Testing structure for testing throughput of upgrading WIFI in EMC darkroom

By installing a turntable, testing mechanism, and antenna mechanism in the EMC anechoic chamber, and utilizing the rotation of the rotating rod and the arrangement of the antenna, combined with the use of absorbing foam, the problem of high cost of building new OTA testing anechoic chambers has been solved. This has enabled the upgrade of the EMC anechoic chamber to an OTA anechoic chamber, reducing financial and time costs and improving testing efficiency.

CN223694012UActive Publication Date: 2025-12-19盐城市质量技术监督综合检验检测中心
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Patent Information

Application Number
CN202520031189.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-01-07
Publication Date
2025-12-19
Estimated Expiration
2035-01-07

AI Technical Summary

Technical Problem

Building a new darkroom specifically for OTA testing requires a significant investment of funds and time, making it uneconomical.

Method used

By installing a turntable, testing mechanism, and antenna mechanism in the EMC anechoic chamber, and utilizing the rotation of the turntable and the arrangement of the antenna, combined with the use of absorbing foam, the EMC anechoic chamber can be upgraded to an OTA anechoic chamber, reducing the financial and time requirements for building a new anechoic chamber.

Benefits of technology

The EMC anechoic chamber was upgraded to an OTA anechoic chamber, reducing the financial and time costs of building a new anechoic chamber and improving testing efficiency and usability.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to an EMC darkroom upgrade WIFI throughput test structure, which comprises a test environment, a rotary table, a test mechanism and an antenna mechanism, and is characterized in that the rotary table is installed in the test environment and is used for driving a product to rotate in a horizontal direction, the antenna mechanism comprises a support assembly and a test antenna, the support assembly is arranged in the test environment, and the test antenna is arranged in the test environment; the test antenna is installed on the support assembly. The testing mechanism comprises a testing assembly, the testing assembly comprises a fixed seat, a connecting seat, a testing rod, a rotating rod and a testing seat, a testing groove is formed in the rotary table, the fixed seat is installed in the testing groove, the connecting seat is detachably connected to the fixed seat, the testing rod is fixedly connected to the connecting seat, the rotating rod is rotationally connected to the testing rod, and the axis of the rotating rod is perpendicular to the axis of the rotary table; the testing seat is fixedly connected to the rotating rod, and the product is fixed to the testing seat when being subjected to OTA testing. The method has the effect of reducing the OTA test cost of the product.
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Description

TECHNICAL FIELD

[0001] The present application relates to the field of test structure, in particular to a test structure for upgrading WIFI throughput test of EMC darkroom. BACKGROUND

[0002] With the development of wireless technology and its unique technical advantages, more and more products integrate wireless functions. How to evaluate the performance of wireless products needs to perform OTA test. OTA (Over the Air) test is an active test, and the terminal performs the test of the emission power and the receiving sensitivity in each direction in the three-dimensional space in the microwave darkroom, which can more directly reflect the radiation performance of the terminal.

[0003] At present, when the product needs to perform OTA test, a new OTA darkroom is generally built to complete the OTA test of the product.

[0004] According to the related technology in the above, the darkroom specially used for performing OTA test needs to invest a large amount of funds and time cost, and the economy is poor. SUMMARY

[0005] In order to reduce the cost of the product performing OTA test, the present application provides a test structure for upgrading WIFI throughput test of EMC darkroom.

[0006] The test structure for upgrading WIFI throughput test of EMC darkroom provided by the present application adopts the following technical scheme:

[0007] A test structure for upgrading WIFI throughput test of EMC darkroom, comprising a test environment, a turntable, a test mechanism and an antenna mechanism, the turntable is installed in the test environment and is used to drive the product to rotate in the horizontal direction, the antenna mechanism comprises a support assembly and a test antenna, the support assembly is arranged in the test environment, and the test antenna is installed on the support assembly;

[0008] The test mechanism comprises a test assembly, the test assembly comprises a fixing seat, a connecting seat, a test rod, a rotating rod and a test seat, the turntable is provided with a test slot, the fixing seat is installed in the test slot, the connecting seat is detachably connected to the fixing seat, the test rod is fixedly connected to the connecting seat, the rotating rod is rotatably connected to the test rod, the axis of the rotating rod is perpendicular to the axis of the turntable, and the test seat is fixedly connected to the rotating rod; when the product performs OTA test, the product is fixed to the test seat;

[0009] When the product needs to perform EMC darkroom test, the connecting seat is disconnected from the fixing seat, and when the product needs to perform OTA darkroom test, the connecting seat is connected to the fixing seat.

