Cutting instrument sample holder
By designing a sample holder for the cutter with movable baffles and positioning components, the problems of small cutting range and large baffle wear in the prior art are solved, enabling precise cutting of samples at different positions, improving cutting flexibility and baffle lifespan.
Patent Information
- Application Number
- CN202520135927.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-20
- Publication Date
- 2026-02-03
- Estimated Expiration
- 2035-01-20
AI Technical Summary
The sample holder baffle of the existing argon ion beam cross-section cutter is fixed and cannot be moved, resulting in a small cutting range, making it difficult to cut to the required position, and the time and effort required for re-preparation of the sample, as well as the large wear and tear on the baffle.
Design a baffle that can translate along the length of the baffle groove, and adjust and lock the baffle position through a positioning component. Combined with scale lines and pointer indication, it can achieve precise cutting of different positions of the sample, enhance cutting flexibility and controllability, and reduce baffle wear.
It improves the accuracy and flexibility of sample cutting, reduces baffle wear, ensures the stability and precision of the cutting process, and improves work efficiency.
Smart Images
Figure CN223870385U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of cross-section cutting test technology, specifically a sample holder for a cutting instrument. Background Technology
[0002] Argon ion beam cross-section cutting works by using an electric field to accelerate ions onto the sample surface, creating a sputtering effect that yields a high-quality, smooth surface. Ion polishing is a stress-free polishing process that does not cause mechanical damage to the sample surface and is widely used in electronic materials, semiconductor lithium-ion batteries, and other fields. After polishing, scanning electron microscopy and X-ray energy dispersive spectroscopy are used to analyze the internal morphology and elemental composition distribution.
[0003] The sample holder baffle of a commonly used argon ion beam cross-section cutter is usually fixed and cannot be moved. It can only cut a specific position. Therefore, the cutting range of the argon ion beam cross-section cutter is very small, and it often cannot cut to the required position. Although the sample can be re-prepared, it cannot be guaranteed that the required position will be cut. Moreover, re-preparing the sample and cutting is time-consuming and labor-intensive, and greatly increases the wear and tear on the baffle. This problem urgently needs to be solved. Utility Model Content
[0004] To address the technical problems existing in the prior art, this utility model provides a sample holder for a cutting instrument, which can cut samples at different positions as required, increase cutting accuracy, and reduce baffle wear.
[0005] To achieve the above objectives, this utility model provides the following technical solution:
[0006] This utility model discloses a sample holder for a cutting instrument, including a base and a positioning component; the top of the base is provided with an elongated baffle groove, and a baffle for carrying the sample is provided in the baffle groove, and the baffle can be translated along the length direction of the baffle groove; the positioning component is provided on the base and is used to adjust and / or lock the position of the baffle in the baffle groove, so as to realize the cutting of the sample at different positions.
[0007] By setting a baffle that can translate along the length of the baffle groove and using a positioning component to adjust and / or lock the baffle position, it is possible to easily cut different positions of the sample, meeting the need for precise cutting of different parts of the sample during argon ion beam cross-section cutting, and improving the flexibility and controllability of cutting. In addition, the wear parts of the baffle can be changed by moving the baffle position, thereby increasing the baffle's service life.
[0008] As a further improvement to the above solution, the positioning component includes two positioning screws; both positioning screws are threaded onto the base, and can extend from the periphery of the base into the baffle groove to abut against two positioning sides of the baffle distributed along its length. By synchronously adjusting the two positioning screws, the baffle can be moved along the baffle groove.
[0009] The position of the baffle is adjusted by two positioning screws. This double-sided positioning method makes the baffle move more smoothly and allows for more precise control of its position, thereby improving the accuracy of the sample cutting position and reducing cutting errors caused by unstable baffle movement or inaccurate positioning.
[0010] As a further improvement to the above solution, the positioning component also includes a fastening screw; the fastening screw is threaded onto the base, and the axis of the fastening screw is perpendicular to the length direction, and can extend from the periphery of the base into the baffle groove and abut against one clamping side of the baffle, the clamping side being adjacent to the two positioning sides.
[0011] An additional fastening screw is added to the two positioning screws to abut against the clamping side of the baffle from a direction perpendicular to its length. Working together with the positioning screws, the baffle's position is further fixed, effectively preventing displacement of the baffle due to the impact of the argon ion beam or other external forces during the cutting process. This ensures the stability of the sample position during the cutting process and improves the cutting quality and accuracy.
[0012] As a further improvement to the above solution, the top of the base is also provided with scale lines parallel to the length direction of the baffle groove.
[0013] Operators can directly read the position of the baffle through the scale lines, thereby quickly and accurately adjusting the baffle to the required cutting position without the need for additional measuring tools, which improves work efficiency and also facilitates repeated positioning of the cutting position, which is beneficial for comparative experiments or multiple cuts at the same position.
