Flatness and parallelism testing fixture for valve plate

By designing the planeness parallelism detector of the distribution disk, using supporting support components, digital display multimeters and lever micrometers, the problems of complex detection operations, low efficiency and accuracy deviation in the prior art are solved, and efficient and accurate planarity and parallelism detection are achieved.

CN222926146UActive Publication Date: 2025-05-30WUHAN FANZHOU ZHONGYUE ALLOY MATERIALS CO LTD
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Patent Information

Application Number
CN202422031599.7
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-20
Publication Date
2025-05-30
Estimated Expiration
2034-08-20

AI Technical Summary

Technical Problem

The planarity and parallelism detection of existing distribution disk products is complex and cumbersome, with low efficiency and prone to accuracy deviations.

Method used

A distribution disk flatness parallelism detector is designed, including a clamping support assembly, a flatness detection assembly and a parallelism detection assembly. The clamping support assembly is used to fix the product to be tested through a reference plate and a V-shaped positioning block. The planarity detection assembly is used to detect using a digital multimeter and a ruby ​​probe. The parallelism detection assembly is used to detect using a lever micrometer and a universal joint support arm.

Benefits of technology

The detection operation is simplified, the detection efficiency is improved, and the accuracy deviation is reduced. A detection tool can perform planarity and parallelism detection at the same time.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a valve plate planeness and parallelism testing fixture, which relates to the field of valve plate product planeness and parallelism detection, and comprises a clamping and supporting assembly, the clamping and supporting assembly comprises a reference flat plate and a V-shaped positioning block, and the V-shaped positioning block is slidably arranged on the surface of the reference flat plate; the flatness detection assembly comprises a digital display dial gauge, the digital display dial gauge is arranged on the reference flat plate, and a flatness detection head of the digital display dial gauge penetrates out of the top surface of the reference flat plate; the parallelism detection device comprises a reference flat plate and a parallelism detection assembly, the parallelism detection assembly comprises a lever dial indicator, the lever dial indicator is arranged on the reference flat plate, operation is simple, one detection tool can detect parallelism and flatness, and the problems that the number of operation steps is large, efficiency is low, and precision deviation is prone to occurring are solved.
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Description

Technical Field

[0001] The utility model relates to the field of detecting the flatness and parallelism of a port plate product, and particularly relates to a flatness and parallelism detector for a port plate. Background Art

[0002] At present, the flatness and parallelism of port plate products are detected by a three-coordinate measuring machine and an optical flatness meter. The detection personnel need to hold the port plate product and perform multi-directional detection on it. The operation is complex and the process is rather cumbersome. Moreover, due to the large number of operation steps, the efficiency is low and accuracy deviation is likely to occur. Summary of the Utility Model

[0003] This application provides a flatness and parallelism detector for a port plate, which can solve the technical problems of a large number of operation steps, low efficiency and easy occurrence of accuracy deviation existing in the prior art.

[0004] In a first aspect, an embodiment of this application provides a flatness and parallelism detector for a port plate, which includes:

[0005] A clamping and supporting assembly, the clamping and supporting assembly includes a reference flat plate and a V-shaped positioning block, and the V-shaped positioning block is slidably arranged on the surface of the reference flat plate;

[0006] A flatness detection assembly, the flatness detection assembly includes a digital display micrometer, the digital display micrometer is arranged on the reference flat plate, and the flatness detection head of the digital display micrometer penetrates out from the top surface of the reference flat plate;

[0007] And a parallelism detection assembly, the parallelism detection assembly includes a lever micrometer, and the lever micrometer is arranged on the reference flat plate.

[0008] By adopting the above technical solution, during the detection process of the port plate product, the top surface of the reference flat plate is used to place the product to be detected. The V-shaped positioning block is slidably arranged on the reference flat plate, and the groove part of the V-shaped positioning block can clamp the product to be detected on the reference flat plate to assist the detection personnel in fixing the product to be detected; the digital display micrometer is fixed on the reference flat plate, and the flatness detection head of the digital display micrometer penetrates out from the top surface of the reference flat plate, so that when the product to be detected is placed on the reference flat plate, the flatness detection head of the digital display micrometer can be pressed down by gravity, and then subsequent flatness detection can be carried out; when detecting the parallelism of the product to be detected, the detection head of the lever micrometer is abutted against the surface of the product to be detected, and the detection head of the lever micrometer is retracted tightly by the surface of the product to be detected. The detection personnel hold the product to be detected by hand, so that the product to be detected rotates on the reference flat plate, and the detection head of the lever micrometer makes a relative circular motion on the surface of the product to be detected, and then the parallelism data of the product to be detected can be measured. The operation is simple, and one detector can perform two detections of parallelism and flatness, solving the problems of a large number of operation steps, low efficiency and easy occurrence of accuracy deviation.

