Fault part testing and analyzing equipment

By designing faulty parts testing and analysis equipment, and using control modules and up and down power control modules to automatically control the up and down power frequency and slope of the faulty parts, the problem of difficulty in accurately controlling the up and down power frequency and slope of human operations in the prior art is solved, and the accuracy of test and analysis is improved.

CN222867024UActive Publication Date: 2025-05-13BEIJING JINGWEI HIRAIN TECH CO INC
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Patent Information

Application Number
CN202421724562.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-07-19
Publication Date
2025-05-13
Estimated Expiration
2034-07-19

AI Technical Summary

Technical Problem

When conducting faulty parts testing and analysis, it is difficult to accurately grasp the up and down power frequency and slope of artificial power on and off, resulting in low test accuracy.

Method used

A fault part testing and analysis equipment is designed, including a control module, a power conversion module and an up-down power control module, which controls the up-down power frequency and slope of the measured fault part through automated means.

Benefits of technology

By automatically controlling the up and down power frequency and slope, the accuracy of faulty parts testing and analysis is improved, and the accuracy problems caused by human operation are avoided.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses fault part test and analysis equipment, which realizes the accuracy of fault part test and analysis. The fault part test analysis equipment comprises a control module, a power supply conversion module and a power-on and power-off control module, the input end of the power supply conversion module is used for accessing a power supply, and the output end is accessed to the power supply end of an electric component in the fault part test analysis equipment; the power supply conversion module is used for converting a power supply voltage into a voltage required by the operation of the electric component; the power-on and power-off control module is provided with an input end, an output end and a controller, the input end of the power-on and power-off control module is used for accessing the power supply, the output end of the power-on and power-off control module is used for accessing a tested fault part, and the control end of the power-on and power-off control module is The power-on and power-off control module is used for adjusting the power-on and power-off frequency and the power-on and power-off slope of the tested fault part under the control of the control module; the first communication interface of the control module is used for accessing the input and output device, and the second communication interface of the control module is used for accessing a tested fault part.
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Description

Technical Field

[0001] The utility model relates to the technical field of automobile electronic circuits, and more specifically to a fault component testing and analyzing device. Background Art

[0002] When testing and analyzing a faulty on-board controller (referred to as the faulty component), it is usually necessary to power on and off multiple times and / or quickly power on and off to reproduce the fault. Power on means providing power to the faulty component, and power off means disconnecting the power to the faulty component; multiple power on and off emphasizes high power on and off frequency, and fast power on and off emphasizes short power on and off time, that is, high power on and off slope.

[0003] In the prior art, when testing and analyzing a faulty component, the faulty component is usually connected to an external power supply, and then the power supply is manually turned on and off repeatedly to reproduce the fault, and then the test and analysis are performed accordingly. However, it is difficult to accurately grasp the power-on and power-off frequency and slope when turning the power on and off manually, resulting in low test accuracy. Utility Model Content

[0004] In view of this, the utility model provides a faulty component testing and analysis device to achieve accuracy in testing and analyzing the faulty component.

[0005] A fault component testing and analysis device comprises: a control module, a power conversion module and an on / off power control module;

[0006] The input end of the power conversion module is used to connect to the power supply, and the output end is connected to the power supply end of the electrical components inside the fault component testing and analysis equipment; the power conversion module is used to convert the power supply voltage into the voltage required for the electrical components to work;

[0007] The power-on and power-off control module has an input end, an output end and a controller, wherein the input end is used to connect to the power supply, the output end is used to connect to the faulty component under test, and the control end is connected to the control module; the power-on and power-off control module is used to adjust the power-on and power-off frequency and the power-on and power-off slope of the faulty component under test under the control of the control module;

[0008] The first communication interface of the control module is used to access the input and output device, and the second communication interface of the control module is used to access the faulty component under test.

