Lighting test fixture

Abstract

The utility model discloses a lighting test fixture, which is used for carrying out lighting test on a display panel and comprises a driving circuit test board electrically connected with a test point of the display panel so as to provide corresponding driving voltage for the test point of the display panel; the over-current detection module is electrically connected between the driving circuit test board and the test point and is used for acquiring the driving current input into the test point by the driving circuit test board and providing comparison information of the reference current and the driving current; and the information processing and control module is electrically connected with the driving circuit test board and the over-current detection module respectively, and is used for providing data of the reference current for the over-current detection module and controlling output maintenance or turn-off of the driving circuit test board according to comparison information of the reference current and the driving current. Therefore, the situation that the jig is damaged due to short circuit caused by inaccurate alignment is avoided.

Description

Technical Field

[0001] The utility model relates to a fixture circuit, in particular to a lighting test fixture. Background Art

[0002] After the production of existing flat panel displays, such as liquid crystal displays (LCD), the display panels need to be tested for lighting. The lighting test fixture provides a test signal to the display panel, and the display panel will display different pictures according to the input test signal. The display effects of different pictures can be used to determine whether the display panel is defective. When the display panel is defective, the display panel needs to be analyzed. During the analysis process, the display panel also needs to be tested for lighting using a lighting fixture, that is, the lighting fixture is used to load the test signal for confirmation.

[0003] Figure 1 A schematic diagram of a liquid crystal panel lighting test according to the prior art is shown. Figure 1 As shown, a shorting bar is used to short-circuit the data lines inside the display panel to form multiple test points, and a lighting test fixture applies a test signal to the test point to light up the panel to detect whether there are pixel defects in the liquid crystal panel. Figure 2 FIG. 1 shows a schematic diagram of the test point spacing in a liquid crystal panel lighting test according to the prior art. Figure 2 As shown in the figure, the multiple test points formed by the shorting bars of the data lines inside the display panel are adjacent. At the same time, the small-sized shorting bar fixture will further compress the spacing between the above test points, making the spacing between multiple test points generally less than 0.6mm. The size of the needle diameter of the test frame pressure head in the lighting test fixture will cause the test points and the pressure head to be inaccurately aligned, resulting in a short circuit between the test points. At the least, the display panel lighting picture is different, and at the worst, the display panel or the lighting test fixture will be damaged. Utility Model Content

[0004] In view of the above problems, the purpose of the present invention is to provide a lighting test fixture to avoid short circuit damage to the fixture and affect panel verification results due to inaccurate alignment.

[0005] According to one aspect of the utility model, a lighting test fixture is provided for performing a lighting test on a display panel, comprising: a driving circuit test board, the driving circuit test board being electrically connected to a test point of the display panel to provide a corresponding driving voltage to the test point of the display panel; an overcurrent detection module, the overcurrent detection module being electrically connected between the driving circuit test board and the test point, collecting a driving current of the driving circuit test board input to the test point, and providing comparison information of a reference current and the driving current; an information processing and control module, the information processing and control module being electrically connected to the driving circuit test board and the overcurrent detection module, respectively, for providing data of the reference current to the overcurrent detection module, and controlling the output of the driving circuit test board to be maintained or shut down according to the comparison information of the reference current and the driving current.

[0006] Optionally, it also includes: a reference voltage generating module, which is used to generate a reference voltage; an overvoltage detection module, which is electrically connected between the driving circuit test board and the test point, and is electrically connected to the reference voltage generating module to receive the reference voltage, and the overvoltage detection module compares the reference voltage with the driving voltage to provide comparison information between the reference voltage and the driving voltage.

[0007] Optionally, the comparison information between the reference voltage and the driving voltage indicates whether the output of the driving circuit test board is overvoltage; the comparison information between the reference current and the driving current indicates whether the output of the driving circuit test board is overcurrent.

[0008] Optionally, the information processing and control module is configured to: control the output of the driving circuit test board to be shut down when the output of the driving circuit test board is overcurrent and / or overvoltage.

[0009] Optionally, the information processing and control module includes a processor chip; the overcurrent detection module includes a current monitoring chip; the reference voltage generation module includes a programmable power supply chip; and the overvoltage detection module includes a voltage comparator.

