Test probe

Abstract

The embodiment of the utility model discloses a test probe. The test probe comprises a first probe head, a second probe head, a first shell, a second shell, a conductive support, a first elastic piece and a second elastic piece, the first needle head is arranged on the first shell in a sliding mode in the first direction, and the second needle head is arranged on the second shell in a sliding mode in the first direction. The first shell and / or the second shell are / is connected with the conductive support in an inserting manner; the tail part of the first needle head and the tail part of the second needle head are electrically connected with the conductive support through two electric connecting wires respectively; the head of the first needle head and / or the head of the second needle head are / is provided with a contact head. According to the embodiment of the invention, the first probe head and / or the second probe head can be supported on the electric connection point more stably and reliably, the test precision of the test probe is improved, the test application range of the test probe is widened, and the test probe meets the requirement of precision test.

Description

Technical Field

[0001] The present application relates to the field of semiconductor detection technology, and in particular to a test probe. Background Art

[0002] Semiconductor test probes are widely used in chips, mobile phones, computers, consumer electronics and other technical fields. They are high-end electronic components with very strict testing requirements.

[0003] A semiconductor test probe typically consists of a needle shaft, a needle tube, and a spring. The shaft and spring are housed within the tube. The two ends of the tube are secured together by either riveting or by using compression at one end and tapping at the other, forming a single unit. During use, the spring is compressed against the shaft, pushing it into the tube. The spring's elastic force then pushes against the shaft, ensuring contact between the shaft and the device under test, allowing testing to proceed.

[0004] However, when the existing semiconductor test probe is used, the instantaneous disconnection phenomenon between the movable needle and the spring will cause inaccurate test data such as current and resistance during the test process, thereby seriously affecting the test accuracy of the semiconductor test probe and the test application range of the semiconductor test probe, resulting in the problem that it cannot be used under precision testing requirements. Utility Model Content

[0005] The present application aims to solve at least one of the technical problems existing in the prior art. To this end, the present application proposes a test probe to improve the test accuracy and test application range of the test probe, and to make the test probe meet the requirements of precision testing.

[0006] The present application provides a test probe, comprising: a first needle, a second needle, a first shell, a second shell, a conductive support, a first elastic member, and a second elastic member;

[0007] The first needle is slidably disposed on the first housing along a first direction, and the second needle is slidably disposed on the second housing along the first direction;

[0008] The first shell and / or the second shell are plug-connected to the conductive support;

[0009] The tail of the first needle and the tail of the second needle are electrically connected to the conductive support through two electrical connection wires, and the tail of the first needle and the tail of the second needle are elastically offset against two ends of the conductive support through the first elastic member and the second elastic member respectively;

[0010] A contact head is provided at the head of the first needle and / or the head of the second needle, and a projection of the first needle and / or the second needle in the first direction is located within the projection range of the contact head.

[0011] Based on the test probe, the first needle and the second needle realize the contact connection between the test probe and the two electrical connection points, and the two needles are connected through the conductive support and the electrical connection line. The test probe can also be provided with a contact head on the head of the first needle and / or the second needle. With the assistance of the elastic force of the first elastic part and the second elastic part, the first needle and / or the second needle can be more stably and reliably supported on the electrical connection point, thereby improving the test accuracy of the test probe and the test application range of the test probe, so that the test probe meets the requirements of precision testing.

[0012] Optionally, the first housing is provided with a first support cylinder sleeved on the outside of the first needle, and the diameter of the first support cylinder matches the diameter of the first needle.

[0013] and / or,

[0014] The second housing is provided with a second supporting cylinder sleeved on the outside of the second needle, and the diameter of the second supporting cylinder matches the diameter of the second needle.

[0015] Furthermore, based on the first support tube and the second support tube arranged on the above-mentioned first shell and the second shell, a sliding track extending along the first direction can be provided for the first needle and the second needle, thereby improving the stability of the first needle and the second needle when sliding in the first direction, reducing the shaking of the first needle and the second needle when sliding, and ensuring that the head of the first needle and the second needle always have a contact plane parallel to the electrical connection point.

[0016] Optionally, at least a portion of the first elastic member extends into the interior of the first supporting tube.

[0017] and / or,

[0018] At least a portion of the second elastic member extends into the interior of the second supporting tube.

[0019] Furthermore, based on the above-mentioned test probe, the inner wall of the first support tube can support and limit the peripheral side of the end of the first elastic member, and the inner wall of the second support tube can support and limit the peripheral side of the end of the second elastic member, so that the end of the elastic member can be reliably and stably connected to the needle.

