Sample holder and infrared spectrometer
By designing an adjustable sample clamp and support device, the problem of poor versatility of existing devices is solved, and stable fixation of different samples is achieved, thereby improving the testing consistency and efficiency of the infrared spectrometer.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CDGM OPTICAL GLASS
- Filing Date
- 2025-06-24
- Publication Date
- 2026-06-23
Smart Images
Figure CN224399259U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of infrared spectrometer technology, and in particular to a sample fixing device and an infrared spectrometer. Background Technology
[0002] An infrared spectrometer is a precision instrument used to analyze the molecular structure and chemical composition of substances. It obtains information about molecular vibrations and rotations by measuring the absorption of infrared light by a sample. It mainly consists of a light source, monochromator, sample chamber, detector, and data processing system, and is widely used in chemistry, materials science, biomedicine, and environmental science. Infrared spectrometers can perform qualitative and quantitative analysis, helping researchers determine the composition of unknown substances, study molecular structures, and monitor chemical reaction processes. Their ease of operation, fast analysis speed, and small sample volume requirements make them an indispensable analytical tool in laboratories.
[0003] However, when using an infrared spectrometer for analysis, the placement of the sample is a crucial factor affecting the accuracy of the test results. Different operators may place the sample with positional errors, thus affecting the consistency and repeatability of the test results. To address this, some infrared spectrometers are equipped with sample fixing devices to secure the sample in the same position. However, current sample fixing devices typically only hold one type of sample, resulting in poor versatility. Utility Model Content
[0004] Therefore, it is necessary to provide a sample fixing device and an infrared spectrometer to address the problem that sample fixing devices can usually only fix one type of sample and have poor versatility.
[0005] A sample fixing device, comprising:
[0006] The motherboard has a light-transmitting hole that runs through itself in a first direction;
[0007] A sample clamp is disposed on one side of the main board in the first direction, and forms a clamping position between the sample and the main board;
[0008] Two sample supports are provided, with one end of each sample support arranged at intervals along a second direction intersecting the first direction on the other side of the main board. The other end of each sample support extends longitudinally along the first direction away from the main board, and all the sample supports form a sample support position on the side facing the light-transmitting hole.
[0009] In one embodiment, the sample fixing device further includes two first fasteners, the main board has two clearance holes, the sample clamp includes two first mounting holes, the two clearance holes and the two first mounting holes are spaced apart along the second direction, each sample support has a second mounting hole at one end facing the main board, and each first fastener passes through the first mounting hole and the clearance hole and is threadedly connected to the second mounting hole.
[0010] In one embodiment, each of the first mounting holes is an oblong hole, all of which extend longitudinally along a third direction, and the sample clip is located on one side of the light-transmitting hole in the third direction.
[0011] Wherein, the first direction, the second direction, and the third direction intersect each other but are not coplanar.
[0012] In one embodiment, the two clearance holes are a group, and the clearance holes include multiple groups. The multiple groups of clearance holes are all arranged at intervals along a third direction. The two first fasteners can choose to pass through one group of clearance holes and be threadedly connected to the two second mounting holes.
[0013] The sample clip and the sample support are both located on one side of the light-transmitting hole in the third direction. The first direction, the second direction, and the third direction intersect each other but are not coplanar.
[0014] In one embodiment, the sample clip includes a clamping part and a supporting part. The clamping part is disposed on the motherboard. One end of the supporting part is connected to one end of the clamping part facing the light-transmitting hole, and the other end extends longitudinally in a direction away from the supporting part and the motherboard. The clamping part and the supporting part are set at an angle.
[0015] In one embodiment, the sample fixing device further includes a base, and the main board is disposed on the base at one end in the third direction and is located at the middle of the base in the first direction;
[0016] Wherein, the first direction, the second direction, and the third direction intersect each other but are not coplanar.
[0017] In one embodiment, the motherboard has a mating groove on one end facing the base, the mating groove passing through the motherboard along the first direction, and the base has an embedding groove, the mating groove being embedded in the embedding groove.
[0018] In one embodiment, at least one of the sample support members has a circumferential sidewall that is an arc surface.
[0019] In one embodiment, the motherboard has a leveling groove on at least one side of its surface in the first direction, the leveling groove extends longitudinally along the second direction, and the cross-section of the leveling groove is triangular.
[0020] An infrared spectrometer includes an instrument body and a sample fixing device as described in any of the preceding claims, the instrument body having a slot, and the main board being inserted into the slot at least one end in the second direction.
