Chip test tool

Abstract

The utility model relates to the field of chip testing tools, in particular to a chip testing tool. The chip is provided with a test area and an electrode area and comprises an upper clamping plate and a lower clamping plate, and a separation film is clamped between the upper clamping plate and the lower clamping plate. The chip is carried in the separation membrane, and the separation membrane is matched with the upper clamping plate to form a channel which enables the test area and the electrode area to be communicated with the outside respectively. The chip is formed by splicing a plurality of layers of structures, and the electrode area and the test area on the chip are isolated through the separation film which is clamped between the upper clamping plate and the lower clamping plate and is made of the rubber material, so that test liquid dripped into the test area cannot spread to the electrode area, and short circuit of the chip in the chip test process is avoided.

Description

Technical Field

[0001] The utility model relates to the field of chip testing tooling, and particularly relates to a chip testing tooling. Background Art

[0002] Some chips for detecting liquid components need to be tested after production to determine whether they are faulty. However, for a chip not installed on a device, the test area for direct contact with the liquid is directly connected to the electrode area for connecting electrodes. Therefore, the liquid dropped on the test area easily spreads to the electrode area, causing a short circuit of the chip. Summary of the Utility Model

[0003] The purpose of the utility model is to provide a chip testing tooling to solve the technical problem in the prior art that the test area and the electrode area of a chip for testing liquid components are directly connected, resulting in the liquid dropped on the test area easily spreading to the electrode area and causing a short circuit of the chip.

[0004] The technical solution of the utility model is: a chip testing tooling, the chip has a test area and an electrode area, including an upper clamping plate and a lower clamping plate, and a separation membrane is clamped between the upper clamping plate and the lower clamping plate; the chip is carried in the separation membrane, and the separation membrane cooperates with the upper clamping plate to construct channels for the test area and the electrode area to communicate with the outside respectively.

[0005] Preferably, the separation membrane is arranged as a double-layer structure that fits together, including a lower diaphragm and an upper diaphragm that are respectively in contact with the upper clamping plate and the lower clamping plate;

[0006] The lower diaphragm has a thickness not less than that of the chip, and a first notch is formed therein, and it cooperates with the lower clamping plate to form a chamber for accommodating the chip;

[0007] The upper diaphragm is provided with a second notch a communicating with the test area, and a second notch b is formed on the upper clamping plate and communicates with the second notch a.

[0008] Preferably, the upper diaphragm is provided with a third notch a corresponding to the electrode area, the upper clamping plate is provided with a third notch b communicating with the third notch a, and the third notch a and the third notch b form a socket for fixing an external wire.

[0009] Preferably, the upper clamping plate and the lower clamping plate are made of a hard insulating material, and the separation membrane is made of a rubber material.

[0010] Preferably, the upper clamping plate, the lower clamping plate and the separation membrane are detachably connected by a fastening member arranged therethrough.

[0011] Preferably, a plurality of the first notches are provided, the second notch a is arranged in a strip structure, and the middle part communicates with the plurality of first notches; the second notch b is formed at the head and tail ends of the second notch a.

[0012] Compared with the prior art, the advantages of the present utility model are as follows:

[0013] (1) This application is formed by splicing multiple layers. The separation film made of rubber material clamped between the upper clamping plate and the lower clamping plate isolates the electrode area and the test area on the chip, so that the test liquid dropped into the test area will not spread to the electrode area, thus avoiding chip short - circuit during the chip test.

[0014] (2) In the second embodiment of this application, the tooling is set as a polygonal structure, so that multiple chips can be accommodated inside. And the second notch a is set as a strip structure in the upper diaphragm, passing through the test areas of multiple chips in sequence. By continuously dropping the test liquid into one second notch b until the test liquid fills the entire second notch a, and at the same time the air in the second notch a escapes from the other second notch b, the test of multiple chips can be completed. Description of the Drawings

[0015] The following further describes the present utility model in conjunction with the drawings and embodiments:

[0016] Figure 1 It is the chip structure diagram of the present utility model;

[0017] Figure 2 It is the structure diagram of a chip test tooling according to the first embodiment of the present utility model;

[0018] Figure 3 It is the exploded view of a chip test tooling according to the first embodiment of the present utility model;

[0019] Figure 4 It is the front view of a chip test tooling according to the second embodiment of the present utility model;

[0020] Figure 5 It is the exploded view of a chip test tooling according to the second embodiment of the present utility model;

[0021] Among them: 1. Lower clamping plate, 2. Lower diaphragm, 3. Upper diaphragm, 4. Upper clamping plate, 5. First notch, 6. Second notch a, 7. Second notch b, 8. Third notch a, 9. Third notch b, 10. Chip, 11. Electrode area, 12. Test area. Detailed Embodiments

[0022] To facilitate the understanding of this application, first, the application scenario of this application is introduced:

[0023] Such as Figure 1As shown, taking the blood glucose test chip 10 as an example, it has a test area 12 and an electrode area 11. Among them, the electrode area 11 is used to connect with an external device to obtain power or transmit signals; the test area 12 is in direct contact with the test substance (blood) and is used to obtain the parameters of the test substance.

[0024] After the chip 10 is manufactured, it needs to be detected to determine whether it is usable. However, at this time, the chip 10 is not loaded on the device, and there is a lack of isolation protection between the test area 12 and the electrode area 11. Therefore, the blood dropped on the test area 12 is likely to overflow into the electrode area 11, causing a short circuit. Therefore, the present application provides a chip test tooling to solve this problem.

