Capacitor chamfer measuring device

Abstract

The embodiment of the utility model provides a capacitor chamfer measuring device, and the device comprises a bearing part which is provided with a light transmitting part; the first supporting part is used for supporting the bearing part; the light source part is fixed above the bearing part and emits light to the light transmitting part in the direction perpendicular to the extending direction of the bearing part; the first adjusting part is fixed above the bearing part, a first capacitor with a chamfer to be measured is detachably arranged on the first adjusting part, the first capacitor is located above the light transmitting part, and the first adjusting part is used for adjusting the relative position between the first capacitor and the light source part; the image acquisition part is arranged below the bearing part; wherein the image acquisition unit has an imaging element, the imaging element and the light source unit face each other in the vertical direction so as to acquire an image of the capacitor, and the optical axis of the light emitted from the light source unit coincides with the central axis of the imaging element. By means of the measuring device, the chamfer measuring precision can be improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of capacitor manufacturing, and in particular to a capacitor chamfer measuring device. BACKGROUND

[0002] In the field of ceramic capacitor processing, a process of overall forming and then dividing is generally adopted.

[0003] After the dividing, corner burrs and sharp corners usually appear. The general method is to roll and grind the divided capacitor to form a certain chamfer. The size of the chamfer is an important parameter of process control. If the chamfer rolling and grinding is not in place, the edges of the capacitor are relatively sharp, and when they contact each other, the area is small, and damage is easily caused. If the chamfer rolling and grinding is too large, it will also cause the thickness of the ceramic layer of the capacitor to become thin, affect the insulation distance of the capacitor, and reduce the withstand voltage. Therefore, it is necessary to determine whether the chamfer rolling and grinding is in place.

[0004] It should be noted that the above introduction to the technical background is only to facilitate a clear and complete description of the technical solutions of the present application, and to facilitate the understanding of those skilled in the art. The above technical solutions cannot be considered as known to those skilled in the art merely because they are described in the background section of the present application. CONTENT OF THE INVENTION

[0005] The inventor found that in the existing chamfer measuring methods, including visual inspection method and manual measurement method, the visual inspection method is to observe whether the chamfer rolling and grinding is in place by eyes, and the manual measurement method is to sense whether the chamfer rolling and grinding is in place by hands. However, the existing measurement methods have the following problems:

[0006] 1. The method is simple, data cannot be measured, and experience is not easy to pass on;

[0007] 2. The consistency of product quality cannot be guaranteed, and the process control is difficult;

[0008] 3. When the chamfer is not enough, a large number of damage is caused, resulting in product scrap;

[0009] 4. When the chamfer is too large, the size changes too much, and the insulation performance is reduced, and the product has potential risks.

[0010] In view of at least one of the above problems or other similar problems, the present application embodiment proposes a capacitor chamfer measuring device. The device uses a CCD camera to obtain a projection image of the capacitor, and then calculates the pixel value of the chamfer through software according to the correspondence coefficient between the pixel and the actual size.

[0011] According to a first aspect of the present application, a capacitor chamfer measuring device is provided, the device has:

[0012] A bearing portion, on which a light-transmitting portion is provided;

[0013] A first support portion supporting the bearing portion;

[0014] A light source portion fixed above the bearing portion and emitting light to the light-transmitting portion in a direction perpendicular to the extending direction of the bearing portion;

[0015] A first adjustment portion fixed above the bearing portion, on which a first capacitor to be measured for chamfer is detachably arranged, the first capacitor being above the light-transmitting portion, the first adjustment portion being used for adjusting the relative position between the first capacitor and the light source portion;

[0016] An image acquisition portion arranged below the bearing portion;

[0017] The image acquisition portion has a camera element opposite to the light source portion in the up-down direction, so as to acquire the image of the capacitor, the optical axis of the light emitted by the light source portion coincides with the central axis of the camera element.

[0018] According to the second aspect of the embodiment of the present application, the first adjustment portion is movable along the direction perpendicular to and / or parallel to the extending direction of the bearing portion, so as to adjust the position of the first capacitor in the X, Y and Z three-axis directions.

