Gain test tool for microwave frequency conversion assembly

Abstract

The utility model discloses a gain test tool for a microwave frequency conversion assembly, which comprises a shell, a display input assembly, and a mother board control assembly, a reference source functional assembly, a detection functional assembly and at least two signal source functional assemblies which are positioned in the shell, the display input assembly is arranged on the shell and used for inputting control information and displaying gain parameters, the mother board control assembly is in communication connection with all the function assemblies, the reference source function assembly is used for sending reference signals, and all the signal source function assemblies are used for outputting reference radio-frequency signals and amplitude information thereof. The detection function assembly is used for receiving a to-be-detected radio frequency signal and outputting amplitude information of the to-be-detected radio frequency signal. The gain test tool has the advantages of small size, light weight, good portability, convenient test, high test efficiency and the like.

Description

Technical Field

[0001] The utility model belongs to the technical field of microwaves, and in particular relates to a gain testing tool for microwave frequency conversion components. Background Art

[0002] With the continuous development of microwave technology, the application of microwave components is becoming increasingly widespread. These components primarily include frequency converters, amplifiers, switches, and filters. Microwave components have a wide range of electrical performance parameters, requiring testing with various microwave test instruments and a complex testing process. Frequency converters, as the most complex microwave components, involve electrical performance parameters such as gain, noise figure, third-order intercept, second-order intercept, standing wave, and output P-1. Gain, as the most fundamental electrical performance parameter of frequency converters, is an essential test item.

[0003] Gain parameter testing for variable-frequency components involves frequency conversion, requiring more signal generation equipment than conventional fixed-frequency microwave components. The greater the frequency conversion, the more signal generation equipment required. Common variable-frequency components primarily perform one or two frequency conversions, requiring at least two to three signal generation devices and one signal analysis device. However, existing test equipment is bulky and heavy, making it difficult to transport. Furthermore, product testing requires an additional computer to issue control commands, resulting in low test efficiency and high testing costs. Utility Model Content

[0004] In view of the above problems, the present invention discloses a gain testing tool for a microwave frequency conversion component, so as to overcome the above problems or at least partially solve the above problems.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] The utility model discloses a gain test tool for a microwave frequency conversion component, comprising a housing and a display input component, as well as a motherboard control component, a reference source function component, a detection function component and at least two signal source function components located in the housing;

[0007] The display input component is arranged on the shell and is communicated with the motherboard control component for inputting control information and display gain parameters. The motherboard control component is communicated with the reference source functional component, the detection functional component and each of the signal source functional components respectively. The reference source functional component is used to send a reference signal to each of the signal source functional components. Each of the signal source functional components is used to output a reference RF signal and amplitude information of the reference RF signal. The detection functional component is used to receive the RF signal to be measured and output the amplitude information of the RF signal to be measured.

[0008] Furthermore, the motherboard control component is communicatively connected to the reference source functional component, the detection functional component, and each of the signal source functional components via a board-to-board connector.

[0009] Furthermore, the display input component includes a touch display screen and a screen control interface board;

[0010] A window is provided on the upper end surface of the shell, the touch screen is located in the window, the screen control interface board is located below the touch screen, and the screen control interface board is communicatively connected to the motherboard control assembly.

[0011] Furthermore, the screen control interface board is provided with a power supply interface, a power start switch, an Ethernet connector and a JTAG debugging port, and the power supply interface, the power start switch, the Ethernet connector and the JTAG debugging port extend from the side wall of the shell.

[0012] Further, the motherboard control assembly includes a motherboard and a control circuit in communication connection;

[0013] The control circuit is arranged on the upper end surface of the motherboard and can control each functional component according to the control information; a 60-pin low-frequency socket is provided on the upper end surface of the motherboard, and the motherboard is communicatively connected to the screen control interface board through the 60-pin low-frequency socket.

[0014] Furthermore, the motherboard is provided with installation slots, the number of which is consistent with the number of the signal source functional components, for installing the signal source functional components, and the installation slots are arranged side by side.

[0015] Furthermore, the reference source functional component, the detection functional component and each of the signal source functional components are arranged on the lower end surface of the motherboard. The lower end surface of the motherboard is provided with at least two first SMP-K type connectors, at least two second SMP-K type connectors, one third SMP-K type connector and at least three fourth SMP-K type connectors and at least four low-frequency sockets. The first SMP-K type connector and the second SMP-K type connector are arranged in pairs. Each of the signal source functional components is provided with a first SMP-J type connector that cooperates with the first SMP-K type connector, a second SMP-J type connector that cooperates with the second SMP-K type connector, and a low-frequency plug that cooperates with the low-frequency socket. The detection functional component is provided with a third SMP-J type connector that cooperates with the third SMP-K type connector and a low-frequency plug that cooperates with the low-frequency socket. The reference source functional component is provided with a fourth SMP-J type connector that cooperates with the fourth SMP-K type connector and a low-frequency plug that cooperates with the low-frequency socket.