[0020] Optionally, the first elastic member is a cylindrical spring, and the diameter of the first elastic member matches the diameter of the first supporting tube.

[0021] and / or,

[0022] The second elastic member is a cylindrical spring, and the diameter of the second elastic member matches the diameter of the second supporting tube.

[0023] Furthermore, based on the above-mentioned test probe, the elastic part can be plugged into the inner wall of the support tube, further improving the connection stability between the elastic part and the needle, as well as the stability of the elastic support generated by the elastic part when the needle slides in the first direction (the elastic part can provide a stable elastic force in the first direction).

[0024] Optionally, the conductive support is provided with a first receiving groove for plugging and matching with the first elastic member, and the diameter of the first elastic member matches the diameter of the first receiving groove.

[0025] and / or,

[0026] The conductive support is provided with a second receiving groove for plugging and matching with the second elastic member, and the diameter of the second elastic member matches the diameter of the second receiving groove.

[0027] Furthermore, based on the above-mentioned test probe, the circumferential sides of both ends of the first elastic member and the circumferential sides of both ends of the second elastic member can be limited and supported, further improving the stability of the elastic supporting force of the elastic member on the needle tip, and making the elastic deformation process of the first elastic member and the second elastic member more controllable.

[0028] Optionally, the first elastic member forms an electrical connection line for electrically connecting the first needle and the conductive support.

[0029] and / or,

[0030] The second elastic member forms an electrical connection line for electrically connecting the second needle and the conductive support.

[0031] Furthermore, based on the above elastic member, the structure of the entire test probe can be made simpler, and fatigue of the connecting wire caused by following the movement of the needle can be avoided, which would affect the service life and reliability of the test probe.

[0032] Optionally, the first supporting tube is made of a conductive material, the first elastic member and the first supporting tube have at least two electrical connection points, and the first elastic member and the first receiving groove have at least two electrical connection points.

[0033] and / or,

[0034] The second supporting tube is made of a conductive material. The second elastic member and the second supporting tube have at least two electrical connection points. The second elastic member and the second receiving groove have at least two electrical connection points.

[0035] Furthermore, based on the above-mentioned test probe, redundant settings of electrical connection points between the first elastic member and the first support tube and the first needle can be achieved, and redundant settings of electrical connection points between the second elastic member and the second support tube and the second needle can also be achieved, thereby improving the reliability of charge transfer from the needle to the conductive support or from the conductive support to the needle.

[0036] Optionally, a first limiting structure is provided between the first needle and the first supporting tube, and the first limiting structure is used to limit the range of movement of the first needle relative to the first supporting tube in the first direction.

[0037] and / or,

[0038] A second limiting structure is provided between the second needle and the second supporting tube, and the second limiting structure is used to limit the range of movement of the second needle relative to the second supporting tube in the first direction.

[0039] Furthermore, based on the above-mentioned first limiting structure and second limiting structure, the first needle can be prevented from falling off from the first support tube when moving along the first direction, and the second needle can be prevented from falling off from the second support tube when moving along the first direction, thereby improving the connection reliability between the needle and the support tube and the flexibility of loading and unloading.

[0040] Optionally, the test probe further includes a sleeve, which is coaxially sleeved on the outside of the first shell and the second shell, and the first shell and the second shell are both detachably connected to the sleeve.

[0041] Furthermore, based on the above-mentioned sleeve, a reliable connecting shell can be provided for the first shell and the second shell. The sleeve connects the test probe into a complete and reliable integrated structure. The outer wall of the sleeve can be provided with anti-slip grooves or coated with anti-slip material. The sleeve itself is made of insulating material. The sleeve can be used as a gripping part for the user. It can not only provide support and fixation for all structures in the test probe, but also facilitate the user's operation, thereby improving the convenience and safety of the test probe when used.

[0042] Optionally, the first shell and the second shell are both threadedly connected to the inner wall of the sleeve, and an elastic buffer pad is provided between the first shell and the second shell, and the end of the first shell and the end of the second shell respectively abut against the two ends of the buffer pad, so that the buffer pad is squeezed and deformed in the first direction.

[0043] Furthermore, based on the above-mentioned test probe, the flexibility and applicability of the test probe can be significantly improved. Through the setting of the buffer pad, when the first shell and the second shell move to the extreme position, the squeezing of the buffer pad and the elastic force generated by the buffer pad itself can be utilized to make the threaded connection between the first shell and the second shell and the sleeve more stable, increase the friction force of the threads between each other, and improve the self-locking effect.