[0019] According to the third aspect of the embodiment of the present application, the device further has:

[0020] A slide glass covering the light-transmitting portion;

[0021] A second adjustment portion fixed above the bearing portion, used for adjusting the relative position between a second capacitor to be measured for chamfer placed on the slide glass and the light source.

[0022] According to the fourth aspect of the embodiment of the present application, the device further has a second support portion supporting the image acquisition portion.

[0023] According to the fifth aspect of the embodiment of the present application, the second support portion has an adjustment bracket supporting the image acquisition portion, the adjustment bracket adjusting the position of the camera element in the X-axis direction, so that the central axis of the camera element coincides with the optical axis of the light emitted by the light source portion.

[0024] According to the sixth aspect of the embodiment of the present application, the light-transmitting portion is a through hole penetrating through the bearing portion, and the cross-sectional area of the light-transmitting portion is greater than the cross-sectional area of the capacitor.

[0025] According to the seventh aspect of the embodiment of the present application, the light source portion has:

[0026] a light source, and a light source fixing portion;

[0027] The light source fixing portion fixes the light source above the bearing portion;

[0028] The light source is a laser.

[0029] According to an eighth aspect of the embodiments of the present application, the device further has:

[0030] a chamfer measuring portion, which is electrically connected with the image acquisition portion, to calculate the chamfer of the capacitor according to the image acquired by the image acquisition portion.

[0031] According to a ninth aspect of the embodiments of the present application, the camera element is a CCD camera.

[0032] According to a tenth aspect of the embodiments of the present application, the device further has a heat dissipation portion, which is located below the bearing portion.

[0033] One of the beneficial effects of the embodiments of the present application is that the chamfer measuring device provided by the embodiments of the present application acquires the projection image of the capacitor by using the camera element, and calculates the chamfer of the capacitor according to the acquired projection image, which can improve the measurement precision of the chamfer, thereby avoiding that the capacitor is excessively or insufficiently tumbled, reducing product loss, improving tumbling efficiency, and saving manufacturing cost.

[0034] The particular implementations of the application will hereinafter be described in conjunction with the following drawings, wherein the principles of the application will be illustrated by referring to the drawings in conjunction with the following description. It should be understood that the application is not limited in scope to the accompanied drawings, in which like numerals represent same elements throughout the drawings, the application is intended to cover any and all modifications and with the scope of the claims. It is submitted that the scope of the application encompassed by the appended claims includes other applications, features, and advantages such as:

[0035] Features described and / or illustrated with respect to one implementation can be used in the same or similar manner in one or more other implementations, in combination with other features in the other implementations, or in place of other features in the other implementations.

[0036] It should be emphasized that the term comprises / comprising, when used in this text, refers to the presence of stated features, integers, steps or components but does not preclude the presence or addition of one or more other features, integers, steps, components or groups thereof. BRIEF DESCRIPTION OF DRAWINGS

[0037] The accompanying drawings, which are included to provide a further understanding of the embodiments and are incorporated in and constitute a part of this application, illustrate embodiments of the application and together with the description serve to explain the principles of the application. It is to be understood that the drawings are solely for purposes of illustration and are not intended to limit the scope of the present application. In the drawings:

[0038] Figure 1 is a schematic diagram of a capacitor chamfer measuring device according to an embodiment of the present application;

[0039] Figure 2 is a schematic diagram of a first adjustment portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0040] Figure 3 is another schematic diagram of a first adjustment portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0041] Figure 4 is a side view of a first adjustment portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0042] Figure 5 is another side view of a first adjustment portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0043] Figure 6 is a schematic diagram of a second adjustment portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0044] Figure 7 is a schematic diagram of an image acquisition portion and a second support portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0045] Figure 8 is a top view of an image acquisition portion and a second support of a capacitor chamfer measuring device according to an embodiment of the present application;

[0046] Figure 9 is another schematic diagram of an image acquisition portion and a second support portion of a capacitor chamfer measuring device according to an embodiment of the present application;

[0047] Figure 10 is another schematic diagram of an image acquisition portion and a second support portion of a capacitor chamfer measuring device according to an embodiment of the present application. DETAILED DESCRIPTION

[0048] The foregoing and other features of the present application will become apparent to those skilled in the art upon consideration of the following description of the application with reference to the accompanying drawings. In the drawings, like reference numerals refer to like elements throughout. The application is illustrated by way of example and not limitation in the figures of the accompanying drawings in which:

[0049] In the embodiments of the present application, the term "and / or" includes any one and all combinations of the associated listed terms. The terms "comprise", "include", "have", and the like, refer to the presence of the stated features, elements, elements or components, but do not exclude the presence or addition of one or more other features, elements, elements or components.