[0009] In one embodiment, the reference flat plate is made of steel structure material.

[0010] By adopting the above technical solution, it has higher strength and good anti-deformation ability, can maintain the horizontal state of the surface of the reference flat plate for a long time, and extends the service life.

[0011] In one embodiment, the V-shaped positioning block is arranged on the reference flat plate through a magnet.

[0012] By adopting the above technical solution, the possibility of the V-shaped positioning block slipping on the reference flat plate is reduced, the influence of external force on the temporary position fixing of the V-shaped positioning block is reduced, so that the V-shaped positioning block can be more stably fixed on the reference flat plate.

[0013] In one embodiment, the flatness probe uses a ruby probe.

[0014] By adopting the above technical solution, the ruby probe has higher strength. Since the flatness detection needs to be carried out by pressing, using a ruby probe with higher quality and strength can extend the service life and reduce the maintenance and replacement frequency of the flatness probe.

[0015] In one embodiment, the parallelism detection assembly further includes:

[0016] A micrometer angle adjusting bracket, the micrometer angle adjusting bracket is arranged on the reference flat plate, and the lever micrometer is arranged on the micrometer angle adjusting bracket.

[0017] By adopting the above technical solution, the lever micrometer is installed on the reference flat plate through the micrometer angle adjusting bracket, so that the detection personnel can adjust the position where the probe of the lever micrometer abuts against the surface of the product to be measured during the detection process.

[0018] In one embodiment, the micrometer angle adjusting bracket is arranged as a universal joint support arm, one end of the universal joint support arm is fixed on the reference flat plate, and the lever micrometer is arranged at the end of the universal joint away from the reference flat plate.

[0019] By adopting the above technical solution, when detecting the parallelism, the detection personnel can directly bend the universal joint support arm to change the position of the probe of the lever micrometer and keep the probe of the lever micrometer in contact with the upper surface of the product to be measured to adapt to products to be measured with different thickness dimensions.

[0020] In one embodiment, a support assembly is arranged below the reference flat plate.

[0021] By adopting the above technical solution, the reference flat plate is stably supported, making it more convenient to use.

[0022] In one embodiment, the support assembly includes a plurality of support legs fixed to the bottom of the reference flat plate.

[0023] By adopting the above technical solution, the reference flat plate can be stably supported, reducing the possibility of the reference flat plate shaking during the detection process. The structure is simple and the installation is convenient.

[0024] In one embodiment, the digital display micrometer is fixed to the reference flat plate by bolts.

[0025] By adopting the above technical solution, the structure is simple and the installation is convenient.

[0026] In one embodiment, a plurality of parallel anti-slip grooves are spaced apart on the reference flat plate.

[0027] By adopting the above technical solution, the possibility of the product to be measured slipping on the reference flat plate can be reduced, making it more convenient to use.

[0028] The beneficial effects brought by the technical solution provided by the embodiment of the present application include:

[0029] By slidably mounting a V-shaped positioning block on the reference flat plate and using the groove of the V-shaped positioning block to clamp the product to be measured, the position of the product to be measured on the reference flat plate can be adjusted by sliding the V-shaped positioning block on the reference flat plate, so that the product to be measured can press the flatness probe on the reference flat plate. When the inspector detects the flatness of the product to be measured, the V-shaped positioning block is used to fix the position of the product to be measured. The product to be measured presses the flatness probe downward under the influence of gravity. The inspector can hold the product to be measured and rotate the product to be measured on the reference flat plate to perform the flatness detection; by abutting the probe of the lever micrometer against the upward surface of the product to be measured, the parallelism detection can be performed. The operation is simple, and a measuring tool can perform two detections of parallelism and flatness, solving the problems of more operation steps, lower efficiency and easy accuracy deviation. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0031] Figure 1 It is a schematic diagram of the overall structure of a flow distribution plate flatness and parallelism measuring tool in the present application;

[0032] In the figure: 1. Reference flat plate; 2. V-shaped positioning block; 3. Lever dial indicator; 4. Universal joint support arm; 5. Support leg; 6. Digital display micrometer; 7. Flatness probe head. Specific implementation manner

[0033] In order to enable those skilled in the art of this technology to better understand the solution of this application, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of this application.

[0034] The embodiment of this application provides a flow distribution plate flatness and parallelism inspection tool, which can solve the problems of more operation steps, lower efficiency and easy occurrence of precision deviation in the prior art.

