System for optoelectronic sensor testing

Abstract

The utility model discloses a system for photoelectric sensor test. According to the embodiment of the present disclosure, the system comprises: a main unit, the main unit has a top surface and a bottom surface opposite to the top surface, a photoelectric sensor to be tested can be placed on the top surface; a rotating component and a rotatable baffle, the rotating component is arranged on the top surface of the main unit, the rotatable baffle is coupled to the rotating component and is driven by the rotating component; and a control unit, the control unit is arranged in the main unit, the control unit is configured to control the rotation of the rotating component, so that the rotatable baffle periodically changes the light path of the light emitted from the emitter of the photoelectric sensor to be tested and tests the photoelectric sensor to be tested through a plurality of electrical signals from the receiver of the photoelectric sensor to be tested.

Description

Technical Field

[0001] This invention generally relates to a system for testing photoelectric sensors, and more specifically, to a system capable of testing photoelectric sensors with intermittent faults. Background Technology

[0002] In the semiconductor device manufacturing industry, photoelectric sensors are widely used in various automated equipment to ensure precise operation. For example, some automated equipment is equipped with dozens of photoelectric sensors. However, if one or more of these photoelectric sensors fail, maintaining optimal equipment performance will pose a significant challenge. For instance, a faulty photoelectric sensor can lead to extended repair times, unplanned downtime, and production interruptions.

[0003] This problem becomes even more complex when photoelectric sensors exhibit intermittent failures, as they require repetitive and time-consuming repairs. Intermittent failure photoelectric sensors refer to those that experience irregular malfunctions, such as sensors that work intermittently or fail at other times, or sensors that are initially thought to have failed but become normal again after being restarted.

[0004] Functional testing of photoelectric sensors typically relies on visual inspection. For example... Figure 1 As shown, when light emitted from the emitter 110 of the photoelectric sensor 100 is incident on the object under test 130, the light emitted by the emitter 110 is reflected back to the receiver 120 of the photoelectric sensor 100. After the receiver 120 receives the light reflected back from the object under test 130, the indicator light (not shown) of the photoelectric sensor 100 will light up, indicating that its function is normal. However, this visual detection method cannot test photoelectric sensors with intermittent malfunctions. For example, when the object under test 130 is in place, the indicator light of the photoelectric sensor 100 may not light up, which can easily lead to false positives. In addition, when passing through Figure 1 When the method shown detects a fault in the photoelectric sensor under test and repairs it, the voltage of the photoelectric sensor under test is often tested with a multimeter to further test whether the photoelectric sensor is functioning properly. However, the intermittent fault of the photoelectric sensor cannot be detected by using a multimeter.

[0005] Therefore, it is desirable to provide a system capable of testing intermittently faulty photoelectric sensors. Utility Model Content

[0006] According to an embodiment of the present invention, a system for testing photoelectric sensors is provided, characterized in that it includes: a main unit having a top surface and a bottom surface opposite to the top surface, on which the photoelectric sensor to be tested can be placed; a rotating component and a rotatable baffle, the rotating component being disposed on the top surface of the main unit, the rotatable baffle being coupled to the rotating component and driven by the rotating component; and a control unit disposed within the main unit, the control unit being configured to control the rotating component to rotate, thereby causing the rotatable baffle to periodically change the optical path of light emitted from the emitter of the photoelectric sensor to be tested and to test the photoelectric sensor to be tested by multiple electrical signals from the receiver of the photoelectric sensor to be tested.

[0007] In some embodiments, the main unit further includes a display screen disposed on the side of the main unit. When the current values ​​of the plurality of electrical signals are within a predetermined range, the display screen displays information indicating that the photoelectric sensor under test has passed the test, and when the current values ​​of the plurality of electrical signals are not within the predetermined range, the display screen displays information indicating that the photoelectric sensor under test has failed the test.

[0008] In some embodiments, the display screen also displays information about the number of times the photoelectric sensor under test has been triggered.

[0009] In some embodiments, the predetermined range is associated with the model of the photoelectric sensor under test and its test conditions.

[0010] In some embodiments, the control unit is further configured to determine whether the photoelectric sensor under test exhibits a deterioration trend based on the changing trends of the current values ​​of the plurality of electrical signals.

