Circuit and device
By designing a circuit that includes multiple diagnostic circuits and isolation circuits, the problems of complexity and poor real-time performance of Fuse state detection circuits in high-voltage bus circuits are solved, and fast and accurate detection and reduced software load are achieved.
Patent Information
- Application Number
- CN202420628217.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-28
- Publication Date
- 2025-04-11
- Estimated Expiration
- 2034-03-28
AI Technical Summary
The Fuse state detection circuit in the high-voltage bus circuit is complex and has poor real-time performance.
A circuit including a first diagnostic circuit, a second diagnostic circuit, a third diagnostic circuit, a first transistor, a first isolation circuit and a second isolation circuit are designed. These circuits are connected to the safety device to be tested to obtain detection information in real time, simplify the circuit structure, and improve the real-time detection.
By simplifying the circuit structure and improving real-time performance, the Fuse state in the high-voltage bus circuit is achieved quickly and accurately detecting it, reducing the software load.
Smart Images

Figure CN222748684U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of circuit detection technology, and in particular to a circuit and a device. Background Art
[0002] At present, the status of the fuse in the high-voltage bus circuit is mainly determined by collecting the Pack voltage and the Fuse load side voltage through a sampling circuit, an AD conversion circuit and a processor circuit. The circuit implementation is complex and has poor real-time performance. Utility Model Content
[0003] Purpose of the utility model: The purpose of the embodiments of the present application is to provide a circuit and a device, aiming to solve the technical problems of complex implementation and poor real-time performance of the detection circuit of the Fuse state in the high-voltage bus circuit in the prior art.
[0004] Technical solution: In a first aspect, an embodiment of the present application provides a circuit, including:
[0005] a first diagnostic circuit, a second diagnostic circuit and a third diagnostic circuit, wherein an output terminal of the first diagnostic circuit is connected to a power supply terminal of the second diagnostic circuit;
[0006] A first transistor, wherein the base of the first transistor is connected to the output end of the first diagnostic circuit, and the collector of the first transistor is connected to the output end of the third diagnostic circuit;
[0007] a first isolation circuit, wherein an input end of the first isolation circuit is connected to an emitter of the first transistor;
[0008] A second isolation circuit, wherein an input end of the second isolation circuit is connected to an output end of the second diagnosis circuit.
[0009] In some embodiments, it also includes:
[0010] A second transistor is connected in series between the emitter of the first transistor and the input end of the first isolation circuit.
[0011] In some embodiments, it also includes:
[0012] A third transistor is connected in series between the output end of the first diagnostic circuit and the power supply end of the second diagnostic circuit.
[0013] In some embodiments, a system switch module is further included, wherein an output terminal of the system switch module is connected to the base of the second transistor and / or the base of the third transistor, and the system switch module includes:
[0014] A first optical coupler switch, wherein: an output end of a phototransistor is connected to an output end of the system switch module;
[0015] A fourth triode, wherein the collector of the fourth triode, the emitter of the fourth triode and the light emitting diode of the first optical coupling switch are connected in series.
[0016] In some embodiments, the first diagnostic circuit comprises:
[0017] A first voltage-dividing circuit, the first voltage-dividing circuit comprising a first voltage-dividing element and a second voltage-dividing element, the first voltage-dividing element and the second voltage-dividing element are connected in series, and a current direction of the first voltage-dividing circuit is from the first voltage-dividing element to the second voltage-dividing element;
[0018] a second voltage-dividing circuit, wherein the second voltage-dividing circuit comprises a third voltage-dividing element and a fourth voltage-dividing element, wherein the third voltage-dividing element and the fourth voltage-dividing element are connected in series, wherein a current direction of the second voltage-dividing circuit is from the third voltage-dividing element to the fourth voltage-dividing element, and a resistance of the fourth voltage-dividing element is greater than a resistance of the second voltage-dividing element;
[0019] A first comparator, wherein an inverting input terminal of the first comparator is connected to an input terminal of the second voltage divider, and a non-inverting input terminal of the first comparator is connected to an input terminal of the fourth voltage divider.
[0020] In some embodiments, the second diagnostic circuit comprises:
[0021] A third voltage-dividing circuit, the third voltage-dividing circuit comprising a fifth voltage-dividing element and a sixth voltage-dividing element, the fifth voltage-dividing element and the sixth voltage-dividing element are connected in series, and the current direction of the third voltage-dividing circuit is from the fifth voltage-dividing element to the sixth voltage-dividing element;
[0022] a fourth voltage-dividing circuit, the fourth voltage-dividing circuit comprising a seventh voltage-dividing element and an eighth voltage-dividing element, the seventh voltage-dividing element and the eighth voltage-dividing element being connected in series, the current direction of the fourth voltage-dividing element being from the seventh voltage-dividing element to the eighth voltage-dividing element, and the resistance of the eighth voltage-dividing element being greater than the resistance of the sixth voltage-dividing element;
[0023] A second comparator, wherein the inverting input terminal of the second comparator is connected to the input terminal of the sixth voltage divider, and the non-inverting input terminal of the second comparator is connected to the input terminal of the eighth voltage divider.
