Three-port thin film device test fixture
By designing a three-port thin-film device test fixture, a clamping adjustment mechanism and a lifting mechanism are used to achieve reliable clamping and position adjustment of the thin-film device, which solves the problem of low testing efficiency in the existing technology and improves testing efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CHENGDU GUOQIANG YUXING ELECTRONIC TECH CO LTD
- Filing Date
- 2025-05-08
- Publication Date
- 2026-04-24
AI Technical Summary
The lack of efficient three-port thin-film device test fixtures in the existing technology leads to low testing efficiency.
A three-port thin-film device test fixture was designed, including a lower support base plate, a side support plate, a lateral clamping adjustment mechanism, a front and rear adjustment mechanism, a microstrip test base assembly, and a connector test base assembly. The lifting mechanism and the clamping adjustment mechanism enable reliable clamping and position adjustment of the thin-film device.
It achieves reliable clamping and position adjustment of three-port thin-film devices, improves testing efficiency, and has a simple structure and reliable adjustment.
Smart Images
Figure CN224163710U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of three-port thin-film device testing technology, and in particular to a three-port thin-film device testing fixture. Background Technology
[0002] This technology primarily targets high-frequency testing of bare semiconductor chips such as amplifiers, filters, switches, attenuators, and loads, as well as other microwave devices, components, and modules based on ceramic substrates, silicon substrates, gallium arsenide, gallium nitride, and other materials, using thick-film, thin-film, and semiconductor processes. However, current technologies lack corresponding test clamping equipment, requiring the devices to be soldered onto dedicated test substrates, resulting in low testing efficiency.
[0003] Therefore, there is an urgent need to propose a simple and reliable three-port thin-film device test fixture. Utility Model Content
[0004] To address the aforementioned problems, the purpose of this utility model is to provide a three-port thin-film device testing fixture. The technical solution adopted by this utility model is as follows:
[0005] A three-port thin-film device test fixture for clamping thin-film devices includes a lower support base plate, a first side support plate, a second side support plate, and a display assembly disposed on the lower support base plate, a lateral clamping adjustment mechanism disposed between the first and second side support plates, a front-rear adjustment mechanism disposed on the lateral clamping adjustment mechanism, a microstrip test base assembly and a connector test base assembly disposed on the front-rear adjustment mechanism, a lifting mechanism fixed on the lower support base plate and positioned below the microstrip test base assembly and the connector test base assembly, and a test stage disposed on the lifting mechanism and supporting the thin-film device; the lifting mechanism is provided with a first adjustment knob; the microstrip test base assembly is provided with two first connectors; the connector test base assembly is provided with a second connector; the microstrip test base assembly and the connector test base assembly clamp the thin-film device and are electrically connected to the first connectors and the second connector.
[0006] Furthermore, the lateral clamping adjustment mechanism includes two slide rods disposed between the first side support plate and the second side support plate, a first dovetail slide rail and a second dovetail slide rail slidably sleeved on the slide rods, a first horizontal movement adjustment screw assembly with its rear end disposed on the second side support plate and its front end threadedly connected to the first dovetail slide rail, and a second horizontal movement adjustment screw assembly with its rear end disposed on the first side support plate and its front end threadedly connected to the second dovetail slide rail; the front and rear adjustment mechanism is disposed on the first dovetail slide rail and the second dovetail slide rail.
[0007] Furthermore, the front and rear adjustment mechanism includes a first slider that is slidably sleeved on the first dovetail slide rail and for mounting the microstrip test base assembly, and a second slider that is slidably sleeved on the second dovetail slide rail and for mounting the connector test base assembly.
[0008] Furthermore, a front baffle is provided between the first side support plate and the second side support plate; a gate-shaped slot is provided on the front baffle; and the first adjustment knob is placed inside the gate-shaped slot.
[0009] Furthermore, the first horizontal movement adjusting screw assembly and the second horizontal movement adjusting screw assembly have the same structure, and the first horizontal movement adjusting screw assembly includes a bushing disposed on the second side support plate, a screw sleeved inside the bushing and whose front end is threadedly connected to the first dovetail slide rail, a second adjusting knob disposed at the rear end of the screw, and a bushing cover plate covering the second side support plate and fixing the bushing on the second side support plate.
[0010] Compared with the prior art, the present invention has the following beneficial effects:
[0011] (1) This utility model has a simple structure and reliable mounting by setting up a lifting mechanism and a test platform, mounting the thin film device to be tested, and clamping it between the microstrip test base assembly and the connector test base assembly.