[0011] In some embodiments, the system further includes a reference photoelectric sensor disposed on the top surface, characterized in that, before placing the photoelectric sensor to be tested on the top surface, the control unit controls the emitter of the reference photoelectric sensor to emit light and determines the state of the system by the current value of the electrical signal received from the receiver of the reference photoelectric sensor.

[0012] In some embodiments, the material used to form the rotatable baffle includes plastic or metal.

[0013] In some embodiments, the rotatable baffle has any of the following shapes: rectangular, square, circular, or elliptical.

[0014] In some embodiments, the emitter of the photoelectric sensor under test emits light with wavelengths in the range of 200 nm to 2900 nm.

[0015] In some embodiments, the transmitter and receiver of the photoelectric sensor under test are located on one side of the rotatable baffle, and light emitted from the transmitter is reflected after being incident on the rotatable baffle and received by the receiver.

[0016] In some embodiments, the transmitter and receiver of the photoelectric sensor under test are located on opposite sides of the rotatable baffle, and the light emitted from the transmitter is received by the receiver when it is not blocked by the rotatable baffle.

[0017] In some embodiments, the rotating component includes a motor, a reducer, and a connecting rod, and the rotatable baffle is coupled to the connecting rod via a groove formed therebetween.

[0018] In some embodiments, when testing the photoelectric sensor under test, the rotation speed of the rotatable baffle is correlated with the response speed of the photoelectric sensor under test.

[0019] In some embodiments, the main unit further includes a programming port for programming the control unit. Attached Figure Description

[0020] The accompanying drawings, which are incorporated herein and form part of the specification, illustrate embodiments of the present invention and, together with the specification, further serve to explain the principles of the present invention and enable those skilled in the art to make and use the present invention.

[0021] Figure 1 A schematic diagram illustrating the testing of a photoelectric sensor using a visual inspection method is shown.

[0022] Figures 2(a)-2(b) A top view and a cross-sectional view of a system according to an embodiment of the present invention, which can be used to test an intermittently faulty photoelectric sensor, are shown; and

[0023] Figures 3(a)-3(b) A top view and a cross-sectional view of a rotatable baffle according to an embodiment of the present invention are shown.

[0024] Various embodiments will be described with reference to the accompanying drawings. Detailed Implementation

[0025] The subject matter described herein will now be discussed with reference to exemplary embodiments. It should be understood that these embodiments are discussed merely to enable those skilled in the art to better understand and implement the subject matter described herein, and are not intended to limit the scope, applicability, or examples set forth in the claims. Changes may be made to the function and arrangement of the elements discussed without departing from the scope of this specification. Various processes or components may be omitted, substituted, or added as needed in the various examples. Furthermore, features described in some examples may be combined in other examples.

[0026] It should be noted that references such as "one embodiment," "embodiment," or "some embodiments" in the specification indicate that the described embodiments may include specific features, structures, or characteristics, but not every embodiment necessarily includes that specific feature, structure, or characteristic. Furthermore, such wording does not necessarily refer to the same embodiment. Additionally, when describing a specific feature, structure, or characteristic in conjunction with embodiments, implementing such features, structures, or characteristics in conjunction with other embodiments, whether explicitly described or not, should be within the knowledge scope of those skilled in the art.

[0027] The embodiments described herein can be referred to in the accompanying drawings. Unless explicitly stated otherwise, the dimensions in the drawings are intended to simplify the examples and are not a description of relative dimensions. For example, unless otherwise indicated, the various lengths / widths / heights of the elements in the drawings may not be drawn to scale.

[0028] Embodiments of a system for testing photoelectric sensors according to the present invention will now be described with reference to the accompanying drawings.

[0029] Figures 2(a)-2(b) A schematic diagram of a system 200, according to an embodiment of the present invention, capable of testing intermittently faulty photoelectric sensors is shown. Figures 2(a)-2(b) As shown, system 200 includes main unit 210, rotating component 220, rotatable baffle 230, control unit 240, reference photoelectric sensor 250, and photoelectric sensor under test 260.

