Insulated gate bipolar transistor (IGBT) static test fixture

Abstract

The utility model discloses an IGBT static test fixture, relates to the IGBT clamping technology field, and comprises a test device body, a heat dissipation mechanism and a clamping mechanism, the test device body is internally provided with a test chamber, the left end side wall and the right end side wall of the test chamber are provided with chutes, the chutes are internally connected with slide blocks in a sliding manner, a test plate is fixedly connected between the two groups of slide blocks, and the test plate is fixedly connected with the heat dissipation mechanism. A plurality of sets of clamping grooves are formed in the test plate, clamping mechanisms are arranged in the clamping grooves, heat dissipation mechanisms are arranged at the upper ends of the clamping mechanisms, and flexible clamping rods can adapt to the special shape of the IGBT plate and can accurately make contact with and fix the outer side wall of the IGBT plate, so that the shape error and irregularity of the IGBT plate can be effectively compensated, and the test accuracy is improved. According to the clamping device, the stability of the clamping device in testing or operation is ensured, the clamping force can be ensured to be uniform and adjustable by the tension provided by the buffer spring when the flexible clamping rod is in contact with the IGBT plate, plate damage or unstable clamping caused by too large or too small clamping force is avoided, and therefore the stable clamping force is provided.

Description

Technical Field

[0001] This utility model relates to the field of IGBT clamping technology, specifically an IGBT static test fixture. Background Technology

[0002] The Insulated-Gate Bipolar Transistor (IGBT) combines the advantages of the Giant Transistor (GTR) and the Power MOSFET, possessing excellent characteristics and a wide range of applications. The IGBT is also a three-terminal device: gate, collector, and emitter.

[0003] A search revealed that Chinese patent CN218548378U discloses a fixture for processing nano-silver paste IGBTs, including a fixed limiting plate with an adjustment groove on its top. An insertion plate is inserted into the adjustment groove, and an adjustment connecting plate is fixedly connected to one side of the insertion plate. In use, the nano-silver paste IGBT is placed between two adjusting clamping plates. The adjusting clamping plates are moved to clamp the nano-silver paste IGBT. Then, the insertion plate is pulled up and down, allowing the nano-silver paste IGBT to move vertically and adjust its height, making it easier for people of different heights to use. A pull-out box is then pulled out to retrieve the processing tools. After use, the processing tools must be placed back into the pull-out box. This not only improves the convenience of accessing processing tools but also allows for the storage of a certain number of processing tools, preventing loss due to improper placement.

[0004] The above-mentioned utility model has the following problems:

[0005] 1. In the above application, the IGBT board is not a regular rectangle. Using conventional clamping plates to fix it cannot effectively secure the IGBT board. Furthermore, IGBTs are fragile, and failure to control the force may damage the IGBT board.

[0006] 2. In the above application, during the testing process, the IGBT may generate heat. Conventional fixtures do not have heat dissipation functions to prevent overheating from affecting the test results or damaging the IGBT.

[0007] Therefore, those skilled in the art have provided an IGBT static test fixture to solve the problems mentioned in the background art. Utility Model Content

[0008] The purpose of this invention is to provide an IGBT static test fixture to solve the problems mentioned in the background art.

[0009] To achieve the above objectives, this utility model provides the following technical solution:

[0010] An IGBT static test fixture includes a test device body, a heat dissipation mechanism, and a clamping mechanism. The test device body has a test chamber, and the left and right side walls of the test chamber have sliding grooves. Sliding blocks are slidably connected in the sliding grooves. A test plate is fixedly connected between two sets of sliding blocks. Multiple clamping slots are opened in the test plate, and clamping mechanisms are provided in the clamping slots. A heat dissipation mechanism is provided at the upper end of each clamping mechanism.

[0011] As a further embodiment of this utility model: a rocker arm is rotatably connected to one end of the test plate, and a first transmission rod is fixedly connected to the output end of the rocker arm after passing through the test plate. A first bevel gear is fixedly connected to the end of the first transmission rod, and a second bevel gear is movably connected to one end of the first bevel gear. A second transmission rod is fixedly connected to the upper end of the second bevel gear. Multiple sets of bidirectional lead screws are provided at the end of the second transmission rod away from the second bevel gear, and all bidirectional lead screws are rotatably connected to the clamping groove.

[0012] As a further embodiment of this utility model: a third transmission rod is fixedly connected between each of the adjacent bidirectional lead screws, the third transmission rod is uniformly connected through the test plate, and threaded sleeves are threadedly connected to both ends of the bidirectional lead screws. A movable plate is fixedly connected to the upper end of each threaded sleeve, and a heat dissipation mechanism is provided at the upper end of each movable plate.

[0013] As a further embodiment of this utility model: a fixing block is fixedly connected to one end of each movable plate near the adjacent bidirectional lead screw, and multiple sets of fixing rods are fixedly connected inside each fixing block. A flexible clamping rod is fixedly connected to one end of each fixing rod away from the adjacent movable plate, and a buffer spring is fixedly connected between the flexible clamping rod and the fixing rod. A cooling fan is embedded inside each movable plate, an air inlet is provided in each fixing block, and the flexible clamping rods are all hollow and have an air outlet at their ends.

