PD protocol chip detecting and sorting device

Abstract

The utility model relates to the technical field of chip detection, in particular to a PD protocol chip detecting and sorting device. Comprising a workbench, a charging tray, a first jig, a second jig, a third jig, a detection device, a first manipulator, a second manipulator and a first driving part, the first manipulator transfers an external chip in the charging tray to the first jig; the detection device is used for detecting the external chip in the first jig; the second manipulator transfers the external chip in the first jig to the second jig or the third jig; the first driving piece drives the first jig material disc to move; the first jig comprises a movable plate, a constant-temperature plate and a material carrying disc which are sequentially arranged from bottom to top. The first driving piece drives the movable plate to move back and forth between the material disc and the first jig. The first jig composed of the movable plate, the constant temperature plate and the material carrying disc is arranged, the constant temperature plate controls the working state temperature of the material carrying disc, the stability and authenticity of an external chip detection result are ensured, and the controllability of production quality is improved.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a PD protocol chip testing and sorting device. Background Technology

[0002] After the electronic chips are manufactured, they enter the testing process to screen out qualified and unqualified chips. In the existing testing process and results, it has been found that the test results are biased due to the difference between the processing environment and the testing environment, which affects the pass rate, increases the processing cost, and cannot meet the production requirements. Therefore, it is necessary to improve the testing equipment. Summary of the Invention

[0003] In order to overcome the problem that the detection device affects the detection results in the existing technology, the purpose of this utility model is to provide a PD protocol chip detection and sorting device.

[0004] To achieve the above objectives, the technical solution of this utility model is as follows:

[0005] A PD protocol chip detection and sorting device includes a worktable, a tray, a first fixture, a second fixture and a third fixture, a detection device, a first robotic arm, a second robotic arm and a first driving component;

[0006] The material tray, the first fixture, the second fixture, and the third fixture are arranged sequentially along the length of the worktable;

[0007] The tray is used to hold external chips that need to be inspected.

[0008] The first robotic arm is positioned on the worktable and transfers the external chips in the tray to the first fixture;

[0009] The detection device is located on the workbench and detects the external chip inside the first fixture;

[0010] The second robotic arm is slidably connected to the worktable and transfers the external chip inside the first fixture to the second or third fixture;

[0011] The first driving component drives the first fixture to move back and forth directly between the material tray and the second fixture;

[0012] The first fixture includes a movable plate, a constant temperature plate, and a material tray arranged sequentially from bottom to top. The first driving member drives the movable plate to move back and forth between the material tray and the first fixture. The detection device is located above the material tray.

[0013] Furthermore, the constant temperature plate is provided with a number of heating strips, and the material tray is provided with a number of grooves, with one heating strip embedded in one groove.

[0014] Furthermore, the constant temperature plate and the material tray are provided with buffer pads.

[0015] Furthermore, the material tray is provided with a middle partition, which divides the material tray into an upper cavity and a lower cavity, and the groove is provided in the lower cavity.

[0016] Furthermore, the constant temperature plate is also provided with several protrusions, which are located on the outer surface of the heating strip and extend in a direction away from the heating strip.

[0017] Furthermore, the first fixture also includes a heat insulation layer, which is connected to the constant temperature plate and close to the movable plate.

[0018] Furthermore, the PD protocol chip detection and sorting device also includes a second driving component and a guide rail. The guide rail is disposed on the worktable, and the second driving component is disposed on the worktable and drives the second robotic arm to slide along the guide rail.

[0019] The beneficial effects of this utility model are as follows: by setting up a first fixture consisting of a movable plate, a constant temperature plate and a material tray, the constant temperature plate controls the working temperature of the material tray, ensuring the stability and authenticity of the external chip detection results, and improving the controllability of production quality. Attached Figure Description

[0020] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0021] Figure 2 This is a schematic diagram of the elevation structure of the first fixture of this utility model;

[0022] Figure 3 for Figure 2 An enlarged schematic diagram of part A in the middle.