[0024] In some embodiments, the third diagnostic circuit comprises:
[0025] a fifth voltage-dividing circuit, the fifth voltage-dividing circuit comprising a ninth voltage-dividing element and a tenth voltage-dividing element, the ninth voltage-dividing element and the tenth voltage-dividing element being connected in series, the current direction of the fifth voltage-dividing element being from the ninth voltage-dividing element to the tenth voltage-dividing element, and the resistance of the tenth voltage-dividing element being greater than the resistance of the eighth voltage-dividing element;
[0026] A third comparator, wherein the inverting input terminal of the third comparator is connected to the input terminal of the eighth voltage divider, and the non-inverting input terminal of the third comparator is connected to the input terminal of the tenth voltage divider.
[0027] In some embodiments, the first isolation circuit comprises:
[0028] A second optocoupler switch, wherein: an input end of a light emitting diode is connected to an input end of the first isolation circuit, and an output end of a phototransistor is connected to an output end of the first isolation circuit.
[0029] In some embodiments, the second isolation circuit comprises:
[0030] A third optocoupler switch, wherein: an input end of the light emitting diode is connected to an input end of the second isolation circuit, and an output end of the phototransistor is connected to an output end of the second isolation circuit.
[0031] In a second aspect, an embodiment of the present application further provides a device, comprising the circuit as described in any one of the first aspects, and:
[0032] a first safety device, wherein an input terminal and an output terminal of the first safety device are both connected to an input terminal of the first diagnostic circuit;
[0033] a second safety device, wherein an input terminal and an output terminal of the second safety device are both connected to an input terminal of the second diagnostic circuit;
[0034] A third safety device, wherein the input terminal and the output terminal of the third safety device are both connected to the input terminal of the third diagnosis circuit.
[0035] Beneficial effects: Compared with the prior art, an embodiment of the present application provides a circuit, comprising a first diagnostic circuit, a second diagnostic circuit, a third diagnostic circuit, a first transistor, a first isolation circuit and a second isolation circuit; in the present application, the first diagnostic circuit, the second diagnostic circuit and the third diagnostic circuit are respectively used to connect to the safety device to be tested; in the present application, the output end of the first diagnostic circuit is connected to the power supply end of the second diagnostic circuit, the base of the first transistor is connected to the output end of the first diagnostic circuit, and the collector of the first transistor is connected to the output end of the third diagnostic circuit, so as to improve the structural connection relationship, simplify the circuit, and improve the real-time performance of circuit detection.
[0036] An embodiment of the present application provides a device, including the circuit provided in the present application, a first safety device, a second safety device and a third safety device, wherein the input and output ends of the first safety device are both connected to the input end of the first diagnostic circuit, the input and output ends of the second safety device are both connected to the input end of the second diagnostic circuit, and the input and output ends of the third safety device are both connected to the input end of the third diagnostic circuit. In the present application, the output end of the first diagnostic circuit is connected to the power supply end of the second diagnostic circuit, the base of the first transistor is connected to the output end of the first diagnostic circuit, and the collector of the first transistor is connected to the output end of the third diagnostic circuit, so as to improve the structural connection relationship, simplify the circuit, and improve the real-time performance of circuit detection. BRIEF DESCRIPTION OF THE DRAWINGS
[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.
[0038] Figure 1 A schematic diagram of a module of a circuit and a device provided in an embodiment of the present application;
[0039] Figure 2 A first circuit diagram of a circuit and a device provided in an embodiment of the present application (showing a second triode and a third triode);
[0040] Figure 3 A second circuit diagram of a circuit and a device provided in an embodiment of the present application (showing a second triode);
[0041] Figure 4 A first circuit diagram of a circuit and a device provided in an embodiment of the present application (showing a third transistor);
[0042] Figure numerals: 10, first diagnostic circuit; 11, first voltage divider circuit; 111, first voltage divider; 112, second voltage divider; 12, second voltage divider circuit; 121, third voltage divider; 122, fourth voltage divider; 13, first comparator; 20, second diagnostic circuit; 21, third voltage divider; 211, fifth voltage divider; 212, sixth voltage divider; 22, fourth voltage divider; 221, seventh voltage divider; 222, eighth voltage divider; 23, second comparator; 30, third diagnostic circuit Circuit; 31, fifth voltage-dividing circuit; 311, ninth voltage-dividing element; 312, tenth voltage-dividing element; 32, third comparator; 40, first transistor; 50, first isolation circuit; 51, second optocoupler switch; 60, second isolation circuit; 61, third optocoupler switch; 70, second transistor; 80, third transistor; 90, system switch module; 91, first optocoupler switch; 92, fourth transistor; 100, first safety device; 200, second safety device; 300, third safety device. DETAILED DESCRIPTION
[0043] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.
