Multi-station quality inspection apparatus

By adjusting the offset angle and distance of the image acquisition device in the quality inspection equipment, the problem of inaccurate detection results in the existing technology is solved, and high-precision quality inspection from multiple angles is achieved.

CN224456612UActive Publication Date: 2026-07-03SHENZHEN YANXIANG JINMA TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN YANXIANG JINMA TECH CO LTD
Filing Date
2025-06-25
Publication Date
2026-07-03

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    Figure CN224456612U_ABST
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Abstract

This application relates to the field of product testing technology and discloses a multi-tasking quality inspection device. The device includes a conveyor line, a first backlight, and multiple image acquisition devices. The first backlight and the multiple image acquisition devices are disposed on both sides of the conveyor line. The multiple image acquisition devices include a first image acquisition device and a second image acquisition device. The first image acquisition device is offset towards a first direction, and the second image acquisition device is offset towards a second direction. The first offset angle of the first image acquisition device is smaller than the second offset angle of the second image acquisition device, and the field of view of both the first and second image acquisition devices is within the luminous area of ​​the first backlight. The first image acquisition device is used to acquire a first image when the product reaches a first preset position, and the second image acquisition device is used to acquire a second image when the product reaches a second preset position. This method improves the accuracy of product quality inspection results.
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