Memory detection system

Abstract

The utility model belongs to the technical field of memory detection, and discloses a memory detection system, which comprises a memory test seat and a buckle type cover body, and further comprises a detection structure arranged on the memory test seat and used for detecting and distributing a memory; the detection structure comprises a test platform and conveying structures, the test platform is arranged at the top of the memory test seat, the conveying structures are arranged on the memory test seat and located on the two sides of the test platform, a cavity is formed in the memory test seat, a fixing rod is installed in the cavity, and the fixing rod is connected with the memory test seat. The outer surface of the fixing rod is sleeved with a movable frame and a reset spring, a driving motor is arranged in the memory testing seat, and a conveying wheel is installed at the end of an output shaft of the driving motor. And the memory can be driven to move through rotation of the conveying wheel and is separated from the memory testing seat, so that qualified memory chips can be automatically screened out.

Description

Technical Field

[0001] The utility model belongs to the technical field of memory detection, in particular to a memory detection system. Background Art

[0002] With the continuous development of computer technology, the capacity and performance of computer memory are getting higher and higher, but the probability of memory failure does not decrease. Therefore, in order to ensure the normal operation of the computer, memory testing is particularly important.

[0003] During memory production, memory chips need to be tested. However, in the prior art, the memory needs to be placed on a test platform for positioning. After the test is completed, the memory is taken out and replaced with another set of memory for positioning. In addition, after each memory test, staff need to observe the test data on the screen to judge the test results. It is difficult to intuitively distinguish the test results of the memory to screen qualified and unqualified products. Utility Model Content

[0004] In order to solve the problems raised in the above background technology, the present invention provides a memory detection system, which has the advantage of being able to quickly identify whether a memory is qualified.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solution: a memory detection system, comprising a memory test socket and a snap-on cover, and further comprising:

[0006] A detection structure is provided on the storage test seat and is used to detect the storage and separate materials;

[0007] Among them, the detection structure includes a test platform, which is arranged on the top of the memory test seat, and also includes a conveying structure, which is arranged on the memory test seat and located on both sides of the test platform. A cavity is opened inside the memory test seat, and a fixed rod is installed inside the cavity. The outer surface of the fixed rod is sleeved with a movable frame and a reset spring. A drive motor is provided inside the memory test seat, and a conveying wheel is installed at the end of the output shaft of the drive motor, and a cam is installed on the outer surface of the output shaft of the drive motor.

[0008] Preferably, the outer surfaces of the conveying wheels are bonded with rubber, and the two groups of conveying wheels are in press contact with the memory chip.

[0009] Preferably, the conveying structure can be blocked by a movable frame when conveying the memory chip.

[0010] Preferably, the cam is in press contact with the movable frame.

[0011] Preferably, the return spring is elastically supported between the movable frame and the cavity.

[0012] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0013] The utility model can transport the memory from one side of the memory test seat to the top of the test platform through the conveying structure and limit the movement of the memory chip through the movable frame. At this time, the memory will be tested. If the memory is qualified, the operation of the driving motor will cause the conveying wheel and the cam to rotate. When the cam squeezes the movable frame, it will drive the movable frame to move along the outer surface of the fixed rod and release the obstruction to the memory. At this time, the rotation of the conveying wheel will drive the memory to move and separate from the memory test seat, and the qualified memory chips can be automatically screened out. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a schematic diagram of the system principle of the utility model;

[0015] Figure 2 This is a schematic diagram of the structure of the utility model;

[0016] Figure 3 This is a schematic cross-sectional structural diagram of the bottom of the utility model;

[0017] Figure 4 For this utility model Figure 3 Schematic diagram of the enlarged structure at A in the middle;

[0018] Figure 5 This is a schematic diagram of the disassembly structure of the movable frame of the utility model.

[0019] In the figure: 1. Memory test socket; 2. Snap-on cover; 3. Conveying structure; 4. Cavity; 5. Fixing rod; 6. Movable frame; 7. Return spring; 8. Driving motor; 9. Conveying wheel; 10. Cam; 11. Test platform. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0021] like Figures 1 to 5 As shown, the present invention provides a memory detection system, including a memory test socket 1 and a snap-on cover 2, and further comprising:

[0022] A detection structure, which is provided on the memory test seat 1 and is used to detect the memory and separate the materials;

[0023] Among them, the detection structure includes a test platform 11, which is arranged on the top of the memory test seat 1, and also includes a conveying structure 3, which is arranged on the memory test seat 1 and is located on both sides of the test platform 11. A cavity 4 is opened inside the memory test seat 1, and a fixed rod 5 is installed inside the cavity 4. The outer surface of the fixed rod 5 is sleeved with a movable frame 6 and a reset spring 7. A drive motor 8 is provided inside the memory test seat 1, and a conveying wheel 9 is installed at the end of the output shaft of the drive motor 8. A cam 10 is installed on the outer surface of the output shaft of the drive motor 8.