[0050] In the embodiments of the present application, the singular form "one", "the" and the like can include the plural form, should be broadly understood as "one" or "a kind of" rather than the meaning of "one"; In addition, the term "said" should be understood to include both singular and plural forms, unless the context clearly indicates otherwise. In addition, the term "according to" should be understood as "at least partially according to", and the term "based on" should be understood as "at least partially based on", unless the context clearly indicates otherwise. In addition, unless otherwise specified, "up" or "up" refers to the direction of gravity, that is, the upper direction of the capacitor measurement device of the present application during operation; "down" or "down" refers to the direction of gravity, that is, the lower direction of the capacitor measurement device of the present application during operation.

[0051] The embodiments of the present application will be described below with reference to the accompanying drawings.

[0052] Embodiments of the first aspect

[0053] The present application provides a capacitor chamfer measurement device, Figure 1 is a schematic diagram of the capacitor chamfer measurement device of the present application. As Figure 1 shown, the capacitor chamfer measurement device 10 includes a bearing part 100, a first support part 200, a light source part 300, a first adjustment part 400, and an image acquisition part 500.

[0054] The first support part 200 supports the bearing part 100, the light source part 300 is fixed above the bearing 100, and the bearing part 100 is provided with a light transmission part 101, and the light source part 300 emits light to the light transmission part 101 along a direction perpendicular to the extension direction of the bearing part 100 (Z direction shown). Figure 1

[0055] ​The first adjusting part 400 is fixed above the bearing part 100, and a first capacitor to be measured for chamfer is arranged on the first adjusting part 400 in a detachable manner (not shown in the figure), the first capacitor is located above the light transmission part 101, and the first adjusting part 400 is used for adjusting the relative position between the first capacitor and the light source part 300. Figure 1

[0056] The image acquisition part 500 is arranged below the bearing part 100, wherein the image acquisition part 500 has a camera element 510 which is opposite to the light source part 300 in the up-down direction (Z direction shown in the figure) and is used for acquiring the image of the first capacitor, and the optical axis of the light emitted by the light source part 300 coincides with the central axis of the camera element 510. Figure 1

[0057] Through the above structure, the capacitor chamfer measuring device 10 provided by the embodiment of the present application acquires the projection image of the first capacitor by using the camera element 510, and calculates the chamfer of the first capacitor according to the image, so as to improve the measurement accuracy of the chamfer, avoid that the capacitor is excessively or insufficiently polished, further reduce product loss, improve polishing efficiency, and save manufacturing cost.

[0058] In the above embodiment, as shown in the figure, Figure 1 The bearing part 100 can be a square platform, the space is divided into a region above the bearing part 100 and a region below the bearing part 100, the first supporting part 200 supports the bearing part 100 from the region below, for example, the first supporting part 200 has three supporting legs 201 supporting three corners of the bearing part 100 respectively, and two adjacent supporting surfaces 202 are formed between the three supporting legs 201 to further support two adjacent edges of the bearing part 100, so that the bearing part 100 is more stable, and the region below is formed as an open space, and further makes the chamfer measurement operation of the first capacitor more convenient and the acquired image more clear, so that the calculated chamfer is more accurate.

[0059] In the embodiment of the present application, only the bearing part 100 is taken as a square platform, and the first supporting part 200 supports and fixes three corners and two edges of the bearing part 100 as an example, in some possible embodiments, the bearing part 100 can be a rectangular platform, and the first supporting part 200 can adjust the supporting mode according to the area and material of the bearing part 100, for example, the first supporting part 200 can have four supporting legs 201 and form two opposite supporting surfaces 202 to support two opposite edges of the bearing part 100, and the specific fixing and supporting mode can be adjusted according to actual conditions, and the present application does not limit this.

