Atomic force microscope probe clamp device universal for multiple environmental atmospheres
By designing a universal atomic force microscope probe clip with a two-stage structure and a removable quartz baffle, the existing probe clip has poor versatility in liquid and large atmospheres, achieving high-resolution imaging and expanding the test range, reducing processing and maintenance costs.
Patent Information
- Application Number
- CN202421347871.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-13
- Publication Date
- 2025-07-01
- Estimated Expiration
- 2034-06-13
AI Technical Summary
The probe clips of existing atomic force microscopes are poorly versatile in liquids and large atmospheres, and are difficult to process, costly and easily damaged, and cannot meet the needs of high-resolution imaging and expanding the test range in multiple environments.
A multi-environmental atmosphere universal atomic force microscope probe clip is designed, adopting a two-stage structure of the main body and a removable quartz baffle. The main body is a hollow conical, special-shaped processing part with a slot. The quartz baffle is removably connected, combined with stainless steel metal clips, suitable for testing of liquid and atmospheric environments.
High-resolution imaging in different environments is achieved, the testing range is expanded, processing difficulty and maintenance costs are reduced, overall scrapping is avoided due to damage, and the testing accuracy and operability are improved.
Smart Images
Figure CN223051353U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of atomic force microscopes, and particularly to a probe holder device for a multi-environment general atomic force microscope. Background Art
[0002] The atomic force microscope (AFM) was invented in 1986 and won the Nobel Prize in Physics. It can work in atmospheres such as air and liquid. By means of a micro-nano scale probe and the optical lever principle, it is a precision large-scale device for achieving high-resolution characterization at the sub-nanometer level. It can not only perform two-dimensional and three-dimensional microscopic morphology characterization on the surfaces of biological and material samples, but also use different modes to achieve the characterization of nano-mechanical and electromagnetic properties. It is one of the essential characterization means in biological fields (such as cells, tissues, etc.), materials science, and industrial fields such as semiconductors.
[0003] Existing atomic force microscopes can be mainly divided into two types: material type and biological type, according to different test targets. Among them, biological atomic force microscopes are mainly designed and manufactured according to samples in a liquid environment, such as living cells, tissues, proteins, etc., and are more proficient in the underwater test mode; material type atomic force microscopes are mainly designed and manufactured according to samples in the atmosphere or a certain gas atmosphere (referred to as the atmospheric atmosphere). In these two different atmospheres, due to different media, different physical properties of the test targets, different types of probes, probe movement modes, the structure of the probe holder, and the details of the optical path are required during testing. Among them, the probe holder is one of the core components. The probe holder is the only component in the entire atomic force microscope system that directly contacts the probe. It needs to hold the probe in a proper manner and minimize the influence on the laser feedback to ensure the sensitivity of the feedback and achieve high-resolution characterization. According to the optical lever principle of the atomic force microscope, the laser used for feedback needs to pass through the probe holder, hit the probe cantilever beam, and then be reflected to the quadrant photodetector. The cantilever beam with the probe tip is subjected to different forces, resulting in different bending amounts, and different laser reflection positions. After photoelectric conversion, nano-scale morphology, force, and electrical characterization are obtained. The laser needs to propagate in the test environmental medium. As a part of the optical path, according to different test environmental media, the existing liquid and atmospheric probe holders mainly have the following characteristics and problems:
[0004] Liquid atmosphere probe holder: 1. Difficult to process, high cost, and impossible to repair. Even a slight scratch will render the whole probe holder scrapped. In order not to block the laser, the probe holder needs to be made of a material with high transmittance, which can not only transmit light but also prevent liquid from penetrating and splashing into the scanning head, causing short circuits and damage. Especially for culture media or salt solutions, the deposits after drying will corrode important components. Usually, a solid flat-round probe holder made of quartz by integral processing is used. Quartz is hard and brittle. The groove part belongs to special-shaped processing, and the light-transmitting part needs precise polishing to ensure the transmittance. The processing difficulty is great, and it is difficult to process in China. The integral quartz probe holder mainly depends on foreign original manufacturers, and the price is expensive, reaching tens of thousands of yuan. And during the use process, if not careful, a bump will cause cracking and scratching, especially for the light-transmitting part. Once there is a little wear and the original transmittance is lost, the probe holder will be scrapped and cannot be repaired. 2. The diving depth is insufficient, and the test is restricted. The flat-round probe holder has an insufficient diving depth. For cells and tissues cultured in liquid, if the distance from the liquid surface is slightly large (deeper), it cannot be touched and tested. If the liquid is reduced to make the liquid surface shallower, during the test, the liquid will continuously volatilize, and replenishing the liquid will destroy the stable state of the liquid environment and may contaminate the scanning head if not careful. 3. It is difficult to use the liquid probe holder in the atmosphere, and the versatility is poor. When the liquid probe holder is used in the atmosphere, the top optical microscope needs to initially observe and lock the target through the quartz probe holder, and then the atomic force probe is used to further image. However, this quartz with a certain thickness will cause loss of visible light transmittance, seriously affecting the clarity, and it is very difficult to find the target.
