An integrated circuit signal testing system

Abstract

This utility model relates to the field of integrated circuit testing technology, specifically to a signal testing system for integrated circuits. It includes a lifting base with a pneumatic buffer probe mechanism slidingly mounted on its surface. The pneumatic buffer probe mechanism includes a mounting box disposed on the surface of the lifting base. Several sets of circuit probes are disposed below the mounting box. A sleeve is slidably connected to the top of each circuit probe, and the sleeve is threaded into the interior of the mounting box. An electromagnet is fixedly connected to the top of the sleeve. An inert gas chamber is formed inside the sleeve, and a magnetic piston is slidably connected inside the inert gas chamber, with the circuit probe fixedly connected to the bottom end of the magnetic piston. This utility model, through the cooperation of the lifting base and the pneumatic buffer probe mechanism, utilizes a multi-stage gas damping system formed by the gas distribution chamber and uniformly distributed micro-pressure relief holes to automatically adjust the buffering force according to the downward pressure speed, achieving nonlinear buffering characteristics.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing technology, and specifically to a system for testing integrated circuit signals. Background Technology

[0002] The rapid development of 5G communication and high-frequency chips has led to increasingly stringent requirements for signal integrity and contact stability in testing systems. Existing probes largely rely on mechanical spring buffer structures, which are prone to rigid impacts during high-speed testing. Especially in batch automated testing scenarios, probes frequently contact circuit boards of varying thicknesses, and rigid contact can easily damage pads or cause probe wear, affecting testing accuracy and increasing equipment maintenance costs. Furthermore, high-frequency signal testing demands extremely high stability of contact impedance; traditional buffer structures are prone to introducing signal noise in micro-vibration environments, making them unsuitable for modern high-precision testing needs.

[0003] Existing probe buffering solutions have significant limitations: while spring-loaded buffers provide some elasticity, their linear buffering characteristics cannot adapt to different impact velocities, and high-speed compression can still cause instantaneous overload; furthermore, mechanical springs are prone to fatigue deformation after long-term use, leading to a decrease in buffering force and affecting test consistency. Some improved solutions attempt to use soft materials such as silicone pads, but these suffer from rapid aging and poor temperature stability. More importantly, these buffering structures are difficult to dynamically adjust and cannot adapt to the pressure requirements of different testing scenarios. These problems severely restrict the efficiency and reliability of high-precision integrated circuit testing.

[0004] Therefore, it is necessary to invent a signal testing system for integrated circuits to solve the above problems. Utility Model Content

[0005] The purpose of this invention is to provide a signal testing system for integrated circuits that improves the reliability of the probe by combining a lifting seat with a pneumatic buffer probe mechanism, thereby solving the problem that the buffer structure in the prior art is difficult to dynamically adjust and cannot adapt to the pressure requirements under different testing scenarios.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a signal testing system for integrated circuits, including a lifting base, a pneumatic buffer probe mechanism slidingly mounted on the surface of the lifting base, the pneumatic buffer probe mechanism including a mounting box disposed on the surface of the lifting base, a plurality of circuit probes disposed below the mounting box, a sleeve slidably connected to the top of the circuit probes and threadedly connected to the inside of the mounting box, an electromagnet fixedly connected to the top of the sleeve, an inert gas chamber opened inside the sleeve, a magnetic piston slidably connected inside the inert gas chamber and the circuit probe fixedly connected to the bottom end of the magnetic piston, a sealing ring fixedly connected to the bottom of the inert gas chamber, a gas distribution chamber opened inside the sleeve, a plurality of miniature pressure relief holes opened inside the inert gas chamber and communicating with the gas distribution chamber, the inert gas inside the inert gas chamber assists in pressure reduction, and the circuit probes are reset by the cooperation of the electromagnet and the magnetic piston.

[0007] Preferably, the surface of the lifting seat is provided with a lifting groove assembly, which includes a main groove and two side grooves on the surface of the lifting seat. A threaded rod is rotatably connected inside the main groove of the lifting groove assembly, and the lifting of the mounting box is coordinated through the lifting groove assembly.

[0008] Preferably, a servo motor is fixedly connected to the top of the lifting seat, and the output end of the servo motor is fixedly connected to the threaded rod. Starting the servo motor drives the threaded rod to rotate.

[0009] Preferably, the mounting box is threaded to the outer wall of the threaded rod, the mounting box is slidably connected to the inside of the lifting groove assembly, and a data collection box is fixedly connected to the top of the mounting box. The lifting of the mounting box is achieved by using the threaded rod and the lifting groove assembly.

[0010] Preferably, the bottom end of the lifting seat is fixedly connected to a base, and the top end of the base is fixedly connected to a mounting platform, which provides support for the lifting seat.

[0011] Preferably, four sets of limiting blocks are fixedly connected to the top of the base. The height of the limiting blocks is lower than the height of the mounting platform. Large and medium-sized integrated circuit boards are installed respectively by the cooperation of the limiting blocks and the mounting platform.