[0060] In some embodiments, as shown in the figure, Figure 1 ​​As shown, the light source part 300 has a light source 301 and a light source fixing part 302, and the light source fixing part 302 fixes the light source 301 above the bearing part 100.

[0061] The light source 301 can be a laser. Since the laser light source has a small divergence angle and high brightness, a more clear and accurate capacitor projection image can be obtained under the irradiation of the light source 301, and a capacitor chamfer with higher precision can be obtained.

[0062] In some embodiments, the camera element 510 is a CCD camera. Since the CCD signal output has better consistency and the image acquisition speed is faster, a clearer capacitor image can be obtained more quickly, and the precision and efficiency of the chamfer measurement are improved.

[0063] In the above embodiment, the light-transmitting part 101 is a through hole penetrating through the bearing part 100. For example, the light-transmitting part 101 is a circular through hole arranged in the middle of the bearing part 100, and the center of the light-transmitting part 101 is on the optical axis of the light emitted by the light source 301. Thus, the light emitted by the light source 301 can pass through the light-transmitting part 101 to the greatest extent, so that the camera element 510 can obtain the image of the capacitor.

[0064] The shape of the light-transmitting part 101 can also be square, hexagonal, triangular, etc. In addition, the cross-sectional area of the light-transmitting part 101 should be greater than the cross-sectional area of the first capacitor to be measured. The shape and area of the light-transmitting part 101 are not limited in the application as long as the structure of the bearing part 100 is stable.

[0065] In some embodiments, the capacitor chamfer measurement device 10 also has a chamfer measurement part (not shown) electrically connected with the image acquisition part 500, and calculates the chamfer of the first capacitor according to the image obtained by the image acquisition part 500. Specifically, the chamfer measurement part can be a software installed in a computer, which calculates the pixel value to be polished according to the image obtained by the image acquisition part 500 and the existing chamfer calculation method. Thus, a more accurate chamfer can be obtained, and the problem of over-polishing or under-polishing of the capacitor can be avoided.

[0066] In some embodiments, as shown, Figure 1 The capacitor chamfer measurement device 10 also has a heat dissipation part 203 located below the bearing part 100. Since the irradiation of the light source 301 and the operation of the camera element 510 will generate a large amount of heat during the operation of the capacitor chamfer measurement device 10, the heat dissipation part 203 is arranged on the support surface 202 of the first support part 200 to improve safety.

[0067] In the above embodiments, the number of heat dissipation portions 203 and the specific positions where the heat dissipation portions 203 are arranged can be adjusted according to specific conditions, and the application does not limit this. In addition, the specific structure of the heat dissipation portion 203 can refer to related technologies in the art, and will not be described here.

[0068] Figure 2 is a schematic view of a first adjustment part 400 of a capacitor chamfer measuring device 10 according to an embodiment of the application; as Figure 1 and Figure 2 shown, the first adjustment part 400 can move in a direction perpendicular to and / or parallel to the extension direction of the bearing part 100 to adjust the position of the first capacitor in the X, Y, Z three-axis direction. For example, in order to adjust the position of the first capacitor in the three-axis direction, the first adjustment part 400 respectively has a Y-axis adjustment part 410, a Z-axis adjustment part 420, and an X-axis adjustment part 430.

[0069] The specific structure and adjustment method of the first adjustment part 400 will be described below.

[0070] As shown in Figure 2 , the first adjustment part 400 has a Y-axis adjustment part 410, wherein the Y-axis adjustment part 410 adjusts the position of the capacitor in the Y-axis direction, and the X-axis adjustment part 410 has a first capacitor fixing part 411 formed in a thin cylindrical shape.

[0071] In the above embodiments, the Z-axis is perpendicular to the extension direction of the bearing part 100, the Y-axis is the extension direction of the center axis of the first capacitor fixing part 411, and the X-axis is perpendicular to the Y-axis and the Z-axis respectively.

[0072] In the above embodiments, the first capacitor mainly refers to a disc capacitor, which has a circular hole in the middle, so that the first capacitor fixing part 411 is inserted into the circular hole of the first capacitor, and the first capacitor is suspended and fixed above the light transmission part 101.