[0014] As a further improvement to the above solution, a pointer is provided on the baffle that points vertically to the plane where the top of the base is located.
[0015] The pointer, used in conjunction with the scale lines on the base, provides a more intuitive and precise indication of the baffle's position, further improving the accuracy of the cutting position. Especially when minute adjustments are required, the pointer helps operators control the baffle's movement more precisely, ensuring the accuracy of the cutting position.
[0016] As a further improvement to the above solution, a clamping groove is provided on the outer side of the base to facilitate gripping with circular tweezers, thereby forming a winding wheel structure.
[0017] The clamping slots allow operators to easily clamp and move the sample holder using tools such as tweezers, improving the convenience and safety of the operation and preventing high-temperature burns to operators and / or instruments during the replacement process.
[0018] As a further improvement to the above solution, the positioning screw is an internal hexagon screw; the diameter of the positioning screw nut is smaller than the height of the clamping groove; the diameter of the fastening screw nut is larger than the height of the clamping groove; and a receiving groove for accommodating the fastening screw nut is also provided on the outer side of the base.
[0019] The positioning screw and nut of this invention can be designed to be small and concealed within the clamping groove. They can be adjusted using an Allen wrench, resulting in a cleaner and more aesthetically pleasing sample holder appearance. This also avoids the problem of exposed screw heads on both sides, which would hinder the use of tweezers or other tools. Conversely, the fastening screw and nut can be designed to be larger and housed within a receiving groove. This allows operators to manually rotate the fastening screw and nut without the need for wrenches or other tools, making it more convenient and enabling quick locking.
[0020] As a further improvement to the above solution, the threaded end diameter of the positioning screw is smaller than the width and height of the baffle groove; the threaded end diameter of the fastening screw is smaller than the length and height of the baffle groove.
[0021] The thread diameters of the positioning screws and fastening screws are smaller than the corresponding dimensions of the baffle groove, ensuring that the screws do not interfere with the wall of the baffle groove when they are inserted into it for adjustment and fixation. This makes the movement and fixation of the baffle smoother, reduces the possibility of jamming or damage caused by the mismatch between the screw and the baffle groove size, and extends the service life of the sample holder.
[0022] As a further improvement to the above solution, a fixing rod is fixedly connected to the center of the bottom of the base. The fixing rod can be inserted into the hole on the sample stage of the argon ion beam section cutter to fix the sample holder.
[0023] The fixing rod enables quick and easy attachment of the sample holder to the cutter, ensuring the stability of the sample holder during cutting and preventing cutting accuracy from being affected by sample holder wobbling. This fixing method is simple, reliable, and easy to operate, improving the efficiency of sample installation.
[0024] As a further improvement to the above solution, the bottom of the base is also provided with a locking hole, which can be engaged with the locking pin on the sample stage to lock the sample holder.
[0025] The locking holes and fixing rods work together to form a double fixing structure, which further improves the fixing effect and positioning accuracy of the sample holder on the cutting instrument, effectively preventing any slight displacement of the sample holder during the cutting process, and ensuring the precision and stability of the cutting.
[0026] Compared with the prior art, the beneficial effects of this utility model are:
[0027] This invention enables cutting at different locations on the sample, meeting the need for precise cutting of different parts of the sample during argon ion beam cross-section cutting. By flexibly adjusting the position of the baffle, the wear points of the baffle can be changed, thus extending the service life of the baffle. Attached Figure Description
[0028] Figure 1 This is a three-dimensional structural diagram of the sample holder of the cutting instrument in a preferred embodiment of the present invention.
[0029] Figure 2 for Figure 1 A cross-sectional view of the sample holder from the main perspective.
[0030] Figure 3 for Figure 3 A three-dimensional structural diagram of the sample holder from another perspective.
[0031] In the diagram: 1. Base; 11. Baffle groove; 12. Clamping groove; 13. Receiving groove; 14. Locking hole; 2. Baffle; 3. Sample; 41. Positioning screw; 42. Fastening screw; 5. Scale line; 6. Pointer; 7. Fixing rod. Detailed Implementation
[0032] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0033] Please see Figures 1 to 3 This embodiment provides a sample holder for a cutting instrument, including a base 1 and a positioning component.
[0034] In this embodiment, the base 1 is generally frustum-shaped, and a clamping groove 12 is provided on the outer side of the base 1 to facilitate gripping by circular tweezers, thereby forming a winding wheel structure.
[0035] The clamping slot 12 facilitates the use of tweezers and other tools to clamp and move the sample holder, improving the convenience and safety of operation and avoiding high-temperature burns to operators and / or instruments during the replacement process.
