Probe type imaging Raman coupling device

Abstract

The utility model provides a probe type imaging Raman coupling device, which belongs to the technical field of optical imaging and comprises an imaging Raman coupling probe, a protective shell, a light source, a Raman spectrum analyzer and an industrial camera. The imaging Raman coupling probe comprises a microscope lens, a Raman fiber interface, an image acquisition interface, an image light source interface and an axial fine tuning structure, the microscope lens is provided with an objective lens, the protective shell is provided with a probe, and the front end of the probe is provided with a deformation element; the image acquisition interface is connected with the industrial camera and comprises an eyepiece, the image light source interface is connected with a light source, and the Raman fiber interface is connected with the light source; the industrial camera is connected with an eyepiece of an image acquisition interface, the eyepiece is connected with a coupling structure, the coupling structure is respectively connected with an objective lens, a Raman optical fiber, a light source and an axial fine adjustment structure, and the defect that a traditional imaging Raman coupling device is poor in contact stability is overcome.

Description

Technical Field

[0001] The utility model belongs to the technical field of optical imaging, and in particular relates to a probe-type imaging Raman coupling device. Background Art

[0002] The imaging Raman coupling device is an advanced detection technology that combines Raman spectroscopy and imaging technologies to simultaneously provide information on the chemical composition and spatial distribution of a sample. Raman spectroscopy is a non-destructive testing technology that determines the chemical composition, structure, and state of a sample by measuring the sample's scattering spectrum of incident light. Imaging technology can capture image information on the sample surface, thereby obtaining the sample's morphological characteristics. The combination of these two technologies makes the imaging Raman coupling device a powerful tool widely used in fields such as materials science, biology, medicine, and chemical engineering. Raman spectroscopy is a non-destructive molecular structure analysis method that obtains information on molecular vibration and rotation by detecting the frequency changes of scattered light generated by the interaction of incident light with matter. With the development of science and technology, Raman spectroscopy has gradually been combined with other imaging technologies to form an imaging Raman coupling device, which can achieve high-resolution imaging of the distribution of chemical composition on the sample surface.

[0003] An imaging Raman coupling device typically consists of a light source, a Raman spectrometer, an imaging system, and a sample stage. The light source emits laser light of a specific wavelength onto the sample, stimulating Raman scattering signals. The Raman spectrometer collects and interprets these scattered signals. The imaging system converts these signals into image information, enabling spatially resolved analysis of the sample's surface chemical composition. Key challenges include: To accurately capture Raman signals, the probe must maintain stable contact with the sample surface. However, in practice, uneven sample surfaces can lead to poor contact, affecting the accuracy of measurement results. Conventional probes struggle to adapt to samples with significant variations in surface hardness, limiting the application of imaging Raman coupling devices. To ensure good contact, operators often need to manually adjust the probe's position and pressure, increasing experimental difficulty and uncertainty. Due to unstable contact, measurement results in different areas can vary significantly due to varying contact conditions, reducing data consistency and reliability. Utility Model Content

[0004] In view of this, the utility model provides a probe-type imaging Raman coupling device, which solves the disadvantage of poor contact stability of traditional imaging Raman coupling devices and enhances the contact stability.

[0005] The utility model is achieved in this way:

[0006] The utility model provides a probe-type imaging Raman coupling device, which includes an imaging Raman coupling probe, a protective housing, a light source, a Raman spectrum analyzer, and an industrial camera. The imaging Raman coupling probe includes a microscope lens, a Raman fiber interface, an image acquisition interface, an image light source interface, and an axial fine-tuning structure. The microscope lens is provided with an objective lens, the protective housing is provided with the imaging Raman coupling probe, and the front end of the imaging Raman coupling probe is provided with a deformation element, and there are multiple deformation elements; the image acquisition interface is connected to the industrial camera, the image acquisition interface includes an eyepiece, the image light source interface is connected to the light source, and the Raman fiber interface is connected to the light source;

[0007] The industrial camera is connected to the eyepiece of the image acquisition interface, the eyepiece is connected to a coupling structure, the coupling structure is respectively connected to the objective lens, the Raman fiber, the light source and the axial fine-tuning structure, and the Raman fiber is connected to a laser and the Raman spectrum analyzer.

