Test fixing seat with clamping mechanism for laser diode chip

Abstract

The utility model provides a test fixing seat with a clamping mechanism for a laser diode chip, and relates to the technical field of laser diode testing, the top of a base is horizontally provided with a test board through a support, the test board is provided with an opening, an illumination intensity detector is installed below the opening, and the edge of the top of the opening is detachably provided with a supporting disc; a placing hole coaxial with the opening is formed in the supporting disc; guide grooves are formed in the positions, on the two sides of the containing hole, of the surface of the supporting disc, the two guide grooves are coaxial and distributed in the two sides of the containing hole, an abutting rod is movably arranged in each guide groove, the ends, away from each other, of the two abutting rods are connected with a telescopic driving mechanism, and the tail ends of the abutting rods are located on the outer side of the containing hole. When the laser diode clamping device is used, the head of a laser diode is placed in the placing hole and can be clamped and fixed by the abutting rod, the abutting rod is placed in the guide groove, so that hands cannot be clamped when the abutting rod reciprocates, and after the laser diode is clamped, the pin of the laser diode is positioned outside, so that wiring and testing are facilitated.

Description

Technical Field

[0001] This utility model relates to the field of laser diode testing technology, specifically a test fixture for laser diode chips with a clamping mechanism. Background Technology

[0002] The laser diode chip is the core component of a laser diode and is commonly referred to as the laser chip. A laser diode chip is a miniaturized device used to generate laser light. It is made of semiconductor materials and features miniaturization, high efficiency, and high precision. When testing a laser diode, simply connect the pins to make it emit light and observe its brightness. If the laser diode's light emission meets the preset requirements, it proves that the chip inside the laser diode meets the requirements; otherwise, the tested laser diode does not meet the requirements.

[0003] Current testing methods involve operators using conductive clips to hold the laser diode's pins and then energizing the mounting frame. However, this method cannot effectively secure the laser diode because of its relatively small size and the wires connected to the conductive clips, making it difficult to maintain a fixed position and observe the luminescence effect. Therefore, we propose a test fixture for laser diode chips with a clamping mechanism. Utility Model Content

[0004] This invention provides a test fixture for laser diode chips with a clamping mechanism, which has the advantage of conveniently clamping and fixing laser diodes, and solves the problems mentioned in the background art.

[0005] The technical solution of this utility model is implemented as follows: A test fixture for laser diode chips with a clamping mechanism includes a base, a test platform horizontally mounted on the top of the base via a support, an opening on the test platform, a light intensity detector mounted below the opening, and a support plate detachably mounted on the top edge of the opening; the support plate has a placement hole coaxial with the opening; the surface of the support plate on both sides of the placement hole is provided with guide grooves, the two guide grooves are coaxial and distributed on both sides of the placement hole, and a stop rod is movably mounted in each guide groove, the ends of the two stop rods that are far apart from each other are respectively connected to a telescopic drive mechanism, and in the initial state, the ends of the stop rods are located outside the placement hole; it also includes a test device connected to the light intensity detector.

[0006] Preferably, the testing device includes a housing located on top of the base, a controller inside the housing, the controller being connected to a light intensity detector, and the controller being connected to operation buttons and an operation screen located on the surface of the housing.

[0007] Preferably, the outer casing surface is also provided with a number of sockets corresponding to the number of pins of the laser diode. The sockets are connected to the controller, and each socket is equipped with a plug that can be plugged in and out. The plug is connected to the conductive clamp through a detection line.

[0008] Preferably, a protective pad is provided at the end of the abutment near the placement hole.

[0009] Preferably, the telescopic drive mechanism includes two telescopic devices, which are symmetrically distributed on both sides of the support plate, and the telescopic direction of the telescopic devices is towards the support plate.

[0010] All telescopic devices are connected to the test bench via mounting bases. Connecting arms are provided on the free ends of the telescopic devices, and the end of the stop rod near the connecting arm is detachably connected to the connecting arm.

[0011] Preferably, the end of the connecting arm away from the support plate is connected to a guide shaft parallel to the telescopic device. The guide shaft is movably placed inside the guide seat, which is mounted on the test bench.

[0012] Preferably, the light intensity detector is detachably connected to the area below the opening.

[0013] Compared with the prior art, in use, the head of the laser diode is placed in the placement hole and can be clamped and fixed by the abutment rod. Since the abutment rod is placed in the guide groove, it will not pinch your hand when it reciprocates. Moreover, when the laser diode is clamped, its pins are located on the outside, which is convenient for wiring and testing. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a schematic diagram of the structure of this utility model.

