Measuring device

Abstract

The application provides a measuring device, comprising a base, a conveying mechanism and a laser measuring mechanism, the base is provided with a measuring station; the conveying mechanism comprises a carrier table and at least two conveying tracks, the conveying tracks are installed on the base and are all communicated with the measuring station, the carrier table is arranged on each conveying track and can move along the extension direction of the conveying track; the laser measuring mechanism is installed on the base, the laser measuring mechanism comprises a laser probe, the laser probe faces the measuring station, and the laser probe is used for emitting a laser beam to the measuring station. The measuring device provided by the application comprises at least two conveying tracks, and the carrier table is arranged on each conveying track; when the carrier table on one of the conveying tracks is located at the measuring station to measure a product, the carrier tables on the other conveying tracks can be used for feeding and discharging the product, the measuring pace at the measuring station is improved, and the measuring efficiency of the measuring device is improved.

Description

Technical Field

[0001] This application relates to the field of data measurement technology, and more specifically, to a measuring device. Background Technology

[0002] The gaps and step differences between the screen cover and structural components on a display device can affect the aesthetics of the product. Therefore, it is necessary to measure the gaps and step differences before the display device leaves the factory.

[0003] One existing measurement method involves manual measurement of a product at a single point using a feeler gauge. However, the measurement results are highly dependent on the worker's skill level, leading to significant measurement errors. Furthermore, feeler gauges wear down over time, which can also affect the measuring structure. Utility Model Content

[0004] In view of this, this application provides a measuring device aimed at improving the measurement accuracy and efficiency of products.

[0005] In a first aspect, this application provides a measuring device, including a base, a conveying mechanism, and a laser measuring mechanism. The base is provided with a measuring station; the conveying mechanism includes a stage and at least two conveying tracks, which are installed on the base and are all connected to the measuring station. Each conveying track is provided with a stage that can move along the extension direction of the conveying track; the laser measuring mechanism is installed on the base and includes a laser probe facing the measuring station. The laser probe is used to emit a laser beam to the measuring station.

[0006] Compared with the prior art, the measuring device provided in this application achieves at least the following beneficial effects:

[0007] The measuring device provided in this application includes a base, a conveying mechanism, and a laser measuring mechanism. The base has a measuring station. The conveying mechanism includes a stage and at least two conveying tracks, each mounted on the base and connected to the measuring station. Each conveying track has a stage that can move along its extension direction. The laser measuring mechanism is mounted on the base and includes a laser probe facing the measuring station. The laser probe emits a laser beam towards the measuring station. The laser probe faces the measuring station and emits a laser beam onto the product at the measuring station. By collecting and analyzing the laser beams reflected back from the product and calculating the parameter differences of the laser beams reflected from different points, the distance between different points can be calculated. Further analysis and calculation can obtain data such as gaps and step differences on the product surface, replacing manual measurement, improving measurement accuracy and efficiency, and reducing the probability of product surface damage by not contacting the product during the measurement process. By including at least two conveying tracks in the conveying mechanism, and providing a platform on each conveying track, when the platform on one of the conveying tracks is at the measuring station for product measurement, the platforms on the other conveying tracks can load and unload products, thereby increasing the measurement cycle time at the measuring station and thus improving the measurement efficiency of the measuring device. Attached Figure Description

[0008] Figure 1 A schematic diagram of the structure of a measuring device provided in this application;

[0009] Figure 2 A schematic diagram of the structure of a measuring device provided in this application, with the hidden portion of the mechanism concealed.

[0010] Figure 3 A front view schematic diagram of a laser probe and a collector provided in this application;

[0011] Figure 4 A schematic diagram of the structure of a first driving mechanism and a laser measuring mechanism provided in this application;

[0012] Figure 5 A waveform diagram corresponding to the surface contour of a display device provided in this application;

[0013] Figure 6 A schematic diagram of the structure of a stage provided in this application;

[0014] Figure 7 A method provided for this application Figure 6 A schematic cross-sectional view of the stage in section BB. Detailed Implementation

[0015] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings. Preferred embodiments of this application are shown in the drawings. However, this application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of this application.