[0044] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, "plurality" means two or more.
[0045] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "connected" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, a direct connection, or an indirect connection through an intermediate medium, or it can be the internal communication of two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0046] The embodiment of the present application provides a circuit. Figures 1 to 4, including a first diagnostic circuit 10, a second diagnostic circuit 20, a third diagnostic circuit 30, a first transistor 40, a first isolation circuit 50 and a second isolation circuit 60; in the present application, the first diagnostic circuit 10, the second diagnostic circuit 20 and the third diagnostic circuit 30 are respectively used to connect with the safety device to be tested, so as to obtain the detection information of the safety device to be tested in real time, without polling sampling, and the real-time nature of the diagnostic result can be effectively guaranteed; the present application performs fault diagnosis on the safety device through the diagnostic circuit, and replaces the MCU for data processing through the diagnostic circuit, which can effectively reduce the software load; in the present application, the output end of the first diagnostic circuit 10 is connected to the power supply end of the second diagnostic circuit 20, the base of the first transistor 40 is connected to the output end of the first diagnostic circuit 10, and the collector of the first transistor 40 is connected to the output end of the third diagnostic circuit 30, so as to control the power supply state of the second diagnostic circuit 20 and the output result of the third diagnostic circuit 30 through the output result of the first diagnostic circuit 10.
[0047] See also Figures 1 to 4 In some embodiments, the input end of the first isolation circuit 50 is connected to the emitter of the first transistor 40 so that the first isolation circuit 50 receives the diagnostic result of the third safety device 300 by the third diagnostic circuit 30 through the first transistor 40; the input end of the second isolation circuit 60 is connected to the output end of the second diagnostic circuit 20 so that the second isolation circuit 60 receives the diagnostic result of the second safety device 200 by the second diagnostic circuit 20.
[0048] See also Figure 2 and Figure 3 In some embodiments, the circuit provided by the embodiments of the present application also includes a second transistor 70, which is connected in series between the emitter of the first transistor 40 and the input end of the first isolation circuit 50, and is used to control the on-off of the output end of the third diagnostic circuit 30 and the first isolation circuit 50; specifically, the second transistor 70 is a PNP transistor, and when the base of the second transistor 70 is at a high level, the second transistor 70 is in a cut-off state, and when the base of the second transistor 70 is at a low level, the second transistor 70 is in a conducting state.
[0049] See also Figure 2 and Figure 4 In some embodiments, the circuit provided by the embodiments of the present application also includes a third transistor 80, which is connected in series between the output end of the first diagnostic circuit 10 and the power supply end of the second diagnostic circuit 20, and is used to control the on-off of the output end of the first diagnostic circuit 10 and the power supply end of the second diagnostic circuit 20; specifically, the third transistor 80 is a PNP transistor, and when the base of the third transistor 80 is at a high level, the third transistor 80 is in a cut-off state, and when the base of the third transistor 80 is at a low level, the third transistor 80 is in a conducting state.
[0050] See also Figures 2 to 4 In the above embodiments, in the circuit provided in the embodiments of the present application, only the second transistor 70 may be configured to control the on / off connection between the output end of the third diagnostic circuit 30 and the first isolation circuit 50, and to control the output result of the third diagnostic circuit 30; only the third transistor 80 may be configured to control the on / off connection between the output end of the first diagnostic circuit 10 and the power supply end of the second diagnostic circuit 20, and to control the power supply of the second diagnostic circuit 20; and the second transistor 70 and the third transistor 80 may also be configured at the same time.
[0051] See also Figures 1 to 4 In some embodiments, the circuit provided by the embodiments of the present application also includes a system switch module 90, the output end of the system switch module 90 is connected to the base of the second transistor 70 and the base of the third transistor 80; the system switch module 90 outputs a high level signal or a low level signal to the base of the second transistor 70 and the base of the third transistor 80 to control the on and off of the second transistor 70 and the third transistor 80.
[0052] See also Figures 2 to 4 Specifically, the system switch module 90 includes a first optocoupler switch 91 and a fourth transistor 92. In the first optocoupler switch 91, the output end of the photosensitive transistor is connected to the output end of the system switch module 90, so that the output end of the photosensitive transistor transmits the signal to the base of the second transistor 70 and the base of the third transistor 80 through the output end of the system switch module 90.
