An integrated tire sensor dedicated test tool

Abstract

This application discloses a dedicated testing fixture for an integrated tire sensor. The tire sensor has a pair of external power supply contacts R+ / R-, a pair of communication contacts BG / RS, and a pair of internal power on contacts R1 / R2. The dedicated testing fixture includes a sensor clamp, a programmer, a debugger, and a toggle switch. The sensor clamp includes a set of spring pins for engaging the external power supply contacts, communication contacts, and internal power on contacts, as well as a telescopic plunger for limiting and fixing the integrated tire sensor. The spring pins are electrically connected to the common terminal of the toggle switch. The toggle switch includes at least a first switching terminal and a second switching terminal. The first switching terminal is electrically connected to the programmer, and the second switching terminal is electrically connected to the debugger. This application uses a dedicated sensor clamp to connect the sensor, facilitating assembly and disassembly. By switching between the programmer and debugger via the toggle switch, a single testing fixture can complete the programming and debugging of the tire sensor.

Description

Technical Field

[0001] This application provides a dedicated testing fixture for integrated tire sensors, relating to the field of tire sensor testing technology. Background Technology

[0002] Before being put into use or during maintenance, tire sensors need to be programmed, debugged, and measured. Current technology generally connects the tire sensors to a programmer, debugger, and ammeter separately for programming, debugging, and testing. This requires a set of testing fixtures for each of the programming, debugging, and testing processes, resulting in low testing efficiency. Utility Model Content

[0003] The technical problem this application aims to solve is how to complete the programming and debugging of tire sensors using a set of tooling.

[0004] To solve the above technical problems, the technical solution of this application provides a dedicated test fixture for an integrated tire sensor. The tire sensor is provided with a pair of external power supply contacts R+\R-, a pair of communication contacts BG\RS, and a pair of internal power conduction contacts R1\R2. The dedicated test fixture includes a sensor fixture, a programmer, a debugger, and a toggle switch.

[0005] The sensor fixture includes a set of spring pins for docking the external power supply contact, communication contact and internal power conduction contact, and a telescopic plunger for limiting and fixing the integrated tire sensor.

[0006] The spring pin is electrically connected to the common terminal of the toggle switch. The toggle switch includes at least a first switching terminal and a second switching terminal. The first switching terminal is electrically connected to the programmer, and the second switching terminal is electrically connected to the debugger.

[0007] Preferably, the sensor clamp includes a groove for accommodating an integrated tire sensor, a spring pin is disposed on the bottom surface of the groove, and a telescopic plunger is disposed on the side surface of the groove. The sensor clamp also includes a press-and-pop assembly, which includes a pressing part, a lever, and a pop-out part. The pressing part is disposed next to the groove, and the pop-out part is disposed at the bottom of the groove. The pressing part is connected to one end of the lever, and the other end of the lever is connected to the pop-out part.

[0008] Preferably, the toggle switch is configured as a six-pole, two-position switch. The external power supply contacts R+ and R-, the communication contacts BG and RS, and the internal power conduction contacts R1 and R2 are respectively connected to the common terminals of the first, second, third, fourth, fifth, and sixth poles of the toggle switch. The first switching terminals of the first, second, third, and fourth poles of the toggle switch are connected to the external power supply port and the communication port of the programmer. The second switching terminals of the fifth and sixth poles of the toggle switch are directly electrically connected.

[0009] Preferably, the tire sensor includes a first main control chip, a rotation direction indicator sensor, a tire temperature and pressure sensor, power supply electronics, a first near-field activation module, and a first near-field communication module. The first main control chip is connected to the rotation direction indicator sensor and the tire temperature and pressure sensor to collect the rotation direction indicator sensor signal and the tire temperature and pressure data to form tire sensor data.

[0010] Preferably, the first near-field activation module includes a low-frequency antenna and a driving chip. The low-frequency antenna is connected to the driving chip, and the driving chip is connected to the first main control chip. After receiving a specific external signal through the low-frequency antenna, the first near-field activation module sends an activation electrical signal to the first main control chip, thereby activating the tire sensor to enter the working state.