[0005] Atmosphere probe holder: Generally, it is a circuit board or a metal sheet. The probe is fixed in the middle hollow part. For the sheet-shaped probe holder, the liquid will enter the scanning head through the hollow part, submerge the piezoelectric ceramic, resulting in equipment damage and cannot be used in liquid.
[0006] Therefore, there is an urgent need for a probe holder that is universal in both atmosphere and liquid atmospheres, can significantly improve the imaging resolution in the atmospheric environment, can increase the diving depth under the liquid, expand the test range, and has the advantages of being easy to process, low cost, easy to maintain and repair, and no longer relying on expensive accessories from foreign original manufacturers. Summary of the Utility Model
[0007] In view of the above-mentioned technical problems, a multi-environment atmosphere universal atomic force microscope probe holder device is provided, which can significantly improve the resolution of equipment in the atmospheric environment, can increase the diving depth under the liquid, expand the test range, and has the advantages of being easy to process, low cost, and easy to maintain and repair.
[0008] The technical means adopted by the present utility model are as follows:
[0009] A multi-environment atmosphere general atomic force microscope probe holder device, comprising: a main body and a quartz baffle, the quartz baffle is detachably connected to the lower end of the main body, a through conical cavity is opened in the main body from top to bottom, and the conical cavity tapers from top to bottom;
[0010] The upper end of the main body is embedded in the scanning head, the upper side of the main body is fixedly installed with the scanning head, a stainless steel metal clip is installed on one side below the main body, and the lower part of the stainless steel metal clip is used to press the atomic force probe.
[0011] Further, the main body is a special-shaped processed part, including a first structure, a second structure, a third structure and a fourth structure coaxially connected in sequence from top to bottom. The first structure is embedded in the scanning head, and both sides of the second structure are installed and connected with the scanning head. The third structure is a position for hand pinching, the quartz baffle is detachably connected to the lower end of the fourth structure, and one end of the stainless steel metal clip is fixedly connected to the side of the fourth structure, and the other end is used to press the atomic force probe;
[0012] First through holes, second through holes, third through holes and fourth through holes are respectively opened inside the first structure, the second structure, the third structure and the fourth structure, and the first through holes, the second through holes, the third through holes and the fourth through holes are connected in sequence to form the conical cavity.
[0013] Further, the first structure is a regular circular ring structure with a flat upper wide opening.
[0014] Further, the second structure is a regular circular ring protruding part with a radius larger than that of the first structure, and bayonets are arranged on both sides of the second structure, and the bayonets are used to be stuck in the corresponding slots on the scanning head during installation.
[0015] Further, the third structure is a cylindrical structure with a diameter smaller than that of the second structure, and the outer surface of the third structure is frosted.
[0016] Further, the fourth structure is a conical structure with an outer diameter smaller than that of the third structure, and the tapering direction of the conical structure is the same as that of the conical cavity; an opening is opened at the lower end of the fourth structure, and the edge of the opening is flush.
[0017] Further, the quartz baffle is in a circular structure, and its outer diameter is consistent with the outer extension of the lower end of the fourth structure; the quartz baffle is detachably connected to the narrow opening at the lower end of the fourth structure through AB glue.
[0018] Further, one end of the stainless steel metal clip, the long end, is fixed on the fourth structure of the main body by a screw, and the other end is provided with a snap spring, and the atomic force probe is pressed by the snap spring, and the surface where the atomic force probe is fixed forms an angle of 15° with the main body.
[0019] Furthermore, the main body is an integrally formed structure, and the material is a polymer material or a stainless steel material.
[0020] The present utility model also provides a method for using a multi-environment atmosphere universal atomic force microscope probe holder device, including the following steps:
[0021] S1. When testing in a liquid, evenly apply an appropriate amount of AB glue to the edge of the narrow end of the fourth structure, and seal and fix the quartz baffle to the fourth structure through the AB glue. After the AB glue is completely dry, the probe holder device can be used for testing in the liquid.
