Testing device for special-shaped test piece

Abstract

The utility model provides a testing device for special-shaped test pieces, which comprises a base and two connecting plates arranged at the top of the base, one end of each connecting plate is fixedly connected with a test piece, one side of each test piece is fixedly connected with a contact block, one side of each test piece is provided with a limiting pin, a chip is arranged on one side of each test piece, and the chip is arranged on the other side of each test piece. And pins are arranged on the surface of the chip. According to the test device for the special-shaped test pieces provided by the utility model, the two test pieces are moved and separated towards the two sides through the limiting pins, so that when the chip is inserted between the two contact blocks, the two contact blocks cannot be contacted with the two sides of a pin of the chip, and therefore, friction cannot be generated; the contact reliability and the weldability of the product in the later period are ensured, and due to the zero-contact-force pressing test, relative friction does not occur between the special-shaped test piece and the pin, so that the loss is reduced, and the service life is longer.

Description

TECHNICAL FIELD

[0001] The utility model relates to the chip test field especially relates to a testing device for special-shaped test piece. BACKGROUND

[0002] Chip, also known as microcircuit, microchip, integrated circuit, is a kind of electronic device that a large number of electronic components, such as transistor, resistance, capacitor etc. are integrated on tiny semiconductor wafer, chip is mainly composed of semiconductor material, metal wire and insulating material, semiconductor material is the basis for chip to realize various functions, by doping process etc. to it, the electrical properties can be changed, metal wire is used to connect different components, realizes the transmission of electrical signal, and insulating material is used to isolate different conductive areas to prevent short circuit.

[0003] Now when testing chip through test piece, when inserting test chip into two test pieces, the two sides of chip pin will contact with the surface of test piece in the process of pressing down, thereby relative friction occurs with the pin of chip, thereby affecting the solderability of product in later period, and the service life of test piece is also reduced, and the relative friction reduces the loss to bring longer service life.

[0004] Therefore, it is necessary to provide a testing device for special-shaped test piece to solve the above technical problems. CONTENT OF UTILITY MODEL

[0005] The utility model provides a testing device for special-shaped test piece, solve the problem that the two sides of chip pin will contact with the surface of test piece and produce friction when inserting test chip into two test pieces.

[0006] To solve the above technical problems, the utility model provides a testing device for special-shaped test piece, which comprises:

[0007] Base;

[0008] Two connecting plates, two connecting plates are arranged on the top of the base, one end of two connecting plates is fixedly connected with test piece, one side of two test pieces is fixedly connected with contact block, and one side of test piece is provided with limiting pin;

[0009] Chip, the chip is arranged on one side of the test piece, and the surface of the chip is provided with pin.

[0010] Preferably, one side of two contact blocks is fixedly connected to the opposite side of one side of two test pieces respectively.

[0011] Preferably, the limiting pin is arranged between two test pieces, and the surface is in sliding contact with one side of the test piece.

[0012] Preferably, the top of the base is fixedly connected with two support rods, and one end of each of the two support rods is fixedly connected with a support ring.

[0013] Preferably, the inside of the support ring is rotatably connected with a rotating rod, and the surface of the rotating rod is fixedly connected with a rotating block.

[0014] Preferably, the two sides of the rotating block are provided with guide rings, and the inside of each of the two guide rings is fixedly connected with two limiting blocks.

[0015] Preferably, the plurality of limiting blocks are all made of rubber material, and the two limiting blocks fixedly connected to the one side of the guide ring are spaced apart from each other.

[0016] Compared with the related art, the test device for the special-shaped test piece has the following beneficial effects:

[0017] The test device for the special-shaped test piece has the following beneficial effects: BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 Fig. 1 is a structural schematic view of a first embodiment of the test device for the special-shaped test piece according to the present application;

[0019] Figure 2 Fig. 2 is a working state view of the test device for the special-shaped test piece according to the present application; Figure 1

[0020] Fig. 3 is a structural schematic view of a second embodiment of the test device for the special-shaped test piece according to the present application. Figure 3 Fig. 1 is a structural schematic view of a first embodiment of the test device for the special-shaped test piece according to the present application;

[0021] Fig. 1 is a structural schematic view of a first embodiment of the test device for the special-shaped test piece according to the present application; DETAILED DESCRIPTION

[0022] The present application will be further described below in combination with the drawings and embodiments.

