Satellite test equipment

Abstract

The utility model relates to satellite test equipment, comprising a test switching unit which comprises a plugging area and a test area, and the test area is provided with a plurality of test connection parts; the plugging area is provided with a plurality of electric connectors, the plurality of electric connectors comprise different electric connector types, and the plurality of electric connectors share a plurality of test connecting parts; the satellite equipment to be tested is connected with the electric connector through the adapter cable; and the test device is connected with the test connection part and is used for outputting test data of the to-be-tested satellite equipment. The satellite test equipment is convenient for workers to operate, and the test efficiency, the test safety and the test effect of the satellite equipment can be improved.

Description

Technical Field

[0001] This utility model mainly relates to the field of satellite simulation and operation control technology, and specifically to a satellite testing device. Background Technology

[0002] Currently, electrical interface testing of satellite devices under test (DUT) primarily employs cable connections, linking the DUT to the testing instrument. One end of the cable serves as the test interface, directly connecting to the probe of the testing instrument. The connector used for this connection can be either a pin-and-hole connector or a pin-and-hole connector.

[0003] Existing satellite equipment testing methods suffer from several drawbacks. The connector sockets have densely packed, unmarked pins and holes, making them difficult for operators to identify, prone to mis-insertion, and resulting in low testing efficiency. Unstable pin and hole contact can negatively impact the accuracy and consistency of test results. Directly connecting the satellite under test (DUT) to the testing instruments via cable is prone to short circuits, potentially causing damage to the satellite equipment and other quality issues. Therefore, current satellite equipment testing methods suffer from unsatisfactory testing results. Utility Model Content

[0004] The technical problem to be solved by this application is to provide a satellite testing device that is easy for staff to operate and can improve the testing efficiency, testing safety and testing effect of satellite equipment.

[0005] The technical solution adopted in this application to solve the above-mentioned technical problems is a satellite testing device, comprising: a test adapter unit, including a plug-in area and a test area, the test area being provided with multiple test connection parts; the plug-in area being provided with multiple electrical connectors, the multiple electrical connectors including different electrical connector types, the multiple electrical connectors sharing multiple test connection parts; an adapter cable, through which the satellite device under test is connected to the electrical connectors; and a testing device, connected to the test connection parts, the testing device being used to output test data of the satellite device under test.

[0006] In one embodiment of this application, the test connection part is a test socket or a test pin.

[0007] In one embodiment of this application, the satellite testing equipment further includes multiple banana plugs, each banana plug having an identification part; there are multiple testing devices, and each testing device is connected to a banana plug in a one-to-one correspondence; the testing connection part is a testing socket, and multiple banana plugs can be stacked and connected to form a connection unit, which is connected to one of the testing sockets.

[0008] In one embodiment of this application, the electrical connector is provided with a metal housing, and the metal housings of each electrical connector are connected; the test socket is connected to the satellite housing.

[0009] In one embodiment of this application, a housing is provided on the test connection part, and the housing is made of insulating material.

[0010] In one embodiment of this application, each test connection has a preset spacing, and multiple test connections are arranged side by side.

[0011] In one embodiment of this application, the satellite device under test includes a first satellite device under test and a second satellite device under test; the adapter cable is a three-way cable, which includes a first end, a second end, and a third end. The first end is connected to the first satellite device under test, the second end is connected to the second satellite device under test, and the third end is connected to an electrical connector.

[0012] In one embodiment of this application, the signal connection line between the plug-in area and the test area is made using a printed circuit board wiring method.

[0013] In one embodiment of this application, the satellite testing equipment further includes a housing having a hollow cavity for housing the test adapter unit, and the housing is made of insulating material.

[0014] In one embodiment of this application, the housing is provided with an opening cover, the position of which corresponds to the insertion area and the test area, and the opening cover can be opened and locked.

[0015] The technical solution of this application, by setting up a highly integrated test adapter unit, covers most satellite plug types. It allows multiple different types of electrical connectors (e.g., sockets) to share multiple test connection parts (e.g., jacks). Different models of satellite devices under test can use this test adapter unit interchangeably. Test devices and instruments can be quickly connected to this test adapter unit, improving test efficiency. Connecting the satellite device under test and the electrical connector via an adapter cable does not affect normal communication between satellite modules during testing. This application is equivalent to a satellite test device with multiple connectors sharing jacks. In the testing of a certain satellite model under development, the verification and use of the satellite test device has shown good results. Compared with previous testing methods, efficiency, ease of operation, and process safety have all been improved. Attached Figure Description

[0016] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the specific embodiments of this application will be described in detail below with reference to the accompanying drawings, wherein:

[0017] Figure 1 This is a schematic diagram of the structure of a satellite testing device according to an embodiment of this application;

[0018] Figure 2 This is a schematic diagram of the structure of a satellite testing device according to another embodiment of this application.