[0022] S2. When testing in the atmosphere, the test can be achieved by either not removing the quartz baffle or directly removing the quartz baffle.
[0023] S3. When testing atomic images, due to the extremely high feedback resolution required for the test target, before use, immerse the entire probe holder device in acetone or ethanol to remove the quartz baffle. This immersion process does not affect the precision polished surface of the quartz baffle and can also clean the precision polished surface. After removing the quartz baffle, the bottom narrow-mouthed hollow of the fourth structure is exposed, so that there is no medium barrier in the feedback laser light path, increasing the feedback resolution, and in the observation light path of the top-mounted optical microscope, the visible light transmittance is high and the field of view is clearer.
[0024] Compared with the prior art, the present utility model has the following advantages:
[0025] 1. The two-stage processing design of the probe holder of the present utility model can meet the test requirements of liquid and atmospheric environments through simple disassembly and assembly, and ensure the test resolution. The two stages are the main body and the light-transmitting baffle. The main body is a special-shaped processed part similar to a hollow cone with a card slot. The probe end has a detachable and precisely polished quartz sheet with high transmittance as the baffle. When testing cells or tissues under the test liquid, installing the baffle can not only prevent the liquid from entering the probe cavity and affecting the microscopic performance of the probe vibration, but also enable the laser to pass through efficiently, improving the imaging resolution. When testing in the atmosphere, removing the quartz sheet baffle further improves the transmittance of the feedback laser of atomic force detection and the feedback visible light of the top-mounted optical microscope in the light path, solving the problems that high-resolution imaging is easily affected and it is difficult to focus on tiny samples. The quartz sheet can be adhered to the hollow part at the narrow end of the main body with commercially available AB glue, and removing the baffle only requires soaking in acetone, which does not damage the accessories and is convenient for replacement.
[0026] 2. The probe clamp of the present utility model adopts a conical design, which can effectively increase the diving depth during liquid atmosphere testing, ensure that cells and biological tissues are tested in a more sufficient culture medium immersion environment, is more conducive to the balance and stability of the liquid environment, avoid the large environmental error caused by insufficient culture medium, and improve the test accuracy. Moreover, it can effectively protect the precision scanning head from liquid splashing or water ingress.
[0027] 3. The probe clamp designed by the present utility model has a conical main body, which is a special-shaped processed part similar to a hollow cone with a card slot, has a low probability of damage, can be used for a long time, and can be made of materials such as ABS material, PLA material, and stainless steel material. The processing difficulty is low and the cost is low; the narrow-end quartz baffle adopts a detachable design, can be processed and precisely polished separately, the manufacturing difficulty is low, which significantly reduces the maintenance and update costs, and avoids the situation of the whole being scrapped due to damage in one place.
[0028] Based on the above reasons, the present utility model can be widely promoted in the fields of atomic force microscopes, etc. Brief Description of the Drawings
[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0030] Figure 1 It is a schematic structural diagram of the present utility model.
[0031] Figure 2 It is a front view of the present utility model.
[0032] Figure 3 It is a side view of the present utility model.
[0033] Figure 4 It is a schematic structural diagram of the present utility model in another direction.
[0034] Figure 5 It is a top view of the present utility model in one direction.
[0035] Figure 6 It is a top view of the present utility model in another direction.
[0036] In the figure: 1. Main body; 11. First structure; 12. Second structure; 13. Bayonet; 14. Third structure; 15. Conical cavity; 16. Fourth structure; 17. Screw; 18. Stainless steel metal clip; 19. Snap spring; 2. Quartz baffle. Detailed Embodiments
[0037] To make the objectives, technical solutions, and advantages of the embodiments of the present utility model clearer, the technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are some, but not all, of the embodiments of the present utility model. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.
[0038] Atomic force microscopy is one of the most important means in existing characterization techniques. Through a probe with micro-nano scale, it can directly "touch" the sample to measure and characterize various properties such as micro-area topography, nano-mechanics, nano-electrics, nano-infrared spectroscopy, and tip-enhanced Raman spectroscopy. Moreover, it can achieve the characterization of the micro-area distribution of elastic modulus covering seven orders of magnitude, and it is also the only technology that can achieve three-dimensional high-resolution imaging and mechanical property characterization of nano-scale, in-situ, and subaqueous biological samples (cells, proteins, etc.). It has powerful functions and plays a crucial role in high-level scientific research and industrial fields such as chemistry, biology, electronic devices, micro-nano processing, and lithography.
