Resistance test fixture for double-sided conduction film

Abstract

The utility model discloses a resistance test fixture for a double-sided conducting film, which comprises a test machine top plate and a test machine base, an upper test module and a lower test module positioned below the upper test module are arranged below the test machine top plate, and the lower test module is fixed at the top of the test machine base. The upper testing module comprises a jig top plate, the jig top plate is fixedly installed at the bottom of the testing machine top plate, and the bottom of the jig top plate is fixedly connected with a plurality of first supporting rods. The resistance test fixture is simple in overall fixture design structure and low in cost, in addition, the resistance of a plurality of double-sided conduction films can be accurately tested at the same time, a manual semi-automatic test mode is adopted, the test efficiency is obviously improved compared with the prior art, and the test efficiency is greatly improved. And the test resistance probe adopts a compressible spring gold plating round head pressing mode, so that the risk of penetrating and damaging the double-sided conduction film in the test process can be effectively reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of resistance testing jigs, in particular to a resistance testing jig for a double-sided conductive film. Background Art

[0002] There are fewer ways to test the on-resistance of contact-type double-sided conductive film products. The principle is to apply a certain voltage at both ends of the conductor to detect the size of the on-resistance. Common on-resistance testing methods include manual testing and automatic testing. The manual testing method uses digital multimeters, digital bridges and other equipment to detect the on-resistance value, and the automatic test is performed through professional on-resistance testing instruments. The manual testing method has low testing efficiency, and the pressure applied to the film during the test or the use of probes that are not suitable for the test film material can easily cause physical damage or penetrate the film; the automatic testing method requires customization of special equipment, which is expensive and has high cost. Based on the above-mentioned problems of manual testing and automatic testing, this application proposes a resistance testing fixture for double-sided conductive film. Utility Model Content

[0003] The purpose of the utility model is to solve the shortcomings of the prior art and to propose a resistance test fixture for a double-sided conductive film.

[0004] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0005] A resistance test fixture for a double-sided conductive film, comprising a test machine top plate and a test machine base, wherein an upper test module and a lower test module located below the upper test module are provided below the test machine top plate, and the lower test module is fixed to the top of the test machine base, and the upper test module comprises a fixture top plate, which is fixedly mounted on the bottom of the test machine top plate, a plurality of first support rods are fixedly connected to the bottom of the fixture top plate, and the bottom ends of the plurality of first support rods are fixedly connected to the same pressing plate, and the plurality of first support rods are used to support the pressing plate, and a plurality of test resistance probes are embedded in the bottom of the pressing plate, and an upper module connector is fixedly mounted on the top of the pressing plate, and the plurality of test resistance probes are electrically connected to the upper module connector, and two fixture positioning pins are fixedly connected to the bottom of the pressing plate, and the fixture positioning pins are used to position the pressing plate;

[0006] The lower test module includes a fixture base, which is fixedly mounted on the top of the test machine base. A plurality of second support rods are fixedly connected to the top of the fixture base. The top ends of the plurality of second support rods are fixedly connected to the same carrier. The plurality of second support rods are used to support the carrier. The bottom of the carrier is fixedly connected to the lower module connector. The top of the carrier is provided with a plurality of test placement slots. The plurality of test placement slots are aligned one by one with a plurality of test resistance probes. The top of the carrier is fixedly connected with a plurality of product positioning columns. The product positioning columns are arranged on one side of the corresponding test placement slots. A PCB test board electrically connected to the lower module connector is installed in the test placement slot. The principle of performing resistance testing on the double-sided conductive film by cooperating with the lower module connector, the PCB test board, the test resistance probe and the upper module connector is an existing technology and will not be elaborated here.

[0007] Preferably, both sides of the bottom of the test machine top plate are fixedly connected with test machine clamps, and the test machine clamps are clamped and fixed on the fixture top plate. The principle of clamping and fixing the fixture top plate by the test machine clamps is the conventional clamping and fixing method in the prior art.

[0008] Preferably, two positioning holes are provided on the top of the carrier, and the two positioning holes are aligned with the two jig positioning pins one by one, and the positioning holes are used for the corresponding jig positioning pins to penetrate.