[0011] Preferably, the first near-field communication module is connected to the first main control chip for transmitting integrated tire sensor data to the outside world.

[0012] Preferably, the low-frequency antenna of the near-field activation module is a 125KHz antenna; the near-field communication module is a 433MHz module.

[0013] Preferably, the debugger is configured as a tire sensor data acquisition device, which is wirelessly connected to the tire sensor.

[0014] Preferably, the data acquisition device includes a second main control chip, a memory, a second near-field activation module, a second near-field communication module, a power interface, and a communication interface. The data acquisition device transmits a specific signal to the tire sensor through the second near-field activation module to control the activation of the tire sensor. The data acquisition device receives tire sensor data through the second near-field communication module and stores it in the memory.

[0015] Preferably, the communication interface is used to connect to a computer or smart terminal.

[0016] The integrated tire sensor testing fixture provided in this application uses a dedicated sensor clamp to connect the sensor, which is convenient for disassembly and assembly. By switching between a programmer and a debugger via a toggle switch, a single testing fixture can complete the programming and debugging of the tire sensor. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the tire sensor contacts provided in an embodiment of this application;

[0018] Figure 2 This is a schematic diagram of the integrated tire sensor testing fixture structure provided in the embodiments of this application;

[0019] Figure 3 Schematic diagram of the sensor fixture structure provided in the embodiments of this application Figure 1 ;

[0020] Figure 4 Schematic diagram of the sensor fixture structure provided in the embodiments of this application Figure 2 ;

[0021] Figure 5 This is a schematic diagram of the toggle switch structure provided in an embodiment of this application;

[0022] Figure 6 This is a schematic diagram of the tire sensor structure provided in an embodiment of this application;

[0023] Figure 7 This is a schematic diagram of the data collector structure provided in an embodiment of this application. Detailed Implementation

[0024] To make this application more apparent and understandable, various exemplary embodiments will be described below. These examples are non-limiting and should be understood as illustrating aspects of the broader application of the apparatus, system, and method. These embodiments can be varied and substituted with equivalents without departing from the spirit and scope of this application. Furthermore, various variations can be made to adapt to specific circumstances, materials, material compositions, processing types, processing actions, or steps to suit the purpose, content, or scope of this application. All such variations will be within the protection scope of this application.

[0025] Any materials, dimensions, or quantities described in the overview or detailed description are merely examples and are not intended to limit the subject matter of this application. Furthermore, the various implementations of the embodiments described herein are complementary rather than purely alternating, unless otherwise stated. In other words, implementations from one embodiment can be freely combined with implementations from other embodiments, as will readily be apparent to those skilled in the art, unless these implementations are stated to be used only as substitutions.

[0026] In the description of this application, it should be noted that the terms "inner" and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product is in use. They are used only for the convenience of describing this application and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. Furthermore, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0027] In the description of this application, it should also be noted that, unless otherwise expressly specified and limited, the terms "setup" and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0028] Example 1

[0029] This application provides a dedicated testing fixture for integrated tire sensors, which can be used to complete the programming and debugging of tire sensors.

[0030] For details, see Figure 1 The tire sensor 100 provides a pair of external power supply contacts R+ / R-, a pair of communication contacts BG / RS, and a pair of internal power on contacts R1 / R2. Internally, the tire sensor houses a main control chip and power supply electronics. When the internal power on contacts R1 / R2 are electrically connected, the tire sensor enters a self-powered operating state, allowing for operational debugging and testing with a debugger. When the tire sensor is connected to an external power source via the external power supply contacts R+ / R-, it is powered by the external power source. Simultaneously, the tire sensor's main control chip connects to a programmer via the communication contacts BG / RS for programming.

[0031] The integrated tire sensor testing fixture provided in this application embodiment is described in [reference]. Figure 2 It includes a sensor fixture 200, a programmer 300, a debugger 400, and a toggle switch 500.