[0016] Figure 2 This is a structural schematic diagram of part of this utility model.

[0017] Figure 3 This is the front view of the present utility model.

[0018] Figure 4 This is a schematic diagram of the structure of the laser diode of this utility model.

[0019] In the diagram: 1. Base; 2. Support; 3. Telescopic device; 4. Mounting seat; 5. Test platform; 6. Housing; 7. Operation panel; 8. Socket; 9. Detection line; 10. Conductive clamp; 11. Light intensity detector; 12. Guide groove; 13. Placement hole; 14. Support rod; 15. Support plate; 16. Connecting arm; 17. Guide shaft; 18. Guide seat; 19. Opening. Detailed Implementation

[0020] The technical solution of this utility model will be clearly and completely described below with reference to its embodiments. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0021] Reference Figures 1 to 3 This utility model provides a technical solution: a test fixture for laser diode chips with a clamping mechanism, including a base 1 and a test device disposed on the base 1. The test device includes a housing 6 disposed on the top of the base 1. A controller is disposed inside the housing 6. The controller is a PCB control board. The controller is connected to operation buttons and an operation screen 7 disposed on the surface of the housing 6. The operation buttons include start and stop buttons and buttons for controlling the test device to start and stop testing, etc.

[0022] Furthermore, the surface of the outer casing 6 is also provided with sockets 8, the number of which corresponds to the number of leads of the laser diode, such as... Figure 4 As shown, the existing laser diode has three pins, so the number of sockets 8 can be three. The sockets 8 are connected to the controller respectively. Each socket 8 has a plug that can be plugged in and out. The plug is connected to the conductive clip 10 through the detection line 9. In order to distinguish the detection line 9, the detection line 9 and the socket 8 can be designed to be different colors, so that it is easy to distinguish the detection line 9 corresponding to the socket 8.

[0023] Furthermore, a test platform 5 is horizontally provided on the top of the base 1 via a support 2. The test platform 5 has an opening 19, which is a circular hole. A light intensity detector 11 is installed below the opening 19. The light intensity detector 11 is connected to the test device, specifically by connecting the controller to the light intensity detector 11. The light intensity detector 11 is detachably connected to the lower part of the opening 19, specifically by threading, snapping, or snapping the light intensity detector 11 to the lower part of the opening 19, which facilitates the disassembly of the light intensity detector 11.

[0024] like Figure 1 and Figure 2As shown, a support plate 15 is detachably provided on the top edge of the opening 19, that is, the edge of the support plate 15 is fastened to the edge of the opening 19 by bolts. The support plate 15 is provided with a placement hole 13 coaxial with the opening 19. The surface of the support plate 15 on both sides of the placement hole 13 is provided with guide grooves 12. The two guide grooves 12 are coaxial and distributed on both sides of the placement hole 13. A stop rod 14 is movably provided in each guide groove 12. The ends of the two stop rods 14 that are far apart from each other are respectively connected to the telescopic drive mechanism. In the initial state, the end of the stop rod 14 is located outside the placement hole 13.

[0025] The specific testing process is as follows: because each laser diode contains an excitation chip, if the laser diode's light emission requirement meets the preset standard, then the chip inside the laser diode meets the requirements. In actual use, the operator can hold the pin and place the head of the laser diode into the placement hole 13. It should be emphasized that the size of the placement hole 13 matches the head of the laser diode. When the head is placed into the placement hole 13, the push rod 14 extends into the placement hole 13 under the action of the telescopic drive mechanism, so that the head of the laser diode is clamped by the push rods 14 on both sides. In order to protect the laser diode, protective pads are specially provided on the end of the push rod 14 near the placement hole 13.

[0026] Once the laser diode is clamped and fixed, its three pins will be exposed above the support plate 15. At this point, the conductive clamp 10 can be held and clamped onto each pin. The circuit is then activated via the operation buttons, causing the diode to emit light. The intensity of the emitted light is detected by the light intensity detector 11. Whether the light intensity meets or does not meet the requirements, the operation screen 7 will flash a warning. After one laser diode has been tested, the telescopic drive mechanism can be controlled to retract the stop rod 14, removing the diode and replacing it with another for further testing.

