A portable aging board testing fixture and its application testing system

Abstract

This application relates to a portable aging board testing fixture and its application testing system, comprising a fixture housing, on which a first connector, a second connector, and a third connector are disposed. A first load resistor and a second load resistor are disposed within the fixture housing. One end of the first load resistor is connected to the first connector, and the other end of the first load resistor is connected to the second connector. One end of the second load resistor is connected to the first connector, and the other end of the second load resistor is connected to the third connector. This application improves connection convenience.

Description

Technical Field

[0001] This application relates to the technical field of testing fixtures, and in particular to a portable aging board testing fixture and a testing system for its application. Background Technology

[0002] Power semiconductor devices (IGBTs), as core components of electronic products, are typically available in single-transistor and modular forms. Before these devices are released to the market, they must undergo reliability testing, including three key reliability tests: High Temperature Gate Bias (HTGB), High Temperature Reverse Bias (HTRB), and High Humidity High Temperature Reverse Bias (H3TRB). Ensuring system stability and long-term performance is crucial.

[0003] Among them, High Temperature Gate Bias (HTGB), High Temperature Reverse Bias (HTRB), and High Humidity High Temperature Reverse Bias (H3TRB) require testing on an aging board. Before testing, a self-test is performed on the aging board to ensure the accuracy and precision of the test. In the self-test of the aging board, load resistors need to be soldered to the A, B, and C ports of the aging board, and then a voltage is applied to the load resistors for testing. Based on Ohm's law (I=U / R), the current data of the load resistors is ensured to be within the error range.

[0004] Regarding the aforementioned technologies, the load resistor is usually soldered to the A, B, and C ports of the aging board using a soldering method. However, this soldering connection method results in low connection convenience, and therefore requires some improvement. Utility Model Content

[0005] To improve connectivity, this application provides a portable aging board testing fixture and its application testing system.

[0006] The portable aging plate testing fixture provided in this application adopts the following technical solution:

[0007] A portable aging plate testing fixture includes a fixture housing, on which a first connector, a second connector and a third connector are provided, and inside the fixture housing are a first load resistor and a second load resistor;

[0008] One end of the first load resistor is connected to the first connector, the other end of the first load resistor is connected to the second connector, one end of the second load resistor is connected to the second connector, and the other end of the second load resistor is connected to the third connector.

[0009] Preferably, the first connector, the second connector, and the third connector are banana plugs.

[0010] Preferably, the first connector, the second connector, and the third connector are fixed to the fixture housing at intervals, with one end of the first connector, the second connector, and the third connector located inside the fixture housing, and the other end of the first connector, the second connector, and the third connector extending outside the fixture housing.

[0011] Preferably, the first load resistor is connected to the first connector, the first load resistor and the second load resistor and the second connector, and the second load resistor and the third connector are all connected via quick-connect terminals.

[0012] Preferably, the fixture housing includes a mounting shell and a cover plate. The mounting shell has a mounting cavity. The first connector, the second connector, and the third connector are disposed on the mounting shell. The first load resistor and the second load resistor are disposed in the mounting cavity. The cover plate covers the mounting shell to close the mounting cavity. The cover plate is fixed to the mounting shell by a plurality of fastening bolts.

[0013] The detection system provided in this application adopts the following technical solution:

[0014] A testing system using a portable aging plate testing fixture as described in the above technical solution includes an output power supply, an aging plate, a first switch, a second switch, and a host computer.

[0015] The aging board has a port A, a port B and a port C. A current sampling circuit is connected to the port B of the aging board, and the current sampling circuit is connected to the host computer.

[0016] The positive terminal of the output power supply is connected to one end of the first switch and the second switch, the negative terminal of the output power supply is connected to port B of the aging board, the other end of the first switch is connected to port A of the aging board, and the other end of the second switch is connected to port C of the aging board.

[0017] The portable aging board testing fixture is used to connect and fit onto ports A, B, and C of the aging board.

[0018] In summary, this application includes at least one of the following beneficial technical effects:

[0019] The portable aging board testing fixture of this application can be directly plugged into ports A, B, and C of the aging board via a first connector, a second connector, and a third connector. This allows the first load resistor to be connected between ports A and B of the aging board, and the second load resistor to be connected between ports B and C of the aging board. This reduces operational complexity and improves connection convenience. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the first structure of a portable aging plate testing fixture.

[0021] Figure 2 This is a schematic diagram of the second structure of the portable aging plate testing fixture.

[0022] Figure 3 This is a system block diagram of the detection system.

[0023] Explanation of reference numerals in the attached drawings: 1. Fixture housing; 101. Mounting shell; 102. Cover plate; 103. Mounting cavity; 104. Fastening bolt; 2. First connector; 3. Second connector; 4. Third connector; 5. First load resistor; 6. Second load resistor; 7. Quick-connect terminal; 8. Wire; 9. Output power supply; 10. First switch; 11. Second switch. Detailed Implementation

[0024] The following is in conjunction with the appendix Figures 1-3 This application will be described in further detail.

