Novel three-coaxial photoelectric probe clamp

By designing a new three-coaxial photoelectric probe fixture, the connection between the three-coaxial joints and the probe is solved, the electromagnetic interference problem in small-signal photoelectric test is improved, and the accuracy and stability of the test are improved.

CN222800797UActive Publication Date: 2025-04-25COTAI OPTICAL CORE (CHANGZHOU) TESTING TECH CO LTD
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Patent Information

Application Number
CN202421175512.7
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-05-28
Publication Date
2025-04-25
Estimated Expiration
2034-05-28

AI Technical Summary

Technical Problem

In the photoelectric test of small signals, external electromagnetic interference can easily affect the test results, reducing the accuracy and efficiency of chip testing.

Method used

A new type of three-coaxial photoelectric probe fixture is designed. Through the combination of three-coaxial joints and needle clamping blocks, protective layers and pinch arm, the probe is connected to the three-coaxial axis to reduce electromagnetic interference.

Benefits of technology

It effectively reduces electromagnetic interference in small-signal photoelectric tests and improves the accuracy and stability of test results.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a novel tri-coaxial photoelectric probe clamp, which comprises a tri-coaxial joint, a probe head clamping block, a protective layer and a probe clamping arm, the tri-coaxial joint is positioned on the side surface of the probe head clamping block, one end of the protective layer is clamped at the bottom of the probe head clamping block, and the probe clamping arm is fixed at the other end of the protective layer; according to the utility model, the probe is connected with the three coaxial lines, so that electromagnetic interference in small-signal photoelectric testing is reduced, and the accuracy and stability of testing results are improved.
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Description

Technical Field

[0001] The utility model relates to the technical field of clamps, in particular to a novel three-coaxial photoelectric probe clamp. Background Art

[0002] At present, in order to meet the needs of various fields for optoelectronic chips, vertical cavity surface emitting laser (VCSEL) is one of the main research and development directions of laser manufacturers. In existing R&D tests, probes are often used to contact the chip pad to power the chip. In small signal optoelectronic tests, the test results are often affected by external electromagnetic interference, which reduces the accuracy of chip testing and affects the chip testing efficiency.

[0003] Therefore, how to reduce or eliminate electromagnetic interference in small signal optoelectronic testing is an urgent problem that technicians in the chip testing field need to solve. Utility Model Content

[0004] In order to solve the above technical problems, the utility model provides the following technical solutions: a new type of three-coaxial photoelectric probe clamp, including a three-coaxial joint, a needle clamping block, a protective layer and a needle clamping arm, the three-coaxial joint is located on the side of the needle clamping block, one end of the protective layer is clamped at the bottom of the needle clamping block, and the needle clamping arm is fixed at the other end of the protective layer.

[0005] Preferably, an insulating layer is included, and the insulating layer is located between the protective layer and the needle clamping arm.

[0006] Preferably, it comprises a joint bracket, wherein the joint bracket is fixed to the side of the needle clamping block, and a triaxial joint is installed on one side of the joint bracket.

[0007] Preferably, the three-coaxial joint includes a three-coaxial joint middle layer, a three-coaxial joint core layer and a three-coaxial joint outer shell, the three-coaxial joint middle layer is correspondingly connected to the needle clamp arm, the three-coaxial joint core layer is correspondingly connected to the protective layer, and the three-coaxial joint outer shell is correspondingly connected to the grounding shell of the three-coaxial photoelectric probe fixture installation machine.

[0008] Preferably, it comprises a photoelectric beryllium copper probe and a connecting plate, wherein the photoelectric beryllium copper probe is arranged at one end of the needle clamping arm away from the protective layer, and the connecting plate is connected to one end of the needle clamping block away from the protective layer.

[0009] Compared with the prior art, the beneficial effects of the utility model are as follows:

[0010] 1. Use probes and triax connections to reduce electromagnetic interference in small signal optoelectronic testing.

[0011] 2. Improve the accuracy and stability of test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a three-dimensional diagram of an embodiment of the utility model.

[0013] Figure 2 It is a schematic diagram of the internal structure of an embodiment of the utility model.

[0014] Figure 3 This is a schematic diagram of the internal structure of the probe head structure of an embodiment of the utility model.