[0030] like Figures 2(a)-2(b) As shown, the main body unit 210 has a top surface 210-1 and a bottom surface 210-2 opposite to the top surface 210-1. A rotating component 220, a reference photoelectric sensor 250, and a photoelectric sensor under test 260 are disposed on the top surface 210-1. According to embodiments of this disclosure, the positions of the rotating component 220, the reference photoelectric sensor 250, and the photoelectric sensor under test 260 on the top surface 210-1 are not limited to... Figures 2(a)-2(b) As shown, its position can be changed according to the needs of the test.

[0031] The rotatable baffle 230 is coupled to the rotating component 220. For example, in one embodiment, the rotating component 220 may include a motor, a reducer, and a D-shaped linkage (not shown), and the rotatable baffle 230 is coupled to the D-shaped linkage of the rotating component 220 via a groove formed therebetween, but this disclosure is not limited thereto. In this way, the rotatable baffle 230 can be driven to rotate by the motor of the rotating component 220.

[0032] According to embodiments of this disclosure, when testing the photoelectric sensor 260, the rotation speed of the rotatable baffle 230 is related to the response speed of the photoelectric sensor 260. For example, in one embodiment, when the response speed of the photoelectric sensor 260 is 500 Hz, the rotation speed of the rotatable baffle 230 can be 1.5 revolutions per second.

[0033] Figures 3(a)-3(b) A top view and a cross-sectional view of a rotatable baffle 230 according to an embodiment of the present invention are shown. As shown in FIG. 3(b), the rotatable baffle 230 may have a "T"-shaped structure, comprising a horizontal portion 230-1 and a columnar vertical portion 230-2 perpendicular to the horizontal portion 230-1. A "D"-shaped groove (not shown) may be provided in the columnar vertical portion 230-2. Through the "D"-shaped groove of the columnar vertical portion 230-2, the rotatable baffle 230 can be tightly coupled to the connecting rod of the rotating component 220, but the present disclosure is not limited thereto.

[0034] As shown in Figure 3(a), the horizontal portion 230-1 of the rotatable baffle 230 can have a rectangular shape, but this disclosure is not limited thereto. For example, in some embodiments, the horizontal portion 230-1 of the rotatable baffle 230 can also have any shape among square, circular, or elliptical. Furthermore, according to embodiments of this disclosure, the size of the horizontal portion 230-1 of the rotatable baffle 230 is selected such that the rotatable baffle 230 can cover the reference photoelectric sensor 250 and the photoelectric sensor 260 under test when rotated.

[0035] In some embodiments, the material used to form the rotatable baffle 230 may include, for example, plastic or metal, but this disclosure is not limited thereto. For example, the material used to form the rotatable baffle 230 may include nylon or aluminum alloy. According to embodiments of this disclosure, the material used to form the rotatable baffle 230 may be selected based on the operating environment of the photoelectric sensor 260 under test.

[0036] According to embodiments of this disclosure, the rotatable baffle 230 can be driven to rotate by the rotating component 220, thereby periodically changing the optical path of the light emitted from the transmitter 260-1 of the photoelectric sensor under test 260 and testing the photoelectric sensor under test 260 by multiple electrical signals from the receiver 260-2 of the photoelectric sensor under test 260.

[0037] by Figures 2(a)-2(b) Taking the photoelectric sensor 260 under test as an example (a reflective photoelectric sensor), the transmitter 260-1 and receiver 260-2 of the photoelectric sensor 260 are located on one side of the rotatable baffle 230, for example, both located below the rotatable baffle 230. When the rotatable baffle 230 rotates above the photoelectric sensor 260 under test, light emitted from the transmitter 260-1 is incident on the rotatable baffle 230, reflected, and received by the receiver 260-2. Through the periodic rotation of the rotatable baffle 230, multiple electrical signals can be received via the receiver 260-2, and the functionality of the photoelectric sensor 260 under test can be tested using these multiple electrical signals.

[0038] As shown in Figure 2(b), the main unit 210 includes a display screen 270 disposed on one side thereof. The display screen 270 can be used to display information such as whether the photoelectric sensor 260 under test has passed the test and the number of times the photoelectric sensor 260 under test has been triggered. For example, the display screen 270 can display information such as "PASS" and "FAILED" to indicate that the photoelectric sensor 260 under test is functional and faulty, respectively, and can also display information such as "10 times" that the photoelectric sensor 260 under test has been triggered in total, but this disclosure is not limited thereto.