[0010] By adopting the technical scheme, when the product needs to be tested, the product is fixed to the test seat and the center of the product is coincided with the center of the rotary table, then the rotary table is horizontally rotated by 360 degrees, each rotation of an angle is to measure a plane vertical horizontal two polarization data, then the rotary rod is rotated according to the standard step requirement to test another plane data, until the whole spherical surface is measured, thereby the test of the product is completed, when the EMC darkroom needs to be upgraded to the OTA darkroom, the connecting seat is fixedly connected with the fixed seat, thereby the connecting seat is fixed with the rotary table, then the antenna mechanism is installed in the test environment, and the wave-absorbing sponge is installed on the ground of the test environment, thereby the EMC darkroom is upgraded to the OTA darkroom, and the problem that a large amount of capital and time cost needs to be invested for the newly-built darkroom specially used for the OTA test and the economic efficiency is poor is improved.

[0011] Optionally, the test mechanism further comprises a connecting assembly and a driving assembly, the connecting assembly comprises a main connecting gear and a slave connecting gear, the main connecting gear is rotationally arranged on the fixed seat, the slave connecting gear is rotationally arranged on the connecting seat, the main connecting gear and the slave connecting gear are engaged, the slave connecting gear rotates, the rotary rod rotates, the driving assembly is arranged on the fixed seat, and the driving assembly drives the rotation of the main connecting gear.

[0012] By adopting the technical scheme, when the connecting seat is disconnected from the fixed seat, the slave connecting gear is disconnected from the engagement with the main connecting gear, when the connecting seat is connected with the fixed seat, the slave connecting gear is engaged with the main connecting gear, thereby the transmission between the fixed seat and the connecting seat is more simple and convenient, and is beneficial to dismounting and mounting, the driving assembly is arranged on the fixed seat, the weight of the test rod is more light, dismounting and mounting are facilitated, and the usability is better.

[0013] Optionally, the main connecting gear is coaxially fixedly connected with a rotating flywheel, the rotating flywheel is provided with a detection groove penetratingly arranged, the fixed seat is provided with a rotating detector, the rotating flywheel is arranged in a detection opening of the rotating detector, and the rotating flywheel rotates one circle when the detection groove and the detection opening are in communication.

[0014] Optionally, the top of the fixed seat is fixedly connected with a plurality of positioning rods, the connecting seat is provided with a plurality of positioning holes penetratingly arranged, and the positioning rods are respectively arranged in the positioning holes when the connecting seat is connected with the fixed seat.

[0015] Optionally, the test rod is rotationally connected with a rotating shaft, the rotating shaft is provided with a rotating hole, the rotating rod is arranged in the rotating hole, a plurality of adjusting bolts are threadedly connected to the outer circumferential surface of the rotating shaft, and the adjusting bolts are located on and abut against the outer circumferential surface of the rotating rod.

[0016] By adopting the technical scheme, when the product is fixed to the test seat and the product center and the rotary table center are not coincident, the adjusting bolts are loosened, so that the adjusting bolts are all disengaged from the abutting and fixing of the rotating rod, so that the rotating rod and the rotating shaft relatively slide, the rotating rod slides towards or away from the rotating shaft, so that the vertical distance between the test seat and the test rod changes, so that the product center position changes, so that the product center and the rotary table center are coincident again, so that the test effect of the product is better, and the usability is better.

[0017] Optionally, the test seat is fixedly provided with a sponge pad.

[0018] Optionally, the rotary table is fixedly provided with a sliding track, the fixed seat is fixedly connected with a sliding block at the bottom, the sliding block is provided with a sliding groove penetratingly arranged, and the sliding track is arranged in the sliding groove when the fixed seat is slidingly matched with the rotary table.

[0019] The rotary table is provided with a fixed sliding block, the fixed sliding block is provided with a fixed sliding groove penetratingly arranged, the fixed sliding groove is slidingly matched with a fixed rod, and the fixed rod is threadedly connected with the fixed seat and abuttingly fixed with the fixed sliding block when the fixed seat is relatively fixed with the rotary table.

