High-adaptability chip test seat

Abstract

The utility model relates to a chip test seat with high adaptability, which comprises a lower closing cover and a needle seat, a test area is arranged in the needle seat, a plurality of test holes are arranged between the test area and the lower closing cover in a penetrating manner, test needles are inserted in the test holes, an upper closing cover is arranged above the needle seat, clamping grooves are arranged on the left side and the right side of the upper closing cover in a sunken manner, and clamping rods are arranged in the clamping grooves. A screw hole is formed in the upper closing cover in a penetrating mode, and a torsion piece is installed in the screw hole in a screwed connection mode. A square groove is formed in the bottom of the upper closing cover. According to the utility model, a large number of test holes are arranged and are distributed all over the test area, so that a tester can prepare the number of test pins according to the number of chip pins in different layouts, and then insert the test pins into the corresponding test holes according to the positions of the chip pins, thereby realizing the adaptation of various chips, and improving the test efficiency. The universality of the testing seat is greatly improved, the requirement for replacing the testing seat is lowered, and the testing efficiency can be effectively improved on the basis of accurate testing.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and in particular relates to a chip testing seat. Background Art

[0002] In the current semiconductor testing field, chip test sockets are often used to test various performances of IC chips. Chip test sockets usually use springs and probe structures as the contact parts between the chip and the test socket pins, and then the number and position of the probes are designed according to the pin layout of the specific chip; and when different models of chips need to be tested, the entire test socket often needs to be replaced to adapt to multi-touch chips with different pin layouts. Frequent replacement of test sockets will not only lead to interruption of the test process, extend the test preparation time, increase the overall test efficiency, but also increase the equipment investment cost.

[0003] Therefore, a chip test socket that is suitable for a variety of different pin layouts is designed. At the same time, taking into account the functional differences of different contacts and the differences in their spot welding methods, which will lead to height differences between different contacts on the same chip, an adjustable clamping structure is added. By precisely controlling the configuration and clamping force of the contacts, the test cost is significantly reduced and the chip test efficiency is improved. Utility Model Content

[0004] The purpose of the present invention is to provide a chip test socket with high adaptability to solve the problems raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a highly adaptable chip test seat, comprising a lower cover and a needle seat, a test area being provided in the needle seat, a plurality of test holes being provided between the test area and the lower cover, test needles being inserted into the test holes, an upper cover being provided above the needle seat, recessed grooves being provided on the left and right sides of the upper cover, a clamping rod being provided in the clamping groove, a clamping part being provided on the clamping rod for rotation, a screw hole being provided through the upper cover, and a torsion part being screwed and installed in the screw hole.

[0006] Preferably, a square groove is provided at the bottom of the upper cover, and a pressing piece is provided in the square groove.

[0007] Preferably, an observation hole is provided between the screw and the pressing piece.

[0008] Preferably, the test area is divided into a test plate and a loading slot, and the loading slot is located above the test plate.

[0009] Preferably, card removal slots are provided on four sides of the inner wall of the loading slot.

[0010] Preferably, two engaging grooves are provided between the lower closing cover and the needle seat, and the engaging grooves cooperate with the engaging member.

[0011] Preferably, a buckle is provided on the inner side of the lower portion of the engaging member, and a push plate is provided on the upper portion of the engaging member.

[0012] Compared with the prior art, the beneficial effects of the present invention are as follows: the present invention opens a large number of test holes throughout the test area, so that the tester can prepare the number of test needles according to the number of chip pins in different layouts, and then insert the test needles into the corresponding test holes according to the pin positions of the chip, thereby achieving adaptation to a variety of chips, which not only greatly improves the versatility of the test socket and reduces the need to replace the test socket, but also effectively improves the test efficiency on the basis of precise testing; the present invention also sets three layers of limit, which lengthens the insertion stroke of the test needle, so that the test needle remains in a vertical state, avoids displacement or deformation during the plugging and unplugging process, and accurately contacts multiple solder joints of the chip; the present invention takes into account the height difference of different contacts, and is equipped with a movable pressing part, which can be fine-tuned according to the actual position and height of the contact to ensure stable contact between the chip and the contact, while avoiding unnecessary pressure damage to the chip, and ensuring the safety and reliability of the testing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a schematic diagram of the three-dimensional structure of the utility model;

[0014] Figure 2 It is an exploded view of the utility model;

[0015] Figure 3 This is an exploded view of the lower cover and needle holder in the utility model;

[0016] Figure 4 This is an exploded view of the upper cover of the present invention;

[0017] Figure 5 This is a cross-sectional view of the unit in use.

