Capacitor aging test system

Abstract

This utility model discloses a capacitor aging test system, relating to the field of capacitor testing technology. The capacitor aging test system includes a capacitor test cabinet, multiple test circuit boards, a temperature control device, a power supply device, and a capacitor mounting bracket. The capacitor test cabinet has multiple test racks inside, each rack having multiple test rails spaced apart. Each test rail has a test probe at its end. Each test circuit board is electrically connected to its corresponding test probe. The power supply device is electrically connected to the multiple test circuit boards. The capacitor mounting bracket is slidably mounted on the corresponding test rails. The capacitor mounting bracket includes a connector, a connecting circuit board, and multiple capacitor mounting fixtures. The connector is located on the side of the capacitor mounting bracket closest to the test probes. The connecting circuit board is electrically connected to both the connector and the capacitor mounting fixtures. Each capacitor mounting fixture includes a first pin clip and a second pin clip. This embodiment of the capacitor aging test system can improve the efficiency of capacitor aging tests.

Description

Technical Field

[0001] This utility model relates to the field of capacitance testing technology, and in particular to a capacitance aging testing system. Background Technology

[0002] In the capacitor manufacturing process, aging tests are necessary to ensure stable performance during future use and to eliminate prematurely failed products; this is an important quality control measure. Aging tests should ideally be conducted in batches to improve efficiency. However, current technology makes capacitor installation and removal cumbersome, and the connection between the capacitor and the test circuit board complex. This results in significant time commitments for each batch of capacitors during installation and connection, hindering efficiency. Utility Model Content

[0003] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a capacitor aging test system that can improve the efficiency of capacitor aging tests.

[0004] The capacitor aging test system according to an embodiment of the present invention includes:

[0005] A capacitance testing cabinet, wherein the interior of the capacitance testing cabinet is provided with multiple test racks, each of the test racks is provided with multiple test rails spaced apart, and each test rail is provided with a test probe at its end;

[0006] Multiple test circuit boards are disposed inside the capacitance test cabinet, and each test circuit board is electrically connected to the corresponding test probe.

[0007] A temperature regulating device is installed inside the capacitance testing cabinet, and the temperature regulating device is used to regulate the temperature inside the capacitance testing cabinet;

[0008] A power supply unit is electrically connected to multiple of the test circuit boards;

[0009] A capacitor mounting bracket is slidably disposed on a corresponding test rail. The capacitor mounting bracket includes a connector, a connecting circuit board, and multiple capacitor mounting fixtures. The connector is disposed on the side of the capacitor mounting bracket near the test probe and is used for electrical connection with the corresponding test probe. The connecting circuit board is electrically connected to the connector and the capacitor mounting fixtures respectively. Each capacitor mounting fixture includes a first pin clip and a second pin clip.

[0010] According to some embodiments of the present invention, the capacitor mounting fixture further includes:

[0011] A fixing frame, wherein the first pin clip is disposed on the first side of the first surface of the fixing frame, and the second pin clip is disposed on the second side of the second surface of the fixing frame, and the first pin clip and the second pin clip are disposed diagonally opposite each other;

[0012] A first connecting terminal is disposed on a first side of the second surface of the fixing frame, opposite to the first pin clip, and the first connecting terminal is electrically connected to the connecting circuit board through a first wire.

[0013] The second connection terminal is disposed on the second side of the first surface of the fixing frame, opposite to the second pin clip, and is electrically connected to the connection circuit board through the second wire.

[0014] According to some embodiments of the present invention, the bottom of the fixing frame is provided with a first positioning hole, the capacitor mounting frame is provided with a mounting groove for placing the capacitor mounting fixture, the mounting groove is provided with a second positioning hole corresponding to the first positioning hole, and the capacitor mounting fixture is fixed in the mounting groove by positioning members passing through the first positioning hole and the second positioning hole.

[0015] According to some embodiments of the present invention, the first pin clip includes:

[0016] The pressing piece is hinged to the fixing frame via a pivot pin;

[0017] A guide rod is inserted through the lower end of the pressing piece;

[0018] An elastic element is sleeved on the outside of the guide rod and located between the pressing piece and the fixing frame.

[0019] According to some embodiments of the present invention, the capacitor mounting bracket further includes a push-pull handle, which is disposed on the side of the capacitor mounting bracket opposite to the connector.