[0009] Preferably, a plurality of avoidance holes are provided at the bottom of the pressing plate, and the plurality of avoidance holes are aligned one by one with the plurality of product positioning columns, and the avoidance holes provide movable space for the corresponding product positioning columns.

[0010] Preferably, a plurality of PE foams are bonded and fixed to the bottom of the pressing plate, and the PE foams are movably mounted on the corresponding test resistance probes. The size of the PE foams is adapted to the internal size of the corresponding test placement slots. The PE foams are used to squeeze the product inside the test placement slots so that the product can fit tightly with the PCB test board, thereby making the test resistance more accurate.

[0011] Preferably, the test resistance probe adopts a compressible spring gold-plated round-head pressure needle. Two compressible spring gold-plated round-head pressure needles are provided on a single test resistance probe. The compressible spring gold-plated round-head pressure needle can avoid indentation or penetration of the test product. Two holes are provided on the bottom inner wall of the test placement groove, and the holes are adapted to the corresponding compressible spring gold-plated round-head pressure needles.

[0012] Preferably, the depth of the test placement slot is consistent with the thickness of the product, the surface of the PCB test board is made of immersion gold, and the PCB test board is electrically connected to the lower module connector through a connecting wire.

[0013] Compared with the existing technology, the beneficial effects of the utility model are:

[0014] 1. By setting up multiple test slots and multiple test resistance probes, resistance tests can be performed on multiple double-sided conductive films at the same time, achieving the purpose of manual and semi-automatic resistance testing. The test efficiency is significantly improved compared to the existing technology. The test resistance probe adopts a compressible spring gold-plated round-head pressure needle, which can effectively reduce the risk of penetrating and damaging the double-sided conductive film during the test process.

[0015] 2. By combining PE foam with the test resistance probe, when the pressing plate is pressed down, the PE foam is squeezed to allow the bottom of the tested product to fully contact the PCB test board, making the test resistance more accurate;

[0016] The resistance test fixture of the utility model has a simple overall fixture design structure and low cost. In addition, it can accurately test the resistance of multiple double-sided conductive films at the same time. It adopts a manual semi-automatic testing method, and its testing efficiency is significantly improved compared with the existing technology. The test resistance probe adopts a compressible spring gold-plated round-head pressure needle, which can effectively reduce the risk of penetrating and damaging the double-sided conductive film during the test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic structural diagram of a resistance test fixture for a double-sided conductive film proposed by the present invention.

[0018] In the figure: 101, test machine top plate; 102, test machine base; 103, test machine clamping plate; 10, fixture top plate; 20, first support rod; 30, pressing plate; 31, PE foam; 32, fixture positioning pin; 40, test resistance probe; 50, upper module connector; 60, fixture base; 70, second support rod; 80, lower module connector; 90, carrier; 91, test placement slot; 92, product positioning column. DETAILED DESCRIPTION

[0019] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0020] Reference Figure 1A resistance test fixture for double-sided conductive film includes a test machine top plate 101 and a test machine base 102. An upper test module and a lower test module located below the upper test module are provided below the test machine top plate 101. The lower test module is fixed to the top of the test machine base 102. The upper test module includes a fixture top plate 10. The fixture top plate 10 is fixedly installed on the bottom of the test machine top plate 101. Both sides of the bottom of the test machine top plate 101 are fixedly connected with test machine clamps 103. The test machine clamps 103 are clamped and fixed on the fixture top plate 10. The principle of clamping and fixing the fixture top plate 10 by the test machine clamps 103 is a conventional clamping and fixing method in the prior art.

[0021] The bottom of the jig top plate 10 is fixedly connected to a plurality of first support rods 20 by screws, and the bottom ends of the plurality of first support rods 20 are fixedly connected to the same pressing plate 30, and the first support rods 20 are used to support the pressing plate 30, and the bottom of the pressing plate 30 is embedded with a plurality of test resistance probes 40, wherein the test resistance probes 40 are installed in the middle of the corresponding test position of the test product, and the top of the pressing plate 30 is fixedly installed with an upper module connector 50, and the plurality of test resistance probes 40 are electrically connected to the upper module connector 50, and the plurality of test resistance probes 40 are electrically connected to the upper module connector 50 through connecting wires, wherein the test resistance probes 40 adopt compressible spring gold-plated round head pressure needles, and two compressible spring gold-plated round head pressure needles are provided on a single test resistance probe 40, and the compressible spring gold-plated round head pressure needles can avoid indentation or penetration of the test product, and the bottom of the pressing plate 30 is fixedly connected to two jig positioning pins 32, and the jig positioning pins 32 are used to position the pressing plate 30;

