A resistance aging test machine

Abstract

This utility model provides a resistance aging tester, belonging to the technical field of testing instruments. It includes a main housing, with a multimeter embedded on one side. Storage grooves are formed on both sides of the bottom inner wall of the main housing. A circuit frame is fixedly connected to the top of the inner wall of the storage grooves, and a connecting wire is embedded in the middle of the circuit frame. A first torsion spring tension shaft is fixedly connected to one side of the circuit frame, and a second torsion spring tension shaft is fixedly connected to the other side. The connecting wire is wound around the outer walls of the first and second torsion spring tension shafts. L-shaped limiting grooves are formed on both sides of the bottom of the multimeter, and the L-shaped limiting grooves are sealed and connected to the storage grooves. A test connector is fixedly connected to one end of the connecting wire, and the test connector is located within the L-shaped limiting groove. This utility model provides a resistance aging tester that, by flipping the dust cover to the other side of the main housing and flipping the support plate hidden in the groove, forms a support structure with the dust cover, allowing the equipment to be erected for voltage and current testing.

Description

Technical Field

[0001] This utility model belongs to the field of testing instrument technology, specifically relating to a resistance aging tester. Background Technology

[0002] Existing resistance testing methods typically connect electrode lines to both ends of the resistor and then connect a multimeter to measure voltage and current to detect the aging of the resistor. However, the multimeter buttons are exposed, which can easily lead to accidental touches. Furthermore, the lack of protective structures makes delicate buttons such as the display screen easily scratched. The "Silicon Carbide Rod Resistance Aging Test Instrument" disclosed in application number "CN202121315937.X" represents an increasingly mature technology. It protects the multimeter's dial, buttons, and screen when not in use, preventing accidental touches or damage. It also provides good protection for the screen, thus ensuring the multimeter's effectiveness in testing silicon carbide rods. However, this device still has the following drawbacks: in actual use, the electrode lines need to be connected each time, and the testing cables are inconvenient to store after each use, making the entire device inconvenient to carry. Utility Model Content

[0003] The purpose of this invention is to provide a resistance aging tester, which aims to solve the problems in the prior art where electrode lines need to be connected each time it is used, the wires used for testing are inconvenient to store and preserve after each use, and the overall equipment is inconvenient to carry.

[0004] To achieve the above objectives, this utility model provides the following technical solution: It includes a main housing, with a multimeter embedded on one side of the main housing. Storage grooves are formed on both sides of the inner wall of the bottom of the main housing. A circuit frame is fixedly connected to the top of the inner wall of the storage groove. A connecting wire is embedded in the middle of the circuit frame. A first torsion spring tension shaft is fixedly connected to one side of the circuit frame, and a second torsion spring tension shaft is fixedly connected to the other side of the circuit frame. The connecting wire is wound around the outer walls of the first and second torsion spring tension shafts. L-shaped limiting grooves are formed on both sides of the bottom of the multimeter, and the L-shaped limiting grooves are sealed and connected to the storage grooves. A test connector is fixedly connected to one end of the connecting wire, and the test connector is located within the L-shaped limiting groove.

[0005] In one embodiment of the resistance aging tester of this utility model, the bottom of the main housing is provided with receiving grooves on both sides, the receiving grooves are sealed and connected to the storage groove, and the other end of the connecting line is fixedly connected to an electrode detection connector, which is located in the receiving groove.

[0006] In this solution, the test connector is pulled out of the L-shaped limiting groove and the end is inserted into the corresponding interface on the multimeter. The electrode test connector is pulled out of the receiving groove and used to connect the two poles of the resistor for power testing.

[0007] In one embodiment of the resistance aging tester of this utility model, the main housing is provided with movable grooves on both sides, a movable block is slidably connected in the movable groove, a connecting rod is rotatably connected in the middle of the movable block, and a dust cover is hinged to one end of the connecting rod.

[0008] In this solution, the dust cover is flipped over, which drives the connecting rod and the moving block moves in the moving groove, flipping the dust cover to the side of the main housing, covering one side of the multimeter and protecting the surface of the multimeter.