[0032] In some implementations, see Figure 3 The sensor clamp 200 includes a set of spring pins 210 for engaging the external power supply contacts, communication contacts, and internal power conduction contacts, and a telescopic plunger 220 for limiting and fixing the integrated tire sensor. The spring pins are commercially available products. In this embodiment, the set of spring pins 210 includes at least six pins, respectively used to contact the external power supply contacts R+\R-, communication contacts BG\RS, and internal power conduction contacts R1\R2 to achieve electrical conduction. The telescopic plunger 220 is an elastic, retractable plunger that clamps the tire sensor using elasticity. Further details can be found in the documentation. Figure 4The sensor clamp 200 includes a recess 230 for accommodating an integrated tire sensor. A spring pin 210 is located at the bottom of the recess, and a telescopic plunger 220 is located on the side of the recess. The sensor clamp also includes a press-and-eject assembly, which includes a pressing part 241, a lever 242, and an ejection part 243. The pressing part 241 is located beside the recess, and the ejection part 243 is located at the bottom of the recess. The pressing part 241 is connected to one end of the lever 242, and the other end of the lever 242 is connected to the ejection part. When the tire sensor is inserted into the recess 230, the contacts of the tire sensor are electrically connected to the spring pin 210, and the telescopic plunger 220 is pressed to clamp the tire sensor. When it is necessary to remove the tire sensor, pressing down the pressing part 241 causes the ejection part 243 to push the tire sensor out.

[0033] In some embodiments, each spring pin 210 is electrically connected via a wire to the common terminal 521 of the toggle switch 500. Based on the six contacts of the tire sensor, a set of spring pins 210 has at least six positions, and the toggle switch 500 has at least six poles and two positions. See [reference needed]. Figure 5 The toggle switch 500 includes at least a first switching terminal 522 and a second switching terminal 523. The first switching terminal 522 is electrically connected to the programmer, and the second switching terminal 523 is electrically connected to the debugger. Specifically, the common terminal 521 of the first pole 511, second pole 512, third pole 513, fourth pole 514, fifth pole 515, and sixth pole 516 of the toggle switch 500 is respectively connected to the external power supply contacts R+ / R-, the communication contacts BG / RS, and the internal power supply contacts R1 / R2. Connecting the first switching terminal to the programmer means connecting the external power supply contacts R+ / R- and the communication contacts BG / RS used for programming to the corresponding external power supply ports and communication ports on the programmer. Specifically, the first switching terminals of the first, second, third, and fourth poles of the toggle switch 500 are electrically connected to the programmer via wires. The external power supply port and communication port are on the device; the second switching terminal is electrically connected to the debugger, which means connecting the contacts of the tire sensor used for debugging to the corresponding ports of the debugger. If the debugger and the tire sensor communicate via wired connection, connect the corresponding contacts to the corresponding ports. If the debugger and the tire sensor communicate via wireless connection, no wired connection is required between the debugger and the tire sensor. Regardless of whether the debugger and the tire sensor communicate via wired or wireless connection, the second switching terminals of the fifth and sixth poles of the toggle switch 500 need to be directly electrically connected via wires. At this time, the tire sensor enters the working state through self-powered power supply and cooperates with the debugger for debugging and testing.

[0034] It is understood that the integrated tire sensor testing fixture provided in this application embodiment is not limited to the specific model of the tire sensor. For different types of tire sensors, it is only necessary to adjust the number of spring pins to correspond to the type of tire sensor. For example, some tire sensors share a contact point between the external power supply contact R- and the internal power conduction contact R1. In this case, a set of spring pins can be set to five pins. By switching the connection between the tire sensor and the debugger or programmer through the toggle switch, one fixture can simultaneously perform programming, debugging and other tasks.

[0035] It should be noted that the integrated tire sensor testing fixture provided in this embodiment is also equipped with a power supply circuit and a power interface that connects to an external power source via a power cord to provide a specific voltage for the debugger and programmer. The power supply circuit is common knowledge and will not be described in detail in this embodiment.

[0036] Example 2

[0037] Based on Embodiment 1, the tire sensor provided in this embodiment includes a first main control chip 610, a rotation direction indicator sensor 620, a tire temperature and tire pressure sensor 630, a power supply electronics 640, a first near-field activation module 650, and a first near-field communication module 660.