[0009] Optionally, the power-on and power-off control module includes: z integration circuits, x high drive circuits and y low drive circuits; x≥1, y≥1, z≥1;

[0010] Wherein, the output end of each integration circuit is correspondingly connected to a high drive circuit and / or a low drive circuit, and each high drive circuit and each low drive circuit has a unique integration circuit correspondingly connected thereto;

[0011] The input ends of each high drive circuit and each low drive circuit are connected together as the input end of the upper and lower power control module, the output ends of the x high drive circuits and the y low drive circuits serve as the x+y output ends of the upper and lower power control module, and the input ends of the z integration circuits serve as the z control ends of the upper and lower power control module.

[0012] Optionally, z=2, x=y=1.

[0013] Optionally, the power source includes an on-board battery or an external voltage regulator.

[0014] Optionally, the second communication interface includes: a CAN bus interface and / or at least one voltage acquisition interface;

[0015] When the second communication interface includes a CAN bus interface, the faulty component testing and analysis device further includes a CAN physical layer chip; one end of the CAN physical layer chip is connected to the CAN bus interface, and the other end is used to connect to the faulty component under test.

[0016] Optionally, the input and output devices include: a human-computer interaction module and / or a computer;

[0017] When the input-output device includes a human-computer interaction module, the human-computer interaction module is a component of the fault component testing and analysis device;

[0018] When the input-output device includes a computer, the first communication interface includes a first UART interface and / or a second UART interface;

[0019] When the first communication interface includes a second UART interface, the faulty component testing and analyzing device further includes a USB to UART chip, one end of the USB to UART chip is connected to the second UART interface, and the other end is connected to the first USB interface of the computer.

[0020] Optionally, the power supply end of the control module is also used to access a second USB port of a computer.

[0021] Optionally, the human-computer interaction module includes a touch screen, or the human-computer interaction module includes a keyboard and a display screen.

[0022] Optionally, the keyboard is a matrix keyboard.

[0023] Optionally, the fault component testing and analyzing device has a connector, which is connected to an external device via the connector.

[0024] It can be seen from the above technical solution that after the control module is debugged through the input and output devices, the test and analysis of the faulty component can be started: the faulty component test and analysis equipment starts to power on and run under the power supply output by the power conversion module, and at the same time, the faulty component under test starts to power on and run under the power supply of the power supply; the control module adjusts the power-on and power-off frequency and slope of the faulty component under test to the target value by controlling the power-on and power-off control module, so that the faulty component under test can reproduce the fault and generate an error signal, and the control module collects and records the error signal and outputs it through the input and output devices to realize the test and analysis of the faulty component under test. It can be seen that the utility model uses an automated method to control the power-on and power-off frequency and slope of the faulty component under test, eliminating the problem of difficulty in accurately grasping the power-on and power-off frequency and slope when manually turning on and off the power supply, thereby improving the test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0026] Figure 1 A schematic diagram of the structure of a fault component testing and analysis device disclosed in an embodiment of the utility model;

[0027] Figure 2 A schematic diagram of the upper and lower power waveforms of a faulty component under test disclosed in an embodiment of the utility model;

[0028] Figure 3 A structural schematic diagram of another fault component testing and analysis device disclosed in an embodiment of the utility model;

[0029] Figure 4 A structural schematic diagram of another fault component testing and analysis device disclosed in an embodiment of the utility model;

[0030] Figure 5 The present invention is a schematic structural diagram of another fault component testing and analyzing device disclosed in an embodiment of the present utility model. DETAILED DESCRIPTION

[0031] For the purpose of reference and clarity, the technical terms, abbreviations or acronyms used below are summarized as follows:

[0032] MOSFET: Metal-Oxide-Semiconductor Field-Effect Transistor, metal oxide semiconductor field effect transistor;

[0033] PWM: Pulse Width Modulation, pulse width modulation;

[0034] CAN: Controller Area Network, controller area network;

[0035] PHY: Physical, port physical layer;

[0036] MCU: Micro Controller Unit, micro control unit;

[0037] FPGA: Field Programmable Gate Array, field programmable gate array;

[0038] ASIC: Application Specific Integrated Circuit, application-specific integrated circuit;

[0039] I / O: Input / Output, input / output;

[0040] OLED: Organic Light-Emitting Diode, organic light-emitting diode;

[0041] LCD: Liquid Crystal Display, liquid crystal display;

[0042] UART: Universal Asynchronous Receiver / Transmitter, universal asynchronous receiver / transmitter;

[0043] USB: Universal Serial Bus.