[0008] The technical effects of the probe-type imaging Raman coupling device provided by the utility model are as follows: the imaging Raman coupling probe uses a special coupler to combine the imaging probe and the Raman probe into one probe, which has the advantages of being small in size and can be used directly in the reactor without the need for sampling and sample preparation.

[0009] The protective shell is made of corrosion-resistant stainless steel, Hastelloy, titanium and other metals, and is equipped with windows made of sapphire glass.

[0010] On the basis of the above technical solution, the probe-type imaging Raman coupling device of the present invention can also be improved as follows:

[0011] The deformation element is specifically a bellows, and the shape of the deformation element is designed to be nonlinearly deformed.

[0012] Furthermore, the deformable element includes a positioning mechanism, which includes a center rod and a spring. The center rod is fixed inside the imaging Raman coupling probe, one end of the spring is connected to the center rod, and the other end is connected to the deformable element, so as to maintain the position of the deformable element stable when contacting the sample.

[0013] Furthermore, the height of each corrugation of the deformation element is between 0.1 mm and 2 mm, the width is between 0.5 mm and 5 mm, and the total length of the deformation element is between 10 mm and 50 mm.

[0014] Furthermore, the outer contour of the deformation element is one of a wave shape, a spiral shape and a ring shape.

[0015] The material of the elastic deformation element includes but is not limited to metal alloys, polymer materials or composite materials.

[0016] Furthermore, an opening is provided at the front end of the imaging Raman coupling probe, the diameter of the opening is between 1-10 mm, the outer diameter of the deformable element is smaller than the diameter of the opening, and the deformable element is connected to the opening at the front end of the imaging Raman coupling probe through the positioning mechanism.

[0017] Furthermore, the microscope lens includes at least one replaceable microscope lens with different magnifications.

[0018] Furthermore, the axial fine-tuning structure includes a microscopic focus fine-tuning button and an imaging optical path and a Raman optical path fine-tuning button.

[0019] The beneficial effect of adopting the above-mentioned improved solution is that the imaging area and the Raman area are made to overlap by using these two buttons.

[0020] Furthermore, the light source includes a Raman light source and an imaging light source, and the Raman light source is a laser light source.

[0021] Raman light sources use laser light sources, and their excitation wavelengths are typically 532nm or 785nm. The power and switching of the laser can be controlled by programming to meet the acquisition requirements.

[0022] The imaging light source can be LED light source, halogen lamp, laser, etc. The light source controller controls the intensity, strobe frequency, exposure time, etc. of the light source to achieve real-time online measurement, especially the measurement of moving particles.

[0023] Furthermore, the deformation element also has a surface coating.

[0024] The surface coating material includes but is not limited to polytetrafluoroethylene (PTFE), diamond-like carbon (DLC), titanium nitride (TiN), aluminum oxide (Al2O3), etc.

[0025] Polytetrafluoroethylene (PTFE): has an extremely low friction coefficient and good chemical stability, and can effectively prevent corrosion and pollution.

[0026] Diamond-like carbon (DLC): It has extremely high hardness and wear resistance, as well as good chemical stability and low friction coefficient.

[0027] Titanium nitride (TiN): has good wear resistance and oxidation resistance, and can effectively prevent wear and corrosion.

[0028] Alumina (Al2O3): has good wear resistance and high temperature resistance, and also has certain chemical stability.