[0012] Preferably, the top of the lifting seat is provided with a small mounting slot, and both sides of the small mounting slot are provided with retrieval slots, through which a small integrated circuit board is installed.

[0013] The technical effects and advantages provided by this utility model in the above technical solution are as follows:

[0014] By combining the lifting seat with the pneumatic buffer probe mechanism, and through the multi-stage gas damping system formed by the gas distribution chamber and the uniformly distributed micro pressure relief holes, the buffering force is automatically adjusted according to the downward pressure speed to achieve nonlinear buffering characteristics. An electromagnet and a magnetic piston are used to form a reset system to complete the circuit probe reset and dynamically adjust the reset force. The inert gas chamber is filled with nitrogen and equipped with a sealing ring to reduce the impact of ambient temperature and humidity on the buffering performance. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this invention. For those skilled in the art, other drawings can be obtained based on these drawings.

[0016] Figure 1 This is a schematic diagram of the overall first-view structure of this utility model;

[0017] Figure 2 This is a schematic diagram of the overall second-view structure of this utility model;

[0018] Figure 3 This is a schematic diagram of the probe structure of this utility model;

[0019] Figure 4 This is a schematic diagram of the internal structure of the sleeve of this utility model;

[0020] Figure 5 For the present utility model Figure 4 Enlarged structural diagram at point A in the middle.

[0021] Explanation of reference numerals in the attached figures:

[0022] 1. Lifting base; 2. Pneumatic buffer probe mechanism; 201. Mounting box; 202. Circuit probe; 203. Sleeve; 204. Electromagnet; 205. Inert gas chamber; 206. Magnetic piston; 207. Sealing ring; 208. Miniature pressure relief hole; 209. Gas distribution chamber; 3. Data collection box; 4. Threaded rod; 5. Lifting slot assembly; 6. Small mounting slot; 7. Base; 8. Mounting platform; 9. Servo motor; 10. Limiting block. Detailed Implementation

[0023] To enable those skilled in the art to better understand the technical solution of this utility model, the present utility model will be further described in detail below with reference to the accompanying drawings.

[0024] This utility model provides, for example Figure 1-5The diagram illustrates a signal testing system for integrated circuits, comprising a lifting base 1. A pneumatic buffer probe mechanism 2 slides on the surface of the lifting base 1. The pneumatic buffer probe mechanism 2 includes a mounting box 201 disposed on the surface of the lifting base 1. Several sets of circuit probes 202 are disposed below the mounting box 201. A sleeve 203 is slidably connected to the top of each circuit probe 202 and threadedly connected to the inside of the mounting box 201. An electromagnet 204 is fixedly connected to the top of the sleeve 203. An inert gas chamber 205 is formed inside the sleeve 203. A magnetic piston 206 is slidably connected inside the inert gas chamber 205, and the circuit probes 202 are fixedly connected to the bottom end of the magnetic piston 206. A sealing ring 207 is fixedly connected to the bottom of the inert gas chamber 205. The cylinder 203 has a gas distribution chamber 209 inside. The inert gas chamber 205 has several sets of miniature pressure relief holes 208 inside, and the miniature pressure relief holes 208 are connected to the gas distribution chamber 209. The inert gas inside the inert gas chamber 205 is used to assist in pressure reduction. The circuit probe 202 is reset by the cooperation of the electromagnet 204 and the magnetic piston 206. The surface of the lifting seat 1 has a lifting groove group 5. The lifting groove group 5 includes a main groove and two side grooves on the surface of the lifting seat 1. The main groove of the lifting groove group 5 is rotatably connected to a threaded rod 4. The lifting groove group 5 is used to cooperate with the lifting of the mounting box 201. The top of the lifting seat 1 is fixedly connected to a servo motor 9. The output end of the servo motor 9 is fixedly connected to the threaded rod 4. The servo motor 9 is started to drive the threaded rod 4 to rotate.

[0025] Refer to the instruction manual appendix Figure 1-5 The mounting box 201 is threaded to the outer wall of the threaded rod 4 and slidably connected to the inside of the lifting slot assembly 5. A data collection box 3 is fixedly connected to the top of the mounting box 201. The threaded rod 4 and the lifting slot assembly 5 are used to raise and lower the mounting box 201. A base 7 is fixedly connected to the bottom of the lifting seat 1, and a mounting platform 8 is fixedly connected to the top of the base 7. The base 7 provides support for the lifting seat 1. Four sets of limiting blocks 10 are fixedly connected to the top of the base 7. The height of the limiting blocks 10 is lower than the height of the mounting platform 8. Large and medium-sized integrated circuit boards are installed through the cooperation of the limiting blocks 10 and the mounting platform 8. The top of the lifting seat 1 has an opening... A small mounting slot 6 is provided, with retrieval slots on both sides of the small mounting slot 6. A small integrated circuit board is installed through the small mounting slot 6. Through the cooperation of the lifting seat 1 and the pneumatic buffer probe mechanism 2, a multi-stage gas damping system is formed by the gas distribution chamber 209 and the evenly distributed micro pressure relief holes 208. The buffering force is automatically adjusted according to the downward pressure speed to achieve nonlinear buffering characteristics. The electromagnet 204 and the magnetic piston 206 form a reset system to complete the reset of the circuit probe 202 and dynamically adjust the reset force. The inert gas chamber 205 is filled with nitrogen and is equipped with a sealing ring 207 to reduce the impact of ambient temperature and humidity on the buffering performance.

