Intermediate range panel test circuit and apparatus

Abstract

The utility model relates to intermediate range board piece test circuit and device, and its circuit includes precision current source, voltage sampling unit, range acquisition unit, board piece control unit and test unit, precision current source is used for connecting intermediate range board piece to inject current signal to it, voltage sampling unit is used for connecting intermediate range board piece to gather its output voltage signal, range acquisition unit is used for connecting intermediate range board piece to gather its output range signal, board piece control unit is used for connecting intermediate range board piece to output control intermediate range board piece's high pressure output value and parameter control signal of discrimination value, test unit is connected with voltage sampling unit, range acquisition unit and board piece control unit, is used for receiving voltage signal and range signal, controls board piece control unit work and exports test report, the utility model discloses can improve intermediate range board piece's test efficiency and reduce human error risk.

Description

Technical Field

[0001] This utility model relates to the field of nuclear power plant equipment maintenance technology, and in particular to an intermediate range board test circuit and device. Background Technology

[0002] To maintain the normal operation of the external neutron measurement system in nuclear power plants, the performance of intermediate range plates needs to be tested periodically. However, existing testing methods for these plates require manual operation of numerous specialized devices, resulting in high workload, high risk of human error, and low testing efficiency. Currently, nuclear power plants urgently need a tool capable of efficiently testing intermediate range plates. Utility Model Content

[0003] The technical problem to be solved by this utility model is to provide an intermediate range board test circuit and device.

[0004] The technical solution adopted by this utility model to solve its technical problem is: to construct an intermediate range board test circuit, including a precision current source, a voltage sampling unit, a range acquisition unit, a board control unit, and a test unit;

[0005] The precision current source is used to connect to the intermediate range board to inject a current signal into it;

[0006] The voltage sampling unit is used to connect to the intermediate range board to collect the voltage signal it outputs;

[0007] The range acquisition unit is used to connect to the intermediate range plate to acquire its output range signal.

[0008] The plate control unit is used to connect to the intermediate range plate to output parameter control signals for controlling the high voltage output value and discrimination value of the intermediate range plate;

[0009] The test unit is connected to the voltage sampling unit, the range acquisition unit, and the board control unit, and is used to receive the voltage signal and the range signal, control the board control unit to work, and output a test report.

[0010] Preferably, the range acquisition unit includes a switching transistor, a pull-up unit, and a switching quantity processing unit;

[0011] The input terminal of the switching transistor is connected to a first DC voltage via the pull-up unit. The input terminal of the switching transistor is also connected to the test unit. The output terminal of the switching transistor is grounded. The input terminal of the switching quantity processing unit is connected to the intermediate range board. The output terminal of the switching transistor is connected to the output terminal of the switching quantity processing unit.

[0012] Preferably, the switching transistor includes an NMOS transistor Q4, the pull-up unit includes a first resistor R1, and the switching quantity processing unit includes a second resistor R2, a third resistor R3, a fourth resistor R4, and a first capacitor C1.

[0013] The drain of the NMOS transistor Q4 is connected to a first DC voltage via the first resistor R1. The drain of the NMOS transistor Q4 is also connected to the test unit. The source of the NMOS transistor Q4 is grounded. The gate of the NMOS transistor Q4 is connected to ground via the fourth resistor R4 and to a second DC voltage via the third resistor R3 and the second resistor R2. The node formed by the connection of the third resistor R3 and the second resistor R2 is used to connect to the intermediate range board. The first capacitor C1 is connected in parallel with the fourth resistor R4.

[0014] Preferably, the range acquisition unit further includes a status display unit and a protection unit;

[0015] The status display unit is connected in series between the input terminal of the switching transistor and the pull-up unit;

[0016] The protection unit is connected to the input terminal of the switching transistor and the switching quantity processing unit.