[0029] Compared with the prior art, the beneficial effects of the probe-type imaging Raman coupling device provided by the present invention are:

[0030] Enhanced contact stability: The elastic deformable element can automatically adjust its deformation according to the specific conditions of the sample surface, thereby ensuring that the probe and sample always maintain good contact, significantly improving the quality and stability of the Raman signal;

[0031] Broaden the scope of application: The elastic deformation element can adapt to sample surfaces of both high and low hardness, greatly expanding the application field of imaging Raman coupling devices;

[0032] Simplified operation process: By automatically adjusting the contact pressure, the need for human intervention is reduced, the operation process is simplified, and the experiment is more convenient and efficient;

[0033] Improved data consistency: Due to improved stability and consistency of contact conditions, data collected from different locations is more reliable, improving the consistency of overall measurement results. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0035] Figure 1 This is a schematic diagram of the structure of a probe-type imaging Raman coupling device;

[0036] Figure 2 Schematic diagram of the imaging Raman coupling probe structure;

[0037] Figure 3 This is an example diagram of a probe-type imaging Raman coupling device;

[0038] Figure 4 This is a diagram of a first embodiment of a probe-type imaging Raman coupling device;

[0039] Figure 5 This is a diagram of a second embodiment of a probe-type imaging Raman coupling device;

[0040] In the accompanying drawings, the components represented by the reference numerals are as follows:

[0041] 10. Imaging Raman coupling probe; 11. Microscope lens; 13. Raman fiber interface; 14. Image acquisition interface; 15. Image light source interface; 16. Axial fine-tuning structure; 17. Deformation element; 171. Positioning mechanism; 20. Protective housing; 30. Light source; 40. Raman spectrometer; 50. Industrial camera. DETAILED DESCRIPTION

[0042] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention.

[0043] like Figure 1 、 Figure 2 、 Figure 3 As shown, a first embodiment of a probe-type imaging Raman coupling device provided by the present invention is shown. In this embodiment, the device includes an imaging Raman coupling probe 10, a protective housing 20, a light source 30, a Raman spectrometer 40, and an industrial camera 50. The imaging Raman coupling probe 10 includes a microscope lens 11, a Raman fiber interface 13, an image acquisition interface 14, an image light source interface 15, and an axial fine-tuning structure 16. The microscope lens 11 is provided with an objective lens, the protective housing 20 is provided with the imaging Raman coupling probe 10, and the front end of the imaging Raman coupling probe 10 is provided with a deformation element 17; the image acquisition interface 14 is connected to the industrial camera 50, and the image acquisition interface 14 includes an eyepiece. The image light source interface 15 is connected to the light source 30, and the Raman fiber interface 13 is connected to the light source 30.

[0044] The industrial camera 50 is connected to the eyepiece of the image acquisition interface 14 , and the eyepiece is connected to the coupling structure. The coupling structure is respectively connected to the objective lens, Raman fiber, light source 30 and axial fine-tuning structure 16 . The Raman fiber is connected to the laser and Raman spectrum analyzer 40 .

[0045] Microscope lenses include microscope lenses of various magnifications;

[0046] The system also includes an optical coupling component to ensure that the Raman laser and imaging optical paths merge into a single path at the acquisition end and separate at the receiving end. The Raman signal and image information are output via a Raman fiber interface and an image acquisition interface, respectively. The image acquisition interface is typically connected to an industrial camera, such as an industrial camera. It can use a standard interface for industrial cameras, such as a CS-mount or C-mount. Furthermore, the image acquisition interface can include an eyepiece with various magnifications, such as 3x and 10x, to further enhance the microscope's magnification.

[0047] The Raman fiber optic interface is used to connect the Raman spectrum analyzer system and the Raman laser.

[0048] The axial fine-tuning mechanism includes a micro-focus fine-tuning button for controlling image clarity, and fine-tuning buttons for the imaging and Raman optical paths, which control the positions of the imaging and Raman regions. These buttons can be used to align the imaging and Raman regions.

[0049] Industrial cameras, including industrial CMOS cameras or CCD cameras.