[0020] Optionally, the support assembly comprises one or more antenna rods, one or more antenna sliding blocks and an arc-shaped rod, the antenna rod is installed in the test environment, the antenna sliding block is slidingly matched with the antenna rod, the antenna sliding block is threadedly connected with a fixed bolt, the antenna sliding block is relatively fixed with the antenna rod when the fixed bolt is tightened, the antenna sliding block relatively slides with the antenna rod when the fixed bolt is loosened, the arc-shaped rod is fixedly connected with the antenna sliding block, the arc-shaped rod is horizontally arranged and concentrically arranged with the rotary table, the test antenna is fixedly installed on the arc-shaped rod and is located at the same height as the test seat.

[0021] Optionally, the test antenna comprises a plurality of test antennas, each test antenna is fixedly installed on the arc-shaped rod, the distance between each two adjacent test antennas is the same, and each test antenna is radially arranged towards the rotary table.

[0022] In summary, the present application has at least one of the following beneficial technical effects:

[0023] 1. When the product needs to be tested, the product is fixed to the test seat and the center of the product is coincided with the center of the turntable, then the turntable is horizontally rotated 360 degrees, each rotation angle measures a plane vertical horizontal two polarization data, then the rotating rod is rotated according to the standard step requirement to measure another plane data, until the whole spherical surface is measured, thereby completing the test of the product, when the EMC darkroom needs to be upgraded to the OTA darkroom, the connecting seat is fixedly connected with the fixed seat, thereby making the connecting seat fixed with the turntable, then the antenna mechanism is installed in the test environment, and the wave-absorbing sponge is installed on the ground of the test environment, thereby making the EMC darkroom upgraded to the OTA darkroom, and the problem of large capital and time cost and poor economy of newly built darkroom specially used for OTA test is improved.

[0024] 2. When the connecting seat is disconnected from the fixed seat, the connecting gear is disconnected from the main connecting gear, when the connecting seat is connected with the fixed seat, the connecting gear is connected with the main connecting gear, thereby making the transmission between the fixed seat and the connecting seat more simple and convenient, and facilitating disassembly and installation, and the driving assembly is installed on the fixed seat, thereby making the test rod more light in weight, facilitating disassembly and installation, and making the usability better. BRIEF DESCRIPTION OF DRAWINGS

[0025] Figure 1 is the overall structure schematic diagram of the embodiment of the application;

[0026] Figure 2 is the full-wave darkroom schematic diagram of the embodiment of the application;

[0027] Figure 3 is the half-wave darkroom schematic diagram of the embodiment of the application;

[0028] Figure 4 is the overall structure schematic diagram of the test mechanism of the embodiment of the application;

[0029] Figure 5 is the fixed seat structure schematic diagram of the embodiment of the application;

[0030] Figure 6 is the connection schematic diagram of the fixed seat and the connecting seat of the embodiment of the application;

[0031] Figure 7 is the test assembly structure schematic diagram of the embodiment of the application;

[0032] Figure 8 is the driving assembly structure schematic diagram of the embodiment of the application;

[0033] Figure 9 is the connection assembly structure schematic diagram of the embodiment of the application;

[0034] Figure 10 is the rotating flywheel structure schematic diagram of the embodiment of the application;

[0035] Figure 11 is a schematic view of a transmission assembly structure according to an embodiment of the present application;

[0036] Figure 12 is a schematic view of an antenna mechanism structure according to an embodiment of the present application.

[0037] Legend: 1, test environment; 2, turntable; 21, test slot; 22, sliding rail; 23, fixed sliding block; 231, fixed sliding groove; 232, fixed rod; 3, test mechanism; 31, test assembly; 311, fixed seat; 3111, sliding block; 3112, positioning rod; 312, connecting seat; 3121, positioning hole; 313, test rod; 3131, rotating shaft; 31311, rotating hole; 31312, adjusting bolt; 314, rotating rod; 315, test seat; 3151, sponge pad; 32, drive assembly; 321, drive motor; 322, main drive wheel; 323, driven wheel; 324, drive belt; 33, connecting assembly; 331, main connecting gear; 3311, rotating flywheel; 33111, detection slot; 3312, rotating detector; 332, driven connecting gear; 34, transmission assembly; 341, main transmission wheel; 342, driven transmission wheel; 343, transmission belt; 4, antenna mechanism; 41, support assembly; 411, antenna rod; 4111, rod body part; 4112, seat body part; 412, antenna sliding block; 413, arc-shaped rod; 42, test antenna. DETAILED DESCRIPTION

[0038] The following will be described in detail with reference to the accompanying drawings. Figures 1-12 The present application will be described in further detail.