[0019] Explanation of reference numerals in the accompanying drawings for specific embodiments:

[0020] 100. Satellite test equipment; 110. Test adapter unit; 111. Plug-in area; 1111. Electrical connector; 112. Test area; 1121. Test connection part; 120. Adapter cable; 1201. First end; 1202. Second end; 1203. Third end; 130. Satellite device under test; 1301. First satellite device under test; 1302. Second satellite device under test; 1303. Other devices under test; 140. Test device; 1401. First test device; 1402. Second test device; 150. Banana plug; 151. Connection assembly. Detailed Implementation

[0021] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the specific embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0022] Many specific details are set forth in the following description in order to provide a full understanding of this application. However, this application may also be implemented in other ways different from those described herein, and therefore this application is not limited to the specific embodiments disclosed below.

[0023] As indicated in this application and claims, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" are not specifically singular and may include plural forms. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements.

[0024] In the description of this application, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0025] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0026] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, these terms have no special meaning and therefore should not be construed as limiting the scope of protection of this application. In addition, although the terminology used in this application is selected from commonly known and used terms, some terms mentioned in this application's specification may have been chosen by the applicant according to his or her judgment, and their detailed meanings are explained in the relevant sections of this description. Moreover, this application should be understood not only through the actual terms used, but also through the meaning implied by each term.

[0027] The embodiments of this application are described below based on the accompanying drawings. However, the embodiments shown below are examples of satellite testing equipment used to embody the technical concept of this application, and the satellite testing equipment of this application is not specifically defined as follows. Furthermore, in order to facilitate understanding of the scope of the claims, the components corresponding to the components shown in the embodiments are assigned numbers to the components shown in the "Claims" and "Utility Model Content" columns. However, the components shown in the claims are not intended to be specific to the components of the embodiments. In particular, the dimensions, materials, shapes, and relative arrangements of the constituent components described in the embodiments are not intended to limit the scope of this application unless specifically stated, but are merely illustrative examples.

[0028] However, the dimensions or positional relationships of the components shown in the accompanying drawings are sometimes exaggerated for clarity. Therefore, in the following description, detailed descriptions of the same names and symbols representing the same or homogeneous components are appropriately omitted. Furthermore, the elements constituting this application may be multiple elements composed of the same components, thus allowing one component to function as multiple elements; conversely, multiple components may share the function of one component. Additionally, the content described in some embodiments and implementations can be applied to other embodiments and implementations. Furthermore, in this specification, "upper" is not limited to the case of being formed in contact with an upper surface, but also includes the case of being formed separately on top, and also includes the meaning of an intermediate layer between layers.

[0029] This application proposes a satellite testing device that can be applied to signal and data testing scenarios for satellite equipment.

[0030] Figure 1 This is a schematic diagram of the structure of a satellite testing device according to an embodiment of this application, with reference to... Figure 1 As shown, the satellite testing equipment 100 of this embodiment includes: a test adapter unit 110, including a connector area 111 and a test area 112, the test area 112 being provided with a plurality of test connection parts 1121; the connector area 111 being provided with a plurality of electrical connectors 1111, the plurality of electrical connectors 1111 including different electrical connector types, the plurality of electrical connectors 1111 sharing the plurality of test connection parts 1121; an adapter cable 120, through which the satellite device under test 130 is connected to the electrical connectors 1111; and a testing device 140, connected to the test connection parts 1121, the testing device 140 being used to output test data of the satellite device under test 130.

[0031] For example, refer to Figure 1 As shown, the electrical connectors 1111 in the mating area 111 are represented by rectangles, and the electrical connectors 1111 can be sockets corresponding to various types of plugs used on the satellite. The test connection parts 1121 in the test area 112 are represented by a circular array, and the test connection parts 1121 can be sockets. Any row, any column, or any combination of rows and columns in these circular arrays corresponds one-to-one with the corresponding nodes on the sockets. In the test adapter unit 110, multiple sockets can share multiple sockets. This application does not limit the type and shape of the electrical connectors 1111 and the test connection parts 1121.

[0032] Figure 2 This is a schematic diagram of the structure of a satellite testing device according to another embodiment of this application, with reference to... Figure 2 As shown, this application integrates multiple test connection parts 1121 and multiple electrical connectors 1111 onto a single adapter board. This arrangement is convenient for staff to use and also facilitates safety protection and standardized operation.