[0073] In addition, the Y-axis adjustment part 410 also has a first base 412, a first moving part 413 and a first fixing part 414. The first capacitor fixing part 411, the first base 412, the first moving part 413 and the first fixing part 414 are connected in sequence, and the first capacitor fixing part 411 and the first base 412 and the first moving part 413 are relatively fixed, and the first moving part 413 is connected to the first fixing part 414 in a manner that can move on the Y-axis. A first handle 415 is provided on the side of the first moving part 413, and a user can use the first handle 415 to push and pull the first moving block in the Y-axis direction, thereby adjusting the position of the first capacitor in the Y-axis direction.

[0074] In the above embodiment, the first mobile part 413 and the first fixed part 414 can be connected by a slidable interface, a track or the like, and specific details can be referred to related art in the field, which will not be described herein.

[0075] Figure 3 is another schematic view of the first adjustment part 400 of the capacitor chamfer measuring device 10 of the embodiment of the present application; as Figure 2 and Figure 3 shown, the first adjustment part 400 further has a Z-axis adjustment part 420, wherein the Z-axis adjustment part 420 has a second mobile part 421, a second fixed part 422, a first rack 423, a second handle 424 and a first buckle 425.

[0076] The first fixed part 414 of the Y-axis adjustment part 410 is connected to one side of the second mobile part 421 of the Z-axis adjustment part 420, and the two are kept relatively fixed. The other side of the second mobile part 421 is connected in a manner that it can move relative to the second fixed part 422 in the Z-axis direction, and the length of the second mobile part 421 in the Y-axis direction is less than that of the second fixed part 422, specifically: Figure 4 is a side view of the first adjustment part 400 of the capacitor chamfer measuring device 10 of the embodiment of the present application; as Figure 2 shown, the second fixed part 422 is provided with the first rack 423 on the side connected to the second mobile part 421, and is provided with a groove H1 capable of accommodating the first rack 423 on the side of the second mobile part 421, the cross-sectional area of the groove H1 is greater than that of the first rack 421, so that the first rack 423 can move freely when accommodated in the groove H1. As Figure 2 and Figure 4 shown, the second mobile part 421 is provided with the second handle 424 and the first buckle 425 on both sides, and a crossbar (not shown) with a gear is connected between the two, the crossbar penetrates the second mobile part 421, and the gear in the middle of the crossbar can cooperate with the first rack 423. When the user rotates the second handle 424, the second mobile part 421 can reciprocate in the Z-axis direction following the gear, thereby adjusting the position of the first capacitor in the Z-axis direction. In addition, the first buckle 425 can adjust the force of the connection between the second handle 424 and the crossbar, so that the user can adjust the speed of the movement of the second mobile part 421 in the Z-axis direction as needed.

[0077] In addition, since the first fixed part 414 of the Y-axis adjustment part 410 and the second mobile part 421 are kept relatively fixed, when the position of the first capacitor in the Z-axis direction is adjusted, the entire Y-axis adjustment part 410 moves in the Z-axis direction with the second mobile part 421, thus avoiding the mutual interference of the position adjustment of the first capacitor in the Y-axis and Z-axis directions.

[0078] In the above embodiment, the second movable portion 421 and the second fixed portion 422 may be connected by using a sliding interface, a snap fastener, etc. For details, please refer to the relevant technology in the field, which will not be described here.

[0079] like Figure 2 and Figure 3 As shown, the first adjustment portion 400 further includes an X-axis adjustment portion 430, which includes a second base 431, a third movable portion 432, and a third fixed portion 433. The third movable portion 432 is connected to the second base 431 so as to be movable relative to the second base 431 in the X-axis direction. Specifically, a second rack 434 is provided on the side of the second base 431 where the third movable portion 432 is connected, that is, above the second base 431. In conjunction with this, a groove H2 is provided below the third movable portion 432 to accommodate the second rack 434. The cross-sectional area of ​​the groove H2 is larger than that of the second rack 434, so that the second rack 434 can move freely when accommodated in the groove H2. In addition, a third handle 435 and a second buckle 436 are provided on both sides of the third movable portion. A crossbar (not shown) with a gear is connected between the third handle 435 and the second buckle 436. The crossbar passes through the third movable portion 432, and the gear in the middle of the crossbar can cooperate with the second rack. When the user turns the third handle 435, the third movable portion 432 can follow the gear and reciprocate along the second rack 434 in the X-axis direction. In addition, the second buckle 436 can adjust the strength of the connection between the third handle 435 and the crossbar, allowing the user to adjust the speed of the third movable portion 432 in the X-axis direction as needed.