[0039] The present application discloses a test structure for upgrading WIFI throughput testing of an EMC darkroom. Referring to Figure 1 and Figure 2 A test structure for upgrading WIFI throughput testing of an EMC darkroom includes a test environment 1, a turntable 2, a test mechanism 3, and an antenna mechanism 4. The turntable 2 is installed on the test environment 1 and is used to drive the product to rotate in the horizontal direction. The test mechanism 3 is installed on the turntable 2. The antenna mechanism 4 is installed on the test environment 1.

[0040] Referring to Figure 2 and Figure 3 The test environment 1 of the EMC darkroom is a semi-electric wave darkroom. When the test environment 1 of the EMC darkroom needs to be upgraded to the test environment 1 of the OTA darkroom, wave-absorbing bubble cotton is installed on the floor of the darkroom, so that the test environment 1 is changed from a semi-electric wave darkroom to a full-electric wave darkroom. After the OTA test is completed, the wave-absorbing bubble cotton on the ground is removed, so that the test environment 1 reverts to a semi-electric wave darkroom.

[0041] Referring to Figure 4 andFigure 5 The testing mechanism 3 comprises a testing assembly 31, the testing assembly 31 comprises a fixing seat 311, the top of the rotary table 2 is provided with a testing groove 21, the bottom of the testing groove 21 is fixedly provided with two sliding rails 22, the bottom of the fixing seat 311 is fixedly connected with two sliding blocks 3111, the two sliding blocks 3111 are both provided with sliding grooves penetrating through, and the two sliding rails 22 are respectively penetratingly arranged and slidingly matched with the two sliding grooves, so that the two sliding blocks 3111 are respectively slidingly matched with the two sliding rails 22, so that the fixing seat 311 is slidingly matched with the rotary table 2, and the distance between the fixing seat 311 and the center of the rotary table 2 is adjusted more simply and conveniently.

[0042] With reference to Figure 4 and Figure 5 The rotary table 2 is provided with a fixed sliding block 23, the fixed sliding block 23 is provided with a fixed sliding groove 231 penetrating through, the fixed sliding groove 231 is slidingly matched with a fixed rod 232, when the fixing seat 311 is fixed relative to the rotary table 2, the fixed rod 232 is threadedly connected with the fixing seat 311 and abuts against the fixed sliding block 23.

[0043] With reference to Figure 5 and Figure 6 The testing assembly 31 further comprises a connecting seat 312, the top of the fixing seat 311 is fixedly provided with two positioning rods 3112, the connecting seat 312 is provided with two positioning holes 3121 penetrating through, the two positioning holes 3121 are respectively arranged opposite to the two positioning rods 3112, when the connecting seat 312 is connected to the fixing seat 311, the two positioning rods 3112 are respectively penetratingly arranged in the two positioning holes 3121, so that the connection between the connecting seat 312 and the fixing seat 311 is more accurate and fast, the connecting seat 312 and the fixing seat 311 are fixedly connected through bolts, so that the connection between the connecting seat 312 and the fixing seat 311 has the ability of quick disassembly.

[0044] With reference to Figure 4 and Figure 7, the test assembly 31 further comprises a test rod 313, a rotating rod 314 and a test seat 315, the test rod 313 is fixedly connected to the top of the connecting seat 312, the test rod 313 is rectangular, a rotating shaft 3131 is rotatably connected to the top of the test rod 313, the axis of the rotating shaft 3131 is perpendicular to the length direction of the test rod 313, a rotating hole 31311 is formed in the end of the rotating shaft 3131 away from the test rod 313, the rotating rod 314 penetrates the rotating hole 31311, three adjusting bolts 31312 are threadedly connected to the outer circumferential surface of the rotating shaft 3131, the adjusting bolts 31312 are evenly distributed in the circumferential direction of the axis of the rotating shaft 3131, and the adjusting bolts 31312 are located on the outer circumferential surface of the rotating rod 314 and abut against and are fixed with the outer circumferential surface of the rotating rod 314, so that the rotating rod 314 is rotatably connected to the test rod 313 and the axis of the rotating rod 314 is perpendicular to the axis of the turntable 2, and the test seat 315 is fixedly connected to the rotating rod 314. When the product is tested by OTA, it is fixed to the test seat 315, and the test seat 315 is fixedly provided with a sponge pad 3151.