[0022] The lower test module includes a fixture base 60, which is fixedly mounted on the top of the test machine base 102. The top of the fixture base 60 is fixedly connected to a plurality of second support rods 70 by screws. The tops of the plurality of second support rods 70 are fixedly connected to the same carrier 90. The plurality of second support rods 70 are used to support the carrier 90. The bottom of the carrier 90 is fixedly connected to the lower module connector 80. The top of the carrier 90 is provided with a plurality of test placement slots 91. The top of the carrier 90 is provided with two positioning holes. The two positioning holes are aligned one by one with the two fixture positioning pins 32. The positioning holes are used for corresponding fixture positioning. The positioning pins 32 are inserted, and multiple test placement slots 91 are aligned with multiple test resistance probes 40 one by one. Two holes are provided on the bottom inner wall of the test placement slot 91, and the holes are adapted to the corresponding compressible spring gold-plated round-head pressure pins. The top of the carrier 90 is fixedly connected to multiple product positioning posts 92, which are provided on one side of the corresponding test placement slot 91. The product positioning posts 92 are used to position the corresponding test product. The bottom of the pressing plate 30 is provided with multiple avoidance holes, and the multiple avoidance holes are aligned with the multiple product positioning posts 92 one by one. The avoidance holes provide movable space for the corresponding product positioning posts 92.

[0023] A plurality of PE foams 31 are bonded and fixed to the bottom of the pressing plate 30. The PE foam 31 is movably mounted on the corresponding test resistance probe 40. The size of the PE foam 31 is adapted to the internal size of the corresponding test placement slot 91. The PE foam 31 is used to squeeze the product inside the test placement slot 91 so that the product can fit tightly with the PCB test board, thereby making the test resistance more accurate. A PCB test board electrically connected to the lower module connector 80 is installed in the test placement slot 91. The depth of the test placement slot 91 is consistent with the thickness of the product. The surface of the PCB test board is made of immersion gold. The PCB test board and the lower module connector 80 are connected by The connecting wires are electrically connected, and the principle of resistance testing of the double-sided conductive film is carried out through the cooperation of the lower module connector 80, the PCB test board, the test resistance probe 40 and the upper module connector 50 is the existing technology, which will not be elaborated here in detail; the resistance testing fixture of the utility model has a simple overall fixture design structure and low cost. In addition, it can accurately test the resistance of multiple double-sided conductive films at the same time, and adopts a manual semi-automatic testing method. Its test efficiency is significantly improved compared with the existing technology, and the test resistance probe 40 adopts a compressible spring gold-plated round head pressure needle, which can effectively reduce the risk of penetrating and damaging the double-sided conductive film during the test process.

[0024] Working principle: When in use, first place the double-sided conductive film product to be tested in the corresponding test placement slot 91, and the bottom of the double-sided conductive film product is in active contact with the top of the PCB test board, and the corresponding product to be tested is positioned by the product positioning column 92, and then the driving part on the external test machine is used to drive the test machine top plate 101 to move downward, and the test machine top plate 101 drives the fixture top plate 10 to move downward through two test machine clamps 103, and the fixture top plate 10 drives the pressing plate 30 to move downward through multiple first support rods 20, and the pressing plate 30 drives multiple test resistance probes 40, PE foam 31 and upper module connector 50 to move downward. When the PE foam 31 moves downward to contact with the corresponding double-sided conductive film product, the double-sided conductive film product is squeezed, so that the bottom of the double-sided conductive film product is completely fitted with the corresponding PCB test board, and when the test resistance probe 40 moves downward to contact with the top of the double-sided conductive film product When touched, under continued squeezing force, the compressible spring gold-plated round-head pressure needle on the test resistance probe 40 automatically contracts, which can effectively reduce the risk of the test resistance probe 40 penetrating the double-sided conductive film product. When the pressing plate 30 moves downward, it also drives the two fixture positioning pins 32 to move downward into the corresponding positioning holes. At the same time, the pressing plate 30 drives multiple avoidance holes to be respectively sleeved on the corresponding product positioning columns 92. When the bottom of the pressing plate 30 contacts the top of the carrier 90, the test resistance probe 40 contacts the corresponding double-sided conductive film product. The resistance test of the double-sided conductive film product can be performed through the test resistance probe 40, the upper module connector 50, the PCB test board and the lower module connector 80. The specific resistance test principle is the existing technology and will not be elaborated here. By testing multiple double-sided conductive film products at the same time, the test efficiency is significantly improved. In addition, the design structure of the entire fixture is simple and the cost is low.