[0039] In the system 200 shown in Figure 2(b), the control unit 240 is disposed in the main unit 210 and is configured to control the rotation of the rotating component 220, thereby causing the rotatable baffle 230 to periodically change the optical path of the light emitted from the transmitter 260-1 of the photoelectric sensor 260 under test and to test the photoelectric sensor 260 under test through multiple electrical signals from the receiver 260-2 of the photoelectric sensor 260 under test.

[0040] A photoelectric sensor typically includes a transmitter, a receiver, and a detection circuit. The transmitter emits light towards the object being measured (e.g., a rotatable baffle 230), and the emitted light beam generally originates from sources such as semiconductor light sources, light-emitting diodes (LEDs), laser diodes, and infrared emitting diodes. The receiver includes photodiodes, phototransistors, photovoltaic cells, etc., and uses these photoelectric elements to convert changes in light intensity into electrical signals. Optical elements such as lenses and apertures are positioned in front of the receiver, and the detection circuit is located behind the receiver, capable of filtering out and utilizing the useful signal.

[0041] According to an embodiment of the present disclosure, the emitter 260-1 of the optoelectronic sensor 260 to be tested may emit light with a wavelength in the range of 200 nm to 2900 nm, but the present disclosure is not limited thereto. In this case, the noise caused by ambient light will not affect the test results.

[0042] According to an embodiment of the present disclosure, when the control unit 240 determines that the current values of multiple electrical signals from the receiver 260-2 of the optoelectronic sensor 260 to be tested are within a predetermined range R, the information "PASS" indicating that the optoelectronic sensor 260 to be tested passes the test is displayed on the display screen 270, and when the current values of multiple electrical signals from the receiver 260-2 of the optoelectronic sensor 260 to be tested are not within the predetermined range R, the information "FAILED" indicating that the optoelectronic sensor 260 to be tested fails the test is displayed on the display screen 270.

[0043] According to an embodiment of the present disclosure, the predetermined range R is associated with the model of the optoelectronic sensor 260 to be tested and its test conditions. For example, for the reflective optoelectronic sensor 260 to be tested, when the emission power of the emitter and the test conditions (such as the reflectivity of the object to be measured, the reception rate of the receiver, etc.) are certain, the predetermined range of the current value of the electrical signal received via the receiver for the optoelectronic diode to be tested and its test conditions can be determined.

[0044] For example, in one embodiment, the predetermined range of the current value of the electrical signal received via the receiver 260-2 of the optoelectronic sensor 260 to be tested is 20 mA < R < 40 mA. In this case, when the control unit 240 determines that the current value of a certain electrical signal among the multiple electrical signals from the receiver 260-2 of the optoelectronic sensor 260 to be tested is > 40 mA or < 20 mA, the control unit 240 determines that the optoelectronic sensor 260 to be tested has a fault and needs to be replaced. Only when the control unit 240 determines that the current values of all the multiple electrical signals from the receiver 260-2 of the optoelectronic sensor 260 to be tested are within the predetermined range 20 mA < R < 40 mA, the control unit 240 determines that the optoelectronic sensor 260 to be tested is a normally operating optoelectronic sensor.

[0045] According to an embodiment of the present disclosure, the control unit 240 may also be configured to determine whether the optoelectronic sensor 260 to be tested has a deteriorating trend based on the changing trend of the current values of multiple electrical signals from the receiver 260-2 of the optoelectronic sensor 260 to be tested. For example, if the current values of multiple electrical signals from the receiver 260-2 of the optoelectronic sensor 260 to be tested are within the predetermined range, but the current values are continuously decreasing. In this case, the control unit 240 determines that the optoelectronic sensor 260 to be tested has a deteriorating trend.

[0046] like Figures 2(a)-2(b) As shown, system 200 also includes a reference photoelectric sensor 250 disposed on the top surface 210-1 of the main unit 210. According to embodiments of this disclosure, the reference photoelectric sensor 250 is a functional photoelectric sensor. Before placing the photoelectric sensor 260 to be tested on the top surface 210-1 for testing, control unit 240 can control the emitter 250-1 of the reference photoelectric sensor 250 to emit light and determine the state of system 200 by the current value of the electrical signal received from the receiver 250-2 of the reference photoelectric sensor 250.