[0045] When the product is fixed to the test seat 315 and the center of the product does not coincide with the center of the turntable 2, the adjusting bolts 31312 are loosened, so that the adjusting bolts 31312 are disengaged from the abutting and fixed state with the rotating rod 314, so that the rotating rod 314 relatively slides with the rotating shaft 3131, and the rotating rod 314 slides towards or away from the rotating shaft 3131, so that the vertical distance between the test seat 315 and the test rod 313 changes, so that the center of the product changes, so that the center of the product coincides with the center of the turntable 2 again, so that the test effect of the product is better, and the sliding cooperation of the fixed seat 311 and the turntable 2 further enlarges the adjustment capacity, so that the center of the product is more easily coincided with the center of the turntable 2, so that the product of different sizes and lengths is conveniently and better tested.

[0046] Referring to Figure 8 The test mechanism 3 further comprises a driving assembly 32, the driving assembly 32 comprises a driving motor 321, a main driving wheel 322, a driven wheel 323 and a driving belt 324, the driving motor 321 is fixedly arranged on the fixed seat 311, the main driving wheel 322 is coaxially fixedly arranged on the output shaft of the driving motor 321, the driven wheel 323 is rotatably arranged on the fixed seat 311, and the driving belt 324 is arranged around the main driving wheel 322 and the driven wheel 323. The driving motor 321 drives the main driving wheel 322 to rotate, and drives the driven wheel 323 to rotate.

[0047] Referring to Figure 9The testing mechanism 3 further comprises a connecting assembly 33, the connecting assembly 33 comprises a main connecting gear 331 and a slave connecting gear 332, the main connecting gear 331 is rotationally arranged on the fixing base 311 and coaxially fixed with the slave driving wheel 323, the slave connecting gear 332 is rotationally arranged on the connecting base 312, the main connecting gear 331 and the slave connecting gear 332 are engaged, the number of teeth of the main connecting gear 331 is same as the number of teeth of the slave connecting gear 332, the slave driving wheel 323 rotates, the main connecting gear 331 rotates, thereby driving the slave connecting gear 332 to rotate.

[0048] When the connecting base 312 is disconnected from the fixing base 311, the slave connecting gear 332 is disconnected from the engagement of the main connecting gear 331, when the connecting base 312 is connected with the fixing base 311, the slave connecting gear 332 is engaged with the main connecting gear 331, thereby making the transmission between the fixing base 311 and the connecting base 312 more simple and convenient, and facilitating disassembly and installation, and the driving assembly 32 is installed on the fixing base 311, making the testing rod 313 more light in weight, facilitating disassembly and installation.

[0049] With reference to Figure 10 The main connecting gear 331 is coaxially fixedly connected with a rotating flywheel 3311, the rotating flywheel 3311 is provided with a detection groove 33111 penetratingly arranged, the fixing base 311 is installed with a rotating detector 3312, the rotating flywheel 3311 is penetratedly arranged on the detection port of the rotating detector 3312, when the detection groove 33111 is communicated with the detection port, the rotating flywheel 3311 rotates one circle, thereby facilitating the detection of the rotation of the main connecting gear 331, and knowing the rotation of the slave connecting gear 332.

[0050] With reference to Figure 11 The testing mechanism 3 further comprises a transmission assembly 34, the transmission assembly 34 comprises a main transmission wheel 341, a slave transmission wheel 342 and a transmission belt 343, the main transmission wheel 341 is rotationally arranged on the connecting base 312 and coaxially fixed with the slave connecting gear 332, the slave transmission wheel 342 is rotationally arranged on the testing rod 313 and coaxially fixed with the rotating shaft 3131, the transmission belt 343 is wound between the main transmission wheel 341 and the slave transmission wheel 342, thereby making the slave connecting gear 332 rotate, the main transmission wheel 341 rotates, thereby driving the slave transmission wheel 342 to rotate, thereby driving the rotating shaft 3131 to rotate, thereby driving the rotating rod 314 to rotate, at the same time, the diameter size of the main transmission wheel 341 is same as the diameter size of the slave transmission wheel 342, thereby making the rotating rod 314 rotate one circle at the same time when the main connecting gear 331 rotates one circle, thereby facilitating the detection of the rotation of the rotating rod 314.