[0050] Microscope lenses include microscope lenses with various magnifications such as 4x, 10x, 20x, 50x and 100x. Microscope lenses are preferably long focal length lenses, such as a microscope lens with a 20mm working distance and a 50x magnification. Microscope lenses are preferably telecentric lenses, such as a telecentric microscope lens with a 20mm working distance and a 50x magnification. The sensor size can be 2 / 3 inch, 1 / 1.8 inch, 1 / 2.3 inch, 1 / 2.5 inch, 1 / 2.7 inch, 1 / 3.2 inch, etc. The global shutter can be used for rapid exposure, with a minimum pixel size of up to 2.7 microns or 3.45 microns. In combination with the telecentric lens group, the optical resolution can reach 500 nanometers.

[0051] In the above technical solution, the deformation element 17 is specifically a bellows, and the shape of the deformation element 17 is designed to be nonlinearly deformed.

[0052] like Figure 4 As shown, the case of a single bellows:

[0053] A single bellows can be installed at the center of the front end of the probe and connected to the probe through a positioning mechanism.

[0054] The central axis of the bellows coincides with the central axis of the front opening of the probe, ensuring that the bellows can deform freely in the vertical direction to adapt to sample surfaces of different hardness or shapes.

[0055] Nonlinear deformation of elastic deformation elements is achieved by:

[0056] Nonlinear deformation of elastic deformable elements can be achieved by designing special geometric shapes. For example, if a bellows is used, nonlinear deformation can be achieved by adjusting the number, height, width, and total length of the bellows. Specifically, the following methods can be used for design:

[0057] Corrugation design of the bellows: The height and width of the corrugations can be designed to different values, for example, the height of the corrugations can gradually increase or decrease, or the width of the corrugations can vary in different parts of the bellows.

[0058] Overall shape of the bellows: The overall shape of the bellows can also be designed to be nonlinear, for example, it can be designed to be conical, trumpet-shaped or other shapes to adapt to sample surfaces of different hardness or shapes.

[0059] Material selection for bellows: Choose suitable materials, such as certain metal alloys or polymer materials, which exhibit different elastic behaviors under different pressures, thereby achieving nonlinear deformation.

[0060] Furthermore, in the above technical solution, the deformable element 17 includes a positioning mechanism 171, which includes a center rod and a spring. The center rod is fixed inside the imaging Raman coupling probe 10, one end of the spring is connected to the center rod, and the other end is connected to the deformable element 17, which is used to maintain the position of the deformable element 17 stable when contacting the sample.

[0061] The center rod is secured to the probe using fasteners (such as screws). A spring is placed over the rod, and one end of the bellows is connected to the other end of the spring. The bellows' position is adjusted by the compression and expansion of the spring to accommodate sample surfaces of varying hardness or shape. The other end of the bellows is connected to the probe's front end via a suitable mechanical structure, ensuring a stable fit and the ability to deform appropriately based on the sample surface's characteristics.

[0062] The bellows is connected to the optical element so that when the bellows deforms, the optical element moves with it, maintaining optimal optical alignment with the sample.

[0063] Optical components include, but are not limited to, one or more lenses, mirrors, and / or optical fibers for directing the laser light to the sample surface and collecting the Raman scattered light back to the Raman spectrometer.

[0064] The optical components are connected to the bellows through a mechanical structure, ensuring that the optimal optical alignment is maintained even when the bellows deforms, thereby ensuring the accuracy of Raman spectroscopy detection.

[0065] Furthermore, in the above technical solution, the height of each corrugation of the deformation element 17 is between 0.1 mm and 2 mm, the width is between 0.5 mm and 5 mm, and the total length of the deformation element 17 is between 10 mm and 50 mm.

[0066] Furthermore, in the above technical solution, the outer contour of the deformation element 17 is one of a wave shape, a spiral shape and a ring shape.

[0067] Furthermore, in the above technical solution, an opening is provided at the front end of the imaging Raman coupling probe 10, and the opening diameter is between 1-10 mm. The outer diameter of the deformable element 17 is smaller than the diameter of the opening, and the deformable element 17 is connected to the opening at the front end of the imaging Raman coupling probe 10 through a positioning mechanism 171.