[0044] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] The disclosure of this application will be more easily understood with reference to the accompanying drawings. Those skilled in the art will readily appreciate that these drawings are for illustrative purposes only and are not intended to limit the scope of protection of this application. Furthermore, similar numbers in the figures represent similar components, where:

[0046] Figure 1 This is a schematic diagram of the structure of the test probe according to an embodiment of the present application;

[0047] Figure 2 for Figure 1 A partial enlarged view of point A in the middle.

[0048] Description of Reference Numerals

[0049] 11. First needle; 12. Second needle; 13. Contact head; 21. First shell; 211. First support tube; 22. Second shell; 221. Second support tube; 23. Sleeve; 3. Conductive support; 31. First accommodating groove; 32. Second accommodating groove; 41. First elastic member; 42. Second elastic member; 5. Buffer pad; 61. First limit block; 62. First limit groove; 63. Second limit block. DETAILED DESCRIPTION

[0050] Some embodiments of the present application are described below with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present application and are not intended to limit the scope of protection of the present application.

[0051] When using existing semiconductor test probes, the instantaneous disconnection phenomenon between the movable needle and the spring will cause inaccurate test data such as current and resistance during the test process, thereby seriously affecting the test accuracy and test application range of the semiconductor test probe, resulting in the problem that it cannot be used under precision testing requirements.

[0052] Based on this, the present application provides a test probe, in which a first needle and a second needle realize contact connection between the test probe and two electrical connection points, and the two needles are connected through a conductive support and an electrical connection line. The test probe can also be provided with a contact head on the head of the first needle and / or the second needle, and with the assistance of the elastic force of the first elastic part and the second elastic part, the first needle and / or the second needle can be more stably and reliably supported on the electrical connection point, thereby improving the test accuracy of the test probe and the test application range of the test probe, so that the test probe meets the requirements of precision testing.

[0053] The present application will be described in detail below through specific embodiments.

[0054] Reference Figure 1 and Figure 2 As shown, this embodiment provides a test probe, including: a first needle 11, a second needle 12, a first shell 21, a second shell 22, a conductive support 3, a first elastic member 41 and a second elastic member 42; the first needle 11 is slidably arranged on the first shell 21 along the first direction, and the second needle 12 is slidably arranged on the second shell 22 along the first direction; the first shell 21 and / or the second shell 22 are plug-connected with the conductive support 3, thereby forming a complete integrated test probe structure, and the first shell 21 and / or the second shell 22 can be specifically connected to the conductive support 3 by means of threading, clamping, sliding plugging, etc., so that the three can be connected into a stable and firm integrated structure; the tail of the first needle 11 and the tail of the second needle 12 The first and second needles 11 and 12 are electrically connected to the conductive support 3 through two electrical connection lines, and the tail of the first needle 11 and the tail of the second needle 12 are elastically pressed against the two ends of the conductive support 3 through the first elastic member 41 and the second elastic member 42 respectively; the head of the first needle 11 and / or the head of the second needle 12 is provided with a contact head 13, wherein the head of the first needle 11 and the head of the second needle 12 refer to the positions where the first needle 11 and the second needle 12 contact the electrical connection point, that is, the ends of the two extending to the outside of the test probe, and the projection of the first needle 11 and / or the second needle 12 in the first direction is located within the projection range of the contact head 13, that is, the contact head 13 can provide a larger support area for the first needle 11 and / or the second needle 12.

[0055] The test probe provided in this embodiment has a first needle 11 and a second needle 12 that realize contact connection between the test probe and two electrical connection points, and the two needles are connected through the conductive support 3 and the electrical connection line. The test probe can also use the contact head 13 set on the head of the first needle 11 and / or the second needle 12 to assist the elastic force of the first elastic member 41 and the second elastic member 42 to enable the first needle 11 and / or the second needle 12 to be more stably and reliably supported on the electrical connection point, thereby improving the test accuracy of the test probe and the test application range of the test probe, so that the test probe meets the requirements of precision testing.

[0056] In some embodiments, the first shell 21 is provided with a first support tube 211 which is sleeved on the outside of the first needle 11, and the diameter of the first support tube 211 matches the diameter of the first needle 11. Optionally, the inner diameter of the first support tube 211 is the same as the outer diameter of the first needle 11, and / or, the second shell 22 is provided with a second support tube 221 which is sleeved on the outside of the second needle 12, and the diameter of the second support tube 221 matches the diameter of the second needle 12. Optionally, the inner diameter of the second support tube 221 is the same as the outer diameter of the second needle 12.