[0038] See Figure 6 The power supply port of the tire sensor is connected to both the electronic power supply circuit and the external power supply circuit (to power the first main control chip and each module). When the internal power supply contacts R1 and R2 are directly connected, the sensor is powered electronically. The external power supply contacts R+ and R- are used to connect to the external power supply. The communication contacts BG and RS are used for external communication.

[0039] The first main control chip 610 is connected to the rotation direction indicator sensor 620 and the tire temperature and pressure sensor 630 to collect the rotation direction indicator sensor signal and the tire temperature and pressure data to form tire sensor data. The first near-field activation module 650 includes a low-frequency antenna and a driver chip. The low-frequency antenna is connected to the driver chip, and the driver chip is connected to the first main control chip 610. After receiving a specific external signal through the low-frequency antenna, the first near-field activation module 650 sends an activation electrical signal to the first main control chip 610 through the driver chip, thereby activating the tire sensor to enter the working state. The first near-field communication module 660 is connected to the first main control chip 610 for external transmission of tire sensor data.

[0040] The tire sensor uses a first near-field activation module, which enters the working state by receiving a specific external signal and re-enters sleep mode after a set time. It is activated by a specific external signal when needed and remains in sleep mode when not needed, thereby reducing the tire sensor's working time and achieving energy saving.

[0041] For example, the low-frequency antenna of the near-field activation module is a 125KHz antenna; the near-field communication module is a conventional 433MHz module.

[0042] It is understandable that the tire temperature and tire pressure sensors can be integrated as a tire temperature sensor + tire pressure sensor, or they can be separate tire temperature sensors and separate tire pressure sensors. For example, the tire sensor can be a pressure sensor of model FXTH8715116T1 or model SIC700A, and the tire temperature sensor can be a temperature-sensitive resistor. The primary control chip can be a general-purpose MCU of model ACM32F070 or MAX7044.

[0043] In a further embodiment, the rotation direction indicator sensor 620 provided in this application uses an electronic gyroscope or an inertial measurement sensor, such as an electronic gyroscope of model SSZ030CG or an inertial measurement sensor of model M-G370PDT0. The rotation direction indicator sensor 620 can output different first and second signals for different rotation directions, thus the tire rotation direction can be determined by the first or second signal. Furthermore, in the case of side-by-side tires, initially all tires are aligned when the integrated tire sensor is installed. When the tires are side-by-side, the outer tire and the inner tire are installed in opposite directions. During driving, the rotation direction indicator sensor in the outer tire and the rotation direction indicator sensor in the inner tire output different first and second signals. Therefore, by adding a rotation direction indicator sensor to the integrated tire sensor, the specific tire can be determined based on the first and second signals for side-by-side tires.

[0044] The debugger is essentially a tire sensor data acquisition device that works in conjunction with the tire sensor. The acquisition device is placed in the test fixture to test the tire sensor's operating status. In this embodiment, the acquisition device is wirelessly connected to the tire sensor. (See [link to documentation]). Figure 7 The system includes a second main control chip 710, a memory 720, a second near-field activation module 730, a second near-field communication module 740, a power interface 750, and a communication interface 760. The power supply of the test fixture is connected to the power interface 750 to power the data acquisition unit. The second main control chip 710 is connected to the second near-field activation module 730, which has the same structure as the first near-field activation module. The second main control chip 710 transmits a specific signal to the first near-field activation module through the second near-field activation module 730 to control the activation of the tire sensor. The second main control chip 710 is connected to the second near-field communication module 740 to receive tire sensor data uploaded by the tire sensor through the first near-field communication module, and this data can be stored in the memory 720. The second main control chip 710 can be connected to a computer or smart terminal through the communication interface 760 for technicians to monitor the testing process.

[0045] Understandably, the programmer is generally paired with the main control chip of the tire sensor. In some implementations, the main control chip of the tire sensor, the main control chip of the data acquisition unit, and the programmer are respectively NTM88, TDA5235, and Freescale FXTH87 programmer development kits, all of which are commercially available products and fall within the scope of existing technology. The programmer is provided with a USB serial port for connecting to a computer or smart terminal for technicians to monitor the programming process.