[0035] Refer to Figure 1 The overall structural schematic diagram of a flow distribution plate flatness and parallelism inspection tool in this application. A flow distribution plate flatness and parallelism inspection tool disclosed in this application includes a clamping and supporting component, a flatness detection component and a parallelism detection component. The clamping and supporting component includes a reference flat plate 1 and a V-shaped positioning block 2. During the detection process of the flow distribution plate product, the top surface of the reference flat plate 1 is used to place the product to be measured. The V-shaped positioning block 2 is slidably arranged on the reference flat plate 1. The groove part of the V-shaped positioning block 2 can clamp the product to be measured on the reference flat plate 1 to assist the inspector to fix the product to be measured; the flatness detection component includes a digital display micrometer 6. The digital display micrometer 6 is fixed on the reference flat plate 1, and the flatness detection head of the digital display micrometer 6 passes through the top surface of the reference flat plate 1, so that when the product to be measured is placed on the reference flat plate 1, it can press down the flatness probe head 7 of the digital display micrometer 6 by gravity, and then perform subsequent flatness detection; the parallelism detection component includes a lever dial indicator 3. The lever dial indicator 3 is arranged on the reference flat plate 1. When detecting the parallelism of the product to be measured, the probe head of the lever dial indicator 3 is in contact with the surface of the product to be measured, and the probe head of the lever dial indicator 3 is retracted by being pressed tightly by the surface of the product to be measured. The inspector holds the product to be measured by hand, so that the product to be measured rotates on the reference flat plate 1, and the probe head of the lever dial indicator 3 makes a relative circular motion on the surface of the product to be measured, and the parallelism data of the product to be measured can be measured. The operation is simple, and an inspection tool can perform two detections of parallelism and flatness, solving the problems of more operation steps, lower efficiency and easy occurrence of precision deviation.

[0036] In this embodiment, the reference flat plate 1 is made of steel structure material, specifically No. 45 steel, which has higher strength and good anti-deformation ability, can maintain the horizontal state of the surface of the reference flat plate 1 for a long time, and prolong the service life. In order to reduce the possibility of the V-shaped positioning block 2 slipping on the reference flat plate 1, the V-shaped positioning block 2 is adsorbed on the reference flat plate 1 by a magnet to reduce the influence of external force on the position of the V-shaped positioning block 2, so that the tester can move the V-shaped positioning block 2 and temporarily fix the V-shaped positioning block 2 stably on the reference flat plate 1 at the same time; a plurality of anti-slip grooves are also spaced along the length direction of the reference flat plate 1 on the surface of the reference flat plate 1, and the edges of the anti-slip grooves are all rounded, so as to reduce the possibility of the product to be tested slipping on the reference flat plate 1 and protect the surface of the product to be tested in contact with the reference flat plate 1, making it more convenient to use.

[0037] Refer to Figure 1 Refer to the overall structural schematic diagram of a flow distribution plate flatness and parallelism gauge in this application. The digital display micrometer 6 is specifically fixed at the bottom of the reference flat plate 1 by bolts, with a simple structure and convenient installation. The flatness probe 7 passes through from the bottom of the reference flat plate 1 and passes out from the top surface of the reference flat plate 1. In order to further facilitate the installation of the digital display micrometer 6, a support assembly is also provided below the reference flat plate 1 to stably support the reference flat plate 1, making it more convenient to use. The support assembly includes a plurality of support legs 5 fixed at the bottom of the reference flat plate 1. In this embodiment, specifically four support legs 5 are provided, and the tops of the four support legs 5 are all installed at the four corners of the bottom of the reference flat plate 1 by bolts to stably support the reference flat plate 1 and reduce the possibility of the reference flat plate 1 shaking during the detection process.

[0038] In this embodiment, the flatness probe 7 is specifically a ruby probe, which has higher strength. Since the flatness detection needs to be carried out by pressing, using a ruby probe with higher quality and strength can prolong the service life and reduce the maintenance and replacement frequency of the flatness probe 7.

[0039] When testing the flatness of the distribution plate, the inspector places the product to be tested flat on the reference plate 1. The product to be tested presses the flatness probe 7 to be flush with the reference plate 1 and activates the digital micrometer 6. The inspector uses the V-shaped positioning block 2 to clamp the upper part of the product to be tested, and pushes the product to be tested to a position convenient for the inspector to operate, always keeping the flatness probe 7 in a compressed state. After clearing the digital micrometer 6, the inspector holds the product to be tested by hand, and rotates the product to be tested with the help of the V-shaped positioning block 2, so that the product to be tested is close to the reference plane and rotates in a circle, and records the maximum and minimum runout values. After recording the data, slide the V-shaped positioning block 2 so that the product to be tested moves with the V-shaped positioning block 2 to change the contact position between the product to be tested and the flatness probe 7, and then hold the product to be tested by hand to rotate, and record the maximum and minimum runout values. The difference between the maximum and minimum values ​​in the final data is the flatness of the product to be tested.

