Switching device compatible with test and card activation of storage equipment and card activation test system

Abstract

The utility model discloses a switching device compatible with test and card activation of storage equipment and a card activation test system. The switching device comprises a first SATA interface, a second SATA interface, a third SATA interface, a bus switch module and a controller, the bus switch module is respectively connected with the first SATA interface, the second SATA interface, the third SATA interface and the controller; the first SATA interface is used for accessing a storage device; the second SATA interface is used for accessing card activating equipment; the third SATA interface is used for accessing test equipment; the controller is used for outputting a gating signal to the bus switch module; and the bus switch module is used for connecting a signal channel between the second SATA interface and the first SATA interface or connecting a signal channel between the third SATA interface and the first SATA interface when receiving the gating signal. According to the invention, frequent plugging of the storage device to the card activating device and the test device depending on manpower can be avoided, and the mass production efficiency can be improved.

Description

Technical Field

[0001] The present application relates to the field of memory control technology, and in particular to an adapter device and a card activation test system for compatible storage device testing and card activation. Background Art

[0002] During the mass production of solid-state drives, the solid-state drives need to be opened and tested. However, the current opening and testing processes for solid-state drives generally require separate execution of each process, that is, a card opening device is used to electrically connect the solid-state drive, and the card opening device performs the card opening action on the solid-state drive alone. After the card opening process is completed, the staff connects the solid-state drive to the test device, and the test device performs the test operation on the solid-state drive. Therefore, during the opening and testing processes for solid-state drives, the staff needs to frequently plug the solid-state drive into the card opening device and the test device, which affects mass production efficiency and occupies manpower. Utility Model Content

[0003] In view of this, the present application provides an adapter device and a card activation test system that are compatible with storage device testing and card activation, so as to solve the problem that the card activation and testing processes of traditional solid-state hard drives affect mass production efficiency and occupy manpower.

[0004] The present application provides an adapter device for testing and opening a compatible storage device, the adapter device for testing and opening a compatible solid-state hard drive includes a first SATA interface, a second SATA interface, a third SATA interface, a bus switch module, and a controller; the bus switch module is respectively connected to the first SATA interface, the second SATA interface, the third SATA interface, and the controller;

[0005] The first SATA interface is used to access a storage device;

[0006] The second SATA interface is used to connect to the card opening device;

[0007] The third SATA interface is used to access the test equipment;

[0008] The controller is used to output a selection signal to the bus switch module;

[0009] The bus switch module is configured to connect the signal path between the second SATA interface and the first SATA interface or connect the signal path between the third SATA interface and the first SATA interface upon receiving the selection signal.

[0010] Optionally, the adapter device further includes a SATA to USB adapter board; the SATA to USB adapter board is connected to the second SATA interface and is used to access the card opening device through the USB interface.

[0011] Optionally, the adapter further includes an external port, and the external port is used to connect to a burning device.

[0012] Optionally, the bus switch module includes an analog switch chip.

[0013] Optionally, the analog switch chip includes a first group of differential signal pair pins, a second group of differential signal pair pins and a third group of differential signal pair pins; the first group of differential signal pair pins is used to connect the first SATA interface; the second group of differential signal pair pins is used to connect the second SATA interface; the third group of differential signal pair pins is used to connect the third SATA interface.

[0014] Optionally, the bus switch module includes an on / off pin; the on / off pin is used to receive a switch signal, and the switch signal is used to instruct the bus switch module to enter an enabled or disabled state.

[0015] Optionally, the bus switch module includes a selection pin; the selection pin is used to access the selection signal, and the selection signal is used to instruct the bus switch module to select the signal channel corresponding to the second SATA interface or the signal channel corresponding to the third SATA interface.

[0016] Optionally, the adapter device also includes a switching tube and a pull-up resistor; the control end of the switching tube is used to access the channel control signal, and is respectively connected to the first node of the switching tube, the first end of the pull-up resistor and the selection pin of the bus switch module, and the second node of the switching tube is grounded; the second end of the pull-up resistor is used to access the preset voltage.

[0017] The present application also provides a card activation test system, including a card activation device, a test device, and a switching device for testing and activating any of the above-mentioned compatible storage devices.

[0018] Optionally, the card opening device and the testing device are the same device.