[0046] The above description is merely a preferred embodiment of this application and does not constitute any limitation on this application in any form or substance. It should be noted that those skilled in the art can make several improvements and additions without departing from this application, and these improvements and additions should also be considered within the scope of protection of this application. Any modifications, alterations, and equivalent variations made by those skilled in the art based on the disclosed technical content without departing from the content and scope of this application are equivalent embodiments of this application. Furthermore, any equivalent changes, alterations, and variations made to the above embodiments based on the essential technology of this application still fall within the scope of the technical solution of this application.

Claims

1. An integrated tire sensor dedicated test tool characterized by, The tire sensor is provided with a pair of external power supply contacts R+\R-, a pair of communication contacts BG\RS and a pair of internal power conduction contacts R1\R2. The special test fixture includes a sensor fixture, a programmer, a debugger and a toggle switch. The sensor fixture includes a set of spring pins for docking the external power supply contact, communication contact and internal power conduction contact, and a telescopic plunger for limiting and fixing the integrated tire sensor. The spring pin is electrically connected to the common terminal of the toggle switch. The toggle switch includes at least a first switching terminal and a second switching terminal. The first switching terminal is electrically connected to the programmer, and the second switching terminal is electrically connected to the debugger.

2. The integrated tire sensor dedicated test tool of claim 1, wherein, The sensor clamp includes a groove for accommodating an integrated tire sensor, a spring pin is located on the bottom surface of the groove, and a telescopic plunger is located on the side surface of the groove. The sensor clamp also includes a press-and-pop assembly, which includes a pressing part, a lever, and a pop-out part. The pressing part is located next to the groove, and the pop-out part is located at the bottom of the groove. The pressing part is connected to one end of the lever, and the other end of the lever is connected to the pop-out part.

3. The integrated tire sensor dedicated test tool of claim 1, wherein, The toggle switch is configured with six poles and two positions. The external power supply contacts R+ and R-, the communication contacts BG and RS, and the internal power conduction contacts R1 and R2 are respectively connected to the common terminals of the first, second, third, fourth, fifth, and sixth poles of the toggle switch. The first switching terminals of the first, second, third, and fourth poles of the toggle switch are connected to the external power supply port and the communication port of the programmer. The second switching terminals of the fifth and sixth poles of the toggle switch are directly electrically connected.

4. The integrated tire sensor dedicated test tool of claim 1, wherein, The tire sensor includes a first main control chip, a rotation direction indicator sensor, a tire temperature and pressure sensor, power supply electronics, a first near-field activation module, and a first near-field communication module. The first main control chip is connected to the rotation direction indicator sensor and the tire temperature and pressure sensor to collect the rotation direction indicator sensor signal and the tire temperature and pressure data to form tire sensor data.

5. The integrated tire sensor dedicated test tool of claim 4, wherein, The first near-field activation module includes a low-frequency antenna and a driver chip. The low-frequency antenna is connected to the driver chip, and the driver chip is connected to the first main control chip. After receiving a specific external signal through the low-frequency antenna, the first near-field activation module sends an activation electrical signal to the first main control chip, thereby activating the tire sensor to enter the working state.

6. The integrated tire sensor dedicated test tool of claim 4, wherein, The first near-field communication module is connected to the first main control chip for transmitting integrated tire sensor data to the outside world.

7. The integrated tire sensor dedicated test tool of claim 4, wherein, The low-frequency antenna of the near-field activation module is set to a 125KHz antenna; the near-field communication module is set to a 433MHz module.

8. The integrated tire sensor dedicated test fixture of claim 1, wherein, The debugger is set as a tire sensor data acquisition device, and the acquisition device is wirelessly connected to the tire sensor.

9. A test fixture for integrated tire sensor specific testing according to claim 8, characterized in that The data acquisition unit includes a second main control chip, a memory, a second near-field activation module, a second near-field communication module, a power interface, and a communication interface. The data acquisition unit transmits a specific signal to the tire sensor through the second near-field activation module to control the activation of the tire sensor. The data acquisition unit receives tire sensor data through the second near-field communication module and stores it in the memory.

10. The integrated tire sensor testing fixture according to claim 9, characterized in that, The communication interface is used to connect to a computer or smart terminal.

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