[0016] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the specification of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0017] When describing positional relationships, unless otherwise specified, when an element, such as a layer, film, or substrate, is referred to as being "on" another element, it may be directly on the other element or there may be intermediate elements present. Furthermore, when a layer is referred to as being "below" another layer, it may be directly below it or there may be one or more intermediate elements present. It is also understood that when a layer is referred to as being "between" two layers, it may be the only layer between the two layers, or there may be one or more intermediate elements present.

[0018] When using the terms “including,” “having,” and “comprising” as described herein, another component may be added unless explicitly qualifying terms such as “only,” “consisting of,” etc. are used. Unless otherwise stated, singular terms may include plural forms and should not be construed as having a quantity of one.

[0019] It should be understood that although the terms “first,” “second,” etc., may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used only to distinguish one element from another. For example, without departing from the scope of this application, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element.

[0020] It should also be understood that, in interpreting an element, although not explicitly described, the element is interpreted as including a range of error, which should be within the acceptable deviation range of a particular value as determined by a person skilled in the art. For example, "approximately," "about," or "substantially" can mean within one or more standard deviations, without limitation herein.

[0021] Furthermore, in the instruction manual, the phrase "planar distribution diagram" refers to the diagram when the target part is viewed from above, and the phrase "cross-sectional diagram" refers to the diagram when the target part is viewed from the side as a cross-section taken by vertically cutting the target part.

[0022] Furthermore, the accompanying drawings are not drawn to a 1:1 scale, and the relative dimensions of the components are shown in the drawings only as examples and not necessarily to actual scale.

[0023] As described in the background section, the measurement method in related technologies involves manual measurement of a product at a single point using a feeler gauge. However, the measurement results are highly dependent on the worker's skill level, leading to significant measurement errors. Furthermore, feeler gauges wear down after prolonged use, which also affects the measuring structure.

[0024] Based on the above-mentioned technical problems, the inventors further developed the technical solutions of the embodiments of this application. Specifically, the measuring device provided in the embodiments of this application includes a base, a conveying mechanism, and a laser measuring mechanism. The base is provided with a measuring station; the conveying mechanism includes a stage and at least two conveying tracks, which are installed on the base and are all connected to the measuring station. Each conveying track is provided with a stage that can move along the extension direction of the conveying track; the laser measuring mechanism is installed on the base and includes a laser probe facing the measuring station. The laser probe is used to emit a laser beam to the measuring station.

[0025] The above is the core idea of ​​this application. The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0026] Please refer to Figure 1 and Figure 2 , Figure 1 A schematic diagram of the structure of a measuring device provided in this application; Figure 2 This is a schematic diagram of the structure of a measuring device provided in this application after the concealed part of the mechanism is shown.

[0027] Combination Figure 1 and Figure 2 As shown, the measuring device 10 provided in this application includes a base 100, a conveying mechanism 200, and a laser measuring mechanism 300. A measuring station 110 is provided on the base 100. The conveying mechanism 200 includes a stage 210 and at least two conveying tracks 220. The conveying tracks 220 are mounted on the base 100 and are all connected to the measuring station 110. Each conveying track 220 has a stage 210 that can move along the extension direction of the conveying track 220. The laser measuring mechanism 300 is mounted on the base 100 and includes a laser probe 310. The laser probe 310 faces the measuring station 110 and is used to emit a laser beam to the measuring station 110.

[0028] It should be noted that this application uses the measuring device 10 to measure a display device (not shown) as an example. The display device can be a mobile phone or any electronic product with a display function, including but not limited to the following categories: televisions, laptops, desktop monitors, tablets, digital cameras, smart bracelets, smart glasses, automotive displays, industrial control equipment, medical displays, touch interactive terminals, etc. This application does not impose any special limitations on these. Of course, in other embodiments, the measuring device 10 can also be used to measure other products.

[0029] It is easy to understand that laser beams have the characteristic of reflection. When the laser beam emitted by the laser probe 310 shines on the surface of the display device, it will be reflected. Due to the difference in the flatness of the display device surface, the time, waveform and other parameters of the laser beam reflected back from the surface of the display device will be different. Therefore, by collecting and analyzing these reflected laser beams and calculating the parameter differences of the laser beams reflected back from different points, the distance between different points can be calculated. Further analysis and calculation can obtain the parameter data of the display device surface, such as gap width, gap depth, step difference, etc.