[0017] Preferably, the status display unit includes an LED lamp D26, the anode of the LED lamp D26 is connected to the pull-up unit, and the cathode of the LED lamp D26 is connected to the input terminal of the switching transistor;

[0018] The protection unit includes a Zener diode D33 and a TVS diode D34. The control terminal of the switching transistor is connected to the cathode of the Zener diode D33, the input terminal of the switching quantity processing unit is connected to one end of the TVS diode D34, and the anode of the Zener diode D33 and the other end of the TVS diode D34 are grounded.

[0019] Preferably, the voltage sampling unit includes an analog-to-digital converter chip U5 and a crystal oscillator unit; the analog input channel of the analog-to-digital converter chip U5 is used to connect to the intermediate range board, the clock channel of the analog-to-digital converter chip U5 is connected to the crystal oscillator unit, and the communication channel of the analog-to-digital converter chip U5 is connected to the test unit.

[0020] Preferably, the board control unit includes a digital-to-analog converter chip U4, the digital signal channel of the digital-to-analog converter chip U4 is connected to the test unit, and the multiple analog channels of the digital-to-analog converter chip U4 are used to connect to the intermediate range board.

[0021] Preferably, the testing unit includes a microprocessor, a communication unit, and a human-computer interaction unit;

[0022] The microprocessor is connected to the voltage sampling unit, the range acquisition unit, the board control unit, and the communication unit. The communication unit is connected to the human-machine interaction unit, which is used to display the test report.

[0023] Preferably, the precision current source is a Keithley 6220 current source.

[0024] This utility model also constructs an intermediate range board testing device, including the intermediate range board testing circuit described above.

[0025] The technical solution of this utility model, through the cooperation of a precision current source and a board control unit, can simulate the working environment of intermediate range boards. Then, the voltage signal and the range signal can be obtained through the voltage sampling unit and the range acquisition unit respectively. The test unit outputs a test report based on the voltage signal and the range signal, which effectively improves the test efficiency of intermediate range boards and reduces the risk of human error. Attached Figure Description

[0026] The present invention will be further described below with reference to the accompanying drawings and embodiments. In the accompanying drawings:

[0027] Figure 1 This is a circuit structure block diagram of the intermediate range board test circuit in some embodiments of this utility model;

[0028] Figure 2 This is a circuit diagram of the voltage sampling unit in some embodiments of this utility model;

[0029] Figure 3 This is a circuit diagram of the range acquisition unit in some embodiments of this utility model;

[0030] Figure 4 This is a circuit diagram of the board control unit in some embodiments of this utility model;

[0031] Figure 5 This is a circuit structure block diagram of the test unit in some embodiments of this utility model. Detailed Implementation

[0032] To provide a clearer understanding of the technical features, objectives, and effects of this utility model, the specific embodiments of this utility model will now be described in detail with reference to the accompanying drawings.

[0033] In the following description, it should be understood that the orientations or positional relationships indicated by terms such as "front," "rear," "up," "down," "left," "right," "longitudinal," "horizontal," "vertical," "horizontal," "top," "bottom," "inner," "outer," "head," and "tail" are based on the orientations or positional relationships shown in the accompanying drawings, and are constructed and operated in a specific orientation. They are only for the convenience of describing this technical solution and do not indicate that the device or component referred to must have a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0034] Figure 1 This is a circuit structure block diagram of an intermediate range board test circuit in some embodiments of the present invention. The intermediate range board test circuit may include a precision current source 1, a voltage sampling unit 2, a range acquisition unit 3, a board control unit 4, and a test unit 5.

[0035] Precision current source 1 is used to connect to the intermediate range board to inject a current signal into it. This current signal simulates the input signal of the intermediate range board, enabling testing even when the reactor is shut down or offline. Furthermore, the current signal ranges from 0.1mA to 100mA; the specific magnitude of the current signal can be customized according to experimental requirements and is not limited here.

[0036] In some embodiments, the precision current source 1 may be a Keithley 6220 current source.

[0037] Voltage sampling unit 2 is used to connect to the intermediate range board to acquire the voltage signal output by the intermediate range board. The voltage signal is the signal output by the intermediate range board when it acquires a current signal, and can characterize the test report of the current signal.