[0044] In the actual use of vehicle controllers, failures are often unavoidable, but the probability of failure recurrence is low and the fault location is difficult, so it is usually necessary to stimulate failure recurrence by powering on and off the vehicle controller multiple times and / or quickly powering on and off the vehicle controller to achieve test analysis of the faulty vehicle controller (referred to as the faulty component). Among them, multiple power on and off emphasizes high power on and off frequency, and fast power on and off emphasizes high power on and off slope.

[0045] In the prior art, when testing and analyzing a faulty component, the faulty component is usually connected to an external power supply, and then the power supply is manually turned on and off repeatedly to reproduce the fault, and then the test and analysis are performed accordingly. However, it is difficult to manually turn the power on and off accurately, and it is difficult to accurately grasp the power-on and power-off frequency and slope, resulting in low test accuracy.

[0046] In order to achieve the accuracy of the test and analysis of the faulty component, the embodiment of the utility model provides a faulty component test and analysis device. The faulty component test and analysis device uses an automated method to control the power-on and power-off frequency and slope of the faulty component under test, eliminating the problem of the difficulty in accurately grasping the power-on and power-off frequency and slope when turning the power on and off manually, thereby improving the test accuracy.

[0047] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0048] In the embodiments of the present invention, "one or more" means one, two or more than two. "And / or" describes the association relationship of the associated objects, indicating that three relationships may exist; for example, A and / or B may mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B may be singular or plural. The character " / " generally indicates that the associated objects before and after are in an "or" relationship.

[0049] See also Figure 1 , a fault component testing and analysis device disclosed in an embodiment of the utility model comprises: a control module 1, a power conversion module 2 and an up and down power control module 3;

[0050] Among them, the input end of the power conversion module 2 is used to connect to the power supply 4; the output end of the power conversion module 2 is connected to the power supply end of the internal power-consuming components of the faulty component testing and analysis equipment (the internal power-consuming components of the faulty component testing and analysis equipment include the control module 1 and the upper and lower power control module 3, etc.; to simplify the drawing, Figure 1 Only the connection between the output end of the power conversion module 2 and the power end of the control module 1 is shown); the power conversion module 2 is used to convert the voltage of the power supply 4 into the voltage required for the internal electrical components of the fault component testing and analysis equipment to work;

[0051] The power-on and power-off control module 3 has an input terminal, an output terminal and a control terminal; the input terminal of the power-on and power-off control module 3 is used to connect to the power supply 4; the output terminal of the power-on and power-off control module 3 is used to connect to the faulty component under test; the control terminal of the power-on and power-off control module 3 is connected to the control module 1, and is used to adjust the power-on and power-off frequency and the power-on and power-off slope of the faulty component under test under the control of the control module 1;

[0052] The first communication interface of the control module 1 is used to access the input / output device 5 , and the second communication interface of the control module 1 is used to access the faulty component under test.