[0030] Specifically, the conveyor track 220 can be a slide rail, a belt conveyor system, a chain conveyor system, or a roller conveyor system. The conveyor track 220 is used to convey the platform 210 and the display device on the platform 210. In this embodiment, the conveyor track 220 is described as extending in a straight line. The side of the conveyor track 220 facing the laser measuring mechanism 300 is the measuring station 110, and the other side is the loading / unloading station 120. The display device, which is conveyed from the previous process to the measuring device 10, is placed on the platform 210 at the loading / unloading station, and moves along the conveyor track 220 with the platform 210 to the measuring station 110, where it is measured by the laser measuring mechanism 300. When a platform 210 carrying a display device is located at the measuring station 110, at least one platform 210 located on another conveyor track 220 is located at the loading / unloading station 120, or between the loading / unloading station 120 and the measuring station 110, thereby increasing the usage frequency of the measuring station 110 and thus improving the measuring efficiency of the measuring device 10. Of course, in other embodiments, depending on specific needs, the extension trajectory of the conveyor track 220 can also be an arc or a broken line.

[0031] In summary, the measuring device 10 provided in this application includes a laser probe 310, which emits a laser beam toward the measuring station 110 and toward the product on the measuring station 110. By collecting and analyzing the laser beams reflected back from the product and calculating the parameter differences of the laser beams reflected back from different points, the distance between different points can be calculated. Further analysis and calculation can obtain data such as gaps and step differences on the product surface, replacing manual measurement, improving measurement accuracy and efficiency, and reducing the probability of product surface damage by not contacting the product during the measurement process. By making the conveying mechanism 200 include at least two conveying tracks 220, and each conveying track 220 is provided with a platform 210, when the platform 210 on one conveying track 220 is located at the measuring station 110 for product measurement, the platforms 210 on other conveying tracks 220 can load and unload products, increasing the measurement cycle time at the measuring station 110, thereby improving the measurement efficiency of the measuring device 10.

[0032] In some embodiments, the measuring device further includes a second drive mechanism (not shown), which is connected to a plurality of stages 210. The second drive mechanism is used to drive the stages 210 to move along the extension direction of the conveying track 220. When one stage 210 is driven by the second drive mechanism to move along the conveying track 220 toward the measuring station 110, at least one stage 210 is driven by the second drive mechanism to move away from the measuring station 110 along another conveying track 220.

[0033] The second drive mechanism can be a motor or cylinder or other related parts.

[0034] Optionally, there can be two conveyor tracks 220. When one platform 210 carrying the display device is driven to the measuring station 110 by the second drive mechanism, the other platform 210 is driven to the loading / unloading station 120 by the second drive mechanism.

[0035] Optionally, the number of conveyor tracks 220 can be three or more. When one platform 210 carrying the display device is driven to the measuring station 110 by the second drive mechanism, another platform 210 is driven to the loading / unloading station 120 by the second drive mechanism, and another platform 210 is driven between the measuring station 110 and the loading / unloading station 120 by the second drive mechanism. This allows the measuring device 10 to further improve the measurement cycle time.

[0036] Optionally, the measuring device also includes a control module (not shown), which is electrically connected to the second drive mechanism. The control module is used to send signals to the second drive mechanism to control the position of each stage 210 on the conveyor track 220. The control module can be a microprocessor.

[0037] The measuring device 10 provided in this application embodiment, by setting a second driving mechanism and using the second driving mechanism to drive the stage 210, enables multiple stages 210 to move alternately back and forth between the measuring station 110 and the loading / unloading station 120, thereby improving the measuring efficiency of the measuring device 10.

[0038] Please refer to Figure 3 , Figure 3 This is a front view of a laser probe and a collection device provided in an embodiment of this application.

[0039] Combination Figure 3 As shown, in some embodiments, the laser measurement mechanism 300 further includes a collection member 320 facing the measurement station 110.