[0015] In the figure, 1. connecting plate, 2. triaxial connector, 3. needle clamping block, 4. connector bracket, 5. protective layer, 6. needle clamping arm, 7. insulating layer, 8. photoelectric beryllium copper probe, 9. triaxial connector middle layer, 10. triaxial connector core layer, 11. triaxial connector outer shell. DETAILED DESCRIPTION

[0016] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0017] like Figure 1-3 A novel three-coaxial photoelectric probe fixture includes a three-coaxial connector 2, a needle clamping block 3, a protective layer 5 and a needle clamping arm 6. The three-coaxial connector 2 is located on the side of the needle clamping block 3, one end of the protective layer 5 is clamped at the bottom of the needle clamping block 3, and the needle clamping arm 6 is fixed to the other end of the protective layer 5; the core layer of the three-coaxial is connected to the needle holder needle clamping arm, and the three-coaxial middle layer is connected to the needle holder protective layer. The three-coaxial shell is connected to the needle clamping block and used as a ground wire through the entire machine, and subsequent operations can be carried out. The probe is connected to the three-coaxial to reduce electromagnetic interference in small signal photoelectric testing.

[0018] like Figure 1-3 , including an insulating layer 7, which is located between the protective layer 5 and the needle clamping arm 6; the insulating layer isolates the protective layer 5 and the needle clamping arm 6 to prevent short circuit during use and improve the service life of the device.

[0019] like Figure 1-3 , including a joint bracket 4, the joint bracket 4 is fixed to the side of the needle clamping block 3, and a three-coaxial joint 2 is installed on one side of the joint bracket 4; the joint bracket protects and fixes the three-coaxial joint.

[0020] like Figure 1-3The three-coaxial joint 2 includes a three-coaxial joint middle layer 9, a three-coaxial joint core layer 10 and a three-coaxial joint shell 11. The three-coaxial joint middle layer 9 is correspondingly connected to the needle clamp arm 6, the three-coaxial joint core layer 10 is correspondingly connected to the protective layer 5, and the three-coaxial joint shell 11 is correspondingly connected to the grounding shell of the three-coaxial photoelectric probe fixture installation machine; the joint bracket is wrapped around the outside of the three-coaxial joint middle layer and the three-coaxial joint core layer to protect the internal structure; the different layers of the probe head are connected to the different layers of the three-coaxial joint, and the three-coaxial joint shell is directly fixed to the machine through the connection between the fixing plates. No wiring is required to achieve the grounding effect.

[0021] like Figure 1-3 , including a photoelectric beryllium copper probe 8 and a connecting plate 1. The photoelectric beryllium copper probe 8 is clamped at the end of the needle clamping arm 6 away from the protective layer 5. The connecting plate 1 is connected to the end of the needle clamping block 3 away from the protective layer 5; the needle clamping block 3 is fixed by the connecting plate, and the protective layer 5 and the needle clamping arm 6 are fixed by the needle clamping block 3. Finally, the photoelectric beryllium copper probe 8 is fixed by the needle clamping arm 6 to ensure the continuity and stability of the device during use.

[0022] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A new type of three-coaxial photoelectric probe fixture, characterized by: The invention comprises a three-coaxial joint (2), a needle clamping block (3), a protective layer (5) and a needle clamping arm (6), wherein the three-coaxial joint (2) is located on the side of the needle clamping block (3), one end of the protective layer (5) is clamped on the bottom of the needle clamping block (3), and the needle clamping arm (6) is fixed to the other end of the protective layer (5).

2. The novel three-coaxial photoelectric probe fixture according to claim 1 is characterized in that: It comprises an insulating layer (7), wherein the insulating layer (7) is located between the protective layer (5) and the needle clamping arm (6).

3. The novel three-coaxial photoelectric probe fixture according to claim 2 is characterized in that: It comprises a joint bracket (4), wherein the joint bracket (4) is fixed to the side of the needle clamping block (3), and a triaxial joint (2) is installed on one side of the joint bracket (4).

4. The novel three-coaxial photoelectric probe fixture according to claim 3 is characterized in that: The triaxial joint (2) comprises a triaxial joint middle layer (9), a triaxial joint core layer (10) and a triaxial joint outer shell (11); the triaxial joint middle layer (9) and the needle clamp arm (6) are connected correspondingly; the triaxial joint core layer (10) and the protective layer (5) are connected correspondingly; and the triaxial joint outer shell (11) and the grounding outer shell of the triaxial photoelectric probe fixture installation machine are connected correspondingly.

5. The novel three-coaxial photoelectric probe fixture according to claim 4 is characterized in that: It comprises a photoelectric beryllium copper probe (8) and a connecting plate (1), wherein the photoelectric beryllium copper probe (8) is clamped at one end of the needle clamping arm (6) away from the protective layer (5), and the connecting plate (1) is connected to one end of the needle clamping block (3) away from the protective layer (5).