[0009] In one embodiment of the resistance aging tester of this utility model, a hidden groove is provided on one side of the dust cover, a support plate is hinged to the top of the inner wall of the hidden groove, and an anti-slip pad is provided at the bottom of the support plate.

[0010] In this solution, during use, the dust cover is flipped to the other side of the main housing, and the support plate in the hidden slot is flipped over. The support plate and the dust cover form a support structure to stand the equipment upright, which facilitates voltage and current testing and improves equipment stability.

[0011] In one embodiment of the resistance aging tester of this utility model, the first torsion spring tension shaft and the second torsion spring tension shaft are both composed of a connecting shaft, a connecting sleeve, and a torsion spring spring. One end of the torsion spring spring is fixedly connected to the outer wall of the connecting shaft, and one end of the torsion spring spring is fixedly connected to the inner wall of the connecting sleeve. The connecting shaft is fixedly connected to both sides of the circuit frame, and one end of the connecting shaft is rotatably connected to one side of the inner wall of the connecting sleeve.

[0012] In this solution, during the pulling out of the electrode detection connector and the test connector, the connecting line wound on the connecting sleeve drives the connecting sleeve to rotate. The connecting sleeve compresses the torsion spring connected to it. After use, as the torsion spring rebounds, the connecting sleeve rotates back to reset and rewind the connecting line, retracting the electrode detection connector and the test connector into the receiving groove and the L-shaped limiting groove respectively for storage, making it easy to carry the line.

[0013] In one embodiment of the resistance aging tester of this utility model, a first magnetic sheet is symmetrically embedded on the top of the main housing, and a second magnetic sheet is embedded on the top and bottom of the dust cover, and the first magnetic sheet and the second magnetic sheet attract each other.

[0014] In this design, after the dust cover is placed on the surface of the main housing, the first magnetic sheet and the second magnetic sheet attract each other to limit the dust cover, so that the dust cover covers the surface of the main housing and protects the surface of the multimeter.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1) When the test connector and electrode detection connector are pulled out, the connecting line wound on the connecting sleeve drives the connecting sleeve to rotate. The connecting sleeve squeezes the torsion spring connected to it. When the use is finished, as the torsion spring spring rebounds, the connecting sleeve rotates back to reset and rewinds the connecting line, and retracts the electrode detection connector and test connector into the receiving groove and L-shaped limiting groove respectively for storage, which is convenient for the line to be carried.

[0017] 2) By flipping the dust cover to the other side of the main housing and flipping the support plate in the hidden slot, the support plate and the dust cover form a support structure to stand the equipment upright, which facilitates voltage and current testing and improves the stability of the equipment. After use, flip the dust cover to cover the other side of the main housing to protect the surface of the multimeter. Attached Figure Description

[0018] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0019] Figure 1 This is a schematic diagram of the structure of this utility model;

[0020] Figure 2 This is one of the structural schematic diagrams of this utility model;

[0021] Figure 3 This is a schematic diagram of the cross-sectional structure of the main shell of this utility model;

[0022] Figure 4 This is one of the schematic diagrams of the cross-sectional structure of the main shell of this utility model;

[0023] Figure 5 This is a schematic diagram of the connecting shaft structure of this utility model.

[0024] In the diagram: 1. Main housing; 2. Multimeter; 3. Storage slot; 4. Circuit board; 5. Connecting circuit; 6. First torsion spring tension shaft; 7. Second torsion spring tension shaft; 71. Connecting shaft; 72. Connecting sleeve; 73. Torsion spring spring; 8. L-shaped limiting slot; 9. Test connector; 10. Receiving slot; 11. Electrode detection connector; 12. Moving slot; 13. Moving block; 14. Connecting rod; 15. Dust cover; 161. Hidden slot; 162. Support plate; 163. Anti-slip pad; 17. First magnetic sheet; 18. Second magnetic sheet. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] Please see Figure 1-5 The present invention provides the following technical solution: a resistance aging tester, comprising a main housing 1, a multimeter 2 embedded on one side of the main housing 1, storage grooves 3 on both sides of the bottom inner wall of the main housing 1, a circuit frame 4 fixedly connected to the top of the inner wall of the storage groove 3, a connecting line 5 embedded in the middle of the circuit frame 4, a first torsion spring tension shaft 6 fixedly connected to one side of the circuit frame 4, a second torsion spring tension shaft 7 fixedly connected to the other side of the circuit frame 4, the connecting line 5 being wound and connected to the outer walls of the first torsion spring tension shaft 6 and the second torsion spring tension shaft 7, an L-shaped limiting groove 8 on both sides of the bottom of the multimeter 2, the L-shaped limiting groove 8 being sealed and connected to the storage groove 3, and a test connector 9 fixedly connected to one end of the connecting line 5, the test connector 9 being disposed in the L-shaped limiting groove 8.