[0040] Optionally, the collector 320 is integrated on the laser probe 310, so that the collector 320 can move synchronously with the laser probe 310. Since both the collector 320 and the laser probe 310 are facing the measurement station 110, the collection efficiency of the collector 320 for the reflected laser beam is improved, thereby improving the measurement accuracy.

[0041] Optionally, the laser measurement mechanism 300 also includes a processing module (not shown). The processing module is electrically connected to the laser probe 310, the collector 320, and the control module. The processing module controls the parameters of the laser beam emitted by the laser probe 310, such as laser power, illumination angle, and illumination time. The reflected laser beam data collected by the collector 320 is also sent to the processing module, which calculates parameters such as the gap width, gap depth, and step difference on the surface of the display device based on the data. The processing module can be a microprocessor.

[0042] Optionally, the processing module also has preset threshold data, and is electrically connected to the control module (not shown) of the measuring device 10. When the display device is measured at the measuring station 110, the processing module compares the measured data of the display device with the built-in threshold data. If the measured data is less than or equal to the threshold data, the measured display device is determined to be a qualified product, and the processing module sends a signal to the control module, allowing the qualified product to proceed to the next process. If the measured data is greater than the threshold data, the measured display device is determined to be a defective product, and the processing module sends another signal to the control module, which then removes the display device from the production line for further processing. The control module can be a microprocessor, and the control module and processing module can also be integrated on the same microprocessor.

[0043] The measuring device 10 provided in this application embodiment collects reflected laser beams using a collector 320, thereby measuring the surface parameters of a display device. By integrating the collector 320 onto the laser probe 310, the collector 320 can move synchronously with the laser probe 310. Furthermore, since both the collector 320 and the laser probe 310 face the measuring station 110, the collection efficiency of the collector 320 for the reflected laser beams is improved, thus enhancing measurement accuracy.

[0044] Please refer to Figure 4 , Figure 4 This is a schematic diagram of a first driving mechanism and a laser measuring mechanism provided in an embodiment of this application.

[0045] Combination Figure 4 As shown, in some embodiments, the measuring device 10 further includes a first driving mechanism 400, which is connected to the base 100. The laser measuring mechanism 300 is connected to the base 100 through the first driving mechanism 400. The first driving mechanism 400 is used for the laser measuring mechanism 300 to move relative to the base 100 along a first direction, a second direction, and a height direction, wherein the first direction, the second direction, and the height direction are arranged in pairs.

[0046] Optionally, the first direction, the second direction, and the height direction are set perpendicular to each other, and the plane formed by the first direction and the second direction is perpendicular to the height direction. This can also be understood as the first direction and the second direction forming a horizontal plane.

[0047] Optionally, the first drive mechanism 400 is also used to drive the laser measuring mechanism 300 to swing relative to the base 100, thereby changing the angle between the laser beam emitted by the laser probe 310 and the horizontal plane. This allows the measuring device 10 to also measure the surface parameters of some products whose surfaces are not flush with the horizontal plane.

[0048] Optionally, the laser beam emitted by the laser probe 310 has an angle between it and the horizontal plane that is greater than or equal to 87° and less than or equal to 103°.

[0049] In this embodiment, a six-axis manipulator is used as an example to illustrate the first drive mechanism 400. The six-axis manipulator can move the laser measuring mechanism 300 in the first direction (x-direction in the figure), the second direction (y-direction in the figure), and the height direction (z-direction in the figure), and can also cause the laser measuring mechanism 300 to swing relative to the base 100, thus improving the movement accuracy of the laser measuring mechanism 300. Of course, in other embodiments, the first drive mechanism 400 can also be a drive module composed of multiple sets of cylinder-slide rail assemblies.

[0050] The measuring device 10 provided in this application embodiment, by setting a first driving mechanism 400, and enabling the first driving mechanism 400 to drive the laser measuring mechanism 300 to move relative to the base 100, allows the laser measuring mechanism 300 to be adapted to display devices of different sizes, and also enables the laser measuring mechanism 300 to measure the dimensions of multiple points on the display device. By enabling the first driving mechanism 400 to drive the laser measuring mechanism 300 to swing relative to the base 100, thereby changing the angle between the laser beam emitted by the laser probe 310 and the horizontal plane, the measuring device 10 can also measure the surface parameters of some products whose surfaces are not flush with the horizontal plane.