[0010] Optionally, the information processing and control module burns reference current data into the overcurrent detection module and burns reference voltage data into the reference voltage generation module through an integrated circuit bus.

[0011] Optionally, the reference voltage generating module includes any one of an operational amplifier, an in-phase proportional operational circuit, and an inverse proportional operational circuit, or a combination thereof to match reference voltage signals of different amplitudes.

[0012] Optionally, an alarm module is further included, which is connected to the information processing and control module. The information processing and control module is also configured to control the alarm module to sound an alarm when the output of the drive circuit test board is overcurrent and / or overvoltage.

[0013] Optionally, the alarm module includes at least one of the following: a light emitting diode and a buzzer.

[0014] Optionally, the number of the light-emitting diodes corresponds to the number of the driving voltages.

[0015] The lighting test fixture provided by the utility model performs overcurrent and / or overvoltage detection on the output of the driving circuit test board through an overcurrent detection module and / or an overvoltage detection module, and disconnects the output of the driving circuit test board when overcurrent and / or overvoltage occurs.

[0016] Furthermore, the embodiment of the present application also includes an alarm module to issue an abnormal alarm corresponding to the displayed voltage signal based on the control of the information processing and control module, so that even if an abnormal condition such as a short circuit occurs later, the abnormality can be located and repaired faster, thereby improving the utilization efficiency and reducing the probability of delaying the progress of product verification due to alignment abnormalities. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and other purposes, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0018] Figure 1 A schematic diagram of a liquid crystal panel lighting test according to the prior art is shown.

[0019] Figure 2 A schematic diagram of the test point spacing in a liquid crystal panel lighting test according to the prior art is shown.

[0020] Figure 3 A structural block diagram of a lighting test fixture provided according to an embodiment of the present application is shown.

[0021] Figure 4 A flow chart of overcurrent detection provided according to an embodiment of the present application is shown.

[0022] Figure 5 A flow chart of overvoltage detection provided according to an embodiment of the present application is shown.

[0023] Figure 6 A schematic diagram of an alarm provided according to an embodiment of the present application is shown.

[0024] Figure 7a A circuit diagram of a sampling part in an overcurrent detection module provided according to an embodiment of the present application is shown.

[0025] Figure 7b A circuit diagram of the detection part in the overcurrent detection module provided according to an embodiment of the present application is shown.

[0026] Figure 8 A circuit diagram of an overvoltage detection module provided according to an embodiment of the present application is shown.

[0027] Figure 9a A circuit diagram of a reference voltage generating portion in a reference voltage generating module provided according to an embodiment of the present application is shown.

[0028] Figure 9b A circuit diagram of a reference voltage processing portion according to a first example provided in accordance with the present application is shown.

[0029] Fig.9c A circuit diagram of a reference voltage processing portion according to a second example provided in accordance with the present application is shown.

[0030] Fig.10 A circuit diagram of an information processing and control module provided according to an embodiment of the present application is shown.

[0031] Fig.11 A circuit diagram of an alarm module provided according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0032] Various embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. In each of the accompanying drawings, the same elements or modules are represented by the same or similar reference numerals. For the sake of clarity, the various parts in the accompanying drawings are not drawn to scale.

[0033] It should be understood that in the following description, a "circuit" may include a single or multiple combined hardware circuits, programmable circuits, state machine circuits, and / or elements capable of storing instructions executed by programmable circuits. When an element or circuit is said to be "connected to" another element or an element or circuit is said to be "connected between" two nodes, it may be directly coupled or connected to another element or there may be an intermediate element, and the connection between the elements may be physical, logical, or a combination thereof. Conversely, when an element is said to be "directly coupled to" or "directly connected to" another element, it means that there is no intermediate element between the two.

[0034] At the same time, certain words are used in this patent specification and claims to refer to specific components. It should be understood by those skilled in the art that hardware manufacturers may use different terms to refer to the same component. This patent specification and claims do not use differences in names as a way to distinguish components, but rather use differences in components' functions as the criteria for distinction.

[0035] In addition, it should be noted that, in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or equipment. In the absence of more restrictions, the elements defined by the statement "comprise one..." do not exclude the existence of other identical elements in the process, method, article or equipment including the elements.

