Surface contact temperature measurement structure
By designing a surface contact temperature measurement structure and utilizing a floating connection between the movable probe and the temperature measurement shell and elastic buffer parts, the problems of large contact thermal resistance and large temperature measurement deviation during point contact temperature measurement are solved, achieving higher temperature measurement accuracy and automation adaptability.
Patent Information
- Application Number
- CN202422987641.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-03
- Publication Date
- 2025-10-28
- Estimated Expiration
- 2034-12-03
AI Technical Summary
The existing thermocouples have a large contact thermal resistance due to point contact when measuring temperature, resulting in large temperature measurement deviations. Especially when the position of the product to be measured in the automatic temperature measurement equipment deviates, they cannot be completely fitted together and there is a gap, which still cannot solve the problem of large temperature measurement deviations.
A surface contact temperature measurement structure is designed, which adopts a movable probe and a floating connection with the temperature measuring shell. The temperature measuring surface can be deflected in any direction relative to the temperature measuring shell. Combined with elastic buffer parts and low thermal resistance materials, it ensures that the temperature measuring surface is fully fitted with the product to be measured, thereby reducing the contact thermal resistance.
It effectively reduces the contact thermal resistance between the temperature measuring structure and the product to be measured, reduces the temperature measurement deviation, improves the temperature measurement accuracy, adapts to the position and angle deviation of the product to be measured, and is suitable for automated temperature measurement equipment.
Smart Images
Figure CN223485322U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of temperature measurement, and in particular to a surface contact temperature measurement structure. Background Art
[0002] A thermocouple is a commonly used temperature measurement sensor, typically consisting of two metal wires of different materials and a contact point. The two wires are welded to the contact point to form a miniature ball, which makes point contact with the surface of the product being measured during temperature measurement. However, point contact temperature measurement introduces significant thermal resistance, resulting in substantial temperature measurement errors.
[0003] To increase the contact area during temperature measurement, a spring is sometimes welded to the end of the thermocouple ball. However, in automatic temperature measurement equipment, the position of the product being measured is prone to deviation. Therefore, the surface of the product being measured and the spring at the end of the thermocouple often cannot be completely fitted due to angular deviation, resulting in a gap between the two surfaces. Consequently, a large contact thermal resistance still exists, and the problem of large temperature measurement deviation cannot be solved. Utility Model Content
[0004] The purpose of this invention is to provide a surface contact temperature measurement structure to solve the technical problem that the contact thermal resistance is still relatively large when in surface contact, resulting in a large temperature measurement deviation.
[0005] To achieve the above objectives, this utility model provides a surface contact temperature measurement structure, including a temperature measuring shell, a movable probe, and a temperature sensing wire;
[0006] The movable probe has a temperature measuring surface at one end and is floatingly connected to the temperature measuring housing at the other end so that the temperature measuring surface can be deflected in any direction relative to the temperature measuring housing; the temperature measuring surface is located outside the temperature measuring housing.
[0007] The temperature sensing wire is inserted into the temperature measuring housing, and one end of the temperature sensing wire is thermally connected to the temperature measuring surface.
[0008] Furthermore, the active probe includes:
[0009] A connecting part for floating connection with the temperature measuring housing; and
[0010] A temperature measuring unit is disposed at one end of the movable probe located outside the temperature measuring housing, the temperature measuring surface is located on the temperature measuring unit, and the temperature sensing wire is thermally connected to the temperature measuring unit.
[0011] Furthermore, the surface contact temperature measuring structure also includes an elastic buffer;
[0012] One end of the elastic buffer is connected to the temperature measuring housing, and the other end is connected to the connecting part of the movable probe, so as to realize the floating connection between the movable probe and the temperature measuring housing.
[0013] Furthermore, the temperature measuring housing has a cavity;
[0014] The connection part of the movable probe is located at one end of the cavity;
[0015] The elastic buffer is located inside the cavity, with its first end abutting against the connecting part and its second end abutting against the other end of the cavity. The first end and the second end are the two opposite ends of the elastic buffer along its elastic force direction.