[0020] According to some embodiments of this utility model, the capacitance testing cabinet is also provided with an operation and display interface.

[0021] According to some embodiments of this utility model, the capacitor test cabinet is also provided with multiple operation buttons.

[0022] According to some embodiments of this utility model, a temperature sensor is installed inside the capacitance testing cabinet.

[0023] The capacitor aging test system according to the present invention has at least the following beneficial effects: the capacitor is fixed by a capacitor mounting fixture, multiple capacitor mounting fixtures are fixed by a capacitor mounting frame, and the capacitor is connected to the test circuit board by a connecting circuit board and a connector of the capacitor mounting frame. This makes it more convenient to install a batch of capacitors and connect them to the test circuit board when performing batch aging tests, thereby improving the efficiency of capacitor aging tests.

[0024] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0025] The above and / or additional aspects and advantages of this utility model will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0026] Figure 1 This is a schematic diagram of the capacitor testing cabinet according to an embodiment of the present invention;

[0027] Figure 2 This is a schematic diagram of the internal structure of the capacitor test cabinet according to an embodiment of the present utility model;

[0028] Figure 3 This is a structural schematic diagram of the capacitor test cabinet from another perspective of an embodiment of this utility model;

[0029] Figure 4 This is an exploded view of the capacitor mounting bracket according to an embodiment of the present invention;

[0030] Figure 5 This is a schematic diagram of the capacitor mounting fixture according to an embodiment of the present invention;

[0031] Figure 6 This is a structural schematic diagram of the capacitor mounting fixture from another perspective of an embodiment of the present utility model;

[0032] Figure label:

[0033] The components include: a capacitor test cabinet 100, a test rack 110, a test rail 120, a test probe 130, an operation and display interface 140, operation buttons 150, a test circuit board 200, a power supply unit 300, a capacitor mounting bracket 400, a mounting slot 410, a positioning component 420, a push-pull handle 430, a connector 500, a capacitor mounting fixture 600, a first pin clamp 610, a pressing plate 611, a guide rod 612, a second pin clamp 620, a fixing bracket 630, a first connecting terminal 640, a first wire 650, a second connecting terminal 660, a second wire 670, and a first positioning hole 680. Detailed Implementation

[0034] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application. The step numbers in the following embodiments are set only for ease of explanation, and there is no limitation on the order between the steps. The execution order of each step in the embodiments can be adaptively adjusted according to the understanding of those skilled in the art.

[0035] In the description of this utility model, it should be understood that the directional descriptions, such as up, down, front, back, left, right, etc., indicate the directional or positional relationship based on the directional or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0036] The terms "first," "second," "third," and "fourth," etc., used in the specification, claims, and accompanying drawings of this utility model are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0037] In this invention, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0038] This utility model embodiment proposes a capacitor aging test system. The capacitor is fixed by a capacitor mounting fixture, and multiple capacitor mounting fixtures are fixed by a capacitor mounting frame. The capacitor is connected to the test circuit board by a connecting circuit board and a connector of the capacitor mounting frame. This makes the installation of a batch of capacitors and the connection between the capacitors and the test circuit board more convenient when performing batch aging tests, thereby improving the efficiency of capacitor aging tests.

[0039] The following is a reference to the appendix. Figure 1-6 This article provides a detailed description of the capacitor aging test system according to embodiments of the present invention.

[0040] This utility model embodiment proposes a capacitor aging test system, such as Figures 1 to 6 As shown, the capacitor aging test system includes a capacitor test cabinet 100, multiple test circuit boards 200, a temperature control device (not shown), a power supply device 300, and a capacitor mounting bracket 400. Among these, as... Figure 2 As shown, the capacitor testing cabinet 100 has multiple test racks 110 inside, each test rack 110 has multiple test rails 120 spaced apart, and each test rail 120 has a test probe 130 at its end; as shown Figure 3 As shown, test circuit boards 200 are disposed within the capacitance test cabinet 100, and each test circuit board 200 is electrically connected to a corresponding test probe 130; a temperature regulating device is disposed within the capacitance test cabinet 100 and is used to regulate the temperature within the capacitance test cabinet 100; a power supply device 300 is disposed within the capacitance test cabinet 100 and is electrically connected to multiple test circuit boards 200; and a capacitor mounting bracket 400 is slidably disposed on a corresponding test rail 120, as shown. Figure 4 As shown, the capacitor mounting bracket 400 includes a connector 500, a connecting circuit board (not shown), and multiple capacitor mounting fixtures 600. The connector 500 is located on the side of the capacitor mounting bracket 400 near the test probe 130 and is used for electrical connection with the test probe 130. The connecting circuit board is electrically connected to the connector 500 and the capacitor mounting fixtures 600 respectively. Figure 5 As shown, each capacitor mounting fixture 600 includes a first pin clip 610 and a second pin clip 620.