[0057] Optionally, the first support tube 211 can be integrally formed with the first shell 21, or can be fixedly installed on the first shell 21. The first support tube 211 can be made of the same material as the first shell 21, or can be made of two different materials. The second support tube 221 can be integrally formed with the second shell 22, or can be fixedly installed on the second shell 22. The second support tube 221 can be made of the same material as the second shell 22, or can be made of two different materials.

[0058] Furthermore, based on the first support cylinder 211 and the second support cylinder 221 set on the above-mentioned first shell 21 and the second shell 22, a sliding track extending along the first direction can be provided for the first needle 11 and the second needle 12, thereby improving the stability of the first needle 11 and the second needle 12 when sliding in the first direction, reducing the shaking of the first needle 11 and the second needle 12 when sliding, and ensuring that the head of the first needle 11 and the head of the second needle 12 always have a contact plane parallel to the electrical connection point.

[0059] Continue to refer to Figure 1 and Figure 2 As shown, at least a portion of the first elastic member 41 extends into the interior of the first support tube 211 , and / or at least a portion of the second elastic member 42 extends into the interior of the second support tube 221 .

[0060] Furthermore, based on the above-mentioned test probe, the inner wall of the first support tube 211 can support and limit the peripheral side of the end of the first elastic member 41, and the inner wall of the second support tube 221 can support and limit the peripheral side of the end of the second elastic member 42, so that the end of the elastic member can be reliably and stably connected to the needle.

[0061] In some embodiments, the first elastic member 41 is a cylindrical spring, the diameter of the first elastic member 41 matches the diameter of the first support tube 211, optionally, the inner diameter of the first support tube 211 is the same as the outer diameter of the first elastic member 41, and / or, the second elastic member 42 is a cylindrical spring, the diameter of the second elastic member 42 matches the diameter of the second support tube 221, optionally, the inner diameter of the second support tube 221 is the same as the outer diameter of the second elastic member 42.

[0062] Furthermore, based on the above-mentioned test probe, the elastic part can be plugged into the inner wall of the support tube, further improving the connection stability between the elastic part and the needle, as well as the stability of the elastic support generated by the elastic part when the needle slides in the first direction (the elastic part can provide a stable elastic force in the first direction).

[0063] Continue to refer to Figure 1 As shown, the conductive support 3 is provided with a first receiving groove 31 that is plugged into and fits with the first elastic member 41, and the diameter of the first elastic member 41 matches the diameter of the first receiving groove 31, and / or, the conductive support 3 is provided with a second receiving groove 32 that is plugged into and fits with the second elastic member 42, and the diameter of the second elastic member 42 matches the diameter of the second receiving groove 32.

[0064] It should be understood that the first receiving groove 31 is coaxially arranged with the first supporting tube 211, and the inner walls thereof have the same diameter, and the second receiving groove 32 is coaxially arranged with the second supporting tube 221, and the inner walls thereof have the same diameter.

[0065] Based on the above-mentioned test probe, the circumferential sides at both ends of the first elastic member 41 and the circumferential sides at both ends of the second elastic member 42 can be limited and supported, further improving the stability of the elastic supporting force of the elastic member on the needle tip, and making the elastic deformation process of the first elastic member 41 and the second elastic member 42 more controllable.

[0066] In some embodiments, the first elastic member 41 forms an electrical connection line for electrically connecting the first needle 11 and the conductive support 3, and / or the second elastic member 42 forms an electrical connection line for electrically connecting the second needle 12 and the conductive support 3, that is, the first elastic member 41 and the second elastic member 42 can be metal springs, or the first elastic member 41 and the second elastic member 42 can be coated with conductive material.

[0067] Furthermore, based on the above elastic member, the structure of the entire test probe can be made simpler, and fatigue of the connecting wire caused by following the movement of the needle can be avoided, which would affect the service life and reliability of the test probe.

[0068] In some further embodiments, the first support tube 211 is made of a conductive material, the first elastic member 41 and the first support tube 211 have at least two electrical connection points, the first elastic member 41 and the first accommodating groove 31 have at least two electrical connection points, and / or, the second support tube 221 is made of a conductive material, the second elastic member 42 and the second support tube 221 have at least two electrical connection points, the second elastic member 42 and the second accommodating groove 32 have at least two electrical connection points. When the first support tube 211 and the second support tube 221 are made of a conductive material, the first shell 21 and the second shell 22 can be made of an insulating material, or the first support tube 211 and the second support tube 221 can be coated with a conductive material on the inner wall.