[0016] Furthermore, the inner wall of the cavity is provided with a boss protruding toward its interior;
[0017] The outer wall of the connecting part is provided with a protruding ring, and the protruding ring has a first surface and a second surface that are disposed opposite to each other.
[0018] The first surface abuts against the elastic buffer, and the second surface abuts against the boss under the action of the elastic buffer.
[0019] Furthermore, the outer diameter of the convex ring is larger than the inner diameter of the boss and smaller than the cavity diameter.
[0020] Furthermore, the connecting portion is located on one side of the first surface of the convex ring and is fitted inside the elastic buffer.
[0021] Furthermore, the temperature measuring part and the connecting part are detachably connected, and the connecting part is provided with a first through hole, through which the temperature sensing wire passes to connect the temperature measuring part.
[0022] Furthermore, the end of the temperature sensing wire is attached to the side of the temperature measuring part near the connecting part by welding or thermally conductive adhesive.
[0023] Furthermore, the temperature measuring part is made of a low thermal resistance material.
[0024] Furthermore, the surface contact temperature measuring structure also includes a mounting head;
[0025] The mounting head is connected to the end of the temperature measuring housing away from the movable probe, and the first end of the elastic buffer abuts against the end face of the mounting head facing the movable probe.
[0026] Furthermore, the mounting head has a second through hole;
[0027] The temperature sensing wire is threaded through the movable probe, the cavity of the temperature measuring housing, and the second through hole. The end of the temperature sensing wire extends to the outside of the mounting head for electrical connection with an external temperature measuring circuit.
[0028] Furthermore, the elastic buffer is a spring or a rubber ring.
[0029] The technical advantage of this utility model is that it provides a surface contact temperature measurement structure, which adopts a surface contact movable probe and is floatingly connected to the temperature measurement housing. Therefore, its temperature measurement surface can be deflected and tilted in any direction relative to the temperature measurement housing to adapt to the position and angle deviation of the contact surface of the product under test, so that the temperature measurement surface of the movable probe is completely in contact with the contact surface of the product under test, thereby effectively reducing the contact thermal resistance when the temperature measurement structure and the product under test are in surface contact, and thus reducing the temperature measurement deviation. Attached Figure Description
[0030] The technical solution and other beneficial effects of this application will become apparent from the following detailed description of specific embodiments in conjunction with the accompanying drawings.
[0031] Figure 1 This is a schematic diagram of the surface contact temperature measurement structure provided in the embodiments of this application;
[0032] Figure 2 for Figure 1 A schematic diagram of the cross-section of the surface contact temperature measuring structure along the AA direction;
[0033] Figure 3 An exploded view of the surface contact temperature measurement structure provided in the embodiments of this application;
[0034] Figure 4 This is a schematic diagram showing the separation of the temperature measuring part and the connecting part provided in the embodiments of this application.
[0035] The components in the attached diagram are labeled as follows:
[0036] 10-Temperature measuring housing; 20-Modible probe; 30-Temperature sensing wire; 40-Elastic buffer; 50-Mounting head; 101-Cavity; 102-Boss; 201-Connecting part; 202-Temperature measuring part; 2011-Protruding ring; 20111-First surface; 20112-Second surface; 2012-Groove; 2021-Temperature measuring surface; 2022-Protrusion; 501-Second through hole. Detailed Implementation
[0037] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.
[0038] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.
[0039] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0040] The following disclosure provides many different embodiments or examples for implementing different structures of this application. To simplify the disclosure, specific examples of components and arrangements are described below. Of course, these are merely examples and are not intended to limit the scope of this application. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, various specific examples of processes and materials are provided in this application, but those skilled in the art will recognize the application of other processes and / or the use of other materials.
[0041] The following description, in conjunction with the accompanying drawings, illustrates a surface contact temperature measurement structure provided in this application.
