SD card test fixture

Abstract

The utility model provides an SD (Secure Digital) card test fixture which comprises a shell, so that the fixture can be compatible with various SD card test devices; the surface of the first side of the shell is provided with a profiling clamping groove, the profiling clamping groove bears an SD card packaging sheet, and the side wall of the profiling clamping groove is provided with a limiting piece, so that the SD card packaging sheet can be detachably and stably installed in the shell; the bottom of the profiling card slot is provided with a first hollow part, and the first hollow part corresponds to the position of a golden finger of the SD card packaging sheet, so that the golden finger on the SD card packaging sheet can be in contact connection with a test equipment card point through the first hollow part after the SD card packaging sheet is installed, and data transmission and signal interaction are carried out to complete a test. The SD card packaging chip is tested in the development process of the SD card, and the situation that repairing is difficult due to the fact that problems occur after the complete SD card is tested is avoided.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor chip testing, in particular to an SD card testing fixture. Background Art

[0002] Most existing SD card testing devices are designed to test finished SD cards. Finished SD cards are usually composed of two parts: an internal packaging sheet and an outer shell. In addition, due to the overall thinness of finished SD cards and for product reliability, they usually use a non-removable ultrasonic welding structure, so it is impossible to test a single packaging sheet.

[0003] However, during the design and development of the package, SD cards need to be tested or scraped to analyze product defects, requiring frequent disassembly and reassembly of the housing. Furthermore, after disassembling and analyzing defective products, testers are unable to reassemble them themselves. Special equipment is required to reassemble the package and housing, reducing package testing efficiency. Furthermore, after testing, the old housing must be discarded, resulting in a large number of discarded housings. Utility Model Content

[0004] The technical problem to be solved by the utility model is to provide an SD card test fixture to improve the testing efficiency of the SD card in the development stage.

[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0006] An SD card test fixture comprises a shell; a surface of a first side of the shell is provided with a contoured card slot, the contoured card slot carrying an SD card packaging sheet; a side wall of the contoured card slot is provided with a limit member; and a first hollow portion is provided at the bottom of the contoured card slot, the first hollow portion corresponding to the position of a gold finger of the SD card packaging sheet.

[0007] Furthermore, it comprises at least two said limiting members; said limiting members are arranged on the same side wall of said contoured slot.

[0008] Furthermore, the limiting member includes an elastic clip.

[0009] Furthermore, a second hollow portion is provided at the bottom of the contoured card slot, and the second hollow portion corresponds to the position of the test output point of the SD card packaging sheet.

[0010] Furthermore, a scraper groove is provided on the surface of the second side of the shell, and the second side is an opposite side to the first side.

[0011] Furthermore, the position of the scraper groove corresponds to the position of the second hollow portion.

[0012] Furthermore, a hollow exit portion is provided on one side of the contoured slot, and the hollow exit portion is communicated with the contoured slot.

[0013] Furthermore, the limiting member is arranged on the side wall on the side where the contoured slot is connected to the hollow exit portion.

[0014] Furthermore, a third hollow portion is provided at the bottom of the side of the profiling card slot communicating with the hollow exit portion; and the length of the bottom of the profiling card slot in the direction of the third hollow portion is smaller than the length of the SD card packaging sheet.

[0015] Furthermore, a hand grip groove is provided on the surface of the first side of the shell.

[0016] The beneficial effects of the present invention are as follows: a shell having the same external structure as a finished SD card is adopted, so that the fixture can be compatible with various SD card testing equipment; a contoured card slot having the same shape as the SD card packaging sheet is provided on the shell, and a limit piece is provided on the side wall of the contoured card slot, so that the SD card packaging sheet can be detachably and stably installed in the shell; and a first hollow portion is provided at the bottom of the contoured card slot, so that after the SD card packaging sheet is installed, the gold finger on the SD card packaging sheet can be in contact and connected with the card point of the test equipment through the first hollow portion, and data transmission and signal interaction are performed to complete the test, thereby realizing testing of the SD card packaging sheet during the development process of the SD card, and avoiding the situation where problems arise after testing the complete SD card and the repair is difficult. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a structural diagram of an SD card test fixture in an embodiment of the present utility model;

[0018] Figure 2 for Figure 1 An enlarged view of the structure marked as part A;

[0019] Figure 3 This is an assembly structure diagram of an SD card test fixture and an SD card packaging sheet in an embodiment of the present utility model;