[0069] Furthermore, based on the above-mentioned test probe, redundant settings of electrical connection points between the first elastic member 41 and the first support tube 211 and the first needle 11 can be achieved, and redundant settings of electrical connection points between the second elastic member 42 and the second support tube 221 and the second needle 12 can also be achieved, thereby improving the reliability of charge transfer from the needle to the conductive support 3 or from the conductive support 3 to the needle.

[0070] In some embodiments, a first limiting structure is provided between the first needle 11 and the first support cylinder 211, and the first limiting structure is used to limit the range of movement of the first needle 11 relative to the first support cylinder 211 in the first direction, and / or a second limiting structure is provided between the second needle 12 and the second support cylinder 221, and the second limiting structure is used to limit the range of movement of the second needle 12 relative to the second support cylinder 221 in the first direction; wherein, the first limiting structure and the second limiting structure can both include a first limiting block 61 provided on the side surface of the needle and a first limiting groove 62 provided on the inner wall of the support cylinder and extending along the first direction, and the first limiting block 61 can be extended and retracted along the radial direction of the needle to facilitate For the loading and unloading of the needle and the support tube, the first limit groove 62 is provided with a limit surface perpendicular to the first direction at both ends in the first direction, and the first limit block 61 is also provided with a plane perpendicular to the first direction at both ends in the first direction, so as to prevent the first limit block 61 from falling out of the first limit groove 62 when moving along the first direction. Optionally, the side surface of the first limit block 61 on the circumferential side of the needle can be provided with a slope structure that slides with the first limit groove 62. When the needle rotates around the axis of the first direction, the first limit block 61 can be elastically squeezed into the inside of the needle, thereby releasing the limiting relationship between the first limit block 61 and the first limit groove 62 in the first direction, thereby realizing the insertion and removal of the needle and the support tube.

[0071] Furthermore, based on the above-mentioned first limiting structure and second limiting structure, the first needle 11 can be prevented from falling off from the first support tube 211 when moving along the first direction, and the second needle 12 can be prevented from falling off from the second support tube 221 when moving along the first direction, thereby improving the connection reliability between the needle and the support tube and the flexibility of loading and unloading.

[0072] In some embodiments, the test probe further includes a sleeve 23 , which is coaxially sleeved on the outside of the first shell 21 and the second shell 22 . The first shell 21 and the second shell 22 are both detachably connected to the sleeve 23 .

[0073] Furthermore, based on the above-mentioned sleeve 23, a reliable connection shell can be provided for the first shell 21 and the second shell 22. The sleeve 23 connects the test probe into a complete and reliable integrated structure. The outer wall of the sleeve 23 can be provided with anti-slip grooves or coated with anti-slip material. The sleeve 23 itself is made of insulating material. The sleeve 23 can be used as a gripping part when the user uses it. It can not only provide support and fixation for all structures in the test probe, but also facilitate the user's operation, thereby improving the convenience and safety of the test probe when used.

[0074] Furthermore, the first shell 21 and the second shell 22 are both threadedly connected to the inner wall of the sleeve 23, and an elastic buffer pad 5 is provided between the first shell 21 and the second shell 22. The end of the first shell 21 and the end of the second shell 22 respectively abut against the two ends of the buffer pad 5, so that the buffer pad 5 is squeezed and deformed in the first direction, wherein the first shell 21 and the second shell 22 can both be connected to the sleeve 23 through self-locking threads, that is, both the first shell 21 and the second shell 22 can be screwed to any position to achieve relative fixation with the sleeve 23 in the first direction, thereby improving the adaptability of the test probe. When the gap between the first shell 21 and the second shell 22 is too large, the first elastic member 41 and the second elastic member 42 and the buffer pad 5 of appropriate length can be replaced to make the entire test probe meet the test requirements, wherein the buffer pad 5 can be a rubber ring or a plastic ring or other structure.

[0075] Based on the above-mentioned test probe, the flexibility and applicability of the test probe can be significantly improved. Through the setting of the buffer pad 5, when the first shell 21 and the second shell 22 move to the extreme position, the squeezing of the buffer pad 5 and the elastic force generated by the buffer pad 5 itself can be utilized to make the threaded connection between the first shell 21 and the second shell 22 and the sleeve 23 more stable, increase the friction force of the threads between each other, and improve the self-locking effect.