[0021] The aforementioned sample fixing device, through a sample clamp on one side of the motherboard, allows smaller samples to be fixed to the device, while two sample supports on the other side allow larger samples to be directly supported. Thus, the sample clamp and supports can fix samples of different sizes and shapes, effectively improving the versatility of the sample fixing device. Attached Figure Description
[0022] Figure 1 This is a schematic diagram of the sample fixing device in some embodiments of this application.
[0023] Figure 2 for Figure 1 The front view of the main board in the sample fixing device shown.
[0024] Figure 3 for Figure 1 Side view of the main board in the sample fixing device shown.
[0025] Figure 4 for Figure 1 Top view of the main board in the sample fixing device shown.
[0026] Figure 5 for Figure 1 The front view of the sample clamp in the sample fixing device shown.
[0027] Figure 6 for Figure 1 A side view of the sample clamp in the sample fixing device shown.
[0028] Figure 7 for Figure 1 The top view of the sample support component in the sample fixing device shown.
[0029] Figure 8 for Figure 1 The front view of the sample support component in the sample fixing device shown.
[0030] Figure 9 for Figure 1 The diagram shows the structure of the fasteners in the sample fixing device.
[0031] Figure 10 for Figure 1 The diagram shows the structure of the base in the sample fixing device.
[0032] Figure 11 for Figure 1 Side view of the base in the sample fixing device shown.
[0033] Explanation of reference numerals in the attached figures:
[0034] Main board 10; Light-transmitting hole 11; Clearance hole 12; Mating groove 13; Leveling groove 14; Second fastening hole 15; Insertion part 16;
[0035] Sample clamp 20; first mounting hole 21; clamping part 22; support part 23;
[0036] Sample support 30; first fastener 31; second mounting hole 32;
[0037] Base 40; Embedded groove 41; First fastening hole 42; Second fastener 43;
[0038] First direction X; second direction Y; third direction Z. Detailed Implementation
[0039] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0040] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0041] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0042] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0043] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0044] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.
[0045] See Figure 1 , Figure 1 The diagram shows a sample fixing device according to an embodiment of the present application. The sample fixing device provided in this embodiment is used to fix the sample that needs to be tested for infrared glass spectral transmittance, so that the sample can be in the same position each time when different testers place the sample, thereby improving the consistency and repeatability of the test structure.
[0046] Specifically, the sample fixing device includes a main board 10, a sample clip 20, and a sample support 30. The main board 10 has a light-transmitting hole 11 extending through itself along a first direction X, which allows light from the infrared spectrometer to pass through. The sample clip 20 is disposed on one side of the main board 10 along the first direction X. The sample support 30 includes two components, one end of which is spaced apart along a second direction Y intersecting the first direction X on the other side of the main board 10, and the other end of each sample support 30 extends longitudinally along the first direction X in a direction away from the main board 10.
[0047] The sample clamp 20 and the main board 10 form a clamping position for clamping the sample, and all sample supports 30 face the light-transmitting hole 11 to form a sample support position. Thus, depending on the size and shape of the sample, the sample can be fixed in the clamping position or the support position. Specifically, in actual use, if the sample size is small, the sample clamp 20 can be used to clamp the small sample in the clamping position to fix the small sample. The sample fixed in the sample clamp 20 can cover the light-transmitting hole 11, so that the light emitted by the infrared spectrometer can pass through the light-transmitting hole 11 and the sample in the sample clamp 20, and finally illuminate the detector of the infrared spectrometer.
[0048] When the sample size is large, it can be placed on the support position formed by the two sample supports 30, since the sample needs to cover the light-transmitting hole 11. Therefore, in actual use, the two sample supports 30 are set below the light-transmitting hole 11. So when the sample is placed on the support position on the two sample supports 30, the sample will cover the light-transmitting hole 11, allowing the collected light to pass through the light-transmitting hole 11.
[0049] The aforementioned sample fixing device, through the sample clamp 20 located on one side of the main board 10, allows smaller samples to be fixed to the sample fixing device using the sample clamp 20, while through the two sample support members 30 located on the other side of the main board 10, allows larger samples to be directly supported by the two sample support members 30. In this way, the sample clamp 20 and sample support members 30 can fix samples of different sizes and shapes, effectively improving the versatility of the sample fixing device.
