NFC performance testing equipment

Abstract

This disclosure provides an NFC performance testing device, belonging to the field of NFC performance testing technology. The NFC performance testing device includes a test platform, a moving component, a dot matrix board, an NFC testing component, and an image recognition component. The dot matrix board is fixed to the test platform and has multiple dots arranged in an array. The image recognition component is located above the dot matrix board and is used to identify at least one dot among the multiple dots. The moving component is used to move the terminal device under test (DUT) above the at least one dot identified by the image recognition component. The NFC testing component is fixed to the dot matrix board, and when the DUT is moved above the at least one dot identified by the image recognition component, the NFC testing component performs NFC signal testing on the DUT. Thus, the NFC testing component can test the NFC signal of the DUT at any dot, thereby detecting the NFC performance of the DUT at any dot.

Description

Technical Field

[0001] This disclosure relates to the field of NFC performance testing technology, and in particular to an NFC performance testing device. Background Technology

[0002] NFC (Near Field Communication) is a short-range, high-frequency wireless communication technology. NFC components are integrated into terminal devices (such as mobile phones), enabling data exchange when the terminal device is near another terminal device with an NFC component, such as for mobile payments or access control. To ensure the NFC performance of a terminal device, its NFC performance needs to be tested before it leaves the factory.

[0003] Therefore, it is necessary to design an NFC performance testing device to test the NFC performance of terminal devices. Utility Model Content

[0004] This disclosure provides an NFC performance testing device that can solve the technical problems existing in related technologies. The technical solution of the NFC performance testing device is as follows.

[0005] This disclosure provides an NFC performance testing device, which includes a test bench, a moving component, a dot matrix board, an NFC testing component, and an image recognition component;

[0006] The dot matrix plate is fixed to the test bench, and the dot matrix plate has multiple points arranged in an array.

[0007] The image recognition component is located above the dot matrix panel and is used to identify at least one of the plurality of dots.

[0008] The moving component is used to move the tested terminal device above the at least one point identified by the image recognition component;

[0009] The NFC testing component is fixed to the dot matrix plate. When the terminal device under test is moved above the at least one dot identified by the image recognition component, the NFC testing component is used to perform NFC signal testing on the terminal device under test.

[0010] In one possible implementation, the dot matrix board includes a board body and a fixing structure;

[0011] The fixing structure is connected to the plate, the point is located on the side of the plate facing away from the fixing structure, and the NFC test component is fixed to the fixing structure.

[0012] In one possible implementation, the NFC testing component includes a card reader for receiving NFC signals emitted by the terminal device under test.

[0013] When the card reader is being tested, the card reader is fixed to the side of the fixing structure facing the board, the fixing structure is in contact with the test platform, and the fixing structure is located on the side of the board facing away from the image recognition component.

[0014] In one possible implementation, the fixing structure includes two first support plates and a second support plate;

[0015] The two ends of the second support plate are respectively connected to the two first support plates, and the plate body, the two first support plates and the second support plate form a first receiving groove, which is used to receive the card reader.

[0016] In one possible implementation, the fixing structure further includes two sets of limiting blocks, which are fixed to the plate body;

[0017] Two first support plates are arranged at intervals along a first direction, and two sets of limiting blocks are arranged at intervals along a second direction. The two sidewalls of the card reader perpendicular to the first direction abut against the two first support plates, and the two sidewalls of the card reader perpendicular to the second direction abut against the two sets of limiting blocks. The first direction and the second direction intersect.

[0018] In one possible implementation, the height of the limiting block is less than the height of the first support plate.

[0019] In one possible implementation, the fixing structure further includes a plurality of support columns for supporting the plate, the height of which is greater than the height of the first support plate.

[0020] In one possible implementation, the NFC testing component includes a test card for sending NFC signals to the terminal device under test.

[0021] The test card is fixed to the side of the fixed structure facing or away from the plate.