[0039] The present utility model provides a multi-environment atmosphere universal atomic force microscope probe holder device, that is, a probe holder for atomic force microscopy suitable for multi-environment atmospheres such as liquid and atmospheric environments (a universal atomic force microscope probe holder for atmospheric and liquid atmospheres). It can significantly improve the imaging resolution in the atmospheric environment, increase the submergence depth under liquid, expand the test range, and has the advantages of being easy to process, low cost, easy to maintain and repair, and no longer relying on expensive accessories from foreign original manufacturers. As the core component of the atomic force microscope, this probe holder can effectively solve problems such as the difficulty in generalizing the probe holder for biological and material atomic force microscopes and the functional defects of existing probe holders, and greatly reduce the processing difficulty and cost, making the operability and producibility significantly enhanced, and being free from the restrictions of expensive accessories from the original imported manufacturers, import permissions, and cycles.
[0040] The probe holder of the present utility model is constructed as follows:
[0041] As Figure 1-2As shown in the figure, the probe clamp is divided into two components: the main body 1 and the quartz baffle 2, which can be combined and disassembled. The main body 1 is a special-shaped processed part similar to a hollow cone with a card slot, including the first structure 11, the second structure 12, the bayonet 13, the third structure 14, the conical cavity 15, the fourth structure 16, the screw 17, and the stainless-steel metal clip 18. The quartz baffle 2 is detachably connected to the lower end of the fourth structure 16. The first structure 11, the second structure 12, the third structure 14, and the fourth structure 16 are connected in sequence from top to bottom. A through conical cavity 15 is opened inside the main body 1 from top to bottom, and the conical cavity 15 tapers from top to bottom. The first through hole, the second through hole, the third through hole, and the fourth through hole are respectively opened inside the first structure 11, the second structure 12, the third structure 14, and the fourth structure 16, and the first through hole, the second through hole, the third through hole, and the fourth through hole are connected in sequence to form the conical cavity 15, and the conical cavity 15 tapers in the direction from the first structure 11 towards the fourth structure 16. The first structure 11, the second structure 12, the third structure 14, and the fourth structure 16 are coaxially arranged.
[0042] The material of the main body 1 can be any polymer material or stainless-steel material with good hardness, etc. The whole presents a hollow cone shape. The first structure 11 is a regular circular ring structure with a flat upper wide opening; the first structure 11 is embedded in the scanning head to further prevent water from entering the scanning head and damaging the precision optoelectronic components; the second structure 12 is a regular circular ring protruding part with a radius larger than that of the first structure 11, and bayonets 13 are provided on both sides for being stuck in the corresponding card slots on the scanning head during installation; the third structure 14 is a cylindrical structure with a diameter slightly smaller than that of the second structure 12, which is the position for hand pinching and can be frosted to increase the friction force for easy finger picking; the fourth structure 16 is a thinner conical structure connecting the third structure 14 (the outer diameter of the fourth structure 16 is smaller than that of the third structure 14), and has the same tapering direction as the conical cavity 15; an opening is opened at the lower end of the fourth structure 16, and the edge of the opening is flush; a stainless-steel metal clip 18 is installed on the fourth structure 16;
[0043] The precision-polished quartz baffle 2 has high light transmittance and is in a circular structure, and its outer diameter is consistent with the lower-end extension of the fourth structure 16; one end of the stainless-steel metal clip 18, the long end, is fixed to the main body 1 with a screw 17 (fixing screw), and the buckle spring piece 19 at the other end can be used to press the atomic force probe. The surface where the probe is fixed forms an angle of 15° with the main body 1. This angle is related to the angle between the central axis of the probe tip and the probe substrate. Through measurement and practical operation experience, it is determined that the angle of 15° formed by the surface where the probe is fixed and the main body 1 is the most suitable.
[0044] During testing, commercially available AB glue can be used. Apply an appropriate amount of AB glue evenly on the edge of the narrow end of the fourth structure 16, and fix the quartz baffle 2 at this position with AB glue. After the AB glue is completely dry, this probe clamp device can be used for testing in liquid. When testing in the atmosphere, it can be directly tested with or without removing the quartz baffle 2. However, when testing atomic images, since the test target requires extremely high feedback resolution, before use, the entire probe clamp can be immersed in acetone or ethanol for a short time, and then the quartz baffle 2 can be easily removed. This not only does not affect the precision polished surface of the quartz baffle 2, but also can clean the precision polished surface. After removing the quartz baffle 2, the bottom narrow-mouthed hollow of the fourth structure 16 is exposed, so that there is no medium barrier in the feedback laser optical path, further increasing the feedback resolution, and in the observation optical path of the top-mounted optical lens, the visible light transmittance is also higher and the field of view is clearer.