[0018] Numbers in the figure: 1-lower closing cover, 2-needle holder, 3-test area, 301-test plate, 302-loading slot, 4-test hole, 5-test needle, 6-upper closing cover, 7-card slot, 8-card rod, 9-clamping part, 10-screw hole, 11-torsion part, 12-square slot, 13-pressing part, 14-observation hole, 15-card removal slot, 16-embedded slot, 17-buckle, 18-push plate. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0020] Example 1

[0021] like Figures 1 to 5 The chip test seat with high adaptability shown in the figure includes a lower cover 1 and a needle seat 2. A test area 3 is provided in the needle seat 2. A plurality of test holes 4 are provided between the test area 3 and the lower cover 1. A test needle 5 is inserted into the test hole 4. An upper cover 6 is provided above the needle seat 2. A card slot 7 is provided on the left and right sides of the upper cover 6. A card rod 8 is provided in the card slot 7. The card rod 8 is provided with a locking part 9 when rotating. A screw hole 10 is provided through the upper cover 6. A torsion part 11 is screwed and installed in the screw hole 10. ; A square groove 12 is provided at the bottom of the upper cover 6, and a pressing part 13 is provided in the square groove 12; an observation hole 14 is provided between the screw and the pressing part 13; the test area 3 is divided into a test plate 301 and a loading slot 302, and the loading slot 302 is located above the test plate 301; card removal slots 15 are provided on the four sides of the inner wall of the loading slot 302; two fitting grooves 16 are provided between the lower cover 1 and the needle seat 2, and the fitting grooves 16 cooperate with the engaging part 9; a buckle 17 is provided on the inner side of the lower part of the engaging part 9, and a push plate 18 is provided on the upper part of the engaging part 9.

[0022] The present invention opens a large number of test holes 4 throughout the test area 3, so that the tester can prepare the number of test needles 5 according to the number of chip pins of different layouts, and then insert the test needles 5 into the corresponding test holes 4 according to the pin positions of the chips, thereby achieving adaptation to a variety of chips, which not only greatly improves the versatility of the test socket and reduces the need to replace the test socket, but also effectively improves the test efficiency on the basis of precise testing; the present invention also sets three layers of limit, which lengthens the insertion stroke of the test needle 5, so that the test needle 5 remains in a vertical state, avoids displacement or deformation during the plugging and unplugging process, and accurately contacts multiple solder joints of the chip; the present invention takes into account the height difference of different contacts and is equipped with a movable pressing part 13, which can be fine-tuned according to the actual position and height of the contact to ensure stable contact between the chip and the contact, while avoiding unnecessary pressure damage to the chip, and ensuring the safety and reliability of the test process.

[0023] Example 2

[0024] like Figures 1 to 5The shown chip test seat has a high adaptability, including a lower cover 1 and a needle seat 2. The lower cover 1 is used to support the entire detection process. The needle seat 2 is installed on the top of the lower cover 1. The needle seat 2 is actually a frame with a size comparable to that of the lower cover 1, and a test area 3 is installed on the inner wall. A plurality of test holes 4 are provided between the test area 3 and the lower cover 1, for inserting the test needle 5 upward into the test area 3 through the position below the lower cover 1. In this way, just insert the chip's solder pad face down into the test area 3 in the needle seat 2, so that the test needle 5 gently touches the chip's solder joint. After the test needle 5 contacts the soldering surface, it remains motionless until the test is completed. It should be noted that this embodiment is mainly adapted for use with multi-touch chips. The specific number of test pins 5 can be adjusted according to the actual contacts of the chip. The number of test pins 5 is prepared according to the number of chip pins with different layouts. Then, the test pins 5 are inserted into the corresponding test holes 4 according to the pin positions of the chip to cooperate with the chip test; that is, the tester can flexibly configure the contact positions according to the pin matrix of the chip, thereby achieving adaptation to multiple chips, which not only greatly improves the versatility of the test socket and reduces the need to replace the test socket, but also effectively improves the test efficiency on the basis of precise testing.