[0020] Figure 4 This is a bottom view of the assembly structure of an SD card test fixture and an SD card packaging sheet in an embodiment of the present utility model;

[0021] Figure 5 This is a structural diagram of the assembly process of an SD card test fixture and an SD card packaging sheet in an embodiment of the present utility model;

[0022] Description of labels:

[0023] 1. Shell; 2. Contoured card slot; 3. Limiting piece; 4. First hollow part; 5. Second hollow part; 6. Scraper slot; 7. Hollow exit part; 8. Third hollow part; 9. Hand grip slot; 10. SD card packaging sheet; 11. Gold finger. DETAILED DESCRIPTION

[0024] In order to explain the technical content, achieved objectives and effects of the present invention in detail, the following description is given in conjunction with the embodiments and the accompanying drawings.

[0025] At present, SD card shells are mostly non-detachable ultrasonically welded structures due to their overall thinness and for the sake of product reliability. Moreover, after the test disassembly analysis, the testers cannot reassemble and restore the shell by themselves, and need to ask the ultrasonic equipment engineer to use a new shell to re-ultrasonic shell welding. Ultrasonic equipment is a production equipment and is often configured in the production base, while the development stage testing belongs to R&D and is carried out in the R&D base, and the R&D base and the production base are often not in the same place. Therefore, the reassembly and restoration of the SD card shell not only requires the scrapping of a large number of shells, but also greatly reduces the test efficiency. In response to the above technical problems, the utility model provides a jig that is convenient for the disassembly and assembly of SD cards, which aims to solve the problem that testers in the development stage cannot reassemble the SD card shell by themselves for re-testing after disassembling it to analyze the defective packaging chip problem, so as to improve the test efficiency in the development stage. The specific structure is as follows:

[0026] Please refer to Figure 1 An SD card test fixture includes a shell; a surface of a first side of the shell is provided with a contoured card slot, the contoured card slot carries an SD card packaging sheet; a side wall of the contoured card slot is provided with a limit member; the bottom of the contoured card slot is provided with a first hollow portion, the first hollow portion corresponds to the position of the gold finger of the SD card packaging sheet.

[0027] From the above description, it can be seen that the beneficial effects of the present invention are: a shell with the same appearance and structure as the finished SD card is adopted, so that the fixture can be compatible with various SD card testing equipment; by arranging a contoured card slot with the same shape as the SD card packaging sheet on the shell, and providing a limiter on the side wall of the contoured card slot, the SD card packaging sheet can be detachably and stably installed in the shell; and a first hollow portion is provided at the bottom of the contoured card slot, so that after the SD card packaging sheet is installed, the gold finger on the SD card packaging sheet can be contacted and connected with the card point of the test equipment through the first hollow portion, and data transmission and signal interaction are performed to complete the test, thereby realizing testing of the SD card packaging sheet during the development process of the SD card, and avoiding problems that may arise after testing the complete SD card, resulting in difficulties in repair.

[0028] Furthermore, it comprises at least two said limiting members; said limiting members are arranged on the same side wall of said contoured slot.

[0029] It can be seen from the above description that by providing multiple groups of limiting members on the side walls of the contoured card slot, the fixing effect of the SD card packaging sheet can be improved, thereby improving the stability of the SD card packaging sheet.

[0030] Furthermore, the limiting member includes an elastic clip.

[0031] As can be seen from the above description, the elastic clamp is used as the limiting member, and the elastic clamp has the retractable characteristic, which can effectively realize the locking of the SD card packaging sheet and is also more conducive to the removal of the SD card packaging sheet.

[0032] Furthermore, a second hollow portion is provided at the bottom of the contoured card slot, and the second hollow portion corresponds to the position of the test output point of the SD card packaging sheet.

[0033] From the above description, it can be seen that by providing a second hollow portion at the bottom of the contoured card slot and making the second hollow portion correspond to the position of the test output point of the SD card packaging sheet, it is convenient for testers to quickly find the test output point position and read the SD card log information through the test output point for analysis.

[0034] Furthermore, a scraper groove is provided on the surface of the second side of the shell, and the second side is an opposite side to the first side.

[0035] From the above description, it can be seen that by setting a scraper groove on the surface of the second side of the shell, it is convenient to place the scraper, and the scraper can make it easier for the tester to scrape off the coating of the test output point on the SD card packaging sheet, thereby improving the test efficiency.

[0036] Furthermore, the position of the scraper groove corresponds to the position of the second hollow portion.