[0051] With reference to Figure 1 and Figure 12, the antenna mechanism 4 comprises a support assembly 41, the support assembly 41 comprises three antenna rods 411, three antenna sliders 412 and an arc-shaped rod 413, each antenna rod 411 is installed in the test environment 1, each antenna rod 411 comprises a rod body part 4111 and a seat body part 4112, the rod body part 4111 and the seat body part 4112 are fixedly connected, so that each antenna rod 411 is placed in a set position of the test environment 1, that is, the installation of each antenna rod 411 is completed, each antenna slider 412 is slidingly matched with each antenna rod 411, the antenna slider 412 is threadedly connected with a fixing bolt (not shown in the figure), when the fixing bolt is tightened, the antenna slider 412 is relatively fixed with the antenna rod 411, when the fixing bolt is loosened, the antenna slider 412 relatively slides with the antenna rod 411, the arc-shaped rod 413 is fixedly connected with each antenna slider 412, the arc-shaped rod 413 is horizontally arranged and concentrically arranged with the turntable 2.

[0052] With reference to Figure 1 and Figure 12 , the antenna mechanism 4 further comprises seven test antennas 42, each test antenna 42 is fixedly installed on the arc-shaped rod 413, the distance between each adjacent two test antennas 42 is the same, the direction of each test antenna 42 is arranged along the radial direction of the turntable 2, each test antenna 42 is located at the same height as the test seat 315, the test antenna 42 array adopts a step of 15°, seven test antennas 42, to form a 90° test angle test antenna 42 array, so that the test efficiency in actual test is improved by 40% compared with one test antenna 42, each test antenna 42 is controlled through a switch switching unit, so that when each test antenna 42 is used to perform test in different directions in the OTA test, the switch switching unit is used to select one of the test antennas 42 to perform test.

[0053] The implementation principle of the test structure for upgrading the WIFI throughput test of the EMC darkroom in the embodiment of the application is as follows: when a product needs to be tested, the product is fixed on the test seat 315 and the center of the product is coincided with the center of the turntable 2, then the turntable 2 is horizontally rotated by 360 degrees, each rotation of an angle completes the measurement of one plane vertical and horizontal polarization data, then the rotating rod 314 is rotated according to the standard step requirement to complete the measurement of another plane data, until the measurement of the entire spherical surface is completed, so that the test of the product is completed, when the EMC darkroom needs to be upgraded to the OTA darkroom, the connecting seat 312 is fixedly connected with the fixing seat 311, so that the connecting seat 312 is fixed with the turntable 2, then the antenna mechanism 4 is installed in the test environment 1, and the wave-absorbing sponge is installed on the ground of the test environment 1, so that the EMC darkroom is upgraded to the OTA darkroom, which improves the problem that a large amount of capital and time cost needs to be invested for building a darkroom specially used for OTA test, and the economic efficiency is poor.

[0054] The above are all preferred embodiments of the present application, and do not limit the protection scope of the present application, so that: all equivalent changes made according to the structure, shape, principle of the present application should be covered in the protection scope of the present application.

Claims

1. A test structure for EMC darkroom upgrade of WIFI throughput test, characterized in that: It includes test environment (1), rotary table (2), test mechanism (3) and antenna mechanism (4), the rotary table (2) is installed on test environment (1) and is used to drive product to rotate in horizontal direction, the antenna mechanism (4) includes support assembly (41) and test antenna (42), the support assembly (41) is arranged in test environment (1), and the test antenna (42) is installed on the support assembly (41); The test mechanism (3) includes test assembly (31), the test assembly (31) includes fixing seat (311), connecting seat (312), test rod (313), rotating rod (314) and test seat (315), the rotary table (2) is provided with test slot (21), the fixing seat (311) is installed on the test slot (21), the connecting seat (312) is detachably connected to the fixing seat (311), the test rod (313) is fixedly connected to the connecting seat (312), the rotating rod (314) is rotatably connected to the test rod (313), the axis of the rotating rod (314) is perpendicular to the axis of the rotary table (2), and the test seat (315) is fixedly connected to the rotating rod (314), and the product is fixed to the test seat (315) when the product is tested by OTA. When the product needs to be tested by EMC darkroom, the connecting seat (312) is disconnected from the fixing seat (311), and when the product needs to be tested by OTA darkroom, the connecting seat (312) is connected to the fixing seat (311).