[0053] See also Figures 2 to 4 Specifically, the collector of the fourth transistor 92 , the emitter of the fourth transistor 92 , and the light emitting diode of the first optical coupling switch 91 are connected in series. The on-off of the light-emitting diode of the first optical coupling switch 91 is controlled by the on-off of the fourth transistor 92. When the fourth transistor 92 is turned on, the light-emitting diode of the first optical coupling switch 91 is energized, the light-emitting diode of the first optical coupling switch 91 emits light, and the photosensitive transistor of the first optical coupling switch 91 senses light and outputs a high level to the base of the second transistor 70 and the base of the third transistor 80 through the output end of the system switch module 90. The second transistor 70 and the third transistor 80 are in a cut-off state, and the fault diagnosis circuit does not work; when the fourth transistor 92 is turned off, the light-emitting diode of the first optical coupling switch 91 is in an open circuit, the light-emitting diode of the first optical coupling switch 91 does not emit light, and the photosensitive transistor of the first optical coupling switch 91 outputs a low level to the base of the second transistor 70 and the base of the third transistor 80 through the output end of the system switch module 90. The second transistor 70 and the third transistor 80 are in a conducting state, and the fault diagnosis circuit works. Specifically, the output end of the light emitting diode of the first optical coupling switch 91 is connected to the collector of the fourth transistor 92 .
[0054] Specifically, the fourth transistor 92 is an NPN transistor, and the base of the fourth transistor 92 is connected to the GPIO3 terminal. When the base of the fourth transistor 92 is at a high level, the fourth transistor 92 is in an on state, and when the base of the fourth transistor 92 is at a low level, the fourth transistor 92 is in an off state.
[0055] See also Figures 1 to 4 When the GPIO3 terminal outputs a high level to the base of the fourth transistor 92, the light emitting diode of the first optocoupler switch 91 is turned on, the light emitting diode of the first optocoupler switch 91 emits light, and the photosensitive transistor of the first optocoupler switch 91 outputs a high level to the second transistor 70 and the third transistor 80 through the output port of the first optocoupler switch 91, the second transistor 70 and the third transistor 80 are cut off, and the circuit provided in the embodiment of the present application does not work; when the GPIO3 terminal outputs a low level to the base of the fourth transistor 92, the light emitting diode of the first optocoupler switch 91 is open, the photosensitive transistor of the first optocoupler switch 91 outputs a low level to the second transistor 70 and the third transistor 80 through the output port of the first optocoupler switch 91, the second transistor 70 and the third transistor 80 are turned on, and the circuit provided in the embodiment of the present application works.
[0056] See also Figures 2 to 4 In some embodiments, the first diagnostic circuit 10 includes a first voltage divider circuit 11, a second voltage divider circuit 12 and a first comparator 13; the input end of the first voltage divider circuit 11 and the input end of the second voltage divider circuit 12 are used to connect with the input end and the output end of the first safety device 100 to be detected, so as to obtain the voltage of the input end and the output end of the first safety device 100 and perform a voltage division operation; the output end of the first voltage divider circuit 11 and the output end of the second voltage divider circuit 12 are respectively connected to the inverting input end and the non-inverting input end of the first comparator 13, so as to input the divided electrical signal into the first comparator 13; the first comparator 13 outputs a high level or a low level based on the comparison result of the voltage of the inverting input end and the non-inverting input end.
[0057] See also Figures 2 to 4 In some embodiments, the first voltage divider circuit 11 includes a first voltage divider 111 and a second voltage divider 112, the first voltage divider 111 and the second voltage divider 112 are connected in series, and the second voltage divider 112 is used to be connected to the negative electrode of the circuit to be tested to form a loop; the current direction of the first voltage divider circuit 11 is from the first voltage divider 111 to the second voltage divider 112; specifically, the first voltage divider 111 includes a first resistor, and the first resistor is used to connect the input end of the first safety device 100 to be tested; the second voltage divider 112 includes a second resistor, and the first resistor and the second resistor are connected in series.
[0058] See also Figures 2 to 4In some embodiments, the second voltage divider circuit 12 includes a third voltage divider 121 and a fourth voltage divider 122, the third voltage divider 121 and the fourth voltage divider 122 are connected in series, and the fourth voltage divider 122 is used to be connected to the negative electrode of the circuit to be tested to form a loop; the current direction of the second voltage divider circuit 12 is from the third voltage divider 121 to the fourth voltage divider 122, and the resistance of the fourth voltage divider 122 is greater than the resistance of the second voltage divider 112; specifically, the third voltage divider 121 includes a third resistor, and the third resistor is used to connect the output end of the first safety device 100 to be detected; the second voltage divider 112 includes a fourth resistor and a fifth resistor, and the third resistor, the fourth resistor and the fifth resistor are connected in series.