[0041] Specifically, in the capacitor aging test system according to this embodiment of the present invention, each capacitor mounting fixture 600 can mount one capacitor to be aged, such as... Figure 5As shown, the capacitor mounting fixture 600 includes a first pin clamp 610 and a second pin clamp 620. The first pin clamp 610 and the second pin clamp 620 are used to clamp the two pins of the capacitor, thereby fixing the capacitor and making the capacitor electrically connected to the connecting circuit board through the capacitor mounting fixture 600. The connecting circuit board is disposed on the capacitor mounting bracket 400 and located at the bottom of the capacitor mounting fixture 600. One capacitor mounting bracket 400 can mount multiple capacitor mounting fixtures 600 and one connecting circuit board. The capacitors on the multiple capacitor mounting fixtures 600 are all electrically connected to the connecting circuit board. At the same time, since the connecting circuit board is connected to the connector 500, the capacitors on the capacitor mounting bracket 400 can all be electrically connected to the connector 500 through the connecting circuit board. On the connector 500, multiple sets of connection probes are provided, and each set of connection probes corresponds to the first capacitor. After the capacitors are mounted onto the capacitor mounting fixture 600 of the capacitor mounting bracket 400, the entire capacitor mounting bracket 400 is placed on one of the test rails 120 of one of the test racks 110 inside the capacitor test cabinet 100. The capacitor mounting bracket 400 is then moved along the test rail 120 into the capacitor test cabinet 100, so that the connector 500 connects to the test probe 130 at the end of the test rail 120. Multiple sets of test probes 130 are also present, each corresponding to a specific set of connection probes. Simultaneously, test circuit boards 200 are located on the back of the capacitor test cabinet 100. Each test circuit board 200 is connected to a corresponding test probe 130, enabling the test circuit board 200 to be electrically connected to all the capacitors on the capacitor mounting bracket 400 via the test probes 130, connectors 500, and the connection circuit board. After the test circuit board 200 is connected to the capacitor, the power supply unit 300 supplies power to the capacitor through the test circuit board 200, causing the capacitor to gradually increase its voltage until it reaches a preset voltage value. The voltage and current of the capacitor are then collected through the test circuit board 200, thereby realizing the aging test of the capacitor. In addition, during the aging test of the capacitor, it is also necessary to maintain the internal temperature of the capacitor test cabinet 100 at a preset temperature. Therefore, the temperature inside the capacitor test cabinet 100 needs to be regulated by a temperature control device.

[0042] According to the capacitor aging test system of this utility model embodiment, the capacitor is fixed by the capacitor mounting fixture 600, and multiple capacitor mounting fixtures 600 are fixed by the capacitor mounting bracket 400. Then, the capacitor is connected to the test circuit board 200 by the connecting circuit board and connector 500 of the capacitor mounting bracket 400. This makes the installation of batch capacitors and the connection of capacitors to the test circuit board 200 more convenient when performing batch aging tests on capacitors, thereby improving the efficiency of capacitor aging tests.