[0023] The reference numerals in the figures include:

[0024] 10—Workbench 21—Material tray 22—First jig

[0025] 221—Moving plate; 222—Constant temperature plate; 223—Material tray

[0026] 224—Buffer pad; 225—Insulation layer; 2201—Heating strip

[0027] 2202—Groove; 2203—Partition plate; 2204—Protrusion

[0028] 23—Second fixture 24—Third fixture 31—Detection device

[0029] 41—First robotic arm; 42—Second robotic arm; 51—First drive unit

[0030] 52—Second driving component; 53—Guide rail. Detailed Implementation

[0031] To facilitate understanding by those skilled in the art, the present invention will be further described below with reference to embodiments and accompanying drawings. The content mentioned in the embodiments is not intended to limit the present invention.

[0032] Please see Figures 1 to 3 The present invention provides a PD protocol chip detection and sorting device, comprising a worktable 10, a material tray 21, a first fixture 22, a second fixture 23 and a third fixture 24, a detection device 31, a first robotic arm 41, a second robotic arm 42 and a first driving component 51.

[0033] The material tray 21, the first fixture 22, the second fixture 23 and the third fixture 24 are arranged sequentially along the length of the worktable 10;

[0034] The tray 21 is used to place external chips to be inspected;

[0035] The first robotic arm 41 is mounted on the worktable 1 and transfers the external chips in the tray 21 to the first fixture 22;

[0036] The detection device 31 is mounted on the workbench 1 and detects the external chip inside the first fixture 22;

[0037] The second robotic arm 42 is slidably connected to the worktable 10 and transfers the external chip in the first fixture 3 to the second fixture 23 or the third fixture 24;

[0038] The first driving component 51 drives the first fixture 22 to move directly back and forth between the material tray 21 and the second fixture 23;

[0039] The first fixture 22 includes a movable plate 221, a constant temperature plate 222 and a material tray 223 arranged sequentially from bottom to top. The first driving member 51 drives the movable plate 221 to move back and forth between the material tray 21 and the first fixture 22. The detection device 31 is located above the material tray 223.

[0040] Specifically, in this embodiment, the material tray 21, the first fixture 22, the second fixture 23, and the third fixture 24 are arranged in a straight line. The detection device 31 and the first robotic arm 41 are located on both sides of the width direction of the first fixture 22. The first robotic arm 41 includes a column and a first vacuum suction cup rotatably connected to the column. Preferably, the first fixture 22 includes a movable plate 221, a constant temperature plate 222, and a material tray 223. The constant temperature plate 222 is disposed between the movable plate 221 and the material tray 223. The temperature of the constant temperature plate 222 is controlled by an external controller so that the temperature of the material tray 223 reaches a preset temperature, that is, the chip to be tested is within the preset temperature range. To ensure the accuracy of the test results, the testing device 31 is preferably stationary. The first driving component 51 drives the movable plate 221 to move back and forth in the horizontal direction, so that the constant temperature plate 222 and the material tray 223 move synchronously. The first vacuum suction cup transfers the chip to be tested in the material tray 21 to the material tray 223. The first driving component 51 drives the movable plate 221 to move, so that the chip to be tested in the material tray 223 passes through the testing device 31 one by one. The second robot arm 42 transfers the qualified chips after testing to the second fixture 23 and the unqualified chips to the third fixture 24, thus completing the chip testing and sorting.

[0041] By setting up a first fixture 22 consisting of a movable plate 221, a constant temperature plate 222 and a material tray 223, the constant temperature plate 222 controls the working temperature of the material tray 223, ensuring the stability and authenticity of the external chip detection results and improving the controllability of production quality.

[0042] The constant temperature plate 222 is provided with a plurality of heating strips 2201, and the material carrier 223 is provided with a plurality of grooves 2202. One heating strip 2201 is embedded in one groove 2202. The arrangement of a plurality of heating strips 2201 and a plurality of grooves 2202 ensures the uniformity of temperature within a unit volume. At the same time, the structure of the heating strips 2201 embedded in the grooves 2202 has a heat preservation effect, so that the working temperature of the material carrier 223 tends to be within a constant range, thereby improving the accuracy of the detection results in the chip detection process.

[0043] A buffer pad 224 is provided between the constant temperature plate 222 and the material tray 223. The buffer pad 224 reduces the impact of fluctuations generated by the moving plate 221 during movement on the material tray 223, further ensuring the stability of the chip state in the material tray 223 and improving the stability of the detection quality.

