite to the upper mounting holes.

3. The integrated test probe according to claim 1 or 2, characterized in that: The first support and the second support are connected by a positioning assembly, and the positioning assembly includes a matching positioning member and a positioning hole; the positioning member is protrudingly arranged on the lower surface of the first support, and the positioning hole is arranged on the second support and corresponds to the position of the positioning member; or, the positioning member is protrudingly arranged on the upper surface of the second support, and the positioning hole is arranged on the first support and corresponds to the position of the positioning member.

4. The integrated test probe according to claim 2, characterized in that: The probe unit is an integrated probe, and the integrated probe is fixedly connected to one of the upper mounting holes of the first support, and is gap-matched with one of the corresponding lower mounting holes.

5. The integrated test probe according to claim 2, characterized in that: The probe monomer includes a first probe component and a second probe component that are separated from each other, the first probe component is arranged on the first support, and the second probe component is arranged on the second support; the upper end of the first probe component is the lead-out end, the lower end of the first probe component is arranged as the interface end, the lower end of the second probe component is arranged as the detection end, the upper end of the second probe component is arranged as the positioning end, and the interface end and the positioning end are coupled.

6. The integrated test probe according to claim 5, characterized in that: A center needle is arranged inside the first probe assembly, and a center conductor is arranged inside the second probe assembly. The center needle penetrates and connects the lead-out end and the interface end, and the center conductor penetrates and connects the positioning end and the detection end. The center needle and the center conductor are arranged opposite to each other.

7. The integrated test probe according to claim 6, characterized in that: The first probe assembly further includes a first body, an interface body and an elastic member, wherein a receiving cavity is provided inside the first body, the receiving cavity communicates with the upper and lower ends of the first body, the elastic member is provided in the receiving cavity, the interface body is provided at the lower part of the receiving cavity and the lower end of the interface body protrudes from the first body; The upper end of the first body is the lead-out end, the lower end of the interface body protruding from the first body is the interface end, the center needle passes through the accommodating cavity and the interface body, the upper end of the center needle extends to the lead-out end and is electrically connected to an external test device, and the lower end of the center needle extends to the interface end; The elastic member abuts against the first body and the interface body to provide a downward elastic force for the interface body.

8. The integrated test probe according to claim 7, characterized in that: The first probe assembly further comprises a clamping claw and a first insulating member, wherein the clamping claw comprises a clamping portion and a claw portion connected to each other; A limited position cavity is arranged inside the interface body, the limited position cavity is connected to the upper end of the interface body, an abutment portion is protrudingly arranged on the outer surface of the interface body, a limited position portion is protruding inwardly arranged at the bottom end of the accommodating cavity, and the abutment portion abuts against the limited position portion; The upper surface of the clamping portion abuts against the first main body, the lower surface of the clamping portion abuts against the upper end of the elastic member, and the claw portion is inserted into the limiting cavity and abuts against the inner wall of the limiting cavity; The center needle is provided with a positioning portion, the upper end of the positioning portion abuts against the first main body, and the lower end of the positioning portion abuts against the claw; the first insulating member is sleeved on the center needle and abuts against the first main body.

9. The integrated test probe according to claim 7, characterized in that: The second probe assembly includes a second body and a second insulating member, the upper end of the second body is the positioning end, and the lower end of the second body is the detection end; the second body is hollow inside, the center conductor is arranged inside the second body, the center conductor connects the positioning end and the detection end, and the second insulating member is arranged between the center conductor and the inner wall of the second body.

10. The integrated test probe according to claim 9, characterized in that: The first body is connected to the first support, and the second body is connected to the second support.

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