[0026] The working principle of this practical application is as follows:

[0027] Refer to the instruction manual appendix Figure 1-5 During the pressure test, the lifting seat 1, driven by the servo motor 9, moves the mounting box 201 downward via the threaded rod 4. After the circuit probe 202 contacts the circuit board under test, the magnetic piston 206 moves upward in the inert gas chamber 205 to compress the gas. Under the pressure equalization effect of the gas distribution chamber 209, the gas forms controllable damping through the micro pressure relief hole 208. At this time, the electromagnet 204 is de-energized. After the test is completed, the servo motor 9 reverses and lifts the lifting seat 1. At the same time, the electromagnet 204 is energized to generate a magnetic field that repels the magnetic piston 206, pushing the piston to reset. At this time, the micro pressure relief hole 208 becomes an air intake channel, and the airflow distribution in the gas distribution chamber 209 ensures that there is no deviation during the reset process. Throughout the process, the data collection box 3 monitors the contact resistance and buffer pressure in real time. When an abnormal air pressure is detected at the sealing ring 207, the downward pressure speed of the servo motor 9 can be automatically adjusted.

[0028] Precise positioning of integrated circuit boards of three different sizes is achieved through the limiting block 10, mounting platform 8, and small mounting slot 6 on the base 7. The height difference between the limiting block 10 and the mounting platform 8 forms a positioning step for large circuit boards, while the pick-and-place slots on both sides of the small mounting slot 6 facilitate vacuum adsorption and fixation of thin chips. This design, which combines multi-level buffering and intelligent reset, ensures that the circuit probe 202 maintains optimal contact pressure when testing circuit boards of different thicknesses.

[0029] The foregoing description only illustrates certain exemplary embodiments of the present invention. Undoubtedly, those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A signal testing system for integrated circuits, comprising a lifting platform (1), characterized in that: A pneumatic buffer probe mechanism (2) slides on the surface of the lifting seat (1). The pneumatic buffer probe mechanism (2) includes a mounting box (201) disposed on the surface of the lifting seat (1). Several sets of circuit probes (202) are disposed below the mounting box (201). A sleeve (203) is slidably connected to the top of the circuit probe (202), and the sleeve (203) is threadedly connected to the inside of the mounting box (201). An electromagnet (204) is fixedly connected to the top of the sleeve (203). An inert gas chamber (205) is provided inside the sleeve (203). A magnetic piston (206) is slidably connected inside the inert gas chamber (205), and a circuit probe (202) is fixedly connected to the bottom end of the magnetic piston (206). A sealing ring (207) is fixedly connected to the bottom of the inert gas chamber (205). A gas distribution chamber (209) is provided inside the sleeve (203). Several sets of micro pressure relief holes (208) are provided inside the inert gas chamber (205), and the micro pressure relief holes (208) communicate with the gas distribution chamber (209).

2. The integrated circuit signal testing system according to claim 1, characterized in that: The surface of the lifting seat (1) is provided with a lifting groove group (5), which includes a main groove and two side grooves on the surface of the lifting seat (1). A threaded rod (4) is rotatably connected inside the main groove of the lifting groove group (5).

3. The integrated circuit signal testing system according to claim 1, characterized in that: The top of the lifting seat (1) is fixedly connected to a servo motor (9), and the output end of the servo motor (9) is fixedly connected to the threaded rod (4).

4. The integrated circuit signal testing system according to claim 1, characterized in that: The mounting box (201) is threaded to the outer wall of the threaded rod (4), the mounting box (201) is slidably connected to the inside of the lifting groove group (5), and the top of the mounting box (201) is fixedly connected to the data collection box (3).

5. A signal testing system for integrated circuits according to claim 1, characterized in that: The bottom end of the lifting seat (1) is fixedly connected to a base (7), and the top end of the base (7) is fixedly connected to a mounting platform (8).

6. A signal testing system for integrated circuits according to claim 5, characterized in that: The top of the base (7) is fixedly connected to four sets of limiting blocks (10), the height of which is lower than the height of the mounting platform (8).

7. A signal testing system for integrated circuits according to claim 1, characterized in that: The top of the lifting seat (1) is provided with a small mounting groove (6), and both sides of the small mounting groove (6) are provided with retrieval grooves.

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