[0019] In the above-mentioned adapter device and card activation test system for compatible storage device testing and card activation in the present application, the card activation device, test device and storage device (which can be a solid-state hard drive) are simultaneously connected through the first SATA interface, the second SATA interface and the third SATA interface, so that the signal channel between the second SATA interface 112 and the first SATA interface 111 is connected when the card activation process needs to be performed, and the signal channel between the third SATA interface 113 and the first SATA interface 111 is connected when the test process needs to be performed. This can avoid relying on manual frequent plugging of solid-state hard drives into card activation devices and test equipment, and can improve mass production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0021] Figure 1 This is a schematic diagram of the structure of an adapter device for testing and opening a compatible storage device according to an embodiment of the present application;

[0022] Figure 2 This is a schematic structural diagram of an adapter device for testing and opening a compatible storage device according to another embodiment of the present application;

[0023] Figure 3 This is a schematic structural diagram of an adapter device for testing and opening a compatible storage device according to another embodiment of the present application;

[0024] Figure 4 This is a schematic diagram of a bus switch module according to another embodiment of the present application. DETAILED DESCRIPTION

[0025] The following, in conjunction with the accompanying drawings, clearly and completely describes the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of this application. In the absence of conflict, the following embodiments and their technical features can be combined with each other.

[0026] The first aspect of the present application provides a compatible storage device (which may be a solid state drive, SSD) test and card opening adapter, reference Figure 1 As shown, the adapter for compatible storage device testing and card activation includes a first SATA interface 111, a second SATA interface 112, a third SATA interface 113, a bus switch module 120, and a controller 130. The bus switch module 120 is connected to the first SATA interface 111, the second SATA interface 112, the third SATA interface 113, and the controller 130, respectively.

[0027] It is understandable that the storage device can be a solid-state drive, UFS device, memory card, or other storage-related device that requires card activation, firmware burning, and testing. The embodiment of this application takes a solid-state drive as an example, but is not limited to this.

[0028] The first SATA interface 111 is used to access a solid-state drive; wherein the solid-state drive may be a SATA-type solid-state drive, and the first SATA interface 111 may support SATA-type solid-state drive plugging, so as to reliably access the solid-state drive through the first SATA interface 111.

[0029] The second SATA interface 112 is used to connect to a card opening device. The second SATA interface 112 can be connected to the card opening device through a related interface adapter module to improve the compatibility of the corresponding adapter device.

[0030] The third SATA interface 113 is used to access the test equipment; the third SATA interface 113 can be directly connected to the test equipment. For the test of the solid-state hard drive, for example, the CDM / H2 test needs to be performed at full speed. Using the SATA interface to directly access the test equipment can match the corresponding rate requirements.

[0031] The controller 130 is configured to output a strobe signal to the bus switch module 120; the controller 130 may be implemented using a component such as an MCU. Optionally, the controller 130 may output a strobe signal to the bus switch module 120 indicating that the signal path between the second SATA interface 112 and the first SATA interface 112 is connected during the card activation process, and may output a strobe signal to the bus switch module 120 indicating that the signal path between the third SATA interface 113 and the first SATA interface 112 is connected during the testing process.

[0032] The bus switch module 120 is configured to, upon receiving a selection signal, connect the signal path between the second SATA interface 112 and the first SATA interface 111 to connect the solid-state drive to the card activation device and perform a card activation process, or connect the signal path between the third SATA interface 113 and the first SATA interface 111 to connect the solid-state drive to the test device and perform a test process. The selection signal includes a first state and a second state. When the selection signal is in the first state, the bus switch module 120 connects the signal path between the second SATA interface 112 and the first SATA interface 111. When the selection signal is in the second state, the bus switch module 120 connects the signal path between the third SATA interface 113 and the first SATA interface 111. Optionally, the first state is a high level and the second state is a low level. In this case, when the selection signal is a high level, the bus switch module 120 connects the signal path between the second SATA interface 112 and the first SATA interface 111. When the selection signal is a low level, the bus switch module 120 connects the signal path between the third SATA interface 113 and the first SATA interface 111.