[0040] The parallelism detection assembly also includes a micrometer angle adjustment frame, and the lever micrometer 3 is installed on the reference plate 1 through the micrometer angle adjustment frame, so that the detection personnel can adjust the position of the lever micrometer 3 abutting against the surface of the product to be tested during the detection process. In this embodiment, the micrometer angle adjustment frame is set as a universal joint support arm 4, one end of the universal joint support arm 4 is fixed to the reference plate 1 by bolts, and the lever micrometer 3 is fixed to the end of the universal joint support arm 4 away from the reference plate 1 by bolts. When performing parallelism detection, the detection personnel can directly bend the universal joint support arm 4 to change the position of the probe of the lever micrometer 3, and keep the probe of the lever micrometer 3 abutting against the upper surface of the product to be tested, so as to adapt to the products to be tested with different thicknesses.

[0041] When testing the parallelism of the distribution plate, the specific operating steps are the same as those for the flatness of the distribution plate. The difference is that the testing surface for the flatness of the distribution plate is the bottom surface where the product to be tested abuts against the reference plate 1, and the testing surface for the parallelism of the distribution plate is the top surface of the product to be tested on the reference plate 1. The parallelism and flatness tests of the distribution plate do not interfere with each other, and the two tests can be performed separately according to the needs of the testers. The testers can also be added to simultaneously record the data of the digital micrometer 6 and the lever micrometer 3 to simultaneously perform the two tests of the flatness and parallelism of the distribution plate.

[0042] In the description of the present application, it should be noted that the orientation or positional relationship indicated by terms such as "upper" and "lower" is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present application. Unless otherwise clearly specified and defined, the terms "installed", "connected" and "coupled" shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection or an integral connection; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0043] It should be noted that in the present application, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprising", "including" or any other variation thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising one..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the said element.

[0044] The above are only specific embodiments of the present application, enabling those skilled in the art to understand or implement the present application. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A flatness and parallelism inspection tool for a distribution plate, characterized in that: It includes: A clamping support assembly, the clamping support assembly comprising a reference plate (1) and a V-shaped positioning block (2), the V-shaped positioning block (2) being slidably arranged on the surface of the reference plate (1); A flatness detection component, the flatness detection component comprising a digital micrometer (6), the digital micrometer (6) being arranged on the reference plate (1), and the flatness detection head (7) of the digital micrometer (6) protruding from the top surface of the reference plate (1); And, a parallelism detection component, the parallelism detection component comprises a lever micrometer (3), and the lever micrometer (3) is arranged on the reference plate (1).

2. A valve plate flatness and parallelism inspection tool according to claim 1, characterized in that: The reference plate (1) is made of steel structural material.

3. A valve plate flatness and parallelism inspection tool according to claim 2, characterized in that: The V-shaped positioning block (2) is arranged on the reference plate (1) via a magnet.

4. A valve plate flatness and parallelism inspection tool according to claim 1, characterized in that: The flatness detection head (7) uses a ruby ​​probe.

5. A valve plate flatness and parallelism inspection tool according to claim 1, characterized in that: The parallelism detection component also includes: A dial gauge angle adjustment frame, wherein the dial gauge angle adjustment frame is arranged on the reference plate (1), and the lever dial gauge (3) is arranged on the dial gauge angle adjustment frame.

6. A valve plate flatness and parallelism inspection tool according to claim 5, characterized in that: The micrometer angle adjustment frame is arranged as a universal joint support arm (4), one end of the universal joint support arm (4) is fixed on the reference plate (1), and the lever micrometer (3) is arranged at one end of the universal joint away from the reference plate (1).

7. A valve plate flatness and parallelism inspection tool according to claim 1, characterized in that: A supporting assembly is arranged below the reference plate (1).

8. A fixture for checking the flatness and parallelism of a valve plate according to claim 7, characterized in that: The support assembly comprises a plurality of support legs (5) fixed to the bottom of the reference plate (1).

9. A valve plate flatness and parallelism inspection tool according to claim 1, characterized in that: The digital multimeter (6) is fixed on the reference plate (1) by means of bolts.

10. A valve plate flatness and parallelism inspection tool according to claim 1, characterized in that: The reference plate (1) is provided with a plurality of mutually parallel anti-slip grooves spaced apart from each other.