[0044] The material tray 223 is provided with a partition 2203, which divides the material tray 223 into an upper cavity and a lower cavity. The groove 2202 is provided in the lower cavity. The partition 2203 serves to support external chips and concentrate the heat generated by the constant temperature plate 222 in the lower cavity, so that the partition 2203 is kept at a constant temperature, that is, a constant temperature is transferred to the chip to be tested, further ensuring the stability of the test results.

[0045] The constant temperature plate 222 is also provided with a number of protrusions 2204. The protrusions 2204 are provided on the outer surface of the heating strip 2201 and extend in a direction away from the heating strip 2201. Each protrusion 2204 is hemispherical, which increases the heat dissipation surface and improves the heat transfer efficiency.

[0046] The first fixture 22 also includes a heat insulation layer 225, which is connected to the constant temperature plate 222 and close to the movable plate 221 to improve the heat preservation effect.

[0047] The PD protocol chip detection and sorting device also includes a second driving component 52 and a guide rail 53. The guide rail 53 is located on the worktable 10. The second driving component 52 is located on the worktable 10 and drives the second robot arm 42 to slide along the guide rail 53. The length direction of the guide rail 53 is consistent with the arrangement direction of the first fixture 22, the second fixture 23 and the third fixture 24. The second driving component 52 adopts a servo motor drive structure to drive the second robot arm 42 to move along the guide rail 53, and put the detected chip into the second fixture 23 or the third fixture 24 as required, thereby improving the degree of production automation.

[0048] The above description is only a preferred embodiment of this utility model. For those skilled in the art, there will be changes in the specific implementation method and application scope based on the idea of ​​this utility model. The content of this specification should not be construed as a limitation of this utility model.

Claims

1. A PD protocol chip detection and sorting device, characterized in that: It includes a worktable (10), a tray (21), a first fixture (22), a second fixture (23) and a third fixture (24), a detection device (31), a first robotic arm (41), a second robotic arm (42) and a first drive unit (51); The material tray (21), the first fixture (22), the second fixture (23) and the third fixture (24) are arranged sequentially along the length of the workbench (10); The tray (21) is used to place external chips to be inspected; The first robotic arm (41) is located on the worktable (10) and transfers the external chips in the tray (21) to the first fixture (22); The detection device (31) is located on the workbench (10) and detects the external chip inside the first fixture (22); The second robotic arm (42) is slidably connected to the worktable (10) and transfers the external chip in the first fixture (22) to the second fixture (23) or the third fixture (24); The first driving member (51) drives the first fixture (22) to move directly back and forth between the material tray (21) and the second fixture (23); The first fixture (22) includes a movable plate (221), a constant temperature plate (222), and a material tray (223) arranged sequentially from bottom to top. The first driving member (51) drives the movable plate (221) to move back and forth between the material tray (21) and the first fixture (22). The detection device (31) is located above the material tray (223).

2. The PD protocol chip test handler of claim 1, wherein: The constant temperature plate (222) is provided with a number of heating strips (2201), and the material tray (223) is provided with a number of grooves (2202), with one heating strip (2201) embedded in one groove (2202).

3. The PD protocol chip test handler of claim 1, wherein: The constant temperature plate (222) and the material tray (223) are provided with buffer pads (224).

4. The PD protocol chip test handler of claim 2, wherein: The material tray (223) is provided with a middle partition (2203), which divides the material tray (223) into an upper cavity and a lower cavity, and the groove (2202) is provided in the lower cavity.

5. The PD protocol chip test handler apparatus of claim 2, wherein: The constant temperature plate (222) is also provided with a number of protrusions (2204), which are provided on the outer surface of the heating strip (2201) and extend in a direction away from the heating strip (2201).

6. The PD protocol chip test handler apparatus of claim 1, wherein: The first fixture (22) also includes a heat insulation layer (225), which is connected to the constant temperature plate (222) and close to the movable plate (221).

7. The PD protocol chip test handler apparatus of claim 1, wherein: The PD protocol chip detection and sorting device also includes a second driving component (52) and a guide rail (53). The guide rail (53) is located on the worktable (10), and the second driving component (52) is located on the worktable (10) and drives the second robotic arm (42) to slide along the guide rail (53).

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