[0037] It can be seen from the above description that by making the position of the scraper groove correspond to the position of the second hollow portion, the scraper can be placed in the vertical direction when scraping the coating at the test output point.

[0038] Furthermore, a hollow exit portion is provided on one side of the contoured slot, and the hollow exit portion is communicated with the contoured slot.

[0039] As can be seen from the above description, by providing a hollow exit portion on one side of the contoured card slot, the tester can remove the tested SD card packaging sheet from the housing through the hollow exit portion.

[0040] Furthermore, the limiting member is arranged on the side wall on the side where the contoured slot is connected to the hollow exit portion.

[0041] From the above description, it can be seen that by arranging the limit member on the side wall of the contoured card slot close to the hollow exit part, it is easier to release the snap fit between the limit member and the SD card encapsulation sheet when the SD card encapsulation sheet is ejected through the hollow exit part.

[0042] Furthermore, a third hollow portion is provided at the bottom of the side of the profiling card slot communicating with the hollow exit portion; and the length of the bottom of the profiling card slot in the direction of the third hollow portion is smaller than the length of the SD card packaging sheet.

[0043] From the above description, it can be seen that by setting a third hollow part at the connection between the contoured card slot and the hollow exit part, the tester can apply force to the SD card packaging piece in the contoured card slot through the third hollow part, thereby making it more convenient for the tester to withdraw the SD card packaging piece from the contoured card slot.

[0044] Furthermore, a hand grip groove is provided on the surface of the first side of the shell.

[0045] It can be seen from the above description that by providing a finger-gripping groove on the surface of the first side of the shell, it is convenient to buckle the fixture out of the card slot of the testing equipment.

[0046] The SD card test fixture provided by this utility model can be applied to the test scenario of SD card packaging chips, and the fixture is compatible with various SD card test equipment. The following is an explanation through specific implementation methods:

[0047] Example 1

[0048] Please refer to Figure 1 as well as Figure 2 , an SD card test fixture, including a shell 1, the shell 1 is compatible with various SD card test equipment; at the same time, the shell 1 can be produced by 3D printing technology, so that the shell 1 has high flexibility; and the shell 1 can change the structure of the SD card package sheet 10 according to the principle shown in this embodiment, for example, forming a contoured card slot 2 of different shapes to quickly adapt to SD card package sheets 10 of different sizes. The surface of the first side of the shell 1 is provided with a contoured card slot 2, and the contoured card slot 2 carries the SD card package sheet 10; the side wall of the contoured card slot 2 is provided with a limiting member 3; the bottom of the contoured card slot 2 is provided with a first hollow portion 4, and the first hollow portion 4 corresponds to the position of the gold finger 11 of the SD card package sheet 10; as shown Figure 3 as well as Figure 4 As shown, when the SD card encapsulation sheet 10 is set in the contoured card slot 2, the gold finger 11 of the SD card encapsulation sheet 10 is connected to the test equipment card point through the first hollow portion 4 on the contoured card slot 2 to perform data transmission and signal interaction.

[0049] In which, the contoured slot 2 includes at least two limit members 3; the limit members 3 are arranged on the same side wall of the contoured slot 2; in an optional embodiment, the limit member 3 includes an elastic card member; in some other optional embodiments, the limit member 3 can also be a structure with a locking function such as a marble; and the limit members 3 can be respectively arranged on different side walls of the contoured slot 2, for example, respectively arranged on the left side wall, right side wall, upper side wall and lower side wall of the contoured slot 2, so as to achieve a stable connection effect; by setting the limit member 3, the disassembly and assembly of the SD card packaging sheet 10 and the shell 1 structure are more convenient and quick, and the packaging sheet can be repeatedly disassembled and assembled by fixing it with elastic card points, so that it does not need to be sent to the factory for ultrasonic welding, which greatly improves the efficiency of analysis and re-verification of test failures.

[0050] At the same time, a hollow exit portion 7 is provided on one side of the profiling slot 2, and the hollow exit portion 7 is connected to the profiling slot 2; and the limiter 3 is provided on the side wall of the profiling slot 2 on the side connected to the hollow exit portion 7. Figure 1 As shown, the two limiting members 3 are respectively arranged on the side walls of the contoured slot 2 close to the hollow exit portion 7, and are respectively arranged on both sides of the hollow exit portion 7.