[0047] For example, when the rotatable baffle 230 rotates above the reference photoelectric sensor 250, light emitted from the emitter 250-1 of the reference photoelectric sensor 250 is incident on the rotatable baffle 230, reflected, and received by the receiver 250-2 of the reference photoelectric sensor 250. Similarly, when the control unit 240 determines that the current value of the electrical signal from the receiver 250-2 of the reference photoelectric sensor 250 is within a predetermined range, the system 200 is determined to be in a normal state. In this case, the photoelectric sensor 260 to be tested can be placed on the top surface 210-1 for testing. Conversely, if the control unit 240 determines that the current value of the electrical signal from the receiver 250-2 of the reference photoelectric sensor 250 is not within a predetermined range, the system 200 is determined to be in an abnormal state. In this case, the problem with the system 200 needs to be identified before the photoelectric sensor 260 to be tested can be placed on the top surface 210-1 for testing.

[0048] Unlike testing the photoelectric sensor 260 under test, it is not necessary to receive multiple electrical signals from the receiver 250-2 of the reference photoelectric sensor 250. Instead, it is only necessary to receive one electrical signal from the receiver 250-2 of the reference photoelectric sensor 250. The state of the system 200 can be determined by the current value of the electrical signal.

[0049] According to embodiments of this disclosure, the main unit 210 further includes a programming port (not shown) for programming the control unit 240. In some embodiments, using this programming port, different predetermined ranges R can be set, for example, for different models of the photoelectric sensor 260 under test, and can also be set according to... Figures 2(a)-2(b) The number of rotations of the rotatable baffle 230 in the system 200 shown is not limited thereto.

[0050] According to embodiments of this disclosure, system 200 also includes a power supply (not shown) disposed within main unit 210 for supplying power to the entire system.

[0051] As shown in FIG2(b), the main body unit 210 further includes a power-on button 280 disposed on its side. According to an embodiment of the present disclosure, the power-on button 280 may be configured to control the electrical connection of power to the rotating component 230, the control unit 240, the reference photoelectric sensor 250, and the photoelectric sensor under test 260.

[0052] As shown in Figure 2(b), the main body unit 210 also includes a start button 290 disposed on its side, which can be configured to start the test of the photoelectric sensor 260 under test.

[0053] Now describe the use Figures 2(a)-2(b) The system 200 shown describes the process of testing the photoelectric sensor 260 under test. First, pressing the power button 280 starts powering the entire system 200. The control unit 240 activates the rotating component 220 and the reference photoelectric sensor 250 to begin a self-test of the system 200. As described above, after determining that the system 200 is in good condition by the current value of the electrical signal received from the receiver 250-2 of the reference photoelectric sensor 250, the display screen 270 displays information such as "READY" to indicate that the test can begin. In this case, the photoelectric sensor 260 under test is placed in a suitable position on the top surface 210-1 of the main unit 210. Next, pressing the start button 290 reads multiple electrical signals from the receiver 260-2 of the photoelectric sensor 260 under test. As described above, the control unit 240 tests the photoelectric sensor 260 under test using the current values ​​of the multiple electrical signals, displays the test results on the display screen 270 after receiving a predetermined number of electrical signals, and ends the test.

[0054] Figures 2(a)-2(b) The photoelectric sensor 260 shown is a reflective photoelectric sensor. The transmitter 260-1 and receiver 260-2 of the photoelectric sensor 260 are located on one side of the rotatable baffle 230, for example, both located below the rotatable baffle 230. However, Figures 2(a)-2(b) The system 200 shown can also test a through-beam photoelectric sensor 260. In this case, the transmitter 260-1 and receiver 260-2 of the photoelectric sensor 260 under test can be located on opposite sides of the rotatable baffle 230, for example, the transmitter 260-1 is located below the rotatable baffle 230 and the receiver 260-2 is located above the rotatable baffle 230. Light emitted from the transmitter 260-1 is received by the receiver 260-2 when it is not blocked by the rotatable baffle 230.