[0022] In one possible implementation, the fixing structure includes two first support plates and a second support plate;

[0023] The two ends of the second support plate are respectively connected to the two first support plates. The second support plate has a second receiving groove, the opening of the second receiving groove facing away from the plate body. The second receiving groove is used to fix the test card.

[0024] When the test card is being used for testing, the board is in contact with the test platform, and the first support plate and the second support plate are located on the side of the board facing the image recognition component.

[0025] In one possible implementation, the distance between adjacent points is 0.5cm-1.5cm.

[0026] In one possible implementation, the NFC performance testing device includes a plurality of dot matrix boards arranged in parallel, with the NFC testing component fixed to one of the dot matrix boards.

[0027] In one possible implementation, the first sidewall of the dot matrix panel has a snap-fit ​​groove, and the second sidewall of the dot matrix panel has a snap-fit ​​protrusion. The snap-fit ​​groove of each dot matrix panel is connected to the snap-fit ​​protrusion of the adjacent dot matrix panel, wherein the first sidewall and the second sidewall are opposite to each other.

[0028] In one possible implementation, the NFC performance testing device further includes a control component;

[0029] The control component is electrically connected to the moving component and the image recognition component. The control component is used to control the moving component to move above the point recognized by the image recognition component according to the point recognized by the image recognition component.

[0030] The technical solution provided in this disclosure includes at least the following beneficial effects:

[0031] This disclosure provides an NFC performance testing device. When the NFC performance testing device is in operation, a moving component drives the terminal device under test (DUT) to move sequentially along the test points. In this way, the NFC testing component can test the NFC signal of the DUT at any point, thereby detecting the NFC performance of the DUT at that point and accurately determining the NFC signal range of the DUT.

[0032] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0033] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure. In the drawings:

[0034] Figure 1 This is a schematic diagram of an NFC performance testing device in a first test state, as shown in an embodiment of this disclosure;

[0035] Figure 2This is a schematic diagram of the structure of a dot matrix plate shown in an embodiment of this disclosure;

[0036] Figure 3 This is a schematic diagram of the structure of a dot matrix plate shown in an embodiment of this disclosure;

[0037] Figure 4 This is a schematic diagram of the structure of a dot matrix plate shown in an embodiment of this disclosure;

[0038] Figure 5 This is a schematic diagram of a dot matrix board in a first test state, as shown in an embodiment of this disclosure;

[0039] Figure 6 This is a schematic diagram of a dot matrix board in a second test state, as shown in an embodiment of this disclosure;

[0040] Figure 7 This is a schematic diagram of a dot matrix board in a second test state, as shown in an embodiment of this disclosure;

[0041] Figure 8 This is a schematic diagram illustrating the splicing of two dot matrix panels according to an embodiment of this disclosure;

[0042] Figure 9 This is a schematic diagram of an NFC performance testing device comprising two dot matrix boards, as shown in an embodiment of this disclosure.

[0043] Legend:

[0044] 1. Test bench;

[0045] 2. Moving parts;

[0046] 3. Dot matrix plate; 30. Dot position; 3a. First receiving groove; 3b. Second receiving groove; 3c. First side wall; 3d. Second side wall; 31. Plate body; 32. Fixing structure; 321. First support plate; 322. Second support plate; 323. Limiting block; 324. Support column; 301. Snap-fit ​​groove; 302. Snap-fit ​​protrusion;

[0047] 4. NFC testing components; 41. Card reader; 42. Test card;

[0048] 5. Image recognition component;

[0049] 100. Terminal equipment.

[0050] The accompanying drawings have illustrated specific embodiments of this disclosure, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concepts of this disclosure to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0051] To make the objectives, technical solutions, and advantages of this disclosure clearer, the embodiments of this disclosure will be further described in detail below with reference to the accompanying drawings.

