Test fixture capable of rapidly switching data lines

Abstract

The utility model discloses a test fixture capable of rapidly switching data lines, which comprises a line switcher, a test system connector, a chip placing disc and a handheld test probe, and the line switcher is respectively connected with the test system connector, the chip placing disc and the handheld test probe. According to the utility model, diode testing is realized through the chip placing disc and the handheld testing probe, the testing disc is contacted with one end of the diode chip and is connected with the testing wire, and a tester holds the testing probe to contact the other end of the diode chip, so that the testing can be completed, and the testing is convenient and fast; the data lines are rapidly switched through the line switcher, and when the polarities of the diodes are opposite, the switching of the test data lines can be completed only by slightly pushing the change-over switch, so that the test is completed, and the test efficiency is greatly improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of diode testing, and in particular relates to a testing fixture capable of quickly switching data lines. Background Art

[0002] Currently, during the bare diode die test process, the polarity of the diode cannot be identified. Therefore, if the polarity is not tested correctly, the test probe position needs to be adjusted or the test data line needs to be switched. The operation steps are cumbersome and affect the test efficiency.

[0003] The existing handheld test fixture is in the shape of tweezers, with test probes at both ends. During the test, two test probes are needed to clamp the bare diode core to achieve electrical connection and complete the test. However, the diode is relatively small and not easy to clamp. At the same time, if the polarity is selected incorrectly, the chip needs to be turned over or the test probes need to be swapped to complete the test, which is cumbersome.

[0004] For example, the Chinese patent with announcement number CN214750445U discloses a universal ultra-small patch diode test fixture, including a test circuit board and a diode, a second electrode block is installed on the upper end of the test circuit board, a diode is detachably installed on the upper end of the test circuit board, first electrode blocks are fixedly installed on both sides of the lower end of the diode, the first electrode block fits with the second electrode block, and a clamping frame is installed on the upper end of the diode, which is U-shaped. The user places the diode on the test circuit board, and the user places the clamping frame on the diode. The insertion rod is inserted through the mounting block and the test circuit board, and one end of the movable card block is inclined. As the insertion rod is inserted, the movable card block shrinks into the inside of the mounting slot, compressing the fixing spring. When the mounting slot passes through the test circuit board, the movable card block pops out under the action of the fixing spring, so that the upper end of the movable card block fits with the lower end of the test circuit board, thereby facilitating the fixation of the diode. However, the fixture is difficult to clamp, requiring the user to align and clamp it. If the polarity is selected incorrectly, the chip needs to be turned over or the test probes need to be swapped to complete the test. The operation is cumbersome and the test efficiency is low.

[0005] Therefore, a diode test fixture is needed that can quickly switch the positive and negative poles of the data line to improve the efficiency of diode testing. Utility Model Content

[0006] In order to solve the above problems, the utility model provides a test fixture that can quickly switch data lines.

[0007] The utility model is achieved through the following technical solutions.

[0008] The utility model provides a test fixture capable of quickly switching data lines, comprising a line switcher, a test system connector, a chip placement tray and a handheld test probe, wherein the line switcher is connected to the test system connector, the chip placement tray and the handheld test probe respectively.

[0009] Preferably, the circuit switch includes an upper circuit board, a lower circuit board, contacts and a switch slide handle, the contacts are respectively arranged on the upper circuit board and the lower circuit board, the upper circuit board is slidably connected to the lower circuit board through the contacts, and the switch slide handle is connected to the upper circuit board.

[0010] Preferably, the circuit switch further includes a spring, an insulating block and a shell, the insulating block is arranged on the upper circuit board and the lower circuit board, the spring connects the insulating block and the shell, and the upper circuit board, the lower circuit board, the contacts and the insulating block are arranged in the shell.

[0011] Preferably, the housing is provided with an opening, and the switch sliding handle is arranged in the opening of the housing.

[0012] Preferably, a line A and a line B are provided on the upper circuit board, the contacts are respectively provided on the line A and the line B, and the line A and the line B are not connected.