[0014] As a further embodiment of this utility model: the first bevel gear and the second bevel gear are arranged perpendicularly, and the first bevel gear and the second bevel gear mesh with each other.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1. Because it is equipped with a clamping mechanism, the IGBT board can be accurately positioned in the clamping slot through the threaded connection of the bidirectional lead screw and the threaded sleeve. The design of the movable plate with fixed connection at both ends can evenly clamp both ends of the IGBT board, which can adapt to IGBT boards of different sizes and specifications and can meet different types of testing needs.

[0017] 2. The design incorporates a heat dissipation mechanism. The flexible clamping rods can adapt to the irregular shapes of the IGBT boards, precisely contacting and fixing the outer walls of the IGBT boards. This effectively compensates for shape errors and irregularities in the IGBT boards, ensuring stability during testing or operation. The buffer springs provide tension when the flexible clamping rods contact the IGBT boards, ensuring uniform and adjustable clamping force. This prevents damage to the boards or unstable clamping due to excessive or insufficient clamping force, thus providing stable clamping force and reducing testing errors or board deformation caused by uneven clamping. The flexible clamping rods can adapt to IGBT boards of various shapes and sizes, making the design highly versatile and flexible. It can handle different types of IGBT boards without complex adjustments or reconfigurations. A cooling fan blows air to the top of the IGBT boards, effectively dissipating heat and preventing overheating caused by excessive heat generated during operation. This heat dissipation design helps maintain the operating temperature of the IGBT boards within a safe range, improving their performance and stability. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of an IGBT static test fixture.

[0019] Figure 2 This is a schematic diagram of the test board in an IGBT static test fixture.

[0020] Figure 3 This is a schematic diagram of the structure of a fixing block in an IGBT static test fixture.

[0021] Figure 4 This is a side view cross-sectional diagram of a fixing block in an IGBT static test fixture.

[0022] Figure 5 This is a top view cross-sectional diagram of the test board in an IGBT static test fixture.

[0023] In the diagram: 1. Test device body; 2. Test chamber; 3. Slide groove; 4. Slider; 5. Test plate; 6. Clamping groove; 7. Bidirectional lead screw; 8. Threaded sleeve; 9. Moving plate; 10. Cooling fan; 11. Fixing block; 12. Flexible clamping rod; 13. Fixing rod; 14. Buffer spring; 15. Air inlet; 16. Rocker arm; 17. First transmission rod; 18. First bevel gear; 19. Second bevel gear; 20. Second transmission rod; 21. Third transmission rod. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Reference Figure 1-5 This embodiment provides an IGBT static test fixture, including a test device body 1, a test chamber 2, a sliding groove 3, a slider 4, a test plate 5, a clamping groove 6, a bidirectional lead screw 7, a threaded sleeve 8, a moving plate 9, a cooling fan 10, a fixing block 11, a flexible clamping rod 12, a fixing rod 13, a buffer spring 14, an air inlet 15, a rocker arm 16, a first transmission rod 17, a first bevel gear 18, a second bevel gear 19, a second transmission rod 20, and a third transmission rod 21. The test device body 1 has a test chamber 2 inside, and sliding grooves 3 are provided on the left and right side walls of the test chamber 2. Slider 4 is slidably connected in each sliding groove 3. A test plate 5 is fixedly connected between two sets of slider 4. Multiple clamping grooves 6 are provided in the test plate 5. Each clamping groove 6 is provided with a clamping mechanism, and a cooling mechanism is provided at the upper end of each clamping mechanism.

[0026] Reference Figure 1 , 25. A rocker arm 16 is rotatably connected to one end of the test plate 5. The output end of the rocker arm 16 passes through the test plate 5 and is fixedly connected to a first transmission rod 17. A first bevel gear 18 is fixedly connected to the end of the first transmission rod 17. A second bevel gear 19 is movably connected to one end of the first bevel gear 18. A second transmission rod 20 is fixedly connected to the upper end of the second bevel gear 19. Multiple sets of bidirectional lead screws 7 are provided at the end of the second transmission rod 20 away from the second bevel gear 19, and all bidirectional lead screws 7 are rotatably connected to the clamping groove 6. A third transmission rod 21 is fixedly connected between adjacent bidirectional lead screws 7. The third transmission rods 21 pass through the test plate 5 evenly. Threaded sleeves 8 are threaded to both ends of the bidirectional lead screws 7. Moving plates 9 are fixedly connected to the upper ends of the threaded sleeves 8. Heat dissipation mechanisms are provided on the upper ends of the moving plates 9. The first bevel gear 18 and the second bevel gear 19 are connected to each other. 9. Vertically positioned, the first bevel gear 18 meshes with the second bevel gear 19. The test plate 5 is pulled out of the test chamber 2 of the test device body 1 through the slide groove 3 and the slider 4. The IGBT board is placed in the clamping groove 6. The rocker arm 16 is shaken, which drives the first transmission rod 17. The first transmission rod 17 drives the first bevel gear 18 to rotate. The first bevel gear 18 meshes with the second bevel gear 19, thereby driving the second bevel gear 19 to rotate. The second bevel gear 19 drives the second transmission rod 20 to rotate. The second transmission rod 20 can then drive multiple sets of bidirectional lead screws 7 to rotate synchronously through the third transmission rod 21. The bidirectional lead screws 7 also drive the threaded sleeves 8 connected at both ends. The threaded sleeves 8 drive the movable plate 9, which is fixed at both ends, to move simultaneously to the center position, fixing the IGBT board and waiting for subsequent static testing.