[0050] In some embodiments of this application, see [reference] Figure 2 , Figure 3 and Figure 4The sample fixing device also includes two first fasteners 31. The main board 10 has two clearance holes 12. The sample clamp 20 includes two first mounting holes 21. The two clearance holes 12 and the two first mounting holes 21 are arranged at intervals along the second direction Y. Each sample support 30 has a second mounting hole 32 at one end facing the main board 10. The second mounting hole 32 is a threaded hole. Each first fastener 31 passes through the first mounting hole 21, the clearance hole 12 and is threadedly connected to the second mounting hole 32. The two first fasteners 31 pass through the two first mounting holes 21, the two clearance holes 12 and the two second mounting holes 32 respectively, thereby fixing the sample clamp 20 and the two sample supports 30 on the main board 10.
[0051] Thus, the first fastener 31 can not only fix the sample clamp 20 but also the sample support 30, thereby eliminating the need to fix the sample clamp 20 and the sample support separately, reducing the number of parts and improving installation convenience.
[0052] In some embodiments, each first mounting hole 21 is an oblong hole, and all oblong holes extend longitudinally along the third direction Z, which intersects with both the first direction X and the second direction Y. Thus, when the first fastener 31 is inserted into the oblong hole, the sample clamp 20 can move relative to the first fastener 31 in the third direction Z through the movement of the first fastener 31 within the oblong hole.
[0053] The sample clamp 20 is located on the side of the light-transmitting hole 11 in the third direction Z. Thus, when the sample clamp 20 moves relative to the first fastener 31 in the third direction Z, it can move closer to or further away from the light-transmitting hole 11. Therefore, when the sample size is small, the sample clamp 20 can be moved closer to the light-transmitting hole 11, allowing the sample in the clamping position to cover the light-transmitting hole 11, thereby ensuring the test effect of the infrared spectral transmittance test.
[0054] Specifically Figure 1 In this embodiment, the third direction Z is the up and down direction. The sample clip 20 is fixed below the light-transmitting hole 11. During the movement of the sample clip 20 relative to the first fastener 31, it can rise or fall relative to the main board 10, thereby moving closer to or away from the light-transmitting hole 11. This allows the sample clip 20 to adjust its position according to the actual size of the sample, thereby achieving better testing results.
[0055] Furthermore, two clearance holes 12 form a group, and multiple groups of clearance holes 12 are included. These groups of clearance holes 12 are spaced apart along the third direction Z. Two first fasteners 31 can be selected to pass through one group of clearance holes 12 and threadedly connected to the two second mounting holes 32. The sample clamp 20 and sample support 30 are both located on the side of the light-transmitting hole 11 along the third direction Z. That is, the clearance holes 12 in different groups have different heights relative to the light-transmitting hole 11. After the two first fastening holes 42 pass through the clearance holes 12 in different groups to fix the sample clamp 20 and sample support 30 onto the main board 10, the positions of the sample clamp 20 and sample support 30 relative to the light-transmitting hole 11 can be adjusted. This allows the positions of the sample clamp 20 and sample support 30 relative to the light-transmitting hole 11 to be adjusted according to the sample size, thereby ensuring the testing effect of the infrared spectral transmittance test.
[0056] In actual use, the sample clamp 20 can be adjusted to a greater range by cooperating with the multiple clearance holes 12 and the waist-shaped holes on the sample clamp 20, thereby improving the adaptability of the sample clamp 20 to samples of more sizes and shapes, and further improving the versatility of the sample fixing device.
[0057] In some embodiments of this application, see [reference] Figure 5 and Figure 6 The sample clamp 20 includes a clamping part 22 and a supporting part 23. The clamping part 22 is disposed on the main board 10. One end of the supporting part 23 is connected to one end of the clamping part 22 facing the light-transmitting hole 11, and the other end extends longitudinally in a direction away from the supporting part 23 and the main board 10. The clamping part 22 and the supporting part 23 are set at an angle.
[0058] In actual use, when the test light passes through the sample, the sample surface needs to be as perpendicular to the test light as possible, that is, the sample surface should be as close as possible to the surface of the motherboard 10. However, since the sample is often not a regular shape, clamping only the bottom of the sample between the sample clamp 20 and the motherboard 10 may cause the top of the sample to tilt, making it impossible for the sample surface to be in contact with the surface of the motherboard 10.