[0033] Specifically, the controller 130 is connected to the bus switch module 120, and is respectively connected to the first SATA interface 111 connected to the solid-state hard drive, the second SATA interface 112 connected to the card opening device, and the third SATA interface 113 connected to the test device through the bus switch module 120. A selection signal of the first state is first output to the bus switch module 120, and the bus switch module 120 connects the signal channel between the second SATA interface 112 and the first SATA interface 111, and the card opening device performs the card opening process on the solid-state hard drive. After the card opening device completes the card opening of the solid-state hard drive, the controller 130 outputs a selection signal of the second state to the bus switch module 120, and the bus switch module 120 connects the signal channel between the third SATA interface 113 and the first SATA interface 111, and the test device performs the test process on the solid-state hard drive.

[0034] The above-mentioned adapter device for compatible storage device testing and card activation is connected to the card activation device, testing equipment and solid-state hard disk at the same time through the first SATA interface 111, the second SATA interface 112 and the third SATA interface 113, so as to connect the signal channel between the second SATA interface 112 and the first SATA interface 111 when the card activation process needs to be performed, and connect the signal channel between the third SATA interface 113 and the first SATA interface 111 when the testing process needs to be performed. This can avoid relying on manual frequent plugging of the solid-state hard disk into the card activation device and the testing equipment, and can improve mass production efficiency.

[0035] In some embodiments, reference Figure 2 As shown, Figure 2 The layout of each component in the adapter is shown, but the connection relationship is not shown. The adapter also includes a SATA to USB adapter board 114; the SATA to USB adapter board 114 is connected to the second SATA interface 112 for accessing the card opening device via the USB interface.

[0036] The SATA to USB adapter board 114 can be used to convert the data format and signal protocol transmitted by the solid-state drive through the SATA interface into a data format and signal protocol that can be transmitted through the USB interface, thereby enabling the solid-state drive to be connected to a computer or other device through the USB interface.

[0037] In this embodiment, a SATA to USB adapter board 114 is set and connected at the second SATA interface 112, and an opening device can be accessed through the USB interface of the SATA to USB adapter board 114, thereby improving the compatibility with the opening card device and obtaining the USB hot-swappable function.

[0038] Optionally, refer to Figure 3As shown, the adapter further includes an external port 115, which is used to connect to a burning device. The burning device can burn a program into the adapter, and the controller 130 can execute the corresponding program. Optionally, the external port 115 is a USB interface.

[0039] Optionally, the adapter device may further include a power access module 116 , which is used to access an external power source to supply power to components such as the controller 130 .

[0040] In some embodiments, the bus switch module 120 includes an analog switch chip, wherein the analog switch chip may include a chip of a model such as PI3PCIE3212 IC.

[0041] Specifically, the pin diagram of the analog switch chip can be referred to Figure 4 As shown, it includes three groups of differential signal pair pins, namely the first group of differential signal pair pins, the second group of differential signal pair pins and the third group of differential signal pair pins; the first group of differential signal pair pins includes Figure 4 There are 4 pins in total, including A0+, A0-, A1+ and A1-. The second set of differential signal pair pins includes Figure 4 There are 4 pins in total, including C0+, C0-, C1+ and C1-. The third group of differential signal pair pins includes Figure 4 Specifically, the first group of differential signal pair pins is used to connect to the first SATA interface 111; the second group of differential signal pair pins is used to connect to the second SATA interface 112; and the third group of differential signal pair pins is used to connect to the third SATA interface 113.

[0042] Alternatively, as Figure 4 As shown, the bus switch module 120 also includes an on / off pin (ie Figure 4 The bus switch module 120 is configured to be connected to a bus 120 bus interface (hereinafter referred to as the bus 120 bus interface) by a pull-down resistor R81. The bus 120 bus interface (hereinafter referred to as the bus 120 bus interface) ...

[0043] Alternatively, as Figure 4 As shown, the bus switch module 120 includes a selection pin (ie Figure 4The SEL pin is used to select a signal path. The select pin can be connected to another GPIO port of the controller 130. The GPIO port of the controller 130 can output a channel control signal. The channel control signal is converted into a selection signal through the action of a related switch tube and resistor. The selection signal is directly input to the SEL pin. Specifically, the SEL pin is used to receive the selection signal, which is used to instruct the bus switch module 120 to select the signal channel corresponding to the second SATA interface 112 or the signal channel corresponding to the third SATA interface 113. When the SEL pin receives the selection signal in a low-level state, the signal channels A0+, A0-, A1+, and A1- are connected to B0+, B0-, B1+, and B1-, and the signal channel corresponding to the third SATA interface 113 is connected. When the SEL pin receives the selection signal in a high-level state, the signal channels A0+, A0-, A1+, and A1- are connected to C0+, C0-, C1+, and C1-, and the signal channel corresponding to the second SATA interface 112 is connected.