[0036] A fixing rod 7 is fixedly connected to the center of the bottom of the base 1. The fixing rod 7 can be inserted into the hole on the sample stage of the argon ion beam cross-section cutter to fix the sample holder. The bottom of the base 1 is also provided with a locking hole 14, which can be engaged with the locking pin on the sample stage to lock the sample holder.
[0037] The fixing rod 7 enables quick fixation of the sample holder to the cutter, ensuring the stability of the sample holder during cutting and preventing cutting accuracy from being affected by sample holder wobbling. This fixing method is simple, reliable, and easy to operate, improving the efficiency of sample installation. The locking hole 14 and the fixing rod 7 work together to form a double fixing structure, further improving the fixing effect and positioning accuracy of the sample holder on the cutter, effectively preventing any slight displacement of the sample holder during the cutting process, and ensuring the accuracy and stability of the cutting.
[0038] The top of the base 1 has an elongated baffle groove 11, within which a baffle 2 for supporting the sample 3 is disposed, and the baffle 2 can be translated along the length of the baffle groove 11. The sample 3 can be fixed to the upper surface of the baffle 2 by adhesive. In some embodiments, the sample 3 can also be placed directly on the upper surface of the baffle 2, or a limiting groove with a shape matching the sample 3 can be provided on the upper surface of the baffle 2, in which the sample 3 is precisely embedded. As long as it can be ensured that the sample 3 does not easily shift during processing and that its upper surface is always within the effective operating space of the cutting instrument, no further limitations are imposed here.
[0039] The upper surface of baffle 2 is horizontal and higher than the upper surface of base 1. During argon ion beam section cutting, the electric field / ion detection direction is parallel to the upper surface of sample 3, thereby polishing the surface of sample 3. Of course, in some embodiments, other processes are performed on sample 3 using a cutting instrument, which will not be described in detail here.
[0040] The top of the base 1 is also provided with a scale line 5 parallel to the length direction along the baffle groove 11. The baffle 2 is provided with a pointer 6 pointing vertically to the plane where the top of the base 1 is located.
[0041] Operators can directly read the position of the baffle 2 via the scale line 11, thus quickly and accurately adjusting the baffle 2 to the desired cutting position without the need for additional measuring tools, improving work efficiency. It also facilitates repeated positioning of the cutting position, which is beneficial for comparative experiments or multiple cuts at the same location. The pointer 6, used in conjunction with the scale line 11 on the base 1, provides a more intuitive and precise indication of the baffle 2's position, further improving the accuracy of the cutting position. Especially when fine position adjustments are required, the pointer helps operators control the movement of the baffle 2 more precisely, ensuring the accuracy of the cutting position.
[0042] A positioning component is mounted on the base 1 and is used to adjust and / or lock the position of the baffle 2 within the baffle groove 11 to achieve cutting at different locations on the sample 3. By setting a baffle 2 that can translate along the length of the baffle groove 11 and using the positioning component to adjust and / or lock the position of the baffle 2, cutting at different locations on the sample 3 can be easily achieved, meeting the requirement for precise cutting of different parts of the sample during argon ion beam cross-section cutting, and improving the flexibility and controllability of cutting. In addition, the wear parts of the baffle 2 can be changed by moving its position, thereby increasing the service life of the baffle 2.
[0043] In this embodiment, the positioning component includes two positioning screws 41 and may also include a fastening screw 42. Both positioning screws 41 are threaded onto the base 1, and can extend from the periphery of the base 1 into the baffle groove 11 to abut against two positioning sides of the baffle 2 distributed along its length. By synchronously adjusting the two positioning screws 41, the baffle 2 can be moved along the baffle groove 11.
[0044] The fastening screw 42 is threaded onto the base 1, and the axial direction of the fastening screw 42 is perpendicular to the length direction. It can extend from the periphery of the base 1 into the baffle groove 11 and abut against one clamping side of the baffle 2. The clamping side is adjacent to the two positioning sides.
[0045] In this embodiment, the position of the baffle 2 is adjusted using two positioning screws 41. This double-sided positioning method makes the baffle 2 more stable during movement and allows for more precise control of its position, thereby improving the accuracy of the sample 3 cutting position and reducing cutting errors caused by unstable movement or inaccurate positioning of the baffle 2. An additional fastening screw 42 is added to the two positioning screws 41, abutting against the clamping side of the baffle 2 from a direction perpendicular to its length. Working together with the positioning screws 41, this further fixes the position of the baffle 2, effectively preventing displacement of the baffle due to the impact of the argon ion beam or other external forces during cutting. This ensures the stability of the sample position during cutting and improves cutting quality and accuracy.