[0059] The sample clamp 20 is configured with a clamping part 22 and a supporting part 23. The clamping part 22 clamps the bottom of the sample, while the supporting part 23 supports one side of the sample, thereby reducing sample tilt and allowing the sample to be as close as possible to the surface of the motherboard 10, improving the testing effect. Optionally, there are two supporting parts 23, which are arranged at intervals along the second direction Y on the clamping part 22. Each supporting part 23 forms a 45° angle with the clamping part 22, and the two supporting parts 23 can increase the support area for the sample.
[0060] Furthermore, a leveling groove 14 is formed on the surface of the motherboard 10 facing the sample support 30. The leveling groove 14 extends longitudinally along the second direction Y, and the cross-section of the leveling groove 14 is triangular. When the sample size is large and can only be placed on the sample support 30, if the surface of the sample is uneven, the uneven part of the sample can be inserted into the leveling groove 14, so that the surface of the sample can fit the surface of the motherboard 10, thereby improving the test effect.
[0061] Furthermore, a leveling groove 14 is also provided on the side surface of the motherboard 10 facing the sample clamp 20, so that when a small sample is clamped by the sample clamp 20, if the sample surface is uneven, the sample can be made to stick to the surface of the motherboard 10 by the leveling groove 14 on this side surface of the motherboard 10.
[0062] In some embodiments of this application, see [reference] Figure 7 and Figure 8 The surface of the sample support 30 is an arc surface, so that when the sample is placed on two sample supports 30, the surface of the sample can fit as closely as possible to the surface of the sample support 30, thereby increasing the support area between the sample and the sample support 30 and thus improving the support effect on the sample.
[0063] Optionally, the sample support 30 is a stainless steel round bar with a stop at the position of the second mounting hole 32. This not only satisfies the need for placing and fixing large-sized samples, but also reduces the problem of samples not being placed perpendicular to the light acquisition path due to factors such as edge processing errors. The round bar design also satisfies the need for stable placement of different samples such as round, square, and irregular shapes.
[0064] In some embodiments of this application, see [reference] Figure 10 and Figure 11 To avoid the sample being too heavy and causing the motherboard 10 to tilt or even fall over when the sample is placed on the sample support 30, thus affecting the test results, the sample fixing device also includes a base 40. The motherboard 10 is mounted on the base 40 at one end in the third direction Z and is located at the middle of the base 40 in the first direction X.
[0065] In actual use, when the sample fixing device is placed in the sample chamber of the infrared spectrometer, the base 40 can increase the contact area between the sample fixing device and the bottom wall of the sample chamber of the infrared spectrometer, thereby increasing the stability of the sample fixing device and reducing the occurrence of tilting or tipping of the main board 10.
[0066] Furthermore, the motherboard 10 has a mating groove 13 on one end facing the base 40. The mating groove 13 passes through the motherboard 10 along the first direction X. The base 40 has an embedding groove 41. The mating groove 13 is embedded in the embedding groove 41, so that the motherboard 10 can be embedded into the base 40. The motherboard 10 is fixed and limited by the embedding groove 41 and the mating groove 13, which further increases the stability of the motherboard 10 on the base 40.
[0067] Furthermore, the sample fixing device also includes a second fastener 43. A first fastening hole 42 is provided on the base 40, and a second fastening hole 15 is provided on one end of the main board 10. The second fastener 43 passes through the first fastening hole 42 and is threadedly connected to the second fastening hole 15. That is, based on the aforementioned mating groove 13 and embedding groove 41, the base 40 and the main board 10 are further fixed by the second fastener 43, further increasing the stability of the main board 10.
[0068] Optionally, see Figure 9 The first fastener 31 and the second fastener 43 mentioned above are both bolts, and the bolts are made of stainless steel to meet the requirements of corrosion resistance.
[0069] This application also provides an infrared spectrometer, including an instrument body and a sample fixing device as described in any of the above embodiments. The instrument body includes a sample chamber, and the sample chamber has slots. The slots include two slots, both of which extend along the third direction Z and are respectively located on two opposite side walls of the sample chamber in the second direction Y.
[0070] The motherboard 10 is located in two slots at both ends in the second direction Y, thereby fixing and limiting the motherboard 10 through the two slots, which can effectively prevent the motherboard 10 from tilting when a heavy sample is placed on the sample fixing device.
[0071] It is understood that in some other embodiments, only one slot may be provided, and the motherboard 10 is inserted into one end of the slot in the second direction Y. Optionally, insertion portions 16 are provided on both sides of the motherboard 10 in the second direction Y. The width of the insertion portions 16 in the first direction X is smaller than the width of the rest of the motherboard 10, so that the motherboard 10 can be inserted into the slot of the sample chamber through the insertion portions 16.