[0023] First Embodiment

[0024] Please refer to Figure 1 and Figure 2 , wherein,Figure 1 A structure schematic view of a first embodiment of a test device for special-shaped test pieces is provided by the utility model. Figure 2 A working state diagram of the test device is shown in the figure. Figure 1 The test device for special-shaped test pieces comprises:

[0025] The base 1;

[0026] Two connecting plates 2 are arranged on the top of the base 1, and one end of each of the two connecting plates 2 is fixedly connected with a test piece 3; one side of each of the two test pieces 3 is fixedly connected with a contact block 4; and one side of the test piece 3 is provided with a limiting pin 5.

[0027] The chip 13 is arranged on one side of the test piece 3, and the surface of the chip 13 is provided with a pin 6.

[0028] The limiting pin 5 is a round pin, which is used to move upward, and when the surface of the limiting pin 5 contacts the inclined surface of the two test pieces 3, the limiting pin 5 moves upward along the inclined surface, thereby extruding the two test pieces 3 connected with the two connecting plates 2 to move and tilt to one side, so that when the chip 13 is inserted between the two contact blocks 4, the two contact blocks 4 do not contact the two sides of the pin 6 of the chip 13, thereby avoiding friction.

[0029] One side of each of the two contact blocks 4 is fixedly connected to the opposite side of one side of each of the two test pieces 3.

[0030] The limiting pin 5 is arranged between the two test pieces 3, and the surface of the limiting pin 5 is in sliding contact with one side of the test piece 3.

[0031] The working principle of the test device for special-shaped test pieces provided by the utility model is as follows:

[0032] In use, the limiting pin 5 is moved upward, and when the surface of the limiting pin 5 contacts the inclined surface of the two test pieces 3, the limiting pin 5 moves upward along the inclined surface, thereby extruding the two test pieces 3 connected with the two connecting plates 2 to move and tilt to one side, so that after the two contact blocks 4 are separated to the appropriate position.

[0033] The chip 13 is inserted into the two contact blocks 4, thereby driving the pin 6 to be inserted into the appropriate position between the two contact blocks 4.

[0034] The limiting pin 5 is moved downward, so that the two connecting plates 2 are reset, thereby driving the two test pieces 3 to slowly merge in the middle along the angle of the inclined surface; after the limiting pin 5 is moved downward to the appropriate position, the two test pieces 3 are reset, thereby enabling the two contact blocks 4 to move to the middle to contact the two sides of the pin 6.

[0035] When the chip needs to be taken out, the above steps are fully performed, the limiting pin 5 is moved upward, and the two test pieces 3 connected with the two connecting plates 2 are moved and inclined to one side.

[0036] Compared with the related art, the test device for the special-shaped test piece has the following beneficial effects:

[0037] The test device for the special-shaped test piece provided by the utility model has the advantages that the two test pieces 3 are moved and separated to two sides through the limiting pin 5, when the chip 13 is inserted between the two contact blocks, the two contact blocks 4 cannot contact the two sides of the pin 6 of the chip 13, so that friction is not generated, the contact reliability and the weldability of the product in the later period are ensured, the zero-contact-force pressing test is benefited from, relative friction between the special-shaped test piece 3 and the pin 6 is not generated, loss is reduced, and a longer service life is brought.

[0038] Second embodiment

[0039] Please refer to Figure 3 Based on the test device for the special-shaped test piece provided by the first embodiment of the utility model, the second embodiment of the utility model proposes another test device for the special-shaped test piece. The second embodiment is only a preferred mode of the first embodiment, and the implementation of the second embodiment does not affect the separate implementation of the first embodiment.

[0040] Specifically, the test device for the special-shaped test piece provided by the second embodiment of the utility model is different in that the test device for the special-shaped test piece is characterized by comprising a base 1, two supporting rods 7 are fixedly connected to the top of the base 1, and one end of each of the two supporting rods 7 is fixedly connected with a supporting ring 8.

[0041] A rotating rod 9 is rotatably connected to the inside of the supporting ring 8, and the surface of the rotating rod 9 is fixedly connected with a rotating block 10.