2. The test structure for EMC darkroom upgrading WIFI throughput test according to claim 1, characterized in that: The test mechanism (3) further includes connecting assembly (33) and driving assembly (32), the connecting assembly (33) includes main connecting gear (331) and slave connecting gear (332), the main connecting gear (331) is rotatably arranged on the fixing seat (311), the slave connecting gear (332) is rotatably arranged on the connecting seat (312), the main connecting gear (331) and the slave connecting gear (332) are engaged, the slave connecting gear (332) is rotated, the rotating rod (314) is rotated, the driving assembly (32) is arranged on the fixing seat (311), and the driving assembly (32) drives the main connecting gear (331) to rotate.

3. The test structure for EMC darkroom upgrading WIFI throughput test according to claim 2, characterized in that: The main connecting gear (331) is coaxially fixedly connected with rotating flywheel (3311), the rotating flywheel (3311) is provided with detection slot (33111) penetrating through, the fixing seat (311) is provided with rotating detector (3312), the rotating flywheel (3311) penetrates the detection port of the rotating detector (3312), and when the detection slot (33111) is communicated with the detection port, the rotating flywheel (3311) rotates one round.

4. The test structure for EMC darkroom upgrading WIFI throughput test according to claim 1, characterized in that: The fixing seat (311) is fixedly connected with a plurality of positioning rods (3112) at the top, and the connecting seat (312) is provided with a plurality of positioning holes (3121) penetrating through, when the connecting seat (312) is connected with the fixing seat (311), each positioning rod (3112) penetrates each positioning hole (3121).

5. The test structure for EMC darkroom upgrading WIFI throughput test according to claim 1, characterized in that: The test rod (313) is rotationally connected with a rotating shaft (3131), the rotating shaft (3131) is provided with a rotating hole (31311), the rotating rod (314) is arranged in the rotating hole (31311), and the rotating shaft (3131) is externally and threadedly connected with a plurality of adjusting bolts (31312), each adjusting bolt (31312) is located on the outer periphery of the rotating rod (314) and is fixedly abutted against the outer periphery of the rotating rod (314).

6. The test structure for EMC darkroom upgrading WIFI throughput test according to claim 1, characterized in that: The test seat (315) is fixedly provided with a sponge pad (3151).

7. The test structure for upgrading the WIFI throughput test of an EMC darkroom according to claim 1, characterized in that: The rotating table (2) is fixedly provided with a sliding rail (22), the bottom of the fixing seat (311) is fixedly connected with a sliding block (3111), the sliding block (3111) is provided with a sliding groove penetratingly arranged, and when the fixing seat (311) is slidingly matched with the rotating table (2), the sliding rail (22) is arranged in the sliding groove, and the sliding block (3111) is slidingly matched with the sliding rail (22). The rotating table (2) is provided with a fixed sliding block (23), the fixed sliding block (23) is provided with a fixed sliding groove (231) penetratingly arranged, the fixed sliding groove (231) is slidingly matched with a fixed rod (232), and when the fixing seat (311) is fixedly arranged relative to the rotating table (2), the fixed rod (232) is threadedly connected with the fixing seat (311) and is fixedly abutted against the fixed sliding block (23).

8. The test structure for upgrading the WIFI throughput test of an EMC darkroom according to claim 1, characterized in that: The support assembly (41) comprises one or more antenna rods (411), one or more antenna sliding blocks (412) and an arc-shaped rod (413), the antenna rod (411) is arranged in the test environment (1), the antenna sliding block (412) is slidingly matched with the antenna rod (411), the antenna sliding block (412) is threadedly connected with a fixing bolt, when the fixing bolt is tightened, the antenna sliding block (412) is fixed relative to the antenna rod (411), when the fixing bolt is loosened, the antenna sliding block (412) is relatively slid relative to the antenna rod (411), the arc-shaped rod (413) is fixedly connected with the antenna sliding block (412), the arc-shaped rod (413) is horizontally arranged and concentrically arranged with the rotating table (2), the test antenna (42) is fixedly arranged on the arc-shaped rod (413) and is located at the same height as the test seat (315).

9. The EMC darkroom upgraded WIFI throughput test structure of claim 8, wherein: The test antenna (42) comprises a plurality of test antennas (42), each test antenna (42) is fixedly arranged on the arc-shaped rod (413), the distance between each two adjacent test antennas (42) is the same, and each test antenna (42) is radially arranged along the rotating table (2).