[0072] The above-mentioned sample fixing device has at least the following advantages:
[0073] 1. It can ensure the stability and fixation of samples of different sizes and shapes, such as infrared glass samples, in the infrared spectrometer, and realize the measurement of infrared spectral transmittance under various sample conditions.
[0074] 2. It can ensure that the sample and the sample fixing device are stably placed in the sample chamber of the infrared spectrometer.
[0075] 3. It can ensure the consistency of the position and angle of the sample placed in the sample chamber under different sample conditions, thereby improving the accuracy, repeatability and measurement efficiency of infrared spectroscopy testing.
[0076] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0077] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A sample holding device, characterized by, The sample fixing device includes: The motherboard (10) has a light-transmitting hole (11) that extends through itself in a first direction (X); The sample clamp (20) is disposed on one side of the main board (10) in the first direction (X) and forms a clamping position for clamping the sample between the sample clamp and the main board (10); Two sample supports (30) are provided on the other side of the main board (10) with one end of each sample support (30) spaced apart along a second direction (Y) intersecting the first direction (X). The other end of each sample support (30) extends longitudinally along the first direction (X) away from the main board (10), and all the sample supports (30) form a sample support position on the side facing the light-transmitting hole (11).
2. The sample fixing device according to claim 1, characterized in that, The sample fixing device further includes two first fasteners (31), the main board (10) has two clearance holes (12), the sample clamp (20) includes two first mounting holes (21), the two clearance holes (12) and the two first mounting holes (21) are arranged at intervals along the second direction (Y), each sample support (30) has a second mounting hole (32) at one end facing the main board (10), each first fastener (31) passes through the first mounting hole (21) and the clearance hole (12) and is threadedly connected to the second mounting hole (32).
3. The sample fixing device according to claim 2, characterized in that, Each of the first mounting holes (21) is an oblong hole, and all the oblong holes extend longitudinally along the third direction (Z). The sample clip (20) is located on one side of the light-transmitting hole (11) in the third direction (Z). The first direction (X), the second direction (Y), and the third direction (Z) intersect each other but are not coplanar.
4. The sample fixing device according to claim 2, characterized in that, Two of the aforementioned clearance holes (12) form a group, and the clearance holes (12) include multiple groups. The multiple groups of clearance holes (12) are all arranged at intervals along a third direction (Z). The two first fasteners (31) can choose to pass through one of the clearance holes (12) and be threadedly connected to the two second mounting holes (32). The sample clip (20) and the sample support (30) are both located on one side of the light-transmitting hole (11) in the third direction (Z). The first direction (X), the second direction (Y) and the third direction (Z) intersect each other but are not coplanar.
5. The sample fixing device according to claim 1, characterized in that, The sample clip (20) includes a clamping part (22) and a supporting part (23). The clamping part (22) is disposed on the main board (10). One end of the supporting part (23) is connected to one end of the clamping part (22) facing the light-transmitting hole (11), and the other end extends longitudinally in a direction away from the supporting part (23) and the main board (10). The clamping part (22) and the supporting part (23) are set at an angle.
6. The sample fixing device according to claim 1, characterized in that, The sample fixing device also includes a base (40), and the main board (10) is disposed on the base (40) at one end in the third direction (Z) and is located at the middle of the base (40) in the first direction (X); The first direction (X), the second direction (Y), and the third direction (Z) intersect each other but are not coplanar.
7. The sample fixing device according to claim 6, characterized in that, The motherboard (10) has a mating groove (13) on one end facing the base (40), the mating groove (13) passes through the motherboard (10) along the first direction (X), and the base (40) has an embedding groove (41), the mating groove (13) is embedded in the embedding groove (41).
8. The sample fixing device according to claim 1, characterized in that, At least one of the sample support members (30) has a circular arc surface on its circumferential sidewall.
9. The sample fixing device according to claim 1, characterized in that, The motherboard (10) has a leveling groove (14) on at least one side of its surface in the first direction (X). The leveling groove (14) extends longitudinally along the second direction (Y) and has a triangular cross-section.
10. An infrared spectrometer, characterized in that, Includes an instrument body and a sample fixing device as described in any one of claims 1-9, wherein the instrument body has a slot and the main board (10) is inserted into the slot at least at one end in the second direction (Y).