[0051] Please refer to Figure 5 , Figure 5 A waveform diagram corresponding to the surface contour of a display device provided in this application.

[0052] Combination Figure 5 As shown, in some embodiments, the laser probe 310 emits multiple laser beams to the measurement station 110, and the multiple laser beams form a laser surface.

[0053] Because the laser beam emitted by the laser probe 310 synchronously illuminates the surface of the display device to be measured, and after reflection based on the surface contour of the display device, the reflected laser beam is collected by the collector 320 and can be directly generated as shown in the image. Figure 5 The waveform diagram corresponding to the surface contour of the display device is shown. Compared with the traditional method of multiple measurements with a single laser beam and then calculating the difference, the measurement method in this embodiment can form the waveform diagram corresponding to the surface contour of the display device in one step, reducing the number of laser irradiations and improving detection efficiency. The subsequent processing module can calculate multiple surface parameters of the display device by automatically acquiring points on the waveform diagram. (See attached diagram.) Figure 5 For example, the depth of the gap is obtained by calculating the difference L1 between points D1 and D2 on the waveform diagram in the height direction z; the step difference is obtained by calculating the difference L2 between points D1 and D3 on the waveform diagram in the height direction z; and the width of the gap is obtained by calculating the difference L3 between points D1 and D2 on the waveform diagram in the horizontal direction. The horizontal direction can be any direction parallel to the plane formed by the first direction x and the second direction y.

[0054] Optionally, the width of the laser surface formed by the laser beam is greater than or equal to 30 mm and less than or equal to 40 mm. The width of the laser surface determines the range of the measured surface profile of the display device. If a larger range of surface profile needs to be measured, the width of the laser surface can be increased.

[0055] Optionally, the laser beams forming the laser surface are parallel, and the spacing between adjacent laser beams is less than or equal to 12 μm. The spacing between adjacent laser beams determines the accuracy of the measured surface profile; if higher measurement accuracy is required, the spacing between adjacent laser beams can be reduced.

[0056] The measuring device 10 provided in this application embodiment emits multiple laser beams from the laser probe 310 to the measuring station 110. The multiple laser beams form a laser surface, so that the emitted laser beams can be collected by the collector 320 and directly generate the surface contour of the display device. Compared with the traditional method of measuring multiple times with a single laser beam and then calculating the difference, this measurement method can efficiently and directly measure the surface contour of the display device. Then, by analyzing the surface contour through the processing module, multiple surface parameters of the display device can be directly calculated, such as gap width, gap depth, and step difference.

[0057] Please refer to Figure 6 and Figure 7 , Figure 6 A schematic diagram of the structure of a stage provided in this application; Figure 7 A method provided for this application Figure 6 A schematic cross-sectional view of the stage in section BB.

[0058] Combination Figure 6 and Figure 7 As shown, in some embodiments, the stage 210 includes two support seats 211 spaced apart along the first direction x, with a receiving groove 212 formed between the two support seats 211, and the support seats 211 are provided with a limiting groove 213 in the height direction z, with the first direction x and the height direction z intersecting.

[0059] The limiting groove 213 is a contour groove for the display device. When the display device is placed on the stage 210, both ends of the display device extend into the limiting grooves 213 of the two support seats 211. The sidewalls of the limiting grooves 213 match the sidewalls of the display device, fixing the display device on the stage 210 and preventing it from moving left or right. When the display device is placed on the stage 210, the light-emitting side faces upwards and the backlight side faces downwards. Since the backlight side of the display device is not a flat surface but a convex arc surface, by spaced out the support seats 211 and using the receiving grooves 212 to avoid the arc surface of the backlight side of the display device, the design difficulty of the stage 210 is reduced, and the levelness of the light-emitting side of the display device when placed on the stage 210 is improved, thereby improving measurement accuracy.

[0060] Optionally, the depth of the limiting groove 213 gradually increases along the direction toward the receiving groove 212. When the outline of the backlight side of the display device is arc-shaped, the arc-shaped limiting groove 213 can be matched with the backlight surface of the display device, so that the display device can be placed stably in the limiting groove 213, and the levelness of the light-emitting side of the display device is also improved when it is placed on the stage 210.