[0045] The probe clamp of the present utility model has the following functions:
[0046] 1. The two-stage processing design of this probe clamp can meet the test requirements in liquid and atmospheric environments through simple disassembly and assembly, and ensure the test resolution. The two stages are the main body and the light-transmitting baffle. The main body is a special-shaped processed part similar to a hollow cone with a card slot. The probe end has a detachable, precisely polished quartz sheet with high transmittance as the baffle. When testing cells or tissues under liquid, install the baffle, which can not only prevent liquid from entering the probe cavity and affecting the microscopic performance of the probe vibration, but also enable the laser to pass through efficiently and improve the imaging resolution. When testing in the atmosphere, remove the quartz sheet baffle to further improve the transmittance of the feedback laser of atomic force detection and the feedback visible light of the top-mounted optical microscope in the optical path, and solve the problems that high-resolution imaging is easily affected and it is difficult to focus on small samples. The quartz sheet can be adhered to the hollow part at the narrow end of the main body with commercially available AB glue, and the baffle can be removed only by soaking in acetone, without damaging the accessories and being convenient for replacement.
[0047] 2. The probe clamp adopts a conical design, which can effectively increase the diving depth during liquid atmosphere testing, ensure that cells and biological tissues are tested in a more sufficient culture medium immersion environment, be more conducive to the balance and stability of the liquid environment, avoid the large environmental error caused by insufficient culture medium, and improve the test accuracy. And it can effectively protect the precision scanning head from liquid splashing or water ingress.
[0048] 3. When the atomic force microscope is imaging, the laser needs to be emitted from the scanning head to the tip of the probe micro-nano cantilever beam. The change in the bending of the cantilever beam caused by the change in the sample surface makes the displacement of the laser reflection spot change, and the position change of the spot is detected by the photodetector to achieve nano-scale imaging. Therefore, in the actual operation process, whether the feedback of the laser is sensitive and whether it is blocked during the propagation process are important factors affecting atomic force imaging. Quartz is one of the materials with the best light transmittance. Therefore, the probe holder in the liquid immersion test mode of a certain brand of atomic force microscope manufacturer in Germany, which is the best at cell research in the world, is designed as a cylindrical shape integrally formed with quartz, that is, a whole piece of quartz is processed. The problem with such a design is that when testing in liquid, it is necessary to drive the probe to vibrate (different modes have different vibration modes). The overall area is relatively large, and the vibration causes the fluid to oscillate accordingly, often resulting in significant noise waves, which causes baseline fluctuations or even thermal drift during cell mechanics analysis, and false signals appear during topography characterization, affecting imaging. Moreover, quartz materials are hard and brittle, and the processing of integrally formed quartz parts is difficult. The surface of the quartz through which the laser passes needs to be polished precisely with high precision and at multiple angles, which further increases the difficulty. Currently, only the German original factory can process it, and the price is as high as 100,000 yuan. And during use, the precisely polished quartz surface near the probe cantilever beam and the sample end is extremely vulnerable to wear and easy to be scratched. Once scratched or soiled, it will seriously affect the feedback of visible light and the laser transmittance, resulting in the top optical microscope losing its observation ability or even being unable to perform atomic force imaging. The probe holder designed by the present utility model has a conical-shaped main body. The main body is a special-shaped processed part similar to a hollow cone with a card slot. The probability of damage is small, and it can be used for a long time. It can be made of materials such as ABS material, PLA material, and stainless steel material. The processing difficulty is low and the cost is low. The narrow-end quartz baffle adopts a detachable design, which can be processed and precisely polished separately. The manufacturing difficulty is low, which significantly reduces the maintenance and renewal costs and avoids the current situation of the whole being scrapped due to damage in one place.
[0049] The present utility model can solve the following problems:
[0050] 1. The current situation that existing atomic force microscopes, especially biological atomic force microscopes, lack a probe holder that is universal for liquid immersion and atmospheric atmosphere;
[0051] 2. The current situation that the liquid immersion probe holders of existing atomic force microscopes all have a flat cylindrical shape and the diving depth is not enough to test cells and tissues cultured deeper under the liquid surface.