[0027] In a specific embodiment of a resistance aging test machine, please refer to Figure 3-4 The main housing 1 has receiving grooves 10 on both sides of the bottom. The receiving grooves 10 are sealed and connected to the storage groove 3. The other end of the connecting line 5 is fixedly connected to the electrode detection connector 11, which is located in the receiving groove 10.

[0028] Please see Figure 3-4 Pull the test connector 9 out of the L-shaped limiting groove 8 and insert the end into the corresponding interface on the multimeter 2. Pull the electrode test connector 11 to pull it out of the receiving groove 10. This is used to connect the two poles of the resistor for power testing.

[0029] In a specific embodiment of a resistance aging test machine, please refer to Figure 1-2 The main housing 1 has movable slots 12 on both sides, and movable blocks 13 are slidably connected in the movable slots 12. A connecting rod 14 is rotatably connected in the middle of the movable block 13, and a dust cover 15 is hinged to one end of the connecting rod 14.

[0030] Please see Figure 1-2 Flip the dust cover 15, which drives the connecting rod 14 and the moving block 13 to move in the moving groove 12, flipping the dust cover 15 to one side of the main housing 1, covering one side of the multimeter 2, and protecting the surface of the multimeter 2.

[0031] In a specific embodiment of a resistance aging test machine, please refer to Figure 1-2The dust cover 15 has a hidden groove 161 on one side, and a support plate 162 is hinged to the top of the inner wall of the hidden groove 161. The bottom of the support plate 162 is provided with an anti-slip pad 163.

[0032] Please see Figure 1-2 During use, such as Figure 1 Figure 2 As shown, the dust cover 15 is flipped to the other side of the main housing 1, and the support plate 162 in the hidden groove 161 is flipped. The support plate 162 and the dust cover 15 form a support structure to stand the equipment up, which facilitates voltage and current testing of the equipment and improves the stability of the equipment.

[0033] In a specific embodiment of a resistance aging test machine, please refer to Figure 5 Both the first torsion spring tension shaft 6 and the second torsion spring tension shaft 7 are composed of a connecting shaft 71, a connecting sleeve 72, and a torsion spring spring 73. One end of the torsion spring spring 73 is fixedly connected to the outer wall of the connecting shaft 71, and the other end of the torsion spring spring 73 is fixedly connected to the inner wall of the connecting sleeve 72. The connecting shaft 71 is fixedly connected to both sides of the line frame 4, and one end of the connecting shaft 71 is rotatably connected to one side of the inner wall of the connecting sleeve 72.

[0034] Please see Figure 5 During the pulling out of electrode detection connector 11 and test connector 9, the connecting line 5 wound on the connecting sleeve 72 drives the connecting sleeve 72 to rotate. The connecting sleeve 72 compresses the torsion spring 73 connected to it. After use, as the torsion spring 73 rebounds, the connecting sleeve 72 rotates back to reset and rewinds the connecting line 5, retracting the electrode detection connector 11 and test connector 9 into the receiving groove 10 and L-shaped limiting groove 8 respectively for storage, making it convenient for the line to be carried.

[0035] In a specific embodiment of a resistance aging test machine, please refer to Figure 1 The top of the main housing 1 is symmetrically embedded with a first magnetic sheet 17, and the top and bottom of the dust cover 15 are embedded with a second magnetic sheet 18. The first magnetic sheet 17 and the second magnetic sheet 18 attract each other.

[0036] Please see Figure 1 After the dust cover 15 is placed on the surface of the main housing 1, the first magnetic piece 17 and the second magnetic piece 18 attract each other and limit the dust cover 15, so that the dust cover 15 covers the surface of the main housing 1 and protects the surface of the multimeter 2.

