Chip test probe device

Abstract

The utility model discloses a chip test probe device, and relates to the chip test equipment field, the chip test probe device comprises a test bench, a transmission band, a test assembly and a support rod, the transmission band is embedded in the center of the upper part of the test bench, the upper surface of the transmission band is provided with positioning holes in a recessed manner, and the positioning holes are arranged at intervals along the surface of the transmission band; two groups of supporting rods are symmetrically arranged on the upper surface of the test board, and a movable test assembly is mounted between the two groups of supporting rods; the testing assembly comprises a top plate, a driving rod and a bearing plate, the upper surface of the bearing plate is connected with the driving rod, and a detection probe is installed on the bottom end face of the bearing plate and corresponds to the positioning hole. According to the utility model, through the arrangement of the transmission belt, the chip is installed at the position of the positioning hole during detection, the transmission belt transmits the chip, the detection probe and the chip do not shift left and right, the detection probe is rotated only according to the detection point on the chip, and the adjustment range of the detection probe during chip detection is effectively reduced.

Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment, specifically a chip testing probe device. Background Technology

[0002] Chip testing refers to a series of physical and electrical tests conducted after chip manufacturing to ensure that the chip's functionality and performance meet design specifications, while also identifying and eliminating any potential defects or problems. The main purpose of chip testing is to verify the chip's functionality, performance, and reliability, ensuring that the chip can function properly in practical applications. Specifically, testing can help identify problems in the chip design or manufacturing process so that they can be repaired and improved in a timely manner.

[0003] During chip testing, probes are required. The chip is placed on the worktable, and then a driving structure is used to bring the probes close to the chip. However, the probes and the chip are often misaligned and need to be adjusted in time. During the adjustment process, the probes need to be constantly adjusted according to the position of the chip, resulting in low testing efficiency. Therefore, the inventors have proposed a chip testing probe device. Utility Model Content

[0004] Based on this, the purpose of this utility model is to provide a chip testing probe device to solve the technical problem of insufficient convenience for patients with leg and foot difficulties in general medical and nursing electric wheelchairs.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a chip testing probe device, comprising a test stage, a conveyor belt, a testing component, and support rods. The conveyor belt is embedded in the center of the upper part of the test stage. Positioning holes are recessed on the upper surface of the conveyor belt and are spaced apart along the surface of the conveyor belt. Two sets of support rods are symmetrically arranged on the upper surface of the test stage, and a movable testing component is installed between the two sets of support rods. The testing component includes a top plate, a drive rod, and a support plate. The upper surface of the support plate is connected to the drive rod, and a detection probe is installed on the bottom surface. The detection probe corresponds to the positioning hole. An illumination lamp is installed on the support plate.

[0006] The present invention is further configured such that the drive rod is arranged vertically, and the top of the drive rod is rotatably connected to the top plate.

[0007] The present invention is further configured such that a drive motor is fixedly installed on the upper surface of the top plate, and the output shaft of the drive motor is connected to the drive rod.

[0008] The present invention is further configured such that each end of the top plate has a protrusion, and the two sets of support rods are respectively provided with vertical lifting grooves on the surface of the top plate for the protrusions to slide through.

[0009] The present invention is further configured such that a rotary motor is fixedly installed on the top of the support rod, and a drive screw is connected to the output shaft of the rotary motor. The drive screw is vertically arranged and rotatably installed in the lifting groove, and the drive screw is threadedly connected to the protrusion.

[0010] The present invention is further configured such that a movable bottom block protrudes from the bottom end face of the support rod.

[0011] The present invention is further configured such that a movable groove is horizontally formed on the upper surface of the test platform, the movable base block is adapted to be installed in the movable groove, and an internal screw rod is rotatably installed inside the movable groove, the internal screw rod threaded through the movable base block.

[0012] In summary, this utility model has the following advantages: Thanks to the conveyor belt, the chip is installed at the positioning hole during testing and transported by the conveyor belt. Once the chip reaches the test component, the conveyor belt stops. Because the chip is positioned by the positioning hole, there is no left-right displacement between the test probe and the chip. The test probe only needs to be rotated according to the test point on the chip, effectively reducing the adjustment range of the test probe during chip testing, improving work efficiency, optimizing the operation steps, reducing the adjustment steps of the test probe, and increasing testing efficiency. It is highly practical. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the structure of the present invention in the seated state;

[0014] Figure 2 This is a schematic diagram of the test component structure of this utility model;

[0015] Figure 3 This is a schematic diagram of the support rod structure;

[0016] Figure 4 for Figure 1 Enlarged structural diagram at point A in the middle.

[0017] In the diagram: 1. Test bench; 2. Positioning hole; 3. Test component; 4. Support rod; 5. Conveyor belt; 6. Bearing plate; 7. Lighting lamp; 8. Detection probe; 9. Drive motor; 10. Drive rod; 11. Top plate; 13. Lifting groove; 14. Moving base block; 15. Rotary motor; 16. Drive screw; 17. Moving groove. Detailed Implementation

[0018] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0019] A chip test probe device, such as Figure 1-4 As shown, the test includes a test platform 1, a conveyor belt 5, a test component 3, and support rods 4. The conveyor belt 5 is embedded in the center of the top of the test platform 1. Positioning holes 2 are recessed on the upper surface of the conveyor belt 5 and are arranged at intervals along the surface of the conveyor belt 5. Two sets of support rods 4 are symmetrically arranged on the upper surface of the test platform 1, and a movable test component 3 is installed between the two sets of support rods 4.