[0025] The above is only a preferred specific implementation method of the present invention, but the protection scope of the present invention is not limited to this. Any technician familiar with the technical field within the technical scope disclosed by the present invention can make equivalent replacements or changes based on the technical solution and utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A resistance test fixture for a double-sided conductive film, comprising a tester top plate (101) and a tester base (102), characterized in that: An upper test module and a lower test module located below the upper test module are provided below the test machine top plate (101), the lower test module is fixed on the top of the test machine base (102), the upper test module includes a fixture top plate (10), the fixture top plate (10) is fixedly installed on the bottom of the test machine top plate (101), a plurality of first support rods (20) are fixedly connected to the bottom of the fixture top plate (10), the bottom ends of the plurality of first support rods (20) are fixedly connected to the same pressing plate (30), a plurality of test resistance probes (40) are embedded in the bottom of the pressing plate (30), an upper module connector (50) is fixedly installed on the top of the pressing plate (30), the plurality of test resistance probes (40) are all electrically connected to the upper module connector (50), and two fixture positioning pins (32) are fixedly connected to the bottom of the pressing plate (30); The lower test module includes a fixture base (60), the fixture base (60) is fixedly installed on the top of the test machine base (102), the top of the fixture base (60) is fixedly connected to a plurality of second support rods (70), the top ends of the plurality of second support rods (70) are fixedly connected to the same carrier (90), the bottom of the carrier (90) is fixedly connected to the lower module connector (80), the top of the carrier (90) is provided with a plurality of test placement slots (91), the plurality of test placement slots (91) are aligned one by one with the plurality of test resistance probes (40), the top of the carrier (90) is fixedly connected to a plurality of product positioning columns (92), the product positioning columns (92) are arranged on one side of the corresponding test placement slots (91), and a PCB test board electrically connected to the lower module connector (80) is installed in the test placement slots (91).

2. The resistance test fixture for a double-sided conductive film according to claim 1, characterized in that: Both sides of the bottom of the testing machine top plate (101) are fixedly connected with testing machine clamping plates (103), and the testing machine clamping plates (103) are clamped and fixed on the fixture top plate (10).

3. The resistance test fixture for a double-sided conductive film according to claim 1, characterized in that: Two positioning holes are provided on the top of the carrier (90), and the two positioning holes are aligned with the two fixture positioning pins (32) one by one.

4. The resistance test fixture for a double-sided conductive film according to claim 1, characterized in that: The bottom of the pressing plate (30) is provided with a plurality of avoidance holes, and the plurality of avoidance holes are aligned one by one with the plurality of product positioning columns (92).

5. The resistance test fixture for a double-sided conductive film according to claim 1, characterized in that: A plurality of PE foams (31) are bonded and fixed to the bottom of the pressing plate (30), and the PE foams (31) are movably sleeved on the corresponding test resistance probes (40), and the size of the PE foams (31) is adapted to the internal size of the corresponding test placement slot (91).

6. The resistance test fixture for a double-sided conductive film according to claim 1, characterized in that: The test resistance probe (40) adopts a compressible spring gold-plated round-head pressure needle. Two compressible spring gold-plated round-head pressure needles are provided on a single test resistance probe (40). Two holes are provided on the bottom inner wall of the test placement groove (91), and the holes are adapted to the corresponding compressible spring gold-plated round-head pressure needles.

7. The resistance test fixture for a double-sided conductive film according to claim 1, characterized in that: The depth of the test placement groove (91) is consistent with the thickness of the product. The surface of the PCB test board is made of immersion gold. The PCB test board is electrically connected to the lower module connector (80) via a connecting wire.

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