[0037] The present invention provides a resistance aging tester, the specific usage of which is as follows: The test connector 9 is pulled out from the L-shaped limiting groove 8 and its end is inserted into the corresponding interface on the multimeter 2. The electrode detection connector 11 is pulled out from the receiving groove 10. The connecting line 5 wound on the connecting sleeve 72 causes the connecting sleeve 72 to rotate, and the connecting sleeve 72 compresses the torsion spring 73 connected to it. After use, as the torsion spring 73 rebounds, the connecting sleeve 72 rotates back to its original position and rewinds the connecting line 5, connecting the electrode detection connector 11 to the test connector. 9. The dust cover 15 is retracted into the receiving groove 10 and the L-shaped limiting groove 8 respectively for easy carrying of the circuit. The dust cover 15 is flipped to the other side of the main housing 1. The support plate 162 in the hidden groove 161 is flipped over. The support plate 162 and the dust cover 15 form a support structure. After the dust cover 15 is placed on the surface of the main housing 1, the first magnetic piece 17 and the second magnetic piece 18 attract each other and limit the dust cover 15, so that the equipment can be stood up, which facilitates voltage and current testing of the equipment and improves the stability of the equipment. After use, the dust cover 15 is flipped over to cover the other side of the main housing 1 to protect the surface of the multimeter 2.

[0038] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A resistance aging tester comprising a main housing (1), characterized in that: A multimeter (2) is embedded on one side of the main housing (1). Storage grooves (3) are opened on both sides of the bottom inner wall of the main housing (1). A circuit frame (4) is fixedly connected to the top of the inner wall of the storage groove (3). A connecting line (5) is embedded in the middle of the circuit frame (4). A first torsion spring tension shaft (6) is fixedly connected to one side of the circuit frame (4). A second torsion spring tension shaft (7) is fixedly connected to the other side of the circuit frame (4). The connecting line (5) is wound around the outer wall of the first torsion spring tension shaft (6) and the second torsion spring tension shaft (7). L-shaped limiting grooves (8) are opened on both sides of the bottom of the multimeter (2). The L-shaped limiting grooves (8) are sealed and connected to the storage groove (3). A test connector (9) is fixedly connected to one end of the connecting line (5). The test connector (9) is located in the L-shaped limiting groove (8).

2. The resistance aging tester according to claim 1, wherein: The main housing (1) has receiving grooves (10) on both sides of its bottom. The receiving grooves (10) are sealed and connected to the storage groove (3). The other end of the connecting line (5) is fixedly connected to an electrode detection connector (11), which is located in the receiving groove (10).

3. The resistance aging tester according to claim 1, characterized in that: The main housing (1) has movable slots (12) on both sides. A movable block (13) is slidably connected in the movable slot (12). A connecting rod (14) is rotatably connected in the middle of the movable block (13). A dust cover (15) is hinged to one end of the connecting rod (14).

4. The resistance aging tester according to claim 3, characterized in that: The dust cover (15) has a hidden groove (161) on one side, and a support plate (162) is hinged to the top of the inner wall of the hidden groove (161). The bottom of the support plate (162) is provided with an anti-slip pad (163).

5. A resistance aging tester according to claim 1, characterized in that: Both the first torsion spring tension shaft (6) and the second torsion spring tension shaft (7) are composed of a connecting shaft (71), a connecting sleeve (72), and a torsion spring spring (73). One end of the torsion spring spring (73) is fixedly connected to the outer wall of the connecting shaft (71), and the other end of the torsion spring spring (73) is fixedly connected to the inner wall of the connecting sleeve (72). The connecting shaft (71) is fixedly connected to both sides of the line frame (4), and one end of the connecting shaft (71) is rotatably connected to one side of the inner wall of the connecting sleeve (72).

6. A resistance aging tester according to claim 3, characterized in that: The main housing (1) is symmetrically fitted with a first magnetic sheet (17) at the top, and the dust cover (15) is fitted with a second magnetic sheet (18) at the top and bottom. The first magnetic sheet (17) and the second magnetic sheet (18) attract each other.

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