[0016] Furthermore, a fifth SMP-J type connector and at least two sixth SMP-J type connectors are provided on the lower end surface of the motherboard, the fifth SMP-J type connector is communicatively connected to the third SMP-K type connector, and each of the sixth SMP-J type connectors is communicatively connected to each of the second SMP-K type connectors.

[0017] Furthermore, an input RF interface and at least two output RF interfaces are provided on the side wall of the shell, the input RF interface is connected to the fifth SMP-J type connector through a first cable, and each of the output RF interfaces is connected to each of the sixth SMP-J type connectors through a second cable.

[0018] Furthermore, the housing comprises an upper shell, a main shell and a lower shell which are fixedly connected in sequence from top to bottom;

[0019] The upper shell, the main shell and the lower shell are all made of aluminum, and the three are fixedly connected by screws.

[0020] The advantages and beneficial effects of the utility model are:

[0021] In the gain test tool of the present invention, a reference source function component, a detection function component and at least two signal source function components are integrated on a motherboard control component, thereby enabling gain testing of a microwave frequency conversion component. Compared with existing test equipment, the tool is smaller in size and lighter in weight. Furthermore, by providing a display input component, the traditional computer serial port control is replaced, so that the gain test tool has the advantages of good portability, convenient testing and high testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present invention. The same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0023] Figure 1 This is a three-dimensional structural diagram of a gain test tool for a microwave frequency conversion component in one embodiment of the present utility model;

[0024] Figure 2 This is an internal structural diagram of the back side of a gain test tool for a microwave frequency conversion component in one embodiment of the present utility model;

[0025] Figure 3 This is a positional arrangement diagram of a reference source functional component, a detection functional component, and a signal source functional component in one embodiment of the present invention;

[0026] Figure 4 This is a structural diagram of the lower end surface of the motherboard in one embodiment of the present utility model;

[0027] Figure 5 This is a structural diagram of the upper end surface of a motherboard in one embodiment of the present utility model.

[0028] Figure: 1. Housing; 1-1. Upper housing; 1-2. Main housing; 1-3. Lower housing; 2. Reference source functional component; 3. Detection functional component; 4. Signal source functional component; 5. Touch screen; 6. Power supply interface; 7. Power start switch; 8. Ethernet connector; 9. JTAG debugging port; 10. Motherboard; 11. Control circuit; 12. 60-pin low-frequency socket; 13. First SMP-K type connector; 14. Second SMP-K type connector; 15. Third SMP-K type connector P-K type connector; 16. Fourth SMP-K type connector; 17. Low-frequency socket; 18. First SMP-J type connector; 19. Second SMP-J type connector; 20. Low-frequency plug; 21. Third SMP-J type connector; 22. Fourth SMP-J type connector; 23. Fifth SMP-J type connector; 24. Sixth SMP-J type connector; 25. Input RF interface; 26. Output RF interface; 27. First cable; 28. Second cable. DETAILED DESCRIPTION

[0029] To make the purpose, technical solutions, and advantages of the present invention more clear, the following will provide a clear and complete description of the technical solutions of the present invention in conjunction with specific embodiments of the present invention and the corresponding drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of the present invention.

[0030] The technical solutions provided by various embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0031] In one embodiment of the present invention, a gain test tool for a microwave frequency conversion component is provided. Figures 1 to 3 As shown, the gain test fixture includes a housing 1 and a display input component, as well as a motherboard control component, a reference source functional component 2, a detection functional component 3 and at least two signal source functional components 4 located in the housing 1.