[0043] Furthermore, such as Figure 5 and Figure 6As shown, in some embodiments of this application, the capacitor mounting fixture 600 further includes a mounting bracket 630, a first connecting terminal 640, and a second connecting terminal 660, wherein the first lead clip 610 is disposed on a first side of the first surface of the mounting bracket 600 (i.e., Figure 5 The second pin clip 620 is disposed on the second side of the second surface of the fixing bracket 630 (i.e., the front left side of the fixing bracket 630). Figure 5 (The mounting bracket 630 shown is located on the rear right side). The first pin clip 610 and the second pin clip 620 are arranged diagonally opposite each other. The first connecting terminal 640 is located on the first side of the second surface of the mounting bracket 630 (i.e., the first connecting terminal 640 is located on the second side of the mounting bracket 630). Figure 5 The mounting bracket 630 shown is located on the left side of the rear of the mounting bracket 630, opposite to the first pin clip 610. The first connecting terminal 640 is electrically connected to the connecting circuit board via the first wire 650; the second connecting terminal 660 is located on the second side of the first surface of the mounting bracket 600 (i.e., the second side of the first surface of the mounting bracket 600). Figure 5 The mounting bracket 630 shown is positioned on the front right side, opposite to the second pin clamp 620. The second connection terminal 660 is electrically connected to the connecting circuit board via the second wire 670. It should be noted that when mounting a capacitor on the capacitor mounting fixture 600, the first pin clamp 610 and the second pin clamp 620 are opened, and the two pins of the capacitor are placed in the first pin clamp 610 and the second pin clamp 620 respectively. Then, the first pin clamp 610 and the second pin clamp 620 are closed to fix the two pins of the capacitor. When the first pin clamp 610 and the second pin clamp 620 clamp the capacitor pins, the capacitor pins come into contact with the first connection terminal 640 and the second connection terminal 660, thus achieving an electrical connection. The capacitor pins are electrically connected to the connecting circuit board via the first connection terminal 640, the second connection terminal 660, the first wire 650, and the second wire 670.

[0044] Furthermore, such as Figure 4 As shown, in some embodiments of this application, the bottom of the mounting bracket 630 is provided with a first positioning hole 680, and the capacitor mounting bracket 400 is provided with a mounting groove 410 for placing the capacitor mounting fixture 600. A second positioning hole corresponding to the first positioning hole 680 is provided in the mounting groove 410. The capacitor mounting fixture 600 is fixed in the mounting groove 410 by positioning elements 420 passing through the first positioning hole 680 and the second positioning hole. The positioning element 420 can be a screw or similar component, which fixes the capacitor mounting fixture 600 to the capacitor mounting bracket 400.

[0045] Furthermore, such as Figure 5As shown, in some embodiments of this application, the first pin clip 610 includes a pressing piece 611, a guide rod 612, and an elastic element (not shown). The pressing piece 611 is hinged to the fixing frame 630 via a pin. The guide rod 612 passes through the lower end of the pressing piece 611. The elastic element is sleeved outside the guide rod 612 and located between the pressing piece 611 and the fixing frame 630. When the first pin clip 610 is to be opened, the lower end of the pressing piece 611 is pressed down, and the lower end of the pressing piece 611 compresses the elastic element backward along the guide rod 612, causing the upper end of the pressing piece 611 to move forward, thereby opening the first pin clip 610. When the lower end of the pressing piece 611 is released, the elastic element returns to its original position. Under the elastic force of the elastic element, the lower end of the pressing piece 611 returns to its original position, causing the upper end of the pressing piece 611 to return to its original position backward, thereby closing the first pin clip 610.

[0046] Furthermore, such as Figure 4 As shown, in some embodiments of this application, the capacitor mounting bracket 400 further includes a push-pull handle 430, which is disposed on the side of the capacitor mounting bracket 400 opposite to the connector 500. By providing the push-pull handle 430, it is convenient for the operator to push the capacitor mounting bracket 400 along the test guide rail 120 into the capacitor test cabinet 100, or to remove the capacitor mounting bracket 400 from the capacitor test cabinet 100 along the test guide rail 120.

[0047] Furthermore, such as Figure 2 As shown in some embodiments of this application, the capacitor test cabinet 100 is also provided with an operation and display interface 140. The operation and display interface 140 is used for users to set the operating status of the capacitor test cabinet 100 and display the aging test results of the capacitor. At the same time, when an abnormality is found in the aging test process, a warning message can be displayed on the operation and display interface 140.

[0048] Furthermore, such as Figure 2 As shown, in some embodiments of this application, the capacitance test cabinet 100 is also provided with multiple operation buttons 150. The operation buttons 150 include power on, power off, emergency stop, etc., to facilitate user control of the status of the capacitance test cabinet 100.