[0038] In some embodiments, such as Figure 2 As shown, the voltage sampling unit 2 may include an analog-to-digital converter chip U5 and a crystal oscillator unit 21. The analog-to-digital converter chip U5 may be an ADS1256IDB. The analog input channel of the analog-to-digital converter chip U5 (including pins 6 to 13) is used to connect to the intermediate range board, the clock channel of the analog-to-digital converter chip U5 (i.e., pin 19) is connected to the crystal oscillator unit 21, and the communication channel of the analog-to-digital converter chip U5 is connected to the test unit 5.

[0039] In some embodiments, the crystal oscillator unit 21 may include an active crystal oscillator Y1, a twenty-second resistor R22, a twenty-seventh capacitor C27, and a twenty-first resistor R21. The power supply terminal of the active crystal oscillator Y1 is connected to the DC voltage VDD_3V3_SYS via the twenty-second resistor R22. The power supply terminal of the active crystal oscillator Y1 is also grounded via the twenty-seventh capacitor C27. The clock signal output terminal of the active crystal oscillator Y1 is connected to the clock channel of the analog-to-digital converter chip U5 via the twenty-first resistor R21.

[0040] In addition, such as Figure 2 As shown, the voltage sampling unit 2 may also include peripheral electronic components connected to the analog-to-digital converter chip U5, specifically resistors 18 to 20 (R18, R19, R20), resistors 22 to 24 (R22, R23, R24), resistor 27 (R27), and capacitors 23 to 26 (C23, C24, C25, C26). For the specific connection structure of the analog-to-digital converter chip U5 and its peripheral electronic components, please refer to [reference needed]. Figure 2 This will not be elaborated upon here.

[0041] The range acquisition unit 3 is used to connect to the intermediate range board to acquire its output range signal. The function of the range acquisition unit 3 is to convert the switching signal output by the intermediate range board into a signal with a lower voltage amplitude, thereby preventing overvoltage damage to the test unit 5. The range signal can indicate the real-time range status of the intermediate range board.

[0042] In some embodiments, such as Figure 3 As shown, the range acquisition unit 3 may include a switching transistor 35, a pull-up unit 31, and a switching quantity processing unit 32. The switching transistor 35 may include an NMOS transistor Q4, with the gate, drain, and source of the NMOS transistor Q4 corresponding to the control terminal, input terminal, and output terminal of the switching transistor 35, respectively. The input terminal of the switching transistor 35 is connected to the first DC voltage VDD_3V3_SYS via the pull-up unit 31. The input terminal of the switching transistor 35 is also connected to the test unit 5. The output terminal of the switching transistor 35 is grounded. The input terminal of the switching quantity processing unit 32 is connected to the intermediate range board, and the output terminal of the switching transistor 35 is connected to the output terminal of the switching quantity processing unit 32.

[0043] In this embodiment, the function of the switching signal processing unit 32 is to process the switching signal DI3 output from the intermediate range board and send the processed signal to the switching transistor 35. The purpose of processing the switching signal DI3 is to prevent the control terminal of the switching transistor 35 from being damaged due to excessive input voltage. When the switching signal DI3 is high, the switching transistor 35 is turned on, and the signal DI_3 input to the test unit 5 from the input terminal of the switching transistor 35 is low. When the switching signal DI3 is low, the switching transistor 35 is turned off, and the signal DI_3 is set to high level under the pull-up action of the pull-up unit 31. It is easy to understand that the test unit 5 can determine the level of the switching signal DI3 based on the level of the signal DI_3.

[0044] In some embodiments, such as Figure 3 As shown, the pull-up unit 31 may include a first resistor R1, and the switching quantity processing unit 32 includes a second resistor R2, a third resistor R3, a fourth resistor R4, and a first capacitor C1.