[0032] Specifically, the display input component is arranged on the shell 1 and is communicated with the motherboard control component for inputting control information and displaying gain parameters. The motherboard control component is communicated with the reference source functional component 2, the detection functional component 3 and each signal source functional component 4 respectively, and can generate a control signal according to the control information, and send the control signal to each functional component (reference source functional component 2, detection functional component 3 and each signal source functional component 4) to realize the control of each functional component; in this way, the operator can control the gain test tooling through the display input component, which is more convenient to operate and thus improves the detection efficiency. In addition, the operator can also intuitively understand the gain parameters of the tested microwave frequency conversion component from the gain test tooling, which is more convenient to use. The reference source functional component 2 is used to send a reference signal of a fixed frequency to each signal source functional component 4. Each signal source functional component 4 is used to output a reference RF signal and the amplitude information of the reference RF signal based on the reference signal. The signal source functional component 4 can generate an RF signal with variable frequency and variable amplitude, replacing the signal generating equipment required in conventional gain testing; the detection functional component 3 is used to receive the RF signal to be tested and output the amplitude information of the RF signal to be tested. The detection functional component 3 can detect the amplitude of the RF signal to be tested, replacing the signal analyzing equipment; the motherboard control component is used to determine the gain parameter based on the amplitude information of the reference RF signal and the amplitude information of the RF signal to be tested, and the determined gain parameter is then displayed through the display input component.

[0033] In this embodiment, there are three signal source functional components 4, which serve as the RF input signal and two local oscillator signals (in a double-frequency conversion mode) during gain testing of the microwave frequency conversion component. In other embodiments, the number of signal source functional components may be two (in a single-frequency conversion mode); of course, the number of signal source functional components may also be other, depending on the number of required frequency conversions.

[0034] In summary, in the gain test tool of this embodiment, by integrating a reference source functional component, a detection functional component and at least two signal source functional components on the motherboard control component, it is possible to implement gain testing of the microwave frequency conversion component. Compared with existing test equipment, it is smaller in size and lighter in weight. In addition, by providing a display input component, it replaces the traditional computer serial port control, making the gain test tool have the advantages of good portability, convenient testing and high testing efficiency.

[0035] In this embodiment, the motherboard control assembly communicates with the reference source functional assembly 2, the detector functional assembly 3, and each signal source functional assembly 4 via board-to-board connectors. This allows the signal source functional assembly 4, the detector functional assembly 3, and the reference source functional assembly 2 to be docked with the motherboard 10 via a blind-mating method. This not only facilitates maintenance and replacement, but also allows functional transformation and expansion of the gain test fixture by reassembling or replacing some or all of the functional components. After the motherboard control assembly and each functional assembly are connected via the board-to-board connectors, they are then secured with screws to ensure a secure connection between the motherboard control assembly and each functional assembly.

[0036] And, as Figure 1 As shown, the display input component includes a touch display screen 5 and a screen control interface board; wherein, the touch display screen is a 7-inch capacitive touch display screen with a resolution of 1080*640 and supports multi-touch, thereby facilitating the operation of the touch display screen, and the touch display screen and the screen control interface board are an integrated structure.

[0037] A window is provided on the upper end face of the shell 1, the touch display screen 5 is located in the window, the screen control interface board is located below the touch display screen 5, and the screen control interface board is communicatively connected to the motherboard control component, so that the operator can operate the touch display screen 5 through the window.

[0038] In addition, if Figure 1As shown, the screen control interface board is equipped with a power supply interface 6, a power start switch 7, an Ethernet connector 8, and a JTAG debug port 9. These interfaces extend from the side wall of the housing 1. This allows the gain test fixture to be compatible with automated test systems via the Ethernet connector 8, enabling automated testing. This eliminates the need for specialized interface development for the test equipment, avoids the tedious task of developing automated test programs for conventional test equipment, and significantly improves operator efficiency. Specifically, the Ethernet connector can be an RJ45 connector, the power supply interface can be a DC-005 interface, and the power start switch can be a toggle-type power start switch.

[0039] In this embodiment, if Figure 2 and Figure 5 As shown, the motherboard control assembly includes a motherboard 10 and a control circuit 11 that are communicatively connected.

[0040] The control circuit 11 is arranged on the upper end surface of the motherboard 10 and can control each functional component according to the control information; the motherboard 10 is fixed in the shell 1 by screws, and a 60-pin low-frequency socket 12 is provided on the upper end surface of the motherboard 10. The motherboard 10 is communicated with the screen control interface board through the 60-pin low-frequency socket 12, so that the screen control interface board sends control information to the control circuit 11 through the 60-pin low-frequency socket 12.

[0041] Furthermore, the motherboard 10 is provided with mounting slots, the number of which matches the number of signal source functional components 4, for mounting the signal source functional components 4, and the mounting slots are arranged side by side. This allows the signal source functional components 4 to be designed with uniform dimensions and interfaces, enabling functional reconfiguration to meet different testing requirements, thereby enabling rapid and efficient functional conversion and expansion of the test fixture.