[0059] See also Figures 2 to 4 In some embodiments, the inverting input terminal of the first comparator 13 is connected to the input terminal of the second voltage divider 112, and the non-inverting input terminal of the first comparator 13 is connected to the input terminal of the fourth voltage divider 122. Specifically, the inverting input terminal of the first comparator 13 is connected to the connection node of the first resistor and the second resistor, and the non-inverting input terminal of the first comparator 13 is connected to the connection node of the third resistor and the fourth resistor.
[0060] See also Figures 2 to 4 Specifically, when the first safety device 100 works normally, since the resistance of the fourth voltage divider 122 is greater than the resistance of the second voltage divider 112, the voltage at the non-inverting input terminal of the first comparator 13 is greater than the voltage at the inverting input terminal of the first comparator 13, and the first comparator 13 outputs a high level; when the first safety device 100 fails, the first safety device 100 is open-circuited, and the second voltage divider circuit has no voltage. Since the second voltage divider 112 is connected to the negative electrode of the circuit to be tested to form a current loop, when the first safety device 100 fails, the first voltage divider circuit 11 still has voltage. At this time, the voltage at the inverting input terminal of the first comparator 13 is greater than the voltage at the non-inverting input terminal, and the first comparator 13 outputs a low level.
[0061] See also Figures 2 to 4 In some embodiments, the second diagnostic circuit 20 includes a third voltage divider circuit 21, a fourth voltage divider circuit 22 and a second comparator 23, the input end of the third voltage divider circuit 21 and the input end of the fourth voltage divider circuit 22 are used to connect with the input end and the output end of the second safety device 200 to be detected, so as to obtain the voltage of the input end and the output end of the second safety device 200 and perform a voltage division operation; the output end of the third voltage divider circuit 21 and the output end of the fourth voltage divider circuit 22 are respectively connected to the inverting input end and the non-inverting input end of the second comparator 23, so as to input the divided electrical signal into the second comparator 23; the second comparator 23 outputs a high level or a low level based on the comparison result of the voltage of the inverting input end and the non-inverting input end.
[0062] See also Figures 2 to 4In some embodiments, the third voltage divider circuit 21 includes a fifth voltage divider 211 and a sixth voltage divider 212, the fifth voltage divider 211 and the sixth voltage divider 212 are connected in series, and the sixth voltage divider 212 is used to be connected to the negative electrode of the circuit to be tested to form a loop; the current direction of the third voltage divider circuit 21 is from the fifth voltage divider 211 to the sixth voltage divider 212; specifically, the fifth voltage divider 211 includes a sixth resistor, and the sixth resistor is used to connect the input end of the second safety device 200 to be tested; the sixth voltage divider 212 includes a seventh resistor, and the sixth resistor is connected in series with the seventh resistor.
[0063] See also Figures 2 to 4 In some embodiments, the fourth voltage divider circuit 22 includes a seventh voltage divider 221 and an eighth voltage divider 222, the seventh voltage divider 221 and the eighth voltage divider 222 are connected in series, and the eighth voltage divider 222 is used to be connected to the negative electrode of the circuit to be tested to form a loop; the current direction of the fourth voltage divider circuit 22 is from the seventh voltage divider 221 to the eighth voltage divider 222, and the resistance of the eighth voltage divider 222 is greater than the resistance of the sixth voltage divider 212; specifically, the seventh voltage divider 221 includes an eighth resistor, and the eighth resistor is used to connect the output end of the second safety device 200 to be detected; the eighth voltage divider 222 includes a ninth resistor and a tenth resistor, and the eighth resistor, the ninth resistor and the tenth resistor are connected in series.
[0064] See also Figures 2 to 4 In some embodiments, the inverting input terminal of the second comparator 23 is connected to the input terminal of the sixth voltage divider 212, and the non-inverting input terminal of the second comparator 23 is connected to the input terminal of the eighth voltage divider 222. Specifically, the inverting input terminal of the second comparator 23 is connected to the connection node of the sixth resistor and the seventh resistor, and the non-inverting input terminal of the second comparator 23 is connected to the connection node of the eighth resistor and the ninth resistor.
[0065] See also Figures 2 to 4 Specifically, when the second safety device 200 works normally, since the resistance of the eighth voltage divider 222 is greater than the resistance of the sixth voltage divider 212, the voltage at the non-inverting input terminal of the second comparator 23 is greater than the voltage at the inverting input terminal of the second comparator 23, and the second comparator 23 outputs a high level; when the second safety device 200 fails, the second safety device 200 is open-circuited, and the fourth voltage divider circuit 22 has no voltage. Since the sixth voltage divider 212 is connected to the negative electrode of the circuit to be tested to form a current loop, when the second safety device 200 fails, the third voltage divider circuit 21 still has voltage. At this time, the voltage at the inverting input terminal of the second comparator 23 is greater than the voltage at the non-inverting input terminal, and the second comparator 23 outputs a low level.