[0045] The drain of NMOS transistor Q4 is connected to the first DC voltage VDD_3V3_SYS via the first resistor R1. The drain of NMOS transistor Q4 is also connected to test unit 5. The source of NMOS transistor Q4 is grounded, and the gate of NMOS transistor Q4 is grounded via the fourth resistor R4. The gate of NMOS transistor Q4 is also connected to the second DC voltage VCC_DI_EX via the third resistor R3 and the second resistor R2. The node formed by the connection of the third resistor R3 and the second resistor R2 serves as the input terminal of the switching quantity processing unit 32 for connecting to the intermediate range board. The first capacitor C1 is connected in parallel with the fourth resistor R4. The node formed by the connection of the third resistor R3 and the fourth resistor R4 serves as the output terminal of the switching quantity processing unit 32. In addition, the first DC voltage VDD_3V3_SYS and the second DC voltage VCC_DI_EX can both be provided by existing power supply modules. The first DC voltage matches the operating voltage of test unit 5, which is usually equal to 3.3V, while the second DC voltage matches the operating voltage of the intermediate range board, which is usually equal to 24V.

[0046] In this embodiment, the second resistor R2, the third resistor R3, and the fourth resistor R4 constitute a voltage divider circuit capable of dividing the second DC voltage. The divided voltage signal is sent to the gate of the NMOS transistor Q4, causing the NMOS transistor Q4 to conduct in the default state. When the switching signal output by the intermediate range board is low, the NMOS transistor Q4 is turned off. In addition, the first capacitor C1 acts as a filter to prevent the NMOS transistor Q4 from jittering during switching on and off.

[0047] In some embodiments, such as Figure 3As shown, the range acquisition unit 3 may also include a status display unit 33 and a protection unit 34. The status display unit 33 is connected in series between the input terminal of the switching transistor 35 and the pull-up unit 31, and is used to display whether the first DC voltage is output normally.

[0048] Furthermore, the status display unit 33 may include an LED D26, with the anode of the LED D26 connected to the pull-up unit 31 and the cathode of the LED D26 connected to the input terminal of the switching transistor 35. When the first DC voltage is output normally, the LED D26 is lit; conversely, when the first DC voltage is not present or is too low, the LED D26 is not lit.

[0049] The protection unit 34 is connected to the input terminal of the switching transistor 35 and the switching quantity processing unit 32. The protection unit 34 is used to prevent the switching transistor 35 from being damaged by overvoltage.

[0050] Furthermore, such as Figure 3 As shown, the protection unit 34 may include a Zener diode D33 and a TVS diode D34. The control terminal of the switching transistor 35 is connected to the cathode of the Zener diode D33, the input terminal of the switching quantity processing unit 32 is connected to one end of the TVS diode D34, and the anode of the Zener diode D33 and the other end of the TVS diode D34 are grounded. In this embodiment, the Zener diode D33 can clamp the voltage at the control terminal of the switching transistor 35 to prevent the Zener diode D33 from being damaged by overvoltage. The TVS diode D34 is mainly used to filter out high-frequency pulse noise superimposed on the switching signal output by the intermediate range board, and can also prevent the switching transistor 35 from being broken down by high-frequency high-voltage noise.

[0051] The plate control unit 4 is used to connect to the intermediate range plate to output parameter control signals for controlling the high-voltage output value and discrimination value of the intermediate range plate. It should be noted that in nuclear power plants, to ensure the measurement accuracy of the intermediate range plate, the high-voltage output value and discrimination value of the intermediate range plate must be accurately set. Therefore, to improve testing accuracy, operators can use the plate control unit 4 to set the high-voltage output value and discrimination value of the intermediate range plate to reasonable values. The functions of the high-voltage output value and discrimination value can be found in existing technology and will not be elaborated here.

[0052] In some embodiments, such as Figure 4 As shown, the board control unit 4 includes a digital-to-analog converter chip U4, which can be an AD5676ARUZ model. The digital signal channels of the digital-to-analog converter chip U4 (including pins SCLK, SDO, SDI, and SYNC) are connected to the test unit 5, and the multiple analog signal channels of the digital-to-analog converter chip U4 (including pins VOUT0, VOUT1, ..., VOUT7) are used to connect to the intermediate range board.