[0068] Furthermore, in the above technical solution, the microscope lens 11 includes at least one replaceable microscope lens with different magnifications.

[0069] Furthermore, in the above technical solution, the axial fine-tuning structure 16 includes a microscopic focus fine-tuning button and imaging optical path and Raman optical path fine-tuning buttons.

[0070] The axial fine-tuning mechanism includes a micro-focus fine-tuning button for controlling image clarity, and fine-tuning buttons for the imaging and Raman optical paths, which control the positions of the imaging and Raman regions. These buttons can be used to align the imaging and Raman regions.

[0071] Furthermore, in the above technical solution, the light source 30 includes a Raman light source and an imaging light source, and the Raman light source is a laser light source.

[0072] Image light source interface, connects to the imaging light source, such as LED light source, halogen lamp, laser, etc. Its connection method is quick plug or screw fixing.

[0073] Furthermore, in the above technical solution, the deformation element 17 also has a surface coating.

[0074] like Figure 1 、 Figure 2 、 Figure 3 As shown, a second embodiment of a probe-type imaging Raman coupling device provided by the present invention is shown. In this embodiment, the device includes an imaging Raman coupling probe 10, a protective housing 20, a light source 30, a Raman spectrometer 40, and an industrial camera 50. The imaging Raman coupling probe 10 includes a microscope lens 11, a Raman fiber interface 13, an image acquisition interface 14, an image light source interface 15, and an axial fine-tuning structure 16. The microscope lens 11 is provided with an objective lens, and the imaging Raman coupling probe 10 is provided inside the protective housing 20. A deformation element 17 is provided at the front end of the imaging Raman coupling probe 10, and there are multiple deformation elements 17; the image acquisition interface 14 is connected to the industrial camera 50, and the image acquisition interface 14 includes an eyepiece; the image light source interface 15 is connected to the light source 30, and the Raman fiber interface 13 is connected to the light source 30;

[0075] The industrial camera 50 is connected to the eyepiece of the image acquisition interface 14 , and the eyepiece is connected to the coupling structure. The coupling structure is respectively connected to the objective lens, Raman fiber, light source 30 and axial fine-tuning structure 16 . The Raman fiber is connected to the laser and Raman spectrum analyzer 40 .

[0076] Microscope lenses include microscope lenses of various magnifications;

[0077] The Raman fiber optic interface is used to connect the Raman spectrum analyzer system and the Raman laser.

[0078] The axial fine-tuning mechanism includes a micro-focus fine-tuning button for controlling image clarity, and fine-tuning buttons for the imaging and Raman optical paths, which control the positions of the imaging and Raman regions. These buttons can be used to align the imaging and Raman regions.

[0079] The Raman coupling device's Raman laser SMA interface, Raman spectrometer SMA interface, camera interface, and imaging light source interface are connected to the corresponding devices to form an imaging Raman coupling probe. The Raman spectrometer model is JGM-RM24, the industrial camera model is JGM-CM500, the computer is Lenovo Blade 7000K, and the computational data processing software is JGM-interface.

[0080] Industrial cameras, including industrial CMOS cameras or CCD cameras.

[0081] Microscope lenses include various magnifications, such as 4x, 10x, 20x, 50x, and 100x. Microscope lenses are preferably long-focal-length lenses, such as a microscope lens with a 20mm working distance and 50x magnification. Microscope lenses are also preferably telecentric lenses, such as a microscope lens with a 20mm working distance and 50x magnification. Sensor sizes can be 2 / 3-inch, 1 / 1.8-inch, 1 / 2.3-inch, 1 / 2.5-inch, 1 / 2.7-inch, and 1 / 3.2-inch, among others. A global shutter allows for rapid exposure, with minimum pixel sizes of up to 2.7 microns or 3.45 microns. When used with a telecentric lens assembly, optical resolutions of up to 500 nanometers can be achieved.