[0053] Below Figure 1The working principle of the scheme shown is described in detail:

[0054] When it is necessary to test and analyze the faulty component under test, the staff first connects the faulty component under test to the faulty component test and analysis equipment, connects the faulty component test and analysis equipment to the input and output equipment 5, and connects the faulty component test and analysis equipment to the power supply 4. Then, after the staff debugs the control logic stored in the control module 1 through the input and output equipment 5 (including setting the target values ​​of the power-on and power-off frequencies and the power-on and power-off slopes of the faulty component under test, and debugging other related control logics), the test and analysis of the faulty component under test can be started, as follows: the faulty component test and analysis equipment starts to power on and run under the power supply output by the power conversion module 2 of the power supply 4, and the faulty component under test starts to power on and run under the power supply of the power supply 4; the control module 1 adjusts the power-on and power-off frequencies and the power-on and power-off slopes of the faulty component under test to the target values ​​by controlling the power-on and power-off control module 3. After multiple power-on and power-off and rapid power-on and power-off, the control module 1 reproduces the fault and generates an error signal. The control module 1 collects and records the error signal of the control module 1 and outputs it through the input and output equipment 5 to realize the test and analysis of the faulty component under test.

[0055] Figure 2 An example of power-on and power-off waveforms of a certain faulty component under test obtained by applying the embodiment of the utility model is as follows: starting from time t1, the action of powering on to V0 and then powering off to 0 volts is repeated several times with a period T1 and a slope k1; then starting from time t2, the action of powering on to V0 and then powering off to 0 volts is repeated several times with a period T2 and a slope k2; the period T1, the period T2, the slope k1 and the slope k2 can all be selected and set through the input-output device 5, and the desired power-on and power-off waveforms can be set by different parameter combinations.

[0056] In summary, the embodiments of the utility model automatically control the power-on and power-off frequency and slope of the faulty component under test, eliminating the problem of manually turning on and off the power supply and being difficult to accurately grasp the power-on and power-off frequency and slope, thereby improving the test accuracy.

[0057] Optionally, based on any of the embodiments disclosed above, see Figure 3, the up and down power control module 3 includes: z integration circuits, x high drive circuits and y low drive circuits; x≥1, y≥1, z≥1; wherein the output end of each integration circuit is correspondingly connected to a high drive circuit and / or a low drive circuit, different integration circuits are connected to different high drive circuits (that is, each high drive circuit has a unique integration circuit correspondingly connected thereto), and different integration circuits are connected to different low drive circuits (that is, each low drive circuit has a unique integration circuit correspondingly connected thereto); the input ends of each high drive circuit and each low drive circuit are connected together as the input end of the up and down power control module 3, the output ends of the x high drive circuits and the y low drive circuits are used as x+y output ends of the up and down power control module 3, and the input ends of the z integration circuits are used as z control ends of the up and down power control module 3. Figure 2 In the example, z=2, x=y=1 is used. Considering that each faulty component is usually tested and analyzed one by one in actual application, and for the convenience of control, an independent integration circuit is usually set for the high drive circuit and the low drive circuit, it is recommended to set z=2, x=y=1.

[0058] Specifically, there are two basic methods for driving the load: low-side drive (referred to as low drive) and high-side drive (referred to as high drive). Among them, low-side drive refers to enabling the drive circuit by closing the switch on the ground line after the electrical appliance or the drive circuit. High-side drive refers to enabling the drive circuit by closing the switch on the power line before the electrical appliance or the drive circuit. Correspondingly, the low-side drive circuit is a drive circuit in which the switch is located between the load and the ground, and the high-side drive circuit is a drive circuit in which the switch is located between the power supply and the load. Both the high-side drive circuit and the low-side drive circuit realize the power supply of the power supply to the load after obtaining the enable, and cut off the power supply of the power supply to the load when the enable is not obtained. The high-side drive circuit and the low-side drive circuit can be implemented, for example, based on NPN transistors and N-type MOSFETs (i.e., NMOS tubes).

