Adjustable probe structure

Abstract

The utility model discloses an adjustable probe structure, which comprises a probe assembly and a sleeve, the probe assembly comprises a primary probe and a secondary probe, one end of the secondary probe is connected with the primary probe, the other end of the secondary probe is connected with one end of the sleeve, the other end of the sleeve is provided with a through hole A, and the sleeve is provided with an adjusting assembly. The sleeve can be directly connected with a voltmeter probe and a universal meter probe, and the requirement for tool replacement is reduced. The probe assembly can be quickly adjusted to extend out or be stored, so that the detection of a pin-shaped structure or a jack-shaped structure can be met, and the debugging and measuring efficiency is improved. And the sleeve is insulated, so that the use safety is ensured, and accidental short circuit or electric shock accidents are prevented.

Description

Technical Field

[0001] This utility model belongs to the field of electronic testing equipment technology, and in particular relates to an adjustable probe structure. Background Technology

[0002] Commonly used voltmeter and multimeter probes are primarily designed for single-sized pins or sockets. However, when testing pins and sockets of different connectors, the varying sizes and dense arrangement of pins and sockets often render existing probes incompatible. This necessitates frequent changes of testing tools or accessories, increasing the complexity and risk of errors during testing. Furthermore, traditional probes, with their thinner pins, struggle to maintain stable contact with pin-like structures, potentially causing short circuits during live testing, leading to inaccurate measurements and even device damage. Therefore, a mechanism is needed to connect voltmeter and multimeter probes for testing pin-like or socket-like structures.

[0003] Patent document CN209400585U discloses a high-voltage probe for an oscilloscope. It features a first and a second compression block, with a return spring between them. When the high-voltage probe is not in use, the return spring returns to its retracted state. Under the action of the first compression block, a push rod moves, causing the push rod to retract the probe inside the housing, thus protecting the probe from deformation or damage due to external factors. However, once the probe retracts, the probe can no longer perform detection, limiting its detection range. Utility Model Content

[0004] To solve the above-mentioned technical problems, this utility model provides an adjustable probe structure. This utility model is achieved through the following technical solution.

[0005] This utility model provides an adjustable probe structure, including a probe assembly and a sleeve. The probe assembly includes a primary probe and a secondary probe. One end of the secondary probe is connected to the primary probe, and the other end of the secondary probe is connected to one end of the sleeve. The other end of the sleeve is provided with a through hole A, and an adjustment component is provided on the sleeve.

[0006] Preferably, the primary probe and the secondary probe are fixedly connected, and a connector is provided at one end of the secondary probe, which is connected to the adjustment component.

[0007] Preferably, the sleeve has a cavity, one end of which is connected to a through hole A and the other end of which is connected to a through hole B, and the probe assembly extends into the cavity through the through hole B.

[0008] Preferably, a connecting tube is provided at one end of the sleeve, and the probe assembly is slidably connected by extending into the through hole B through the connecting tube.

[0009] Preferably, a placement groove is provided at one end of the through hole A, and a sliding groove is provided on the sleeve.

[0010] Preferably, the adjustment assembly includes an elastic element and a sliding element, the elastic element being connected to the sliding element, and the sliding element being connected to one end of the secondary probe.

[0011] Preferably, the slider includes a push rod and a connecting part, the push rod is connected to one side of the connecting part, and the connecting part is connected to one end of the secondary probe.

[0012] Preferably, the connecting part is provided with a connecting groove, and the connecting part is connected to one end of the secondary probe through the connecting groove.

[0013] The beneficial effects of this utility model are as follows:

[0014] This utility model's sleeve can be directly connected to voltmeter and multimeter probes, reducing the need for tool changes. By quickly adjusting the extension or retraction of the probe assembly, it can meet the testing needs of pin-like or socket-like structures, improving the efficiency of debugging and measurement. The sleeve's insulated design ensures safe use and prevents accidental short circuits or electric shocks. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the extended probe assembly of this utility model;

[0016] Figure 2 This is a schematic diagram of the extended probe assembly of this utility model;

[0017] Figure 3 This is a schematic diagram of the shrinkage structure of the probe assembly of this utility model;

[0018] Figure 4 This is a schematic diagram of the shrinking structure of the probe assembly of this utility model;

[0019] Figure 5 This is a schematic diagram of the connecting part of this utility model;

[0020] Figure 6 This is a schematic diagram of the structure of the slide groove in this utility model;

[0021] In the figure: 1-Probe assembly, 2-Sleeve, 21-Through hole A, 22-Cavity, 23-Through hole B, 24-Placement groove, 25-Slide groove, 26-Connecting tube, 3-First-stage probe, 4-Second-stage probe, 41-Connector, 5-Elastic element, 6-Sliding element, 61-Push rod, 62-Connecting part, 63-Connecting groove. Detailed Implementation

[0022] The technical solution of this utility model is further described below, but the scope of protection is not limited to what is described.

[0023] Example:

[0024] like Figures 1 to 6 As shown, an adjustable probe structure includes a probe assembly 1 and a sleeve 2. The probe assembly 1 includes a primary probe 3 and a secondary probe 4. One end of the secondary probe 4 is connected to the primary probe 3, and the other end of the secondary probe 4 is connected to one end of the sleeve 2. The probe assembly 1 is made of conductive material to ensure effective conductivity and ensure the accuracy of electrical measurements. The other end of the sleeve 2 is provided with a through hole A21, through which the sleeve 2 can be connected to probes fixed to a voltmeter or multimeter. An adjustment component is provided on the sleeve 2. Except for the connecting tube 26, the rest of the structure of the sleeve 2 is made of insulating material.