[0013] Preferably, a circuit C and a circuit D are provided on the lower circuit board, and the contacts are provided on the circuit C and the circuit D respectively.

[0014] Preferably, the test system connector is connected to the lower circuit board, and the chip placement tray and the handheld test probe are respectively connected to the upper circuit board.

[0015] Preferably, the chip placement pad is electrically conductive.

[0016] The beneficial effects of the present invention are:

[0017] 1. The diode test is realized by using the chip placement tray and handheld test probe. The test tray contacts one end of the diode chip and connects the test line. The tester touches the other end of the diode chip with the handheld test probe to complete the test. The test is convenient and fast.

[0018] 2. The data line can be quickly switched through the line switch. When the polarity of the diode is opposite, just push the switch gently to complete the switching of the test data line and then complete the test, which greatly improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a schematic diagram of the overall structure provided by an embodiment of the present utility model;

[0020] Figure 2 This is a schematic diagram of the circuit switch structure provided by an embodiment of the present utility model;

[0021] Figure 3 This is a schematic structural diagram of an upper circuit board and a lower circuit board provided by an embodiment of the present utility model.

[0022] In the figure: 1-line switch, 2-test system connector, 3-chip placement tray, 4-handheld test probe, 5-upper circuit board, 6-lower circuit board, 7-contact, 8-switch slider, 9-spring, 10-housing, 11-line A, 12-line B, 13-line C, 14-line D, 15-insulation block. DETAILED DESCRIPTION

[0023] The technical solution of the present invention is further described below, but the scope of protection claimed is not limited to the described solution.

[0024] like Figure 1 As shown, a test fixture that can quickly switch data lines includes a line switcher 1, a test system connector 2, a chip placement tray 3 and a handheld test probe 4. The line switcher 1 is connected to the test system connector 2, the chip placement tray 3 and the handheld test probe 4 respectively.

[0025] Connect the test system connector 2 to the test system, place the diode bare die on the chip placement tray 3, contact the chip placement tray 3 with one end of the chip and connect the test line, and touch the handheld test probe 4 to the other end of the chip to complete the test.

[0026] If the diode polarity is opposite to that of the test system and the required data cannot be measured, the line switch 1 can be used to adjust the diode polarity and the test system to be consistent, eliminating the need to frequently unplug wires or rotate diodes, thereby improving test efficiency.

[0027] like Figure 2 As shown, the circuit switch 1 includes an upper circuit board 5, a lower circuit board 6, contacts 7 and a switch slide 8. The contacts 7 are respectively arranged on the upper circuit board 5 and the lower circuit board 6. The upper circuit board 5 is slidably connected to the lower circuit board 6 through the contacts 7, and the switch slide 8 is connected to the upper circuit board 5.

[0028] The line switch 1 can switch the test data line and then complete the test by simply pushing the switch slide handle 8, which greatly improves the test efficiency.

[0029] The line switcher 1 also includes a spring 9, an insulating block 15 and a shell 10. The insulating block 15 is arranged on the upper circuit board 5 and the lower circuit board 6. The spring 9 connects the insulating block 15 and the shell 10. The upper circuit board 5, the lower circuit board 6, the contact 7 and the insulating block 15 are arranged in the shell 10.

[0030] The housing 10 ensures the stability of the internal structure of the circuit switcher 1 , and the insulating block 15 prevents the circuits on the upper circuit board 5 and the lower circuit board 6 from being disturbed.

[0031] The spring 9 supports the insulating block 15 and the lower circuit board 6 so that the upper circuit board 5 and the lower circuit board 6 are squeezed by elastic force, thereby making the upper circuit board 5 and the lower circuit board 6 fully contact each other and ensuring stable electrical connection.

[0032] The housing 10 is provided with an opening, and the switch sliding handle 8 is disposed in the opening of the housing 10 .

[0033] A portion of the switch slide handle 8 is outside the housing 10 , which is convenient for personnel to operate and thereby control the circuit switch 1 .