[0049] Furthermore, in some embodiments of this application, a temperature sensor is installed inside the capacitor testing cabinet 100 to detect the temperature inside the capacitor testing cabinet 100 and ensure the temperature load requirements inside the capacitor testing cabinet 100 are met. It should be noted that in this example, the temperature regulation device includes a heating device and a cooling device. The heating device is used to increase the temperature inside the capacitor testing cabinet 100, and the cooling device is used to decrease the temperature inside the capacitor testing cabinet 100. Specifically, the heating device can use a resistance wire, heating tube, etc., to heat the capacitor; the cooling device can use a cooling fan or a cooling plate, etc., to cool the capacitor.

[0050] According to the capacitor aging test system of this utility model embodiment, the capacitor is fixed by the capacitor mounting fixture 600, and multiple capacitor mounting fixtures 600 are fixed by the capacitor mounting bracket 400. Then, the capacitor is connected to the test circuit board 200 by the connecting circuit board and connector 500 of the capacitor mounting bracket 400. This makes the installation of batch capacitors and the connection of capacitors to the test circuit board 200 more convenient when performing batch aging tests on capacitors, thereby improving the efficiency of capacitor aging tests.

[0051] The above is a detailed description of the preferred embodiments of the present utility model. However, the present utility model is not limited to the above embodiments. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present utility model. All such equivalent modifications or substitutions are included within the scope defined by the claims of the present utility model.

Claims

1. A system for testing the aging of a capacitor, comprising: include: A capacitance testing cabinet, wherein the interior of the capacitance testing cabinet is provided with multiple test racks, each of the test racks is provided with multiple test rails spaced apart, and each test rail is provided with a test probe at its end; Multiple test circuit boards are disposed inside the capacitance test cabinet, and each test circuit board is electrically connected to the corresponding test probe. A temperature regulating device is installed inside the capacitance testing cabinet, and the temperature regulating device is used to regulate the temperature inside the capacitance testing cabinet; A power supply unit is electrically connected to multiple of the test circuit boards; A capacitor mounting bracket is slidably disposed on a corresponding test rail. The capacitor mounting bracket includes a connector, a connecting circuit board, and multiple capacitor mounting fixtures. The connector is disposed on the side of the capacitor mounting bracket near the test probe and is used for electrical connection with the corresponding test probe. The connecting circuit board is electrically connected to the connector and the capacitor mounting fixtures respectively. Each capacitor mounting fixture includes a first pin clip and a second pin clip.

2. The capacitor aging test system according to claim 1, characterized in that, The capacitor mounting fixture also includes: A fixing frame, wherein the first pin clip is disposed on the first side of the first surface of the fixing frame, and the second pin clip is disposed on the second side of the second surface of the fixing frame, and the first pin clip and the second pin clip are disposed diagonally opposite each other; A first connecting terminal is disposed on a first side of the second surface of the fixing frame, opposite to the first pin clip, and the first connecting terminal is electrically connected to the connecting circuit board through a first wire. The second connection terminal is disposed on the second side of the first surface of the fixing frame, opposite to the second pin clip, and is electrically connected to the connection circuit board through the second wire.

3. The capacitor aging test system according to claim 2, characterized in that, The bottom of the fixing frame is provided with a first positioning hole, and the capacitor mounting frame is provided with a mounting groove for placing the capacitor mounting fixture. The mounting groove is provided with a second positioning hole corresponding to the first positioning hole. The capacitor mounting fixture is fixed in the mounting groove by positioning members passing through the first positioning hole and the second positioning hole.

4. The capacitor aging test system according to claim 2, characterized in that, The first pin clip includes: The pressing piece is hinged to the fixing frame via a pivot pin; A guide rod is inserted through the lower end of the pressing piece; An elastic element is sleeved on the outside of the guide rod and located between the pressing piece and the fixing frame.

5. The capacitor aging test system according to claim 1, characterized in that, The capacitor mounting bracket also includes a push-pull handle, which is located on the side of the capacitor mounting bracket opposite to the connector.

6. The capacitor aging test system according to claim 1, characterized in that, The capacitance test cabinet is also equipped with an operation and display interface.

7. The capacitor aging test system according to claim 1, characterized in that, The capacitor test cabinet is also equipped with multiple operation buttons.

8. The capacitor aging test system according to claim 1, characterized in that, A temperature sensor is installed inside the capacitance test cabinet.

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