[0052] The terminology used in the embodiments of this disclosure is for illustrative purposes only and is not intended to limit the disclosure. Unless otherwise defined, the technical or scientific terms used herein should be understood in their ordinary sense by one of ordinary skill in the art to which this disclosure pertains. The terms “first,” “second,” “third,” and similar terms used in this patent application specification and claims do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Similarly, the terms “a” or “one,” and similar terms do not indicate a quantity limitation, but rather indicate the presence of at least one. The terms “comprising,” “including,” and similar terms mean that the elements or objects preceding “comprising” or “including” encompass the elements or objects listed following “comprising” or “including” and their equivalents, and do not exclude other elements or objects. The terms “connected,” “linked,” and similar terms are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. The terms “upper,” “lower,” “left,” “right,” etc., are used only to indicate relative positional relationships, and these relative positional relationships may change accordingly when the absolute position of the described object changes.

[0053] In view of the above-mentioned technical problems, embodiments of this disclosure provide an NFC performance testing device, such as... Figure 1 and Figure 2 As shown, the NFC performance testing equipment includes a test platform 1, a moving component 2, a dot matrix board 3, an NFC testing component 4, and an image recognition component 5. The dot matrix board 3 is fixed to the test platform 1 and has multiple dots 30 arranged in an array. The image recognition component 5 is located above the dot matrix board 3 and is used to identify at least one dot 30 among the multiple dots 30. The moving component 2 is used to move the terminal device under test 100 above the at least one dot 30 identified by the image recognition component 5. The NFC testing component 4 is fixed to the dot matrix board 3, and when the terminal device under test 100 is moved above the at least one dot 30 identified by the image recognition component 5, the NFC testing component 4 performs NFC signal testing on the terminal device under test 100.

[0054] In this embodiment, the moving component 2 can be a robotic arm. The moving component 2 can move vertically or horizontally along the test platform 1, and can also rotate. This disclosure does not specifically limit the method by which the moving component 2 moves the terminal device under test 100. The side of the moving component 2 facing the dot matrix plate 3 may have a receiving groove, in which the terminal device under test 100 can be placed. When the moving component 2 moves, the terminal device under test 100 can move accordingly. In optional embodiments, the moving component 2 can be other structures capable of movement.

[0055] The tested terminal device 100 can be an electronic product with NFC function, such as a watch, bracelet, mobile phone or tablet.

[0056] Image recognition component 5 can be a camera, which can be integrated into moving component 2. Moving component 2 can move sequentially along the points 30 identified by image recognition component 5 (the movement path can be as follows). Figure 3 (As shown).

[0057] The dot matrix plate 3 can be fixed to the test platform 1 by adhesive. Multiple dots 30 are arranged in a matrix. The center of the dot matrix plate 3 can have a positioning hole. The diameter of the positioning hole is larger than the diameter of the dot 30. The positioning hole can be used to position the card reader 41.

[0058] The technical solution provided in this embodiment of the invention involves a moving component 2 that drives the terminal device under test 100 to move sequentially along points 30 during operation of the NFC performance testing device. This allows the NFC testing component 4 to test the NFC signal of the terminal device under test at any point 30, thereby detecting the NFC performance of the terminal device under test at that point 30.

[0059] In some examples, such as Figure 4 and Figure 5 As shown, the dot matrix board 3 includes a board body 31 and a fixing structure 32. The fixing structure 32 is connected to the board body 31, and the dot 30 is located on the side of the board body 31 facing away from the fixing structure 32. The NFC test component 4 is fixed to the fixing structure 32.

[0060] The following is an exemplary description of how the fixed structure 32 is implemented.

[0061] In some examples, such as Figure 1 and Figure 4 As shown, the NFC test component 4 includes a card reader 41, which is used to receive NFC signals emitted by the terminal device under test 100. When using the card reader 41 for testing, the card reader 41 is in contact with the side of the fixing structure 32 facing the plate 31. The fixing structure 32 is fixed to the test platform 1 and is located on the side of the plate 31 facing away from the image recognition component 5.