[0061] The measuring device 10 provided in this application includes a stage 210 comprising two support seats 211 spaced apart along a first direction x, with a receiving groove 212 formed between the two support seats 211. The receiving groove 212 avoids the protruding structure of the backlight surface of the display device, reducing the design difficulty of the stage 210 and improving the levelness of the light-emitting side of the display device when placed on the stage 210, thereby improving measurement accuracy. By gradually increasing the depth of the limiting groove 213 along the direction towards the receiving groove 212, and by matching the arc-shaped limiting groove 213 with the backlight surface of the display device, the display device can be stably placed within the limiting groove 213, similarly improving the levelness of the light-emitting side of the display device when placed on the stage 210.

[0062] As can be seen from the above embodiments, the measuring device provided in this application achieves at least the following beneficial effects:

[0063] The measuring device provided in this application includes a laser probe that faces the measuring station and emits a laser beam onto the product at the measuring station. By collecting and analyzing the laser beams reflected back from the product and calculating the parameter differences of the laser beams reflected from different points, the distance between different points can be calculated. Further analysis and calculation can obtain data such as gaps and step differences on the product surface, replacing manual measurement, improving measurement accuracy and efficiency, and reducing the probability of product surface damage by not contacting the product during the measurement process. By including at least two conveyor tracks in the conveying mechanism, and providing a platform on each conveyor track, when the platform on one conveyor track is at the measuring station for product measurement, the platforms on the other conveyor tracks can load and unload products, increasing the measurement cycle time at the measuring station, thereby improving the measurement efficiency of the measuring device.

[0064] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0065] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A measuring device, characterized in that include: A base, on which a measuring station is provided; The conveying mechanism includes a platform and at least two conveying tracks, which are installed on the base and are all connected to the measuring station. Each of the conveying tracks is provided with a platform that can move along the extension direction of the conveying track. A laser measuring mechanism is installed on the base. The laser measuring mechanism includes a laser probe facing the measuring station and is used to emit a laser beam to the measuring station.

2. The measuring device of claim 1, wherein, The laser measurement mechanism also includes: A collection component, the collection component being oriented toward the measuring station.

3. The measuring device of claim 1, wherein, Also includes: A first driving mechanism is connected to the base. The laser measuring mechanism is connected to the base through the first driving mechanism. The first driving mechanism is used to drive the laser measuring mechanism to move relative to the base along a first direction, a second direction, and a height direction. The first direction, the second direction, and the height direction are arranged to intersect each other.

4. The measuring device according to claim 3, characterized in that, The first driving mechanism is also used to drive the laser measuring mechanism to swing relative to the base, so as to change the angle between the laser beam emitted by the laser probe and the horizontal plane.

5. The measuring device according to claim 4, characterized in that, The angle between the laser beam emitted by the laser probe and the horizontal plane is greater than or equal to 87° and less than or equal to 103°.

6. The measuring device according to claim 1, characterized in that, The laser probe emits multiple laser beams toward the measuring station, and the multiple laser beams form a laser surface.

7. The measuring device according to claim 6, characterized in that, The width of the laser surface formed by the laser beam is greater than or equal to 30 mm and less than or equal to 40 mm.

8. The measuring device according to claim 7, characterized in that, The laser beams forming the laser surface are parallel to each other, and the distance between adjacent laser beams is less than or equal to 12 μm.

9. The measuring device according to claim 1, characterized in that, Also includes: The second drive mechanism is connected to all of the plurality of the platforms. The second drive mechanism is used to drive the platforms to move along the extension direction of the conveying track. When one of the platforms is driven by the second drive mechanism to move along the conveying track toward the measuring station, at least one of the platforms is driven by the second drive mechanism to move away from the measuring station along another conveying track.

10. The measuring device according to claim 1, characterized in that, The stage includes two support seats spaced apart along a first direction, with a receiving groove formed between the two support seats. The support seats are provided with a limiting groove in the height direction, and the first direction intersects with the height direction.

11. The measuring device according to claim 10, characterized in that, The depth of the limiting groove gradually increases along the direction toward the receiving groove.

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