[0082] like Figure 5 As shown in the figure, for multiple bellows, the position of each bellows should be kept at a certain distance relative to the central axis of the probe front opening to ensure that the bellows can deform freely according to the changes in the sample surface:

[0083] When multiple bellows are used, a symmetrical arrangement can be adopted to enhance the adaptability and stability of the device. When multiple bellows are used, each bellows should be connected by an independent positioning mechanism to ensure that each bellows can independently adapt to changes in the sample surface.

[0084] Symmetrical arrangement: Multiple bellows can be arranged symmetrically around the probe tip opening. For example, the bellows can be arranged in a circular pattern, with each bellow located at the same distance from the center bellows (if present). This arrangement can more evenly distribute the contact force on the sample surface.

[0085] In the above technical solution, the deformation element 17 is specifically a bellows, and the shape of the deformation element 17 is designed to be nonlinearly deformed.

[0086] Furthermore, in the above technical solution, the deformable element 17 includes a positioning mechanism 171, which includes a center rod and a spring. The center rod is fixed inside the imaging Raman coupling probe 10, one end of the spring is connected to the center rod, and the other end is connected to the deformable element 17, which is used to maintain the position of the deformable element 17 stable when contacting the sample.

[0087] Furthermore, in the above technical solution, the height of each corrugation of the deformation element 17 is between 0.1 mm and 2 mm, the width is between 0.5 mm and 5 mm, and the total length of the deformation element 17 is between 10 mm and 50 mm.

[0088] Furthermore, in the above technical solution, the outer contour of the deformation element 17 is one of a wave shape, a spiral shape and a ring shape.

[0089] Furthermore, in the above technical solution, an opening is provided at the front end of the imaging Raman coupling probe 10, and the opening diameter is between 1-10 mm. The outer diameter of the deformable element 17 is smaller than the diameter of the opening, and the deformable element 17 is connected to the opening at the front end of the imaging Raman coupling probe 10 through a positioning mechanism 171.

[0090] Furthermore, in the above technical solution, the microscope lens 11 includes at least one replaceable microscope lens with different magnifications.

[0091] Furthermore, in the above technical solution, the axial fine-tuning structure 16 includes a microscopic focus fine-tuning button and imaging optical path and Raman optical path fine-tuning buttons.

[0092] The microscope focus fine-tuning button changes the microscope focus by adjusting the position of the objective lens, and the Raman optical path fine-tuning button changes the Raman optical path and the position of the Raman spot by adjusting the position of the first transflective mirror.

[0093] Furthermore, in the above technical solution, the light source 30 includes a Raman light source and an imaging light source, and the Raman light source is a laser light source.

[0094] The Raman laser is connected to the SMA interface of the Raman coupling device through an optical fiber. After being collimated and adjusted by the internal lens group, it is irradiated onto the sample through the first reflector, the first transflector, and the objective lens group. The Raman signal reflected by the sample passes through the first transflector, the first reflector, and the Raman light return lens group, and then passes through the optical fiber and the optical fiber of the SMA interface of the Raman coupling device to reach the Raman spectrum analyzer.

[0095] On the other side, the imaging light source passes through the imaging light source interface, the second reflector and the second transparent reflector, the first transparent reflector and then passes through the objective lens group to irradiate the sample. The sample reflects the light and passes through the first transparent reflector, the second transparent reflector and the eyepiece lens group to reach the imaging camera.

[0096] Furthermore, in the above technical solution, the deformation element 17 also has a surface coating.