[0025] Example 1

[0026] A portable aging plate testing fixture, as described in the reference Figure 1 and Figure 2 As shown, the fixture includes a fixture housing 1, on which a first connector 2, a second connector 3, and a third connector 4 are provided. A first load resistor 5 and a second load resistor 6 are provided inside the fixture housing 1. One end of the first load resistor 5 is connected to the first connector 2, and the other end of the first load resistor 5 is connected to the second connector 3. One end of the second load resistor 6 is connected to the second connector 3, and the other end of the second load resistor 6 is connected to the third connector 4.

[0027] The fixture housing 1 includes a mounting shell 101 and a cover plate 102. A mounting cavity 103 is provided within the mounting shell 101. A first connector 2, a second connector 3, and a third connector 4 are disposed on the mounting shell 101. A first load resistor 5 and a second load resistor 6 are disposed within the mounting cavity 103. The cover plate 102 covers the mounting shell 101 to seal the mounting cavity 103. The cover plate 102 is fixed to the mounting shell 101 by a plurality of fastening bolts 104. In one embodiment, the fastening bolts 104 are hexagonal socket head cap screws.

[0028] In one embodiment, the first connector 2, the second connector 3, and the third connector 4 are banana plugs.

[0029] The first connector 2, the second connector 3, and the third connector 4 are fixedly fixed to the fixture housing 1 at intervals. The first connector 2, the second connector 3, and the third connector 4 are fixed to the fixture housing 1 by interference fit. The fixture housing 1 is provided with three mounting holes, and the first connector 2, the second connector 3, and the third connector 4 are respectively interference-fitted into the corresponding mounting holes. One end of the first connector 2, the second connector 3, and the third connector 4 is located inside the fixture housing 1, and the other end of the first connector 2, the second connector 3, and the third connector 4 extends outside the fixture housing 1.

[0030] The first load resistor 5 is connected to the first connector 2, the first load resistor 5 is connected to the second load resistor 6 and the second connector 3, and the second load resistor 6 is connected to the third connector 4 via quick-connect terminals 7. Specifically, there are three quick-connect terminals 7 arranged side by side, with both ends of each quick-connect terminal 7 serving as connection terminals.

[0031] Specifically, one end of the first load resistor 5 is connected to one end of the quick-connect terminal 7, and the other end of the quick-connect terminal 7 is connected to the first connector 2 via a wire 8. Similarly, the other end of the first load resistor 5 and one end of the second load resistor 6 are connected to one end of the quick-connect terminal 7, and the other end of the quick-connect terminal 7 is connected to the second connector 3 via a wire 8. The other end of the second load resistor 6 is connected to one end of the quick-connect terminal 7, and the other end of the quick-connect terminal 7 is connected to the third connector 4 via a wire 8. In one embodiment, the wire 8 is connected and fixed to the first connector 2, the second connector 3, or the third connector 4 by soldering.

[0032] Example 2

[0033] A testing system using a portable aging plate testing fixture, referring to Figure 3 As shown, it includes an output power supply 9, an aging board, a first switch 10, a second switch 11, and a host computer.

[0034] The aging board has ports A, B, and C, which are connection ports. During self-testing, ports A, B, and C are used to connect to the portable aging board testing fixture. During aging tests of power semiconductor devices, ports A, B, and C are used to connect to the test socket on which the power semiconductor device is mounted.

[0035] A current sampling circuit is connected to port B of the aging board, and this circuit is connected to a host computer. The current sampling circuit collects the current value at port B of the aging board and then transmits the collected current value to the host computer for verification. In one embodiment, the current sampling circuit can use a current sensor.

[0036] The positive terminal of the output power supply 9 is connected to one end of the first switch 10 and the second switch 11, the negative terminal of the output power supply 9 is connected to port B of the aging board, the other end of the first switch 10 is connected to port A of the aging board, and the other end of the second switch 11 is connected to port C of the aging board.

[0037] The portable aging board testing fixture is used to plug into and fit onto ports A, B, and C of the aging board.

[0038] When the application testing system needs to perform self-testing on the aging board, the portable aging board testing fixture is inserted into ports A, B and C of the aging board. At this time, the two ends of the first load resistor 5 are connected to ports A and B of the aging board, respectively, and the two ends of the second load resistor 6 are connected to ports B and C of the aging board, respectively.

[0039] First, the first switch 10 is closed, and the output source flows from the positive terminal of the output power supply 9 to the A port of the aging board. After passing through the first load resistor 5, it flows to the B port of the aging board and then to the negative terminal of the output power supply 9. The current value of the B port of the aging board is collected by the current sampling circuit and transmitted to the host computer.

[0040] Since the resistance value of the first load resistor 5 and the voltage value of the output power supply 9 are fixed values, a standard current value can be obtained based on Ohm's law (I=U / R). The host computer compares the collected current value with the standard current value to determine whether the collected current value is within the error range of the standard current. The host computer can then quickly and effectively detect the status of ports A and B of the aging board.