[0052] The probe holder of the present utility model adopts a two-stage design, namely the main body part (hollow cone part), which is integrally formed with high-quality ABS plastic. The cost is low and the processing difficulty is low. The narrow ends are all made of high-purity quartz material. When used for liquid immersion testing, the quartz sheet can be glued to the narrow end with commercially available conventional AB epoxy resin glue. When used for testing in the atmosphere, the epoxy resin glue can be removed by soaking in acetone, and the quartz sheet can be easily removed.
[0053] Due to the hard and brittle nature of quartz materials, scratches or wear are likely to occur on the quartz seal at the narrow end of the probe clamp, and it is difficult to perform specific processing and precision polishing. The design of the detachable quartz sheet in the present utility model can play a role in blocking the entry of liquid into the cavity, with low processing difficulty, easy to be precisely polished, replaceable, and can effectively solve the situation where the entire probe clamp is scrapped after the quartz sheet is worn.
[0054] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present utility model, rather than to limit it; although the present utility model has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present utility model.
Claims
1. A universal atomic force microscope probe clamp device for multiple environments, characterized in that: include: A main body (1) and a quartz baffle (2), wherein the quartz baffle (2) is detachably connected to the lower end of the main body (1), and a through conical cavity (15) is formed inside the main body (1) from top to bottom, and the conical cavity (15) gradually contracts from top to bottom; The upper end of the main body (1) is embedded in the scanning head, the upper side of the main body (1) is fixedly mounted to the scanning head, and a stainless steel metal clip (18) is installed on one side below the main body (1), and the bottom of the stainless steel metal clip (18) is used to press the atomic force probe.
2. The multi-environment universal atomic force microscope probe clamp device according to claim 1, characterized in that: The main body (1) is a special-shaped processed part, comprising a first structure (11), a second structure (12), a third structure (14) and a fourth structure (16) which are coaxially connected in sequence from top to bottom, the first structure (11) is embedded in the scanning head, the two sides of the second structure (12) are installed and connected to the scanning head, the third structure (14) is a position for hand pinching, the quartz baffle (2) is detachably connected to the lower end of the fourth structure (16), one end of the stainless steel metal clip (18) is fixedly connected to the side of the fourth structure (16), and the other end is used to press the atomic force probe; The first structure (11), the second structure (12), the third structure (14) and the fourth structure (16) are respectively provided with a first through hole, a second through hole, a third through hole and a fourth through hole, and the first through hole, the second through hole, the third through hole and the fourth through hole are sequentially connected to form the conical cavity (15).
3. The multi-environment atmosphere universal atomic force microscope probe clamp device according to claim 2, characterized in that: The first structure (11) is a regular circular ring structure with a wide opening at the upper end being flush.
4. The multi-environment universal atomic force microscope probe clamp device according to claim 2, characterized in that: The second structure (12) is a regular annular protrusion with a radius greater than that of the first structure (11), and bayonet holes (13) are provided on both sides of the second structure (12), and the bayonet holes (13) are used to be clamped in corresponding slots on the scanning head during installation.
5. The multi-environment universal atomic force microscope probe clamp device according to claim 2, characterized in that: The third structure (14) is a cylindrical structure with a diameter smaller than that of the second structure (12), and the outer surface of the third structure (14) is frosted.
6. The multi-environment universal atomic force microscope probe clamp device according to claim 2, characterized in that: The fourth structure (16) is a conical structure with an outer diameter smaller than that of the third structure (14), and the tapering direction of the conical structure is the same as the tapering direction of the conical cavity (15); an opening is formed at the lower end of the fourth structure (16), and the edges of the opening are flush.
7. The multi-environment universal atomic force microscope probe clamp device according to claim 2, characterized in that: The quartz baffle (2) is a circular structure, and its outer diameter is consistent with the outer extension of the lower end of the fourth structure (16); the quartz baffle (2) is detachably connected to the narrow opening at the lower end of the fourth structure (16) by AB glue.
8. The multi-environment universal atomic force microscope probe clamp device according to claim 1, characterized in that: One long end of the stainless steel metal clip (18) is fixed to the fourth structure (16) of the main body (1) by means of a screw (17), and the other end is provided with a snap-on spring sheet (19), which is used to press the atomic force probe, and the surface on which the atomic force probe is fixed is at an angle of 15 degrees to the main body (1).
9. The multi-environment universal atomic force microscope probe clamp device according to claim 1, characterized in that: The main body (1) is an integrally formed structure and is made of a polymer material or stainless steel.