[0027] The structure of the telescopic drive mechanism is described in detail below, such as... Figure 2 As shown, the telescopic drive mechanism includes telescopic devices 3, which can be cylinders, electric cylinders, electric push rods, etc. During installation, two telescopic devices 3 are symmetrically distributed on both sides of the support plate 15, and the telescopic directions of the telescopic devices 3 are all facing the support plate 15. The telescopic devices 3 are all connected to the test bench 5 through mounting bases 4. Connecting arms 16 are provided on the free ends of the telescopic devices 3. The end of the abutment rod 14 near the connecting arm 16 is detachably connected to the connecting arm 16. Specifically, the end of the abutment rod 14 near the connecting arm 16 is L-shaped, and the L-shaped part is installed on the connecting arm 16 with bolts.

[0028] To make the reciprocating motion of the abutment rod 14 more stable, a guide shaft 17 parallel to the telescopic device 3 is connected to the end of the connecting arm 16 away from the support plate 15. The guide shaft 17 is movably placed inside the guide seat 18, which is installed on the test bench 5.

[0029] Based on the above embodiments, it should be further noted that the combined depth of the opening 19 and the placement hole 13 cannot exceed the total length of the diode. This is to prevent the diode from being trapped inside the opening 19 and placement hole 13 after the retaining rod 14 is released. However, this possibility is almost non-existent because the conductive clip 10 is connected to the pin at this time, so the diode is fixed and will not fall.

[0030] Based on the above embodiments, it should be further noted that the surface height of the abutment 14 does not exceed the depth of the guide groove 12, so as to avoid the abutment 14 protruding and getting caught in the hand.

[0031] Based on the above embodiments, it should be further explained that the support plate 15 and the abutment 14 are a combination, which forms a diode clamping mechanism. Furthermore, there are multiple combinations of support plate 15 and abutment 14 to accommodate the testing of diodes of different sizes. To test diodes of different sizes, the original support plate 15 and abutment 14 can be disassembled and replaced with another set of support plate 15 and abutment 14.

[0032] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A test fixture for laser diode chips with a clamping mechanism, comprising a base (1), characterized in that, The base (1) has a test platform (5) horizontally mounted on the top via a support (2). The test platform (5) has an opening (19). A light intensity detector (11) is installed below the opening (19). A support plate (15) is detachably mounted on the top edge of the opening (19). The support plate (15) is provided with a placement hole (13) coaxial with the opening (19); The surfaces of the support plates (15) on both sides of the placement hole (13) are provided with guide grooves (12). The two guide grooves (12) are coaxial and distributed on both sides of the placement hole (13). A stop rod (14) is movably installed in each guide groove (12). The ends of the two stop rods (14) that are far apart from each other are respectively connected to the telescopic drive mechanism. In the initial state, the ends of the stop rods (14) are located outside the placement hole (13); and, It also includes a test device connected to the light intensity detector (11).

2. The test fixture for laser diode chips with a clamping mechanism as described in claim 1, characterized in that, The testing device includes a housing (6) set on top of the base (1), a controller is provided inside the housing (6), the controller is connected to the light intensity detector (11), and the controller is connected to the operation buttons and operation screen (7) set on the surface of the housing (6).

3. The test fixture for laser diode chips with a clamping mechanism as described in claim 2, characterized in that, The outer casing (6) is also provided with sockets (8) corresponding to the number of pins of the laser diode. The sockets (8) are connected to the controller respectively. Each socket (8) is equipped with a plug, which is connected to the conductive clip (10) through the detection line (9).

4. The test fixture for laser diode chips with a clamping mechanism as described in claim 1, characterized in that, The end of the abutment (14) near the placement hole (13) is provided with a protective pad.

5. The test fixture for laser diode chips with a clamping mechanism as described in any one of claims 1-4, characterized in that, The telescopic drive mechanism includes telescopic devices (3), with two telescopic devices (3) symmetrically distributed on both sides of the support plate (15), and the telescopic direction of the telescopic devices (3) is towards the support plate (15). The telescopic devices (3) are all connected to the test bench (5) through the mounting base (4). A connecting arm (16) is provided on the free end of the telescopic device (3). The end of the abutment (14) near the connecting arm (16) is detachably connected to the connecting arm (16).

6. The test fixture for laser diode chips with a clamping mechanism as described in claim 5, characterized in that, The end of the connecting arm (16) away from the support plate (15) is connected to a guide shaft (17) parallel to the telescopic device (3). The guide shaft (17) is movably placed inside the guide seat (18), which is mounted on the test bench (5).

7. The test fixture for a laser diode chip with a clamping mechanism as described in claim 1, characterized in that, The light intensity detector (11) is detachably connected to the lower part of the opening (19).

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