[0042] In addition, if Figures 2 to 4 As shown, the reference source functional component 2, the detection functional component 3 and each signal source functional component 4 are arranged on the lower end surface of the motherboard 10. The lower end surface of the motherboard 10 is provided with at least two first SMP-K type connectors 13, at least two second SMP-K type connectors 14, one third SMP-K type connector 15 and at least three fourth SMP-K type connectors 16 and at least four low-frequency sockets 17. The first SMP-K type connector 13 and the second SMP-K type connector 14 are arranged in pairs, that is, a second SMP-K type connector 14 is arranged next to a first SMP-K type connector 13. The number of first SMP-K type connectors 13 and second SMP-K type connectors 14 is the same as the number of signal source functional components 4. The number of fourth SMP-K type connectors 16 is one more than the number of signal source functional components 4. The number of low-frequency sockets 17 is the same as the number of functional components. Each signal source functional component 4 is mounted on Figure 4On the upper side of the middle motherboard 10, the signal source functional component 4 is provided with a first SMP-J type connector 18 that cooperates with the first SMP-K type connector 13, a second SMP-J type connector 19 that cooperates with the second SMP-K type connector 14, and a low-frequency plug 20 that cooperates with the low-frequency socket 17. The signal source functional component 4 receives the control signal on the motherboard 10 through the low-frequency plug 20, receives the reference signal provided by the reference source functional component 2 through the first SMP-J type connector 18, and outputs the reference RF signal through the second SMP-J type connector 19, thereby realizing the RF signal output function; the detection functional component 3 is installed on Figure 4 On the lower left side of the middle motherboard 10, the detection function component 3 is provided with a third SMP-J type connector 21 that cooperates with the third SMP-K type connector 15 and a low-frequency plug 20 that cooperates with the low-frequency socket 17. The detection function component 3 receives the control signal on the motherboard 10 through the low-frequency plug 20 and receives the external input RF signal to be measured through the third SMP-J type connector 21; the reference source function component 2 is installed Figure 4 In the center of the lower side of the mid-middle motherboard 10, the reference source functional component 2 is equipped with a fourth SMP-J connector 22 that mates with the fourth SMP-K connector 16, and a low-frequency plug 20 that mates with the low-frequency socket 17. The reference source functional component 2 receives control signals from the motherboard 10 via the low-frequency plug 20 and provides reference signals to the signal source functional component 4 via the fourth SMP-J connector 22. Each fourth SMP-J connector 22 corresponds to a different signal source functional component 4, with one additional fourth SMP-J connector 22 provided as a backup. The low-frequency plug is a 16-pin low-frequency plug, and the low-frequency socket is a 16-pin low-frequency socket.

[0043] Further, if Figure 4 As shown, a fifth SMP-J type connector 23 and at least two sixth SMP-J type connectors 24 are provided on the lower end surface of the motherboard 10. The fifth SMP-J type connector 23 is communicatively connected to the third SMP-K type connector 15, and each sixth SMP-J type connector 24 is communicatively connected to each second SMP-K type connector 14 respectively.

[0044] In this way, the relevant RF interfaces of each functional component on the motherboard 10 are interconnected via internal RF cables, forming a complete RF link. The main functions of these RF links are: first, transmitting the reference signal output by the reference source functional component 2 to the signal source functional component 4; second, interconnecting the input signal of the detection functional component 3 with the fifth SMP-J type connector 23 on the motherboard 10; and third, interconnecting the output signal of the signal source functional component 4 with the sixth SMP-J type connector 24 on the motherboard 10. This makes the motherboard 10 the hub of the entire test fixture, enabling the interconnection and transfer of low-frequency control signals and RF signals.

[0045] In this embodiment, if Figure 2 As shown, an input RF interface 25 and at least two output RF interfaces 26 are provided on the side wall of the housing 1. The number of output RF interfaces 26 matches the number of signal source functional components 4. The input RF interface 25 is connected to the fifth SMP-J type connector 23 via a first cable 27, and each output RF interface 26 is connected to each sixth SMP-J type connector 24 via a second cable 28. Both the input RF interface and the output RF interface are SMA-K interfaces.

[0046] And, as Figure 1 and Figure 2 As shown, the housing 1 includes an upper shell 1-1, a main shell 1-2 and a lower shell 1-3 which are fixedly connected in sequence from top to bottom.

[0047] The window is located on the upper shell 1-1. The upper shell 1-1, main shell 1-2, and lower shell 1-3 are all made of aluminum, effectively dissipating heat from the gain test fixture. Screws securely connect the three components, sealing the entire shell 1. This structure facilitates removal of the display and input components, and after removing the lower shell 1-3, the various functional components can be quickly assembled and disassembled.