[0036] Figure 3 The structure diagram of the lighting test fixture provided according to the embodiment of the present application is shown as follows: Figure 3 As shown, the lighting test fixture provided in the embodiment of the present application includes an information processing and control module 201, a drive circuit test board 202, a reference voltage generation module 203, an overvoltage detection module 204, an overcurrent detection module 205, and an alarm module 206.

[0037] The data lines inside the display panel are short-circuited by a shorting bar to form a test point.

[0038] The driving circuit test board 202 is electrically connected to the test points of the display panel to provide corresponding driving voltages to the test points of the display panel.

[0039] The reference voltage generating module 203 generates a reference voltage for overvoltage protection.

[0040] The overvoltage detection module 204 is electrically connected between the drive circuit test board 202 and the test point, collects the drive voltage provided to the test point by the drive circuit test board 202, and provides comparison information to the information processing and control module 201 based on the reference voltage and the drive voltage.

[0041] The overcurrent detection module 205 is electrically connected between the drive circuit test board 202 and the test point, collects the drive current of the drive circuit test board 202 input test point, and provides comparison information based on the reference current and the current of the drive circuit test board 202 input test point.

[0042] The information processing and control module 201, together with the driving circuit test board 202, writes reference voltage and reference current data to the reference voltage generation module 203 and the overcurrent detection module 205 respectively, and controls the stopping or maintaining of the output of the driving circuit test board 202 according to the comparison information between the reference voltage and the driving voltage and / or the comparison information between the reference current and the driving current.

[0043] In addition, the lighting test fixture provided in the embodiment of the present application also includes an alarm module 206. When the comparison information of the reference voltage and the driving voltage and / or the comparison information of the reference current and the driving current received by the information processing and control module 201 indicate overcurrent and / or overvoltage, the information processing and control module 201 controls the driving circuit test board 202 to stop output, and also controls the alarm module 206 to alarm.

[0044] Specifically, the overcurrent detection module 205 includes an overcurrent detection (OCP) element. In one embodiment, the overcurrent detection element can use a current monitoring chip, and then the information processing and control module 201 can burn data on the overcurrent detection element through the I2 C (Inter-Integrated Circuit, I2 C) bus protocol, such as the setting of the current monitoring chip register to perform different functions, and the value setting of the reference current. The drive current of the input test point of the drive circuit test board 202 is collected, and comparison information is provided based on the reference current and the current of the input test point of the drive circuit test board 202.

[0045] Since the voltage parameters of the voltage signals AVDD, VGH, VGL, etc. provided by different display driver test boards 202 are different, the reference voltage generation module 203 also needs to generate corresponding reference voltages. In one embodiment, the reference voltage generation module 203 uses a programmable power supply chip to generate the above reference voltage. The programmable power supply chip can set different reference voltage parameters through a program, thereby matching different display driver test boards 202 to achieve the purpose of universality among different models.

[0046] Furthermore, the amplitude of the voltage signal AVDD is generally 17-25V, while the amplitudes of the voltage signal Vcom and the voltage signal RGB are both below 5V. Since the amplitudes of the above-mentioned different voltage signals vary greatly, for different voltage signals, the reference voltage generation module 203 uses an operational amplifier to follow the reference voltage signal with a smaller amplitude, uses a common-phase amplification proportional circuit to generate the reference voltage signal with a larger amplitude, and generates the negative voltage signal through an inverse proportional operational circuit to match the final reference voltage requirement.

[0047] The overvoltage detection module 204 includes a voltage comparator, which compares the reference voltage with the driving voltage provided to the test point by the driving circuit test board 202, determines whether the multiple driving voltages are overvoltage during transmission, and sends the comparison information to the information processing and control module 201.

[0048] The information processing and control module 201 includes a processor chip, which burns data of the overcurrent detection module 205 and the reference voltage generation module 203, and receives comparison information of the overcurrent detection module 205 and the overvoltage detection module 204. When overcurrent and / or overvoltage protection occurs, the output of the drive circuit test board 202 is shut down.