[0033] Figure 2 The diagram shows three types of devices under test (such as functional units of a satellite): a first satellite device under test 1301, a second satellite device under test 1302, and other devices under test 1303. The first satellite device under test 1301 and the second satellite device under test 1302 are connected to the test adapter unit 110 via an adapter cable 120 (such as a T-shaped cable). Figure 2 The diagram illustrates two testing devices 140: a first testing device 1401 (e.g., an oscilloscope) and a second testing device 1402 (e.g., a multimeter). The test adapter unit 110 can receive signals from the first satellite device under test 1301 and the second satellite device under test 1302. After testing the test points, the first testing device 1401 and the second testing device 1402 can output test data for the device under test. This application enables the simultaneous testing of multiple satellite devices under test 130 using multiple testing devices 140.

[0034] The technical solution of this application, by setting up a highly integrated test adapter unit 110, covers most satellite plug types, enabling multiple different types of electrical connectors 1111 (e.g., sockets) to share multiple test connection parts 1121 (e.g., jacks). Different models of satellite devices under test 130 can use this test adapter unit 110 universally, and test devices 140 and instruments can be quickly connected to this test adapter unit 110, improving test efficiency. Connecting the satellite device under test 130 and the electrical connectors 1111 via the adapter cable 120 does not affect normal communication between satellite modules during testing. This application is equivalent to a satellite test device 100 with multiple connectors sharing jacks. In the testing of a certain satellite model under development, the verification and use of the satellite test device 100 showed good results. Compared with previous testing methods, efficiency, ease of operation, and process safety have all been improved.

[0035] refer to Figure 2 As shown, in some embodiments, the test connection 1121 is a test socket or a test pin. Exemplarily, in practical applications, the test area 112 can be configured as a pin-to-hole connection, for example, the test connection 1121 can be configured as a socket, and other components connected to the test connection 1121 can be configured as pins, with the pins inserted into the socket to achieve a connection. Alternatively, the test area 112 can be configured as a pin-to-hole connection, for example, the test connection 1121 can be configured as a pin, and other components connected to the test connection 1121 can be configured as sockets, with the sockets aligned with the pins and inserted to achieve a connection. This application does not limit the type of the test connection 1121.

[0036] Continue to refer Figure 2As shown, in some embodiments, the satellite testing equipment 100 further includes a plurality of banana plugs 150, each banana plug 150 having an identification part (not shown); there are a plurality of testing devices 140, and the testing devices 140 are connected one-to-one with the banana plugs 150; the testing connection part 1121 is a testing socket, and the plurality of banana plugs 150 can be stacked and connected to form a connection whole 151, which is connected to one of the testing sockets.

[0037] For example, Figure 2 In this design, the first testing device 1401 is connected to one of the banana plugs 150, and the second testing device 1402 is connected to another banana plug 150. Stacking the banana plugs 150 allows simultaneous connection to both types of testing devices 140 at the same point. Multiple banana plugs 150 can be stacked into a single socket, facilitating simultaneous connection to multiple testing devices 140 via a single signal. By providing markings (e.g., serial numbers) on the banana plugs 150, operators can quickly identify them, ensuring strong error prevention, ample operating space, and reduced chance of mistakes, thus improving the accuracy of the insertion and removal process.

[0038] In some embodiments, the electrical connectors 1111 are provided with metal housings (not shown), and the metal housings of each electrical connector 1111 are connected together; the test socket is connected to the satellite housing (not shown). Exemplarily, the satellite housing is equivalent to the outer shell of a satellite. This application achieves grounding of the device by connecting the metal housings of all electrical connectors 1111 together and connecting the test socket to the satellite housing. The grounding path provides a discharge channel for static charge, preventing the accumulation of static electricity and thus avoiding the accumulation of static electricity inside the device and causing damage.

[0039] In some embodiments, the test connection 1121 is provided with a housing (not shown), the housing being made of an insulating material. In some embodiments, each test connection 1121 has a preset spacing, and multiple test connections 1121 are arranged side by side. Exemplarily, this arrangement can improve the security and ease of use of the test area 112.

[0040] refer to Figure 2 As shown, in some embodiments, the satellite device under test 130 includes a first satellite device under test 1301 and a second satellite device under test 1302; the adapter cable 120 is a T-connector cable, which includes a first end 1201, a second end 1202, and a third end 1203. The first end 1201 is connected to the first satellite device under test 1301, the second end 1202 is connected to the second satellite device under test 1302, and the third end 1203 is connected to the electrical connector 1111. Exemplarily, this configuration allows the first satellite device under test 1301 and the second satellite device under test 1302 to be simultaneously connected to the test adapter unit 110 without affecting normal communication between satellite modules during testing.