[0042] like Figures 1 to 4As shown in the figure, this application embodiment provides a surface contact temperature measurement structure, which includes a temperature measuring housing 10, a movable probe 20, and a temperature sensing wire 30. The movable probe 20 has a temperature measuring surface 2021 at one end, and the other end is floatingly connected to the temperature measuring housing 10 so that the temperature measuring surface 2021 can deflect relative to the temperature measuring housing 10 in any direction. The temperature measuring surface 2021 is located outside the temperature measuring housing 10. The temperature sensing wire 30 passes through the temperature measuring housing 10, and one end of the temperature sensing wire 30 is thermally connected to the temperature measuring surface 2021 to sense the temperature of the product under test through the temperature measuring surface 2021.
[0043] The aforementioned temperature measuring surface 2021 is used to contact the product under test, which refers to the object or medium whose temperature needs to be measured. The shape of the temperature measuring surface 2021 is adapted to the shape of the contact surface of the product under test. Schematic, if the product under test is an object with a flat surface, such as a cuboid, cube, or cone, or if the temperature-measuring part 202 of the product under test has a flat surface, then the temperature measuring surface 2021 is set as a plane; if the product under test is an object with a curved surface, such as a cylinder or sphere, then the temperature measuring surface 2021 can also be curved. It should be noted that the size of the temperature measuring surface 2021 can be larger than the contact surface of the product under test, can completely fit the contact surface of the product under test, or can be smaller than the contact surface of the product under test; there is no limitation in this regard.
[0044] During temperature measurement, the surface of the temperature measuring part 202 of the product under test is usually opposite to the temperature measuring surface 2021, and the temperature measuring surface 2021 is attached to the surface of the product under test for temperature measurement. Due to the accuracy of various equipment and positioning fixtures, the surface of the product under test cannot be guaranteed to be completely parallel to the temperature measuring surface 2021. When the position of the product under test deviates, causing its surface to be not completely parallel to the temperature measuring surface 2021, such as tilting, since the movable probe 20 of the temperature measuring structure of this application is floatingly connected to the temperature measuring housing 10, the movable head can drive the temperature measuring surface 2021 to rotate relative to the temperature measuring housing 10, thereby automatically correcting the angle difference and making the contact surface of the temperature measuring surface 2021 completely attached to the contact surface of the product under test. This reduces the contact thermal resistance when the temperature measuring structure and the product under test are in surface contact, thereby reducing the temperature measurement deviation and effectively improving the temperature measurement accuracy.
[0045] In the above temperature measurement process, it is not necessary to adjust the direction of the force applied to the temperature measuring housing 10 to achieve surface contact between the temperature measuring structure and the product to be tested. Instead, the temperature measuring surface 2021 on the movable probe 20, which is floatingly connected to the temperature measuring housing 10, automatically levels the contact surface. This can be used in automatic temperature measuring equipment, which is conducive to realizing automated temperature measurement.
[0046] In addition, the active probe 20 may be completely outside the temperature measuring housing 10, or it may be partially outside the temperature measuring housing 10 with the remaining part inside the temperature measuring housing 10, at least the temperature measuring surface 2021 is located outside the temperature measuring housing 10.
[0047] The aforementioned temperature sensing wire 30 can be made of flexible or rigid material. When the temperature sensing surface 2021 comes into contact with the contact surface of the product under test, the temperature sensing wire 30 can achieve thermal conductivity connection with the contact surface through the temperature sensing surface 2021, thereby realizing temperature sensing of the product under test.
[0048] The surface contact temperature measurement structure provided in this application embodiment adopts a surface contact movable probe 20, and the movable probe 20 is floatingly connected to the temperature measurement housing 10. Therefore, its temperature measurement surface 2021 can be deflected and tilted in any direction relative to the temperature measurement housing 10 to adapt to the position and angle deviation of the contact surface of the product under test, so that the temperature measurement surface 2021 of the movable probe 20 is completely attached to the contact surface of the product under test, thereby effectively reducing the contact thermal resistance when the temperature measurement structure and the product under test are in surface contact, and thus reducing the temperature measurement deviation.