[0049] Figure 4 FIG. 4 shows an overcurrent detection flow chart according to an embodiment of the present application. Figure 4 As shown, the process of overcurrent detection of the lighting test fixture provided by this application is:

[0050] The information processing and control module 201 performs data burning on the overcurrent detection element through the I2 C (Inter-Integrated Circuit, I2 C) bus protocol, such as setting the current monitoring chip register to perform different functions and setting the value of the reference current.

[0051] The overcurrent detection module 205 collects the driving current of the input test point of the driving circuit test board 202, and provides comparison information based on the reference current and the current of the input test point of the driving circuit test board 202. The comparison information indicates whether the output of the driving circuit test board is overcurrent.

[0052] When the comparison information indicates that the output of the driving circuit test board 202 is not over-current, the information processing and control module 201 controls the driving circuit test board 202 to maintain the output.

[0053] When the comparison information indicates that the output of the driving circuit test board 202 is overcurrent, the information processing and control module 201 controls the driving circuit test board 202 to stop outputting, and controls the alarm module 206 to sound an alarm.

[0054] Figure 5 FIG. 4 shows an overvoltage detection flow chart according to an embodiment of the present application. Figure 5 As shown, the process of overvoltage detection of the lighting test fixture provided by this application is:

[0055] The information processing and control module 201 performs data programming on the reference voltage generation module 203 through the I2 C (Inter-Integrated Circuit, I2 C) bus protocol to set different reference voltage parameters.

[0056] The overvoltage detection module 204 compares the reference voltage with the driving voltage provided to the test point by the driving circuit test board 202 to determine whether the multiple driving voltages are overvoltage during transmission, and sends the comparison information to the information processing and control module 201 .

[0057] When the comparison information indicates that the output of the driving circuit test board 202 is not over-voltage, the information processing and control module 201 controls the driving circuit test board 202 to maintain the output.

[0058] When the comparison information indicates that the output of the driving circuit test board 202 is over-voltage, the information processing and control module 201 controls the driving circuit test board 202 to stop outputting, and controls the alarm module 206 to sound an alarm.

[0059] It should be additionally explained that the above-mentioned overcurrent detection and overvoltage detection can be performed in a union / intersection manner. For example, when the drive circuit test board 202 outputs overcurrent and overvoltage at the same time, the drive circuit test board 202 is controlled to stop output, and the alarm module is controlled to sound an alarm. Or when the drive circuit test board 202 outputs one of overcurrent and overvoltage, the drive circuit test board 202 is controlled to stop output, and the alarm module 206 is controlled to sound an alarm. The technical personnel in the field can make adjustments according to actual conditions, and the present application does not impose any restrictions on this.

[0060] Figure 6 FIG. 4 shows a schematic diagram of an alarm provided according to an embodiment of the present application, such as Figure 6 As shown, the information processing and control module 201 burns data to the above-mentioned overcurrent detection module 205 and the reference voltage generation module 203, and the overvoltage detection module 204 and the overcurrent detection module 205 respectively receive the driving voltage provided to the test point by the driving circuit test board 202, such as the data voltage (R / G / B) of each sub-pixel and the common voltage Vcom, the power supply voltage VGH / VGL, etc. The overvoltage detection module 204 and the overcurrent detection module 205 respectively perform overvoltage detection and overcurrent detection according to the reference voltage and the reference current, determine whether the above-mentioned multiple driving voltages are overvoltage and / or overcurrent during the transmission process, and send the comparison information to the information processing and control module 201. The information processing and control module 201 controls the alarm module 206 to issue an abnormal alarm corresponding to the display voltage signal.

[0061] The alarm module includes at least one of the following: a light emitting diode and a buzzer. At the same time, the number of the light emitting diodes corresponds to the number of driving voltages, so that when the alarm module alarms, it can display the corresponding driving voltage overvoltage and / or overcurrent, so as to facilitate technicians to repair faster.

[0062] The present application performs overcurrent and / or overvoltage detection on the output of the driving circuit test board through an overcurrent detection module and / or an overvoltage detection module, and disconnects the output of the driving circuit test board when overcurrent and / or overvoltage occurs.

[0063] Furthermore, the embodiment of the present application also includes an alarm module to issue an abnormal alarm corresponding to the displayed voltage signal based on the control of the information processing and control module, so that even if an abnormal condition such as a short circuit occurs later, the abnormality can be located and repaired faster, thereby improving the utilization efficiency and reducing the probability of delaying the progress of product verification due to alignment abnormalities.