[0025] The following will further elaborate on the content of the present utility model in combination with specific embodiments:

[0026] In the first embodiment of the present application, as Figure 2 - Figure 3 shown, a chip test tooling includes an upper clamping plate 4 and a lower clamping plate 1 made of insulating materials such as acrylic. A separation film is clamped between the upper clamping plate 4 and the lower clamping plate 1. The separation film is used to carry the chip 10 to be tested and isolate the test area 12 and the electrode area 11 on the chip 10.

[0027] As shown in the figure, the separation film is set as a double-layer structure that fits together, including an upper diaphragm 3 and a lower diaphragm 2. Among them, the upper diaphragm 3 is attached to the upper clamping plate 4, and the lower diaphragm 2 is attached to the lower clamping plate 1.

[0028] The lower diaphragm 2 is provided with a first notch 5 similar in shape to the chip 10 and cooperates with the lower clamping plate 1 to form a chamber for accommodating the chip 10. The upper diaphragm 3 is provided with a second notch a6 corresponding to the test area 12 of the chip 10 and a third notch a8 corresponding to the electrode area 11 of the chip 10. And the upper clamping plate 4 is provided with a second notch b7 and a third notch b9 that respectively communicate with the second notch a6 and the third notch a8. The channel formed by the third notch a8 and the third notch b9 can be plugged by an external wiring.

[0029] The upper clamping plate 4, the separation film, and the lower clamping plate 1 are tightly connected by fasteners such as bolts and rivets penetratingly provided. The separation film is made of rubber material, and moreover, the lower diaphragm 2 has a thickness slightly higher than that of the chip 10. When the upper clamping plate 4 and the lower clamping plate 1 press the separation film tightly, the upper surface of the lower diaphragm 2 is flush with the upper surface of the chip 10, and the upper diaphragm 3 is in close contact with the chip 10. The part between the second notch a6 and the third notch a8 forms a blocking part for blocking the liquid dropped on the test area 12 from entering the electrode area 11, thereby isolating the test area 12 and the electrode area 11 of the chip 10.

[0030] In the second embodiment of the present application, as Figure 4 - Figure 5As shown, the upper clamping plate 4, the lower clamping plate 1, and the separation membrane are all set as polygonal structures. A plurality of first notches 5 for carrying the chip 10 are provided on the lower diaphragm 2. The second notch a6 is set as a strip structure in the upper diaphragm 3, and the middle of the strip structure communicates with the plurality of first notches 5. The second notch b7 is opened at both the head and the tail ends of the second notch a6. By continuously dripping the test liquid into one of the second notches b7 until the test liquid fills the entire second notch a6, and at the same time the air in the second notch a6 escapes from the other second notch b7, the testing of the plurality of chips 10 can be completed.

[0031] In other embodiments of the present application, the upper diaphragm 3 and the lower diaphragm 2 can also be integrally formed into a single-layer structure.

[0032] During operation:

[0033] 1. Stack and assemble the lower clamping plate 1, the lower diaphragm 2, the chip 10, the upper diaphragm 3, and the upper clamping plate 4 with bolts.

[0034] 2. Insert the wiring of the power supply and the display device into the third notch a8 and the third notch b9, and connect it to the electrode region 11 of the chip 10 to supply power to the chip 10 and display the processing result of the chip 10.

[0035] 3. Drop the corresponding test liquid into the second notch a6 and the second notch b7. Since the test liquid is blocked by the blocking portion of the upper diaphragm 3, it will not flow into the electrode region 11 of the chip 10.

[0036] The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose is to enable those who are familiar with this technology to understand the content of the present invention and implement it accordingly. It cannot be used to limit the protection scope of the present invention. For those skilled in the art, it is obvious that the present invention is not limited to the details of the above exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic characteristics of the present invention. Therefore, no matter from which point of view, the embodiments should be regarded as exemplary and non-limiting. The scope of the present invention is defined by the appended claims rather than the above description. Therefore, it is intended to include all changes falling within the meaning and scope of the equivalent elements of the claims in the present invention.

Claims

1. A chip testing tooling, wherein the chip has a testing area and an electrode area, characterized in that It includes an upper clamping plate and a lower clamping plate, and a separation membrane is clamped between the upper clamping plate and the lower clamping plate; the chip is mounted in the separation membrane, and the separation membrane cooperates with the upper clamping plate to construct channels for the test area and the electrode area to communicate with the outside respectively.

2. The chip testing tooling according to claim 1, characterized in that, The separation membrane is arranged as a double-layer structure that fits together, including a lower diaphragm and an upper diaphragm that are respectively in contact with the upper clamping plate and the lower clamping plate; The lower diaphragm has a thickness not less than that of the chip, and a first notch is formed therein, which cooperates with the lower clamping plate to form a chamber for accommodating the chip; The upper diaphragm is provided with a second notch a communicating with the test area, and the upper clamping plate is provided with a second notch b that communicates with the second notch a.

3. The chip testing tooling according to claim 2, characterized in that, The upper diaphragm is provided with a third notch a corresponding to the electrode area, the upper clamping plate is provided with a third notch b communicating with the third notch a, and the third notch a and the third notch b form a socket for fixing an external wire.

4. A chip testing tooling according to claim 1, characterized in that, The upper clamping plate and the lower clamping plate are made of a hard insulating material, and the separation membrane is made of a rubber material.

5. A chip testing tooling according to claim 1, characterized in that, The upper clamping plate, the lower clamping plate and the separation membrane are detachably connected by a fastener arranged therethrough.

6. The chip testing tooling according to claim 3, characterized in that, The first notch is provided in multiple numbers, the second notch a is arranged in a strip structure, and the middle part communicates with multiple first notches; the second notch b is opened at the head and tail ends of the second notch a.

Images