[0059] In the embodiment of the utility model, the load is the faulty component under test. The power supply type of the faulty component under test is either low-side drive or low-side drive. In the embodiment of the utility model, a high-side drive circuit and a low-side drive circuit are introduced at the same time. Before the test, the staff determines whether to connect the faulty component under test to the high-side drive circuit or the low-side drive circuit according to the power supply type of the faulty component under test. When z integral circuits are provided, the z faulty components under test can be tested and analyzed at the same time. During the test, the frequency of the PWM signal output by the control module 1 determines the upper and lower power frequencies of the faulty component under test; the integral circuit is a circuit that makes its own output signal proportional to the time integral value of its own input signal. The control module 1 controls the switching speed of the high drive circuit or the low drive circuit by controlling the integral circuit, and then controls the upper and lower power slopes of the faulty component under test, thereby realizing automatic control of the upper and lower power frequencies and slopes of the faulty component under test.

[0060] Optionally, based on any of the embodiments disclosed above, still refer to Figure 3 , power supply 4 includes a vehicle-mounted battery or an external voltage regulator. When the faulty component to be tested is located outside the vehicle (for example, in a laboratory), power supply 4 uses an external voltage regulator; when the faulty component to be tested is located on the vehicle, the staff can directly carry the faulty component test and analysis equipment on the vehicle for testing, and power supply 4 uses a vehicle-mounted battery to avoid the working environment when connected to the external voltage regulator being inconsistent with the working environment when connected to the vehicle-mounted battery, which leads to test deviation, and facilitates vehicle-mounted road testing / debugging.

[0061] Optionally, based on any of the embodiments disclosed above, see Figure 4 The second communication interface of the control module 1 includes: a CAN bus interface and / or at least one voltage acquisition interface ( Figure 4 Only two voltage acquisition interfaces are taken as an example); when the second communication interface of the control module 1 includes a CAN bus interface, the faulty component testing and analysis equipment also includes a CAN PHY, one end of the CAN PHY is connected to the CAN bus interface, and the other end is used to connect to the faulty component under test; one end of the voltage acquisition interface is connected to the control module 1, and the other end is used to connect to the faulty component under test.

[0062] Specifically, when the second communication interface of the control module 1 includes a CAN bus interface, the faulty component under test can communicate with the control module 1 through the CAN bus. The control module 1 can use MCU, FPGA or ASIC, etc., and the signal processed by it is a digital signal. CAN PHY is also called CAN physical layer chip. CAN PHY defines the electrical characteristics, transmission rate and other parameters of the physical layer. It is responsible for converting the digital signal sent by the control module 1 into a differential analog signal, and converting the received analog signal into a digital signal for processing by the control module 1. In addition, when a certain fault occurs in the faulty component under test, an abnormal voltage will appear at the corresponding position point. Collecting and observing the voltage here can realize the test and analysis of the fault, so the second communication interface of the control module 1 may include a voltage acquisition interface.

[0063] Optionally, based on any of the embodiments disclosed above, see Figure 4 , the input and output device 5 includes: a human-computer interaction module and / or a computer.

[0064] When the input / output device 5 includes a human-computer interaction module, the human-computer interaction module is a component of the fault component testing and analysis device. The human-computer interaction module can be a touch screen, or the human-computer interaction module includes a keyboard and a display screen. Figure 4 Only the latter is used as an example.

[0065] Optionally, the keys in the keyboard are matrix keys, that is, the keyboard is a matrix keyboard. Keys are divided into two categories: independent keys and matrix keys. When independent keys are connected to the control module 1, each key needs to occupy an I / O port of the control module 1. If the control module 1 needs more keys, more I / O port resources will be occupied. In order to save I / O port resources, matrix keys can be introduced.

[0066] The principle of matrix keys is to use the switching characteristics of the circuit to arrange multiple keys into a matrix. Each key is connected to a row and a column of circuits. When the user presses a key, the circuits of the corresponding row and column will be turned on, thereby generating a unique signal, which can be recognized by the microcontroller and perform corresponding operations. Taking the 4×4 matrix keys as an example, each row connects one end of each key in the row to form a row line, and each column connects the other end of each key in the column to form a column line. In this way, there are 4 rows and 4 columns with a total of 8 lines. These 8 lines are connected to the 8 I / O ports of the control module 1. The status of 16 keys can be identified and controlled by scanning the keyboard through the program, thereby saving 8 I / O ports compared to independent keys.