[0055] Unlike visual inspection methods used to test photoelectric sensors, the system according to this embodiment of the invention controls the rotation of a rotating component, causing a rotatable baffle to periodically change the optical path of light emitted from the emitter of the photoelectric sensor under test. This allows the system to test the photoelectric sensor using multiple electrical signals from its receiver. In this case, even if the photoelectric sensor under test is intermittently faulty, its malfunction can be accurately detected. Furthermore, the system according to this embodiment of the invention can determine whether the photoelectric sensor under test is showing a deterioration trend based on the changing trends of the current values ​​of the multiple electrical signals from the receiver, enabling timely detection of potential problems.

[0056] It should be noted that not all units in the above devices are necessary, and some units can be omitted according to actual needs. The device structure described in the above embodiments can be a physical structure or a logical structure. That is, some units may be implemented by the same physical entity, or some units may be implemented by multiple physical entities, or they may be jointly implemented by certain components in multiple independent devices.

[0057] The foregoing description of this invention is provided to enable any person skilled in the art to make or use the contents of this disclosure. Various modifications to this invention will be apparent to those skilled in the art, and the general principles defined herein can be applied to other variations without departing from the scope of protection of this invention. Therefore, this invention is not limited to the examples and designs described herein, but is consistent with the widest scope of the principles and novel features disclosed herein.

Claims

1. A system for testing photoelectric sensors, characterized in that, include: The main body unit has a top surface and a bottom surface opposite to the top surface, and the photoelectric sensor to be tested can be placed on the top surface; A rotating component and a rotatable baffle, the rotating component being disposed on the top surface of the main body unit, the rotatable baffle being coupled to and driven by the rotating component; as well as The control unit is disposed within the main body unit. The control unit is configured to control the rotation of the rotating component, thereby causing the rotatable baffle to periodically change the optical path of the light emitted from the emitter of the photoelectric sensor under test and to test the photoelectric sensor under test by means of multiple electrical signals from the receiver of the photoelectric sensor under test.

2. The system according to claim 1, characterized in that, The main unit also includes a display screen disposed on the side of the main unit. When the current values ​​of the plurality of electrical signals are within a predetermined range, the display screen displays information indicating that the photoelectric sensor under test has passed the test. When the current values ​​of the plurality of electrical signals are not within the predetermined range, the display screen displays information indicating that the photoelectric sensor under test has failed the test.

3. The system according to claim 2, characterized in that, The display screen also shows information about the number of times the photoelectric sensor under test has been triggered.

4. The system according to claim 2, characterized in that, The predetermined range is associated with the model of the photoelectric sensor to be tested and its test conditions.

5. The system according to claim 2, characterized in that, The control unit is also configured to determine whether the photoelectric sensor under test is showing a deterioration trend based on the changing trends of the current values ​​of the plurality of electrical signals.

6. The system according to claim 1 further includes a reference photoelectric sensor disposed on the top surface, characterized in that, Before placing the photoelectric sensor under test on the top surface, the control unit controls the emitter of the reference photoelectric sensor to emit light and determines the state of the system by the current value of the electrical signal received from the receiver of the reference photoelectric sensor.

7. The system according to claim 1, characterized in that, The materials used to form the rotatable baffle include plastic or metal.

8. The system according to claim 1, characterized in that, The rotatable baffle has any shape, such as rectangular, square, circular, or elliptical.

9. The system according to claim 1, characterized in that, The emitter of the photoelectric sensor under test emits light with a wavelength in the range of 200 nm to 2900 nm.

10. The system according to claim 1, characterized in that, The transmitter and receiver of the photoelectric sensor under test are located on one side of the rotatable baffle. Light emitted from the transmitter is reflected after being incident on the rotatable baffle and received by the receiver.

11. The system according to claim 1, characterized in that, The transmitter and receiver of the photoelectric sensor under test are located on opposite sides of the rotatable baffle. Light emitted from the transmitter is received by the receiver when it is not blocked by the rotatable baffle.

12. The system according to claim 1, characterized in that, The rotating component includes a motor, a reducer, and a connecting rod, and the rotatable baffle is coupled to the connecting rod through a groove formed therebetween.

13. The system according to claim 12, characterized in that, When testing the photoelectric sensor under test, the rotation speed of the rotatable baffle is related to the response speed of the photoelectric sensor under test.

14. The system according to claim 1, characterized in that, The main unit also includes a programming port for programming the control unit.

Images