[0064] Figure 7a FIG. 4 shows a circuit diagram of a sampling part in an overcurrent detection module provided in an embodiment of the present application. Figure 7b FIG. 4 shows a circuit diagram of a detection part in an overcurrent detection module provided in an embodiment of the present application. Figure 7a and 7b As shown, the main circuit in the driving circuit test board 202 is between the port R_IN and the port R_OUT. The sampling circuit in the overcurrent detection module obtains current sampling signals IR+ and IR- through resistors R5 and R6 respectively.

[0065] The model of the current detection device is, for example, INA226AIDGST; for example, the current sampling signals IR+ and IR- are received through the IN+ and IN- pins, and the corresponding comparison information of the reference current and the driving current is output at the ALERT pin.

[0066] The placement of other pins in the above-mentioned current detection device and the connection of components can be adjusted according to actual conditions, and this application does not impose any restrictions on this.

[0067] Figure 8 FIG. 4 shows a circuit diagram of an overvoltage detection module provided according to an embodiment of the present application, such as Figure 8 As shown, the device model used by the overvoltage detection module is, for example, LM239PWR, which receives different driving voltage signals and corresponding reference voltage signals through pins 1IN+, 1IN-, 2IN+, 2IN-, 3IN+, 3IN-, 4IN+, and 4IN-, and outputs comparison information between the reference voltage and the driving voltage at OUT1, OUT2, OUT3, and OUT4.

[0068] The placement of other pins in the above-mentioned voltage detection device and the connection of components can be adjusted according to actual conditions, and this application does not impose any restrictions on this.

[0069] Figure 9a FIG. 4 shows a circuit diagram of a reference voltage generating portion in a reference voltage generating module provided according to an embodiment of the present application. Figure 9aAs shown, the reference voltage in the reference voltage generation module is generated by a power chip of model G1632QA1R, for example. Different reference voltage parameters can be set by a program, and corresponding reference voltage signals are output at pins OUT1, OUT2, OUT3, and OUT4 to match different models to achieve the purpose of universality of models. Not shown in the figure, the reference voltage generation module includes a pull-up circuit and a level conversion circuit so that the above-mentioned power chip can work normally.

[0070] Figure 9b A circuit diagram of a reference voltage processing portion according to a first example provided by the present application is shown. Fig.9c FIG. 4 shows a circuit diagram of a reference voltage processing portion according to a second example provided by the present application, as shown in FIG. Figure 9b and 9c As shown, the corresponding reference voltage signals are received at pins IN1+ and IN2+ respectively through an operational amplifier of model LM35BD, and a voltage follower is used for the small voltage in the reference voltage signal, a common-phase amplification proportional circuit is used for the large voltage, and an inverse amplification proportional circuit is used for the negative voltage, and the processed reference voltage signal is output at pins OUT1 and OUT2, so that the load of the reference voltage signal can be matched.

[0071] Fig.10 The circuit diagram of the information processing and control module provided in the embodiment of the present application is shown as follows: Fig.10 As shown, the information processing and control module includes, for example, an STM32 207ARM chip, which controls the maintenance or shutdown of the driving circuit by receiving the comparison information of the reference voltage and the driving voltage and the corresponding comparison information of the reference current and the driving current. In addition, the ARM chip also includes pins for controlling multiple LED lights, and the corresponding pins are grounded according to the comparison information of the reference voltage and the driving voltage and the corresponding comparison information of the reference current and the driving current.

[0072] In addition, the ARM chip also includes some peripheral circuits not shown in the figure to ensure that the ARM chip can work normally. Those skilled in the art can make adjustments according to actual conditions.

[0073] Fig.11 The circuit diagram of the alarm module provided according to the embodiment of the present application is shown as follows: Fig.11 As shown, the alarm module includes a plurality of light emitting diodes, one end of the plurality of light emitting diodes is connected to a power supply voltage (for example, 3.3V), and the other end of a plurality of light emitting diodes of different colors is connected to the pins of the ARM chip for controlling a plurality of LED lamps, and the pins are grounded, so that the branch where the light emitting diodes of corresponding colors are located forms a loop, thereby making the light emitting diodes of corresponding colors emit light.