[0049] In some embodiments of this application, the movable probe 20 specifically includes a connecting portion 201 and a temperature measuring portion 202. The connecting portion 201 is used for a floating connection with the temperature measuring housing 10, and the temperature measuring portion 202 is disposed at the end of the connecting portion 201 located outside the temperature measuring housing 10. A temperature measuring surface 2021 is located on the temperature measuring portion 202, and a temperature sensing wire 30 is thermally connected to the temperature measuring portion 202.
[0050] In some embodiments of this application, the surface contact temperature measuring structure further includes an elastic buffer 40, and the aforementioned connecting portion 201 is floatingly connected to the temperature measuring housing 10 through the elastic buffer 40.
[0051] Specifically, one end of the elastic buffer 40 is connected to the temperature measuring housing 10, and the other end is connected to the connecting part 201 of the movable probe 20, so as to realize the floating connection between the movable probe 20 and the temperature measuring housing 10.
[0052] The elastic buffer 40 can be an elastic component such as a spring or rubber ring. Under the pressure on the temperature measuring housing 10 and the contact force provided by the contact surface of the product under test, the elastic buffer 40 deforms, causing the movable probe 20 to rotate and automatically align with the contact surface of the product under test, thus ensuring complete contact between the temperature measuring surface 2021 and the contact surface of the product under test. Furthermore, when the temperature measuring structure is close to the product under test, the elastic buffer 40 provides cushioning for the movable probe 20, preventing excessive force on the movable probe 20 and the product under test, and also reducing the accuracy requirements of the temperature measuring equipment.
[0053] The surface contact temperature measurement structure provided in this application embodiment achieves a floating connection between the movable probe 20 and the temperature measurement housing 10 through the elastic buffer 40. When the temperature measurement surface 2021 contacts the contact surface of the product under test, it can adapt to the position and angle deviation of the product under test, effectively reducing the contact thermal resistance when the temperature measurement structure and the product under test are in surface contact, thereby reducing the temperature measurement deviation.
[0054] In some embodiments of this application, the temperature measuring housing 10 has a cavity 101, the connecting portion 201 of the movable probe 20 is located at one end of the cavity 101, and the aforementioned elastic buffer 40 is located inside the cavity 101, with its first end abutting against the connecting portion 201 and its second end abutting against the other end of the cavity 101. The first and second ends of the elastic buffer 40 are opposite ends along its elastic force direction. Here, the elastic force direction refers to the direction in which the elastic buffer 40 generates elastic force under the action of external force. For example, the elastic buffer 40 deforms inside the cavity 101 due to the compression of the movable probe 20 and the other end of the cavity 101, and the direction of the resulting elastic force is the same as the axial direction of the cavity 101. Therefore, the first and second ends of the elastic buffer 40 are opposite ends along the axial direction of the cavity 101.
[0055] In this embodiment, part of the movable probe 20 is inside the cavity 101, and another part extends out of the cavity 101 to the outside of the temperature measuring housing 10. To facilitate the sliding of the movable probe 20 inside the temperature measuring housing 10, the temperature measuring housing 10 has an opening on the side near the movable probe 20. This opening can accommodate the movable probe 20 to slide and deflect within the temperature measuring housing 10. Correspondingly, the boundary of one end of the cavity 101 is open due to the presence of the opening.
[0056] The aforementioned elastic buffer 40 is entirely located within the cavity 101. The boundary at the other end of the cavity 101 can be closed or partially open. In the partially open case, the side of the temperature measuring housing 10 away from the movable probe 20 also has an opening, the inner diameter of which is smaller than the cavity diameter of the cavity 101, so that the cavity 101 can provide sufficient support to abut against the inner wall of the elastic buffer 40. In this embodiment, considering the stability of the surface contact temperature measuring structure during temperature measurement, the side of the temperature measuring housing 10 away from the movable probe 20 is closed.