[0080] The third movable portion 432 is connected to the third fixed portion 433 at its upper portion, and the two are relatively fixed. In addition, the first fixed portion 414 of the Y-axis adjustment portion 410 and the second fixed portion 422 of the Z-axis adjustment portion 420 are both connected to the third fixed portion 433 in a relatively fixed manner.

[0081] In addition, if Figure 3 As shown, a support portion 426 is provided between the second fixing portion 422 and the third fixing portion 433 of the Z-axis adjustment unit 420. The support portion 426 is connected to the second fixing portion 422 and the third fixing portion 433, respectively, and extends outward. Its cross-section is triangular in the upper half and rectangular in the lower half. The support portion 426 increases the connection area between the second fixing portion 422 and the third fixing portion 433 and supports the second fixing portion 422, thereby further stabilizing the connection between the Z-axis adjustment unit 420 and the X-axis adjustment unit 430.

[0082] Figure 5is another side view of the first adjustment portion 400 of the capacitor chamfer measurement device 10 according to an embodiment of the present application; it is worth noting that Figure 5 As shown, the bottom surface of the first base 412 of the Y-axis adjustment part 410 is parallel to the bottom surface of the third movable part 432 of the X-axis adjustment part 430, that is, the Y-axis adjustment part 410 is suspended and fixed above the second base 431. According to this structure, when the position of the capacitor in the X-axis direction is adjusted, the Z-axis adjustment part 430 and the Y-axis adjustment part 410 as a whole move with the third movable part 432, and even when the position to be adjusted in the X-axis direction causes a part of the Y-axis adjustment part 410 to slide above the second base 431, the two will not interfere with each other. That is to say, the position adjustment of the first adjustment part 400 of the capacitor chamfer measuring device of the embodiment of the present application in the three-axis directions will not interfere with each other. Therefore, it is more flexible when adjusting the position of the capacitor and the operation is more convenient.

[0083] As mentioned above, the first adjustment portion 400 is mainly used to adjust the position of the disk capacitor, but the present application is not limited thereto. The following will introduce a method for adjusting the position of the square capacitor.

[0084] In some embodiments, the capacitor chamfer measurement device 10 provided in the present application further includes: a slide glass 600 and a second adjustment unit 700 .

[0085] Figure 6 FIG. 1 is a schematic diagram of the second adjustment portion 700 of the capacitor chamfer measurement device 10 according to an embodiment of the present application; Figure 1 and Figure 6 As shown, the slide glass 600 covers the light-transmitting portion 101 , and the second adjustment portion 700 is fixed above the carrying portion 100 for adjusting the relative position between the second capacitor to be chamfered and placed on the slide glass 600 and the light source portion 300 .

[0086] like Figure 6 As shown, the second adjustment portion 700 includes: a fourth moving portion 701 , a main body 702 , a fourth fixing portion 703 , and a fourth handle 704 .

[0087] Fourth fixing portions 703 are further provided on both sides of the main body 702 , wherein the fourth fixing portions 703 have through holes for screws to pass through, thereby fixing the main body 702 above the carrying portion 100 .

[0088] In addition, the main body 702 is formed as a cuboid with an accommodating space inside, wherein the fourth moving part 701 can be accommodated, the fourth moving part 701 is composed of two parts, 701a and 701b, wherein the end of 701a has an included angle for directly contacting the second capacitor and pushing the capacitor to adjust the position of the capacitor, and 701b is accommodated in the main body 702 and can slide in the accommodating space inside the main body 702.

[0089] A groove H4 is further arranged on the top surface of the main body 702, the fourth handle 704 can pass through the groove H4, and the groove H4 is also a sliding track of the fourth handle 704, specifically: the fourth handle 704 is inserted into the groove H4 and connected with the fourth moving part 701, the fourth handle 704 and the fourth moving part 701 are relatively fixed, and the fourth handle 704 can slide along the groove H4 as a track.