[0062] When the moving part 2 is aligned with a certain point 30, if the card reader 41 can detect the NFC signal, it indicates that the point 30 is within the receiving signal range of the card reader 41. If the card reader 41 cannot detect the NFC signal, it indicates that the point 30 is outside the receiving signal range of the card reader 41. Therefore, when the terminal device under test 100 is aligned with each point 30 one by one, the signal receiving range of the card reader 41 can be detected (e.g., ...). Figure 3 (The area enclosed by the bold solid line). Since the card reader 41 can only receive NFC signals within the effective radio frequency range of the NFC element of the terminal device under test 100, the signal receiving range of the card reader 41 is equivalent to the effective radio frequency range of the terminal device under test 100. In this way, the effective radio frequency area of ​​the terminal device can be calculated based on the area enclosed by multiple points located within the signal receiving range of the card reader 41.

[0063] At this time, the card reader 41 is located below the board 31, but since the dot 30 is in a penetrating state, the NFC signal emitted by the tested terminal device 100 can penetrate the dot 30, allowing the card reader 41 to read the NFC signal even though it is located below the board 31. Furthermore, the card reader 41's location below the board 31 ensures that the dot 30 is not obstructed. When the moving part 2 moves above a certain dot 30, it will remain there for a sufficient time (e.g., 2-4 seconds) to allow the card reader 41 to detect the presence of an NFC signal. Figure 3 As shown, the moving part 2 can follow the path indicated by the dashed arrow in the figure. Figure 3 (Only a partial path is shown in the image.) When the tested terminal device 100 is above point A, the card reader 41 does not receive an NFC signal, therefore point A is outside the radio frequency range of the terminal device. When the tested terminal device 100 is above point B, the card reader 41 can receive an NFC signal, therefore point B is outside the radio frequency range of the terminal device.

[0064] The card reader 41 can be connected to a computer. When the card reader 41 detects the NFC signal emitted by the terminal device under test 100, it can send the detection result to the computer. For example, the card reader 41 can read the user identity information written in the terminal device under test 100 and then transmit the information to the computer.

[0065] In some examples, such as Figure 4 and Figure 5As shown, the fixing structure 32 includes two first support plates 321 and a second support plate 322. Point 30 is located on the plate body 31, and both ends of the second support plate 322 are connected to the two first support plates 321 respectively. The plate body 31, the two first support plates 321, and the second support plate 322 form a first receiving groove 3a, which is used to receive the card reader 41. When the NFC performance testing equipment is working, the dot matrix plate 3 can be fixed to the test platform 1 first, and then the card reader 41 can be placed in the first receiving groove 3a.

[0066] In some examples, such as Figure 4 and Figure 5 As shown, the fixing structure 32 also includes two sets of limiting blocks 323, which are fixed to the plate 31. Two first support plates 321 are arranged at intervals along a first direction, and two sets of limiting blocks 323 are arranged at intervals along a second direction. The two sidewalls of the card reader 41 perpendicular to the first direction abut against the two first support plates 321, and the two sidewalls of the card reader 41 perpendicular to the second direction abut against the two sets of limiting blocks 323. The first and second directions intersect. Thus, the two sets of limiting blocks 323 and the two first support plates 321 can hold the card reader 41 in the first receiving groove 3a, strengthening the limiting of the card reader 41 and preventing slippage. This ensures relatively accurate detection results. It should be noted that the first and second directions can be perpendicular to each other or not; this embodiment does not specifically limit this.

[0067] For example, each set of limiting blocks 323 may include two limiting blocks 323, and both ends of each first support plate 321 are connected to the limiting blocks 323.

[0068] In some examples, such as Figure 4 As shown, the height H1 of the limiting block 323 is less than the height H2 of the first support plate 321. In this way, when the card reader 41 is placed into the first receiving slot 3a, the limiting block 323 will not obstruct the card reader 41, so that the card reader 41 can smoothly enter the first receiving slot 3a.