[0074] The placement of other pins of each chip in the above modules and the connection of components can be adjusted according to actual conditions, and this application does not impose any restrictions on this.

[0075] It should be noted that it will be understood by those skilled in the art that the words "during", "when" and "when..." used in this article in connection with the operation of the circuit are not strict terms indicating an action that occurs immediately when the start-up action begins, but that there may be some small but reasonable delay or delays between it and the reaction action initiated by the start-up action, such as various transmission delays, etc. The words "approximately" or "substantially" used in this article mean that the element value has a parameter that is expected to be close to the declared value or position. However, as is well known in the art, there are always slight deviations that make it difficult for the value or position to be strictly the declared value. It has been properly determined in the art that a deviation of at least ten percent (10%) (for semiconductor doping concentrations, at least twenty percent (20%)) is a reasonable deviation from the accurate ideal target described. When used in conjunction with a signal state, the actual voltage value or logic state (e.g., "1" or "0") of the signal depends on whether positive logic or negative logic is used.

[0076] According to the embodiments of the present invention as described above, these embodiments do not describe all the details in detail, nor do they limit the present invention to specific embodiments. Obviously, many modifications and changes can be made based on the above description. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that technicians in the relevant technical field can make good use of the present invention and the modified use based on the present invention. The scope of protection of the present invention shall be based on the scope defined by the claims of the present invention and their equivalents.

Claims

1. A lighting test fixture, used for performing a lighting test on a display panel, characterized in that: include: A driving circuit test board, the driving circuit test board is electrically connected to the test points of the display panel to provide corresponding driving voltages to the test points of the display panel; An overcurrent detection module, the overcurrent detection module is electrically connected between the drive circuit test board and the test point, collects the drive current of the drive circuit test board input test point, and provides comparison information between the reference current and the drive current; An information processing and control module, wherein the information processing and control module is electrically connected to the drive circuit test board and the overcurrent detection module, respectively, and is used to provide the reference current data to the overcurrent detection module, and to control the output of the drive circuit test board to maintain or shut down according to comparison information between the reference current and the drive current.

2. The lighting test fixture according to claim 1, characterized in that: Also includes: A reference voltage generating module, wherein the reference voltage generating module is used to generate a reference voltage; An overvoltage detection module, wherein the overvoltage detection module is electrically connected between the driving circuit test board and the test point, and is electrically connected to the reference voltage generation module to receive the reference voltage, and the overvoltage detection module compares the reference voltage with the driving voltage to provide comparison information of the reference voltage and the driving voltage.

3. The lighting test fixture according to claim 2, characterized in that: The comparison information between the reference voltage and the driving voltage indicates whether the output of the driving circuit test board is over-voltage; the comparison information between the reference current and the driving current indicates whether the output of the driving circuit test board is over-current.

4. The lighting test fixture according to claim 3, characterized in that: The information processing and control module is configured to control the output of the driving circuit test board to be turned off when the output of the driving circuit test board is overcurrent and / or overvoltage.

5. The lighting test fixture according to claim 4, characterized in that: The information processing and control module includes a processor chip; the overcurrent detection module includes a current monitoring chip; the reference voltage generation module includes a programmable power supply chip; and the overvoltage detection module includes a voltage comparator.

6. The lighting test fixture according to claim 5, characterized in that: The information processing and control module burns reference current data into the overcurrent detection module and burns reference voltage data into the reference voltage generation module through an integrated circuit bus.

7. The lighting test fixture according to claim 5, characterized in that: The reference voltage generation module includes any one of an operational amplifier, an in-phase proportional operational circuit, and an inverse proportional operational circuit, or a combination thereof, to match reference voltage signals of different amplitudes.

8. The lighting test fixture according to claim 1, characterized in that: It also includes an alarm module, which is connected to the information processing and control module. The information processing and control module is also configured to control the alarm module to sound an alarm when the output of the drive circuit test board is overcurrent and / or overvoltage.

9. The lighting test fixture according to claim 8, characterized in that: The alarm module includes at least one of the following: a light emitting diode and a buzzer.

10. The lighting test fixture according to claim 9, characterized in that: The number of the light emitting diodes corresponds to the number of the driving voltages.

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