[0041] In some embodiments, the signal connection line (not shown) between the connector area 111 and the test area 112 is fabricated using a printed circuit board (PCB) wiring method. For example, the signal connection line can be made as thick as possible. The test adapter unit 110 is typically used to connect control signals from a test satellite, which involves relatively low current. The PCB wiring method offers flexibility and convenience, ensuring reliable performance, lower production costs, and facilitating widespread application.

[0042] In some embodiments, the satellite test equipment 100 further includes a housing (not shown) having a hollow cavity (not shown) for accommodating the test adapter unit 110, and the housing is made of an insulating material. Exemplarily, this arrangement avoids the risk of short circuits.

[0043] In some embodiments, the housing is provided with an opening cover (not shown), the position of which corresponds to the insertion area 111 and the test area 112, and the opening cover can be opened and locked. Exemplarily, this arrangement can effectively prevent dust from entering the test adapter unit 110 and improve its safety.

[0044] While the foregoing disclosure has discussed various examples of utility model embodiments that are currently considered useful, it should be understood that such details are for illustrative purposes only, and the appended claims are not limited to the disclosed embodiments. Rather, the claims are intended to cover all modifications and equivalent combinations that conform to the spirit and scope of the embodiments of this application. For example, although the system components described above can be implemented by hardware devices, they can also be implemented solely by software solutions, such as installing the described system on existing servers or mobile devices.

[0045] Similarly, it should be noted that, in order to simplify the description of the present application and thus aid in the understanding of one or more embodiments of the utility model, the foregoing description of the embodiments of the present application sometimes combines multiple features into a single embodiment, drawing, or description thereof. However, this disclosure method does not imply that the subject matter of the present application requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of the single embodiments disclosed above.

[0046] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of embodiments are modified in some examples with the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of scope in some embodiments of this application are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

[0047] Although this application has been described with reference to specific embodiments, those skilled in the art should recognize that the above embodiments are only used to illustrate this application, and various equivalent changes or substitutions can be made without departing from the spirit of this application. Therefore, any changes or modifications to the above embodiments within the essential spirit of this application will fall within the scope of the claims of this application.

Claims

1. A satellite testing device, characterized in that, include: The test adapter unit includes a plug-in area and a test area. The test area is provided with multiple test connection parts. The plug-in area is provided with multiple electrical connectors, which include different types of electrical connectors and share the multiple test connection parts. The adapter cable connects the satellite device under test to the electrical connector. A testing device is connected to a testing connection part, and the testing device is used to output test data of the satellite device under test.

2. The satellite testing equipment as described in claim 1, characterized in that, The test connection part is a test socket or a test pin.

3. The satellite testing equipment as described in claim 1, characterized in that, It also includes multiple banana plugs, each with an identification part; there are multiple testing devices, and each testing device is connected to a banana plug in a one-to-one correspondence; the testing connection part is a testing socket, and the multiple banana plugs can be stacked and connected to form a connection unit, which is connected to one of the testing sockets.

4. The satellite testing equipment as described in claim 3, characterized in that, The electrical connectors are equipped with metal housings, and the metal housings of each electrical connector are connected; the test socket is connected to the satellite housing.

5. The satellite testing equipment as described in claim 1, characterized in that, The test connection is provided with a housing, which is made of insulating material.

6. The satellite testing equipment as described in claim 1, characterized in that, Each test connection has a preset spacing, and the multiple test connections are arranged side by side.

7. The satellite testing equipment as described in claim 1, characterized in that, The satellite device under test includes a first satellite device under test and a second satellite device under test; the adapter cable is a three-way cable, which includes a first end, a second end, and a third end. The first end is connected to the first satellite device under test, the second end is connected to the second satellite device under test, and the third end is connected to the electrical connector.

8. The satellite testing equipment as described in claim 1, characterized in that, The signal connection line between the plug-in area and the test area is made using a printed circuit board wiring method.

9. The satellite testing equipment as described in claim 1, characterized in that, It also includes a housing having a hollow cavity for accommodating the test adapter unit, the housing being made of an insulating material.

10. The satellite testing equipment as described in claim 9, characterized in that, The housing is provided with an opening cover, the position of which corresponds to the insertion area and the test area, and the opening cover can be opened and locked.

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