[0044] Furthermore, if Figure 4 As shown, the switching device also includes a switch tube Q12 (ie Figure 4 The control terminal (i.e., gate) of the NMOS transistor Q12 is used to receive the channel control signal and is respectively connected to the first node (i.e., drain) of the NMOS transistor Q12, the first end of the pull-up resistor R78, and the SEL pin of the bus switch module 120, with the second node (i.e., source) being grounded. The second end of the pull-up resistor R78 is used to receive a preset voltage. The preset voltage can be 3.3V. When the channel control signal is high, the selection signal at the SEL pin is low. When the channel control signal is low, the selection signal at the SEL pin is high. Specifically, Figure 4 As shown, when the SEL pin is connected to the drain of NMOS transistor Q12, the source of NMOS transistor Q12 is grounded, and the gate of NMOS transistor Q12 is connected to the channel control signal SEL_EN provided by controller 130, when the channel control signal SEL_EN is high, NMOS transistor Q12 is turned on, the SEL pin is pulled down to the ground level (low level), and the channel is directed from Group A (the first group of differential signal pair pins) to Group B (the third group of differential signal pair pins). When the channel control signal SEL_EN is low, NMOS transistor Q12 is turned off, and the SEL pin is pulled up to the preset voltage 3.3V power supply level (high level) through pull-up resistor R78, and the channel is directed from Group A (the first group of differential signal pair pins) to Group C (the second group of differential signal pair pins). This enables signal channel switching, connecting the signal channel of the SSD that has completed card activation to the test equipment, and continuing the test operation.

[0045] Specifically, in actual application, when the card opening action is to be performed, the card opening device can power on the second SATA interface 112 and can draw out the corresponding power supply signal 3V_MP from the power supply path. If the card opening device completes the card opening action, the card opening device is powered off, and a GPIO port of the controller 130 can be connected to the power supply signal 3V_MP to detect the power supply signal 3V_MP and determine whether the card opening is completed. For example, the controller 130 can determine that the card opening is completed when it detects that the power supply signal 3V_MP disappears, so that after it knows that the solid-state hard disk has completed the card opening action, it sets the channel control signal to a high level and switches the selection signal to a low level, thereby switching the selection signal; optionally, the controller 130 can also notify the test device, and the test device performs a test action on the solid-state hard disk.

[0046] The above-mentioned adapter device for compatible storage device testing and card activation is connected to the card activation device, test equipment and solid-state hard disk at the same time through the first SATA interface 111, the second SATA interface 112 and the third SATA interface 113, so as to connect the signal channel between the first SATA interface 111 and the second SATA interface 112 when the card activation process needs to be performed. When the card activation device completes the card activation of the solid-state hard disk, the solid-state hard disk can be switched to the test equipment corresponding to the third SATA interface 113, and the test equipment tests the solid-state hard disk, thereby realizing automatic testing after the solid-state hard disk card activation is completed, thereby improving mass production efficiency.

[0047] A second aspect of the present application provides a card activation test system, which can also be referred to as a device for debugging a storage device. The card activation test system includes a card activation device, a test device, and a compatible storage device testing and activation adapter as described in any of the above embodiments. The card activation device and the test device can be connected to the storage device simultaneously. After the card activation device completes activation of the storage device, the storage device can be switched to the corresponding test device, which then performs testing on the storage device.

[0048] Optionally, the card activation device and the test device are the same device, that is, the same device for debugging the solid-state hard disk has two functions: card activation and testing, which can enhance the function of the device corresponding to the debugging storage device.

[0049] The card activation test system includes the adapter device for compatible storage device testing and card activation described in any of the above embodiments, and has all the beneficial effects of the adapter device described in any of the above embodiments, which will not be repeated here.