[0012] (2) By setting a lateral clamping adjustment mechanism and a front and rear adjustment mechanism, the lateral position of the microstrip test base assembly and the connector test base assembly can be adjusted by rotating the first horizontal moving adjustment screw assembly and the second horizontal moving adjustment screw assembly. The microstrip test base assembly and the connector test base assembly slide along the first dovetail slide rail and the second dovetail slide rail, ensuring that the position adjustment of the microstrip test base assembly and the connector test base assembly is reliable.
[0013] In summary, this invention has the advantages of simple structure and reliable adjustment, and has high practical and promotional value in the field of three-port thin-film device testing technology. Attached Figure Description
[0014] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope of protection. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.
[0015] Figure 1 This is a schematic diagram of the structure of this utility model.
[0016] Figure 2 This is a schematic diagram of the blasting process of this utility model.
[0017] Figure 3 This is a schematic diagram of the structure of the present invention with the display component removed.
[0018] Figure 4 This is a schematic diagram of the structure of the present invention, which removes the microstrip test base assembly and the connector test base assembly.
[0019] Figure 5 This is a schematic diagram of the installation of the lifting mechanism and the test platform in this utility model.
[0020] In the above figures, the component names corresponding to the reference numerals are as follows:
[0021] 1. Lower support base plate; 2. First side support plate; 3. Second side support plate; 4. Front baffle; 5. Lifting mechanism; 6. Slide rod; 7. First dovetail slide rail; 8. Second dovetail slide rail; 9. First horizontal movement adjusting screw assembly; 10. Second horizontal movement adjusting screw assembly; 11. First slider; 12. Second slider; 13. Microstrip test base assembly; 14. Connector test base assembly; 15. Display assembly; 16. Test stage; 41. Gate-shaped slot; 51. First adjusting knob; 91. Bushing; 92. Screw; 93. Second adjusting knob; 94. Bushing cover plate. Detailed Implementation
[0022] To make the objectives, technical solutions, and advantages of this application clearer, the present invention will be further described below with reference to the accompanying drawings and embodiments. The embodiments of this utility model include, but are not limited to, the following embodiments. All other embodiments obtained by those skilled in the art based on the embodiments in this application without inventive effort are within the scope of protection of this application.
[0023] Example
[0024] In this embodiment, the term "and / or" is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can represent three situations: A exists alone, A and B exist simultaneously, and B exists alone.
[0025] The terms "first" and "second," etc., used in the specification and claims of this embodiment are used to distinguish different objects, not to describe a specific order of objects. For example, "first target object" and "second target object," etc., are used to distinguish different target objects, not to describe a specific order of target objects.
[0026] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.
[0027] In the description of the embodiments in this application, unless otherwise stated, "multiple" means two or more. For example, multiple processing units means two or more processing units; multiple systems means two or more systems.
[0028] like Figures 1 to 5 As shown, this embodiment provides a three-port thin-film device test fixture for clamping thin-film devices.
[0029] Here, the three-port thin-film device test fixture includes a lower support base plate 1, a first side support plate 2, a second side support plate 3, and a display assembly 15 disposed on the lower support base plate 1, a lateral clamping adjustment mechanism disposed between the first side support plate 2 and the second side support plate 3, a front baffle 4 disposed between the first side support plate 2 and the second side support plate 3, a front and rear adjustment mechanism disposed on the lateral clamping adjustment mechanism, a microstrip test base assembly 13 and a connector test base assembly 14 disposed on the front and rear adjustment mechanism, a lifting mechanism 5 fixed on the lower support base plate 1 and located below the microstrip test base assembly 13 and the connector test base assembly 14, and a test stage 16 disposed on the lifting mechanism 5 and carrying the thin-film device. A first adjustment knob 51 is disposed on the lifting mechanism 5, and a gate-shaped slot 41 is disposed on the front baffle 4, with the first adjustment knob 51 placed within the gate-shaped slot 41.
[0030] In this embodiment, two first connectors are provided on the microstrip test base assembly 13, and the first connectors are connected to the two ports of the thin-film device via microstrip. Additionally, a second connector is provided on the connector test base assembly 14. Here, the microstrip test base assembly 13 and the connector test base assembly 14 clamp the thin-film device and are electrically connected to the first connector and the second connector, respectively.