[0053] Furthermore, such as Figure 4 As shown, the board control unit 4 also includes a seventh resistor R7, an eighth resistor R8, eleventh resistors R11 through seventeenth resistors R17, an eighteenth capacitor C18, a nineteenth capacitor C19, and a twentieth capacitor C20. Please refer to the following for the specific connection structure. Figure 4 This will not be elaborated further here. Among them, resistors R7 (seventh), R8 (eighth), R16 (sixteenth), and R17 (seventeenth) are pull-up resistors, capable of pulling up the pins they are connected to. Resistors R11 through R15 are matching resistors, capable of impedance matching of the communication lines they are connected to, improving communication stability. Capacitors C18 (eighteenth), C19 (nineteenth), and C20 (twentieth) are decoupling capacitors, capable of decoupling the power supply they are connected to, improving the operational stability of the digital-to-analog converter chip U4.

[0054] Test unit 5 is connected to voltage sampling unit 2, range acquisition unit 3 and board control unit 4. Test unit 5 is used to receive voltage signals and range signals, control the operation of board control unit 4 and output test reports.

[0055] In some embodiments, such as Figure 5 As shown, the test unit 5 includes a microprocessor 51, a communication unit 52, and a human-machine interaction unit 53. The microprocessor 51 is connected to the voltage sampling unit 2, the range acquisition unit 3, the board control unit 4, and the communication unit 52. The communication unit 52 is connected to the human-machine interaction unit 53, which is used to display the test report.

[0056] In this embodiment, the microprocessor 51 can be an existing microprocessor or a single-chip microcomputer, such as an STM32F407 microprocessor. The communication unit 52 can be an existing Ethernet communication module, or a communication module using other communication protocols, as long as it enables communication between the microprocessor 51 and the human-machine interface unit 53. The human-machine interface unit 53 can be a touch screen, allowing the display of the test report and the input of relevant control commands through the human-machine interface unit 53, including controlling the specific magnitude of the high-voltage output value and discrimination value in the intermediate range board through the board control unit 4. Furthermore, the test report can directly display the voltage and range signals, allowing operators to independently determine whether the intermediate range board is abnormal. Of course, given that the current signal output by the precision current source is known, the theoretical values ​​of the voltage and range signals can be determined from the current signal. Correspondingly, the test report can also include the errors between the theoretical values ​​of the voltage and range signals and the voltage and range signals output by the voltage sampling unit and range acquisition unit, respectively. Furthermore, the microprocessor can determine whether the intermediate range board is abnormal by judging whether the error is within a corresponding preset error range. For example, when the error between the theoretical value of the voltage signal and the voltage signal output by the voltage sampling unit is no longer within a certain preset error range, the intermediate range board can be determined to be abnormal.

[0057] The technical solution of this utility model, through the cooperation of a precision current source and a board control unit, can simulate the working environment of intermediate range boards. Then, the voltage signal and the range signal can be obtained through the voltage sampling unit and the range acquisition unit respectively. The test unit outputs a test report based on the voltage signal and the range signal, which effectively improves the test efficiency of intermediate range boards and reduces the risk of human error.

[0058] This utility model also provides an intermediate range board testing device, including the intermediate range board testing circuit provided in the embodiments of this utility model.

[0059] It is understood that the above embodiments only illustrate preferred embodiments of the present utility model, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the present utility model patent. It should be noted that for those skilled in the art, the above technical features can be freely combined, and several modifications and improvements can be made without departing from the concept of the present utility model, all of which fall within the protection scope of the present utility model. Therefore, all equivalent transformations and modifications made within the scope of the claims of the present utility model should fall within the coverage of the claims of the present utility model.

Claims

1. A test circuit for intermediate range board components, characterized in that, It includes a precision current source (1), a voltage sampling unit (2), a range acquisition unit (3), a board control unit (4), and a testing unit (5); The precision current source (1) is used to connect to the intermediate range plate to inject a current signal into it; The voltage sampling unit (2) is used to connect to the intermediate range board to collect the voltage signal output by it; The range acquisition unit (3) is used to connect to the intermediate range plate to acquire its output range signal; The plate control unit (4) is used to connect to the intermediate range plate to output parameter control signals for controlling the high voltage output value and discrimination value of the intermediate range plate; The test unit (5) is connected to the voltage sampling unit (2), the range acquisition unit (3) and the board control unit (4), and is used to receive the voltage signal and the range signal, control the board control unit (4) to work and output the test report.