[0042] One end of the rotating rod 9 is fixedly connected with a rotating handle for conveniently rotating the rotating rod 9, the rotating rod 9 is rotatably connected to the inside of the two supporting rings 8, the rotating block 10 is fixedly connected to the surface of the rotating rod 9, and is used for driving the rotating block 10 to rotate to one side when the rotating rod 9 rotates to one side.

[0043] The rotating block 10 is an oval block.

[0044] Both sides of the rotating block 10 are provided with a guide ring 11, and the inside of each of the two guide rings 11 is fixedly connected with two limiting blocks 12.

[0045] The guide ring 11 is a C-shaped ring, and one side of the two guide rings 11 is fixedly connected to one side of the two test pieces 3, so as to push the two test pieces 3 connected with the two guide rings 11 to tilt to a suitable angle when the rotating block 10 rotates.

[0046] The plurality of limiting blocks 12 are made of rubber material, and the two limiting blocks 12 fixedly connected to one side of the guide ring 11 are spaced apart from each other.

[0047] The plurality of limiting blocks 12 are used for limiting the rotating block 10 when the rotating block 10 rotates to the distance between the plurality of limiting blocks 12 at two ends, so as to increase the stability of the two test pieces 3 after the rotating block 10 rotates to a suitable position.

[0048] The working principle of the test device for the special-shaped test piece is as follows:

[0049] In use, the rotating rod 9 is rotated to one side, so as to rotate to one side in the inside of the supporting ring 8, and the rotating block 10 is driven to rotate when the rotating rod 9 rotates to one side.

[0050] When the rotating block 10 rotates to one side and contacts one end of the guide ring 11, the guide ring 11 moves to one side along the surface of the rotating block 10, so as to press the test piece 3 connected with the guide ring 11 to tilt to one side, and the two test pieces 3 connected with the two guide rings 11 tilt to one side after the rotating block 10 rotates by 90 degrees, and the two contact blocks 4 are separated.

[0051] After the chip 13 is inserted into a suitable position, the rotating rod 9 is rotated to one side to reset, so as to drive the rotating block 10 to rotate to one side to reset, and the test piece 3 resets when the rotating block 10 rotates to one side to reset, so that the two guide rings 11 move to one side along the surface of the rotating block 10 to reset, and the two test pieces 3 drive one end of the two contact blocks 4 to contact the two sides of the pin, respectively.

[0052] Compared with the related art, the test device for the special-shaped test piece has the following beneficial effects:

[0053] The test device for the special-shaped test piece is provided, the rotating block 10 presses the two test pieces 3 to move to two sides when the rotating block 10 rotates, so as to facilitate the separation of the two test pieces 3.

[0054] The above merely illustrates the embodiments of the present application, and does not limit the patent scope of the present application, and any equivalent structure or equivalent process transformation, or direct or indirect application in other related technical fields, which are made by using the content of the present application specification and drawings, are also included in the patent protection scope of the present application.

Claims

1. A testing device for a profiled test sheet, characterized in that, Include: Base; Two connecting plates, two said connecting plates are arranged on the top of the base, one end of two said connecting plates is fixedly connected with test piece, one side of two said test pieces is fixedly connected with contact block, one side of the test piece is provided with a limit pin; Chip, the chip is arranged on one side of the test piece, the surface of the chip is provided with pin.

2. The test device for a profile test strip according to claim 1, wherein One side of two said contact blocks is fixedly connected with the opposite side of one side of two said test pieces.

3. The test device for a profile test strip according to claim 1, wherein The limit pin is arranged between two said test pieces, and the surface is in sliding contact with one side of the test piece.

4. The test device for a profile test strip according to claim 1, wherein The top of the base is fixedly connected with two support rods, one end of two said support rods is fixedly connected with support ring.

5. A test device for a profiled test strip according to claim 4, wherein, The inside of the support ring is rotatably connected with the rotating rod, and the surface of the rotating rod is fixedly connected with the rotating block.

6. A test device for a profile test strip according to claim 5, wherein, Both sides of the rotating block are provided with guide ring, and two said guide rings are fixedly connected with two limit blocks.

7. A test device for a profile test strip according to claim 6, wherein, A plurality of said limit blocks are made of rubber material, and the distance between two said limit blocks on one side of the guide ring is left.

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