Electromechanical product testing system
By designing a testing system for electromechanical products that supports LIN communication, a single LIN device is used to achieve synchronous control and protocol conversion of multiple electromechanical products. This solves the problem that existing systems cannot support LIN communication, reduces testing costs, and improves efficiency.
CN224436486UActive Publication Date: 2026-06-30PANGEO TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- PANGEO TECH CO LTD
- Filing Date
- 2025-07-21
- Publication Date
- 2026-06-30
AI Technical Summary
Technical Problem
Existing electromechanical product testing systems cannot support LIN communication, resulting in high testing costs and low efficiency.
Method used
Design an electromechanical product testing system, including a testing device, a CAN device, and a LIN device. The system can control at least two electromechanical products through a single LIN device, and convert LIN protocol data into CAN protocol data to achieve hardware resource reuse and protocol compatibility conversion, and synchronously control multiple electromechanical products.
Benefits of technology
It reduced testing costs, improved testing efficiency, and enabled synchronous control and protocol compatibility conversion of multiple electromechanical products.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN224436486U_ABST
Abstract
This application discloses a testing system for electromechanical products. The system includes: a testing device comprising a test computer and a test bench; a CAN device for communication with both the test computer and the test bench; a LIN device connected to the test computer, providing at least two LIN interfaces, each LIN interface for connecting one electromechanical product, wherein the electromechanical products communicate using the LIN protocol; and an output shaft of the electromechanical product connected to the testing device. This approach reduces testing costs and improves testing efficiency.
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