[0048] The above description is only a specific embodiment of the present invention. Based on the above teachings of the present invention, those skilled in the art may make other improvements or modifications based on the above embodiments. Those skilled in the art should understand that the above description is only a better explanation of the purpose of the present invention, and the scope of protection of the present invention shall be based on the scope of protection of the claims.

Claims

1. A gain test tool for microwave frequency conversion components, characterized in that: It includes a housing and a display input component, as well as a motherboard control component, a reference source functional component, a detection functional component and at least two signal source functional components located in the housing; The display input component is arranged on the shell and is communicated with the motherboard control component for inputting control information and display gain parameters. The motherboard control component is communicated with the reference source functional component, the detection functional component and each of the signal source functional components respectively. The reference source functional component is used to send a reference signal to each of the signal source functional components. Each of the signal source functional components is used to output a reference RF signal and amplitude information of the reference RF signal. The detection functional component is used to receive the RF signal to be measured and output the amplitude information of the RF signal to be measured.

2. The gain test fixture for microwave frequency conversion components according to claim 1, characterized in that: The motherboard control component is communicatively connected to the reference source functional component, the detection functional component and each of the signal source functional components via a board-to-board connector.

3. The gain test fixture for microwave frequency conversion components according to claim 1, characterized in that: The display input component includes a touch display screen and a screen control interface board; A window is provided on the upper end surface of the shell, the touch screen is located in the window, the screen control interface board is located below the touch screen, and the screen control interface board is communicatively connected to the motherboard control assembly.

4. The gain test fixture for microwave frequency conversion components according to claim 3, characterized in that: The screen control interface board is provided with a power supply interface, a power start switch, an Ethernet connector and a JTAG debugging port, and the power supply interface, the power start switch, the Ethernet connector and the JTAG debugging port extend from the side wall of the shell.

5. The gain test fixture for microwave frequency conversion components according to claim 3, characterized in that: The motherboard control assembly includes a motherboard and a control circuit in communication connection; The control circuit is arranged on the upper end surface of the motherboard and can control each functional component according to the control information; a 60-pin low-frequency socket is provided on the upper end surface of the motherboard, and the motherboard is communicatively connected to the screen control interface board through the 60-pin low-frequency socket.

6. The gain testing tool for microwave frequency conversion components according to claim 5, characterized in that: The motherboard is provided with installation slots, the number of which is consistent with the number of the signal source functional components, for installing the signal source functional components, and the installation slots are arranged side by side.

7. The gain testing tool for microwave frequency conversion components according to claim 5, characterized in that: The reference source functional component, the detection functional component and each of the signal source functional components are arranged on the lower end surface of the motherboard. The lower end surface of the motherboard is provided with at least two first SMP-K type connectors, at least two second SMP-K type connectors, one third SMP-K type connector, at least three fourth SMP-K type connectors and at least four low-frequency sockets. The first SMP-K type connector and the second SMP-K type connector are arranged in pairs. Each of the signal source functional components is provided with a first SMP-J type connector that cooperates with the first SMP-K type connector, a second SMP-J type connector that cooperates with the second SMP-K type connector, and a low-frequency plug that cooperates with the low-frequency socket. The detection functional component is provided with a third SMP-J type connector that cooperates with the third SMP-K type connector and a low-frequency plug that cooperates with the low-frequency socket. The reference source functional component is provided with a fourth SMP-J type connector that cooperates with the fourth SMP-K type connector and a low-frequency plug that cooperates with the low-frequency socket.

8. The gain testing tool for microwave frequency conversion components according to claim 7, characterized in that: A fifth SMP-J type connector and at least two sixth SMP-J type connectors are provided on the lower end surface of the motherboard. The fifth SMP-J type connector is communicatively connected to the third SMP-K type connector, and each of the sixth SMP-J type connectors is communicatively connected to each of the second SMP-K type connectors.

9. The gain testing tool for microwave frequency conversion components according to claim 8, characterized in that: An input RF interface and at least two output RF interfaces are provided on the side wall of the shell. The input RF interface is connected to the fifth SMP-J type connector through a first cable, and each of the output RF interfaces is connected to each of the sixth SMP-J type connectors through a second cable.

10. The gain testing tool for microwave frequency conversion components according to any one of claims 1 to 9, characterized in that: The housing comprises an upper shell, a main shell and a lower shell which are fixedly connected in sequence from top to bottom; The upper shell, the main shell and the lower shell are all made of aluminum, and the three are fixedly connected by screws.

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