[0057] Furthermore, the inner wall of the cavity 101 is provided with a boss 102 protruding inward. That is, the temperature measuring housing 10 has an opening on the side near the movable probe 20, and the opening is smaller than the cavity diameter of the cavity 101.
[0058] A protruding ring 2011 is provided on the outer side wall of the connecting part 201. Figure 1 and 2In the AA direction shown, the convex ring 2011 has a first surface 20111 and a second surface 20112 disposed opposite to each other. The first surface 20111 abuts against the elastic buffer 40, and the second surface 20112 abuts against the boss 102 under the action of the elastic buffer 40, thereby floatingly connecting the movable probe 20 to one end of the temperature measuring housing 10. It should be noted that the convex ring 2011 can be located at the end of the connecting portion 201 away from the temperature measuring surface 2021, or it can be located in the middle of the connecting portion 201, etc. The connecting portion 201 is located on one side of the first surface 20111 of the convex ring 2011 and is sleeved within the elastic buffer 40; that is, a portion of the connecting portion 201 is sleeved within the elastic buffer 40, ensuring a stable connection between the elastic buffer 40 and the movable probe 20.
[0059] The outer diameter R1 of the aforementioned convex ring 2011 is greater than the inner diameter R2 of the boss 102 of the temperature measuring housing 10 and smaller than the cavity diameter of the cavity 101. That is, the outer diameter of the convex ring 2011 is greater than the inner diameter of the opening, so as to keep the convex ring 2011 in the cavity 101 of the temperature measuring housing 10 and prevent the movable probe 20 from detaching from the temperature measuring housing 10.
[0060] When the temperature measuring surface 2021 is not in contact with the product under test, due to the restriction of the boss 102 and the elastic force of the elastic buffer 40, the convex ring 2011 and the part above the convex ring 2011 in the movable probe 20 are inside the cavity 101, and the remaining part is outside the cavity 101, with the convex ring 2011 abutting against the boss 102. When the temperature measuring surface 2021 is in contact with the product under test, the movable probe 20 can slide up and down or rotate back and forth and left and right at the opening. However, due to the restriction of the boss 102, the angle of rotation of the movable probe 20 is limited to a certain extent, so that the temperature sensing wire 30 passing through the movable probe 20 and the cavity 101 is not easily broken, and the stability of the surface contact temperature measuring structure can be improved. In addition, the outer diameter of the convex ring 2011 is smaller than the cavity diameter of the cavity 101, which ensures that the convex ring 2011 can slide up and down and deflect back and forth and left and right within the cavity 101.
[0061] In some embodiments, the temperature measuring part 202 and the connecting part 201 are detachably connected. For example, the temperature measuring part 202 and the connecting part 201 can be detachably connected by screws, clips, wedges, etc. This detachable connection facilitates the replacement of the temperature measuring part 202 to adapt to the contact surface shape of different products under test, or to replace damaged temperature sensing wires 30 and temperature measuring surfaces 2021, thereby improving applicability and convenience. In other embodiments of this application, the temperature measuring part 202 and the connecting part 201 can also be integrally formed.
[0062] Schematic, the temperature measuring part 202 and the connecting part 201 are engaged. The connecting part 201 has a groove 2012 on one end outside the temperature measuring housing 10. Correspondingly, the temperature measuring part 202 has a protrusion 2022 on one end near the connecting part 201. The protrusion 2022 and the groove 2012 are adapted to each other and can be engaged.
[0063] Furthermore, a first through hole is provided inside the connecting part 201, through which the aforementioned temperature sensing wire 30 passes to connect to the temperature measuring part 202. That is, the temperature sensing wire 30 passes through the connecting part 201 and is thermally connected to the temperature measuring part 202.