[0067] Optionally, the display screen is recommended to use an OLED display screen. OLED display technology is different from traditional LCD display methods. It does not require a backlight, but uses a very thin organic material coating and a glass substrate (or a flexible organic substrate). When current passes through, these organic materials will emit light; OLED displays can be made lighter and thinner, have a larger viewing angle, and can significantly save power consumption.

[0068] When the input-output device 5 includes a computer, the first communication interface of the control module 1 includes a first UART interface and / or a second UART interface; one end of the first UART interface is connected to the control module 1, and the other end is used to access the computer, so as to realize UART communication between the computer and the control module 1; when the first communication interface of the control module 1 includes a second UART interface, the fault component testing and analysis device also includes a USB to UART chip, one end of the USB to UART chip is connected to the second UART interface, and the other end is connected to the first USB interface of the computer, at which time the computer and the control module 1 can communicate via USB to UART.

[0069] Optionally, based on the previous embodiment, still refer to Figure 4, the power supply end of the control module 1 is also used to connect to the second USB interface of the computer, and the computer can provide the debugging voltage to the control module 1 through the second USB interface. When there is no second USB interface, for the control module 1, the power conversion module 2 is used to provide the working voltage to the control module 1 in the test phase, and is also used to provide the debugging voltage to the control module 1 in the debugging phase; after the second USB interface is introduced, for the control module 1, the power conversion module 2 can only be used to provide the working voltage to the control module 1 in the test phase, and the second USB interface provides the debugging voltage to the control module 1 in the debugging phase, and the debugging voltage is generally 5 volts.

[0070] Optionally, based on any of the above disclosed embodiments, in order to facilitate the fault component testing and analysis equipment and external equipment (such as Figure 4 The connection of the power supply 4, the faulty part under test, and the computer, etc., can be set up in the faulty part test and analysis equipment with corresponding connectors. The connectors are also called connectors. When the faulty part test and analysis is required, the interface of the external device can be directly inserted into the connector of the faulty part test and analysis equipment. The use of connectors can simplify the assembly process of electronic products. Figure 4 Taking the scheme shown as an example, the connectors of the fault component testing and analysis equipment include:

[0071] Power connector: used to plug in the power supply 4 to achieve the connection between the power supply 4 and the power supply end of the internal electrical components of the fault component testing and analysis equipment;

[0072] USB connector: used to plug into the computer to achieve the connection between the computer and the USB to UART chip, and to achieve the connection between the power supply end of the control module 1 and the computer;

[0073] UART connector: used to plug into the computer to achieve the connection between the first UART interface of the control module 1 and the computer;

[0074] High-drive connector: used to plug in the faulty part under test to achieve the connection between the faulty part under test and the high-drive circuit;

[0075] Low-drive connector: used to plug in the faulty part under test to achieve the connection between the faulty part under test and the low-drive circuit;

[0076] Input acquisition connector 1: used to plug in the faulty part under test, to achieve the connection between a voltage sampling point of the faulty part under test and a voltage acquisition interface of the control module 1;

[0077] Input acquisition connector 2: used to plug in the faulty component under test to achieve connection between another voltage sampling point of the faulty component under test and another voltage acquisition interface of the control module 1;

[0078] CAN connector: used to plug in the faulty part under test to achieve the connection between the faulty part under test and the CAN bus interface of the control module 1.

[0079] Optionally, in any of the above disclosed embodiments, in terms of chip model selection, the control module 1 may use Renesas's R7F7016953, such as Figure 5 shown.

[0080] Optionally, in any of the above disclosed embodiments including CAN PHY, see Figure 5 In terms of chip model selection, CAN PHY can use TCAN1042.