[0031] This embodiment utilizes a lateral clamping adjustment mechanism and a front-to-back adjustment mechanism to provide lateral adjustment and front-to-back movement for the microstrip test base assembly 13 and the connector test base assembly 14, facilitating the clamping of thin-film devices on the test stage 16. Here, the lateral clamping adjustment mechanism includes two slide rods 6 disposed between the first side support plate 2 and the second side support plate 3, a first dovetail slide rail 7 and a second dovetail slide rail 8 slidably sleeved on the slide rods 6, a first horizontal movement adjustment screw assembly 9 with its rear end disposed on the second side support plate 3 and its front end threadedly connected to the first dovetail slide rail 7, and a second horizontal movement adjustment screw assembly 10 with its rear end disposed on the first side support plate 2 and its front end threadedly connected to the second dovetail slide rail 8. Additionally, the front-to-back adjustment mechanism includes a first slider 11 slidably sleeved on the first dovetail slide rail 7 and used to mount the microstrip test base assembly 13, and a second slider 12 slidably sleeved on the second dovetail slide rail 8 and used to mount the connector test base assembly 14. In this embodiment, the front and rear positions of the microstrip test base assembly 13 and the connector test base assembly 14 are adjusted by sliding the first slider 11 and the second slider 12. When the front and rear positions correspond to the positions of the thin film devices, the first horizontal movement adjustment screw assembly 9 and the second horizontal movement adjustment screw assembly 10 can be rotated to clamp them.
[0032] Here, the first horizontal movement adjusting screw assembly 9 and the second horizontal movement adjusting screw assembly 10 have the same structure. Taking the first horizontal movement adjusting screw assembly 9 as an example, it includes a bushing 91 disposed on the second side support plate 3, a screw 92 sleeved inside the bushing 91 and whose front end is threadedly connected to the first dovetail slide rail 7, a second adjusting knob 93 disposed at the rear end of the screw 92, and a bushing cover plate 94 covering the second side support plate 3 and fixing the bushing 91 to the second side support plate 3. Here, the rear end of the screw 92 is rotatably limited inside the bushing 91, and rotating the second adjusting knob 93 causes the first dovetail slide rail 7 to slide along the slide rod 6.
[0033] The above embodiments are merely preferred embodiments of this utility model and are not intended to limit the scope of protection of this utility model. Any changes made based on the design principles of this utility model, or any non-creative changes made on this basis, shall fall within the scope of protection of this utility model.
Claims
1. A three-port thin-film device testing fixture for holding thin-film devices, characterized in that, Includes a lower support base plate (1), a first side support plate (2), a second side support plate (3), and a display assembly (15) disposed on the lower support base plate (1), a lateral clamping adjustment mechanism disposed between the first side support plate (2) and the second side support plate (3), a front and rear adjustment mechanism disposed on the lateral clamping adjustment mechanism, a microstrip test base assembly (13) and a connector test base assembly (14) disposed on the front and rear adjustment mechanism, and fixed on the lower support base plate (1) and placed on the microstrip test base assembly (13) and the connector test base assembly (14). The lower part of the stage assembly (14) has a lifting mechanism (5), which is set on the lifting mechanism (5) and carries the test stage (16) of the thin film device; the lifting mechanism (5) is provided with a first adjustment knob (51); the microstrip test base assembly (13) is provided with two first connectors; the connector test base assembly (14) is provided with a second connector; the microstrip test base assembly (13) and the connector test base assembly (14) clamp the thin film device and are electrically connected to the first connector and the second connector.
2. A three-port thin film device test fixture according to claim 1, wherein, The lateral clamping adjustment mechanism includes two slide rods (6) disposed between the first side support plate (2) and the second side support plate (3), a first dovetail slide rail (7) and a second dovetail slide rail (8) slidably sleeved on the slide rods (6), a first horizontal movement adjustment screw assembly (9) with its rear end disposed on the second side support plate (3) and its front end threadedly connected to the first dovetail slide rail (7), and a second horizontal movement adjustment screw assembly (10) with its rear end disposed on the first side support plate (2) and its front end threadedly connected to the second dovetail slide rail (8); the front and rear adjustment mechanism is disposed on the first dovetail slide rail (7) and the second dovetail slide rail (8).
3. A three-port thin film device test fixture according to claim 2, wherein, The front and rear adjustment mechanism includes a first slider (11) that is slidably sleeved on the first dovetail slide rail (7) and used to install the microstrip test base assembly (13), and a second slider (12) that is slidably sleeved on the second dovetail slide rail (8) and used to install the connector test base assembly (14).
4. A three-port thin film device test fixture according to claim 1 or 2 or 3, wherein, A front baffle (4) is provided between the first side support plate (2) and the second side support plate (3); a gate-shaped slot (41) is provided on the front baffle (4); the first adjustment knob (51) is placed in the gate-shaped slot (41).
5. A three-port thin film device test fixture according to claim 2 or 3, wherein, The first horizontal movement adjusting screw assembly (9) and the second horizontal movement adjusting screw assembly (10) have the same structure. The first horizontal movement adjusting screw assembly (9) includes a bushing (91) set on the second side support plate (3), a screw (92) sleeved in the bushing (91) and whose front end is threadedly connected to the first dovetail slide rail (7), a second adjusting knob (93) set at the rear end of the screw (92), and a bushing cover plate (94) covering the second side support plate (3) and fixing the bushing (91) on the second side support plate (3).