[0069] In some examples, such as Figure 4 and Figure 5 As shown, the fixing structure 32 also includes multiple support columns 324, which support the plate 31. The height of the support columns 324 is greater than the height of the first support plate 32. The support columns 324 enable the dot matrix plate 3 to be more stably fixed on the test platform 1, and the support columns 324 can raise the height of the card reader 41, so that there is a certain distance between the card reader 41 and the test platform 1, avoiding interference from the test platform 1 to the signal received by the card reader 41.

[0070] For example, the fixing structure 32 includes four support columns 324, two of which can be distributed on both sides of the two first support plates 321.

[0071] The preceding text describes how the NFC performance testing equipment detects the effective radio frequency range of the terminal device under test 100. In addition, the NFC performance testing equipment can also test the card reading speed and stability of the terminal device under test 100.

[0072] In some examples, such as Figure 5 and Figure 6 As shown, the NFC testing component 4 includes a test card 42, which is used to send NFC signals to the terminal device under test 100. The test card 42 is fixed to the side of the fixing structure 32 facing or away from the plate 31. When the NFC performance testing equipment is working, the moving component 2 moves the terminal device under test 100 above the test card 42, while the test card 42 continuously emits NFC signals. The terminal device under test 100 then receives the NFC signals emitted by the test card 42. Based on the time taken for the terminal device under test 100 to detect the NFC signal, the card reading speed of the terminal device under test 100 can be determined.

[0073] To ensure accurate card reading speed of the tested terminal device 100, the strongest radio frequency (RF) point of the tested terminal device 100 can be aligned with the strongest RF point of the test card 42. The strongest RF point can be marked on the surface of the test card 42 and also on the tested terminal device 100. After the image recognition component 5 identifies the strongest RF point, the moving component 2 moves the tested terminal device 100 until its strongest RF point aligns with the strongest RF point of the test card 42.

[0074] Furthermore, the test card 42 can also be used to test the stability of the NFC performance of the terminal device under test 100. Specifically, the moving part 2 repeatedly moves the terminal device under test 100 above the test card 42. If the terminal device under test 100 can receive the NFC signal emitted by the test card 42 each time, it indicates that the NFC performance of the terminal device under test 100 is stable. If there are cases where the terminal device under test 100 cannot receive the NFC signal, it indicates that the NFC performance of the terminal device under test 100 is unstable.

[0075] In some examples, such as Figures 5-7As shown, the fixing structure 32 includes two first support plates 321 and a second support plate 322. The two ends of the second support plate 322 are respectively connected to the two first support plates 321. The second support plate 322 has a second receiving groove 3b, the opening of which faces away from the plate body 31. The second receiving groove 3b is used to fix the test card 42. When the test card 42 is being used for testing, the plate body 31 is in contact with the test bench 1, and the first support plates 321 and the second support plate 322 are located on the side of the plate body 31 facing the image recognition component 5.

[0076] The NFC performance testing equipment has a first test state and a second test state. The first test state involves the NFC performance testing equipment detecting the effective radio frequency range of the terminal device under test 100, while the second test state involves the NFC performance testing equipment detecting the card reading speed and stability of the terminal device under test 100. For example... Figure 1 and Figure 6 As shown, in the first test state, the support column 324 is fixed to the plate 31, and the card reader 41 and the second support plate 322 are located between the plate 31 and the test table 1, thereby preventing the point 30 from being blocked by the card reader 41.

[0077] In the second test state, such as Figure 6 and Figure 7 As shown, the board 31 is connected to the test platform 1, and the test card 42 is fixed in the second receiving slot 3b. The board 31 is located between the second support plate 322 and the test platform 1. This prevents the board 31 from obstructing the test card 42, allowing for accurate detection of the card reading speed of the terminal device under test 100. Furthermore, the presence of the first support plate 321 also ensures a certain distance between the test card 42 and the test platform 1, reducing radio frequency interference from the metal test platform 1 to the test card 42.

[0078] Of course, in other examples, the opening of the second receiving groove 3b may also face the plate 31. In the second test state, that is, in the state of testing using the test card 42, the support column 324 is in contact with the plate 31. The test card 42 and the second support plate 322 are located between the plate 31 and the test table 1, and the test card 42 is fixed to the second receiving groove 3b. This embodiment of the present disclosure does not specifically limit this aspect.