[0024] The conveying structure 3 can transport the memory from one side of the memory test seat 1 to the top of the test platform 11 and limit the movement of the memory chip through the movable frame 6. At this time, the memory will be tested. If the memory is qualified, the operation of the drive motor 8 will cause the conveying wheel 9 and the cam 10 to rotate. When the cam 10 squeezes the movable frame 6, it will drive the movable frame 6 to move along the outer surface of the fixed rod 5 and release the obstruction to the memory. At this time, the rotation of the conveying wheel 9 will drive the memory to move and separate from the memory test seat 1.

[0025] The outer surface of the conveying wheel 9 is bonded with rubber, and the two groups of conveying wheels 9 are in press contact with the memory chip.

[0026] The design of the conveying wheel 9 allows the memory chip to move when the conveying wheel 9 rotates. At the same time, the rubber provided on the outer surface of the conveying wheel 9 prevents the memory chip from being damaged when it is squeezed by the conveying wheel 9.

[0027] The transport structure 3 can be blocked by the movable frame 6 when transporting the memory chips.

[0028] Through the design of the movable frame 6 , one side of the memory chip can be blocked, so that the memory chip can be moved to a position corresponding to the test platform 11 .

[0029] The cam 10 is in press contact with the movable frame 6 .

[0030] Through the cooperation between the cam 10 and the movable frame 6, when the cam 10 presses the movable frame 6, the movable frame 6 will be driven to move along the outer surface of the fixed rod 5, thereby driving the movable frame 6 to release the obstruction of the memory chip.

[0031] The return spring 7 is elastically supported between the movable frame 6 and the cavity 4 .

[0032] The design of the reset spring 7 enables the movable frame 6 to have good elastic reset performance. At this time, since the reset spring 7 is in a compressed state, it will apply an elastic force to the movable frame 6, thereby driving the movable frame 6 to block the memory chip.

[0033] The working principle and use process of this utility model:

[0034] By placing the memory chip on the test platform 11 and rotating the snap-on cover 2 to close the memory test seat 1, and by setting the test parameters on the computer device and transmitting the test data of the test platform to the computer device, the data of the memory can be tested and the function of the memory can be detected. After the memory detection is completed, the computer determines whether the product is qualified. If it is qualified, the drive motor 8 is driven to run. The operation of the drive motor 8 will cause the conveying wheel 9 and the cam 10 to rotate. When the cam 10 squeezes the movable frame 6, the movable frame 6 will be separated from the memory chip. At the same time, the rotation of the conveying wheel 9 will drive the memory to move, and then the memory can be conveyed by the conveying structure 3, so that the memory chip is automatically discharged from one side of the memory test seat 1. If the memory chip is unqualified, it will not be discharged, and it is necessary to open the snap-on cover 2 to take out the memory chip.

[0035] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus.

[0036] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A memory detection system, comprising a memory test socket (1) and a snap-on cover (2), characterized in that: Also includes: A detection structure is provided on the storage test seat (1) and is used for detecting the storage and dividing the material; The detection structure includes a test platform (11), which is arranged on the top of a memory test seat (1), and a conveying structure (3), which is arranged on the memory test seat (1) and located on both sides of the test platform (11). A cavity (4) is provided inside the memory test seat (1), a fixing rod (5) is installed inside the cavity (4), and a movable frame (6) and a reset spring (7) are sleeved on the outer surface of the fixing rod (5). A drive motor (8) is provided inside the memory test seat (1), a conveying wheel (9) is installed at the end of the output shaft of the drive motor (8), and a cam (10) is installed on the outer surface of the output shaft of the drive motor (8).

2. The memory detection system according to claim 1, wherein: The outer surfaces of the conveying wheels (9) are bonded with rubber, and the two groups of conveying wheels (9) are in extrusion contact with the memory chip.

3. The memory detection system according to claim 1, wherein: The conveying structure (3) can be blocked by a movable frame (6) when conveying the memory chip.

4. The memory detection system according to claim 1, wherein: The cam (10) is in extrusion contact with the movable frame (6).

5. The memory detection system according to claim 1, wherein: The return spring (7) is elastically supported between the movable frame (6) and the cavity (4).

Images