[0046] Of course, in some embodiments, other types of positioning components can also be provided. For example, a pressing block can be provided on one side of the baffle 2 along the length of the baffle groove 11, and a return spring can be provided on the other side. The position of the pressing block can be adjusted by adjusting the threaded screw, etc., and the position adjustment and fixation of the baffle 2 can be achieved in conjunction with the reset action of the return spring. This will not be elaborated further here.
[0047] In this embodiment, the positioning screw 41 is an internal hexagon screw; the diameter of the nut of the positioning screw 41 is smaller than the height of the clamping groove 12; the diameter of the nut of the fastening screw 42 is larger than the height of the clamping groove 12; a receiving groove 13 for accommodating the nut of the fastening screw 42 is also provided on the outer side of the base 1.
[0048] The positioning screw 41 can be designed with a smaller nut, which is hidden in the clamping groove 12. It can be adjusted with an Allen wrench during use, which not only makes the sample holder look cleaner and more aesthetically pleasing, but also avoids the problem of the screw heads on both sides being exposed, making it difficult to grasp with tweezers or other tools. The fastening screw 42 can be designed with a larger nut, which is housed in the receiving groove 13. The operator can directly reach into the receiving groove 13 to manually rotate the nut of the fastening screw 42 without using a wrench or other tools, making it more convenient to use and enabling quick locking.
[0049] The threaded end diameter of the positioning screw 41 is smaller than the width and height of the baffle groove 11, and the threaded end diameter of the fastening screw 42 is smaller than the length and height of the baffle groove 11. This ensures that the screw will not interfere with the wall of the baffle groove 11 when it is inserted into the baffle groove 11 for adjustment and fixation. This makes the movement and fixation of the baffle 2 smoother, reduces the jamming or damage that may occur due to the mismatch between the screw and the baffle groove 11, and extends the service life of the sample holder.
[0050] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.
Claims
1. A sample holder for a cutting instrument, characterized in that, The sample includes a base (1) and a positioning component; the top of the base (1) is provided with a long strip-shaped baffle groove (11), and a baffle (2) for carrying the sample (3) is provided in the baffle groove (11), and the baffle (2) can be translated along the length direction of the baffle groove (11); the positioning component is provided on the base (1) and is used to adjust and / or lock the position of the baffle (2) in the baffle groove (11) so as to realize the cutting of the sample (3) at different positions.
2. The sample holder for a cutting instrument according to claim 1, characterized in that, The positioning component includes two positioning screws (41); both positioning screws (41) are threaded onto the base (1), and can extend from the periphery of the base (1) into the baffle groove (11) and respectively abut against the two positioning sides of the baffle (2) distributed along the length direction. By synchronously adjusting the two positioning screws (41), the baffle (2) can be moved along the baffle groove (11).
3. A sample holder for a cutting instrument according to claim 2, characterized in that, The positioning assembly also includes a fastening screw (42); the fastening screw (42) is threaded onto the base (1), and the axial direction of the fastening screw (42) is perpendicular to the length direction, and can extend from the periphery of the base (1) into the baffle groove (11) and abut against one clamping side of the baffle (2), the clamping side being adjacent to the two positioning sides.
4. A sample holder for a cutting instrument according to any one of claims 1 to 3, characterized in that, The top of the base (1) is also provided with a scale line (5) parallel to the length direction along the baffle groove (11).
5. A sample holder for a cutting instrument according to claim 4, characterized in that, A pointer (6) is provided on the baffle (2) pointing vertically to the plane where the top of the base (1) is located.
6. A sample holder for a cutting instrument according to claim 3, characterized in that, A clamping groove (12) is provided on the outer side of the base (1) to facilitate gripping with round tweezers, thereby forming a winding wheel structure.
7. A sample holder for a cutting instrument according to claim 6, characterized in that, The positioning screw (41) is an internal hexagon screw; the diameter of the nut of the positioning screw (41) is smaller than the height of the clamping groove (12); the diameter of the nut of the fastening screw (42) is larger than the height of the clamping groove (12); a receiving groove (13) for accommodating the nut of the fastening screw (42) is also provided on the outside of the base (1).
8. A sample holder for a cutting instrument according to claim 7, characterized in that, The threaded end diameter of the positioning screw (41) is smaller than the width and height of the baffle groove (11); the threaded end diameter of the fastening screw (42) is smaller than the length and height of the baffle groove (11).
9. A sample holder for a cutting instrument according to any one of claims 1 to 3, characterized in that, A fixing rod (7) is fixedly connected to the bottom center of the base (1). The fixing rod (7) can be inserted into the hole on the sample stage of the argon ion beam section cutter to fix the sample holder.
10. A sample holder for a cutting instrument according to claim 9, characterized in that, The bottom of the base (1) is also provided with a locking hole (14), which can be engaged with the locking pin on the sample stage to lock the sample holder.