[0076] In some embodiments, a second limit block 63 is provided on the inner wall of the first shell 21 and the inner wall of the second shell 22, and a limit groove is formed between the two second limit blocks 63 for limiting the conductive support 3 in the first direction, thereby supporting and fixing the conductive support 3 in the first direction, preventing the conductive support 3 from floating up and down along the first direction when the test probe is working, affecting the accuracy and stability of the test probe.

[0077] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0078] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of such features. Throughout the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0079] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A test probe, characterized in that: include: A first needle (11), a second needle (12), a first housing (21), a second housing (22), a conductive support (3), a first elastic member (41), and a second elastic member (42); The first needle (11) is slidably arranged on the first housing (21) along a first direction, and the second needle (12) is slidably arranged on the second housing (22) along the first direction; The first shell (21) and / or the second shell (22) are plug-connected to the conductive support (3); The tail of the first needle (11) and the tail of the second needle (12) are electrically connected to the conductive support (3) through two electrical connection wires, and the tail of the first needle (11) and the tail of the second needle (12) are elastically offset against the two ends of the conductive support (3) through the first elastic member (41) and the second elastic member (42). The head of the first needle (11) and / or the head of the second needle (12) is provided with a contact head (13), and the projection of the first needle (11) and / or the second needle (12) in the first direction is located within the projection range of the contact head (13).

2. The test probe according to claim 1, wherein: The first housing (21) is provided with a first support tube (211) sleeved on the outside of the first needle (11), and the diameter of the first support tube (211) matches the diameter of the first needle (11). and / or, The second housing (22) is provided with a second support cylinder (221) sleeved on the outside of the second needle (12), and the diameter of the second support cylinder (221) matches the diameter of the second needle (12).

3. The test probe according to claim 2, wherein: At least a portion of the first elastic member (41) extends into the interior of the first supporting tube (211), and / or, At least a portion of the second elastic member (42) extends into the interior of the second supporting tube (221).

4. The test probe according to claim 3, characterized in that: The first elastic member (41) is a cylindrical spring, and the diameter of the first elastic member (41) matches the diameter of the first supporting tube (211). and / or, The second elastic member (42) is a cylindrical spring, and the diameter of the second elastic member (42) matches the diameter of the second supporting cylinder (221).

5. The test probe according to claim 4, characterized in that: The conductive support (3) is provided with a first receiving groove (31) for plugging and matching with the first elastic member (41), and the diameter of the first elastic member (41) matches the diameter of the first receiving groove (31). and / or, The conductive support (3) is provided with a second receiving groove (32) for plugging and matching with the second elastic member (42), and the diameter of the second elastic member (42) matches the diameter of the second receiving groove (32).

6. The test probe according to claim 5, characterized in that: The first elastic member (41) forms an electrical connection line for electrically connecting the first needle (11) and the conductive support (3). and / or, The second elastic member (42) forms an electrical connection line for electrically connecting the second needle (12) and the conductive support (3).

7. The test probe according to claim 6, characterized in that: The first support tube (211) is made of a conductive material, the first elastic member (41) and the first support tube (211) have at least two electrical connection points, and the first elastic member (41) and the first receiving groove (31) have at least two electrical connection points. and / or, The second support tube (221) is made of a conductive material, the second elastic member (42) and the second support tube (221) have at least two electrical connection points, and the second elastic member (42) and the second receiving groove (32) have at least two electrical connection points.

8. The test probe according to claim 2, wherein: A first limiting structure is provided between the first needle (11) and the first supporting tube (211), and the first limiting structure is used to limit the range of movement of the first needle (11) relative to the first supporting tube (211) in a first direction. and / or, A second limiting structure is provided between the second needle (12) and the second supporting cylinder (221), and the second limiting structure is used to limit the range of movement of the second needle (12) relative to the second supporting cylinder (221) in a first direction.

9. The test probe according to any one of claims 1 to 8, characterized in that: The test probe further comprises a sleeve (23), wherein the sleeve (23) is coaxially sleeved on the outside of the first shell (21) and the second shell (22), and the first shell (21) and the second shell (22) are both detachably connected to the sleeve (23).

10. The test probe according to claim 9, characterized in that: The first shell (21) and the second shell (22) are both threadedly connected to the inner wall of the sleeve (23); an elastic buffer pad (5) is provided between the first shell (21) and the second shell (22); the end of the first shell (21) and the end of the second shell (22) respectively abut against the two ends of the buffer pad (5), so that the buffer pad (5) is squeezed and deformed in a first direction.

Images