[0064] More specifically, the temperature sensing wire 30 includes two ends, one end of which is attached to the side of the temperature measuring part 202 near the connecting part 201 by welding or thermally conductive adhesive. The other side of the temperature measuring part 202 is the temperature measuring surface 2021, meaning that the temperature sensing wire 30 does not penetrate the temperature measuring surface 2021. The temperature sensing wire 30 can be located at the center of the temperature measuring part 202, or at other locations within the range mapped from the first through hole to the temperature measuring part 202.
[0065] In addition, to further reduce contact thermal resistance, the temperature measuring part 202 can be made of a material with good thermal conductivity and low thermal resistance, and the thickness of the temperature measuring part 202 is also relatively thin. The material of the temperature measuring part 202 can be a low thermal resistance material such as copper or aluminum.
[0066] It should be noted that the three-dimensional shapes of the connecting part 201 and the temperature measuring part 202 can be the same or different. The connecting part 201 can be a cylinder, a cuboid, etc., and the shape of the temperature measuring housing 10 is not limited and can be designed according to the actual application scenario requirements.
[0067] In some embodiments of this application, the surface contact temperature measurement structure also includes a mounting head 50.
[0068] Specifically, the mounting head 50 is connected to the end of the temperature measuring housing 10 away from the movable probe 20, for sealing the end of the cavity 101 and providing abutment force for the elastic buffer 40. The first end of the elastic buffer 40 abuts against the end face of the mounting head 50 facing the movable probe 20.
[0069] The mounting head 50 is used to connect to an external actuator (such as a motor, transformer, engine, heater, etc.), facilitating the installation of the surface contact temperature sensing structure on the external actuator. The shape of the mounting head 50 is adapted to the installation position on the external actuator. Figure 3The mounting head 50 is shown as an illustration. In other embodiments of this application, the shape of the mounting head 50 can be adapted to the shape of the actual installation position on the external actuator, and this application does not limit this. The detachable design allows for the replacement of mounting heads 50 with different shapes, enabling the temperature measuring structure to be installed on different external actuators.
[0070] The mounting head 50 and the temperature measuring housing 10 can be fixedly connected or detachably connected. Schematic, the temperature measuring housing 10 has a first connecting ear on its outer periphery, located on the side of the temperature measuring housing 10 near the mounting head 50. The mounting head 50 has a second connecting ear corresponding to the first connecting ear. A fastener passes through the first and second connecting ears to connect the temperature measuring housing 10 to the mounting head 50. The fastener can be a bolt, etc. In other embodiments of this application, the mounting head 50 and the temperature measuring housing 10 can also be integrally formed.
[0071] The mounting head 50 includes two opposing end faces, one facing away from the movable probe 20 and the other facing the movable probe 20. The end face facing the movable probe 20 abuts against the elastic buffer 40.
[0072] Furthermore, the mounting head 50 has a second through hole 501 through which the temperature sensing wire 30 passes. The temperature sensing wire 30 passes through the second through hole 501, the cavity 101 of the temperature measuring housing 10, and the connection portion 201 of the movable probe 20, to achieve thermally conductive connection with the temperature measuring surface 2021. One end of the temperature sensing wire 30 near the mounting head 50 extends to the outside of the mounting head 50, thereby facilitating electrical connection with an external temperature measuring circuit to realize the signal transmission of temperature sensing information.
[0073] The shape of the cavity 101 can be similar to or different from that of the elastic buffer 40. For example, assuming the cross-section of the elastic buffer 40 is circular, the cross-section inside the cavity 101 can be circular or square, as long as the elastic buffer 40 can move up and down inside the cavity 101. This application does not limit this. Schematic, the cross-section inside the cavity 101, the cross-section of the elastic buffer 40, and the cross-section of the movable probe 20 are all circular. Here, the cross-section refers to the cross-section along the direction perpendicular to AA.
[0074] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.