[0097] Specifically, the principle of the present utility model is:

[0098] Design and working principle of elastic deformation element:

[0099] Elastic deformation elements are designed based on special elastic materials (bellows). These materials are characterized by their ability to reversibly deform when subjected to external forces and return to their original shape after the external force is removed. Specifically, the elastic deformation element in this utility model mainly includes the following key parts:

[0100] Elastic elements: Made of materials with a high elastic modulus, such as spring steel or certain polymer materials. This material can produce appropriate deformation when subjected to external forces within a certain range, while maintaining sufficient strength to avoid permanent deformation;

[0101] Contact end: Located at one end of the elastic element, it directly contacts the sample surface. The design of the contact end needs to take into account the characteristics of different sample surfaces, such as hardness and roughness, so that good contact can be formed under various conditions;

[0102] Fixed end: connected to other components of the imaging Raman coupling device to ensure the stability of the elastic element;

[0103] When the elastically deformable element contacts the sample surface, it automatically adjusts its deformation based on the surface's hardness and shape to ensure optimal contact pressure between the contact tip and the sample. This automatic adjustment mechanism not only reduces operator error but also effectively improves measurement accuracy and repeatability.

Claims

1. A probe-type imaging Raman coupling device, characterized in that: The invention comprises an imaging Raman coupling probe (10), a protective housing (20), a light source (30), a Raman spectrum analyzer (40) and an industrial camera (50), wherein the imaging Raman coupling probe (10) comprises a microscope lens (11), a Raman optical fiber interface (13), an image acquisition interface (14), an image light source interface (15) and an axial fine-tuning structure (16), wherein the microscope lens (11) is provided with an objective lens, the protective housing (20) is provided with the imaging Raman coupling probe (10), and the front end of the imaging Raman coupling probe (10) is provided with a deformation element (17), wherein the deformation element (17) is provided in plurality; the image acquisition interface (14) is connected to the industrial camera (50), the image acquisition interface (14) comprises an eyepiece, the image light source interface (15) is connected to the light source (30), and the Raman optical fiber interface (13) is connected to the light source (30); The industrial camera (50) is connected to the eyepiece of the image acquisition interface (14), the eyepiece is connected to a coupling structure, the coupling structure is respectively connected to the objective lens, the Raman optical fiber, the light source (30) and the axial fine-tuning structure (16), and the Raman optical fiber is connected to a laser and the Raman spectrum analyzer (40).

2. The probe-type imaging Raman coupling device according to claim 1, characterized in that: The deformation element (17) is specifically a bellows, and the shape of the deformation element (17) is designed to be nonlinearly deformed.

3. The probe-type imaging Raman coupling device according to claim 2, characterized in that: The deformable element (17) includes a positioning mechanism (171), and the positioning mechanism (171) includes a central rod and a spring. The central rod is fixed inside the imaging Raman coupling probe (10), and one end of the spring is connected to the central rod, and the other end is connected to the deformable element (17), so as to maintain the position of the deformable element (17) stable when contacting the sample.

4. The probe-type imaging Raman coupling device according to claim 3, characterized in that: The height of each corrugation of the deformation element (17) is between 0.1 mm and 2 mm, the width is between 0.5 mm and 5 mm, and the total length of the deformation element (17) is between 10 mm and 50 mm.

5. The probe-type imaging Raman coupling device according to claim 4, characterized in that: The outer contour of the deformation element (17) is one of a wave shape, a spiral shape and a ring shape.

6. The probe-type imaging Raman coupling device according to claim 5, characterized in that: The front end of the imaging Raman coupling probe (10) is provided with an opening, the diameter of the opening is between 1 and 10 mm, the outer diameter of the deformable element (17) is smaller than the diameter of the opening, and the deformable element (17) is connected to the opening at the front end of the imaging Raman coupling probe (10) via the positioning mechanism (171).

7. The probe-type imaging Raman coupling device according to claim 6, characterized in that: The microscope lens (11) comprises at least one replaceable microscope lens with different magnifications.

8. The probe-type imaging Raman coupling device according to claim 7, characterized in that: The axial fine-tuning structure (16) comprises a microscopic focus fine-tuning button and an imaging light path and a Raman light path fine-tuning button.

9. The probe-type imaging Raman coupling device according to claim 8, characterized in that: The light source (30) includes a Raman light source and an imaging light source, and the Raman light source is a laser light source.

10. The probe-type imaging Raman coupling device according to claim 9, characterized in that: The deformation element (17) also has a surface coating.

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