[0051] In order to make it easier to remove the SD card encapsulation sheet 10 from the profiling card slot 2, a third hollow portion 8 is provided at the bottom of the profiling card slot 2 on the side communicating with the hollow exit portion 7; the length of the bottom of the profiling card slot 2 in the direction of the third hollow portion 8 is less than the length of the SD card encapsulation sheet 10. Figure 4 As shown, D2 represents the length of the bottom of the contoured card slot 2 in the direction of the third hollow portion 8, and D1 represents the length of the SD card encapsulation sheet 10, that is, a portion of the bottom of the SD card encapsulation sheet 10 is exposed at the third hollow portion 8, so that when the SD card encapsulation sheet 10 needs to be removed, the SD card encapsulation sheet 10 can be pushed out of the contoured card slot 2 through the ejection position formed by the third hollow portion 8.

[0052] Among them, a second hollow portion 5 is provided at the bottom of the contoured card slot 2, and the second hollow portion 5 corresponds to the position of the test output point (TX point) of the SD card packaging sheet 10; the TX point is used to capture the SD card log information. By setting the second hollow portion 5, it is convenient for the tester to scrape off the coating at this point, and then connect the TX point through a flying wire to read the SD card log, so that when a test failure occurs, it can be analyzed in combination with the log.

[0053] The second side of the housing 1 is also provided with a scraper groove 6, which is opposite the first side. The position of the scraper groove 6 corresponds to the position of the second hollow portion 5. This allows for the placement of a relatively long scraper, for example, to facilitate vertical placement when scraping off the coating at the TX point. The position of the scraper groove 6 can be adjusted or eliminated based on the location of the TX point and actual conditions. The first side of the housing 1 also features a hand grip groove 9, which allows the tester to easily remove the housing 1 from the test equipment's slot.

[0054] The usage of the above SD card test fixture is as follows:

[0055] Please refer to Figure 5 , place the SD card packaging sheet 10 into the contoured card slot 2 on the shell 1, and fix the SD card packaging sheet 10 through the limiter 3 in the contoured card slot 2. During the test, the gold finger 11 of the SD card packaging sheet 10 contacts and connects with the test equipment card point through the first hollow part 4 for data transmission and signal interaction, and the test log is captured and analyzed based on the TX point of the second hollow part 5; when the test is completed and the SD card packaging sheet 10 needs to be removed, the SD card packaging sheet 10 is pushed out of the contoured card slot 2 through the ejection position formed by the third hollow part 8, and the SD card packaging sheet 10 can be removed.

[0056] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent transformations made using the contents of the description and drawings of the present invention, or directly or indirectly applied in the relevant technical field, are also included in the patent protection scope of the present invention.

Claims

1. An SD card test fixture, characterized in that: including a housing; The surface of the first side of the housing is provided with a contoured card slot, and the contoured card slot carries an SD card packaging sheet; The side wall of the contoured slot is provided with a limiting piece; A first hollow portion is provided at the bottom of the contoured card slot, and the first hollow portion corresponds to the position of the gold finger of the SD card packaging sheet.

2. The SD card test fixture according to claim 1, characterized in that: comprising at least two of the aforementioned limiting members; The limiting member is arranged on the same side wall of the contoured slot.

3. An SD card test fixture according to claim 1 or 2, characterized in that: The limiting component includes an elastic clip.

4. The SD card test fixture according to claim 1, characterized in that: A second hollow portion is provided at the bottom of the contoured card slot, and the second hollow portion corresponds to the position of the test output point of the SD card packaging sheet.

5. The SD card test fixture according to claim 4, characterized in that: A scraper groove is provided on the surface of the second side of the housing, and the second side is an opposite side to the first side.

6. The SD card test fixture according to claim 5, characterized in that: The position of the scraper groove corresponds to the position of the second hollow portion.

7. The SD card test fixture according to claim 1, characterized in that: A hollow exit portion is provided on one side of the contoured card slot, and the hollow exit portion is communicated with the contoured card slot.

8. The SD card test fixture according to claim 7, characterized in that: The limiting member is arranged on the side wall on the side where the contoured slot is connected to the hollow exit portion.

9. An SD card test fixture according to claim 7 or 8, characterized in that: A third hollow portion is provided at the bottom of the side where the profiling slot communicates with the hollow exit portion; The length of the bottom of the contoured card slot in the direction of the third hollow portion is smaller than the length of the SD card packaging sheet.

10. The SD card test fixture according to claim 1, characterized in that: The surface of the first side of the shell is also provided with a hand-grip groove.

Images