[0081] Optionally, in any of the above disclosed embodiments including a USB to UART chip, see Figure 5 In terms of chip model selection, the USB to UART chip can use CH340E.

[0082] Optionally, in any of the above disclosed embodiments, still refer to Figure 5 In terms of chip model selection, the power conversion module 2 can use LM46000; the maximum input voltage of LM46000 is 60 volts, which can be directly connected to a 24 volt vehicle battery.

[0083] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other and will not be described in detail.

[0084] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the embodiments of the present invention. Therefore, the embodiments of the present invention will not be limited to the embodiments shown herein, but will conform to the widest range consistent with the principles and novel features disclosed herein.

Claims

1. A fault component testing and analysis device, characterized in that: include: Control module, power conversion module and power on and off control module; The input end of the power conversion module is used to connect to the power supply, and the output end is connected to the power supply end of the electrical components inside the fault component testing and analysis equipment; the power conversion module is used to convert the power supply voltage into the voltage required for the electrical components to work; The power-on and power-off control module has an input end, an output end and a controller, wherein the input end is used to connect to the power supply, the output end is used to connect to the faulty component under test, and the control end is connected to the control module; the power-on and power-off control module is used to adjust the power-on and power-off frequency and the power-on and power-off slope of the faulty component under test under the control of the control module; The first communication interface of the control module is used to access the input and output device, and the second communication interface of the control module is used to access the faulty component under test.

2. The fault component testing and analysis equipment according to claim 1, characterized in that: The power-on and power-off control module includes: z integration circuits, x high drive circuits and y low drive circuits; x≥1, y≥1, z≥1; Wherein, the output end of each integration circuit is correspondingly connected to a high drive circuit and / or a low drive circuit, and each high drive circuit and each low drive circuit has a unique integration circuit correspondingly connected thereto; The input ends of each high drive circuit and each low drive circuit are connected together as the input end of the upper and lower power control module, the output ends of the x high drive circuits and the y low drive circuits serve as the x+y output ends of the upper and lower power control module, and the input ends of the z integration circuits serve as the z control ends of the upper and lower power control module.

3. The fault component testing and analysis equipment according to claim 2, characterized in that: z=2, x=y=1.

4. The fault component testing and analysis equipment according to any one of claims 1 to 3, characterized in that: The power source includes a vehicle-mounted battery or an external voltage-stabilizing source.

5. The fault component testing and analysis equipment according to any one of claims 1 to 3, characterized in that: The second communication interface includes: a CAN bus interface and / or at least one voltage acquisition interface; When the second communication interface includes a CAN bus interface, the faulty component testing and analysis device further includes a CAN physical layer chip; one end of the CAN physical layer chip is connected to the CAN bus interface, and the other end is used to connect to the faulty component under test.

6. The fault component testing and analysis equipment according to any one of claims 1 to 3, characterized in that: The input and output devices include: a human-computer interaction module and / or a computer; When the input-output device includes a human-computer interaction module, the human-computer interaction module is a component of the fault component testing and analysis device; When the input-output device includes a computer, the first communication interface includes a first universal asynchronous receiver-transmitter UART interface and / or a second UART interface; When the first communication interface includes a second UART interface, the faulty component testing and analyzing device further includes a USB to UART chip, one end of the USB to UART chip is connected to the second UART interface, and the other end is connected to the first USB interface of the computer.

7. The fault component testing and analysis equipment according to claim 6, characterized in that: The power supply end of the control module is also used to access the second USB interface of the computer.

8. The fault component testing and analysis equipment according to claim 6, characterized in that: The human-computer interaction module includes a touch screen, or the human-computer interaction module includes a keyboard and a display screen.

9. The fault component testing and analysis equipment according to claim 8, characterized in that: The keyboard is a matrix keyboard.

10. The faulty component testing and analysis equipment according to any one of claims 1 to 3, characterized in that: The fault component testing and analyzing device has a connector, which is connected to an external device via the connector.