2. The intermediate range board test circuit according to claim 1, characterized in that, The range acquisition unit (3) includes a switching transistor (35), a pull-up unit (31), and a switching quantity processing unit (32); The input terminal of the switch (35) is connected to the first DC voltage via the pull-up unit (31). The input terminal of the switch (35) is also connected to the test unit (5). The output terminal of the switch (35) is grounded. The input terminal of the switch quantity processing unit (32) is connected to the intermediate range board. The output terminal of the switch (35) is connected to the output terminal of the switch quantity processing unit (32).

3. The intermediate range board test circuit according to claim 2, characterized in that, The switching transistor (35) includes an NMOS transistor Q4, the pull-up unit (31) includes a first resistor R1, and the switching quantity processing unit (32) includes a second resistor R2, a third resistor R3, a fourth resistor R4, and a first capacitor C1. The drain of the NMOS transistor Q4 is connected to the first DC voltage via the first resistor R1. The drain of the NMOS transistor Q4 is also connected to the test unit (5). The source of the NMOS transistor Q4 is grounded. The gate of the NMOS transistor Q4 is connected to the second DC voltage via the fourth resistor R4 and the third resistor R3 and the second resistor R2. The node after the third resistor R3 and the second resistor R2 are connected is used to connect the intermediate range board. The first capacitor C1 is connected in parallel with the fourth resistor R4.

4. The intermediate range board test circuit according to claim 2 or 3, characterized in that, The range acquisition unit (3) also includes a status display unit (33) and a protection unit (34); The status display unit (33) is connected in series between the input terminal of the switch tube and the pull-up unit (31); The protection unit (34) is connected to the input terminal of the switching transistor and the switching quantity processing unit (32).

5. The intermediate range board test circuit according to claim 4, characterized in that, The status display unit (33) includes an LED lamp D26, the anode of the LED lamp D26 is connected to the pull-up unit (31), and the cathode of the LED lamp D26 is connected to the input terminal of the switching transistor; The protection unit (34) includes a Zener diode D33 and a TVS diode D34. The control terminal of the switching transistor is connected to the cathode of the Zener diode D33. The input terminal of the switching quantity processing unit (32) is connected to one end of the TVS diode D34. The anode of the Zener diode D33 and the other end of the TVS diode D34 are grounded.

6. The intermediate range board test circuit according to claim 1, characterized in that, The voltage sampling unit (2) includes an analog-to-digital converter chip U5 and a crystal oscillator unit (21); the analog input channel of the analog-to-digital converter chip U5 is used to connect to the intermediate range board, the clock channel of the analog-to-digital converter chip U5 is connected to the crystal oscillator unit (21), and the communication channel of the analog-to-digital converter chip U5 is connected to the test unit (5).

7. The intermediate range board test circuit according to claim 1, characterized in that, The board control unit (4) includes a digital-to-analog converter chip U4. The digital signal channel of the digital-to-analog converter chip U4 is connected to the test unit (5). The multiple analog channels of the digital-to-analog converter chip U4 are used to connect to the intermediate range board.

8. The intermediate range board test circuit according to claim 1, characterized in that, The test unit (5) includes a microprocessor (51), a communication unit (52), and a human-computer interaction unit (53); The microprocessor (51) is connected to the voltage sampling unit (2), the range acquisition unit (3), the board control unit (4), and the communication unit (52). The communication unit (52) is connected to the human-machine interaction unit (53), which is used to display the test report.

9. The intermediate range board test circuit according to claim 1, characterized in that, The precision current source (1) is a Keithley 6220 current source.

10. A test apparatus for intermediate-range plate components, characterized in that, Includes the intermediate range board test circuit as described in any one of claims 1 to 9.

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