[0066] See also Figures 2 to 4Specifically, the emitter of the third transistor 80 is connected to the output end of the first comparator 13, and the collector of the third transistor 80 is connected to the power supply end of the second comparator 23; when the first safety device 100 works normally, the first comparator 13 outputs a high level, and the second comparator 23 is powered by the third transistor 80; when the first safety device 100 fails and opens, the first comparator 13 outputs a low level, and the second comparator 23 does not work.
[0067] See also Figures 2 to 4 In some embodiments, the third diagnostic circuit 30 includes a fifth voltage divider circuit 31 and a third comparator 32; the input end of the fifth voltage divider circuit 31 is used to be connected to the output end of the third safety device 300 to be detected, so as to obtain the voltage of the output end of the third safety device 300 and perform a voltage dividing operation; the output end of the fifth voltage divider circuit 31 is connected to the non-inverting input end of the third comparator 32; in an embodiment of the present application, the second safety device 200 and the third safety device 300 are arranged in parallel, and the inverting input end of the third comparator 32 is connected to the input end of the eighth voltage divider 222; the third comparator 32 outputs a high level or a low level based on the comparison result of the inverting input end and the non-inverting input end voltage.
[0068] See also Figures 2 to 4 In some embodiments, the fifth voltage divider circuit 31 includes a ninth voltage divider 311 and a tenth voltage divider 312, the ninth voltage divider 311 and the tenth voltage divider 312 are connected in series, and the tenth voltage divider 312 is used to be connected to the negative electrode of the circuit to be tested to form a loop; the current direction of the fifth voltage divider 211 is from the ninth voltage divider 311 to the tenth voltage divider 312, and the resistance of the tenth voltage divider 312 is greater than the resistance of the eighth voltage divider 222; specifically, the ninth voltage divider 311 includes an eleventh resistor, and the eleventh resistor is used to connect the output end of the third safety device 300 to be detected; the tenth voltage divider 312 includes a twelfth resistor, a thirteenth resistor and a fourteenth resistor, and the eleventh resistor, the twelfth resistor, the thirteenth resistor and the fourteenth resistor are connected in series.
[0069] See also Figures 2 to 4 In some embodiments, the inverting input terminal of the third comparator 32 is connected to the input terminal of the eighth voltage divider 222, and the non-inverting input terminal of the third comparator 32 is connected to the input terminal of the tenth voltage divider 312. Specifically, the inverting input terminal of the third comparator 32 is connected to the connection node of the eighth resistor and the ninth resistor, and the non-inverting input terminal of the third comparator 32 is connected to the connection node of the eleventh resistor and the twelfth resistor.
[0070] See also Figures 2 to 4Specifically, when the third safety device 300 works normally, since the resistance of the tenth voltage divider 312 is greater than the resistance of the eighth voltage divider 222, the voltage at the non-inverting input terminal of the third comparator 32 is greater than the voltage at the inverting input terminal of the third comparator 32, and the third comparator 32 outputs a high level; when the third safety device 300 fails and the second safety device 200 works normally, the third safety device 300 is open-circuited, and the fifth voltage divider circuit 31 has no voltage. Since the eighth voltage divider 222 is connected to the negative electrode of the circuit to be tested to form a current loop, when the third safety device 300 fails and the second safety device 200 works normally, the fourth voltage divider circuit 22 still has voltage. At this time, the voltage at the inverting input terminal of the third comparator 32 is greater than the voltage at the non-inverting input terminal, and the third comparator 32 outputs a low level.
[0071] See also Figures 2 to 4 Specifically, the collector of the first transistor 40 is connected to the output end of the third comparator 32, and the base of the first transistor 40 is connected to the output end of the first comparator 13; when the first safety device 100 works normally, the first comparator 13 outputs a high level, the first transistor 40 is turned on, and the output result of the third comparator 32 can enter the first isolation circuit 50 through the first transistor 40 and the second transistor 70.
[0072] See also Figures 2 to 4 In some embodiments, the first isolation circuit 50 includes a second optocoupler switch 51, in which: the input end of the light-emitting diode is connected to the input end of the first isolation circuit 50, the output end of the phototransistor is connected to the output end of the first isolation circuit 50, and the output end of the first isolation circuit 50 is connected to the GPIO2 terminal.
[0073] See also Figures 2 to 4 In some embodiments, the second isolation circuit 60 includes a third optocoupler switch 61, in which: the input end of the light-emitting diode is connected to the input end of the second isolation circuit 60, the output end of the phototransistor is connected to the output end of the second isolation circuit 60, and the output end of the second isolation circuit 60 is connected to the GPIO1 terminal.