[0090] As shown in Figure 1 , the second adjusting part 700 can be arranged at position A of the bearing part 100, and the second capacitor is directly placed on the object glass 600, when the chamfer of the second capacitor needs to be measured, the fourth handle 704 can drive the fourth moving part 701 to move in the range of the groove H4 by pushing the fourth handle 704, thereby adjusting the position of the second capacitor.

[0091] In the above embodiment, the second capacitor mainly refers to a square capacitor, through the above structure provided by the embodiment of the present application, the chamfer of different types of capacitors can be measured, and the operation is flexible and convenient when adjusting the position.

[0092] The capacitor chamfer measuring device 10 provided by the embodiment of the present application can not only adjust the position of the capacitor, but also adjust the position of the image acquisition part 500 when acquiring the image of the capacitor.

[0093] In some embodiments, the capacitor chamfer measuring device 10 provided by the embodiment of the present application further has a second supporting part 800.

[0094] Figure 7 is a schematic view of the image acquisition part 500 and the second supporting part 800 of the capacitor chamfer measuring device 10 of the embodiment of the present application; as Figure 7 shown, the image acquisition part 500 has a camera element 510, the camera element 510 has a lens 511 and a camera body 512, the second supporting part 800 can support the image acquisition part 500, and the camera element 510 is used to acquire the image of the capacitor.

[0095] In addition, in order to electrically connect the image acquisition unit 500 and the chamfer measuring unit, an interface for transmitting electronic images, such as a USB interface (not shown), is arranged on the image acquisition unit 500, so that the image of the capacitor acquired can be transmitted to a computer, and the chamfer of the capacitor can be calculated according to the image by using the chamfer measuring unit.

[0096] As shown in Figure 7 , the second support unit 800 has a support column 801, a fixing screw 802, and an adjusting bracket. As shown in Figure 1 and Figure 7 , the fixing screw 802 is arranged on the top surface of the support column 801 and is fixed on the bearing unit 100. The adjusting bracket adjusts the position of the camera element in the Z-axis direction, so that the central axis of the camera element coincides with the optical axis of the light emitted by the light source unit.

[0097] Figure 8 is a top view of the image acquisition unit 500 and the second support unit 800 of the capacitor chamfer measuring device 10 of the present application embodiment; as shown in Figure 7 and Figure 8 , the adjusting bracket includes a first bracket 803, a second bracket 804, and a third bracket 805.

[0098] Among them, the first bracket 803 is fixedly connected with the support column 801, the second bracket 804 is fixedly connected with the camera element 510, and the third bracket 805 is connected with the first bracket 803 and the second bracket 804 respectively.

[0099] Figure 9 and Figure 10 is another schematic view of the image acquisition unit 500 and the second support unit 800 of the capacitor chamfer measuring device 10 of the present application embodiment, as shown in Figure 9 and Figure 10 , the first bracket 803, the second bracket 804, and the third bracket 805 also have adjusting bolts 806, 807, and 808 respectively, the first bracket 803 has a first track R1, and the third bracket 805 has a second track R2, and the adjusting bolts 806, 807, and 808 and the first track R1 and the second track R2 are used to adjust and fix the brackets.

[0100] In the above fixing structure, the first bracket 803, the second bracket 804, the third bracket 805, and the camera element 510 are relatively fixed between each other, the first bracket 803 can move in the Z-axis direction relative to the support column 801 with R1 as the track, and since the second bracket 804, the third bracket 805, and the camera element 510 are relatively fixed with the first bracket 803, the camera element 510 can also move in the Z-axis direction relative to the support column 801 with R1 as the track.

[0101] The second rail R2 is used to fix the connection between the first bracket 803 and the third bracket 805.

[0102] Through the above structure, the adjusting bracket can adjust the position of the camera element 510 in the Z-axis direction, so that after the position adjustment of the capacitor is completed, the camera element 510 position adjustment can be used to assist focusing, and a clearer image can be obtained.

[0103] In the embodiments of the present application, the adjustment mode of the capacitor and the camera element 510 is manually adjusted by the user, so that the position of the capacitor and the camera element can be flexibly adjusted according to the user's needs, and the image of the capacitor can be obtained.