[0079] In some examples, the distance between any two adjacent points 30 is 0.5cm-1.5cm. If the distance between adjacent points 30 is too close, the moving part 2 needs to move more points, resulting in lower detection efficiency. If the distance between adjacent points 30 is too far, the accuracy of the detection results for the effective radio frequency range of the NFC element in the tested terminal device 100 will be lower.

[0080] In some examples, the aperture of point 30 is 1mm-4mm. In the first test state, if the aperture of point 30 is too small, it will block the NFC signal. If the aperture of point 30 is too large, it will lead to inaccurate measurement results.

[0081] In some examples, the dot matrix plate 3 is made of a non-metallic material, which can significantly reduce the metal interference problems that may occur during the testing process.

[0082] If the NFC element of the terminal device under test 100 has a large radio frequency range, the entire dot matrix board 3 may be located within the radio frequency range of the NFC element. This makes it difficult to detect the specific radio frequency range of the NFC element. Therefore, in some examples, such as... Figure 8 and Figure 9 As shown, the NFC performance testing equipment includes multiple dot matrix boards 3 arranged in parallel, with a card reader 41 fixed to one of the dot matrix boards 3. This increases the testing range of the terminal device under test 100, thereby accurately measuring the specific radio frequency range of the NFC element of the terminal device under test 100.

[0083] Specifically, the number of dot matrix boards 3 can be set according to the test results. If all the dot matrix boards 3 on the test platform 1 are within the radio frequency range of the NFC signal of the terminal device under test 100, then continue to add dot matrix boards 3 on the test platform 1 until some positions of the dot matrix boards 3 can no longer detect NFC signals.

[0084] In some examples, the first sidewall 3c of the dot matrix plate 3 has a snap-fit ​​groove 301, and the second sidewall 3d of the dot matrix plate 3 has a snap-fit ​​protrusion 302. The snap-fit ​​groove 301 of each dot matrix plate 3 is connected to the snap-fit ​​protrusion 302 of the adjacent dot matrix plate 3, wherein the first sidewall 3c and the second sidewall 3d are opposite each other. Both the snap-fit ​​groove 301 and the snap-fit ​​protrusion 302 are located on the plate body 31.

[0085] In some examples, the NFC performance testing device also includes a control unit. The control unit is electrically connected to the moving part 2 and the image recognition part 5, and is used to control the moving part 2 to move above the point 30 recognized by the image recognition part 5 based on the point 30 recognized by the image recognition part 5.

[0086] The control component can be a chip integrated into the moving component 2. The control component can acquire the image collected by the image recognition component 5, and then control the moving component 2 to move according to the image. The implementation of the control component can be the same as that of the control component in the prior art. For example, the control component can use an existing processing chip, acquire the image collected by the image recognition component, analyze and process the image to determine the point 30 recognized by the image recognition component, and control the moving component to move to the recognized point through control commands.

[0087] The above description is merely an optional embodiment of this disclosure and is not intended to limit this disclosure. Any modifications, equivalent substitutions, improvements, etc., made within the principles of this disclosure should be included within the protection scope of this disclosure.

Claims

1. An NFC performance testing device, characterized in that, The NFC performance testing equipment includes a test bench (1), a moving component (2), a dot matrix board (3), an NFC testing component (4), and an image recognition component (5); The dot matrix plate (3) is fixed to the test bench (1), and the dot matrix plate (3) has multiple points (30) arranged in an array; The image recognition component (5) is located above the dot matrix plate (3) and is used to identify at least one of the plurality of dots (30); The moving component (2) is used to move the terminal device under test (100) above the at least one point (30) identified by the image recognition component (5); The NFC test component (4) is fixed to the dot matrix plate (3). When the terminal device under test (100) is moved above the at least one dot (30) identified by the image recognition component (5), the NFC test component (4) is used to perform NFC signal testing on the terminal device under test (100).