[0025] It should be noted that the chip test socket usually uses a spring and probe structure as the contact part between the chip and the test socket pin, and these structures need to have sufficient elasticity to ensure that good contact performance is maintained after multiple plugging and unplugging; therefore, the test needle 5 in this embodiment is also elastic. While the test needle 5 is elastic, it is also easily affected by hard objects during insertion, causing bending and the like. As a result, it is impossible to ensure that the test needle 5 can accurately align with the chip pin during the plugging and unplugging process and achieve a stable connection; and when the test needle 5 cannot be effectively controlled and is accidentally inserted into the welding surface of the chip, it will also damage the chip welding structure, resulting in the inability to perform normal testing, and may even cause damage to the test socket.

[0026] Therefore, in this embodiment, the insertion stroke of the test needle 5 is lengthened so that the test needle 5 remains in a vertical state, thereby preventing displacement or deformation during the insertion and removal process and accurately contacting multiple solder joints of the chip.

[0027] The test area 3 is divided into a test board 301 and a loading slot 302. The loading slot 302 is located above the test board 301 and is used to load chips. Specifically, the test board 301 is located in the lower cover 1, and the loading slot 302 is located in the needle seat 2. Referring to the above "a plurality of test holes 4 are provided between the test area 3 and the lower cover 1", it can be understood that the test board 301 and the loading slot 302 are both provided with the same number and distribution position of test holes 4 as the lower cover 1. The test holes 4 will pass through the lower cover 1, the test board 301 and the loading slot 302. Then, when the test needle 5 is inserted from the bottom of the lower cover 1, it needs to pass through the lower cover 1, the test board 301 and the loading slot 302 in turn, and maintain a vertical state after passing through three layers of limiters until it contacts the contacts of the chip for testing.

[0028] The four sides of the inner wall of the loading slot 302 are further provided with card removal slots 15 to provide sufficient space for the tester to remove the chip safely and completely, thereby reducing the scrap rate during the test process.

[0029] Example 3

[0030] like Figures 1 to 5 The shown is a highly adaptable chip test socket. During testing, the chip's pad surface needs to be inserted into the test area 3 in the needle holder 2, and then the test needle 5 is inserted through the bottom of the lower cover 1. The test needle 5 is inserted through the bottom of the lower cover 1 in sequence until it contacts the chip's contacts. During this period, the test needle 5 and the welding surface are kept relatively stationary, and the test socket starts testing until contact is made.

[0031] It should be noted that the layout of the solder contacts on the chip will also affect the height of the solder points, which in turn leads to a certain height difference between the solder points. The more solder points there are, the more difficult it is to achieve complete contact between the test pin 5 and the solder points. Therefore, an upper cover 6 is also provided. The chip is pressed downward by the arrangement on the upper cover 6 until all its contacts are in contact with the test pin 5. The upper cover 6 is a separate arrangement that can be completely separated from the lower cover 1. When in operation, it will be located directly above the chip. The four sides of the upper cover 6 are consistent with the lower cover 1, and a square groove 12 is provided at the bottom. A pressing piece 13 is provided to slide inside the square groove 12. The pressing piece 13 is specifically a soft block with different upper and lower sizes. The upper part of the pressing piece 13 slides in the square groove 12, and the lower part is used to adapt to the loading slot 302 to achieve effective contact with the chip. The soft material can reduce the hard contact between the chip and the pressing piece 13. This not only reduces the error rate and chip damage rate during the test process, but also prevents the chip from being damaged by excessive force, effectively reducing the test cost.

[0032] Correspondingly, a screw hole 10 is provided through the upper closing cover 6, and a torsion piece 11 is screwed and installed in the screw hole 10. The torsion piece 11 can be specifically designed as a screw plus a twist handle. Then, after fixing the upper closing cover 6, the user can rotate the torsion piece 11 to drive the screw to move up and down in the screw hole 10. When the screw moves downward, the pressing piece 13 can be squeezed downward to limit the chip, driving the contacts on the chip to be in close contact with the test needle 5, thereby completing a more accurate and efficient test.