[0041] Similarly, after completing the detection of ports A and B of the aging board, the first switch 10 is turned off and the second switch 11 is closed. The output source flows from the positive terminal of the output power supply 9 to port C of the aging board, then through the second load resistor 6 to port B of the aging board, and then to the negative terminal of the output power supply 9. The current value of port B of the aging board is collected by the current sampling circuit and transmitted to the host computer. The host computer compares the collected current value with the standard current value to determine whether the collected current value is within the error range of the standard current. The host computer can then quickly and effectively detect the status of ports B and C of the aging board.

[0042] After completing the self-test of the aging board, the aging board can be used to perform three reliability tests on power semiconductor devices: High Temperature Gate Bias (HTGB), High Temperature Reverse Bias (HTRB), and High Humidity High Temperature Reverse Bias (H3TRB).

[0043] First, remove the portable aging plate testing fixture from ports A, B, and C of the aging plate. Then, install the power semiconductor device in the test socket and install the test socket in ports A, B, and C of the aging plate to achieve aging testing of the power semiconductor device.

[0044] Therefore, this application has the following beneficial effects:

[0045] 1. Rapid detection: It abandons the complicated process of traditional detection methods. Only quick-release first load resistor 5 and second load resistor 6 are needed to quickly calculate the resistance value of the aging board according to Ohm's law, so as to quickly judge the condition of the aging board, greatly shorten the detection time and improve the detection efficiency.

[0046] 2. Real-time feedback: Through the collaborative work of the data acquisition and transmission module and the device computer, the measurement data can be transmitted and analyzed in real time. Operators can obtain the test results of the aging board on the device computer in a timely manner, so as to take corresponding measures in a timely manner.

[0047] 3. Precise and reliable: The equipment performs measurements independently, combined with precise calculations based on Ohm's law, which improves the accuracy and reliability of the detection and enables timely detection of subtle changes in the early stages of aging.

[0048] 4. High adaptability: The first load resistor 5 and the second load resistor 6 can be flexibly selected according to the characteristics of different aging boards and testing requirements, making it suitable for testing various types of aging boards.

[0049] 5. Easy to operate: The first load resistor 5 and the second load resistor 6 adopt an integrated quick-release design, which reduces the complexity of operation and improves the testing efficiency.

[0050] 6. Stability and Reliability: The first load resistor 5 and the second load resistor 6 are fixed with an insulating frame and metal screws, and high-quality wires 8 are used to reduce the risk of poor contact; the optimized circuit layout reduces signal interference and ensures test accuracy.

[0051] 7. Reusability: The first load resistor 5 and the second load resistor 6 have a simple structure, are reliable and low cost, and are reusable through high-quality materials and special surface treatment.

[0052] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A portable aging plate testing fixture, characterized in that, Includes a fixture housing (1), on which a first connector (2), a second connector (3) and a third connector (4) are provided, and inside the fixture housing (1) are a first load resistor (5) and a second load resistor (6); One end of the first load resistor (5) is connected to the first connector (2), the other end of the first load resistor (5) is connected to the second connector (3), one end of the second load resistor (6) is connected to the second connector (3), and the other end of the second load resistor (6) is connected to the third connector (4).

2. The portable aging board testing fixture according to claim 1, characterized in that, The first connector (2), the second connector (3) and the third connector (4) are banana plugs.

3. The portable aging plate testing fixture according to claim 1, characterized in that, The first connector (2), the second connector (3) and the third connector (4) are fixed at intervals on the fixture housing (1). One end of the first connector (2), the second connector (3) and the third connector (4) is located inside the fixture housing (1), and the other end of the first connector (2), the second connector (3) and the third connector (4) extends outside the fixture housing (1).

4. The portable aging board testing fixture according to claim 1, characterized in that, The first load resistor (5) is connected to the first connector (2), the first load resistor (5) and the second load resistor (6) and the second connector (3), and the second load resistor (6) and the third connector (4) are all connected via quick-connect terminals (7).

5. A portable aging board testing fixture according to claim 1, characterized in that, The fixture housing (1) includes a mounting shell (101) and a cover plate (102). The mounting shell (101) has a mounting cavity (103). The first connector (2), the second connector (3) and the third connector (4) are disposed on the mounting shell (101). The first load resistor (5) and the second load resistor (6) are disposed in the mounting cavity (103). The cover plate (102) covers the mounting shell (101) to close the mounting cavity (103). The cover plate (102) is fixed to the mounting shell (101) by a plurality of fastening bolts (104).

6. A testing system using the portable aging board testing fixture as described in any one of claims 1 to 5, characterized in that, It includes an output power supply (9), an aging board, a first switch (10), a second switch (11), and a host computer; The aging board has a port A, a port B and a port C. A current sampling circuit is connected to the port B of the aging board, and the current sampling circuit is connected to the host computer. The positive terminal of the output power supply (9) is connected to one end of the first switch (10) and the second switch (11), the negative terminal of the output power supply (9) is connected to port B of the aging board, the other end of the first switch (10) is connected to port A of the aging board, and the other end of the second switch (11) is connected to port C of the aging board. The portable aging board testing fixture is used to connect and fit onto ports A, B, and C of the aging board.

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