[0050] Although the present application has been shown and described with respect to one or more implementations, equivalent variations and modifications will occur to those skilled in the art based on reading and understanding this specification and the accompanying drawings. The present application includes all such modifications and variations and is limited only by the scope of the appended claims. In particular, with respect to the various functions performed by the above-mentioned components, the terms used to describe such components are intended to correspond to any component (unless otherwise indicated) that performs the specified function of the component (e.g., it is functionally equivalent), even if it is not structurally equivalent to the disclosed structure that performs the function in the exemplary implementation of this specification shown herein.

[0051] That is, the above description is merely an embodiment of the present application and does not limit the patent scope of the present application. Any equivalent structural or equivalent process transformations made using the contents of the description and drawings of this application, such as the mutual combination of technical features between the various embodiments, or direct or indirect application in other related technical fields, are also included in the patent protection scope of the present application.

[0052] In addition, in the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present application. In addition, for structural elements with the same or similar characteristics, the present application may use the same or different reference numerals to identify them. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more features. In the description of the present application, "multiple" means two or more, unless otherwise clearly and specifically defined.

[0053] In this application, the word "exemplary" is used to mean "serving as an example, illustration or description". Any embodiment described in this application as "exemplary" is not necessarily to be construed as being more preferred or more advantageous than other embodiments. The above description is provided to enable any person skilled in the art to implement and use the present application. In the above description, various details are listed for the purpose of explanation. It should be understood that a person of ordinary skill in the art can recognize that the present application can be implemented without using these specific details. In other embodiments, well-known structures and processes will not be elaborated in detail to avoid obscuring the description of the present application with unnecessary details. Therefore, the present application is not intended to be limited to the embodiments shown, but is consistent with the widest scope consistent with the principles and features disclosed in this application.

Claims

1. A switching device for compatible storage device testing and card opening, characterized in that: The adapter includes a first SATA interface, a second SATA interface, a third SATA interface, a bus switch module and a controller; the bus switch module is respectively connected to the first SATA interface, the second SATA interface, the third SATA interface and the controller; The first SATA interface is used to access a storage device; The second SATA interface is used to connect to the card opening device; The third SATA interface is used to access the test equipment; The controller is used to output a selection signal to the bus switch module; The bus switch module is configured to connect a signal path between the second SATA interface and the first SATA interface or connect a signal path between the third SATA interface and the first SATA interface after receiving the selection signal.

2. The adapter for testing and opening a compatible storage device according to claim 1, characterized in that: The adapter device also includes a SATA to USB adapter board; the SATA to USB adapter board is connected to the second SATA interface and is used to access the card opening device through the USB interface.

3. The adapter for testing and opening a compatible storage device according to claim 2, characterized in that: The adapter also includes an external port, which is used to connect to a burning device.

4. The adapter for testing and opening a compatible storage device according to claim 1, characterized in that: The bus switch module includes an analog switch chip.

5. The adapter for testing and opening a compatible storage device according to claim 4, characterized in that: The analog switch chip includes a first group of differential signal pair pins, a second group of differential signal pair pins and a third group of differential signal pair pins; The first group of differential signal pair pins is used to connect to the first SATA interface; The second group of differential signal pair pins is used to connect to the second SATA interface; The third group of differential signal pair pins is used to connect to the third SATA interface.

6. The adapter for testing and opening a compatible storage device according to claim 1, characterized in that: The bus switch module includes an on / off pin; the on / off pin is used to receive a switch signal, and the switch signal is used to instruct the bus switch module to enter an enabled or disabled state.

7. The adapter for testing and opening a compatible storage device according to claim 1, characterized in that: The bus switch module includes a selection pin; the selection pin is used to receive the selection signal, and the selection signal is used to instruct the bus switch module to select the signal channel corresponding to the second SATA interface or the signal channel corresponding to the third SATA interface.

8. The adapter for testing and opening a compatible storage device according to claim 7, characterized in that: The switching device also includes a switch tube and a pull-up resistor; The control end of the switch tube is used to access the channel control signal, and is respectively connected to the first node of the switch tube, the first end of the pull-up resistor and the selection pin of the bus switch module. The second node of the switch tube is grounded; the second end of the pull-up resistor is used to access the preset voltage.

9. A card opening test system, characterized in that: The invention comprises a card opening device, a testing device and a switching device for testing and opening a compatible storage device as claimed in any one of claims 1 to 8.

10. The card opening test system according to claim 9, characterized in that: The card opening device and the testing device are the same device.

Images