[0033] Next, the tester rotates the torsion piece 11 to drive the screw rod to move downward in the screw hole 10, and the pressing piece 13 is squeezed and moved downward to squeeze and limit the chip, driving the contacts on the chip to make close contact with the test needle 5; the basis of the above technical solution is "after the user fixes the upper cover 6", and then a locking piece 9 is provided to fix the upper cover 6 on the lower cover 1 to ensure the stable operation of the pressing piece 13. The upper cover 6 is recessed with a card slot 7 on the left and right sides, and a locking piece 9 is provided in the card slot 7 through the rotation of the card rod 8. A buckle 17 is provided on the inner side of the lower part of the locking piece 9, and then two interlocking grooves 16 are opened between the lower cover 1 and the needle seat 2. When the upper cover 6 is placed on the needle seat 2, the locking piece 9 can be pushed to move downward until the buckle 17 is snapped into the interlocking groove 16, thereby indirectly fixing the entire upper cover 6; at the same time, a push plate 18 is provided on the upper part of the locking piece 9, and in order to further achieve the stable positioning of the upper cover 6, a connection can also be made between the card rod 8 and the locking piece 9. The torsion spring is not shown in the figure. The end of the buckle 17 of the locking part 9 is tilted inward in the initial state. In this way, the tester can easily hold the push plate 18 with two fingers and apply force to open the locking part 9 and the end of the buckle 17 outward. At this time, the torsion spring is deformed; then the end of the buckle 17 is aligned with the fitting groove 16, and the upper closing cover 6 is aligned with the needle seat 2 and inserted, and the push plate 18 is slowly released. The torsion spring is reset to drive the end of the buckle 17 to be stuck in the fitting groove 16, thereby achieving stable limiting of the upper closing cover 6 and cooperating with the stable operation of the torsion member 11.

[0034] Example 4

[0035] With reference to Examples 1-3, it should be noted that when the pressing part 13 is in operation, the entire test seat is in a sealed state, and the tester cannot view its internal conditions, which may easily cause the torsion part 11 to rotate excessively, causing the pressing part 13 to move excessively and damage the chip. Therefore, an observation hole 14 is also opened between the screw and the pressing part 13 to observe the contact status between the pressing part 13 and the chip to avoid chip damage.

[0036] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0037] The above description is only used to illustrate the technical solution of the present invention and is not intended to limit it. Other modifications or equivalent substitutions made to the technical solution of the present invention by ordinary technicians in this field should be included in the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solution of the present invention.

Claims

1. A highly adaptable chip test socket, comprising a lower cover (1) and a needle seat (2), characterized in that: The needle seat (2) is provided with a test area (3), and a plurality of test holes (4) are provided between the test area (3) and the lower cover (1), and a test needle (5) is inserted into the test hole (4). An upper cover (6) is provided above the needle seat (2), and a card slot (7) is provided inwardly on the left and right sides of the upper cover (6), and a card rod (8) is provided in the card slot (7), and a card member (9) is provided when the card rod (8) is rotated. A screw hole (10) is provided through the upper cover (6), and a torsion member (11) is screwed and installed in the screw hole (10); a square groove (12) is provided at the bottom of the upper cover (6), and a pressing member (13) is provided in the square groove (12).

2. The highly adaptable chip test socket according to claim 1, characterized in that: An observation hole (14) is provided between the twisting member (11) and the pressing member (13).

3. The highly adaptable chip test socket according to claim 1, characterized in that: The test area (3) is divided into a test plate (301) and a loading slot (302), and the loading slot (302) is located above the test plate (301).

4. The highly adaptable chip test socket according to claim 3, characterized in that: Card taking slots (15) are provided on four sides of the inner wall of the loading slot (302).

5. The highly adaptable chip test socket according to claim 1, characterized in that: Two engaging grooves (16) are provided between the lower cover (1) and the needle seat (2), and the engaging grooves (16) cooperate with the engaging member (9).

6. The highly adaptable chip test socket according to claim 5, characterized in that: A buckle (17) is provided on the inner side of the lower portion of the engaging member (9), and a push plate (18) is provided on the upper portion of the engaging member (9).

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