[0034] like Figure 3 As shown, the upper circuit board 5 is provided with a circuit A11 and a circuit B12, and the contacts 7 are respectively provided on the circuit A11 and the circuit B12, and the circuit A11 and the circuit B12 are not connected.

[0035] The lower circuit board 6 is provided with a circuit C13 and a circuit D14 , and the contacts 7 are respectively provided on the circuit C13 and the circuit D14 .

[0036] The test system connector 2 is connected to the lower circuit board 6 , and the chip placement tray 3 and the handheld test probe 4 are respectively connected to the upper circuit board 5 .

[0037] The circuit switching principle: Pushing the switch handle to the left causes the left contact 7 of the upper circuit board 5 to contact the left contact 7 of the lower circuit board 6, connecting lines A11 and C13, and lines B12 and D14. When the lines need to be switched, pushing the switch handle 8 to the right causes the right contact 7 of the upper circuit board 5 to contact the right contact 7 of the lower circuit board 6, connecting lines A11 and D14, and lines B12 and C13, thereby switching the lines and achieving the purpose of rapid switching. During the circuit switching process, the misalignment of contact 7 achieves isolation between the circuit contacts. At the same time, four springs 9 installed on the lower circuit board ensure effective contact of contacts 7.

[0038] The chip placement pad 3 is conductive.

[0039] The chip placement plate 3 is conductive, thereby achieving the function of the chip placement plate 3 contacting one end of the diode chip and connecting the test line.

[0040] The utility model realizes diode testing through a chip placement tray and a handheld test probe. The test tray contacts one end of the diode chip and is connected to the test line. The tester touches the other end of the diode chip with the handheld test probe to complete the test. The test is convenient and fast. The line switcher is used to quickly switch the data line. When the polarity of the diode is opposite, the test data line can be switched by gently pushing the switch, thereby completing the test, which greatly improves the test efficiency.

Claims

1. A test fixture capable of quickly switching data lines, characterized in that: The invention comprises a circuit switch (1), a test system connector (2), a chip placement tray (3) and a handheld test probe (4); the circuit switch (1) is connected to the test system connector (2), the chip placement tray (3) and the handheld test probe (4) respectively.

2. The test fixture according to claim 1, wherein: The circuit switch (1) comprises an upper circuit board (5), a lower circuit board (6), a contact (7) and a switch slide (8); the contact (7) is respectively arranged on the upper circuit board (5) and the lower circuit board (6); the upper circuit board (5) is slidably connected to the lower circuit board (6) via the contact (7); and the switch slide (8) is connected to the upper circuit board (5).

3. The test fixture according to claim 2, wherein: The circuit switch (1) further comprises a spring (9), an insulating block (15) and a housing (10); the insulating block (15) is arranged on an upper circuit board (5) and a lower circuit board (6); the spring (9) connects the insulating block (15) and the housing (10); and the upper circuit board (5), the lower circuit board (6), the contact (7) and the insulating block (15) are arranged in the housing (10).

4. The test fixture according to claim 3, wherein: The housing (10) is provided with an opening, and the switch sliding handle (8) is arranged in the opening of the housing (10).

5. The test fixture according to claim 2, wherein: The upper circuit board (5) is provided with a circuit A (11) and a circuit B (12), the contacts (7) are respectively provided on the circuit A (11) and the circuit B (12), and the circuit A (11) and the circuit B (12) are not connected.

6. The test fixture according to claim 2, wherein: The lower circuit board (6) is provided with a circuit C (13) and a circuit D (14), and the contacts (7) are respectively provided on the circuit C (13) and the circuit D (14).

7. The test fixture according to claim 2, wherein: The test system connector (2) is connected to a lower circuit board (6), and the chip placement tray (3) and the handheld test probe (4) are respectively connected to an upper circuit board (5).

8. The test fixture according to claim 1, wherein: The chip placement plate (3) is conductive.

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