[0074] The circuit provided in the embodiment of the present application can determine the working states of the first safety device 100, the second safety device 200 and the third safety device 300 by detecting the high and low level states of GPIO1 and GPIO2: when GPIO1 and GPIO2 are both high levels, the first safety device 100, the second safety device 200 and the third safety device 300 are all in normal states; when GPIO1 and GPIO2 are both low levels, the first safety device 100 is in an abnormal disconnected state; when GPIO1 is high and GPIO2 is low, the third safety device 300 is in an abnormal disconnected state, and the first safety device 100 and the second safety device 200 are in normal states; when GPIO1 is low and GPIO2 is high, the second safety device 200 is in an abnormal disconnected state, and the first safety device 100 and the third safety device 300 are in normal states.
[0075] It can be understood that the circuit provided in the present application includes a first diagnostic circuit 10, a second diagnostic circuit 20, a third diagnostic circuit 30, a first transistor 40, a first isolation circuit 50 and a second isolation circuit 60; in the present application, the first diagnostic circuit 10, the second diagnostic circuit 20 and the third diagnostic circuit 30 are respectively used to connect to the safety device to be tested, so as to obtain the detection information of the safety device to be tested in real time, without the need for polling sampling, and the real-time nature of the diagnostic result can be effectively guaranteed; the present application performs fault diagnosis on the safety device through the diagnostic circuit, and replaces the MCU for data processing through the diagnostic circuit, which can effectively reduce the software load; in the present application, the output end of the first diagnostic circuit 10 is connected to the power supply end of the second diagnostic circuit 20, the base of the first transistor 40 is connected to the output end of the first diagnostic circuit 10, and the collector of the first transistor 40 is connected to the output end of the third diagnostic circuit 30, so as to control the power supply state of the second diagnostic circuit 20 and the output result of the third diagnostic circuit 30 through the output result of the first diagnostic circuit 10.
[0076] See also Figures 1 to 4 Accordingly, the present application further provides a device, including the circuit provided in the embodiment of the present application, and:
[0077] A first safety device 100, wherein both an input terminal and an output terminal of the first safety device 100 are connected to an input terminal of the first diagnostic circuit 10;
[0078] A second safety device 200, wherein both an input terminal and an output terminal of the second safety device 200 are connected to an input terminal of the second diagnostic circuit 20;
[0079] The third safety device 300 , the input end and the output end of the third safety device 300 are both connected to the input end of the third diagnosis circuit 30 .
[0080] Pre-charging relay S1, pre-charging resistor R, main positive contactor S2 and main negative contactor S3;
[0081] Among them, the input end of the first safety device 100 is used to connect to the positive pole of the battery, the output end of the first safety device 100 is connected to the pre-charging relay S1 and the main positive contactor S2, the pre-charging relay S1 and the main positive contactor S2 are connected in parallel, the pre-charging resistor R is connected in series with the pre-charging relay S1 and then connected in parallel with the main positive contactor S2; the second safety device 200 and the third safety device 300 are connected in parallel, the output end of the pre-charging resistor R is connected to the connection node of the output end of the main positive contactor S2 and the output end of the second safety device 200 is connected to the connection node of the output end of the third connection device; the main negative contactor S3 is used to connect the negative pole of the battery.
[0082] It can be understood that the device provided in the embodiment of the present application includes the circuit provided in the present application, the first safety device 100, the second safety device 200 and the third safety device 300, the input and output ends of the first safety device 100 are both connected to the input end of the first diagnostic circuit 10, the input and output ends of the second safety device 200 are both connected to the input end of the second diagnostic circuit 20, and the input and output ends of the third safety device 300 are both connected to the input end of the third diagnostic circuit 30, so that the first diagnostic circuit 10, the second diagnostic circuit 20 and the third diagnostic circuit 30 can obtain the detection information of the safety device to be tested in real time without polling sampling, which can effectively ensure the real-time nature of the diagnosis result; the present application performs fault diagnosis on the safety device through the diagnostic circuit, and uses the diagnostic circuit instead of the MCU for data processing, which can effectively reduce the software load.
[0083] The present application has introduced a circuit and a device provided by the embodiments of the present application in detail above. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.
Claims
1. A circuit, characterized in that: include: a first diagnostic circuit, a second diagnostic circuit and a third diagnostic circuit, wherein an output terminal of the first diagnostic circuit is connected to a power supply terminal of the second diagnostic circuit; A first transistor, wherein the base of the first transistor is connected to the output end of the first diagnostic circuit, and the collector of the first transistor is connected to the output end of the third diagnostic circuit; a first isolation circuit, wherein an input end of the first isolation circuit is connected to an emitter of the first transistor; A second isolation circuit, wherein an input end of the second isolation circuit is connected to an output end of the second diagnosis circuit.