[0025] The primary probe 3 and the secondary probe 4 are fixedly connected. One end of the secondary probe 4 is provided with a connector 41, which is connected to the adjustment component. The diameter of the connector 41 is larger than the diameter of the through hole A21 and the through hole B23.

[0026] The sleeve 2 is provided with a cavity 22. One end of the cavity 22 is connected to the through hole A21, and the other end of the cavity 22 is connected to the through hole B23. The probe assembly 1 extends into the cavity 22 through the through hole B23.

[0027] One end of the sleeve 2 is provided with a connecting tube 26, which can be made of conductive material. The probe assembly 1 is slidably connected to the through hole B23 through the connecting tube 26. The connecting tube 26 can protect the probe assembly 1 after shrinkage, and the connecting tube 26 is in contact with the probe assembly 1.

[0028] One end of the through hole A21 is provided with a placement groove 24, through which the through hole A21 communicates with the cavity 22. The sleeve 2 is provided with a sliding groove 25, which is L-shaped and communicates with one side of the cavity 22. A fixing part is provided at the end of the sliding groove 25 away from the connecting pipe 26. This fixing part is perpendicular to the rest of the sliding groove 25, making the sliding groove 25 L-shaped. By moving the sliding member 6 and rotating it along the axis of the connecting groove 63 to the fixing part on the other side of the sliding groove 25, the position of the probe assembly 1 can be fixed. The placement groove 24 can be used to place the connecting part 62, facilitating the retraction and positioning of the probe assembly 1.

[0029] The adjustment assembly includes an elastic element 5 and a sliding element 6. The elastic element 5 is connected to the sliding element 6, and the elastic element 5 is disposed within the cavity 22. The sliding element 6 is connected to one end of the secondary probe 4. The elastic element 5 is a spring, and its diameter is larger than the diameters of the through holes A21 and B23 to prevent it from dislodging from the cavity 22.

[0030] The sliding member 6 includes a push rod 61 and a connecting part 62. The push rod 61 is connected to one side of the connecting part 62. The push rod 61 extends out of the sleeve 2 through the sliding groove 25. The connecting part 62 is connected to one end of the secondary probe 4.

[0031] The connecting part 62 is provided with a connecting groove 63. The connecting part 62 is connected to one end of the secondary probe 4 through the connecting groove 63. The connecting groove 63 can be circular, so that one end of the secondary probe 4 extends into and fits into the groove.

[0032] The method of using this utility model includes the following steps:

[0033] It is connected to the probes of the voltmeter and multimeter fixed through the through hole A21. The probes of the voltmeter and multimeter extend into the cavity 22 and contact the probe assembly 1.

[0034] If measurement is required by a probe, the push rod 61 is moved away from the fixed part of the slide groove 25. At this time, the elastic force of the elastic element 5 causes the probe assembly 1 to extend out of the connecting tube 26, and the detection can be performed by the probe assembly 1. This method is used when the structure to be detected is a hole structure, and the probe assembly 1 can be inserted into the hole structure to make contact and perform the detection.

[0035] If measurement is required through a perforated structure, push rod 61 is pushed into the fixed part of slide groove 25, elastic element 5 retracts, and probe assembly 1 is fully retracted into connecting tube 26. At this time, detection can be performed through the hole at the end of connecting tube 26. This method is used when the structure to be detected is a pin structure, and the pin can be inserted into connecting tube 26 for contact detection.

Claims

1. An adjustable probe structure, characterized in that: The device includes a probe assembly (1) and a sleeve (2). The probe assembly (1) includes a primary probe (3) and a secondary probe (4). One end of the secondary probe (4) is connected to the primary probe (3), and the other end of the secondary probe (4) is connected to one end of the sleeve (2). The other end of the sleeve (2) is provided with a through hole A (21), and an adjustment component is provided on the sleeve (2).

2. The adjustable probe structure as described in claim 1, characterized in that: The primary probe (3) and the secondary probe (4) are fixedly connected. One end of the secondary probe (4) is provided with a connector (41), which is connected to the adjustment component.

3. The adjustable probe structure as described in claim 1, characterized in that: The sleeve (2) is provided with a cavity (22), one end of the cavity (22) is connected to the through hole A (21), and the other end of the cavity (22) is connected to the through hole B (23). The probe assembly (1) extends into the cavity (22) through the through hole B (23).

4. The adjustable probe structure as described in claim 3, characterized in that: The sleeve (2) is provided with a connecting tube (26) at one end, and the probe assembly (1) is slidably connected to the through hole B (23) through the connecting tube (26).

5. An adjustable probe structure as described in claim 1, characterized in that: One end of the through hole A (21) is provided with a placement groove (24), and the sleeve (2) is provided with a sliding groove (25).

6. The adjustable probe structure as described in claim 1, characterized in that: The adjustment assembly includes an elastic element (5) and a sliding element (6), the elastic element (5) and the sliding element (6) are connected, and the sliding element (6) is connected to one end of the secondary probe (4).

7. An adjustable probe structure as described in claim 6, characterized in that: The sliding member (6) includes a push rod (61) and a connecting part (62). The push rod (61) is connected to one side of the connecting part (62), and the connecting part (62) is connected to one end of the secondary probe (4).

8. An adjustable probe structure as described in claim 7, characterized in that: The connecting part (62) is provided with a connecting groove (63), and the connecting part (62) is connected to one end of the secondary probe (4) through the connecting groove (63).

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