[0075] The foregoing has provided a detailed description of a surface contact temperature measurement structure provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the technical solutions and core ideas of this application. Those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. A surface contact temperature measurement structure, characterized in that, It includes a temperature measuring housing (10), a movable probe (20), and a temperature sensing wire (30); The movable probe (20) has a temperature measuring surface (2021) at one end and is floatingly connected to the temperature measuring housing (10) at the other end so that the temperature measuring surface (2021) can be deflected in any direction relative to the temperature measuring housing (10); the temperature measuring surface (2021) is located outside the temperature measuring housing (10); The temperature sensing wire (30) is inserted into the temperature measuring housing (10), and one end of the temperature sensing wire (30) is thermally connected to the temperature measuring surface (2021).
2. The surface contact temperature measurement structure as described in claim 1, characterized in that, The active probe (20) includes: Connecting part (201) for floating connection with the temperature measuring housing (10); and The temperature measuring part (202) is located at one end of the active probe (20) outside the temperature measuring housing (10), the temperature measuring surface (2021) is located on the temperature measuring part (202), and the temperature sensing wire (30) is thermally connected to the temperature measuring part (202).
3. The surface contact temperature measurement structure as described in claim 2, characterized in that, The surface contact temperature measurement structure also includes an elastic buffer (40); One end of the elastic buffer (40) is connected to the temperature measuring housing (10), and the other end is connected to the connecting part (201) of the movable probe (20) to realize the floating connection between the movable probe (20) and the temperature measuring housing (10).
4. The surface contact temperature measurement structure as described in claim 3, characterized in that, The temperature measuring housing (10) has a cavity (101); The connecting part (201) of the movable probe (20) is located at one end of the cavity (101); The elastic buffer (40) is located inside the cavity (101), with its first end abutting against the connecting part (201) and its second end abutting against the other end of the cavity (101). The first end and the second end are the two opposite ends of the elastic buffer (40) along its elastic force direction.
5. The surface contact temperature measurement structure as described in claim 4, characterized in that, The inner wall of the cavity (101) is provided with a boss (102) protruding toward its interior; The outer side wall of the connecting part (201) is provided with a protruding ring (2011), and the protruding ring (2011) has a first surface (20111) and a second surface (20112) disposed opposite to each other; The first surface (20111) abuts against the elastic buffer (40), and the second surface (20112) abuts against the boss (102) under the action of the elastic buffer (40).
6. The surface contact temperature measurement structure as described in claim 5, characterized in that, The outer diameter of the convex ring (2011) is greater than the inner diameter of the boss (102) and smaller than the cavity diameter of the cavity (101).
7. The surface contact temperature measurement structure as described in claim 5, characterized in that, The connecting part (201) is located on one side of the first surface (20111) of the convex ring (2011) and is sleeved inside the elastic buffer (40).
8. The surface contact temperature measurement structure as described in claim 2, characterized in that, The temperature measuring part (202) is detachably connected to the connecting part (201). The connecting part (201) has a first through hole inside, and the temperature sensing wire (30) passes through the first through hole to connect to the temperature measuring part (202).
9. The surface contact temperature measurement structure as described in claim 8, characterized in that, The end of the temperature sensing wire (30) is attached to the side of the temperature measuring part (202) near the connecting part (201) by welding or thermal adhesive.
10. The surface contact temperature measurement structure as described in claim 8, characterized in that, The temperature measuring unit (202) is made of a low thermal resistance material.
11. The surface contact temperature measurement structure as described in claim 4, characterized in that, The surface contact temperature measurement structure also includes a mounting head (50); The mounting head (50) is connected to the end of the temperature measuring housing (10) away from the movable probe (20), and the first end of the elastic buffer (40) abuts against the end face of the mounting head (50) facing the movable probe (20).
12. The surface contact temperature measurement structure as described in claim 11, characterized in that, The mounting head (50) has a second through hole (501); The temperature sensing wire (30) is inserted into the cavity (101) of the movable probe (20), the temperature measuring housing (10), and the second through hole (501). The end of the temperature sensing wire (30) extends to the outside of the mounting head (50) for electrical connection with the external temperature measuring circuit.
13. The surface contact temperature measurement structure as described in claim 3, characterized in that, The elastic buffer (40) is a spring or a rubber ring.