[0104] In the above embodiments, the connection between the two modules with relatively fixed connection can be welded, screwed, etc., and the present application does not limit this.

[0105] In the above embodiments, the present application uses the gear and rack cooperation mode for sliding connection, but the present application is not limited to this, and the sliding connection of each component can also be achieved by setting a rail.

[0106] The capacitor chamfer measuring device 10 provided by the present application can adjust the position of different types of capacitors through the first adjusting part 400 and the second adjusting part 700, obtain the projection image of the capacitor by using the camera element 510, and calculate the chamfer of the capacitor according to the image by using the chamfer measuring part. Therefore, compared with the traditional manual method and visual method, the measurement accuracy of the chamfer can be improved, the capacitor can be prevented from being excessively or insufficiently rolled, the product loss can be reduced, the rolling efficiency can be improved, and the manufacturing cost can be saved.

[0107] The embodiments of the present application are described above in combination with specific implementation manners, but those skilled in the art should know that these descriptions are exemplary and are not a limitation on the protection scope of the embodiments of the present application. Those skilled in the art can make various modifications and changes to the embodiments of the present application according to the spirit and principles of the embodiments of the present application, and these modifications and changes are also within the scope of the embodiments of the present application.

[0108] The preferred embodiments of the embodiments of the present application are described above with reference to the accompanying drawings. Many features and advantages of these embodiments are clear according to the detailed description, and therefore the appended claims are intended to cover all these features and advantages falling within the true spirit and scope of the embodiments of the present application. Furthermore, since many modifications and changes are easily conceivable by those skilled in the art, the embodiments of the present application are not limited to the precise structures and operations exemplified and described, but can cover all suitable modifications and equivalents within the scope thereof.

Claims

1. A capacitor chamfer measuring device, characterized in that: The device has: a carrying portion, on which a light-transmitting portion is provided; a first supporting portion, which supports the carrying portion; a light source portion, which is fixed above the supporting portion and emits light toward the light-transmitting portion in a direction perpendicular to the extending direction of the supporting portion; a first adjustment portion, fixed above the carrying portion, a first capacitor to be measured for chamfering being detachably disposed on the first adjustment portion, the first capacitor being located above the light-transmitting portion, and the first adjustment portion being used to adjust a relative position between the first capacitor and the light source; an image acquisition unit, which is disposed below the carrying unit; The image acquisition unit includes an imaging element, which is vertically opposed to the light source unit to acquire an image of the capacitor, and an optical axis of light emitted from the light source unit coincides with a central axis of the imaging element.

2. The device according to claim 1, characterized in that The first adjustment portion can move along a direction perpendicular to and / or parallel to an extension direction of the carrying portion to adjust a position of the first capacitor in three axes: X, Y, and Z.

3. The device according to claim 1, characterized in that The device also has: a slide glass covering the light-transmitting portion; The second adjusting portion is fixed above the carrying portion and is used to adjust the relative position between a second capacitor to be chamfered and measured and placed on the slide and the light source.

4. The device according to claim 1, characterized in that The device further includes a second support portion that supports the image acquisition portion.

5. The device according to claim 4, characterized in that The second supporting portion includes an adjustment bracket that supports the image acquisition portion, and the adjustment bracket adjusts the position of the imaging element in the X-axis direction so that the central axis of the imaging element coincides with the optical axis of the light emitted by the light source portion.

6. The device according to claim 1, characterized in that The light-transmitting portion is a through hole penetrating the carrying portion, and a cross-sectional area of ​​the light-transmitting portion is larger than a cross-sectional area of ​​the capacitor.

7. The device according to claim 1, characterized in that The light source unit has: a light source and a light source fixing portion; The light source fixing portion fixes the light source above the carrying portion; The light source is laser.

8. The device according to claim 1, characterized in that The device also has: A chamfer measuring unit is electrically connected to the image acquiring unit to calculate the chamfer of the capacitor according to the image acquired by the image acquiring unit.

9. The device according to claim 1, characterized in that The imaging element is a CCD camera.

10. The device according to claim 1, characterized in that The device further comprises a heat dissipation portion, which is located below the supporting portion.

Images