[0020] The test assembly 3 includes a top plate 11, a drive rod 10, and a support plate 6. The upper surface of the support plate 6 is connected to the drive rod 10, and a detection probe 8 is installed on the bottom surface. The detection probe 8 corresponds to the positioning hole 2. An illumination lamp 7 is installed on the support plate 6. The drive rod 10 is vertically arranged, and the top of the drive rod 10 is rotatably connected to the top plate 11.

[0021] A drive motor 9 is fixedly mounted on the upper surface of the top plate 11, and the output shaft of the drive motor 9 is connected to the drive rod 10. Each end of the top plate 11 has a protrusion, and two sets of support rods 4 have vertically opening lifting grooves 13 on their surfaces facing the top plate 11 for the protrusions to slide through. A rotary motor 15 is fixedly mounted on the top of the support rods 4, and a drive screw 16 is connected to the output shaft of the rotary motor 15. The drive screw 16 is vertically positioned and rotatably mounted within the lifting groove 13, and is threadedly connected to the protrusion.

[0022] The bottom end face of the support rod 4 has a protruding movable base block 14.

[0023] The upper surface of the test bench 1 is horizontally provided with a movable groove 17. The movable base block 14 is adapted to the movable groove 17 and is installed. An internal screw is rotatably installed inside the movable groove 17, and the internal screw thread passes through the movable base block 14.

[0024] The working principle of this utility model is as follows: In use, the chip is first placed in the positioning hole 2, and the chip is transported by the conveyor belt 5. When the chip is transported to the test component 3, the conveyor belt 5 stops. The conveyor belt 5 works in the same way as the assembly line in the prior art. The rotary motor 15 starts and drives the drive screw 16 to rotate. After the drive screw 16 rotates, the top plate 11 is subjected to force and slides down along the support rod 4, which drives the detection probe 8 to descend. The detection probe 8 gradually approaches the chip. Since the chip is limited by the positioning hole 2, there will be no left or right position offset between the detection probe 8 and the chip. The detection probe 8 can be rotated only according to the detection point on the chip, which effectively saves the adjustment range of the detection probe 8 during chip detection and improves work efficiency. When the detection probe 8 approaches the chip, the lighting lamp 7 is turned on to assist in docking. The drive motor 9 starts and drives the drive rod 10 to rotate. The drive rod 10 drives the carrier plate 6 to rotate, and then the detection probe 8 is subjected to force and rotates. After aligning with the detection point on the upper surface of the chip, the top plate 11 continues to move down so that the detection probe 8 contacts the chip. It is highly practical.

[0025] The detection probe 8 is a key component in the existing technology that connects the tester and the chip, and is used to realize signal transmission to detect the chip's performance indicators such as continuity, current, function and aging.

[0026] After the test is completed, the test probe 8 is raised, and then the conveyor belt 5 continues to move.

[0027] Although embodiments of the present invention have been shown and described, these specific embodiments are merely explanations of the present invention and are not intended to limit the invention. The specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. After reading this specification, those skilled in the art may make modifications, substitutions, and variations to the embodiments as needed without departing from the principles and spirit of the present invention, provided that such modifications, substitutions, and variations are within the scope of the claims of the present invention and are protected by patent law.

Claims

1. A chip test probe device, comprising a test stage (1), a conveyor belt (5), a test assembly (3), and a support rod (4), characterized in that: A conveyor belt (5) is embedded in the center of the upper part of the test platform (1). The upper surface of the conveyor belt (5) is recessed and has positioning holes (2). The positioning holes (2) are arranged at intervals along the surface of the conveyor belt (5). The support rods (4) are symmetrically arranged in two sets on the upper surface of the test platform (1), and a movable test component (3) is installed between the two sets of support rods (4); The test assembly (3) includes a top plate (11), a drive rod (10) and a support plate (6). The upper surface of the support plate (6) is connected to the drive rod (10), and a detection probe (8) is installed on the bottom surface. The detection probe (8) corresponds to the positioning hole (2). A lighting lamp (7) is installed on the support plate (6).

2. The chip test probe device according to claim 1, characterized in that: The drive rod (10) is vertically arranged, and the top of the drive rod (10) is rotatably connected to the top plate (11).

3. The chip test probe device according to claim 2, characterized in that: A drive motor (9) is fixedly installed on the upper surface of the top plate (11), and the output shaft of the drive motor (9) is connected to the drive rod (10).

4. The chip test probe device according to claim 3, characterized in that: The top plate (11) has protrusions at both ends, and the two sets of support rods (4) have vertically opened lifting grooves (13) on the surface facing the top plate (11) for the protrusions to slide through.

5. A chip test probe device according to claim 4, characterized in that: A rotary motor (15) is fixedly installed on the top of the support rod (4). A drive screw (16) is connected to the output shaft of the rotary motor (15). The drive screw (16) is vertically arranged and rotatably installed in the lifting groove (13). The drive screw (16) is threadedly connected to the protrusion.

6. The chip test probe device according to claim 1, characterized in that: The bottom end face of the support rod (4) is provided with a movable bottom block (14).

7. A chip test probe device according to claim 6, characterized in that: The upper surface of the test bench (1) is provided with a horizontal moving groove (17). The moving base block (14) is adapted to the moving groove (17). An internal screw is rotatably installed inside the moving groove (17), and the internal screw thread passes through the moving base block (14).

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