2. The NFC performance testing device according to claim 1, characterized in that, The dot matrix plate (3) includes a plate body (31) and a fixing structure (32); The fixing structure (32) is connected to the plate (31), the point (30) is located on the side of the plate (31) facing away from the fixing structure (32), and the NFC test component (4) is fixed to the fixing structure (32).

3. The NFC performance testing device according to claim 2, characterized in that, The NFC test component (4) includes a card reader (41), which is used to receive NFC signals emitted by the terminal device under test (100); When the card reader (41) is being tested, the card reader (41) is fixed to the side of the fixing structure (32) facing the plate (31), the fixing structure (32) is in contact with the test bench (1), and the fixing structure (32) is located on the side of the plate (31) facing away from the image recognition component (5).

4. The NFC performance testing device according to claim 3, characterized in that, The fixing structure (32) includes two first support plates (321) and a second support plate (322); The two ends of the second support plate (322) are respectively connected to the two first support plates (321). The plate body (31), the two first support plates (321) and the second support plate (322) form a first receiving groove (3a), which is used to receive the card reader (41).

5. The NFC performance testing device according to claim 4, characterized in that, The fixing structure (32) also includes two sets of limiting blocks (323), which are fixed to the plate (31); Two first support plates (321) are arranged at intervals along a first direction, and two sets of limiting blocks (323) are arranged at intervals along a second direction. The card reader (41) has two side walls perpendicular to the first direction that abut against the two first support plates (321) respectively, and the card reader (41) has two side walls perpendicular to the second direction that abut against the two sets of limiting blocks (323) respectively. The first direction and the second direction intersect.

6. The NFC performance testing device according to claim 5, characterized in that, The height (H1) of the limiting block (323) is less than the height (H2) of the first support plate (321).

7. The NFC performance testing device according to claim 4, characterized in that, The fixing structure (32) also includes a plurality of support columns (324), which are used to support the plate (31), and the height of the support columns (324) is greater than the height of the first support plate (321).

8. The NFC performance testing device according to claim 2, characterized in that, The NFC test component (4) includes a test card (42), which is used to send NFC signals to the terminal device under test (100); The test card (42) is fixed to the side of the fixing structure (32) facing or away from the plate (31).

9. The NFC performance testing device according to claim 8, characterized in that, The fixing structure (32) includes two first support plates (321) and a second support plate (322); The two ends of the second support plate (322) are respectively connected to the two first support plates (321). The second support plate (322) has a second receiving groove (3b). The opening of the second receiving groove (3b) faces away from the plate body (31). The second receiving groove (3b) is used to fix the test card (42). When the test card (42) is being used for testing, the plate (31) is in contact with the test table (1), and the first support plate (321) and the second support plate (322) are located on the side of the plate (31) facing the image recognition component (5).

10. The NFC performance testing device according to claim 1, characterized in that, The distance between adjacent points (30) is 0.5cm-1cm.

11. The NFC performance testing device according to claim 1, characterized in that, The NFC performance testing equipment includes multiple dot matrix boards (3) arranged in parallel, and the NFC testing component (4) is fixed to one of the dot matrix boards (3).

12. The NFC performance testing device according to claim 11, characterized in that, The first sidewall (3c) of the dot matrix plate (3) has a snap-fit ​​groove (301), and the second sidewall (3d) of the dot matrix plate (3) has a snap-fit ​​protrusion (302). The snap-fit ​​groove (301) of each dot matrix plate (3) is connected to the snap-fit ​​protrusion (302) of the adjacent dot matrix plate (3), wherein the first sidewall (3c) and the second sidewall (3d) are opposite to each other.

13. The NFC performance testing device according to claim 1, characterized in that, The NFC performance testing equipment also includes a control component; The control component is electrically connected to the moving component (2) and the image recognition component (5). The control component is used to control the moving component (2) to move above the point (30) identified by the image recognition component (5) according to the point (30) identified by the image recognition component (5).

Images