2. The circuit according to claim 1, characterized in that Also includes: A second transistor is connected in series between the emitter of the first transistor and the input end of the first isolation circuit.
3. The circuit according to claim 2, characterized in that Also includes: A third transistor is connected in series between the output end of the first diagnostic circuit and the power supply end of the second diagnostic circuit.
4. The circuit according to claim 3, characterized in that It also includes a system switch module, the output end of which is connected to the base of the second transistor and / or the base of the third transistor, and the system switch module includes: A first optical coupler switch, wherein: an output end of a phototransistor is connected to an output end of the system switch module; A fourth triode, wherein the collector of the fourth triode, the emitter of the fourth triode and the light emitting diode of the first optical coupling switch are connected in series.
5. The circuit according to claim 1, characterized in that The first diagnostic circuit comprises: A first voltage-dividing circuit, the first voltage-dividing circuit comprising a first voltage-dividing element and a second voltage-dividing element, the first voltage-dividing element and the second voltage-dividing element are connected in series, and a current direction of the first voltage-dividing circuit is from the first voltage-dividing element to the second voltage-dividing element; a second voltage-dividing circuit, wherein the second voltage-dividing circuit comprises a third voltage-dividing element and a fourth voltage-dividing element, wherein the third voltage-dividing element and the fourth voltage-dividing element are connected in series, wherein a current direction of the second voltage-dividing circuit is from the third voltage-dividing element to the fourth voltage-dividing element, and a resistance of the fourth voltage-dividing element is greater than a resistance of the second voltage-dividing element; A first comparator, wherein an inverting input terminal of the first comparator is connected to an input terminal of the second voltage divider, and a non-inverting input terminal of the first comparator is connected to an input terminal of the fourth voltage divider.
6. The circuit according to claim 5, characterized in that The second diagnostic circuit comprises: A third voltage-dividing circuit, the third voltage-dividing circuit comprising a fifth voltage-dividing element and a sixth voltage-dividing element, the fifth voltage-dividing element and the sixth voltage-dividing element are connected in series, and the current direction of the third voltage-dividing circuit is from the fifth voltage-dividing element to the sixth voltage-dividing element; a fourth voltage-dividing circuit, the fourth voltage-dividing circuit comprising a seventh voltage-dividing element and an eighth voltage-dividing element, the seventh voltage-dividing element and the eighth voltage-dividing element being connected in series, the current direction of the fourth voltage-dividing element being from the seventh voltage-dividing element to the eighth voltage-dividing element, and the resistance of the eighth voltage-dividing element being greater than the resistance of the sixth voltage-dividing element; A second comparator, wherein the inverting input terminal of the second comparator is connected to the input terminal of the sixth voltage divider, and the non-inverting input terminal of the second comparator is connected to the input terminal of the eighth voltage divider.
7. The circuit according to claim 6, characterized in that The third diagnostic circuit comprises: a fifth voltage-dividing circuit, the fifth voltage-dividing circuit comprising a ninth voltage-dividing element and a tenth voltage-dividing element, the ninth voltage-dividing element and the tenth voltage-dividing element being connected in series, the current direction of the fifth voltage-dividing element being from the ninth voltage-dividing element to the tenth voltage-dividing element, and the resistance of the tenth voltage-dividing element being greater than the resistance of the eighth voltage-dividing element; A third comparator, wherein the inverting input terminal of the third comparator is connected to the input terminal of the eighth voltage divider, and the non-inverting input terminal of the third comparator is connected to the input terminal of the tenth voltage divider.
8. The circuit according to claim 1, characterized in that The first isolation circuit comprises: A second optocoupler switch, wherein: an input end of a light emitting diode is connected to an input end of the first isolation circuit, and an output end of a phototransistor is connected to an output end of the first isolation circuit.
9. The circuit according to claim 1, characterized in that The second isolation circuit comprises: A third optocoupler switch, wherein: an input end of the light emitting diode is connected to an input end of the second isolation circuit, and an output end of the phototransistor is connected to an output end of the second isolation circuit.
10. A device, characterized in that: A circuit comprising a circuit as claimed in any one of claims 1 to 9, and: a first safety device, wherein an input terminal and an output terminal of the first safety device are both connected to an input terminal of the first diagnostic circuit; a second safety device, wherein an input terminal and an output terminal of the second safety device are both connected to an input terminal of the second diagnostic circuit; A third safety device, wherein the input terminal and the output terminal of the third safety device are both connected to the input terminal of the third diagnosis circuit.