[0027] Reference Figure 1 , 3 4. Each movable plate 9 has a fixed block 11 fixedly connected to one end of the adjacent bidirectional lead screw 7. Multiple sets of fixed rods 13 are fixedly connected within each fixed block 11. A flexible clamping rod 12 is fixedly connected to the end of each fixed rod 13 away from the adjacent movable plate 9, and a buffer spring 14 is fixedly connected between the flexible clamping rod 12 and the fixed rod 13. Each movable plate 9 has a built-in cooling fan 10. Each fixed block 11 has an air inlet 15. Each flexible clamping rod 12 is hollow and has an air outlet at its end. The IGBT board is located between the two sets of movable plates 9, controlling the two sets of... The movable plate 9 moves in the center and contacts the IGBT plate through the flexible clamping rod 12. The flexible clamping rod 12 that contacts the IGBT plate will move backward through the buffer spring 14 until the buffer spring 14 reaches its maximum tension, and the flexible clamping rod 12 that contacts the IGBT plate will retract backward, while the flexible clamping rod 12 that does not contact the IGBT plate will remain stationary. This allows the IGBT plate to be positioned according to its irregular shape and the outer wall of the IGBT plate to be fixed. When the cooling fan 10 is started, the cooling fan 10 blows air through the air inlet 15 and the air outlet to the upper part of the IGBT plate to dissipate heat.

[0028] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0029] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. An IGBT static test fixture comprising a test device body (1), a heat dissipation mechanism, and a clamping mechanism, characterized in that, The test device body (1) is provided with a test bin (2), the left and right two end side walls of the test bin (2) are provided with a sliding groove (3), the sliding groove (3) is slidably connected with a sliding block (4), the two groups of sliding blocks (4) are fixedly connected with a test plate (5), the test plate (5) is provided with a plurality of clamping grooves (6), the clamping grooves (6) are provided with a clamping mechanism, and the clamping mechanism is provided with a heat dissipation mechanism.

2. The IGBT static test fixture of claim 1, wherein, The clamping mechanism comprises a bidirectional screw rod (7), a threaded sleeve (8), a moving plate (9), a rocker (16), a first transmission rod (17), a first bevel gear (18), a second bevel gear (19), a second transmission rod (20) and a third transmission rod (21), one end of the test plate (5) is rotatably connected with the rocker (16), the rocker (16) is fixedly connected with the first transmission rod (17) penetrating through the test plate (5), and the first transmission rod (17) is fixedly connected with the first bevel gear (18) at the tail end.

3. The IGBT static test fixture of claim 2, wherein, One end of the first bevel gear (18) is movably connected with the second bevel gear (19), the second bevel gear (19) is fixedly connected with the second transmission rod (20) at the upper end, and a plurality of bidirectional screw rods (7) are arranged on the end away from the second bevel gear (19) of the second transmission rod (20) and are rotatably connected with the clamping grooves (6).

4. The IGBT static test fixture of claim 3, wherein, The third transmission rod (21) is fixedly connected between the adjacent bidirectional screw rods (7) and penetrates the test plate (5), and the left and right ends of the bidirectional screw rod (7) are threadedly connected with the threaded sleeve (8).

5. The IGBT static test fixture of claim 4, wherein, The upper end of the threaded sleeve (8) is fixedly connected with the moving plate (9), and the moving plate (9) is provided with a heat dissipation mechanism.

6. The IGBT static test fixture of claim 5, wherein, The heat dissipation mechanism comprises a heat dissipation fan (10), a fixed block (11), a flexible clamping rod (12), a fixed rod (13), a buffer spring (14) and an air inlet (15), one end of the moving plate (9) close to the adjacent bidirectional screw rod (7) is fixedly connected with the fixed block (11), a plurality of fixed rods (13) are fixedly connected in the fixed block (11), the end away from the adjacent moving plate (9) of the fixed rod (13) is fixedly connected with the flexible clamping rod (12), and the buffer spring (14) is fixedly connected between the flexible clamping rod (12) and the fixed rod (13).

7. The IGBT static test fixture of claim 3, wherein, The moving plate (9) is embedded with the heat dissipation fan (10), the fixed block (11) is provided with the air inlet (15), the flexible clamping rod (12) is hollow, and the end of the flexible clamping rod (12) is provided with an air outlet. The first bevel gear (18) and the second bevel gear (19) are arranged vertically, and the first bevel gear (18) and the second bevel gear (19) are engaged.

Images