Probe module for testing crystal oscillator

Abstract

This invention discloses a probe module for testing crystal oscillators, comprising a test circuit board, a metal block, a probe circuit board, and several probe sleeves. Probes are inserted into both ends of each probe sleeve. The metal block has holes for the probe sleeves to pass through, and each probe sleeve passes through the metal block. The probe circuit board is fixed to the metal block, and the front end of each probe sleeve is soldered to the probe circuit board. The probes at the ends of the probe sleeves are electrically connected to the test circuit board. This invention utilizes a metal block outside the probe sleeves to create a Faraday cage effect, shielding against external electromagnetic interference. This invention also allows for the simultaneous testing of multiple crystal oscillators, improving testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of wafer manufacturing technology, and in particular to a probe module for testing crystal oscillators. Background Technology

[0002] In crystal oscillator frequency testing, when using conventional probe testing, the crystal oscillators are close to each other in the fixture, which also causes the probes to be close together. As a result, the electromagnetic waves and parasitic capacitances between the probes will interfere with the tested frequency, causing the tested frequency to deviate. Utility Model Content

[0003] The technical problem to be solved by this utility model embodiment is to provide a probe module for testing crystal oscillators to reduce interference during testing.

[0004] To address the aforementioned technical problems, this utility model provides a probe module for testing crystal oscillators, comprising a test circuit board, a metal block, a probe circuit board, and several probe sleeves. Probes are inserted into both ends of each probe sleeve. The metal block has holes for the probe sleeves to pass through, and each probe sleeve passes through the metal block. The probe circuit board is fixed to the metal block, and the front end of each probe sleeve is soldered to the probe circuit board. The probes at the ends of each probe sleeve are electrically connected to the test circuit board.

[0005] Furthermore, a probe positioning plate for fixing the end of the probe sleeve is provided on the metal block.

[0006] Furthermore, the hole is a square hole, and the probe sleeves are spaced apart.

[0007] Furthermore, all the probe sleeves are perpendicular to the probe circuit board.

[0008] Furthermore, the tips of the probes located at the front and rear ends of the probe sleeve are flush.

[0009] The beneficial effects of this invention are as follows: This invention sets a metal block (such as stainless steel) on the outside of each probe sleeve to form a Faraday cage effect and shield external electromagnetic interference; This invention can test multiple crystal oscillators at the same time, thus improving testing efficiency. Attached Figure Description

[0010] Figure 1 This is a three-dimensional structural diagram of the probe module for testing crystal oscillators according to Embodiment 1 of this utility model.

[0011] Figure 2 This is a cross-sectional view of the probe module for testing crystal oscillators according to Embodiment 1 of this utility model.

[0012] Explanation of icon numbers

[0013] 1. Probe; 2. Probe sleeve; 3. Probe circuit board; 4. Metal block; 5. Test circuit board; 6. Probe positioning plate. Detailed Implementation

[0014] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of this application can be combined with each other. The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0015] In this embodiment of the invention, directional indicators (such as up, down, left, right, front, back, etc.) are only used to explain the relative positional relationship and movement of the components in a specific posture (as shown in the attached figure). If the specific posture changes, the directional indicators will also change accordingly.

[0016] Furthermore, in this utility model, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features.

[0017] Please refer to Figures 1-2 The probe module for testing crystal oscillators according to this embodiment of the present invention includes a test circuit board, a metal block, a probe circuit board, and several probe sleeves.

[0018] Probes are inserted at both ends of the probe sleeve. Holes are opened on the metal block to facilitate the passage of the probe sleeve. The probe sleeves pass through the metal block. The probe circuit board is fixed on the metal block. The front end of the probe sleeve is soldered to the probe circuit board. The two probes at the top are a pair and contact the two pins of the crystal oscillator respectively for testing.

[0019] A probe positioning plate is provided on the metal block to fix the end of the probe sleeve. The probe positioning plate is used to fix the position and prevent the probe from swinging or deviating from its original position. The probe at the end of the probe sleeve is electrically connected to the test circuit board. The probe near the probe positioning plate is compressed by the test circuit board, thereby achieving contact with the test circuit board and establishing an electrical connection.

[0020] The hole is preferably a square hole. The probe sleeves are spaced apart, preferably arranged in an array. Preferably, the probe sleeves are perpendicular to the probe circuit board. The tops of the probes at the front and rear ends of the probe sleeves are flush, that is, the tops of the probes at the top are flush, and the bottoms of the probes at the bottom are flush.

[0021] The testing accuracy of this invention is 30% higher than that of ordinary testing methods.

[0022] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A probe module for testing crystal oscillators, characterized in that, The device includes a test circuit board, a metal block, a probe circuit board, and several probe sleeves. Probes are inserted into both ends of the probe sleeves. The metal block has holes to facilitate the passage of the probe sleeves. The probe sleeves pass through the metal block. The probe circuit board is fixed on the metal block. The front end of the probe sleeve is soldered to the probe circuit board. The probe at the end of the probe sleeve is electrically connected to the test circuit board.

2. The probe module for testing a crystal oscillator of claim 1, wherein, The metal block is equipped with a probe positioning plate for fixing the end of the probe sleeve.

3. The probe module for testing a crystal oscillator of claim 1, wherein, The hole is a square hole, and the probe sleeves are spaced apart.

4. The probe module for testing a crystal oscillator of claim 1, wherein, The probe sleeves are all perpendicular to the probe circuit board.

5. The probe module for testing a crystal oscillator of claim 1, wherein, The tops of the probes located at the front and rear ends of the probe sleeve are flush.

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